80 dB SFDR @ 100 MHz (±1 MHz) A
4× to 20× programmable reference clock multiplier
Dual 48-bit programmable frequency registers
Dual 14-bit programmable phase offset registers
12-bit programmable amplitude modulation and shaped
on/off keying function
Single pin FSK and BPSK data interface
PSK capability via I/O interface
Linear or nonlinear FM chirp functions with single pin
frequency hold function
Frequency-ramped FSK
REFERENCE
CLOCK IN
DIFF/SINGLE
SELECT
FSK/BPSK/HOLD
DATA IN
BIDIRECTIONAL
INTERNAL/EXTERNA
I/O UPDATE CLOCK
REF
CLK
BUFFER
SYSTEM
CLOCK
DEMUX
2
MODE SELECT
SYSTEM
CLOCK
3
FREQUENCY
48484814
DELTA
FREQUENCY
WORD
CK
D
INT
EXT
4× – 20×
REF CLK
MULTIPLIER
MUX
DELTA
RATE TIMER
SYSTEM
CLOCK
Q
OUT
FUNCTIONAL BLOCK DIAGRAM
SYSTEM CLOCK
ACC 1
FREQUENCY
ACCUMULATOR
MUX
FREQUENCY
TUNING
WORD 1
INTERNAL
PROGRAMMABLE
UPDATE CLOCK
FREQUENCY
÷2
4848
48
MUXMUX
TUNING
WORD 2
PROGRAMMING REGISTERS
SYSTEM
CLOCK
<25 ps rms total jitter in clock generator mode
Automatic bidirectional frequency sweeping
SIN(x)/x correction
Simplified control interface
3.3 V single supply
Multiple power-down functions
Single-ended or differential input reference clock
Small 80-lead LQFP packaging
APPLICATIONS
Agile LO frequency synthesis
Programmable clock generator
FM chirp source for radar and scanning systems
Test and measurement equipment
Commercial and amateur RF exciter
DDS CORE
17
17
ACC 2
PHASE
ACCUMULATOR
FIRST 14-BIT
PHASE/OFFSET
WORD
READWRITE SERIAL/
Figure 1.
14
AD9852
PHASE-TO-
Complete DDS
AD9852
10 MHz serial, 2-wire or 3-wire SPI® compatible, or
100 MHz parallel 8-bit programming
DIGITAL MULTIPLIERS
INV.
12
SINC
I
FILTER
AMPLITUDE
CONVERTER
Q
SYSTEM
CLOCK
14
SECOND 14-BIT
PHASE/OFFSET
WORD
PARALLEL
SELECT
MUX
PROGRAMMABLE
AMPLITUDE AND
RATE CONTROL
12
AM
MODULATION
BUS
I/O PORT BUFFERS
6-BIT ADDRESS
OR SERIAL
PROGRAMMING
LINES
MUX
SYSTEM
CLOCK
12-BIT DC
CONTROL
PARALLEL
12
12
8-BIT
LOAD
12-BIT
COSINE
DAC
12-BIT
CONTROL
DAC
COMPARATOR
MASTER
RESET
DAC R
CLOCK
OUT
OSK
GND
+V
ANALOG
OUT
SET
ANALOG
OUT
ANALOG
IN
S
00634-C-001
Rev. C
Information furnished by Analog Devices is believed to be accurate and reliable.
However, no responsibility is assumed by Analog Devices for its use, nor for any
infringements of patents or other rights of third parties that may result from its use.
Specifications subject to change without notice. No license is granted by implication
or otherwise under any patent or patent rights of Analog Devices. Trademarks and
registered trademarks are the property of their respective owners.
Changes to Figure 50................................................................27
Changes to Figure 65................................................................36
Rev. C | Page 2 of 48
AD9852
GENERAL DESCRIPTION
The AD9852 digital synthesizer is a highly integrated device
that uses advanced DDS technology, coupled with an internal
high speed, high performance D/A converter to form a digitally
programmable agile synthesizer function. When referenced to
an accurate clock source, the AD9852 generates a highly stable,
frequency-phase-amplitude-programmable cosine output that
can be used as an agile LO in communications, radar, and many
other applications. The AD9852’s innovative high speed DDS
core provides 48-bit frequency resolution (1 MHz tuning
resolution with 300 MHz SYSCLK). Maintaining 17 bits assures
excellent SFDR.
The AD9852’s circuit architecture allows the generation of
output signals at frequencies up to 150 MHz, which can be
digitally tuned at a rate of up to 100 million new frequencies per
second. The (externally filtered) cosine wave output can be
converted to a square wave by the internal comparator for agile
clock generator applications. The device provides two 14-bit
phase registers and a single pin for BPSK operation. For high
order PSK operation, the I/O interface may be used for phase
changes. The 12-bit cosine DAC, coupled with the innovative
DDS architecture, provides excellent wideband and narrowband output SFDR. When configured with the comparator, the
12-bit control DAC facilitates static duty cycle control in the
high speed clock generator applications. The 12-bit digital
multiplier permits programmable amplitude modulation,
shaped on/off keying, and precise amplitude control of the
cosine DAC output. Chirp functionality is also included for
wide bandwidth frequency sweeping applications. The
AD9852’s programmable 4 × to 20 × REFCLK multiplier circuit
generates the 300 MHz system clock internally from a lower
frequency external reference clock. This saves the user the
expense and difficulty of implementing a 300 MHz system
clock source. Direct 300 MHz clocking is also accommodated
with either single-ended or differential inputs. Single pin
conventional FSK and the enhanced spectral qualities of
“ramped” FSK are supported. The AD9852 uses advanced
0.35 micron CMOS technology to provide this high level of
functionality on a single 3.3 V supply.
The AD9852 is available in a space-saving 80-lead LQFP
surface-mount package and a thermally enhanced 80-lead
LQFP package. The AD9852 is pin-for-pin compatible with the
AD9854 single-tone synthesizer. It is specified to operate over
the extended industrial temperature range of –40°C to +85°C.
OVERVIEW
The AD9852 digital synthesizer is a highly flexible device that
addresses a wide range of applications. The device consists of
an NCO with 48-bit phase accumulator, a programmable
reference clock multiplier, an inverse sinc filter, a digital
multiplier, two 12-bit/300 MHz DACs, a high speed analog
comparator, and interface logic. This highly integrated device
can be configured to serve as a synthesized LO agile clock
generator and FSK/BPSK modulator. The theory of operation of
the functional blocks of the device, and a technical description
of the signal flow through a DDS device is provided by Analog
Devices in “A Technical Tutorial on Digital Signal Synthesis.”
This tutorial is available in the DDS Technical Library of the
Analog Devices website at www.analog.com/dds. The tutorial
also provides basic applications information for a variety of
digital synthesis implementations.
Rev. C | Page 3 of 48
AD9852
SPECIFICATIONS
VS = 3.3 V ± 5%, R
external reference clock frequency = 20 MHz with REFCLK multiplier enabled at 10× for AD9852AST, unless otherwise noted.
Table 1.
Parameter
REF CLOCK INPUT CHARACTERISTICS1
Internal System Clock Frequency Range
REFCLK Multiplier Enabled Full VI 20 300 20 200 MHz
REFCLK Multiplier Disabled Full VI DC 300 DC 200 MHz
External REF Clock Frequency Range
REFCLK Multiplier Enabled Full VI 5 75 5 50 MHz
REFCLK Multiplier Disabled Full VI DC 300 DC 200 MHz
Duty Cycle 25°C IV 45 50 55 45 50 55 %
Input Capacitance 25°C IV 3 3 pF
Input Impedance 25°C IV 100 100 kΩ
Differential-Mode Common-Mode Voltage Range
Minimum Signal Amplitude2 25°C IV 400 400 mV p-p
Common-Mode Range 25°C IV 1.6 1.75 1.9 1.6 1.75 1.9 V
VIH (Single-Ended Mode) 25°C IV 2.3 2.3 V
VIL (Single-Ended Mode) 25°C IV 1 1 V
DAC STATIC OUTPUT CHARACTERISTICS
Output Update Speed Full I 300 200 MSPS
Resolution 25°C IV 12 12 Bits
Cosine and Control DAC Full-Scale Output Current 25°C IV 5 10 20 5 10 20 mA
Gain Error 25°C I
Output Offset 25°C I 2 2 µA
Differential Nonlinearity 25°C I 0.3 1.25 0.3 1.25 LSB
Integral Nonlinearity 25°C I 0.6 1.66 0.6 1.66 LSB
Output Impedance 25°C IV 100 100 kΩ
Voltage Compliance Range 25°C I
DAC DYNAMIC OUTPUT CHARACTERISTICS
DAC Wideband SFDR
1 MHz to 20 MHz A
20 MHz to 40 MHz A
40 MHz to 60 MHz A
60 MHz to 80 MHz A
80 MHz to 100 MHz A
100 MHz to 120 MHz A
DAC Narrow-Band SFDR
10 MHz A
10 MHz A
10 MHz A
41 MHz A
41 MHz A
41 MHz A
119 MHz A
119 MHz A
119 MHz A
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
OUT
= 3.9 kΩ; external reference clock frequency = 30 MHz with REFCLK multiplier enabled at 10× for AD9852ASQ;
SET
Temp
25°C V 58 58 dBc
OUT
25°C V 56 56 dBc
OUT
25°C V 52 52 dBc
OUT
25°C V 48 48 dBc
OUT
OUT
25°C V 48 dBc
OUT
25°C V 48 48 dBc
Test
Level
AD9852ASQ
Min Typ Max
+2.25
−6
+1.0
−0.5
AD9852AST
Min Typ Max Unit
+2.25 % FS
−6
+1.0 V
−0.5
(± 1 MHz) 25°C V 83 83 dBc
(± 250 kHz) 25°C V 83 83 dBc
(± 50 kHz) 25°C V 91 91 dBc
(± 1 MHz) 25°C V 82 82 dBc
(± 250 kHz) 25°C V 84 84 dBc
(± 50 kHz) 25°C V 89 89 dBc
(± 1 MHz) 25°C V 71 dBc
(± 250 kHz) 25°C V 77 dBc
(± 50 kHz) 25°C V 83 dBc
Rev. C | Page 4 of 48
AD9852
Parameter
Residual Phase Noise
(A
= 5 MHz, Ext. CLK = 30 MHz, REFCLK
OUT
Multiplier Engaged at 10×)
1 kHz Offset 25°C V 140 140 dBc/Hz
10 kHz Offset 25°C V 138 138 dBc/Hz
100 kHz Offset 25°C V 142 142 dBc/Hz
(A
= 5 MHz, Ext. CLK = 300 MHz, REFCLK
OUT
Multiplier Bypassed)
1 kHz Offset 25°C V 142 142 dBc/Hz
0 kHz Offset 25°C V 148 148 dBc/Hz
100 kHz Offset 25°C V 152 152 dBc/Hz
PIPELINE DELAYS3, 4, 5
DDS Core (Phase Accumulator and Phase-toAmp Converter)
Frequency Accumulator 25°C IV 26 26
Inverse Sinc Filter 25°C IV 16 16
Digital Multiplier 25°C IV 9 9
DAC 25°C IV 1 1
I/O Update Clock (INT Mode) 25°C IV 2 2
I/O Update Clock (EXT Mode) 25°C IV 3 3
MASTER RESET DURATION 25°C IV 10 10
COMPARATOR INPUT CHARACTERISTICS
Input Capacitance 25°C V 3 3 pF
Input Resistance 25°C IV 500 500 kΩ
Input Current 25°C I ± 1 ± 5 ± 1 ± 5 µA
Hysteresis 25°C IV 10 20 10 20 mV p-p
COMPARATOR OUTPUT CHARACTERISTICS
Logic 1 Voltage, High Z Load Full VI 3.1 3.1 V
Logic 0 Voltage, High Z Load Full VI 0.16 0.16 V
Output Power, 50 Ω Load, 120 MHz Toggle Rate 25°C I 9 11 9 11 dBm
Propagation Delay 25°C IV 3 3 ns
Output Duty Cycle Error6 25°C I
Rise/Fall Time, 5 pF Load 25°C V 2 2 ns
Toggle Rate, High Z Load 25°C IV 300 350 300 350 MHz
Toggle Rate, 50 Ω Load 25°C IV 375 400 375 400 MHz
Output Cycle-to-Cycle Jitter7 25°C IV 4.0 4.0 ps rms
COMPARATOR NARROWBAND SFDR
8
10 MHz (± 1 MHz) 25°C V 84 84 dBc
10 MHz (± 250 MHz) 25°C V 84 84 dBc
10 MHz (± 50 kHz) 25°C V 92 92 dBc
41 MHz (± 1 MHz) 25°C V 76 76 dBc
41 MHz (± 250 kHz) 25°C V 82 82 dBc
41 MHz (± 50 kHz) 25°C V 89 89 dBc
119 MHz (± 1 MHz) 25°C V 73 dBc
119 MHz (± 250 kHz) 25°C V 73 dBc
119 MHz (± 50 kHz) 25°C V 83 dBc
Temp
Test
Level
AD9852ASQ
Min Typ Max
AD9852AST
Min Typ Max Unit
25°C IV 33 33
SysClk
cycles
SysClk
cycles
SysClk
cycles
SysClk
cycles
SysClk
cycles
SysClk
cycles
SysClk
cycles
SysClk
cycles
−10
± 1 +10
± 1 +10 %
−10
Rev. C | Page 5 of 48
AD9852
Parameter
Temp
Test
Level
AD9852ASQ
Min Typ Max
AD9852AST
Min Typ Max
CLOCK GENERATOR OUTPUT JITTER8
5 MHz A
40 MHz A
100 MHz A
25°C V 23 23 ps rms
OUT
25°C V 12 12 ps rms
OUT
25°C V 7 7 ps rms
OUT
PARALLEL I/O TIMING CHARACTERISTICS
T
(Address Setup Time to WR Signal Active)
ASU
T
(Address Hold Time to WR Signal Inactive)
ADHW
T
(Data Setup Time to WR Signal Inactive)
DSU
T
(Data Hold Time to WR Signal Inactive)
DHD
T
(WR Signal Minimum Low Time)
WRLOW
T
(WR Signal Minimum High Time)
WRHIGH
Full IV 8.0 7.5 8.0 7.5 ns
Full IV 0 0 ns
Full IV 3.0 1.6 3.0 1.6 ns
Full IV 0 0 ns
Full IV 2.5 1.8 2.5 1.8 ns
Full IV 7 7 ns
TWR (Minimum WRITE Time) Full IV 10.5 10.5 ns
T
(Address to Data Valid Time) Full V 15 15 15 15 ns
ADV
T
(Address Hold Time to RD Signal Inactive)
ADHR
T
(RD Low-to-Output Valid)
RDLOV
T
(RD High-to-Data Three-State)
RDHOZ
Full IV 5 5 ns
Full IV 15 15 ns
Full IV 10 10 ns
SERIAL I/O TIMING CHARACTERISTICS
T
(CS Setup Time)
PRE
T
(Period of Serial Data Clock) Full IV 100 100 ns
SCLK
T
(Serial Data Setup Time) Full IV 30 30 ns
DSU
T
(Serial Data Clock Pulse Width High) Full IV 40 40 Ns
SCLKPWH
T
(Serial Data Clock Pulse Width Low) Full IV 40 40 Ns
SCLKPWL
T
(Serial Data Hold Time) Full IV 0 0 Ns
DHLD
Full IV 30 30 ns
TDV (Data Valid Time) Full V 30 30 ns
CMOS LOGIC INPUTS 9
Logic 1 Voltage 25°C I 2.2 2.2 V
Logic 0 Voltage 25°C I 0.8 0.8 V
Logic ” Current 25°C IV ± 5 ± 12 µA
Logic 0 Current 25°C IV ± 5 ± 12 µA
Input Capacitance 25°C V 3 3 pF
POWER SUPPLY
10
+VS Current11 25°C I 815 922 585 660 mA
+VS Current12 25°C I 640 725 465 520 mA
+VS Current13 25°C I 585 660 425 475 mA
P
11 25°C I 2.70 3.20 1.93 2.39 W
DISS
P
12 25°C I 2.12 2.52 1.53 1.81 W
DISS
P
13 25°C I 1.93 2.29 1.40 1.65 W
DISS
P
Power-Down Mode 25°C I 1 50 1 50 mW
DISS
1
The reference clock inputs are configured to accept a 1 V p-p (typical) dc offset square or sine waves centered at one-half the applied VDD or a 3 V TTL-level pulse input.
2
An internal 400 mV p-p differential voltage swing equates to 200 mV p-p applied to both REFCLK input pins.
3
Pipeline delays of each individual block are fixed; however, if the eight top MSBs of a tuning word are all zeros, the delay appears appear longer. This is due to
insufficient phase accumulation per a system clock period to produce enough LSB amplitude to the D/A converter.
4
If a feature such as inverse sinc, which has 16 pipeline delays, can be bypassed, the total delay is reduced by that amount.
5
The I/O Update CLK transfers data from the I/O port buffers to the programming registers. This transfer takes system clocks to perform.
6
Change in duty cycle from 1 MHz to 100 MHz with 1 V p-p sine wave input and 0.5 V threshold.
7
Represents comparator’s inherent cycle-to-cycle jitter contribution. Input signal is a 1 V, 40 MHz square wave. Measurement device Wavecrest DTS – 2075.
8
Comparator input originates from analog output section via external 7-pole elliptic LPF. Single-ended input, 0.5 V p-p. Comparator output terminated in 50 Ω.
9
Avoid overdriving digital inputs. (Refer to equivalent circuits in .) Figure 3
10
Simultaneous operation at the maximum ambient temperature of 85°C and the maximum internal clock frequency of 200 MHz for the 80-lead LQFP, or 300 MHz for
the thermally enhanced 80-lead LQFP may cause the maximum die junction temperature of 150°C to be exceeded. Refer to the Power Dissipation and Thermal
Considerations section for derating and thermal management information.
11
All functions engaged.
12
All functions except inverse sinc engaged.
13
All functions except inverse sinc and digital multipliers engaged.
Unit
Rev. C | Page 6 of 48
AD9852
ABSOLUTE MAXIMUM RATINGS
Table 2.
Parameter Rating
Maximum Junction Temperature 150°C
V
S
Digital Inputs
Digital Output Current 5 mA
Storage Temperature
Operating Temperature
Lead Temperature (Soldering, 10 s) 300°C
Maximum Clock Frequency (ASQ) 300 MHz
Maximum Clock Frequency (AST) 200 MHz
θJA (ASQ) 16°C/W
θJC (ASQ) 2°C/W
θJA (AST) 38°C/W
4 V
−0.7 V to +V
−65°C to +150°C
−40°C to +85°C
S
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only and functional operation of the device at these or
any other condition s above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
EXPLANATION OF TEST LEVELS
Tes t Le v el
1. 100% production tested.
2. Sample tested only.
3. Parameter is guaranteed by design and characterization
testing.
4. Parameter is a typical value only.
5. Devices are 100% production tested at 25°C and
guaranteed by design and characterization testing for
industrial operating temperature range.
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on
the human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
6-bit parallel address inputs for program registers. Used only in parallel programming mode. A0, A1, and
A2 have a second function when the serial programming mode is selected. See following descriptions.
17
A2/IO
RESET
Allows an IO RESET of the serial communications bus that is unresponsive due to improper
programming protocol. Resetting the serial bus in this manner does not affect previous programming,
nor does it invoke the “default” programming values seen in Table 7. Active HIGH.
18 A1/SDO Unidirectional serial data output for use in 3-wire serial communication mode.
19 A0/SDIO Bidirectional serial data input/output for use in 2-wire serial communication mode.
20 I/O UD CLK
Bidirectional I/O update CLK. Direction is selected in control register. If selected as an input, a rising edge
transfers the contents of the I/O port buffers to the programming registers. If I/O UD is selected as an
output (default), an output pulse (low to high) of eight system clock cycle duration indicates that an
internal frequency update has occurred.
21 WRB/SCLK
Write parallel data to I/O port buffers. Shared function with SCLK. Serial clock signal associated with the
serial programming bus. Data is registered on the rising edge. This pin is shared with WRB when the
parallel mode is selected. Mode dependent on Pin 70 (S/P Select).
Rev. C | Page 8 of 48
AD9852
Pin Number Mnemonic Function
22 RDB/CSB
29
FSK/BPSK/
HOLD
30
OUTPUT
SHAPED
KEYING
31, 32, 37, 38, 44,
AVDD
50, 54, 60, 65
33, 34, 39, 40, 41,
AGND Connections for analog circuitry ground return. Same potential as DGND.
45, 46, 47, 53, 59,
62, 66, 67
36 VOUT
42 VINP Voltage input positive. The internal high speed comparator’s noninverting input.
43 VINN Voltage input negative. The internal high speed comparator’s inverting input.
48 IOUT1 Unipolar current output of the cosine DAC. (Refer to Figure 3.)
49 IOUT1B Complementary unipolar current output of the cosine DAC.
51 IOUT2B Complementary unipolar current output of the control DAC.
52 IOUT2 Unipolar current output of the control DAC.
55 DACBP
56 DAC R
61 PLL FILTER
64
DIFF CLK
ENABLE
68 REFCLKB
69 REFCLK
70 S/P SELECT Selects between serial programming mode (logic low) and parallel programming mode (logic high).
71
MASTER
RESET
AVDD
Read parallel data from programming registers. Shared function with CSB. Chip select signal associated
with the serial programming bus. Active low. This pin is shared with RDB when the parallel mode is
selected.
Multifunction pin according to the mode of operation selected in the programming control register. If in
the FSK mode, logic low selects F1, logic high selects F2. If in the BPSK mode, logic low selects Phase 1,
logic high selects Phase 2. In chirp mode, logic high engages the HOLD function causing the frequency
accumulator to halt at its current location. To resume or commence chirp, logic low is asserted.
Must first be selected in the programming control register to function. A logic high causes the cosine
DAC outputs to ramp up from zero-scale to full-scale amplitude at a preprogrammed rate. Logic low
causes the full-scale output to ramp down to zero scale at the preprogrammed rate.
Connections for the analog circuitry supply voltage. Nominally 3.3 V more positive than AGND and
DGND.
Internal high speed comparator’s noninverted output pin. Designed to drive 10 dBm to 50 Ω loads as
well as standard CMOS logic levels.
Common bypass capacitor connection for both DACs. A 0.01 µF chip cap from this pin to AVDD improves
harmonic distortion and SFDR slightly. No connect is permissible (slight SFDR degradation).
Common connection for both DACs to set the full-scale output current. R
SET
= 39.9/ I
SET
. Normal R
OUT
range is from 8 kΩ (5 mA) to 2 kΩ (20 mA).
This pin provides the connection for the external zero compensation network of the REFCLK multiplier’s
PLL loop filter. The zero compensation network consists of a 1.3 kΩ resistor in series with a 0.01 µF
capacitor. The other side of the network should be connected to AVDD as close as possible to Pin 60. For
optimum phase noise performance, the REFCLK multiplier can be bypassed by setting the “Bypass PLL”
bit in control register 1E.
Differential REFCLK ENABLE. A high level of this pin enables the differential clock inputs, REFCLK and
REFCLKB (Pins 69 and 68, respectively).
The COMPLEMENTARY (180 Degrees Out-of-Phase) differential clock signal. User should tie this pin high
or low when single-ended clock mode is selected. Same signal levels as REF CLK.
Single-ended (CMOS logic levels required) reference clock input or one of two differential clock signals.
In differential reference clock mode, both inputs can be CMOS logic levels or have greater than
400 mV p-p square or sine waves centered about 1.6 V dc.
Initializes the serial/parallel programming bus to prepare for user programming; sets programming
registers to a “do-nothing” state defined by the default values seen in Table 7. Active on logic high.
Asserting MASTER RESET is essential for proper operation upon power-up.
DVDD
SET
AVDD
I
OUTIOUTB
MUST TERMINATE OUTPUTS
FOR CURRENT FLOW. DO
NOT EXCEED THE OUTPUT
VOLTAGE COMPLIANCE RATING.
A. DAC OutputsB. Comparator OutputC. Comparator InputD. Digital Inputs
COMPARATOR
OUT
Figure 3. Equivalent Input and Output Circuits
Rev. C | Page 9 of 48
VINP/
VINN
AVDD
DIGITAL
IN
AVOID OVERDRIVING
DIGITAL INPUTS. FORWARD
BIASING ESD DIODES MAY
COUPLE DIGITAL NOISE
ONTO POWER PINS.
00634-C-003
AD9852
–
TYPICAL PERFORMANCE CHARACTERISTICS
Figure 4 to Figure 9 indicate the wideband harmonic distortion performance of the AD9852 from 19.1 MHz to 119.1 MHz fundamental
output, reference clock = 30 MHz, REFCLK multiplier = 10. Each graph plotted from 0 MHz to 150 MHz (Nyquist).
–10
–20
–30
–40
–50
–60
–70
–80
–90
–100
0
START 0Hz
15MHz/STOP 150MHz
00634-C-004
–10
–20
–30
–40
–50
–60
–70
–80
–90
–100
0
START 0Hz
15MHz/STOP 150MHz
00634-C-007
–10
–20
–30
–40
–50
–60
–70
–80
–90
–100
–10
–20
–30
–40
–50
–60
–70
–80
–90
–100
0
START 0Hz
0
START 0Hz
Figure 4. Wideband SFDR, 19.1 MHz
15MHz/STOP 150MHz
Figure 5. Wideband SFDR, 39.1 MHz
15MHz/STOP 150MHz
Figure 6. Wideband SFDR, 59.1 MHz
00634-C-005
00634-C-006
–10
–20
–30
–40
–50
–60
–70
–80
–90
100
–10
–20
–30
–40
–50
–60
–70
–80
–90
–100
0
START 0Hz
0
START 0Hz
Figure 7. Wideband SFDR, 79.1 MHz
15MHz/STOP 150MHz
Figure 8. Wideband SFDR, 99.1 MHz
15MHz/STOP 150MHz
Figure 9. Wideband SFDR, 119.1 MHz
00634-C-008
00634-C-009
Rev. C | Page 10 of 48
AD9852
–
Figure 10 to Figure 13 show the trade-off in elevated noise floor, increased phase noise, and discrete spurious energy when the internal
REFCLK multiplier circuit is engaged. Plots with wide (1 MHz) and narrow (50 kHz) spans are shown.
Compare the noise floor of Figure 11 and Figure 13 to Figure 14 and Figure 15. The improvement seen in Figure 11 and Figure 13 is a
direct result of sampling the fundamental at a higher rate. Sampling at a higher rate spreads the quantization noise of the DAC over a
wider bandwidth, which effectively lowers the noise floor.
Figure 17 shows the narrow-band performance of the AD9852 when operating with a 20 MHz reference clock and the REFCLK multiplier
enabled at 10×vs. a 200 MHz reference clock with REFCLK multiplier bypassed.
0
–10
–20
–30
–40
–50
–60
–70
–80
–90
–100
CENTER 112.469MHz
50kHz/SPAN 500kHz
00634-C-016
–90
–100
–110
–120
–130
–140
PHASE NOISE (dBc/Hz)
–150
A
= 5MHz
OUT
–160
101M100100k10k1k
A
= 80MHz
OUT
FREQUENCY (Hz)
00634-C-019
Figure 16. A Slight Change in Tuning Word Yields Dramatically Better Results.
112.469 MHz with All Spurs Shifted Out-of-Band. RECLK is 300 MHz.