Analog Devices AD9850 Datasheet

REV. E
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a
CMOS, 125 MHz
Complete DDS Synthesizer
FUNCTIONAL BLOCK DIAGRAM
CLOCK OUT
CLOCK OUT
ANALOG IN
ANALOG OUT
DAC R
SET
+V
S
GND
COMPARATOR
PHASE
AND
CONTROL
WORDS
SERIAL
LOAD
32-BIT
TUNING
WORD
HIGH SPEED
DDS
FREQUENCY/PHASE
DATA REGISTER
PARALLEL
LOAD
DATA INPUT REGISTER
AD9850
10-BIT
DAC
REF
CLOCK IN
MASTER
RESET
WORD LOAD
CLOCK
FREQUENCY
UPDATE/
DATA REGISTER
RESET
1-BIT
40 LOADS
8-BITS 5 LOADS
FREQUENCY, PHASE, AND CONTROL
DATA INPUT
GENERAL DESCRIPTION
The AD9850 is a highly integrated device that uses advanced DDS technology coupled with an internal high speed, high performance, D/A converter and comparator, to form a com­plete digitally programmable frequency synthesizer and clock generator function. When referenced to an accurate clock source, the AD9850 generates a spectrally pure, frequency/ phase-programmable, analog output sine wave. This sine wave can be used directly as a frequency source or converted to a square wave for agile-clock generator applications. The AD9850’s innovative high speed DDS core provides a 32-bit frequency tuning word, which results in an output tuning resolution of
0.0291 Hz, for a 125 MHz reference clock input. The AD9850’s circuit architecture allows the generation of output frequencies of up to one-half the reference clock frequency (or
62.5 MHz), and the output frequency can be digitally changed (asynchronously) at a rate of up to 23 million new frequencies per second. The device also provides five bits of digitally controlled phase modulation, which enables phase shifting of its output in increments of 180°, 90°, 45°, 22.5°, 11.25° and any
combination thereof. The AD9850 also contains a high speed comparator that can be configured to accept the (externally) filtered output of the DAC to generate a low jitter square wave output. This facilitates the device’s use as an agile clock gen­erator function.
The frequency tuning, control, and phase modulation words are loaded into the AD9850 via a parallel byte or serial loading format. The parallel load format consists of five iterative loads of an 8-bit control word (byte). The first byte controls phase modulation, power-down enable, and loading format; bytes 2–5 comprise the 32-bit frequency tuning word. Serial loading is accomplished via a 40-bit serial data stream on a single pin. The AD9850 Complete-DDS uses advanced CMOS technology to provide this breakthrough level of functionality and performance on just 155 mW of power dissipation (+3.3 V supply).
The AD9850 is available in a space saving 28-lead SSOP, sur­face mount package. It is specified to operate over the extended industrial temperature range of –40°C to +85°C.
FEATURES 125 MHz Clock Rate On-Chip High Performance DAC and High Speed
Comparator
DAC SFDR > 50 dB @ 40 MHz A
OUT
32-Bit Frequency Tuning Word Simplified Control Interface: Parallel Byte or Serial
Loading Format Phase Modulation Capability +3.3 V or +5 V Single Supply Operation Low Power: 380 mW @ 125 MHz (+5 V)
Low Power: 155 mW @ 110 MHz (+3.3 V)
Power-Down Function Ultrasmall 28-Lead SSOP Packaging
APPLICATIONS Frequency/Phase–Agile Sine-Wave Synthesis Clock Recovery and Locking Circuitry for Digital
Communications Digitally Controlled ADC Encode Generator Agile Local Oscillator Applications
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 781/329-4700 World Wide Web Site: http://www.analog.com Fax: 781/326-8703 © Analog Devices, Inc., 1999
AD9850BRS
Parameter Temp Test Level Min Typ Max Units
CLOCK INPUT CHARACTERISTICS
Frequency Range
+5 V Supply Full IV 1 125 MHz +3.3 V Supply Full IV 1 110 MHz
Pulsewidth High/Low
+5 V Supply +25°C IV 3.2 ns +3.3 V Supply +25°C IV 4.1 ns
DAC OUTPUT CHARACTERISTICS
Full-Scale Output Current
R
SET
= 3.9 k +25°C V 10.24 mA
R
SET
= 1.95 k +25°C V 20.48 mA Gain Error +25°C I –10 +10 % FS Gain Temperature Coefficient Full V 150 ppm/°C Output Offset +25°CI 10 µA Output Offset Temperature Coefficient Full V 50 nA/°C Differential Nonlinearity +25°C I 0.5 0.75 LSB Integral Nonlinearity +25°C I 0.5 1 LSB Output Slew Rate (50 , 2 pF Load) +25°C V 400 V/µs Output Impedance +25°C IV 50 120 kΩ Output Capacitance +25°CIV 8 pF Voltage Compliance +25°C I 1.5 V Spurious-Free Dynamic Range (SFDR):
Wideband (Nyquist Bandwidth)
1 MHz Analog Out +25°C IV 63 72 dBc 20 MHz Analog Out +25°C IV 50 58 dBc 40 MHz Analog Out +25°C IV 46 54 dBc
Narrowband
40.13579 MHz ± 50 kHz +25°C IV 80 dBc
40.13579 MHz ± 200 kHz +25°C IV 77 dBc
4.513579 MHz ± 50 kHz/20.5 MHz CLK +25°C IV 84 dBc
4.513579 MHz ± 200 kHz/20.5 MHz CLK +25°C IV 84 dBc
COMPARATOR INPUT CHARACTERISTICS
Input Capacitance +25°CV 3 pF Input Resistance +25°C IV 500 kΩ Input Current +25°C I –12 +12 µA Input Voltage Range +25°CIV 0 V
DD
V
Comparator Offset* Full VI 30 30 mV
COMPARATOR OUTPUT CHARACTERISTICS
Logic “1” Voltage +5 V Supply Full VI +4.8 V Logic “1” Voltage +3.3 V Supply Full VI +3.1 V Logic “0” Voltage Full VI +0.4 V Propagation Delay, +5 V Supply (15 pF Load) +25°C V 5.5 ns Propagation Delay, +3.3 V Supply (15 pF Load) +25°CV 7 ns Rise/Fall Time, +5 V Supply (15 pF Load) +25°CV 3 ns Rise/Fall Time, +3.3 V Supply (15 pF Load) +25°C V 3.5 ns Output Jitter (p-p) +25°CV 80 ps
CLOCK OUTPUT CHARACTERISTICS
Clock Output Duty Cycle (Clk Gen. Config.) +25°C IV 50 ± 10 %
REV. E
–2–
(VS = +5 V 5% except as noted, R
SET
= 3.9 k⍀)
AD9850–SPECIFICATIONS
AD9850BRS
Parameter Temp Test Level Min Typ Max Units
CMOS LOGIC INPUTS (Including CLKIN)
Logic “1” Voltage, +5 V Supply +25°C I 3.5 V Logic “1” Voltage, +3.3 V Supply +25°C I 3.0 V Logic “0” Voltage +25°C I 0.4 V Logic “1” Current +25°CI 12 µA Logic “0” Current +25°CI 12 µA Input Capacitance +25°CV 3 pF
POWER SUPPLY (A
OUT
= 1/3 CLKIN)
+V
S
Current @:
62.5 MHz Clock, +3.3 V Supply Full VI 30 48 mA 110 MHz Clock, +3.3 V Supply Full VI 47 60 mA
62.5 MHz Clock, +5 V Supply Full VI 44 64 mA 125 MHz Clock, +5 V Supply Full VI 76 96 mA
P
DISS
@:
62.5 MHz Clock, +3.3 V Supply Full VI 100 160 mW 110 MHz Clock, +3.3 V Supply Full VI 155 200 mW
62.5 MHz Clock, +5 V Supply Full VI 220 320 mW 125 MHz Clock, +5 V Supply Full VI 380 480 mW
P
DISS
Power-Down Mode +5 V Supply Full V 30 mW +3.3 V Supply Full V 10 mW
NOTES *Tested by measuring output duty cycle variation.
Specifications subject to change without notice.
TIMING CHARACTERISTICS*
AD9850BRS
Parameter Temp Test Level Min Typ Max Units
t
DS
(Data Setup Time) Full IV 3.5 ns
t
DH
(Data Hold Time) Full IV 3.5 ns
t
WH
(W_CLK min. Pulsewidth High) Full IV 3.5 ns
t
WL
(W_CLK min. Pulsewidth Low) Full IV 3.5 ns
t
WD
(W_CLK Delay After FQ_UD) Full IV 7.0 ns
t
CD
(CLKIN Delay After FQ_UD) Full IV 3.5 ns
t
FH
(FQ_UD High) Full IV 7.0 ns
t
FL
(FQ_UD Low) Full IV 7.0 ns
t
CF
(Output Latency from FQ_UD) Frequency Change Full IV 18 CLKIN Cycles Phase Change Full IV 13 CLKIN Cycles
t
FD
(FQ_UD Min. Delay After W_CLK) Full IV 7.0 ns
t
RH
(CLKIN Delay After RESET Rising Edge) Full IV 3.5 ns
t
RL
(RESET Falling Edge After CLKIN) Full IV 3.5 ns
t
RS
(Minimum RESET Width) Full IV 5 CLKIN Cycles
t
OL
(RESET Output Latency) Full IV 13 CLKIN Cycles
t
RR
(Recovery from RESET) Full IV 2 CLKIN Cycles Wake-Up Time from Power-Down Mode +25°CV 5 µs
NOTES *Control functions are asynchronous with CLKIN.
Specifications subject to change without notice.
(VS = +5 V 5% except as noted, R
SET
= 3.9 k⍀)
REV. E
–3–
AD9850
AD9850
–4–
REV. E
ABSOLUTE MAXIMUM RATINGS*
Maximum Junction Temperature . . . . . . . . . . . . . . . +165°C
V
DD
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +6 V
Digital Inputs . . . . . . . . . . . . . . . . . . . . . . . . . –0.7 V to +V
S
Digital Output Continuous Current . . . . . . . . . . . . . . . 5 mA
DAC Output Current . . . . . . . . . . . . . . . . . . . . . . . . . 30 mA
Storage Temperature . . . . . . . . . . . . . . . . . . –65°C to +150°C
Operating Temperature . . . . . . . . . . . . . . . . . –40°C to +85°C
Lead Temperature (Soldering 10 sec) . . . . . . . . . . . . +300°C
SSOP θ
JA
Thermal Impedance . . . . . . . . . . . . . . . . . . 82°C/W
*Absolute maximum ratings are limiting values, to be applied individually, and
beyond which the serviceability of the circuit may be impaired. Functional operability under any of these conditions is not necessarily implied. Exposure of absolute maximum rating conditions for extended periods of time may affect device reliability.
EXPLANATION OF TEST LEVELS
Test Level
I 100% Production Tested. III – Sample Tested Only. IV – Parameter is guaranteed by design and characterization
testing. V Parameter is a typical value only. VI – All devices are 100% production tested at +25°C.
100% production tested at temperature extremes for
military temperature devices; guaranteed by design and
characterization testing for industrial devices.
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the human body and test equipment and can discharge without detection. Although the AD9850 features proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance degradation or loss of functionality.
Application Note: Users are cautioned not to apply digital input signals prior to power-up of this device. Doing so may r
esult in a latch-up condition.
ORDERING GUIDE
Model Temperature Range Package Description Package Option
AD9850BRS –40°C to +85°C Shrink Small Outline (SSOP) RS-28
WARNING!
ESD SENSITIVE DEVICE
AD9850
–5–
REV. E
Table I. Lead Function Descriptions
Pin No. Mnemonic Function
4–1, D0–D7 8-Bit Data Input. This is the 8-bit data port for iteratively loading the 32-bit frequency and 8-bit phase/ 28–25 control word. D7 = MSB; D0 = LSB. D7 (Pin 25) also serves as the input pin for the 40-bit serial data word.
5, 24 DGND Digital Ground. These are the ground return leads for the digital circuitry.
6, 23 DVDD Supply Voltage Leads for digital circuitry.
7 W_CLK Word Load Clock. This clock is used to load the parallel or serial frequency/phase/control words.
8 FQ_UD Frequency Update. On the rising edge of this clock, the DDS will update to the frequency (or phase)
loaded in the data input register, it then resets the pointer to Word 0.
9 CLKIN Reference Clock Input. This may be a continuous CMOS-level pulse train or sine input biased at
1/2 V supply. The rising edge of this clock initiates operation.
10, 19 AGND Analog Ground. These leads are the ground return for the analog circuitry (DAC and comparator).
11, 18 AVDD Supply Voltage for the analog circuitry (DAC and comparator).
12 R
SET
This is the DAC’s external R
SET
connection. This resistor value sets the DAC full-scale output current. For
normal applications (F
S IOUT
= 10 mA), the value for R
SET
is 3.9 k connected to ground. The R
SET/IOUT
relationship is: I
OUT
= 32 (1.248 V/R
SET
).
13 QOUTB Output Complement. This is the comparator’s complement output.
14 QOUT Output True. This is the comparator’s true output.
15 VINN Inverting Voltage Input. This is the comparator’s negative input.
16 VINP Noninverting Voltage Input. This is the comparator’s positive input.
17 DACBL (NC) DAC Baseline. This is the DAC baseline voltage reference; this lead is internally bypassed and should
normally be considered a “no connect” for optimum performance.
20 IOUTB The Complementary Analog Output of the DAC.
21 IOUT Analog Current Output of the DAC.
22 RESET Reset. This is the master reset function; when set high it clears all registers (except the input register) and
the DAC output will go to Cosine 0 after additional clock cycles—see Figure 19.
PIN CONFIGURATIONS
17
16
15
20
19
18
28
27
26
25
24
23
22
21
14
13
12
11
10
9
8
1
2
3
4
7
6
5
TOP VIEW
(Not to Scale)
AD9850
D3
D7 MSB/SERIAL LOAD
D6
D5
D4
D2
D1
LSB D0
RESET
DVDD
DGND
DGND
DVDD
W
CLK
FQ
UD
CLKIN
AGND AGND
IOUTB
IOUT
AVDD
R
SET
QOUTB
QOUT
AVDD
VINN
VINP
DACBL (NC)
NC = NO CONNECT
CH1 S
Spectrum
10dB/REF
–8.6dBm
76.642 dB
Fxd
AD9850
CLOCK 125MHz
RBW # 100Hz START 0Hz
VBW 100Hz ATN # 30dB SWP 762 sec
STOP 62.5MHz
0
Figure 1. SFDR, CLKIN = 125 MHz/f
OUT
= 1 MHz
CH1
S Spectrum
10dB/REF
–10dBm
54.818 dB
Fxd
AD9850
CLOCK 125MHz
RBW # 300Hz START 0Hz
VBW 300Hz ATN # 30dB SWP 182.6 sec
STOP 62.5MHz
0
Figure 2. SFDR, CLKIN = 125 MHz/f
OUT
= 41 MHz
Tek Run: 100GS/s ET Sample
Ch 1 500mV M 20.0ns Ch 1 1.58V
D 500ps Runs After
1
: 300ps @: 25.26ns
Figure 3. Typical Comparator Output Jitter, AD9850 Configured as Clock Generator w/42 MHz LP Filter (40 MHz A
OUT
/125 MHz CLKIN)
AD9850–Typical Performance Characteristics
–6–
REV. E
CH1
S Spectrum
10dB/REF
–10dBm
59.925 dB
Fxd
AD9850
CLOCK 125MHz
RBW # 300Hz START 0Hz
VBW 300Hz ATN # 30dB SWP 182.6 sec
STOP 62.5MHz
0
Figure 4. SFDR, CLKIN = 125 MHz/f
OUT
= 20 MHz
CH1 S
Spectrum
12dB/REF
0dBm –85.401 dB
Mkr
AD9850
RBW # 3Hz CENTER 4.513579MHz
VBW 3Hz ATN # 20dB SWP 399.5 sec
SPAN 400kHz
0
–23 kHz
Figure 5. SFDR, CLKIN = 20.5 MHz/f
OUT
= 4.5 MHz
OFFSET FROM 5MHz CARRIER Hz
105
110
155
115
120
125
130
135
140
145
150
100 100k1k
dBc
10k
PN.3RD
Figure 6. Output Residual Phase Noise (5 MHz A
OUT
/
125 MHz CLKIN)
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