On-chip VCO tunes from 2.55 GHz to 2.95 GHz
External VCO/VCXO to 2.4 GHz optional
One differential or two single-ended reference inputs
Reference monitoring capability
Auto and manual reference switchover/holdover modes
Autorecover from holdover
Accepts references to 250 MHz
Programmable delays in path to PFD
Digital or analog lock detect, selectable
3 pairs of 1.6 GHz LVPECL outputs
Each pair shares 1 to 32 divider with coarse phase delay
Additive output jitter 225 f
Channel-to-channel skew paired outputs <10 ps
2 pairs of 800 MHz LVDS clock outputs
Each pair shares two cascaded 1 to 32 dividers with coarse
phase del
ay
Additive output jitter 275 f
Fine delay adjust (ΔT) on each LVDS output
Eight 250 MHz CMOS outputs (two per LVDS output)
Automatic synchronization of all outputs on power-up
Manual synchronization of outputs as needed
Serial control port
64-lead LFCSP
APPLICATIONS
Low jitter, low phase noise clock distribution
Clocking high speed ADCs, DACs, DDSs, DDCs, DUCs, MxFEs
High performance wireless transceivers
High performance instrumentation
Broadband infrastructure
AT E
GENERAL DESCRIPTION
The AD9516-01 provides a multi-output clock distribution
function with subpicosecond jitter performance, along with an onchip PLL and VCO. The on-chip VCO tunes from 2.55 GHz to
2.95 GHz. Optionally, an external VCO/VCXO of up to 2.4 GHz
may be used.
The AD9516-0 emphasizes low jitter and phase noise to
max
imize data converter performance, and can benefit other
applications with demanding phase noise and jitter requirements.
rms
S
rms
S
Integrated 2.8 GHz VCO
AD9516-0
FUNCTIONAL BLOCK DIAGRAM
PLL
ΔT
ΔT
ΔT
ΔT
LF
STATUS
MONITOR
VCO
LVPECL
LVPECL
LVPECL
LVDS/CMOS
LVDS/CMOS
AD9516-0
CP
REF1
REFIN
REF2
SWITCHOVER
AND MONI TOR
CLK
DIV/ΦDIV/Φ
DIV/ΦDIV/Φ
SERIAL CONT ROL PORT
DIVIDER
AND MUXs
DIV/Φ
DIV/Φ
DIV/Φ
AND
DIGITAL LOGIC
Figure 1.
The AD9516-0 features six LVPECL outputs (in three pairs);
four LVDS outputs (in two pairs); and eight CMOS outputs
(two per LVDS output). The LVPECL outputs operate to
1.6 GHz, the LVDS outputs operate to 800 MHz, and the CMOS
outputs operate to 250 MHz.
Each pair of outputs has dividers that allow both the divide
atio and coarse delay (or phase) to be set. The range of division
r
for the LVPECL outputs is 1 to 32. The LVDS/CMOS outputs
allow a range of divisions up to a maximum of 1024.
The AD9516-0 is available in a 64-lead LFCSP and can be
op
erated from a single 3.3 V supply. An external VCO, which
requires an extended voltage range, can be accommodated
by connecting the charge pump supply (VCP) to 5.5 V. A
separate LVPECL power supply can be from 2.375 V to 3.6 V.
The AD9516-0 is specified for operation over the industrial
nge of −40°C to +85°C.
ra
1
AD9516 is used throughout to refer to all the members of the AD9516
family. However, when AD9516-0 is used it is referring to that specific
member of the AD9516 family.
OUT0
OUT1
OUT2
OUT3
OUT4
OUT5
OUT6
OUT7
OUT8
OUT9
06419-001
Rev. 0
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Anal og Devices for its use, nor for any infringements of patents or ot her
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarks and registered trademarks are the property of their respective owners.
BYPASS Pin Capacitor 220 nF Bypass for internal LDO regulator; necessary for LDO stability; connect to ground
PLL CHARACTERISTICS
Table 2.
Parameter Min Typ Max Unit Test Conditions/Comments
VCO (ON-CHIP)
Frequency Range 2550 2950 MHz See Figure 15
VCO Gain (K
Tunin g Volt age (VT) 0.5 VCP − 0.5 V
Frequency Pushing (Open-Loop) 1 MHz/V
Phase Noise @ 100 kHz Offset −105 dBc/Hz f = 2800 MHz
Phase Noise @ 1 MHz Offset −123 dBc/Hz f = 2800 MHz
REFERENCE INPUTS
Differential Mode (REFIN, REFIN)
Input Frequency 0 250 MHz
Input Sensitivity 250 mV p-p
Self-Bias Voltage, REFIN 1.35 1.60 1.75 V Self-bias voltage of REFIN
Self-Bias Voltage, REFIN
Input Resistance, REFIN 4.0 4.8 5.9 kΩ Self-biased
Input Resistance, REFIN
Dual Single-Ended Mode (REF1, REF2) Two single-ended CMOS-compatible inputs
Input Frequency (AC-Coupled) 20 250 MHz Slew rate > 50 V/μs
Input Frequency (DC-Coupled) 0 250 MHz Slew rate > 50 V/μs; CMOS levels
Input Sensitivity (AC-Coupled) 0.8 V p-p Should not exceed VS p-p
Input Logic High 2.0 V
Input Logic Low 0.8 V
Input Current −100 +100 μA
Input Capacitance 2 pF
) 50 MHz/V See Figure 10
VCO
= 3.3 V ± 5%; VS ≤ VCP ≤ 5.25 V; TA = 25°C; R
S_LVPECL
V This is nominally 2.5 V to 3.3 V ± 5%
S
SET
5.25 V This is nominally 3.3 V to 5.0 V ± 5%
Sets internal CP current range, nominally 4.8 mA (CP_lsb = 600 μA);
tual current can be calculated by: CP_lsb = 3.06/CPRSET; connect to ground
ac
1.30 1.50 1.60 V
4.4 5.3 6.4 kΩ Self-biased
= 4.12 kΩ; CP
and TA (−40°C to +85°C) variation.
S
≤ VS when using internal VCO; outside of this
V
CP
= 5.1 kΩ,
RSET
range, the CP spurs may increase due to CP up/
down mismatch
Differential mode (can accommodate singleended input by ac grounding undriven input)
Frequencies below about 1 MHz should be
coupled; be careful to match V
dc-
(self-bias voltage)
CM
PLL figure of merit will increase with increasing
te; see Figure 14
slew ra
Self-bias voltage of REFIN
1
1
Each pin, REFIN/REFIN
1
1
(REF1/REF2)
Rev. 0 | Page 4 of 84
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Parameter Min Typ Max Unit Test Conditions/Comments
In-Band Phase Noise of the Charge
Pump/Phase Frequency Detector
(In-Band Means Within the LBW
of the PLL)
PLL Figure of Merit (FOM) −220 dBc/Hz
V
P = 1 FD 300 MHz
P = 2 FD 600 MHz
P = 3 FD 900 MHz
P = 2 DM (2/3) 600 MHz
P = 4 DM (4/5) 1000 MHz
P = 8 DM (8/9) 2400 MHz
P = 16 DM (16/17) 3000 MHz
P = 32 DM (32/33) 3000 MHz
@ 500 kHz PFD Frequency −165 dBc/Hz
@ 1 MHz PFD Frequency −162 dBc/Hz
@ 10 MHz PFD Frequency −151 dBc/Hz
@ 50 MHz PFD Frequency −143 dBc/Hz
1.5 % 0.5 < CPV < VCP − 0.5 V
A, B counter input frequency (prescaler
input fr
The PLL in-band phase noise floor is estimated
by measuring the in-band phase noise at the
output of the VCO and subtracting 20log(N)
(where N is the value of the N divider)
Reference slew rate > 0.25 V/ns. FOM +10log (f
is an approximation of the PFD/CP in-band
phase noise (in the flat region) inside the PLL
loop bandwidth. When running closed loop,
the phase noise, as observed at the VCO output,
is increased by 20log(N)
= 5.1 kΩ
RSET
equency divided by P)
PFD
)
Rev. 0 | Page 5 of 84
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Parameter Min Typ Max Unit Test Conditions/Comments
PLL DIGITAL LOCK DETECT WINDOW
Required to Lock (Coincidence of Edges) Selected by 0x17<1:0> and 0x18<4>
Low Range (ABP 1.3 ns, 2.9 ns) 3.5 ns 0x17<1:0> = 00b, 01b,11b; 0x18<4> = 1b
High Range (ABP 1.3 ns, 2.9 ns) 7.5 ns 0x17<1:0> = 00b, 01b, 11b; 0x18<4> = 0b
High Range (ABP 6 ns) 3.5 ns 0x17<1:0> = 10b; 0x18<4> = 0b
To Unlock After Lock (Hysteresis)
Low Range (ABP 1.3 ns, 2.9 ns) 7 ns 0x17<1:0> = 00b, 01b, 11b; 0x18<4> = 1b
High Range (ABP 1.3 ns, 2.9 ns) 15 ns 0x17<1:0> = 00b, 01b, 11b; 0x18<4> = 0b
High Range (ABP 6 ns) 11 ns 0x17<1:0> = 10b; 0x18<4> = 0b
1
REFIN and
2
For reliable operation of the digital lock detect, the period of the PFD frequency must be greater than the unlock-after-lock time.
REFIN
self-bias points are offset slightly to avoid chatter on an open input condition.
CLOCK INPUTS
Table 3.
Parameter Min Typ Max Unit Test Conditions/Comments
CLOCK INPUTS (CLK, CLK)
Input Frequency 0
0
Input Sensitivity, Differential 150 mV p-p
Input Level, Differential 2 V p-p
Input Common-Mode Voltage, V
Input Common-Mode Range, V
Input Sensitivity, Single-Ended 150 mV p-p
Below about 1 MHz, the input should be dc-coupled. Care should be taken to match VCM.
CMR
2
2
Signal available at LD, STATUS, and REFMON pins
when se
lected by appropriate register settings
Differential input
1
2.4 GHz High frequency distribution (VCO divider)
1
1.6 GHz Distribution only (VCO divider bypassed)
Measured at 2.4 GHz. Jitter performance is improved
w rates > 1 V/ns
with sle
Larger voltage swings may turn on the protection
diodes and can degr
CM
1.3 1.57 1.8 V Self-biased; enables ac coupling
ade jitter performance
1.3 1.8 V With 200 mV p-p signal applied; dc-coupled
CLK ac-coupled; CLK
ac-bypassed to RF ground
CLOCK OUTPUTS
Table 4.
Parameter Min Typ Max Unit Test Conditions/Comments
LVPECL CLOCK OUTPUTS Termination = 50 Ω to VS − 2 V
OUT0, OUT1, OUT2, OUT3, OUT4, OUT5
Differential (OUT, OUT
Output Frequency, Maximum 2950 MHz Using direct to output; see Figure 25
Output High Voltage (VOH) VS − 1.12 VS − 0.98 VS − 0.84 V
Output Low Voltage (VOL) VS − 2.03 VS − 1.77 VS − 1.49 V
Output Differential Voltage (VOD) 550 790 980 mV
LVDS CLOCK OUTPUTS Differential termination 100 Ω @ 3.5 mA
OUT6, OUT7, OUT8, OUT9
Differential (OUT, OUT
Output Frequency 800 MHz See Figure 26
Differential Output Voltage (VOD) 247 360 454 mV
Delta V
OD
25 mV
Output Offset Voltage (VOS) 1.125 1.24 1.375 V
Delta V
OS
25 mV
Short-Circuit Current (ISA, ISB) 14 24 mA Output shorted to GND
Rev. 0 | Page 6 of 84
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)
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Parameter Min Typ Max Unit Test Conditions/Comments
Output Frequency 250 MHz see Figure 27
Output Voltage High (VOH) VS − 0.1 V @ 1 mA load
Output Voltage Low (VOL) 0.1 V @ 1 mA load
TIMING CHARACTERISTICS
Table 5.
Parameter Min Typ Max Unit Test Conditions/Comments
LVPECL Termination = 50 Ω to VS − 2 V; level = 810 mV
Output Rise Time, t
Output Fall Time, t
PROPAGATION DELAY, t
High Frequency Clock Distribution Configuration 835 995 1180 ps See Figure 42
Clock Distribution Configuration 773 933 1090 ps See Figure 44
Variation with Temperature 0.8 ps/°C
OUTPUT SKEW, LVPECL OUTPUTS
LVPECL Outputs That Share the Same Divider 5 15 ps
LVPECL Outputs on Different Dividers 13 40 ps
All LVPECL Outputs Across Multiple Parts 220 ps
LVDS Termination = 100 Ω differential; 3.5 mA
Output Rise Time, t
Output Fall Time, t
PROPAGATION DELAY, t
OUT6, OUT7, OUT8, OUT9
For All Divide Values 1.4 1.8 2.1 ns
Variation with Temperature 1.25 ps/°C
OUTPUT SKEW, LVDS OUTPUTS
LVDS Outputs That Share the Same Divider 6 62 ps
LVDS Outputs on Different Dividers 25 150 ps
All LVDS Outputs Across Multiple Parts 430 ps
CMOS Termination = open
Output Rise Time, t
Output Fall Time, t
PROPAGATION DELAY, t
For All Divide Values 1.6 2.1 2.6 ns
Variation with Temperature 2.6 ps/°C
OUTPUT SKEW, CMOS OUTPUTS
CMOS Outputs That Share the Same Divider 4 66 ps
All CMOS Outputs on Different Dividers 28 180 ps
All CMOS Outputs Across Multiple Parts 675 ps
Distribution section only; does not
include PLL and
clock signal
Calculated from SNR of ADC method.
C not used for even divides
DC
Calculated from SNR of ADIC method.
C on
DC
Distribution section only; does not
include PLL and
clock signal
Calculated from SNR of ADC method.
C not used for even divides
DC
Distribution section only; does not
include PLL and
clock signal
Calculated from SNR of ADC method.
C not used for even divides
DC
VCO; rising edge of
VCO; rising edge of
VCO; rising edge of
CLOCK OUTPUT ADDITIVE TIME JITTER (VCO DIVIDER USED)
Table 12.
Parameter Min Typ Max Unit Test Conditions/Comments
LVPECL OUTPUT ADDITIVE TIME JITTER
CLK = 2.4 GHz; VCO Div = 2; LVPECL = 100 MHz;
Divider = 12; Duty-Cycle Correction = Off
LVDS OUTPUT ADDITIVE TIME JITTER
CLK = 2.4 GHz; VCO Div = 2; LVDS = 100 MHz;
Divider = 12; Duty-Cycle Correction = Off
CMOS OUTPUT ADDITIVE TIME JITTER
CLK = 2.4 GHz; VCO Div = 2; CMOS = 100 MHz;
Divider = 12; Duty-Cycle Correction = Off
210 f
285 f
350 f
S
S
S
Distribution section only; does not include PLL and VCO;
ising edge of clock signal
uses r
rms Calculated from SNR of ADC method
Distribution section only; does not include PLL and VCO;
ising edge of clock signal
R
rms Calculated from SNR of ADC method
Distribution section only; does not include PLL and VCO;
ising edge of clock signal
r
rms Calculated from SNR of ADC method
Rev. 0 | Page 11 of 84
AD9516-0
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DELAY BLOCK ADDITIVE TIME JITTER
Table 13.
Parameter Min Typ Max Unit Test Conditions/Comments
DELAY BLOCK ADDITIVE TIME JITTER
100 MHz Output
Delay (1600 μA, 1C) Fine Adj. 000000 0.54 ps rms
Delay (1600 μA, 1C) Fine Adj. 101111 0.60 ps rms
Delay (800 μA, 1C) Fine Adj. 000000 0.65 ps rms
Delay (800 μA, 1C) Fine Adj. 101111 0.85 ps rms
Delay (800 μA, 4C) Fine Adj. 000000 0.79 ps rms
Delay (800 μA, 4C) Fine Adj. 101111 1.2 ps rms
Delay (400 μA, 4C) Fine Adj. 000000 1.2 ps rms
Delay (400 μA, 4C) Fine Adj. 101111 2.0 ps rms
Delay (200 μA, 1C) Fine Adj. 000000 1.3 ps rms
Delay (200 μA, 1C) Fine Adj. 101111 2.5 ps rms
Delay (200 μA, 4C) Fine Adj. 000000 1.9 ps rms
Delay (200 μA, 4C) Fine Adj. 101111 3.8 ps rms
1
This value is incremental. That is, it is in addition to the jitter of the LVDS or CMOS output without the delay. To estimate the total jitter, the LVDS or CMOS output jitter
should be added to this value using the root sum of squares (RSS) method.
1
Incremental additive jitter
SERIAL CONTROL PORT
Table 14.
Parameter Min Typ Max Unit Test Conditions/Comments
CS (INPUT)
Input Logic 1 Voltage 2.0 V
Input Logic 0 Voltage 0.8 V
Input Logic 1 Current 3 μA
Input Logic 0 Current 110 μA
Input Capacitance 2 pF
SCLK (INPUT) SCLK has an internal 30 kΩ pull-down resistor
Input Logic 1 Voltage 2.0 V
Input Logic 0 Voltage 0.8 V
Input Logic 1 Current 110 μA
Input Logic 0 Current 1 μA
Input Capacitance 2 pF
SDIO (WHEN INPUT)
Input Logic 1 Voltage 2.0 V
Input Logic 0 Voltage 0.8 V
Input Logic 1 Current 10 nA
Input Logic 0 Current 20 nA
Input Capacitance 2 pF
SDIO, SDO (OUTPUTS)
Output Logic 1 Voltage 2.7 V
Output Logic 0 Voltage 0.4 V
CS has an internal 30 kΩ pull-up resistor
Rev. 0 | Page 12 of 84
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Parameter Min Typ Max Unit Test Conditions/Comments
TIMING
Clock Rate (SCLK, 1/t
Pulse Width High, t
Pulse Width Low, t
SDIO to SCLK Setup, t
SCLK to SDIO Hold, t
SCLK to Valid SDIO and SDO, t
CS to SCLK Setup and Hold, tS, t
CS Minimum Pulse Width High, t
PD, SYNC, AND RESET PINS
Table 15.
Parameter Min Typ Max Unit Test Conditions/Comments
INPUT CHARACTERISTICS These pins each have a 30 kΩ internal pull-up resistor
Logic 1 Voltage 2.0 V
Logic 0 Voltage 0.8 V
Logic 1 Current 110 μA
Logic 0 Current 1 μA
Capacitance 2 pF
RESET TIMING
Pulse Width Low 50 ns
SYNC TIMING
Pulse Width Low 1.5 High speed clock cycles High speed clock is CLK input signal
LD, STATUS, REFMON PINS
) 25 MHz
SCLK
HI
LO
DS
DH
DV
H
PWH
16 ns
16 ns
2 ns
1.1 ns
8 ns
2 ns
3 ns
Table 16.
Parameter Min Typ Max Unit Test Conditions/Comments
OUTPUT CHARACTERISTICS
Output Voltage High (VOH) 2.7 V
Output Voltage Low (VOL) 0.4 V
MAXIMUM TOGGLE RATE 100 MHz
ANALOG LOCK DETECT
Capacitance 3 pF
REF1, REF2, AND VCO FREQUENCY STATUS MONITOR
Normal Range 1.02 MHz
Extended Range (REF1 and REF2 Only) 8 kHz
LD PIN COMPARATOR
Trip Point 1.6 V
Hysteresis 260 mV
When selected as a digital output (CMOS); there are other
in which these pins are not CMOS digital outputs;
modes
see Table 53, 0x17, 0x1A, and 0x1B
Applies when mux is set to any divid
or PFD up/down pulse; also applies in analog lock detect
mode; usually only debug mode; beware that spurs may
couple to output when any of these pins are toggling
On-chip capacitance; used to calculate RC time constant
or analog lock detect readback; use a pull-up resistor
f
Frequency above which the monitor always indicates the
esence of the reference
pr
Frequency above which the monitor always indicates the
esence of the reference
pr
er or counter output,
Rev. 0 | Page 13 of 84
AD9516-0
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POWER DISSIPATION
Table 17.
Parameter Min Typ Max Unit Test Conditions/Comments
POWER DELTAS, INDIVIDUAL FUNCTIONS Power delta when a function is enabled/disabled
VCO Divider 30 mW VCO divider not used
REFIN (Differential) 20 mW All references off to differential reference enabled
REF1, REF2 (Single-Ended) 4 mW
VCO 70 mW CLK input selected to VCO selected
PLL 75 mW PLL off to PLL on, normal operation; no reference enabled
Channel Divider 30 mW Divider bypassed to divide-by-2 to 32
LVPECL Channel (Divider Plus Output Driver) 160 mW No LVPECL output on to one LVPECL output on
LVPECL Driver 90 mW Second LVPECL output turned on, same channel
LVDS Channel (Divider Plus Output Driver) 120 mW No LVDS output on to one LVDS output on
LVDS Driver 50 mW Second LVDS output turned on, same channel
CMOS Channel (Divider Plus Output Driver) 100 mW Static. No CMOS output on to one CMOS output on
CMOS Driver (Second in Pair) 0 mW Static. Second CMOS output, same pair, turned on
CMOS Driver (First in Second Pair) 30 mW Static. First output, second pair, turned on
Fine Delay Block 50 mW
75 185 mW
31 mW
No clock; no programming; defa
does not include power dissipated in external resistors
PLL on; internal VCO = 2750 MHz; VCO divider = 2;
annel dividers on; six LVPECL outputs @ 687.5 MHz;
all ch
eight CMOS outputs (10 pF load) @ 229 MHz; all fine
delay on, maximum current; does not include power
dissipated in external resistors
PLL on; internal VCO = 2800 MHz, VCO divider = 2;
all channel dividers on; six L
four LVDS outputs @ 200 MHz; all fine delay on,
maximum current; does not include power dissipated
in external resistors
PD
pin pulled low; does not include power dissipated
in terminations
PD
pin pulled low; PLL power-down 0x10<1:0> = 01b;
SYNC power-down 0x230<2> = 1b; REF for distribution
power-down 0x230<1> = 1b
All references off to REF1 or REF2 enabled; differential
ference not enabled
re
Delay block off to delay block enabled; maximum
ent setting
curr
ult register values;
VPECL outputs @ 700 MHz;
Rev. 0 | Page 14 of 84
AD9516-0
K
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TIMING DIAGRAMS
t
CLK
CL
DIFFERENTIAL
80%
20%
t
LVDS
t
PECL
LVDS
t
CMOS
Figure 2. CLK/
DIFFERENTIAL
80%
20%
Figure 3. LVPECL Timing, Differential
CLK
to Clock Output Timing, DIV = 1
LVPECL
t
RP
t
RL
06419-060
Figure 4. LVDS Timing, Differential
SINGL E-ENDE D
80%
CMOS
10pF LOAD
20%
t
FP
06419-061
t
RC
Figure 5. CMOS Timing, Single-End
t
FL
t
FC
ed, 10 pF Load
06419-062
06419-063
Rev. 0 | Page 15 of 84
AD9516-0
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ABSOLUTE MAXIMUM RATINGS
Table 18.
With
Parameter or Pin
VS, VS_LVPECL GND −0.3 V to +3.6 V
VCP GND −0.3 V to+5.8 V
REFIN, REFIN
REFIN
RSET GND −0.3 V to VS + 0.3 V
CPRSET GND −0.3 V to VS + 0.3 V
CLK, CLK
CLK
SCLK, SDIO, SDO, CS
OUT0, OUT0, OUT1,
, OUT2, OUT2,
OUT1
OUT3, OUT3
OUT4, OUT5, OUT5,
OUT6, OUT6
OUT7, OUT7, OUT8,
OUT8, OUT9, OUT9
SYNC
REFMON, STATUS, LD GND −0.3 V to VS + 0.3 V
Junction Temperature
Storage Temperature
Range
Lead Temperature (10 sec) 300°C
1
See Table 19 for θJA.
, OUT4,
Respec
t to Rating
GND −0.3 V to VS + 0.3 V
REFIN
GND −0.3 V to VS + 0.3 V
CLK
GND −0.3 V to VS + 0.3 V
GND −0.3 V to VS + 0.3 V
GND −0.3 V to VS + 0.3 V
GND −0.3 V to VS + 0.3 V
1
150°C
−65°C to +150°C
−3.3 V to +3.3 V
−1.2 V to +1.2 V
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
THERMAL RESISTANCE
Table 19.
Package Type
64-Lead LFCSP 24 °C/W
1
Thermal impedance measurements were taken on a 4-layer board in still air
in accordance with EIA/JESD51-7.
1
θ
JA
Unit
ESD CAUTION
Rev. 0 | Page 16 of 84
AD9516-0
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PIN CONFIGURATION AND FUNCTION DESCRIPTIONS
REFIN (REF 1)
REFIN (REF 2)
CPRSETVSVS
GND
RSETVSOUT0
OUT0
VS_LVPECL
OUT1
OUT1VSVS
646362616059585756555453525150
VS
49
VS
VCP
SYNC
CLK
CLK
SCLK
LD
CP
LF
VS
VS
NC
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
REFMON
STATUS
REF_SEL
BYPASS
NC = NO CONNECT
PIN 1
INDICATO R
LVPECL LVPECL
AD9516-0
TOP VIEW
(Not to Scale)
LVPECL LVPECL
171819202122232425262728293031
CS
NCNCNC
PD
SDO
SDIO
OUT4
RESET
VSVSVS
OUT4
OUT5
OUT5
VS_LVPECL
48
OUT6 (OUT6A)
47
OUT6 (OUT6B)
46
OUT7 (OUT7A)
45
LVPECL LVPECL
OUT7 (OUT7B)
44
GND
43
OUT2
42
OUT2
41
VS_LVPECL
40
OUT3
39
OUT3
38
VS
37
GND
36
OUT9 (OUT9B)
35
OUT9 (OUT9A)
34
OUT8 (OUT8B)
33
OUT8 (OUT8A)
06419-003
LVDS/CMOS
w/FINE DELAY ADJUST
LVDS/CMOS
w/FINE DELAY ADJUST
32
Figure 6. Pin Configuration
Table 20. Pin Function Descriptions
Pin No. Mnemonic Description
1, 11, 12, 30, 31,
VS 3.3 V Power Pins.
32, 38, 49, 50, 51,
57, 60, 61
2 REFMON Reference Monitor (Output). This pin has multiple selectable outputs; see Table 53 0x1B.
3 LD
4 VCP
5 CP
6 STATUS
7 REF_SEL
8
SYNC
Lock Detect (Output). This pin has multiple selectable outputs; see Table 5 3 0x1A.
Power Supply for Charge Pump (CP); VS < VCP < 5.0 V.
Charge Pump (Output). Connects to external loop filter.
Status (Output). This pin has multiple selectable outputs; see Table 53 0x17.
Reference Select. Selects REF1 (low) or REF2 (high). This pin has an internal 30 kΩ pull-down resistor.
Manual Synchronizations and Manual Holdover. This pin initiates a manual synchronization and is
also used for manual holdover. Active low. This pin has an internal 30 kΩ pull-up resistor.
9 LF
10 BYPASS
13 CLK
14
CLK
Loop Filter (Input). Connects to VCO control voltage node internally.
This pin is for bypassing the LDO to ground with a capacitor.
Along with CLK
, this is the differential input for the clock distribution section.
Along with CLK, this is the differential input for the clock distribution section.
15, 18, 19, 20 NC No Connection.
16 SCLK
17
CS
21 SDO
22 SDIO
23
24
RESET
PD
27, 41, 54 VS_LVPECL
37, 44, 59, EPAD GND
Serial Control Port Data Clock Signal.
Serial Control Port Chip Select; Active Low. This pin has an internal 30 kΩ pull-up resistor.
Serial Control Port Unidirectional Serial Data Out.
Serial Control Port Bidirectional Serial Data In/Out.
Chip Reset; Active Low. This pin has an internal 30 kΩ pull-up resistor.
Chip Power Down; Active Low. This pin has an internal 30 kΩ pull-up resistor.
Extended Voltage 2.5 V to 3.3 V LVPECL Power Pins.
Ground Pins; Includes External Paddle (EPAD).
56 OUT0 LVPECL Output; One Side of a Differential LVPECL Output.
Rev. 0 | Page 17 of 84
AD9516-0
www.BDTIC.com/ADI
Pin No. Mnemonic Description
55
53 OUT1 LVPECL Output; One Side of a Differential LVPECL Output.
52
43 OUT2 LVPECL Output; One Side of a Differential LVPECL Output.
42
40 OUT3 LVPECL Output; One Side of a Differential LVPECL Output.
39
25 OUT4 LVPECL Output; One Side of a Differential LVPECL Output.
26
28 OUT5 LVPECL Output; One Side of a Differential LVPECL Output.
29
48 OUT6 (OUT6A) LVDS/CMOS Output; One Side of a Differential LVDS Output, or a Single-Ended CMOS Output.
47
46 OUT7 (OUT7A) LVDS/CMOS Output; One Side of a Differential LVDS Output, or a Single-Ended CMOS Output.
45
33 OUT8 (OUT8A) LVDS/CMOS Output; One Side of a Differential LVDS Output, or a Single-Ended CMOS Output.
34
35 OUT9 (OUT9A) LVDS/CMOS Output; One Side of a Differential LVDS Output, or a Single-Ended CMOS Output.
36
58 RSET Resistor Connected Here Sets Internal Bias Currents. Nominal value = 4.12 kΩ.
62 CPRSET Resistor Connected Here Sets the CP Current Range. Nominal value = 5.1 kΩ.
63
64 REFIN (REF1)
OUT0
OUT1
OUT2
OUT3
OUT4
OUT5
(OUT6B)
OUT6
(OUT7B)
OUT7
(OUT8B)
OUT8
(OUT9B)
OUT9
(REF2) Along with REFIN, this is the differential input for the PLL reference. Alternatively, this pin is a
REFIN
LVPECL Output; One Side of a Differential LVPECL Output.
LVPECL Output; One Side of a Differential LVPECL Output.
LVPECL Output; One Side of a Differential LVPECL Output.
LVPECL Output; One Side of a Differential LVPECL Output.
LVPECL Output; One Side of a Differential LVPECL Output.
LVPECL Output; One Side of a Differential LVPECL Output.
LVDS/CMOS Output; One Side of a Differential LVDS Output, or a Single-Ended CMOS Output.
LVDS/CMOS Output; One Side of a Differential LVDS Output, or a Single-Ended CMOS Output.
LVDS/CMOS Output; One Side of a Differential LVDS Output, or a Single-Ended CMOS Output.
LVDS/CMOS Output; One Side of a Differential LVDS Output, or a Single-Ended CMOS Output.
single-ended input for REF2.
Along with REFIN
single-ended input for REF1.
, this is the differential input for the PLL reference. Alternatively, this pin is a
Rev. 0 | Page 18 of 84
AD9516-0
www.BDTIC.com/ADI
TYPICAL PERFORMANCE CHARACTERISTICS
300
280
260
240
220
200
180
CURRENT (mA)
160
140
120
100
050010001500200025003000
Figure 7. Current vs. Frequency, Direct
3 CHANNELS - 6 LVPECL
3 CHANNELS - 3 LVPECL
2 CHANNELS - 2 LVPECL
1 CHANNEL - 1 LVPECL
FREQUENCY (MHz)
to Output, LVPECL Outputs
06419-007
180
2 CHANNELS - 4 LVDS
160
140
120
CURRENT (mA)
100
80
0200400600800
2 CHANNELS - 2 LVDS
1 CHANNEL - 1 LVDS
FREQUENCY (MHz )
06419-008
Figure 8. Current vs. Frequency—LVDS Outputs
240
220
200
180
160
140
CURRENT (mA)
120
100
80
2 CHANNEL - 8 CMOS
2 CHANNEL - 2 CMOS
1 CHANNEL - 2 CMOS
1 CHANNEL - 1 CMOS
02
FREQUENCY (MHz )
010050
5020015
06419-009
Figure 9. Current vs. Frequency—CMOS Outputs
65
60
55
(MHz/V)
VCO
50
K
45
40
2.552.952.852.752.65
VCO FREQUENCY ( GHz)
Figure 10. VCO K
vs. Frequency
VCO
5.0
4.5
4.0
3.5
3.0
2.5
2.0
1.5
CURRENT FROM CP P IN (mA)
1.0
0.5
PUMP DOWNPUMP UP
0
00.51.01.52.02.53.0
VOLTAGE ON CP PIN (V)
Figure 11. Charge Pump Characteristics @ V
5.0
4.5
4.0
3.5
3.0
2.5
2.0
1.5
CURRENT FROM CP P IN (mA)
1.0
0.5
0
PUMP DOWNPUMP UP
00.5 1.0 1.5 2.03.04.02.53.55.04.5
VOLTAGE ON CP PIN (V)
Figure 12. Charge Pump Characteristics @ V
= 3.3 V
CP
= 5.0 V
CP
06419-010
06419-011
06419-012
Rev. 0 | Page 19 of 84
AD9516-0
–
–
www.BDTIC.com/ADI
140
–145
–150
–155
(dBc/Hz)
–160
–165
PFD PHASE NOI SE REFERRED TO PFD INPUT
–170
0.1110010
PFD FREQUENCY (MHz)
Figure 13. PFD Phase Noise Referred to PFD Input vs. PFD Frequency
An ideal sine wave can be thought of as having a continuous
nd even progression of phase with time from 0° to 360° for
a
each cycle. Actual signals, however, display a certain amount
of variation from ideal phase progression over time. This
phenomenon is called phase jitter. Although many causes can
contribute to phase jitter, one major cause is random noise,
which is characterized statistically as being Gaussian (normal)
in distribution.
This phase jitter leads to a spreading out of the energy of the
sin
e wave in the frequency domain, producing a continuous
power spectrum. This power spectrum is usually reported as a
series of values whose units are dBc/Hz at a given offset in
frequency from the sine wave (carrier). The value is a ratio
(expressed in dB) of the power contained within a 1 Hz
bandwidth with respect to the power at the carrier frequency.
For each measurement, the offset from the carrier frequency is
also given.
It is meaningful to integrate the total power contained within
ome interval of offset frequencies (for example, 10 kHz to
s
10 MHz). This is called the integrated phase noise over that
frequency offset interval and can be readily related to the time
jitter due to the phase noise within that offset frequency interval.
Phase noise has a detrimental effect on the performance of
Cs, DACs, and RF mixers. It lowers the achievable dynamic
AD
range of the converters and mixers, although they are affected
in somewhat different ways.
Time Jitter
Phase noise is a frequency domain phenomenon. In the time
do
main, the same effect is exhibited as time jitter. When
observing a sine wave, the time of successive zero crossings
varies. In a square wave, the time jitter is a displacement of the
edges from their ideal (regular) times of occurrence. In both
cases, the variations in timing from the ideal are the time jitter.
Because these variations are random in nature, the time jitter is
specified in units of seconds root mean square (rms) or 1 sigma
of the Gaussian distribution.
Time jitter that occurs on a sampling clock for a DAC or an
C decreases the signal-to-noise ratio (SNR) and dynamic
AD
range of the converter. A sampling clock with the lowest possible
jitter provides the highest performance from a given converter.
Additive Phase Noise
Additive phase noise is the amount of phase noise that is
ttributable to the device or subsystem being measured. The
a
phase noise of any external oscillators or clock sources are
subtracted. This makes it possible to predict the degree to which
the device impacts the total system phase noise when used in
conjunction with the various oscillators and clock sources, each
of which contribute their own phase noise to the total. In many
cases, the phase noise of one element dominates the system
phase noise. When there are multiple contributors to phase
noise, the total is the square root of the sum of squares of the
individual contributors.
Additive Time Jitter
Additive time jitter is the amount of time jitter that is
ttributable to the device or subsystem being measured. The
a
time jitter of any external oscillators or clock sources are subtracted.
This makes it possible to predict the degree to which the device
impacts the total system time jitter when used in conjunction with
the various oscillators and clock sources, each of which
contribute their own time jitter to the total. In many cases, the
time jitter of the external oscillators and clock sources dominates
the system time jitter.
Rev. 0 | Page 25 of 84
AD9516-0
V
www.BDTIC.com/ADI
DETAILED BLOCK DIAGRAM
REFIN (REF1)
REFIN (REF2)
BYPASS
CLK
CLK
SYNC
RESET
SCLK
SDIO
SDO
REF1
REF2
LF
PD
CS
REF_ SELCPRSETVCP
REFERENCE
SWITCHOVER
STATUS
STATUS
LOW DROPOUT
REGULATOR ( LDO)
VCO
DIGITAL
LOGIC
SERIAL
CONTROL
PORT
SGNDRSET
DISTRIBUTI ON
REFERENCE
R
DIVIDER
VCO STATUS
P, P + 1
PRESCALER
DIVIDE BY
2, 3, 4, 5, OR 6
01
N DIVIDER
A/B
COUNTER S
REFMON
PROGRAMMABLE
R DELAY
PROGRAMMABLE
N DELAY
DIVIDE BY
1 TO 32
DIVIDE BY
1 TO 32
DIVIDE BY
1 TO 32
LOCK
DETECT
PHASE
FREQUENCY
DETECTOR
PLL
REFERENCE
CHARGE
PUMP
HOLD
LVPECL
LVPECL
LVPECL
LD
CP
STATUS
OUT0
OUT0
OUT1
OUT1
OUT2
OUT2
OUT3
OUT3
OUT4
OUT4
OUT5
OUT5
AD9516-0
DIVIDE BY
1 TO 32
DIVIDE BY
1 TO 32
DIVIDE BY
1 TO 32
DIVIDE BY
1 TO 32
Figure 41. Detailed Block Diagram
Rev. 0 | Page 26 of 84
ΔT
ΔT
ΔT
ΔT
LVDS/CMOS
LVDS/CMOS
OUT6 (OUT6A)
OUT6 (OUT6B)
OUT7 (OUT7A)
OUT7 (OUT7B)
OUT8 (OUT8A)
OUT8 (OUT8B)
OUT9 (OUT9A)
OUT9 (OUT9B)
6419-002
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