FEATURES
Single +5 V Supply
TTL and CMOS Compatible
10 ps Delay Resolution
2.5 ns to 10 ms Full-Scale Range
Maximum Trigger Rate 50 MHz
MIL-STD-883-Compliant Versions Available
APPLICATIONS
Disk Drive Deskewing
Data Communications
Test Equipment
Radar I & Q Matching
GENERAL DESCRIPTION
The AD9501 is a digitally programmable delay generator which
provides programmed time delays of an input pulse. Operating
from a single +5 V supply, the AD9501 is TTL- or CMOScompatible, and is capable of providing accurate timing adjustments with resolutions as low as 10 ps. Its accuracy and
programmability make it ideal for use in data deskewing and
pulse delay applications, as well as clock timing adjustments.
Full-scale delay range is set by the combination of an external
resistor and capacitor, and can range from 2.5 ns to 10 µs for a
Delay Generator
AD9501
FUNCTIONAL BLOCK DIAGRAM
single AD9501. An eight-bit digital word selects a time delay
within the full-scale range. When triggered by the rising edge of
an input pulse, the output of the AD9501 will be delayed by an
amount equal to the selected time delay (t
propagation delay (t
The AD9501 is available for a commercial temperature range of
0°C to +70°C in a 20-pin plastic DIP, 20-pin ceramic DIP, and
a 20-lead plastic leaded chip carrier (PLCC). Devices fully
compliant to MIL-STD-883 are available in ceramic DIPs.
Refer to the Analog Devices Military Products Databook or current
AD9501/883B data sheet for detailed specifications.
PD
).
) plus an inherent
D
REV. A
Information furnished by Analog Devices is believed to be accurate and
reliable. However, no responsibility is assumed by Analog Devices for its
use, nor for any infringements of patents or other rights of third parties
which may result from its use. No license is granted by implication or
otherwise under any patent or patent rights of Analog Devices.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: 617/329-4700Fax: 617/326-8703
Lead Soldering Temperature (10 sec) . . . . . . . . . . . . +300°C
Digital Output Current (Sinking) . . . . . . . . . . . . . . . . 50 mA
ELECTRICAL CHARACTERISTICS
[+VS = +5 V; C
device output connected to Pin 4 RESET input unless otherwise noted]
= Open; R
EXT
= 3090 Ω (Full-Scale Range =100 ns); Pin 8 grounded; and
SET
08C to +708C –558C to +1258C
Test AD9501JN/JP/JQ AD9501SQ
ParameterTempLevelMinTypMaxMinTypMaxUnits
RESOLUTION88Bits
ACCURACY
Differential Nonlinearity+25°CI0.50.5LSB
Integral Nonlinearity+25°CI11LSB
Monotonicity+25°CI Guaranteed Guaranteed
DIGITAL INPUTS
Latch Input “1” VoltageFullVI2.02.3V
Latch Input “0” VoltageFullVI0.80.8V
Logic “1” VoltageFullVI2.02.0V
Logic “0” VoltageFullVI0.80.8V
Logic “1” CurrentFullVI6060µA
Logic “0” CurrentFullVI33µA
Digital Input Capacitance+25°CIV5.55.5pF
Data Setup Time (t
Data Hold Time (t
Latch Pulse Width (t
3
)
S
4
)
H
)+25°CV3.53.5ns
L
+25°CV2.52.5ns
+25°CV2.52.5ns
Reset/Trigger Pulse Width (tR, tT)+25°CV22ns
DYNAMIC PERFORMANCE
Maximum Trigger Rate
Minimum Propagation Delay (t
Propagation Delay Tempco
5
PD
7
+25°CIV 18221822MHz
6
)
+25°CI25302530ns
FullV2525ps/°C
Full-Scale Range TempcoFullV3636ps/°C
Delay Uncertainty+25°CV5353ps
Reset Propagation Delay (t
Reset-to-Trigger Holdoff (t
Trigger-to-Reset Holdoff (t
Minimum Output Pulse Width
Output Rise Time
Output Fall Time
DAC Settling Time (t
12
12
LD
Linear Ramp Settling Time (t
8
RD
THO
RHO
)
9
)
10
)
11
+25°CI14.517.514.517.5ns
+25°CV4.54.5ns
+25°CV1919ns
+25°CV7.57.5ns
+25°CI2.33.52.33.5ns
13
)
LRS
+25°CI1.02.01.02.0ns
+25°CV3030ns
14
)
+25°CV2020ns
DIGITAL OUTPUT
Logic “1” Voltage (Source 1 mA)FullVI2.42.4V
Logic “0” Voltage (Sink 4 mA)FullVI0.240.40.240.5V
POWER SUPPLY
15
Positive Supply Current (+5.0 V)FullVI69.58369.583mA
Power DissipationFullVI415415mW
Power Supply Rejection Ratio
16
Full-Scale Range Sensitivity+25°CI0.72.00.72.0ns/V
Minimum Prop Delay Sensitivity+25°CI0.451.70.451.7ns/V
–2–
REV. A
AD9501
NOTES
1
Absolute maximum ratings are limiting values, to be applied individually, and beyond which the serviceability of the circuit may be impaired. Functional operability
is not necessarily implied. Exposure to absolute maximum rating conditions for an extended period of time may affect device reliability.
Digital data inputs must remain stable for the specified time prior to the positive transition of the LATCH signal.
4
Digital data inputs must remain stable for the specified time after the positive transition of the LATCH signal.
5
Programmed delay (tD) = 0 ns. Maximum self-resetting trigger rate is limited to 6.9 MHz with 100 ns programmed delay. If tD= 0 ns and external RESET signal is
used, maximum trigger rate is 23 MHz.
6
Programmed delay (tD) = 0 ns. In operation, any programmed delays are in addition to the minimum propagation delay (tPD).
7
Programmed delay (tD) = 0 ns. [Minimum propagation delay (tPD)].
8
Measured from 50% transition point of the RESET signal input to the 50% transition point of the falling edge of the output.
9
Minimum time from the falling edge of RESET to the triggering input to insure valid output pulse, using external RESET pulse.
10
Minimum time from triggering event to rising edge of RESET to insure valid output event, using external RESET pulse. Extends to 125 ns when programmed delay
is 100 ns.
11
When self-resetting with a full-scale programmed delay.
12
Measured from +0.4 V to +2.4 V; source = 1 mA; sink = 4 mA.
13
Measured from the data input to the time when the AD9501 becomes 8-bit accurate, after a full-scale change in the program delay data word.
14
Measured from the RESET input to the time when the AD9501 becomes 8-bit accurate, after a full-scale programmed delay.
15
Supply voltage should remain stable within ±5% for normal operation.
16
Measured at +VS = +5.0 V ± 5%; specification shown is for worst case.
Specifications subject to change without notice.
EXPLANATION OF TEST LEVELS
Test Level
I– 100% production tested.
II – 100% production tested at +25°C, and sample tested at specified
temperatures.
III – Sample tested only.
IV – Parameter is guaranteed by design and characterization testing.
V – Parameter is a typical value only.
VI – All devices are 100% production tested at +25°C. 100% production
tested at temperature extremes for extended temperature devices;
sample tested at temperature extremes for commercial/industrial
devices.
ORDERING GUIDE
DeviceTemperatureDescriptionOption*
AD9501JN0°C to +70°C20-Pin Plastic DIPN-20
AD9501JP0°C to +70°C20-Lead PLCCP-20A
AD9501JQ0°C to +70°C20-Pin Ceramic DIPQ-20
AD9501SQ–55°C to +125°C20-Pin Ceramic DIPQ-20
2LATCHTTL/CMOS register control line. Logic HIGH latches input data D
Positive voltage supply; nominally +5 V.
. Register is
0–D7
transparent for logic LOW.
3TRIGGERTTL/CMOS-compatible input. Rising edge triggers the internal ramp generator, and begins
the delay cycle.
4RESETTTL/CMOS-compatible input. Logic HIGH resets the ramp voltage and OUTPUT.
5DAC OUTPUTOutput voltage of the internal digital-to-analog converter.
6C
7R
EXT
SET
8OFFSET ADJUST Normally connected to GROUND. Can be used to adjust minimum propagation delay (t
Optional external capacitor connected to +VS; used with R
to determine full-scale delay range (t
DFS
).
External resistor to ground, used to determine full-scale delay range (t
TTL/CMOS-compatible inputs, used to set the programmed delay of the AD9501 delayed
output. D
is LSB and D7 is MSB.
0
20GROUNDCircuit ground return.
AD9501 Equivalent Circuits
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection.
Although the AD9501 features proprietary ESD protection circuitry, permanent damage may
occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD
precautions are recommended to avoid performance degradation or loss of functionality.
–4–
REV. A
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