83.6 dBFS SNR with 30 MHz input (3.8 V p-p input, 80 MSPS)
82.6 dBFS SNR with 30 MHz input (3.2 V p-p input, 80 MSPS)
89 dBc SFDR with 30 MHz input (3.2 V p-p input, 80 MSPS)
95 dBFS 2-tone SFDR with 9.8 MHz and 10.8 MHz (100 MSPS)
60 fsec rms jitter
Excellent linearity
DNL = ±0.4 LSB typical
INL = ±3.0 LSB typical
2.0 V p-p to 4.0 V p-p differential full-scale input
Buffered analog inputs
LVDS outputs (ANSI-644 compatible) or CMOS outputs
Data format select (offset binary or twos complement)
Output clock available
The AD9446 is a 16-bit, monolithic, sampling analog-to-digital
converter (ADC) with an on-chip track-and-hold circuit. It is
optimized for performance, small size, and ease of use. The
product operates up to a 100 MSPS, providing superior SNR for
instrumentation, medical imaging, and radar receivers
employing baseband (<100 MHz) IF frequencies.
The ADC requires 3.3 V and 5.0 V power supplies and a low
v
oltage differential input clock for full performance operation.
No external reference or driver components are required for
many applications. Data outputs are CMOS or LVDS
compatible (ANSI-644 compatible) and include the means to
reduce the overall current needed for short trace distances.
AD9446
FUNCTIONAL BLOCK DIAGRAM
AGNDDRGND DRVDD
AVDD1 AVDD2
2
32
2
DFS
DCS MODE
OUTPUT MODE
OR
D15 TO D0
DCO
AD9446
VIN+
VIN–
CLK+
CLK–
BUFFER
CLOCK
AND TIMING
MANAGEMENT
T/H
PIPELINE
VREF
ADC
REF
Figure 1.
16
CMOS
OR
LVDS
OUTPUT
STAGING
REFBSENSE REFT
Optional features allow users to implement various selectable
op
erating conditions, including input range, data format select,
and output data mode.
The AD9446 is available in a Pb-free, 100-lead, surface-mount,
lastic package (100-lead TQFP/EP) specified over the
p
industrial temperature range −40°C to +85°C.
PRODUCT HIGHLIGHTS
1. True 16-bit linearity.
2. H
igh performance: outstanding SNR performance for
baseband IFs in data acquisition, instrumentation,
magnetic resonance imaging, and radar receivers.
ase of use: on-chip reference and high input impedance
3. E
track-and-hold with adjustable analog input range and an
output clock simplifies data capture.
performance over a wide range of clock pulse widths.
6. O
R (out-of-range) outputs indicate when the signal is
beyond the selected input range.
05490-001
Rev. 0
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Anal og Devices for its use, nor for any infringements of patents or ot her
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarks and registered trademarks are the property of their respective owners.
AVDD1 = 3.3 V, AVDD2 = 5.0 V, DRVDD = 3.3 V, LVDS mode, specified minimum sampling rate, 3.2 V p-p differential input, internal
trimmed reference (1.6 V mode), A
Table 1.
AD9446BSVZ-80 AD9446BSVZ-100
Parameter Te mp Min Typ Max Min Typ Max Unit
RESOLUTION Full 16 16 Bits
ACCURACY
No Missing Codes Full Guaranteed Guaranteed
Offset Error Full −5 ±0.1 +5 −5 ±0.1 +5 mV
Gain Error Full −3 ±0.6 +3 −3 ±0.5 +3 % FSR
25°C −2 ±0.3 +2 −2 ±0.3 +2 % FSR
Differential Nonlinearity (DNL)
Integral Nonlinearity (INL)1 25°C −5 ±3.0 +5 −6 ±3.0 +6 LSB
VOLTAGE REFERENCE
Output Voltage
1
VREF = 1.6 V (3.2 V p-p Analog Input Range) Full 1.6 1.6 V
Load Regulation @ 1.0 mA Full ±2 ±2 mV
Reference Input Current (External 1.6 V Reference) Full µA
INPUT REFERRED NOISE 25°C 1.5 1.9 LSB rms
ANALOG INPUT
Input Span
VREF = 1.6 V Full 3.2 3.2 V p-p
VREF = 1.0 V (External) Full 2.0 2.0 V p-p
Internal Input Common-Mode Voltage Full 3.5 3.5 V
External Input Common-Mode Voltage Full 3.2 3.8 3.2 3.8 V
Input Resistance
Input Capacitance
2
2
POWER SUPPLIES
Supply Voltage
AVDD1 Full 3.14 3.3 3.46 3.14 3.3 3.46 V
AVDD2 Full 4.75 5.0 5.25 4.75 5.0 5.25 V
DRVDD—LVDS Outputs Full 3.0 3.3 3.6 3.0 3.3 3.6 V
DRVDD—CMOS Outputs Full 3.0 3.3 3.6 3.0 3.3 3.6 V
Supply Current
1
I
AVDD
1
I
AVDD2
1
I
—LVDS Outputs Full 68 75 69 75 mA
DRVDD
1
I
—CMOS Outputs Full 14 14 mA
DRVDD
PSRR
Offset Full 1 1 mV/V
Gain Full 0.2 0.2 %/V
POWER CONSUMPTION
LVDS Outputs Full 2.4 2.6 2.6 2.8 W
CMOS Outputs (DC Input) Full 2.2 2.3 W
1
Measured at the maximum clock rate, fIN = 15 MHz, full-scale sine wave, with a 100 Ω differential termination on each pair of output bits for LVDS output mode and
approximately 5 pF loading on each output bit for CMOS output mode.
2
Input capacitance or resistance refers to the effective impedance between one differential input pin and AGND. Refer to Figure 6 for the equivalent analog input structure.
= −1.0 dBFS, DCS on, unless otherwise noted.
IN
1
Full −0.75 ±0.4 +0.75 −0.85 ±0.4 +0.85 LSB
Full 1 1 kΩ
Full 6 6 pF
Full 335 365 368 401 mA
Full 204 234 223 255 mA
Rev. 0 | Page 3 of 36
AD9446
www.BDTIC.com/ADI
AC SPECIFICATIONS
AVDD1 = 3.3 V, AVDD2 = 5.0 V, DRVDD = 3.3 V, LVDS mode, specified minimum sample rate, 3.2 V p-p differential input, internal
trimmed reference (1.6 V mode), A
Table 2.
AD9446BSVZ-80 AD9446BSVZ-100
Parameter Te m p Min Typ Max Min Typ Max Unit
SIGNAL-TO-NOISE RATIO (SNR)
fIN = 10 MHz 25°C 79.6 81.8 78.4 79.7 dB
fIN = 30 MHz 25°C 80.5 81.6 78.3 79.5 dB
Full 79.2 77.9 dB
fIN = 70 MHz 25°C 79.0 80.6 77.7 79.0 dB
Full 78.2 77.6 dB
fIN = 92 MHz 25°C 80.1 78.9 dB
fIN = 125 MHz 25°C 78.8 78.2 dB
fIN = 170 MHz 25°C 77.1 77.0 dB
fIN = 10 MHz (2 V p-p Input) 25°C 78.3 76.6 dB
fIN = 30 MHz (2 V p-p Input) 25°C 78.3 76.6 dB
fIN = 70 MHz (2 V p-p Input) 25°C 77.6 76.2 dB
fIN = 92 MHz (2 V p-p Input) 25°C 77.5 76 dB
fIN = 125 MHz (2 V p-p Input) 25°C 76.7 75.6 dB
fIN = 170 MHz (2 V p-p Input) 25°C 75.5 75.1 dB
SIGNAL-TO-NOISE AND DISTORTION (SINAD)
fIN = 10 MHz 25°C 77.1 80.5 76.9 78.9 dB
fIN = 30 MHz 25°C 75.9 80.4 75.5 78.6 dB
Full 74.9 71.7 dB
fIN = 70 MHz 25°C 75.5 78.6 73.8 77.7 dB
Full 74.4 69.1 dB
fIN = 92 MHz 25°C 79.2 77.1 dB
fIN = 125 MHz 25°C 74.9 76.9 dB
fIN = 170 MHz 25°C 66.0 70.5 dB
fIN = 10 MHz (2 V p-p Input) 25°C 77.9 76.2 dB
fIN = 30 MHz (2 V p-p Input) 25°C 77.8 76.1 dB
fIN = 70 MHz (2 V p-p Input) 25°C 77.1 75.9 dB
fIN = 92 MHz (2 V p-p Input) 25°C 77.1 75.7 dB
fIN = 125 MHz (2 V p-p Input) 25°C 75.7 75.3 dB
fIN = 170 MHz (2 V p-p Input) 25°C 72.5 73.6 dB
EFFECTIVE NUMBER OF BITS (ENOB)
fIN = 10 MHz 25°C 13.2 13.0 Bits
fIN = 30 MHz 25°C 13.2 12.9 Bits
fIN = 70 MHz 25°C 12.9 12.8 Bits
fIN = 92 MHz 25°C 13.0 12.7 Bits
fIN = 125 MHz 25°C 12.3 12.6 Bits
fIN = 170 MHz 25°C 10.8 11.6 Bits
= −1 dBFS, DCS on, unless otherwise noted.
IN
Rev. 0 | Page 4 of 36
AD9446
www.BDTIC.com/ADI
AD9446BSVZ-80 AD9446BSVZ-100
Parameter Te m p Min Typ Max Min Typ Max Unit
SPURIOUS-FREE DYNAMIC RANGE
(SFDR, Second or Third Harmonic)
fIN = 10 MHz 25°C 82 90 82 92 dBc
fIN = 30 MHz 25°C 82 89 82 89 dBc
Full 80 79 dBc
fIN = 70 MHz 25°C 80 87 81 89 dBc
Full 79 77 dBc
fIN = 92 MHz 25°C 84 84 dBc
fIN = 125 MHz 25°C 80 83 dBc
fIN = 170 MHz 25°C 66 74 dBc
fIN = 10 MHz (2 V p-p Input) 25°C 92 94 dBc
fIN = 30 MHz (2 V p-p Input) 25°C 93 92 dBc
fIN = 70 MHz (2 V p-p Input) 25°C 92 92 dBc
fIN = 92 MHz (2 V p-p Input) 25°C 90 89 dBc
fIN = 125 MHz (2 V p-p Input) 25°C 85 87 dBc
fIN = 170 MHz (2 V p-p Input) 25°C 77 82 dBc
WORST SPUR EXCLUDING SECOND OR
THIRD HARMONICS
fIN = 10 MHz 25°C −98 −89 −96 −91 dBc
fIN = 30 MHz 25°C −97 −89 −97 −89 dBc
Full −89 −87 dBc
fIN = 70 MHz 25°C −98 −90 −96 −90 dBc
Full −89 −88 dBc
fIN = 92 MHz 25°C −98 −95 dBc
fIN = 125 MHz 25°C −96 −96 dBc
fIN = 170 MHz 25°C −95 −92 dBc
fIN = 10 MHz (2 V p-p Input) 25°C −97 −93 dBc
fIN = 30 MHz (2 V p-p Input) 25°C −97 −96 dBc
fIN = 70 MHz (2 V p-p Input) 25°C −94 −94 dBc
fIN = 92 MHz (2 V p-p Input) 25°C −97 −99 dBc
fIN = 125 MHz (2 V p-p Input) 25°C −97 −95 dBc
fIN = 170 MHz (2 V p-p Input) 25°C −93 −95 dBc
TWO-TONE SFDR
fIN = 10.8 MHz @ −7 dBFS,
9.8 MHz @ −7 dBFS
fIN = 70.3 MHz @ −7 dBFS,
69.3 MHz @ −7 dBFS
ANALOG BANDWIDTH Full 325 540 MHz
25°C 96 95 dBFS
25°C 92 92 dBFS
Rev. 0 | Page 5 of 36
AD9446
www.BDTIC.com/ADI
DIGITAL SPECIFICATIONS
AVDD1 = 3.3 V, AVDD2 = 5.0 V, DRVDD = 3.3 V, R
Table 3.
AD9446BSVZ-80 AD9446BSVZ-100
Parameter Te mp Min Typ Max Min Typ Max Unit
CMOS LOGIC INPUTS (DFS, DCS MODE, OUTPUT MODE)
High Level Input Voltage Full 2.0 2.0 V
Low Level Input Voltage Full 0.8 0.8 V
High Level Input Current Full 200 200 µA
Low Level Input Current Full −10
Input Capacitance Full
DIGITAL OUTPUT BITS—CMOS MODE (D0 to D15, OTR)
DRVDD = 3.3 V
High Level Output Voltage Full 3.25
Low Level Output Voltage Full
DIGITAL OUTPUT BITS—LVDS MODE (D0 to D15, OTR)
VOD Differential Output Voltage
2
VOS Output Offset Voltage Full 1.125
CLOCK INPUTS (CLK+, CLK−)
Differential Input Voltage Full 0.2
Common-Mode Voltage Full 1.31.51.61.3 1.5 1.6 V
Input Resistance Full 1.1 1.41.71.1 1.4 1.7 kΩ
Input Capacitance Full
1
Output voltage levels measured with 5 pF load on each output.
AD9446BSVZ-80 AD9446BSVZ-100
Parameter Te mp Min Typ Max Min Typ Max Unit
CLOCK INPUT PARAMETERS
Maximum Conversion Rate Full 80 100 MSPS
Minimum Conversion Rate Full 1 1 MSPS
CLK Period Full 12.5 10 ns
CLK Pulse Width High1 (t
CLK Pulse Width Low1 (t
DATA OUTPUT PARAMETERS
Output Propagation Delay—CMOS (tPD)2 (Dx, DCO+) Full 3.35 3.35 ns
Output Propagation Delay—LVDS (tPD)3 (Dx+), (t
Pipeline Delay (Latency) Full 13 13 Cycles
Aperture Delay (tA) Full ns
Aperture Uncertainty (Jitter, tJ) Full 60 60
1
With duty cycle stabilizer (DCS) enabled.
2
Output propagation delay is measured from clock 50% transition to data 50% transition with 5 pF load.
3
LVDS R
= 100 Ω. Measured from the 50% point of the rising edge of CLK+ to the 50% point of the data transition.
TERM
) Full 5.0 4.0 ns
CLKH
) Full 5.0 4.0 ns
CLKL
)3 (DCO+) Full 2.1 3.6 4.8 2.3 3.6 4.8 ns
CPD
fsec
s
rm
Rev. 0 | Page 6 of 36
AD9446
www.BDTIC.com/ADI
TIMING DIAGRAMS
A
CLK+
CLK–
N–1
IN
t
CLKH
t
CLKL
N
N + 1
1/
f
S
t
PD
DATA OUT
DCO+
DCO–
VIN
CLK–
CLK+
DX
DCO+
DCO–
N–1
t
CLKH
N + 1
05490-002
t
CPD
N – 13
13 CLOCK CYCLES
N–12
N
Figure 2. LVDS Mode Timing Diagram
N
N + 1
t
CLKL
t
PD
N – 13N – 12N – 1N
N + 2
13 CLOCK CYCLES
05490-003
Figure 3. CMOS T
iming Diagram
Rev. 0 | Page 7 of 36
AD9446
www.BDTIC.com/ADI
ABSOLUTE MAXIMUM RATINGS
Table 5.
With
t
Respec
Parameter
ELECTRICAL
AVDD1 AGND −0.3 V to +4 V
AVDD2 AGND −0.3 V to +6 V
DRVDD DGND −0.3 V to +4 V
AGND DGND −0.3 V to +0.3 V
AVDD1 DRVDD −4 V to +4 V
AVDD2 DRVDD −4 V to +6 V
AVDD2 AVDD1 −4 V to +6 V
D0± to D15± DGND –0.3 V to DRVDD + 0.3 V
CLK+/CLK− AGND –0.3 V to AVDD1 + 0.3 V
OUTPUT MODE,
DCS MODE, DFS
VIN+, VIN− AGND –0.3 V to AVDD2 + 0.3 V
VREF AGND –0.3 V to AVDD1 + 0.3 V
SENSE AGND –0.3 V to AVDD1 + 0.3 V
REFT, REFB AGND –0.3 V to AVDD1 + 0.3 V
ENVIRONMENTAL
Storage Temperature
Range
Operating Temperature
Range
Lead Temperature
(Soldering 10 sec)
Junction Temperature 150°C
to
AGND –0.3 V to AVDD1 + 0.3 V
–65°C to +125°C
–40°C to +85°C
300°C
Rating
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
THERMAL RESISTANCE
The heat sink of the AD9446 package must be soldered to
ground.
Table 6.
Package Type θ
100-lead TQFP/EP 19.8 8.3 2 °C/W
JA
Typical θJA = 19.8°C/W (heat sink soldered) for multilayer
board in still air.
Typical θ
= 8.3°C/W (heat sink soldered) for multilayer board
JB
in still air.
Typical θ
= 2°C/W (junction to exposed heat sink) represents
JC
the thermal resistance through heat sink path.
Airflow increases heat dissipation, effectively reducing θ
more metal directly in contact with the package leads from
metal traces through holes, ground, and power planes reduces
the θ
. It is required that the exposed heat sink be soldered to
JA
the ground plane.
θ
JB
θ
JC
Unit
. Also,
JA
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on
the human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
Rev. 0 | Page 8 of 36
AD9446
www.BDTIC.com/ADI
TERMINOLOGY
Analog Bandwidth (Full Power Bandwidth)
The analog input frequency at which the spectral power of the
undamental frequency (as determined by the FFT analysis) is
f
reduced by 3 dB.
Minimum Conversion Rate
The clock rate at which the SNR of the lowest analog signal
frequency drops by no more than 3 dB below the guaranteed
limit.
Aperture Delay (t
The delay between the 50% point of the rising edge of the clock
nd the instant at which the analog input is sampled.
a
Aperture Uncertainty (Jitter, t
The sample-to-sample variation in aperture delay.
Clock Pulse Width and Duty Cycle
Pulse width high is the minimum amount of time that the
lock pulse should be left in the Logic 1 state to achieve rated
c
performance. Pulse width low is the minimum time the clock
pulse should be left in the low state. At a given clock rate, these
specifications define an acceptable clock duty cycle.
Differential Nonlinearity (DNL, No Missing Codes)
An ideal ADC exhibits code transitions that are exactly 1 LSB
part. DNL is the deviation from this ideal value. Guaranteed
a
no missing codes to 16-bit resolution indicates that all 65,536
codes must be present over all operating ranges.
Effective Number of Bits (ENOB)
The effective number of bits for a sine wave input at a given
put frequency can be calculated directly from its measured
in
SINAD using the following formula:
ENOB
Gain Error
The first code transition should occur at an analog value of
½ LSB above negative full scale. The last transition should occur
at an analog value of 1½ LSB below the positive full scale. Gain
error is the deviation of the actual difference between first and
last code transitions and the ideal difference between first and
last code transitions.
Integral Nonlinearity (INL)
The deviation of each individual code from a line drawn from
negative full scale through positive full scale. The point used as
negative full scale occurs ½ LSB before the first code transition.
Positive full scale is defined as a level 1½ LSB beyond the last
code transition. The deviation is measured from the middle of
each particular code to the true straight line.
Maximum Conversion Rate
The clock rate at which parametric testing is performed.
)
A
)
J
()
SINAD
=
1.76−
6.02
Offset Error
The major carry transition should occur for an analog value of
½ LSB below VIN+ = VIN−. Offset error is defined as the
deviation of the actual transition from that point.
Out-of-Range Recovery Time
The time it takes for the ADC to reacquire the analog input
after a transition from 10% above positive full scale to 10%
above negative full scale, or from 10% below negative full scale
to 10% below positive full scale.
Output Propagation Delay (tPD)
The delay between the clock rising edge and the time when all
bits are within valid logic levels.
Power-Supply Rejection Ratio
The change in full scale from the value with the supply at the
minimum limit to the value with the supply at the maximum
limit.
Signal-to-Noise and Distortion (SINAD)
The ratio of the rms input signal amplitude to the rms value of
the sum of all other spectral components below the Nyquist
frequency, including harmonics but excluding dc.
Signal-to-Noise Ratio (SNR)
The ratio of the rms input signal amplitude to the rms value of
the sum of all other spectral components below the Nyquist
frequency, excluding the first six harmonics and dc.
Spurious-Free Dynamic Range (SFDR)
The ratio of the rms signal amplitude to the rms value of the
peak spurious spectral component. The peak spurious component
may be a harmonic. SFDR can be reported in dBc (that is, degrades
as signal level is lowered) or dBFS (always related back to converter
full scale).
Tem p er at u re Dr i ft
The temperature drift for offset error and gain error specifies
the maximum change from the initial (25°C) value to the value
at T
or T
MIN
Total Harmonic Distortion (THD)
The ratio of the rms input signal amplitude to the rms value of
the sum of the first six harmonic components.
Two -Tone SFDR
The ratio of the rms value of either input tone to the rms value
of the peak spurious component. The peak spurious component
may or may not be an IMD product.