78.3 dBFS SNR/92 dBFS SFDR with 30 MHz input (3.2 V p-p)
74.8 dBFS SNR/95 dBFS SFDR with 30 MHz input (2.0 V p-p)
77.0 dBFS SNR/87 dBFS SFDR with 170 MHz input (3.2 V p-p)
74.6 dBFS SNR/95 dBFS SFDR with 170 MHz input (2.0 V p-p)
73.0 dBFS SNR/88 dBFS SFDR with 300 MHz input (2.0 V p-p)
102 dBFS 2-tone SFDR with 30 MHz and 31 MHz
92 dBFS 2-tone SFDR with 170 MHz and 171 MHz
60 fsec rms jitter
Excellent linearity
DNL = ±0.25 LSB typical
INL = ±0.8 LSB typical
2.0 V p-p to 4.0 V p-p differential full-scale input
Buffered analog inputs
LVDS outputs (ANSI-644 compatible) or CMOS outputs
Data format select (offset binary or twos complement)
Output clock available
3.3 V and 5 V supply operation
APPLICATIONS
Multicarrier, multimode cellular receivers
Antenna array positioning
Power amplifier linearization
Broadband wireless
Radar
Infrared imaging
Medical imaging
Communications instrumentation
GENERAL DESCRIPTION
The AD9445 is a 14-bit, monolithic, sampling analog-to-digital
converter (ADC) with an on-chip IF sampling track-and-hold
circuit. It is optimized for performance, small size, and ease of
use. The product operates at up to a 125 MSPS conversion rate
and is designed for multicarrier, multimode receivers, such as
those found in cellular infrastructure equipment.
The ADC requires 3.3 V and 5.0 V power supplies and a low
voltage differential input clock for full performance operation.
No external reference or driver components are required for
many applications. Data outputs are CMOS or LVDS
compatible (ANSI-644 compatible) and include the means to
reduce the overall current needed for short trace distances.
AD9445
FUNCTIONAL BLOCK DIAGRAM
AGNDDRGND DRVDD
AVDD1 AVDD2
2
28
2
RF ENABLE
DFS
DCS MODE
OUTPUT MODE
OR
D13 TO D0
DCO
AD9445
VIN+
VIN–
CLK+
CLK–
BUFFER
CLOCK
AND TIMING
MANAGEMENT
T/H
PIPELINE
VREF
ADC
REF
Figure 1.
14
CMOS
OR
LVDS
OUTPUT
STAGING
REFBSENSE REFT
Optional features allow users to implement various selectable
operating conditions, including input range, data format select,
high IF sampling mode, and output data mode.
The AD9445 is available in a Pb-free, 100-lead, surface-mount,
plastic package (100-lead TQFP/EP) specified over the
industrial temperature range −40°C to +85°C.
PRODUCT HIGHLIGHTS
1. High performance: outstanding SFDR performance for IF
sampling applications such as multicarrier, multimode 3G,
and 4G cellular base station receivers.
2. Ease of use: on-chip reference and high input impedance
track-and-hold with adjustable analog input range and an
output clock simplifies data capture.
3. Packaged in a Pb-free, 100-lead TQFP/EP package.
performance over a wide range of clock pulse widths.
5. OR (out-of-range) outputs indicate when the signal is
beyond the selected input range.
6. RF enable pin allows users to configure the device for
optimum SFDR when sampling frequencies above 210 MHz
(AD9445-125) or 240 MHz (AD9445-105).
05489-001
Rev. 0
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Anal og Devices for its use, nor for any infringements of patents or ot her
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarks and registered trademarks are the property of their respective owners.
AD9445BSVZ-105 AD9445BSVZ-125
Parameter Te mp Min Typ Max Min Typ Max Unit
RESOLUTION Full 14 14 Bits
ACCURACY
No Missing Codes Full Guaranteed Guaranteed
Offset Error Full −7 +7 −7 +7 mV
25°C ±3 ±3 mV
Gain Error Full −3 +3 −3 +3 % FSR
25°C −2 +2 −2 +2 % FSR
Differential Nonlinearity (DNL)
5 5
Integral Nonlinearity (INL)1 25°C ±0.65 ±0.8 LSB
Full −1.6 +1.6 −2 +2 LSB
VOLTAGE REFERENCE
Output Voltage VREF = 1.0 V Full 0.9 1.0 1.1 0.9 1.0 1.1 V
Load Regulation @ 1.0 mA Full ±2 ±2 mV
Reference Input Current (External VREF = 1.6 V) Full µA
INPUT REFERRED NOISE 25°C 1.0 1.0 LSB rms
ANALOG INPUT
Input Span
VREF = 1.6 V Full 3.2 3.2 V p-p
VREF = 1.0 V Full 2.0 2.0 V p-p
Internal Input Common-Mode Voltage Full 3.5 3.5 V
External Input Common-Mode Voltage Full 3.1
Input Resistance
Input Capacitance
2
2
POWER SUPPLIES
Supply Voltage
AVDD1 Full 3.14 3.3 3.46 3.14 3.3 3.46 V
AVDD2 Full 4.75 5.05.254.75 5.0 5.25 V
DRVDD—LVDS Outputs Full 3.0
DRVDD—CMOS Outputs Full 3.03.33.63.0 3.3 3.6 V
Supply Current
1
AVDD1 Full 335 364 384 424 mA
1, 3
AVDD2
1
I
—LVDS Outputs Full 6378 63 78 mA
DRVDD
1
I
—CMOS Outputs Full 14 14 mA
DRVDD
PSRR
Offset Full 1 1 mV/V
Gain Full 0.2 0.2 %/V
POWER CONSUMPTION
LVDS Outputs Full 2.22.4 2.3 2.6 W
CMOS Outputs (DC Input) Full 2.0 2.1 W
1
Measured at the maximum clock rate, fIN = 15 MHz, full-scale sine wave, with a 100 Ω differential termination on each pair of output bits for LVDS output mode and
approximately 5 pF loading on each output bit for CMOS output mode.
2
Input capacitance or resistance refers to the effective impedance between one differential input pin and AGND. Refer to Figure 6 for the equivalent analog input structure.
3
For RF ENABLE = AVDD1, I
AVDD2
1
Full −0.6 ±0.25 +0.65 −0.6 ±0.25 +0.65 LSB
Full 1 1 kΩ
Full 6 6 pF
Full 169196 172 199 mA
increases by ~30 mA, which increases power dissipation.
3.9 3.1 3.9 V
3.63.0 3.6 V
Rev. 0 | Page 3 of 40
AD9445
AC SPECIFICATIONS
AVDD1 = 3.3 V, AVDD2 = 5.0 V, DRVDD = 3.3 V, LVDS mode, specified minimum sample rate, 2.0 V p-p differential input, internal
trimmed reference (1.0 V mode), A
Table 2.
Parameter Temp
SIGNAL-TO-NOISE RATIO (SNR)
fIN = 10 MHz 25°C 74.3 74.1 dB
fIN = 30 MHz 25°C 73.3 74.3 72.9 73.8 dB
Full 73 72.5 dB
fIN = 170 MHz 25°C 72.9 73.6 72.3 73.2 dB
fIN = 225 MHz
1
Full 72.2 71.4 dB
fIN = 300 MHz
fIN = 400 MHz
fIN = 450 MHz
2
2
2
fIN = 10 MHz (3.2 V p-p Input) 25°C 77.6 77.3 dB
fIN = 30 MHz (3.2 V p-p Input) 25°C 77.5 77.3 dB
fIN = 170 MHz (3.2 V p-p Input) 25°C 76 76 dB
fIN = 225 MHz (3.2 V p-p Input)
fIN = 300 MHz (3.2 V p-p Input)
SIGNAL-TO-NOISE AND DISTORTION (SINAD)
fIN = 10 MHz 25°C 74.2 73.9 dB
fIN = 30 MHz 25°C 73.2 74.2 72.8 73.7 dB
Full 72.8 72.3 dB
fIN = 170 MHz 25°C 72.3 73.3 72.4 73.0 dB
fIN = 225 MHz
1
Full 71.3 70.7 dB
fIN = 300 MHz
fIN = 400 MHz
fIN = 450 MHz
2
2
2
fIN = 10 MHz (3.2 V p-p Input) 25°C 77.4 76.9 dB
fIN = 30 MHz (3.2 V p-p Input) 25°C 77.3 76.8 dB
fIN = 170 MHz (3.2 V p-p Input) 25°C 75.7 75.4 dB
fIN = 225 MHz (3.2 V p-p Input)
fIN = 300 MHz (3.2 V p-p Input)
EFFECTIVE NUMBER OF BITS (ENOB)
fIN = 10 MHz 25°C 12.2 12.2 Bits
fIN = 30 MHz 25°C 12.2 12.1 Bits
fIN = 170 MHz 25°C 12.1 12.0 Bits
fIN = 225 MHz
fIN = 300 MHz
fIN = 400 MHz
fIN = 450 MHz
(SFDR, Second or Third Harmonic)
fIN = 10 MHz 25°C 95 95 dBc
fIN = 30 MHz 25°C 84 92 85 94 dBc
Full 83 82 dBc
fIN = 170 MHz 25°C 82 94 80 91 dBc
fIN = 225 MHz
1
25°C 76 87 83 88
Full 75 75 dBc
fIN = 300 MHz
fIN = 400 MHz
fIN = 450 MHz
2
2
2
25°C 76 87 75 87 dBc
25°C 75 73 dBc
25°C 70 69 dBc
fIN = 10 MHz (3.2 V p-p Input) 25°C 92 92 dBc
fIN = 30 MHz (3.2 V p-p Input) 25°C 88 91 dBc
fIN = 170 MHz (3.2 V p-p Input) 25°C 86 86 dBc
fIN = 225 MHz (3.2 V p-p Input)
fIN = 300 MHz (3.2 V p-p Input)
WORST SPUR EXCLUDING SECOND OR
1
2
25°C 81 80 dBc
25°C 77 76 dBc
THIRD HARMONICS
fIN = 10 MHz 25°C −97 −97 dBc
fIN = 30 MHz 25°C −99 −90 −98 −89 dBc
Full −90 −88 dBc
fIN = 170 MHz 25°C −99 −92 −93 −85 dBc
fIN = 225 MHz
1
25°C −94 −88 −94 −84 dBc
Full −86 −80 dBc
fIN = 300 MHz
fIN = 400 MHz
fIN = 450 MHz
2
2
2
25°C −97 −90 −92 −82 dBc
25°C −93 −93 dBc
25°C −82 −87 dBc
fIN = 10 MHz (3.2 V p-p Input) 25°C −97 −95 dBc
fIN = 30 MHz (3.2 V p-p Input) 25°C −97 −95 dBc
fIN = 170 MHz (3.2 V p-p Input) 25°C −97 −95 dBc
fIN = 225 MHz (3.2 V p-p Input)
fIN = 300 MHz (3.2 V p-p Input)
1
2
25°C −95 −94 dBc
25°C −93 −91 dBc
TWO-TONE SFDR
fIN = 30.3 MHz @ −7 dBFS,
25°C 102 102 dBFS
31.3 MHz @ −7 dBFS
fIN = 170.3 MHz @ −7 dBFS,
25°C 92 91 dBFS
171.3 MHz @ −7 dBFS
ANALOG BANDWIDTH Full 615 615 MHz
1
RF ENABLE = low (AGND ) for AD9445-105; RF ENABLE = high (AVDD1) for AD9445-125.
2
RF ENABLE = high (AVDD1).
Min Typ Max Min Typ Max Unit
dBc
Rev. 0 | Page 5 of 40
AD9445
DIGITAL SPECIFICATIONS
AVDD1 = 3.3 V, AVDD2 = 5.0 V, DRVDD = 3.3 V, R
Table 3.
AD9445BSVZ-105 AD9445BSVZ-125
Parameter Te mp Min Typ Max Min Typ Max Unit
CMOS LOGIC INPUTS (DFS, DCS MODE, OUTPUT MODE)
High Level Input Voltage Full 2.0 2.0 V
Low Level Input Voltage Full 0.8 0.8 V
High Level Input Current Full
Low Level Input Current Full −10
Input Capacitance Full
DIGITAL OUTPUT BITS—CMOS MODE (D0 to D13, OTR)
DRVDD = 3.3 V
High Level Output Voltage Full 3.25
Low Level Output Voltage Full
DIGITAL OUTPUT BITS—LVDS MODE (D0 to D13, OTR)
VOD Differential Output Voltage
2
VOS Output Offset Voltage Full 1.125
CLOCK INPUTS (CLK+, CLK−)
Differential Input Voltage Full 0.2
Common-Mode Voltage Full 1.31.51.61.3 1.5 1.6 V
Differential Input Resistance Full 1.1 1.41.71.1 1.41.7kΩ
Differential Input Capacitance Full
1
Output voltage levels measured with 5 pF load on each output.
AD9445BSVZ-105 AD9445BSVZ-125
Parameter Te mp Min Typ Max Min Typ Max Unit
CLOCK INPUT PARAMETERS
Maximum Conversion Rate Full 105 125 MSPS
Minimum Conversion Rate Full 10 10 MSPS
CLK Period Full 9.5 8.0 ns
CLK Pulse Width High1 (t
CLK Pulse Width Low1 (t
DATA OUTPUT PARAMETERS
Output Propagation Delay—CMOS (tPD)2 (Dx, DCO+) Full 3.35 3.35 ns
Output Propagation Delay—LVDS (tPD)3 (Dx+), (t
Pipeline Delay (Latency) Full 13 13 Cycles
Aperture Delay (tA) Full
Aperture Uncertainty (Jitter, tJ) Full 60 60
1
With duty cycle stabilizer (DCS) enabled.
2
Output propagation delay is measured from clock 50% transition to data 50% transition with 5 pF load.
3
LVDS R
= 100 Ω. Measured from the 50% point of the rising edge of CLK+ to the 50% point of the data transition.
TERM
) Full 3.8 3.2 ns
CLKH
) Full 3.8
CLKL
)3 (DCO+) Full 2.1 3.6 4.8 2.3 3.6 4.8 ns
CPD
3.2 ns
ns
fsec
rms
Rev. 0 | Page 6 of 40
AD9445
TIMING DIAGRAMS
A
CLK+
CLK–
N–1
IN
t
CLKH
t
CLKL
N
N + 1
1/
f
S
t
PD
DATA OUT
DCO+
DCO–
VIN
CLK–
CLK+
DX
DCO+
DCO–
N–1
t
CLKH
N + 1
05489-002
t
CPD
N – 13
13 CLOCK CYCLES
N–12
N
Figure 2. LVDS Mode Timing Diagram
N
N + 1
t
CLKL
t
PD
N – 13N – 12N – 1N
N + 2
13 CLOCK CYCLES
05489-003
Figure 3. CMOS Timing Diagram
Rev. 0 | Page 7 of 40
AD9445
ABSOLUTE MAXIMUM RATINGS
Table 5.
With
Respect
Parameter
ELECTRICAL
AVDD1 AGND −0.3 V to +4 V
AVDD2 AGND −0.3 V to +6 V
DRVDD DGND −0.3 V to +4 V
AGND DGND −0.3 V to +0.3 V
AVDD1 DRVDD −4 V to +4 V
AVDD2 DRVDD −4 V to +6 V
AVDD2 AVDD1 −4 V to +6 V
D0± to D13± DGND –0.3 V to DRVDD + 0.3 V
CLK+/CLK− AGND –0.3 V to AVDD1 + 0.3 V
OUTPUT MODE, DCS
MODE, DFS, SFDR,
RF ENABLE
VIN+, VIN− AGND –0.3 V to AVDD2 + 0.3 V
VREF AGND –0.3 V to AVDD1 + 0.3 V
SENSE AGND –0.3 V to AVDD1 + 0.3 V
REFT, REFB AGND –0.3 V to AVDD1 + 0.3 V
ENVIRONMENTAL
Storage Temperature
Range
Operating Temperature
Range
Lead Temperature
(Soldering 10 sec)
Junction Temperature 150°C
To
AGND –0.3 V to AVDD1 + 0.3 V
–65°C to +125°C
–40°C to +85°C
300°C
Rating
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
THERMAL RESISTANCE
The heat sink of the AD9445 package must be soldered to ground.
Table 6.
Package Type θJA θ
100-lead TQFP/EP 19.8 8.3 2 °C/W
Typical θJA = 19.8°C/W (heat sink soldered) for multilayer
board in still air.
Typical θ
= 8.3°C/W (heat sink soldered) for multilayer board
JB
in still air.
Typical θ
= 2°C/W (junction to exposed heat sink) represents
JC
the thermal resistance through heat sink path.
Airflow increases heat dissipation, effectively reducing θ
more metal directly in contact with the package leads from
metal traces through holes, ground, and power planes reduces
the θ
. It is required that the exposed heat sink be soldered to
JA
the ground plane.
θJC Unit
JB
. Also,
JA
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on
the human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
Rev. 0 | Page 8 of 40
AD9445
TERMINOLOGY
Analog Bandwidth (Full Power Bandwidth) Minimum Conversion Rate
The analog input frequency at which the spectral power of the
fundamental frequency (as determined by the FFT analysis) is
reduced by 3 dB.
The clock rate at which the SNR of the lowest analog signal
frequency drops by no more than 3 dB below the guaranteed
limit.
Aperture Delay (t
) Offset Error
A
The delay between the 50% point of the rising edge of the clock
and the instant at which the analog input is sampled.
Aperture Uncertainty (Jitter, t
)
J
The sample-to-sample variation in aperture delay.
Clock Pulse Width and Duty Cycle
Pulse width high is the minimum amount of time that the
clock pulse should be left in the Logic 1 state to achieve rated
performance. Pulse width low is the minimum time the clock
pulse should be left in the low state. At a given clock rate, these
specifications define an acceptable clock duty cycle.
Differential Nonlinearity (DNL, No Missing Codes)
An ideal ADC exhibits code transitions that are exactly 1 LSB
apart. DNL is the deviation from this ideal value. Guaranteed
no missing codes to 14-bit resolution indicates that all 16,384
codes must be present over all operating ranges.
Effective Number of Bits (ENOB)
The effective number of bits for a sine wave input at a given
input frequency can be calculated directly from its measured
SINAD using the following formula:
ENOB
()
SINAD
=
6.02
1.76−
Gain Error
The first code transition should occur at an analog value of
½ LSB above negative full scale. The last transition should occur
at an analog value of 1½ LSB below the positive full scale. Gain
error is the deviation of the actual difference between first and
last code transitions and the ideal difference between first and
last code transitions.
Integral Nonlinearity (INL)
The deviation of each individual code from a line drawn from
negative full scale through positive full scale. The point used as
negative full scale occurs ½ LSB before the first code transition.
Positive full scale is defined as a level 1½ LSB beyond the last
code transition. The deviation is measured from the middle of
each particular code to the true straight line.
Maximum Conversion Rate
The clock rate at which parametric testing is performed.
The major carry transition should occur for an analog value of
½ LSB below VIN+ = VIN−. Offset error is defined as the
deviation of the actual transition from that point.
Out-of-Range Recovery Time
The time it takes for the ADC to reacquire the analog input
after a transition from 10% above positive full scale to 10%
above negative full scale, or from 10% below negative full scale
to 10% below positive full scale.
Output Propagation Delay (tPD)
The delay between the clock rising edge and the time when all
bits are within valid logic levels.
Power-Supply Rejection Ratio
The change in full scale from the value with the supply at the
minimum limit to the value with the supply at the maximum
limit.
Signal-to-Noise and Distortion (SINAD)
The ratio of the rms input signal amplitude to the rms value of
the sum of all other spectral components below the Nyquist
frequency, including harmonics but excluding dc.
Signal-to-Noise Ratio (SNR)
The ratio of the rms input signal amplitude to the rms value of
the sum of all other spectral components below the Nyquist
frequency, excluding the first six harmonics and dc.
Spurious-Free Dynamic Range (SFDR)
The ratio of the rms signal amplitude to the rms value of the
peak spurious spectral component. The peak spurious component
may be a harmonic. SFDR can be reported in dBc (that is, degrades
as signal level is lowered) or dBFS (always related back to converter
full scale).
Tem p er at u re Dr i ft
The temperature drift for offset error and gain error specifies
the maximum change from the initial (25°C) value to the value
at T
MIN
or T
MAX
.
Total Harmonic Distortion (THD)
The ratio of the rms input signal amplitude to the rms value of
the sum of the first six harmonic components.
Two -Tone SFDR
The ratio of the rms value of either input tone to the rms value
of the peak spurious component. The peak spurious component
may or may not be an IMD product.
Clock Duty Cycle Stabilizer (DCS) Control Pin. CMOS compatible. DCS = low (AGND) to
enable DCS (recommended); DCS = high (AVDD1) to disable DCS.
CMOS-Compatible Output Logic Mode Control Pin. OUTPUT MODE = 0 for CMOS mode;
OUTPUT MODE = 1 (AVDD1) for LVDS outputs.
Data Format Select Pin. CMOS control pin that determines the format of the output data.
DFS = high (AVDD1) for twos complement; DFS = low (ground) for offset binary format.
Reference Mode Selection. Connect to AGND for internal 1 V reference; connect to
AVDD1 for external reference.
1.0 V Reference I/O. Function dependent on SENSE and external programming resistors.
Decouple to ground with 0.1 µF and 10 µF capacitors.
Analog Ground. The exposed heat sink on the bottom of the package must be
connected to AGND.
Differential Reference Output. Decoupled to ground with 0.1 µF capacitor and to REFB
(Pin 14) with 0.1 µF and 10 µF capacitors.
Differential Reference Output. Decoupled to ground with a 0.1 µF capacitor and to REFT
(Pin 13) with 0.1 µF and 10 µF capacitors.
RF ENABLE Control Pin. CMOS-compatible control pin to optimize the configuration of
the AD9445 analog front end. Connecting RF ENABLE to AGND optimizes SFDR
performance for applications with analog input frequencies <210 MHz for 125 MSPS
speed grade and <230 MHz for the 105 MSPS speed grade. For applications with analog
inputs >225 MHz for the 125 MSPS speed grade and >230 MHz for the 105 MSPS speed
grade, this pin should be connected to AVDD1 for optimum SFDR performance. Power
dissipation from AVDD2 increases by 150 mW to 200 mW.
Rev. 0 | Page 12 of 40
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