SNR = 65 dB @ fIN = 70 MHz @ 210 MSPS
ENOB of 10.6 @ f
SFDR = 80 dBc @ f
Excellent linearity:
DNL = ±0.3 LSB (typical)
INL = ±0.5 LSB (typical)
2 output data options:
Demultiplexed 3.3 V CMOS outputs each @ 105 MSPS
Interleaved or parallel data output option
LVDS at 210 MSPS
700 MHz full-power analog bandwidth
On-chip reference and track-and-hold
Power dissipation = 1.3 W typical @ 210 MSPS
1.5 V input voltage range
3.3 V supply operation
Output data format option
Data sync input and data clock output provided
Clock duty cycle stabilizer
APPLICATIONS
Wireless and wired broadband communications
Cable reverse path
Communications test equipment
Radar and satellite subsystems
Power amplifier linearization
GENERAL DESCRIPTION
The AD9430 is a 12-bit monolithic sampling analog-to-digital
converter optimized for high performance, low power, and ease
of use. The product operates up to a 210 MSPS conversion rate
and is optimized for outstanding dynamic performance in
wideband carrier and broadband systems. All necessary
functions, including a track-and-hold (T/H) and reference, are
included on the chip to provide a complete conversion solution.
The ADC requires a 3.3 V power supply and a differential
ENCODE clock for full performance operation. The digital
outputs are TTL/CMOS or LVDS compatible and support either
twos complement or offset binary format. Separate output
power supply pins support interfacing with 3.3 V or 2.5 V
CMOS logic.
= 70 MHz @ 210 MSPS (–0.5 dBFS)
IN
= 70 MHz @ 210 MSPS (–0.5 dBFS)
IN
3.3 V A/D Converter
AD9430
FUNCTIONAL BLOCK DIAGRAM
DRGND
12
OR LVDS
S5S4S2S1
DRVDD
LVDS
OUTPUTS
CMOS
OUTPUTS
AVDD
DATA,
OVERRANGE
IN LVDS OR
2-PORT CMOS
DCO+
DCO–
VIN+
VIN–
DS+
DS–
CLK+
CLK–
AD9430
TRACK-
AND-HOLD
CLOCK
MANAGEMENT
SENSEVREF
SCALABLE
REFERENCE
Figure 1. Functional Block Diagram
ADC
12-BIT
PIPELINE
CORE
AGND
SELECT CMOS
Two output buses support demultiplexed data up to 105 MSPS
rates in CMOS mode. A data sync input is supported for proper
output data port alignment in CMOS mode, and a data clock
output is available for proper output data timing. In LVDS
mode, the chip provides data at the ENCODE clock rate.
Fabricated on an advanced BiCMOS process, the AD9430 is
available in a 100-lead, surface-mount plastic package
(100 e-PAD TQFP) specified over the industrial temperature
range (–40°C to +85°C).
PRODUCT HIGHLIGHTS
1. High performance.
Maintains 65 dB SNR @ 210 MSPS with a 65 MHz input.
2. Low power.
Consumes only 1.3 W @ 210 MSPS.
3. Ease of use.
LVDS output data and output clock signal allow interface
to current FPGA technology. The on-chip reference and
sample/hold provide flexibility in system design. Use of a
single 3.3 V supply simplifies system power supply design.
4. Out of range (OR).
The OR output bit indicates when the input signal is
beyond the selected input range.
5. Pin compatible with 10-bit AD9411 (LVDS only).
02607-001
Rev. C
Information furnished by Analog Devices is believed to be accurate and reliable.
However, no responsibility is assumed by Analog Devices for its use, nor for any
infringements of patents or other rights of third parties that may result from its use.
Specifications subject to change without notice. No license is granted by implication
or otherwise under any patent or patent rights of Analog Devices. Trademarks and
registered trademarks are the property of their respective owners.
AD9430-170 AD9430-210
Parameter Temp Test Level Min Typ Max Min Typ Max Unit
RESOLUTION 12 Bits
ACCURACY
No Missing Codes Full VI Guaranteed Guaranteed
Offset Error 25°C I –3 +3 –3 +3 mV
Gain Error 25°C I –5 +5 –5 +5 % FS
Differential Nonlinearity (DNL) 25°C I –1 ± 0.3 +1 –1 ± 0.3 +1 LSB
Full VI –1 ± 0.3 +1.5 –1 ± 0.3 +1.5 LSB
Integral Nonlinearity (INL) 25°C I –1.5 ± 0.5 +1.5
Full VI –2.25 ± 0.5 +2.25 –2.5 ± 0.3 +2.5 LSB
TEMPERATURE DRIFT
Offset Error Full V 58 58 µV/°C
Gain Error Full V 0.02 0.02 %/°C
Reference Out (VREF) Full V +0.12/–0.24 +0.12/–0.24 mV/°C
REFERENCE
Reference Out (VREF) 25°C I 1.15 1.235 1.3 1.15 1.235 1.3 V
Output Current
I
Input Current2 25°C I 20 20 mA
VREF
I
Input Current2 25°C I 1.6 5.0 1.6 5.0 mA
SENSE
1
ANALOG INPUTS (VIN+, VIN–)3
Differential Input Voltage Range (S5 = GND)
Differential Input Voltage Range (S5 = AVDD)
Input Common-Mode Voltage Full VI 2.65 2.8 2.9 2.65 2.8 2.9 V
Input Resistance Full VI 2.2 3 3.8 2.2 3 3.8 kΩ
Input Capacitance 25°C V 5 5 pF
POWER SUPPLY (LVDS Mode)
AVDD Full IV 3.1 3.3 3.6 3.2 3.3 3.6 V
DRVDD Full IV 3.0 3.3 3.6 3.0 3.3 3.6 V
Supply Currents:
I
I
(AVDD = 3.3 V)
ANALOG
(DRVDD = 3.3 V)4 Full VI 55 62 55 62 mA
DIGITAL
4
Power Dissipation4 Full VI 1.29 1.43 1.5 1.7 W
Power Supply Rejection 25°C V –7.5 –7.5 mV/V
POWER SUPPLY (CMOS Mode)
AVDD Full IV 3.1 3.3 3.6 3.2 3.3 3.6 V
DRVDD Full IV 3.0 3.3 3.6 3.0 3.3 3.6 V
Supply Currents:
I
(AVDD = 3.3 V)5 Full IV 335 372 390 450 mA
AVDD
I
(DRVDD = 3.3 V)5 Full IV 24 30 30 30 mA
DRVDD
Power Dissipation5 Full IV 1.1 1.3 W
Power Supply Rejection 25°C V –7.5 –7.5 mV/V
1
Internal reference mode; SENSE = Floats.
2
External reference mode; SENSE = DRVDD, VREF driven by external 1.23 V reference.
3
S5 (Pin 1) = GND. See Analog Input section. S5 = GND in all dc, ac tests unless otherwise specified.
4
I
and I
AVDD
Characteristics and Application Notes sections for I
5
I
AVDD
Characteristics and Application Notes sections for I
are measured with an analog input of 10.3 MHz, –0.5 dBFS, sine wave, rated ENCODE rate, and in LVDS output mode. See Typical Performance
DRVDD
and I
are measured with an analog input of 10.3 MHz, –0.5 dBFS, sine wave, rated ENCODE rate, and in CMOS output mode. See Typical Performance
DRVDD
= –40°C, T
MIN
= +85°C, fIN = –0.5 dBFS, internal reference, full scale = 1.536 V, LVDS output mode,
MAX
–1.75
± 0.3 +1.75 LSB
25°C IV 3.0 3.0 mA
Full V 1.536 1.536 V
Full V 0.766 0.766 V
Full VI 335 372 390 450 mA
. Power consumption is measured with a dc input at rated ENCODE rate in LVDS output mode.
DRVDD
. Power consumption is measured with a dc input at rated ENCODE rate in CMOS output mode.
Parameter Temp Test Level Min Typ Max Min Typ Max Unit
SNR
Analog Input @ –0.5 dBFS 10 MHz 25°C I 63.5 65 62.5 64.5 dB
70 MHz 25°C I 63 65 62.5 64.5 dB
100 MHz 25°C V 65 64.5 dB
240 MHz 25°C V 61 61 dB
SINAD
Analog Input @ –0.5 dBFS 10 MHz 25°C I 63.5 65 62.5 64.5 dB
70 MHz 25°C I 63 65 62.5 64.5 dB
100 MHz 25°C V 65 64.5 dB
240 MHz 25°C V 60 60 dB
EFFECTIVE NUMBER OF BITS (ENOB) 10 MHz 25°C I 10.2 10.6 10.2 10.5 Bits
70 MHz 25°C I 10.2 10.6 10.2 10.5 Bits
100 MHz 25°C V 10.6 10.5 Bits
240 MHz 25°C V 9.8 9.8 Bits
WORST HARMONIC (2nd or 3rd)
Analog Input @ –0.5 dBFS 10 MHz 10 MHz 25°C I –85 –75 –84 –74 dBc
70 MHz 25°C I –85 –75 –84 –74 dBc
100 MHz 25°C V –77 –77 dBc
240 MHz 25°C V –63 –63 dBc
WORST HARMONIC (4th or Higher)
Analog Input @ –0.5 dBFS 10 MHz 10 MHz 25°C I –87 –78 –87 –77 dBc
70 MHz 25°C I –87 –78 –87 –77 dBc
100 MHz 25°C V –77 –77 dBc
240 MHz 25°C V –63 –63 dBc
TWO-TONE IMD2
F1, F2 @ –7 dBFS 25°C V –75 –75 dBc
ANALOG INPUT BANDWIDTH 25°C V 700 700 MHz
1
All ac specifications tested by driving CLK+ and CLK– differentially.
2
F1 = 28.3 MHz, F2 = 29.3 MHz.
= –40°C, T
MIN
= +85°C, fIN = –0.5 dBFS, internal reference, full scale = 1.536 V, LVDS output mode,
MAX
AD9430-170AD9430-210
Rev. C | Page 5 of 40
AD9430
DIGITAL SPECIFICATIONS
AVDD = 3.3 V, DRVDD = 3.3 V, T
Table 3.
Test AD9430-170 AD9430-210
Parameter Temp Level Min Typ Max Min Typ Max Unit
ENCODE AND DS INPUTS
(CLK+, CLK–, DS+, DS–)1
Differential Input Voltage2 Full IV 0.2 0.2 V
Common-Mode Voltage3 Full VI 1.375 1.5 1.575 1.375 1.5 1.575 V
Input Resistance Full VI 3.2 5.5 6.5 3.2 5.5 6.5 kΩ
Input Capacitance 25°C V 4 4 pF
LOGIC INPUTS (S1, S2, S4, S5)
Logic 1 Voltage Full IV 2.0 2.0 V
Logic 0 Voltage Full IV 0.8 0.8 V
Logic 1 Input Current Full VI 190 190 µA
Logic 0 Input Current Full VI 10 10 µA
Input Resistance 25°C V 30 30 kΩ
Input Capacitance 25°C V 4 4 pF
LOGIC OUTPUTS (CMOS Mode)
Logic 1 Voltage4 Full IV DRVDD DRVDD V
–0.05 –0.05
Logic 0 Voltage4 Full IV 0.05 0.05 V
LOGIC OUTPUTS (LVDS Mode)4, 5
VOD Differential Output Voltage Full VI 247 454 247 454 mV
VOS Output Offset Voltage Full VI 1.125 1.375 1.125 1.375 V
Output Coding Twos complement or binary Twos complement or binary
1
ENCODE and DS inputs identical on-chip. See Equivalent Circuits section.
2
All ac specifications tested by driving CLK+ and CLK– differentially, |(CLK+) – (CLK–)| > 200 mV.
3
ENCODE inputs’ common mode can be externally set, such that 0.9 V < ENC± < 2.6 V.
4
Digital output logic levels: DRVDD = 3.3 V, C
5
LVDS R
= 100 Ω, LVDS output current set resistor (R
TERM
= –40°C, T
MIN
= 5 pF.
LOAD
= +85°C, unless otherwise noted.
MAX
) = 3.74 kΩ (1% tolerance).
SET
Rev. C | Page 6 of 40
AD9430
SWITCHING SPECIFICATIONS
AVDD = 3.3 V, DRVDD = 3.3 V, T
Table 4.
Test AD9430-170 AD9430-210
Parameter (Conditions) Temp Level Min Typ Max Min Typ Max Unit
Maximum Conversion Rate1 Full VI 170
Minimum Conversion Rate
1
Full V
CLK+ Pulse Width High (tEH)1 Full IV 2
CLK+ Pulse Width Low (tEL)1 Full IV 2
DS Input Setup Time (t
DS Input Hold Time (t
)2 Full IV –0.5 –0.5 ns
SDS
)2 Full IV 1.75 1.75 ns
HDS
OUTPUT (CMOS Mode)
Valid Time (tV) Full IV 2 2 ns
Propagation Delay (tPD) Full IV 3.8 5 3.8 5 ns
Rise Time (tR) (20% to 80%) 25°C V 1 1 ns
Fall Time (tF) (20% to 80%) 25°C V 1 1 ns
DCO Propagation Delay (tCPD) Full IV 3.8 5 3.8 5 ns
Data to DCO Skew (tPD – t
) Full IV –0.5 0 +0.5 –0.5 0 +0.5 ns
CPD
Interleaved Mode (A, B Latency) Full IV 14, 14 14, 14 Cycles
Parallel Mode (A, B Latency) Full IV 15, 14 15, 14 Cycles
OUTPUT (LVDS Mode)
Valid Time (tV) Full VI 2.0 2.0 ns
Propagation Delay (tPD) Full VI 3.2 4.3 3.2 4.3 ns
Rise Time (tR) (20% to 80%) 25°C V 0.5 0.5 ns
Fall Time (tF) (20% to 80%) 25°C V 0.5 0.5 ns
DCO Propagation Delay (t
Data to DCO Skew (tPD – t
CPD
) Full IV 0.2 0.5 0.8 0.2 0.5 0.8 ns
CPD
Latency Full IV 14 14 Cycles
Aperture Delay (tA) 25°C V 1.2 1.2 ns
Aperture Uncertainty (Jitter, tJ) 25°C V 0.25 0.25 ps rms
Out of Range Recovery Time (CMOS and LVDS) 25°C V 1 1 Cycles
1
All ac specifications tested by driving CLK+ and CLK– differentially.
2
DS inputs used in CMOS mode only.
= –40°C, T
MIN
= +85°C, unless otherwise noted.)
MAX
40
12.5 2
12.5 2
210
MSPS
40 MSPS
12.5 ns
12.5 ns
) Full VI 1.8 2.7 3.8 1.8 2.7 3.8 ns
Rev. C | Page 7 of 40
AD9430
–
CLK+
CLK–
DS+
DS–
PORT A
DA11–DA0
PORT B
DB11–DB0
PORT A
DA11–DA0
PORT B
DB11–DB0
DCO–
DCO+
t
HDS
INTERLEAVED DATA OUT
STATIC
STATIC
PARALLEL DATA OUT
STATIC
STATIC
STATIC
t
SDS
14 CYCLES
INVALID
INVALID
INVALID
INVALID
INVALID
INVALID
INVALID
t
PD
NN+2
N+1
NN+2
N+1N+3
t
CPD
N+3
t
V
02607-002
Figure 2. CMOS Timing Diagram
N
1
A
IN
N
N+1
t
EL
t
EH
CLK+
CLK–
DATA OUT
DCO+
DCO–
t
CPD
1/f
S
t
PD
N–14
N–13
14 CYCLES
N
N+1
02607-003
Figure 3. LVDS Timing Diagram
Rev. C | Page 8 of 40
AD9430
ABSOLUTE MAXIMUM RATINGS
Table 5.
ParameterRating
AVDD, DRVDD 4 V
Analog Inputs –0.5 V to AVDD + 0.5 V
Digital Inputs –0.5 V to DRVDD + 0.5 V
REFIN Inputs –0.5 V to AVDD + 0.5 V
Digital Output Current 20 mA
Operating Temperature –55ºC to +125°C
Storage Temperature –65ºC to +150°C
Maximum Junction Temperature 150°C
Maximum Case Temperature 150°C
soldered) for multilayer board in still air with solid ground plane.
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those listed in the operational sections
of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
EXPLANATION OF TEST LEVELS
Test L ev el
I. 100% production tested.
II. 100% production tested at 25°C and sample tested at
specified temperatures.
III. Sample tested only.
IV. Parameter is guaranteed by design and characterization
testing.
V. Parameter is a typical value only.
VI. 100% production tested at 25°C; guaranteed by design and
characterization testing for industrial temperature range;
100% production tested at temperature extremes for
military devices.
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the
human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
Data Format Select. Low = binary,
CMOS and LVDS mode.
10 SENSE Reference Mode Select Pin. Float for internal reference operation.
11 VREF 1.235 V Reference I/O—Function Dependent on SENSE.
21 VIN+ Analog Input—True.
22 VIN– Analog Input—Complement.
32 DS+ Data Sync (Input)—True. Tie low if not used.
33 DS– Data Sync (Input)—Complement. Tie high if not used.
36 CLK+ Clock Input—True.
37 CLK– Clock Input—Complement.
44 DB0 B Port Output Data Bit (LSB).
45 DB1 B Port Output Data Bit.
46 DB2 B Port Output Data Bit.
47, 54, 62, 75, 83 DRVDD 3.3 V Digital Output Supply (3.0 V to 3.6 V).
48, 53, 61, 67, 74, 82 DRGND1 Digital Output Ground.
49 DB3 B Port Output Data Bit.
50 DB4 B Port Output Data Bit.
51 DB5 B Port Output Data Bit.
52 DB6 B Port Output Data Bit.
55 DB7 B Port Output Data Bit.
56 DB8 B Port Output Data Bit.
57 DB9 B Port Output Data Bit.
58 DB10 B Port Output Data Bit.
59 DB11 B Port Output Data Bit (MSB).
60 OR_B B Port Overrange.
63 DCO– Data Clock Output—Complement.
64 DCO+ Data Clock Output—True.
69 DA0 A Port Output Data Bit (LSB).
70 DA1 A Port Output Data Bit.
71 DA2 A Port Output Data Bit.
72 DA3 A Port Output Data Bit.
73 DA4 A Port Output Data Bit.
76 DA5 A Port Output Data Bit.
77 DA6 A Port Output Data Bit.
78 DA7 A Port Output Data Bit.
79 DA8 A Port Output Data Bit.
80 DA9 A Port Output Data Bit.
81 DA10 A Port Output Data Bit.
84 DA11 A Port Output Data Bit (MSB).
85 OR_A A Port Overrange.
1
AGND and DRGND should be tied together to a common ground plane.
= 0.768 V p-p differential, GND
S
high = twos
complement for both
Rev. C | Page 11 of 40
AD9430
DNC
AGND
LVDSBIAS
AVDD
AGND
SENSE
VREF
AGND
AGND
AVDD
AVDD
AGND
AGND
AVDD
AVDD
AGND
VIN+
VIN–
AGND
AVDD
AGND
AGND
AVDD
AVDD
AGND
AGND
AVDD
AVDD
AGND
AGND
AGND
AVDD
AVDD
AVDD
AGND
AGND
OR+
OR–
DRVDD
DRGND
D11+
D11–79D10+78D10–77D9+76D9–
DNC
DNC
81
82
80
4445464748
DNC
DNC
DNC
DRVDD
49
D0–
DRGND
75
DRVDD
74
DRGND
73
D8+
72
D8–
71
D7+
70
D7–
69
D6+
68
D6–
67
DRGND
66
D5+
65
D5–
64
DCO+
63
DCO–
62
DRVDD
61
DRGND
60
D4+
59
D4–
58
D3+
57
D3–
56
D2+
D2–
55
54
DRVDD
53
DRGND
52
D1+
51
D1–
50
D0+
02607-005
99989796959493
100
S5
1
2
3
S4
4
5
S2
6
S1
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
2627282930
AVDD
AVDD
AVDD
AGND
AGND
31
32
GND
AGND
33
AVDD
929190
343536
AVDD
AGND
8786858483
89
88
AD9430
LVDS PINOUT
TOP VIEW
(Not to Scale)
37
39
38
CLK–
CLK+
AVDD
AGND
40
AVDD
414243
AGND
Figure 5. LVDS Mode Pinout
Rev. C | Page 12 of 40
AD9430
Table 7. Pin Function Descriptions (LVDS Mode)
Pin Number Mnemonic Function
1 S5 Full-Scale Adjust Pin. AVDD sets fS = 0.768 V p-p differential,
GND sets fS = 1.536 V p-p differential.
2, 42 to 46 DNC Do Not Connect.
AGND and DRGND should be tied together to a common ground plane.
Control Pin for CMOS Mode. Tie low when operating in LVDS
mode.
Data Format Select. GND = binary, AVDD = twos complement.
Set Pin for LVDS Output Current. Place 3.74 kW resistor
terminated to ground.
Reference Mode Select Pin. Float for internal reference operation.
Rev. C | Page 13 of 40
AD9430
−
TERMINOLOGY
Analog Bandwidth
The analog input frequency at which the spectral power of the
fundamental frequency (as determined by the FFT analysis) is
reduced by 3 dB.
Aperture Delay
The delay between the 50% point of the rising edge of the
ENCODE command and the instant at which the analog input
is sampled.
Aperture Uncertainty (Jitter)
The sample-to-sample variation in aperture delay.
Crosstalk
Coupling onto one channel being driven by a low level
(–40 dBFS) signal when the adjacent interfering channel is
driven by a full-scale signal.
Differential Analog Input Resistance, Differential Analog
Input Capacitance, and Differential Analog Input Impedance
The real and complex impedances measured at each analog
input port. The resistance is measured statically and the
capacitance and differential input impedances are measured
with a network analyzer.
Full-Scale Input Power
Expressed in dBm. Computed using the following equation:
Power
FULLSCALE
⎛
⎜
2
V
FULLSCALE
=
⎜
log10
Z
⎜
INPUT
⎜
⎝
001.0
RMS
⎞
⎟
⎟
⎟
⎟
⎠
Gain Error
The difference between the measured and ideal full-scale input
voltage range of the ADC.
Harmonic Distortion, Second
The ratio of the rms signal amplitude to the rms value of the
second harmonic component, reported in dBc.
Harmonic Distortion, Third
The ratio of the rms signal amplitude to the rms value of the
third harmonic component, reported in dBc.
Integral Nonlinearity
The deviation of the transfer function from a reference line
measured in fractions of 1 LSB using a “best straight line”
determined by a least square curve fit.
Differential Analog Input Voltage Range
The peak-to-peak differential voltage that must be applied to
the converter to generate a full-scale response. Peak differential
voltage is computed by observing the voltage on a single pin
and subtracting the voltage from the other pin, which is
180° out of phase. Peak-to-peak differential is computed by
rotating the input’s phase 180° and again taking the peak
measurement. The difference is then computed between both
peak measurements.
Differential Nonlinearity
The deviation of any code width from an ideal 1 LSB step.
Effective Number of Bits (ENOB)
Calculated from the measured SNR based on the equation
ENOB
MEASURED
=
76.1dBSNR
02.6
ENCODE Pulse Width/Duty Cycle
Pulse width high is the minimum amount of time the ENCODE
pulse (clock pulse) should be left in Logic 1 state to achieve
rated performance; pulse width low is the minimum time the
ENCODE pulse should be left in low state. See timing
implications of changing t
in the Application Notes, Encode
EH
Input section. At a given clock rate, these specifications define
an acceptable ENCODE duty cycle.
Minimum Conversion Rate
The ENCODE rate at which the SNR of the lowest analog
frequency drops by no more than 3 dB below the
signal
guaranteed limit.
Maximum Conversion Rate
The ENCODE rate at which parametric testing is performed.
Output Propagation Delay
The delay between a differential crossing of CLK+ and CLK– and
the time when all output data bits are within valid logic levels.
Noise (for Any Range within the ADC)
Calculated as follows:
NOISE
ZV
⎛
××=
10001.0
⎜
⎝
−−
10
⎞
dBFSdBcdBM
⎟
⎠
SignalSNRFS
where Z is the input impedance, FS is the full scale of the device
for the frequency in question, SNR is the value of the particular
input level, and Signal is the signal level within the ADC,
reported in dB below full scale. This value includes input levels
both thermal and quantization noise.
Power Supply Rejection Ratio
The ratio of a change in input offset voltage to a change in
power supply voltage.
Rev. C | Page 14 of 40
AD9430
Signal-to-Noise-and-Distortion (SINAD)
The ratio of the rms signal amplitude (set 1 dB below full scale)
to the rms value of the sum of all other spectral components,
including harmonics but excluding dc.
Worst Other Spur
The ratio of the rms signal amplitude to the rms value of the
worst spurious component (excluding the second and third
harmonic) reported in dBc.
Signal-to-Noise Ratio (without Harmonics)
The ratio of the rms signal amplitude (set at 1 dB below full
scale) to the rms value of the sum of all other spectral
components, excluding the first five harmonics and dc.
Spurious-Free Dynamic Range (SFDR)
The ratio of the rms signal amplitude to the rms value of the
peak spurious spectral component. The peak spurious
component may or may not be a harmonic. May be reported
in dBc (i.e., degrades as signal level is lowered) or dBFS (always
related back to converter full scale).
Two-Tone Intermodulation Distortion Rejection
The ratio of the rms value of either input tone to the rms
value of the worst third-order intermodulation product
reported in dBc.
Two -Tone SFDR
The ratio of the rms value of either input tone to the rms value
of the peak spurious component. The peak spurious component
may or may not be an IMD product. May be reported in dBc
(i.e., degrades as signal level is lowered) or in dBFS (always
related back to converter full scale).
;
Transi ent Res p onse T i m e
The time it takes for the ADC to reacquire the analog input
after a transient from 10% above negative full scale to
10% below positive full scale.
Out-of-Range Recovery Time
The time it takes for the ADC to reacquire the analog input
after a transient from 10% above positive full scale to 10% above
negative full scale, or from 10% below negative full scale to
10% below positive full scale.
Rev. C | Page 15 of 40
AD9430
V
EQUIVALENT CIRCUITS
AVDD
Ω
12k
CLK+
OR
DS+
10k
150
Ω
Ω
12k
150
FULL
K
SCALE
S5 = 0 —> K = 1.24
Ω
CLK–
OR
Ω
10k
Ω
DS–
+
–
1V
S5 = 1 —> K = 0.62
A1
200
0.1µF
VREF
Ω
VIN+
Figure 6. ENCODE and DS Inputs
3.5k
Ω
20k
Ω
Figure 7. Analog Inp uts
S1, S2,
S4, S5
30k
1k
VDD
02607-006
DISABLE
A1
Figure 9. VREF, SENSE I/O
DR
DX
3.5k
20k
AVDD
Ω
VIN–
Ω
02607-007
SENSE
Ω
02607-009
DD
02607-010
VDD
Figure 10. Data Outputs (CMOS Mode)
Ω
02607-008
V
DX–
V
DRVDD
V
DX+
V
Figure 8. S1-S5 Inputs
02607-011
Figure 11. Data Outputs (LVDS Mode)
Rev. C | Page 16 of 40
AD9430
TYPICAL PERFORMANCE CHARACTERISTICS
Charts at 170 MSPS, 210 MSPS for –170, –210 grades, respectively. AVDD, DRVDD = 3.3 V, T = 25C, AIN differential drive,
Full scale = 1.536 V, internal reference unless otherwise noted.
Figure 23. Harmonic Distortion (Second and Third) and
SFDR vs. A
Frequency, fs = 170 MSPS, CMOS Mode
IN
02607-023
AD9430
70
68
66
64
62
60
dB
58
56
54
52
50
010015050200250300350400
Figure 24. SNR, and SINAD vs. A
A
@ –0.5 dBFS, LVDS Mode
IN
–170 SNR
–170 SINAD
AIN (MHz)
Frequency ; fs = 170, 210 MSPS,
IN
–210 SNR
–210 SINAD
02607-024
0
–30
–60
dB
–90
–120
0 102030405060809010070
SFDR = 63dBc
MHz
Figure 27. Two-Tone Intermodulation Distortion (59 MHz and 60 MHz),
LVD S Mod e, f
= 210 MSPS
s
02607-027
85
80
75
70
65
dB
60
55
50
45
40
010015025035050200300400
Figure 25. SNR, and SINAD, SFDR vs. A
f
= 210 MSPS, AIN @ –0.5 dBFS, CMOS Mode
s
0
SFDR = 75dBc
–10
–20
–30
–40
dB
–50
–60
–70
–80
–90
–100
04010203050607080
SNR
AIN (MHz)
MHz
SFDR
SINAD
Frequency;
IN
Figure 26. Two-Tone Intermodulation Distortion
(28.3 MHz and 29.3 MHz; LVDS Mode, f
= 170 MSPS)
s
02607-025
85
02607-026
95
90
85
80
75
dB
70
65
60
55
50
025050100150200
SFDR
SINAD
MHz
Figure 28. SINAD and SFDR vs. Clock Rate
(A
= 10.3 MHz @ –0.5 dBFS, LVDS Mode), –170 Grade
IN
85
80
75
70
65
dB
60
55
50
45
40
010015025050200
SINAD
SFDR
SNR
MHz
Figure 29. SNR, and SINAD, SFDR vs. Clock Rate
= 10.3 MHz, @ –0.5 dBFS), LVDS Mode, –210 Grade
(A
IN
02607-028
02607-029
Rev. C | Page 19 of 40
AD9430
400
ANALOG SUPPLY
CURRENT CMOS
350
MODE
300
250
OUTPUT SUPPLY
CURRENT LVDS
200
MODE
150
100
(ANALOG SUPPLY CURRENT) (mA)
50
AVDD
I
0
100220140160180200120
Figure 30. I
AVDD
and I
ENCODE (MSPS)
vs. Clock Rate (AIN = 10.3 MHz @ –0.5 dBFS)
DRVDD
170 MSPS Grade, C
450
ANALOG SUPPLY
400
CURRENT LVDS MODE
350
300
250
200
150
100
(ANALOG SUPPLY CURRENT) (mA)
50
AVDD
I
0
100140160200
(A
OUTPUT SUPPLY
CURRENT LVDS MODE
120180
Figure 31. I
= 10.3 MHz @ –0.5 dBFS) 210 MSPS Grade, C
IN
ENCODE (MSPS)
AVDD
ANALOG SUPPLY
CURRENT LVDS
MODE
OUTPUT SUPPLY
CURRENT CMOS
MODE
= 5pF
LOAD
ANALOG SUPPLY
CURRENT CMOS MODE
OUTPUT SUPPLY
CURRENT CMOS MODE
and I
vs. Clock Rate
DRVDD
220
LOAD
240
= 5 pF
80
60
40
20
0
90
80
70
60
50
40
30
20
10
0
(OUTPUT SUPPLY CURRENT) (mA)
DRVDD
I
02607-030
(OUTPUT SUPPLY CURRENT) (mA)
DRVDD
I
02607-031
80
75
70
65
dB
60
55
50
20405070306080
ENCODE POSITIVE DUTY CYCLE (%)
SFDR
SNR
SINAD
Figure 33. SNR, SINAD, and SFDR vs. ENCODE Pulse Width High,
= 10.3 MHz @ –0.5 dBFS, 210 MSPS, LVDS)
(A
IN
1.4
1.2
1.0
0.8
(V)
0.6
REFOUT
V
0.4
0.2
0
081472
RO = 13Ω TYP
Figure 34. V
I
LOAD
536
(mA)
vs. I
REFOUT
LOAD
02607-033
02607-034
85
80
75
70
dB
65
60
55
50
106090204050708030
SFDR
SNR
SINAD
ENCODE POSITIVE DUTY CYCLE (%)
Figure 32. SINAD and SFDR vs. Clock Pulse Width High
(A
= 10.3 MHz @ –0.5 dBFS, 170 MSPS, LVDS)
IN
02607-032
Rev. C | Page 20 of 40
2.0
1.5
1.0
0.5
0
–0.5
GAIN ERROR (%)
–1.0
–1.5
–2.0
–501095–30–1030507090
TEMPERATURE (°C)
% GAIN ERROR
USING EXT REF
Figure 35. Full-Scale Gain Error vs. Temperature
= 10.3 MHz @ –0.5 dBFS, 170 MSPS/210 MSPS, LVDS)
(A
IN
02607-035
AD9430
1.250
1.245
1.00
0.75
0.50
1.240
(V)
REF
V
1.235
1.230
1.225
2.53.12.72.93.33.53.73.9
Figure 36. V
95
90
85
80
dB
75
70
65
60
–5010–30–1030507090
SFDR
AVDD (V)
Output Voltage vs. AVDD
REF
THIRD
SECOND
TEMPERATURE (°C)
Figure 37. SNR, SINAD, SFDR vs. Temperature
= 10.3 MHz @ –0.5 dBFS, 170 MSPS)
(A
IN
SNR
SINAD
02607-036
02607-037
0.25
0
LSB
–0.25
–0.50
–0.75
–1.00
0400050015002500 3000100020003500
Figure 39. Typical INL Plot (A
1.00
0.75
0.50
0.25
0
LSB
–0.25
–0.50
–0.75
–1.00
0400050015002500 3000100020003500
Figure 40. Typical DNL Plot (A
CODE
= 10.3 MHz @ –0.5 dBFS, 170 MSPS, LVDS)
IN
CODE
= 10.3 MHz @ –0.5 dBFS)
IN
02607-039
02607-040
65
64
63
62
61
60
dB
59
58
57
56
55
–45–51555–253575
TEMPERATURE (°C)
AVDD = 3.135
AVDD = 3.3
AVDD = 3.0
Figure 38. SINAD vs. Temperature, AVDD
= 70 MHz @ –0.5 dB, 210 MSPS, LVDS Mode)
(A
IN
AVDD = 3.6
02607-038
Rev. C | Page 21 of 40
100
90
80
70
60
50
dB
40
30
20
10
0
–1000–70–50–30 –20–60–40–10–80–90
SFDR –dBFS
SFDR –dBc
80dB
REFERENCE LINE
ANALOG INPUT LEVEL (dBFS)
Figure 41. SFDR vs. A
A
@ 10.3MHz,170 MSPS, LVDS Mode
IN
Input Level,
IN
02607-041
AD9430
90
80
70
60
50
dB
40
30
20
10
0
–90–70–60–40–20–80–50–30–10
Figure 42. SFDR vs. A
90
80
70
60
50
dB
40
30
20
10
0
–90–70–60–40–20–80–50–30–10
Figure 43. SFDR vs. A
SFDR dBc
LVDS MODE
FULL SCALE = 1.5
SFDR dBc
CMOS MODE
FULL SCALE = 1.5
80dB REFERENCE LINE
0
Input Level, AIN @ 10.3 MHz, 210 MSPS,
IN
LVD S/C MO S Mo des
SFDR dBc
LVDS MODE
FULL SCALE = 1.5
SFDR dBc
LVDS MODE
FULL SCALE = 0.75
80dB REFERENCE LINE
0
Input Level, AIN @ 10.3 MHz, 210 MSPS, LVDS Mode,
IN
Full Scale = 0.76 V/1.536 V
02607-042
02607-043
0
–20
–40
dB
–60
–80
–100
19.238.4
19.2
MHz
Figure 45. W-CDMA Four Channels Centered at 38.4 MHz,
= 153.6 MHz, LVDS Mode
f
s
90
80
70
60
50
dB
40
30
20
10
0
02.52.01.01.50.5
FULL-SCALE RANGE (V)
SFDR
SNR
SINAD
Figure 46. SNR, and SINAD. SFDR vs. Full-Scale Range, S5 = 0,
Full-Scale Range Varied by Adjusting VREF, 170 MSPS
47.6
02607-045
02607-046
0
NPR = 56.95dB
ENCODE = 170MSPS
–20
NOTCH @ 19MHz
–40
–60
–80
–100
NOISE INPUT LEVEL (dB)
–120
–140
2.6542.521.25
Figure 44. Noise Power Ratio Plot
4.5
4.0
3.5
ns
TPD
3.0
TCPD
2.5
MHz
02607-044
–40100602040–20080
TEMPERATURE (°C)
02607-047
Figure 47. Propagation Delay vs. Temperature, LVDS Mode,
170 MSPS/210 MSPS
Rev. C | Page 22 of 40
AD9430
4.5
4.0
3.5
ns
3.0
2.5
–40100602040–20080
TCPD (CLOCKOUT RISING)
TPDR (DATA RISING)
TEMPERATURE (°C)
Figure 48. Propagation Delay vs. Temperature,
CMOS Mode, 170 MSPS/210 MSPS
TPDF (DATA FALLING)
02607-048
900
800
700
600
500
(mV)
DIF
400
V
300
200
100
0
014106212
V
V
OS
OD
84
RSET (kΩ)
1.4
1.3
1.2
1.1
1.0
0.9
0.8
0.7
0.6
0.5
(V)
OS
V
02607-049
Figure 49. LVDS Output Swing, Common-Mode Voltage vs. RSET,
Placed at LVDSBIAS, 170 MSPS/210 MSPS
Rev. C | Page 23 of 40
AD9430
APPLICATION NOTES
THEORY OF OPERATION
The AD9430 architecture is optimized for high speed and ease
of use. The analog inputs drive an integrated high bandwidth
track-and-hold circuit that samples the signal prior to
quantization by the 12-bit core. For ease of use, the part
includes an on-board reference and input logic that accepts
TTL, CMOS, or LVPECL levels. The digital output’s logic levels
are user selectable as standard 3 V CMOS or LVDS (ANSI-644
compatible) via Pin S2.
ENCODE INPUT
Any high speed A/D converter is extremely sensitive to the
quality of the sampling clock provided by the user. A track-andhold circuit is essentially a mixer, and any noise, distortion, or
timing jitter on the clock is combined with the desired signal at
the A/D output. For that reason, considerable care has been
taken in the design of the clock inputs of the AD9430, and the
user is advised to give careful thought to the clock source.
The AD9430 has an internal clock duty cycle stabilization
circuit that locks to the rising edge of CLK+ and optimizes
timing internally. This allows for a wide range of input duty
cycles at the input without degrading performance. Jitter in
rising edge of the input is still of paramount concern and
the
not reduced by the internal stabilization circuit. The duty
is
cycle control loop does not function for clock rates less than
30 MHz nominally. The loop has a time constant associated
1 X X X Twos complement
0 X X X Offset binary
X 0 1 X Dual-mode CMOS interleaved
X 0 0 X Dual-mode CMOS parallel
X 1 X X LVDS mode
X X X 1 Full scale = 0.768 V
X X X 0 Full scale = 1.536 V
1
X = Don’t care.
2
S4 used in CMOS mode only (S2 = 0). S1 to S5 all have 30 kΩ-resistive pull-downs on-chip.
3
S5 full-scale adjust (see Analog Inputs section).
In interleaved mode, output data on Port A is offset from output data changes on Port B by one-half output clock cycle:
S21 S41 S51
with it that needs to be considered in applications where the
clock rate can change dynamically, requiring a wait time of
1.5 µs to 5 µs after a dynamic clock frequency increase before
valid data is available. This circuit is always on and cannot be
disabled by the user.
The clock inputs are internally biased to 1.5 V (nominal) and
support either differential or single-ended signals. For best
dynamic performance, a differential signal is recommended. An
MC100LVEL16 performs well in the circuit to drive the clock
inputs, as illustrated in Figure 50. (For trace lengths > 2 inches,
a standard LVPECL termination is recommended rather than
the simple pull-down as shown.) Note that for this low voltage
PECL device, the ac coupling is optional.
0.1µF
PECL
GATE
0.1µF
510Ω
Figure 50. Driving Clock Inputs with LVEL16
510Ω
AD9430
CLK+
CLK–
02607-050
INTERLEAVED MODEPARALLEL MODE
Figure 51.
Rev. C | Page 24 of 40
02607-051
AD9430
ANALOG INPUT
The analog input to the AD9430 is a differential buffer. For
best dynamic performance, impedances at VIN+ and VIN
should match. The analog input is optimized to provide
superior
wideband performance and requires that the analog
inputs be driven differentially. SNR and SINAD performance
degrades significantly if the analog input is driven with a singleended signal.
A wideband transformer, such as Mini-Circuits’ ADT1-1WT,
can provide the differential analog inputs for applications that
require a single-ended-to-differential conversion. Both analog
inputs are self-biased by an on-chip resistor divider to a
nominal 2.8 V. (See the Equivalent Circuits section.)
Special care was taken in the design of the analog input section
of the AD9430 to prevent damage and corruption of data when
the input is overdriven. The nominal differential input range is
approximately 1.5 V p-p ~ (768 mV × 2). Note that the best
performance is achieved with S5 = 0 (full-scale = 1.5). See
Figure 43.
S5 = GND
VIN+
768mV
2.8V
VIN–
–
2.8V
DS INPUTS (DS+, DS–)
In CMOS output mode, the data sync inputs (DS+, DS–) can be
used in applications that require a given sample to appear at a
specific output port (A or B) relative to a given external timing
signal. The DS inputs can also be used to synchronize two or
more ADCs in a system to maintain phasing between Ports A
and B on separate ADCs (in effect, synchronizing multiple
DCO outputs). When DS+ is held high (DS– low), the ADC
data outputs and clock do not switch and are held static.
Synchronization is accomplished by the assertion (falling edge)
of DS+ within the timing constraints t
SDS
and t
clock rising edge. (On initial synchronization, t
relevant.) If DS+ falls within the required setup time (t
before a given clock rising edge N, the analog value at that point
in time will be digitized and available at Port A, 14 cycles later
in interleaved mode.
The very next sample, N + 1, is sampled by the next rising clock
edge and available at Port B, 14 cycles after that clock edge. In
dual parallel mode, Port A has a 15-cycle latency and Port B has
a 14-cycle latency, but data is available at the same time. Driving
each ADC’s DS inputs by the same sync signals accomplishes
this. An easy way to accomplish synchronization is by a onetime sync at power-on reset. Note that when running the
AD9430 in LVDS mode, set DS+ to ground and DS– to 3.3 V, as
the DS inputs are relevant only in CMOS output mode,
simplifying the design for some applications as well as affording
superior SNR/SINAD performance at higher encode/analog
frequencies.
, relative to a
HDS
is not
HDS
SDS
)
768mV
DIGITALOUT = ALL 1sDIGITALOUT = ALL 0s
Figure 52. Differential Analog Input Range
S5 = AVDD
VIN+
2.8V
VIN– =2.8V
Figure 53. Single-Ended Analog Input Range
2.8V
CMOS OUTPUTS
The off-chip drivers on the chip can be configured to provide
02607-052
CMOS compatible output levels via Pin S2. The CMOS digital
outputs (S2 = 0) are TTL/CMOS compatible for lower power
consumption. The outputs are biased from a separate supply
(DRVDD), allowing easy interface to external logic. The outputs
are CMOS devices that swing from ground to DRVDD (with no
dc load). It is recommended to minimize the capacitive load the
ADC drives by keeping the output traces short (< 1 inch, for a
total C
< 5 pF). When operating in CMOS mode, it is also
LOAD
recommended to place low value (20 Ω) series damping
resistors on the data lines to reduce switching transient effects
on performance.
LVDS OUTPUTS
The off-chip drivers on the chip can be configured to provide
LVDS compatible output levels via Pin S2. LVDS outputs are
02607-053
at Pin 7 (LVDSBIAS) to ground. The RSET resistor current is
ratioed on-chip, setting the output current at each output equal
to a nominal 3.5 mA (11 × IRSET). A 100 Ω
termination resistor placed at the LVDS receiver inputs results
available when S2 = V
and a 3.74 kΩ RSET resistor is placed
DD
differential
Rev. C | Page 25 of 40
AD9430
in a nominal 350 mV swing at the receiver. LVDS mode
facilitates interfacing with LVDS receivers in custom ASICs and
FPGAs that have LVDS capability for superior switching
performance in noisy environments. Single point-to-point net
topologies are recommended with a 100 Ω termination resistor
as close to the receiver as possible. It is recommended to keep
the trace length two inches maximum and to keep differential
output trace lengths as equal as possible.
FULL
K
SCALE
S5 = 0—> K = 1.24
S5 = 1—> K = 0.62
+
1V
A1
200Ω
0.1µF
VREF
EXTERNAL 1.23V
REFERENCE
+
CLOCK OUTPUTS (DCO+, DCO–)
The input ENCODE is divided by two (in CMOS mode) and
available off-chip at DCO+ and DCO–. These clocks can
facilitate latching off-chip, providing a low skew clocking
solution (see Figure 2). The on-chip clock buffers should not
drive more than 5 pF of capacitance to limit switching transient
effects on performance. Note that the output clocks are CMOS
levels when CMOS mode is selected (S2 = 0) and are LVDS
levels when in LVDS mode (S2 = V
), (requiring a 100 Ω
DD
differential termination at receiver in LVDS mode). The output
clock in LVDS mode switches at the ENCODE rate.
VOLTAGE REFERENCE
A stable and accurate 1.23 V voltage reference is built into the
AD9430 (VREF). The analog input full-scale range is linearly
proportional to the voltage at VREF. Note that an external
reference can be used by connecting the SENSE pin to VDD
(disabling internal reference) and driving VREF with the
external reference source. No appreciable degradation in
performance occurs when VREF is adjusted ±5%. A 0.1 µF
capacitor to ground is recommended at the VREF pin in
internal and external reference applications. Float the SENSE
pin for internal reference operation.
DISABLE
1kΩ
A1
Figure 54. Using an External Reference
V
DD
SENSE
3.3V
+
02607-054
NOISE POWER RATIO TESTING (NPR)
NPR is a test that is commonly used to characterize the return
path of cable systems where the signals are typically QAM
signals with a “noise-like” frequency spectrum. NPR
performance of the AD9430 was characterized in the lab
yielding an effective NPR = 56.9 dB at an analog input of
19 MHz. This agrees with a theoretical maximum NPR of
57.1 dB for an 11-bit ADC at 13.6 dB backoff. The rms noise
power of the signal inside the notch is compared with the rms
noise level outside the notch using an FFT. Sufficiently long
record lengths to guarantee a sufficient number of samples
inside the notch are a requirement, as well as a high order bandstop filter that provides the required notch depth for testing.
Rev. C | Page 26 of 40
AD9430
EVALUATION BOARD, CMOS MODE
The AD9430 evaluation board offers an easy way to test the
AD9430 in CMOS mode. It requires a clock source, an analog
input signal, and a 3.3 V power supply. The clock source is
buffered on the board to provide the clocks for the ADC, an onboard DAC, latches, and a data ready signal. The digital outputs
and output clocks are available at two 40-pin connectors, P3
and P4. (See Figure 60.) The board has several different modes
of operation and is shipped in the following configurations:
• Offset Binary
• Internal Voltage Reference
• CMOS Parallel Timing
• Full-Scale Adjust = Low
POWER CONNECTOR
Power is supplied to the board via a detachable 12-lead power
strip (three 4-pin blocks). (AVDD, DRVDD, and VDL are the
minimum required power connections).
Table 9. Power Connector, CMOS Mode
AVDD 3.3 V Analog supply for ADC (350 mA)
DRVDD 3.3 V Output supply for ADC (28 mA)
VDL 3.3 V Supply for support logic and DAC (350 mA)
EXT_VREF Optional external reference input
VCLK/V_XTAL Supply for clock buffer/optional CRYSTAL
VAMP Supply for optional amp
ANALOG INPUTS
The evaluation board accepts a 1.3 V p-p analog input signal
centered at ground at SMB connector J4. This signal is
terminated to ground through 50 Ω
alternatively terminated at transformer T1 secondary by R13
and R14. T1 is a wideband RF transformer providing the singleended-to-differential conversion, allowing the ADC to be
driven differentially, minimizing even order harmonics. An
optional second transformer, T2, can be placed following T1 if
desired. This would provide some performance advantage
(~1 dB to 2 dB) for high analog input frequencies (>100 MHz).
If T2 is placed, two shorting traces at the pads would need to be
cut. The analog signal is low-pass filtered by R41, C12 and R42,
C13 at the ADC input.
by R16. The input can be
GAIN
Full scale is set at E17, E18, and E19. Connecting E17 to E18
sets S5 low, full scale = 1.5 V differential; connecting E17 to E19
sets S5 high, full scale = 0.75 V differential.
ENCODE
The ENCODE clock is terminated to ground through 50 Ω at
SMB connector J5. The input is ac-coupled to a high speed
differential receiver (LVEL16) that provides the required
low jitter, fast edge rates needed for optimum performance.
J5 input should be > 0.5 V p-p. Power to the EL16 is set at
jumper E47. Connecting E47 to E45 powers the buffer from
AVDD; connecting E47 to E46 powers the buffer from
VCLK/V_XTAL.
VOLTAGE REFERENCE
The AD9430 has an internal 1.23 V voltage reference. The ADC
uses the internal reference as the default
and E25–E26 are left open. The full scale can be increased by
placing optional resistor R3. The required value would vary
with the process and needs to be tuned for the specific
application. Full scale can similarly be reduced by placing R4;
tuning is required here as well. An external reference can be
used by shorting the SENSE pin to 3.3 V (place jumper
E26–E25). E27–E24 jumper connects the ADC VREF pin to the
EXT_VREF pin at the power connector.
when jumpers
E24–E27
DATA FORMAT SELECT
Data format select sets the output data format of the ADC.
Setting DFS (E1 to E2) low sets the output format to be offset
binary; setting DFS high (E1 to E3) sets the output to twos
complement.
I/P TIMING SELECT
Output timing is set at E11, E12 and E13. E12 to E11 sets S4 low
for parallel output timing mode. E11 to E13 sets S4 high for
interleaved timing mode.
TIMING CONTROLS
Flexibility in latch clocking and output timing is accomplished
by allowing for clock inversion at the timing controls section of
the PCB. Each buffered clock is buffered by an XOR and can be
inverted by moving the appropriate jumper for that clock.
CMOS DATA OUTPUTS
The ADC CMOS digital outputs are latched on the board by
four LVT574s; the latch outputs are available at the two 40-pin
connectors at Pins 11–33 on P23 (Channel A) and Pins 11–33
on P3 (Channel B). The latch output clocks (data ready) are
available at Pin 37 on P23 (Channel A) and Pin 37 on P3
(Channel B). The data-ready clocks can be inverted at the
timing controls section if needed
Rev. C | Page 27 of 40
AD9430
∆
4.6ns
C1 FREQ
84.65608MHz
1
2
2.00V2.00V
CH1CH2CH2M 5.00ns
02607-055
Figure 55. Data Output and Clock @ 80-Pin Connector
DAC OUTPUTS
Each channel is reconstructed by an on-board, dual-channel
DAC, an AD9753. This DAC is intended to assist in debug—it
should not be used to measure the performance of the ADC. It
is a current output DAC with on-board 50 Ω
resistors. Figure 56 is representative of the DAC output with a
full-scale analog input. The scope setting is low bandwidth.
termination
C1 FREQ
10.33592MHz
C1 p-p
448mV
0
ENCODE 163.84MHz
–10
ANALOG 65.02MHz
SNR 63.93dB
SINAD 63.87dB
–20
FUND –0.45dBFS
2ND –85.62dBc
–30
3RD –91.31dBc
4TH –90.54dBc
–40
5TH –90.56dBc
6TH –91.12dBc
–50
THD –82.21dBc
dB
SFDR 83.93dBc
–60
SAMPLES 8k
NOISEFLR –100.44dBFS
WORSTSP –83.93dBc
–70
–80
–90
–100
0820
4060
MHz
0
02607-057
Figure 57. FFT—Using VF561 CRYSTAL as Clock Source
ADC input filtering would enhance performance. See the
AD8350 data sheet. SNR/SINAD performance of 61 dB/60 dB is
possible and would start to degrade at about 30 MHz.
CUT TRACE
AD8350
1
CH1CH1M 25.0ns
2.00m
Ω
248mV
02607-056
Figure 56. DAC Output
CRYSTAL OSCILLATOR
An optional crystal oscillator can be placed on the board to
serve as a clock source for the PCB. Power to the oscillator is
through the VCLK/VXTAL pin at the power connector. If an
oscillator is used, ensure proper termination for best results.
The board has been tested with a Valpey Fisher VF561 and a
Vectron JN00158-163.84. Test results for the VF561 are shown
in Figure 57.
OPTIONAL AMPLIFIER
The footprint for transformer T2 can be modified to accept a
wideband differential amplifier (AD8350) for low frequency
applications where gain is required. Note that Pin 2 would need
to be lifted and left floating for operation. Input transformer T1
would need to be modified to a 4:1 for impedance matching and
1
CUT TRACE
02607-058
Figure 58. Using the AD8350 on the AD9430 PCB
TROUBLESHOOTING
If the board does not seem to be working correctly, try the
following:
• Verify power at IC pins.
• Check that all jumpers are in the correct position for the
desired mode of operation.
• Verify that VREF is at 1.23 V.
• Try running clock and analog inputs at low speeds
(10 MSPS/1 MHz) and monitor latch, DAC, and ADC for
toggling.
The AD9430 evaluation board is provided as a design example
for customers of Analog Devices, Inc. ADI makes no
warranties, express, statutory, or implied, regarding
merchantability or fitness for a particular purpose.
Rev. C | Page 28 of 40
AD9430
SIGNAL
GENERATOR
REFIN
10MHz
REFOUT
SIGNAL
GENERATOR
BAND-PASS
FILTER
3.3V
+
AVDD GND DRVDD GNDVDL GND
ANALOG
J4
AD9430 EVALUATION BOARD
CLOCK
J5
3.3V
–
–
+
+
Figure 59. Evaluation Board Connections
3.3V
–
DATA
CAPTURE
AND
PROCESSING
02607-059
Rev. C | Page 29 of 40
AD9430
Table 10. Evaluation Board Bill of Materials—CMOS
No. Quantity Reference Designator Device Package Value Comments
The AD9430 evaluation board offers an easy way to test the
AD9430 in LVDS mode. (The board is also compatible with the
AD9411.) It requires a clock source, an analog input signal, and
a 3.3 V power supply. The clock source is buffered on the board
to provide the clocks for the ADC, latches, and a data-ready
signal. The digital outputs and output clocks are available at a
40-pin connector, P23. The board has several different modes of
operation and is shipped in the following configurations:
• Offset Binary
• Internal Voltage Reference
GAIN
Full scale
differential; E17–E19 sets S5 high, full scale = 0.75 V
differential. Best performance is obtained at 1.5 V full scale.
is set at E17–E19, E17–E18 sets S5 low, full scale = 1.5 V
CLOCK
The CLOCK input is terminated to ground through a 50 Ω
resistor at SMB connector J5. The input is ac-coupled to a high
speed differential receiver (LVEL16) that provides the required
low jitter, fast edge rates needed for optimum performance. J5
input should be > 0.5 V p-p. Power to the LVEL16 is set at
Jumper E47. E47–E45 powers the buffer from AVDD; E47–E46
powers the buffer from VCLK/V_XTAL.
• Full-Scale Adjust = Low
POWER CONNECTOR
Power is supplied to the board via a detachable 8-lead power
strip (two 4-pin blocks). Note for the following table that VCC,
DRVDD, and VDL are the minimum required power
connections, and LVEL16 clock buffer can be powered from
VCC or VDL at E47 jumper.
Table 11. Power Connector, LVDS Mode
VCC 3.3 V Analog supply for ADC (350 mA)
DRVDD 3.3 V Output supply for ADC (50 mA)
VDL 3.3 V Supply for support logic
EXT_VREF Optional external reference input
ANALOG INPUTS
The evaluation board accepts a 1.3 V p-p analog input signal
centered at ground at SMB connector J4. This signal is
terminated to ground through 50 Ω
alternatively terminated at T1 transformer secondary by R13
and R14.
singlebe driven differentially, minimizing even-order harmonics.
ptional second transformer, T2, can be placed following
o
if desired. This provides some performance advantage
(~1 – 2dB) for high analog input frequencies (>100 MHz). If T2
is placed, two shorting traces at the pads need to be cut. The
analog signal can be low-pass filtered by R41, C12 and R42, C13
at the ADC input. A wideband differential amplifier (AD8351)
can be configured on the PCB for DC-coupled applications.
Remove C6, C15, C30 to prevent transformer loading of the
amp. See the PCB schematic for more information.
T1 is a wideband RF transformer providing the
ended-to-differential conversion, allowing the ADC to
by R16. The input can be
An
T1
VOLTAGE REFERENCE
The AD9430 has an internal 1.23 V voltage reference. The ADC
uses the internal reference as the default when jumpers E24–E27
and E25–E26 are left open. The full scale can be increased by
placing optional resistor R3. The required value varies with the
process and needs to be tuned for the specific application. Full
scale can similarly be reduced by placing R4; tuning is required
here as well. An external reference can be used by shorting the
SENSE pin to 3.3 V (place jumper E26–E25). Jumper E27–E24
connects the ADC VREF pin to the EXT_VREF pin at the
power connector.
DATA FORMAT SELECT
Data format select (DFS) sets the output data format of the ADC.
Setting DFS low (E1–E2) sets the output format to be offset binary;
setting DFS high (E1–E3) sets the output to twos complement.
DATA OUTPUTS
The ADC LVDS digital outputs are routed directly to the
connector at the card edge. Resistor pads have been placed at
the output connector to allow for termination if the connector
receiving logic does not have the required differential
termination for the data bits and DCO. Each output trace pair
should be terminated differentially at the far end of the line
with a single 100 ohm resistor.
CRYSTAL OSCILLATOR
An optional crystal oscillator can be placed on the board to
serve as a clock source for the PCB. Power to the oscillator is
through the VCLK/VXTAL pin at the power connector. If an
oscillator is used, ensure proper termination for best results.
The board has been tested with a Valpey Fisher VF561 and a
Vectron JN00158-163.84.
Rev. C | Page 34 of 40
AD9430
Table 12. Evaluation Board Bill of Material—LVDS PCB
No. Quantity Reference Designator Device Package Value Comment
1. CENTER FIGURES ARE TYPICAL UNLESS OTHERWISE NOTED.
2. THE AD9411 HAS A CONDUCTIVE HEAT SLUG TO HELP DISSIPATE HEAT AND ENSURE RELIABLE OPERATION OF
THE DEVICE OVER THE FULL INDUSTRIAL TEMPERATURE RANGE. THE SLUG IS EXPOSED ON THE BOTTOM OF
THE PACKAGE AND ELECTRICALLY CONNECTED TO CHIP GROUND. IT IS RECOMMENDED THAT NO PCB SIGNAL
TRACES OR VIAS BE LOCATED UNDER THE PACKAGE THAT COULD COME IN CONTACT WITH THE CONDUCTIVE
SLUG. ATTACHING THE SLUG TO A GROUND PLANE WILL REDUCE THE JUNCTION TEMPERATURE OF THE
DEVICE WHICH MAY BE BENEFICIAL IN HIGH TEMPERATURE ENVIRONMENTS.
1
25
2650
7°
3.5°
0°
16.00 SQ
14.00 SQ
76100
75
TOP VIEW
(PINS DOWN)
51
0.50 BSC
COMPLIANT TO JEDEC STANDARDS MS-026AED-HD
0.27
0.22
0.17
0.15
0.05
75
51
1.05
1.00
0.95
COPLANARITY
0.08
76100
CONDUCTIVE
HEAT SINK
2650
6.50
NOM
1
25
Figure 77.100-Lead Thin Quad Flat Package, Exposed Pad [TQFP/EP]
(SV-100-1)
Dimensions shown in millimeters
ORDERING GUIDE
Model Temperature Range Package Description Package Option
AD9430BSV-170 –40°C to +85°C 100-Lead Thin Quad Flat Package, Exposed Pad [TQFP/EP] SV-100-1
AD9430BSVZ-1701 –40°C to +85°C 100-Lead Thin Quad Flat Package, Exposed Pad [TQFP/EP] SV-100-1
AD9430BSV-210 –40°C to +85°C 100-Lead Thin Quad Flat Package, Exposed Pad [TQFP/EP] SV-100-1
AD9430BSVZ-2101 –40°C to +85°C 100-Lead Thin Quad Flat Package, Exposed Pad [TQFP/EP] SV-100-1
AD9430-CMOS/PCB Evaluation Board (CMOS Mode) Shipped with –210 Grade
AD9430-LVDS/PCB Evaluation Board (LVDS Mode) Shipped with –210 Grade