SNR = 60 dB @ fIN up to 70 MHz @ 200 MSPS
ENOB of 9.8 @ f
SFDR = 80 dBc @ f
Excellent linearity:
DNL = ±0.15 LSB (typical)
INL = ±0.25 LSB (typical)
LVDS output levels
700 MHz full-power analog bandwidth
On-chip reference and track-and-hold
Power dissipation = 1.25 W typical @ 200 MSPS
1.5 V input voltage range
3.3 V supply operation
Output data format option
Clock duty cycle stabilizer
Pin compatible to LVDS mode AD9430
APPLICATIONS
Wireless and wired broadband communications
Cable reverse path
Communications test equipment
Radar and satellite subsystems
Power amplifier linearization
up to 70 MHz @ 200 MSPS (–0.5 dBFS)
IN
up to 70 MHz @ 200 MSPS (–0.5 dBFS)
IN
VIN+
VIN–
CLK+
CLK–
3.3 V A/D Converter
FUNCTIONAL BLOCK DIAGRAM
SENSE VREF
SCALABLE
REFERENCE
TRACK
AND
HOLD
CLOCK
MANAGEMENT
S1S5
AGND DRGND DRVDD AVDD
AD9411
ADC
10
10-BIT
PIPELINE
CORE
Figure 1.
LVDS TIMING
/
LVDS
OUTPUTS
AD9411
DATA,
OVERRANGE
IN LVDS
DCO+
DCO–
04530-0-001
GENERAL DESCRIPTION
The AD9411 is a 10-bit monolithic sampling analog-to-digital
converter optimized for high performance, low power, and ease
of use. The product operates up to a 200 MSPS conversion rate
and is optimized for outstanding dynamic performance in
wideband carrier and broadband systems. All necessary
functions, including track-and-hold (T/H) and reference, are
included on the chip to provide a complete conversion solution.
The ADC requires a 3.3 V power supply and a differential
sample clock for full performance operation. The digital outputs
are LVDS compatible and support both twos complement and
offset binary format. A data clock output is available to ease
data capture.
Fabricated on an advanced BiCMOS process, the AD9411 is
available in a 100-lead surface-mount plastic package (e-PAD
TQFP-100) specified over the industrial temperature range
(–40°C to +85°C).
Rev. A
Information furnished by Analog Devices is believed to be accurate and reliable.
However, no responsibility is assumed by Analog Devices for its use, nor for any
infringements of patents or other rights of third parties that may result from its use.
Specifications subject to change without notice. No license is granted by implication
or otherwise under any patent or patent rights of Analog Devices. Trademarks and
registered trademarks are the property of their respective owners.
PRODUCT HIGHLIGHTS
1. High performance.
Maintains 60 dB SNR @ 200 MSPS with a 70 MHz input.
2. Low power.
Consumes only 1.25 W @ 200 MSPS.
3. Ease of use.
LVDS output data and output clock signal allow interface
to current FPGA technology. The on-chip reference and
sample-and-hold function provide flexibility in system
design. Use of a single 3.3 V supply simplifies system
power supply design.
4. Out-of-range (OR).
The OR output bit indicates when the input signal is
beyond the selected input range.
Input Capacitance 25°C V 4 4 pF
LVDS LOGIC OUTPUTS4
VOD Differential Output Voltage Full VI 247 454 247 454 mV
VOS Output Offset Voltage Full VI 1.125 1.375 1.125 1.375 V
Output Coding Twos Complement or Binary Twos Complement or Binary
1
See the section. Equivalent Circuits
2
All ac specifications tested by driving CLK+ and CLK– differentially, |(CLK+) – (CLK–)| > 200 mV.
3
Clock inputs’ common mode can be externally set, such that 0.9 V < CLK± < 2.6 V.
4
LVDS R
= 100 Ω, LVDS output current set resistor (R
TERM
= –40°C, T
MIN
= +85°C, unless otherwise noted.
MAX
AD9411-170 AD9411-200
) = 3.74 kΩ (1% tolerance).
SET
Rev. A | Page 5 of 28
AD9411
SWITCHING SPECIFICATIONS
AVDD = 3.3 V, DRVDD = 3.3 V, T
Table 4.
Parameter (Conditions) TempTest
Maximum Conversion Rate1 Full VI 170
Minimum Conversion Rate
1
Full V
CLK+ Pulse Width High (tEH)1 Full IV 2
CLK+ Pulse Width Low (tEL)1 Full IV 2
OUTPUT (LVDS Mode)
Valid Time (tV) Full VI 2.0 2.0 ns
Propagation Delay (tPD) Full VI 3.2 4.3 3.2 4.3 ns
Rise Time (tR) (20% to 80%) 25°C V 0.5 0.5 ns
Fall Time (tF) (20% to 80%) 25°C V 0.5 0.5 ns
DCO Propagation Delay (t
Data to DCO Skew (tPD–t
CPD
) Full IV 0.2 0.5 0.8 0.2 0.5 0.8 ns
CPD
Latency Full IV 14 14 Cycles
Aperture Delay (tA) 25°C V 1.2 1.2 ns
Aperture Uncertainty (Jitter, tJ) 25°C V 0.25 0.25
Out-of-Range Recovery Time 25°C V 1 1 Cycles
1
All ac specifications tested by driving CLK+ and CLK– differentially.
= –40°C, T
MIN
= +85°C, unless otherwise noted.
MAX
AD9411-170 AD9411-200
Min Typ Max Min Typ Max Unit
Level
200
40
12.5 2
12.5 2
40 MSPS
12.5 ns
12.5 ns
MSPS
) Full VI 1.8 2.7 3.8 1.8 2.7 3.8 ns
ps
rms
EXPLANATION OF TEST LEVELS
I. 100% production tested.
II. 100% production tested at 25°C and sample tested at specified temperatures.
III. Sample tested only.
IV. Parameter is guaranteed by design and characterization testing.
V. Parameter is a typical value only.
VI. 100% production tested at 25°C; guaranteed by design and characterization testing for industrial temperature range; 100%
production tested at temperature extremes for military devices.
CLK+
CLK–
DATA OUT
DCO+
DCO–
N–1
A
IN
t
EH
N
N+1
t
EL
1/f
S
t
PD
N–14N–13N
14 CYCLES
N+1
t
CPD
Figure 2. LVDS Timing Diagram
Rev. A | Page 6 of 28
04530-0-002
AD9411
ABSOLUTE MAXIMUM RATINGS
Table 5.
ParameterRating
AVDD, DRVDD 4 V
Analog Inputs –0.5 V to AVDD +0.5 V
Digital Inputs –0.5 V to DRVDD +0.5 V
REFIN Inputs –0.5 V to AVDD +0.5 V
Digital Output Current 20 mA
Operating Temperature –55ºC to +125°C
Storage Temperature –65ºC to +150°C
Maximum Junction Temperature 150°C
Maximum Case Temperature 150°C
1
θ
JA
1
Typical θ
soldered) for multilayer board in still air with solid ground plane.
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on
the human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only and functional operation of the device at these or
any other conditions outside of those indicated in the operation
section of this specification is not implied. Exposure to absolute
maximum ratings conditions for extended periods may affect
device reliability.