The AD9289 is a quad 8-bit, 65 MSPS analog–to–digital converter
with an on–chip track–and–hold circuit and is designed for low
cost, low power, small size and ease of use. The product operates
up to 65 MSPS conversion rate and is optimized for outstanding
dynamic performance where a small package size is critical.
The ADC requires a single+3V power supply and an LVDS
compatible sample rate clock for full performance operation. No
external reference or driver components are required for many
applications. A separate output power supply pin supports LVDS
compatible serial digital output levels.
The ADC automatically multiplies up the sample rate clock for the
appropriate LVDS serial data rate. An FCO trigger is provided to
signal a new output byte. Power down is supported, and the ADC
consumes less than 10mW when enabled.
Fabricated on an advanced CMOS process, the AD9289 is
available in a 64-ball mini-BGA package (64 CSP_BGA)
specified over the industrial temperature range (–40°C to +85°C).
FUNCTIONAL BLOCK DIAGRAM
VIN+A
VIN-A
VIN+D
VIN-D
VREF
SENSE
REFT_A
REFB_A
REFT_B
REFB_B
SHARED_REF CML
AVDDDRVDD
DRGND
Ref
Select
Figure 1. Functional Block Diagram
PDWN
AD9289
SHA
SHA
+
0.5 V
-
Pipeline
ADC
Pipeline
ADC
FCO+ FCO-
8
8
Data Rate
Multiplier
CLK+ CLK-AGND
Serial
LVDS
Serial
LVDS
OR+ OR-S1
PRODUCT HIGHLIGHTS
1. Four analog-to-digital converters are contained in one small,
space saving package.
2. A Data Clock Out (DCO) is provided which operates up to
260 MHz.
3. The outputs of each ADC are serialized and provided on the
rising and falling edge of DCO). Output data rates up to 520
Mbps (8 bits x 65 MSPS) are available.
4. The AD9289 operates from a single 3V power supply.
5. The clock duty cycle stabilizer maintains performance over a
wide range of input clock duty cycles
AD9289 R1
SNR = 49.1dB, SFDR = 71.9dB
0
-10
-20
-30
-40
-50
-60
-70
-80
-90
-100
051015202530
D1+A
D1-A
D1+D
D1-D
LVDSBIAS
LOCK
DCO+
DCO-
Information furnished by Analog Devices is believed to be accurate and
reliable. However, no responsibility is assumed by Analog Devices for its
use, nor for any infringements of patents or other rights of third parties
that may result from its use. No license is granted by implication or
otherwise under any patent or patent rights of Analog Devices. Trademarks
and registered trademarks are the property of their respective companies.
AVDD = 3.0V, DRVDD = 3.0V; INT REF; DIFFERENTIAL ANALOG AND CLOCK INPUTS
Parameter Temp Test Level Min Typ Max Unit
RESOLUTION 8 Bits
No Missing Codes Full VI Guaranteed
Offset Matching
Gain Matching2
ACCURACY
TEMPERATURE
DRIFT
REFERENCE
ANALOG INPUTS
POWER SUPPLY
CROSSTALK Crosstalk Full V 70 dB
Differential Nonlinearity (DNL)
Full VI LSB
Integral Nonlinearity (INL)
Full VI LSB
Offset Error Full V
Gain Error2 Full V
Reference Full V
Internal Reference Voltage
Output Current Full V uA
Input Current Full V uA
Input Resistance Full V 7
Differential Input Voltage Range 1 –2 Vpp
Common Mode Voltage Full V 1.5 V
Input Resistance Full V tbd
Input Capacitance Full V 5 pF
Analog Bandwidth, Full Power Full V 400 MHz
AVDD Full IV 2.85 3.0 3.15 V
DRVDD Full IV 2.85 3.0 3.15 V
Power Dissipation3 Full VI 558 mW
Power Down Dissipation Full VI <10 mW
Power Supply Rejection Ratio
(PSRR)
IAVDD3 Full VI 150 mA
DRVDD3 Full VI 36 mA
1
25°C
25°C
25°C
25°C
25°C
25°C
Table 1
I
I
I
I
± 25
± 2
± 0.25
± 0.5
± 16
± 150
I 0.5 V
I mV/V
mV
% FS
LSB
LSB
ppm/°C
ppm/°C
ppm/°C
kΩ
kΩ
1
Specifications subject to change without notice
2
Gain error and gain temperature coefficients are based on the ADC only (with a fixed 0.5 V external reference and a 1 V p-p differential analog input).
3
Power dissipation measured with rated encode and a dc analog input (Outputs Static, I
0.5dBFS.
Rev. PrJ | Page 3 of 16 6/25/2004
VDD
= 0.). I
VCC
and I
measured with TBD MHz analog input @
VDD
AD9289 Preliminary Technical Data
DIGITAL SPECIFICATIONS
AVDD = 3.0V, DRVDD = 3.0V
Parameter Temp Test
Min Typ Max Unit
Level
Differential Input Voltage1 Full IV 247 mVpp
CLOCK INPUTS
(CLK+, CLK-)
LOGIC INPUTS
(LVDS Mode)
Input Common Mode Voltage Full IV 1.25 V
Input Resistance Full IV
Input Capacitance
Logic ‘1’ Voltage Full IV 2.0 V
Logic ‘0’ Voltage Full IV 0.8 V
Input Resistance Full IV 30
Input Capacitance Full IV 4 PF
Differential Output Voltage (VOD) Full IV 247 454 mV
Output Offset Voltage (VOS) Full IV 1.125 1.375 V DIGITAL OUTPUTS
Output Coding Full IV Twos Complement or
Table 2: Digital Specifications
25°C
IV pF
Binary
kΩ
kΩ
AC SPECIFICATIONS2
AVDD = 3.0 V, DRVDD = 3.0 V; INTERNAL REF; DIFFERENTIAL ANALOG AND CLOCK INPUT, LVDS OUTPUT
MODE
Parameter Temp Test
Level
SIGNAL TO NOISE
RATIO (SNR) –
Without Harmonics
SIGNAL TO NOISE
RATIO (SINAD) –
With Harmonics
EFFECTIVE
NUMBER OF BITS
(ENOB)
SPURIOUS FREE
DYNAMIC RANGE
(SFDR)
SECOND AND
THIRD HARMONIC
DISTORTION
TOTAL HARMONIC
DISTORTION (THD)
1
Clock Inputs are LVDS compatible .Clock Inputs require external DC bias and cannot be AC coupled.
2
SNR/harmonics based on an analog input voltage of –0.5 dBFS referenced to a 1 Vpp full-scale input range.
Minimum Clock Rate Full VI 20 MSPS
Clock Pulse Width High (tEH) Full IV 6.9 ns
Clock Pulse Width Low (tEL) Full IV 6.9 ns
Valid Time (tV)1 Full VI ns
Propagation Delay (tPD) 1 Full VI 10 ns
MSB Propagation Delay (t
) 1 Full VI 10 ns
MSB
Rise Time (tR) (20% to 80%) Full V 0.5 ns
Fall Time (tF) (20% to 80%) Full V 0.5 ns
DCO Propagation Delay (t
Data to DCO Skew (tPD – t
) Full VI 10 ns
CPD
) Full IV
CPD
Pipeline Latency Full VI 6 cycles
Aperture Delay (tA)
Aperture Uncertainty (Jitter)
Table 4: Switching Specifications
25°C
25°C
Min Typ Max Unit
+/- 100
pS
V ps
V <1 ps rms
EXPLANATION OF TEST LEVELS
TEST LEVEL
I 100% production tested.
II 100% production tested at +25°C and guaranteed by design and characterization at specified temperatures.
III Sample Tested Only
IV Parameter is guaranteed by design and characterization testing.
V Parameter is a typical value only.
VI 100% production tested at +25°C and guaranteed by design and characterization for industrial temperature range.
1
tV and t
not to exceed an ac load of 5 pF or a dc current of ±40 µA. Rise and fall times measured from 20% to 80%.
are measured from the transition points of the CLK input to the 50%/50% levels of the digital outputs swing. The digital output load during test is
PD
Rev. PrJ | Page 5 of 16 6/25/2004
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