Analog Devices AD9245 b Datasheet

FEATURES

Single 3 V supply operation (2.7 V to 3.6 V) SNR = 72.7 dBc to Nyquist SFDR = 87.6 dBc to Nyquist Low power: 366 mW Differential input with 500 MHz bandwidth On-chip reference and sample-and-hold DNL = ± 0.5 LSB Flexible analog input: 1 V p-p to 2 V p-p range Offset binary or twos complement data format Clock duty cycle stabilizer

APPLICATIONS

High end medical imaging equipment IF sampling in communications receivers:
WCDMA, CDMA-One, CDMA-2000, TDS-CDMA Battery-powered instruments Hand-held scopemeters Low cost digital oscilloscopes Power sensitive military applications

GENERAL DESCRIPTION

The AD9245 is a monolithic, single 3 V supply, 14-bit, 80 MSPS analog-to-digital converter featuring a high performance sample-and-hold amplifier (SHA) and voltage reference. The AD9245 uses a multistage differential pipelined architecture with output error correction logic to provide 14-bit accuracy at 80 MSPS and guarantee no missing codes over the full operat­ing temperature range.
The wide bandwidth, truly differential SHA allows a variety of user-selectable input ranges and common modes, including single-ended applications. It is suitable for multiplexed systems that switch full-scale voltage levels in successive channels, and for sampling single-channel inputs at frequencies well beyond the Nyquist rate. Combined with power and cost savings over previously available analog-to-digital converters, the AD9245 is suitable for applications in communications, imaging, and medical ultrasound.
A single-ended clock input is used to control all internal con­version cycles. A duty cycle stabilizer (DCS) compensates for wide variations in the clock duty cycle while maintaining
Rev. B
Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. Specifications subject to change without notice. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Trademarks and registered trademarks are the property of their respective owners.
14-Bit, 80 MSPS, 3 V A/D Converter
AD9245

FUNCTIONAL BLOCK DIAGRAM

DRVDDAVDD
AD9245
VIN+
VIN–
REFT
REFB
VREF
SENSE
SHA
REF
SELECT
MDAC1
4 16
A/D
0.5V
AGND
Figure 1. Functional Block Diagram
excellent overall ADC performance. The digital output data is presented in straight binary or twos complement formats. An out-of-range (OTR) signal indicates an overflow condition that can be used with the most significant bit to determine low or high overflow. Fabricated on an advanced CMOS process, the AD9245 is available in a 32-lead LFCSP and is specified over the industrial temperature range (–40°C to +85°C).
PRODUCT HIGHLIGHTS
1. The AD9245 operates from a single 3 V power supply and
features a separate digital output driver supply to accommo­date 2.5 V and 3.3 V logic families.
2. Operating at 80 MSPS, the AD9245 consumes a low 366 mW.
3. The patented SHA input maintains excellent performance for
input frequencies up to 100 MHz, and can be configured for single-ended or differential operation.
4. The AD9245 is pin compatible with the AD9215, AD9235,
and AD9236. This allows a simplified migration from 10 bits to 14 bits and 20 MSPS to 80 MSPS.
5. The clock DCS maintains overall ADC performance over a
wide range of clock pulsewidths.
6. The OTR output bit indicates when the signal is beyond the
selected input range.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 781.329.4700 www.analog.com Fax: 781.326.8703 © 2003 Analog Devices, Inc. All rights reserved.
8-STAGE
1 1/2-BIT PIPELINE
CORRECTION LOGIC
14
OUTPUT BUFFERS
CLOCK
DUTY CYCLE
STABILIZER
CLK PDWN MODE DGND
MODE
SELECT
A/D
03583-B-001
3
OTR
D13 (MSB)
D0 (LSB)
AD9245

TABLE OF CONTENTS

AD9245–DC Specifications ............................................................ 3
Analog Input and Reference Overview ................................... 14
AD9245–AC Specifications............................................................. 4
AD9245–Digital Specifications....................................................... 5
AD9245–Switching Specifications ................................................. 6
Explanation of Test Levels........................................................... 6
Absolute Maximum Ratings............................................................ 7
Thermal Resistance ...................................................................... 7
ESD Caution.................................................................................. 7
Definitions of Specifications ........................................................... 8
Pin Configuration and Functional Descriptions.......................... 9
Equivalent Circuits......................................................................... 10
Typical Performance Characteristics ........................................... 11
Theory of Operation ...................................................................... 14
REVISION HISTORY
Revision B
Clock Input Considerations...................................................... 15
Jitter Considerations .................................................................. 16
Power Dissipation and Standby Mode .................................... 16
Digital Outputs........................................................................... 16
Timing ......................................................................................... 17
Voltage Reference....................................................................... 17
Internal Reference Connection ................................................ 17
External Reference Operation .................................................. 18
Operational Mode Selection ..................................................... 18
Evaluation Board........................................................................ 18
Outline Dimensions....................................................................... 25
Ordering Guide .......................................................................... 25
10/03—Data Sheet Changed from REV. A to REV. B
Changes to Figure 33 ..................................................................... 17
5/03—Data Sheet Changed from REV. 0 to REV. A
Changes to Figure 30 .................................................................... 15
Changes to Figure 37 ..................................................................... 19
Changes to Figure 38..................................................................... 20
Changes to Figure 39...................................................................... 21
Changes to Table 10 ....................................................................... 24
Changes to the ORDERING GUIDE........................................... 25
Rev. B | Page 2 of 28
AD9245

AD9245–DC SPECIFICATIONS

Table 1. AVDD = 3 V, DRVDD = 2.5 V, Sample Rate = 80 MSPS, 2 V p-p Differential Input, 1.0 V External Reference, unless otherwise noted
Parameter
Temp
Test Level
Min Typ Max
RESOLUTION Full VI 14 Bits ACCURACY
No Missing Codes Full VI Guaranteed
Offset Error1 Full VI ±0.30 ±1.2 % FSR
Gain Error 25°C V ±0.28 % FSR
Gain Error1 Full VI ±0.70 ±4.16 % FSR
Differential Nonlinearity (DNL)2 Full VI ±0.5 ±1.0 LSB
Integral Nonlinearity (INL)2 Full VI ±1.4 ±5.15 LSB TEMPERATURE DRIFT
Offset Error1 Full V ±10 ppm/°C
Gain Error Full V ±12 ppm/°C
Gain Error1 Full V ±17 ppm/°C INTERNAL VOLTAGE REFERENCE
Output Voltage Error (1 V Mode) Full VI ±3 ±34 mV
Load Regulation @ 1.0 mA 25°C V ±2 mV
Output Voltage Error (0.5 V Mode) 25°C V ±6 mV
Load Regulation @ 0.5 mA 25°C V ±1 mV INPUT REFERRED NOISE
VREF = 0.5 V 25°C V 1.86 LSB rms
VREF = 1.0 V 25°C V 1.17 LSB rms ANALOG INPUT
Input Span, VREF = 0.5 V Full IV 1 V p-p
Input Span, VREF = 1.0 V Full IV 2 V p-p
Input Capacitance3 Full V 7 pF REFERENCE INPUT RESISTANCE Full V 7 kΩ POWER SUPPLIES
Supply Voltage
AVDD Full IV 2.7 3.0 3.6 V DRVDD Full IV 2.25 2.5 3.6 V
Supply Current
IAVDD2 Full VI 122 138 mA IDRVDD2 25°C V 9 mA
PSRR 25°C V ±0.01 % FSR POWER CONSUMPTION
Low Frequency Input4 25°C V 366 mW
Standby Power5 25°C V 1.0 mW
AD9245BCP
Unit
1
With a 1.0 V internal reference.
2
Measured at the maximum clock rate, f
3
Input capacitance refers to the effective capacitance between one differential input pin and AGND. Refer to for the equivalent analog input structure. Figure 4
4
Measured at AC Specification conditions without output drivers.
5
Standby power is measured with a dc input, CLK pin inactive (i.e., set to AVDD or AGND).
= 2.4 MHz, full-scale sine wave, with approximately 5 pF loading on each output bit.
IN
Rev. B | Page 3 of 28
AD9245

AD9245–AC SPECIFICATIONS

Table 2. AVDD = 3 V, DRVDD = 2.5 V, Sample Rate = 80 MSPS, 2 V p-p Differential Input, 1.0 V External Reference, AIN = –0.5 dBFS, DCS Off, unless otherwise noted
Parameter
SIGNAL-TO-NOISE RATIO (SNR)
fIN = 2.4 MHz Full VI 71.1 dB
25°C V 73.3 dB
fIN = 40 MHz 25°C V 72.7 dB fIN = 70 MHz Full IV 70.5 dB
25°C V 71.7 dB
fIN = 100 MHz 25°C V 70.2 dB
SIGNAL-TO-NOISE AND DISTORTION (SINAD)
fIN = 2.4 MHz Full VI 70.7 dB
25°C V 73.2 dB
fIN = 40 MHz 25°C V 72.5 dB fIN = 70 MHz Full IV 69.9 dB
25°C V 71.2 dB
fIN = 100 MHz 25°C V 69.6 dB
EFFECTIVE NUMBER OF BITS (ENOB)
fIN = 2.4 MHz Full VI 11.5 Bits
25°C V 11.9 Bits
fIN = 40 MHz 25°C V 11.8 Bits fIN = 70 MHz Full IV 11.3 Bits
25°C V 11.5 Bits
fIN = 100 MHz 25°C V 11.3 Bits
WORST SECOND OR THIRD
fIN = 2.4 MHz Full VI –76.5 dBc
25°C V –92.8 dBc
fIN = 40 MHz 25°C V –87.6 dBc fIN = 70 MHz Full IV –75.7 dBc
25°C V –81.6 dBc
fIN = 100 MHz 25°C V –79.0 dBc
SPURIOUS-FREE DYNAMIC RANGE (SFDR)
fIN = 2.4 MHz Full VI 76.5 dBc
25°C V 92.8 dBc
fIN = 40 MHz 25°C V 87.6 dBc fIN = 70 MHz Full IV 75.7 dBc
25°C V 81.6 dBc
fIN = 100 MHz 25°C V 79.0 dBc
Temp
Test Level
Min Typ Max
AD9245BCP
Unit
Rev. B | Page 4 of 28
AD9245

AD9245–DIGITAL SPECIFICATIONS

Table 3. AVDD = 3 V, DRVDD = 2.5 V, 1.0 V External Reference, unless otherwise noted
Parameter
LOGIC INPUTS (CLK, PDWN)
High Level Input Voltage Full IV 2.0 V
Low Level Input Voltage Full IV 0.8 V
High Level Input Current Full IV –10 +10 µA
Low Level Input Current Full IV –10 +10 µA
Input Capacitance Full V 2 pF DIGITAL OUTPUT BITS (D0–D13, OTR)1
DRVDD = 3.3 V
High Level Output Voltage (IOH = 50 µA) Full IV 3.29 V High Level Output Voltage (IOH = 0.5 mA) Full IV 3.25 V Low Level Output Voltage (IOH = 1.6 mA) Full IV 0.2 V Low Level Output Voltage (IOH = 50 µA) Full IV 0.05 V
DRVDD = 2.5 V
High Level Output Voltage (IOH = 50 µA) Full IV 2.49 V High Level Output Voltage (IOH = 0.5 mA) Full IV 2.45 V Low Level Output Voltage (IOH = 1.6 mA) Full IV 0.2 V Low Level Output Voltage (IOH = 50 µA) Full IV 0.05 V
Temp
Test Level
1
Output voltage levels measured with 5 pF load on each output.
AD9245BCP
Min Typ Max
Unit
Rev. B | Page 5 of 28
AD9245

AD9245–SWITCHING SPECIFICATIONS

Table 4. AVDD = 3 V, DRVDD = 2.5 V, unless otherwise noted
AD9245BCP
Unit
Parameter
Temp
Test Level
Min Typ Max
CLOCK INPUT PARAMETERS
Maximum Conversion Rate Full VI 80 MSPS Minimum Conversion Rate Full V 1 MSPS CLK Period Full V 12.5 ns CLK Pulsewidth High1 Full V 4.6 ns CLK Pulsewidth Low1 Full V 4.6 ns
DATA OUTPUT PARAMETERS
Output Propagation Delay (tPD)2 Full V 4.2 ns Pipeline Delay (Latency) Full V 7 Cycles Aperture Delay (tA) Full V 1 ns Aperture Uncertainty (Jitter, tJ) Full V 0.3 ps rms Wake-Up Time3 Full V 7 ms
OUT-OF-RANGE RECOVERY TIME Full V 2 Cycles
1
With duty cycle stabilizer (DCS) enabled.
2
Output propagation delay is measured from CLK 50% transition to DATA 50% transition, with 5 pF load.
3
Wake-up time is dependant on the value of the decoupling capacitors; typical values shown with 0.1 µF and 10 µF capacitors on REFT and REFB.
N+1
ANALOG
INPUT
CLK
DATA
OUT
N
N–1
N9N8N7N6N5N4N3N2N1 N
t
N+2
A
Figure 2. Timing Diagram
N+3
N+4
N+5
t
= 6.0ns MAX
PD
2.0ns MIN
N+6
N+7
N+8
03583-B-002

EXPLANATION OF TEST LEVELS

Test Level Definitions
I 100% production tested. II 100% production tested at 25°C and guaranteed by design and characterization at specified temperatures. III Sample tested only. IV Parameter is guaranteed by design and characterization testing. V Parameter is a typical value only. VI 100% production tested at 25°C and guaranteed by design and characterization for industrial temperature range.
Rev. B | Page 6 of 28
AD9245

ABSOLUTE MAXIMUM RATINGS

Table 5. AD9245 Absolute Maximum Ratings
Parameter With Respect to Min Max Unit ELECTRICAL
AVDD AGND –0.3 +3.9 V
DRVDD DGND –0.3 +3.9 V
AGND DGND –0.3 +0.3 V
AVDD DRVDD –3.9 +3.9 V
D0–D13 DGND –0.3 DRVDD + 0.3 V
CLK, MODE AGND –0.3 AVDD + 0.3 V
VIN+, VIN– AGND –0.3 AVDD + 0.3 V
VREF AGND –0.3 AVDD + 0.3 V
SENSE AGND –0.3 AVDD + 0.3 V
REFT, REFB AGND –0.3 AVDD + 0.3 V
PDWN AGND –0.3 AVDD + 0.3 V
ENVIRONMENTAL
Storage Temperature –65 +125 °C
Operating Temperature Range –40 +85 °C
Lead Temperature Range
(Soldering 10 sec)
Junction Temperature 150 °C
300
°C
Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational section of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.

THERMAL RESISTANCE

θJA is specified for the worst-case conditions on a 4-layer board in still air, in accordance with EIA/JESD51-1.
Table 6. Thermal Resistance
Package Type
CP-32 32.5 32.71 °C/W
θJC
θ
JA
Airflow increases heat dissipation, effectively reducing θ Also, more metal directly in contact with the package leads from metal traces, through holes, ground, and power planes reduces the θ
. It is recommended that the exposed paddle be
JA
soldered to the ground plane for the LFCSP package. There is an increased reliability of the solder joints, and maximum thermal capability of the package is achieved with the exposed paddle soldered to the customer board.
Unit
JA
.

ESD CAUTION

ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the human body and test equipment and can discharge without detection. Although this product features proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance degradation or loss of functionality.
Rev. B | Page 7 of 28
AD9245
(

DEFINITIONS OF SPECIFICATIONS

Analog Bandwidth (Full Power Bandwidth)—The analog input frequency at which the spectral power of the fundamental frequency (as determined by the FFT analysis) is reduced by 3 dB.
Aperture Delay (t
rising edge of the clock and the instant at which the analog input is sampled.
Aperture Uncertainty (Jitter, t
tion in aperture delay.
Integral Nonlinearity (INL)—The deviation of each individual code from a line drawn from negative full scale through positive full scale. The point used as negative full scale occurs ½ LSB before the first code transition. Positive full scale is defined as a level 1½ LSB beyond the last code transition. The deviation is measured from the middle of each particular code to the true straight line.
Differential Nonlinearity (DNL, No Missing Codes)—An ideal ADC exhibits code transitions that are exactly 1 LSB apart. DNL is the deviation from this ideal value. Guaranteed no miss­ing codes to 14-bit resolution indicates that all 16384 codes must be present over all operating ranges.
Offset Error—The major carry transition should occur for an analog value ½ LSB below VIN+ = VIN–. Offset error is defined as the deviation of the actual transition from that point.
)—The delay between the 50% point of the
A
)—The sample-to-sample varia-
J
Effective Number of Bits (ENOB)—The effective number of
bits for a sine wave input at a given input frequency can be cal­culated directly from its measured SINAD using the following formula:
)
=
ENOB
Signal-to-Noise Ratio (SNR)
SINAD
1
The ratio of the rms input
76.1
02.6
signal amplitude to the rms value of the sum of all other spec­tral components below the Nyquist frequency, excluding the first six harmonics and dc.
Spurious-Free Dynamic Range (SFDR)
1
The difference in dB
between the rms input signal amplitude and the peak spurious signal. The peak spurious component may or may not be a harmonic.
1
Two -Ton e SFDR
The ratio of the rms value of either input
tone to the rms value of the peak spurious component. The peak spurious component may or may not be an IMD product.
Clock Pulsewidth and Duty Cycle—Pulsewidth high is the minimum amount of time that the clock pulse should be left in the Logic 1 state to achieve rated performance. Pulsewidth low is the minimum time the clock pulse should be left in the Logic 0 state. At a given clock rate, these specifications define an acceptable clock duty cycle.
Gain Error—The first code transition should occur at an analog value ½ LSB above negative full scale. The last transition should occur at an analog value 1½ LSB below the positive full scale. Gain error is the deviation of the actual difference between first and last code transitions and the ideal difference between first and last code transitions.
Temperature Drift—The temperature drift for offset error and gain error specifies the maximum change from the initial (25°C) value to the value at T
MIN
or T
MAX
.
Power Supply Rejection Ratio—The change in full scale from the value with the supply at the minimum limit to the value with the supply at its maximum limit.
1
Total Harmonic Distortion (THD)
The ratio of the rms
input signal amplitude to the rms value of the sum of the first six harmonic components.
1
Signal-to-Noise and Distortion (SINAD)
The ratio of the
rms input signal amplitude to the rms value of the sum of all other spectral components below the Nyquist frequency, includ­ing harmonics but excluding dc.
Minimum Conversion Rate—The clock rate at which the SNR of the lowest analog signal frequency drops by no more than 3 dB below the guaranteed limit.
Maximum Conversion Rate—The clock rate at which para­metric testing is performed.
Output Propagation Delay (t
)—The delay between the clock
PD
rising edge and the time when all bits are within valid logic levels.
Out-of-Range Recovery Time—The time it takes for the ADC to reacquire the analog input after a transition from 10% above positive full scale to 10% above negative full scale, or from 10% below negative full scale to 10% below positive full scale.
1
AC specifications may be reported in dBc (degrades as signal levels are
lowered) or in dBFS (always related back to converter full scale).
Rev. B | Page 8 of 28
AD9245

PIN CONFIGURATION AND FUNCTIONAL DESCRIPTIONS

32 AVDD
31 AGND
30 VIN–
29 VIN+
28 AGND
27 AVDD
26 REFT
25 REFB
DNC 1
CLK 2
DNC 3
PDWN 4
(LSB) D0 5
D1 6
D2 7
D3 8
(Not to Scale)
D4 9
D5 10
AD9245
CSP
TOP VIEW
D6 11
D7 12
D8 13
D9 14
Figure 3. 32-Lead LFCSP
Table 7. Pin Function Descriptions—32-Lead LFCSP (CP Package)
Pin No. Mnemonic Description
1, 3 DNC Do Not Connect 2 CLK Clock Input Pin 4 PDWN Power-Down Function Select 5 to 14, 17 to 20 D0 (LSB) to D13 (MSB) Data Output Bits 15 DGND Digital Output Ground 16 DRVDD Digital Output Driver Supply 21 OTR Out-of-Range Indicator 22 MODE Data Format Select and DCS Mode Selection (see ) 23 SENSE Reference Mode Selection (see Table 8) 24 VREF Voltage Reference Input/Output 25 REFB Differential Reference (–) 26 REFT Differential Reference (+) 27, 32 AVDD Analog Power Supply 28, 31 AGND Analog Ground 29 VIN+ Analog Input Pin (+) 30 VIN– Analog Input Pin (–)
DGND 15
24 VREF
23 SENSE
22 MODE
21 OTR
20 D13 (MSB)
19 D12
18 D11
17 D10
DRVDD 16
03583-B-022
Table 9
Rev. B | Page 9 of 28
Loading...
+ 19 hidden pages