300 mW at 40 MSPS
On-chip reference and sample-and-hold
750 MHz analog input bandwidth
SNR > 73 dBc to Nyquist @ 65 MSPS
SFDR > 86 dBc to Nyquist @ 65 MSPS
Differential nonlinearity error = ±0.7 LSB
Guaranteed no missing codes over full temperature range
1 V to 2 V p-p differential full-scale analog input range
Single 5 V analog supply, 3.3 V/5 V driver supply
Out-of-range indicator
Straight binary or twos complement output data
Clock duty cycle stabilizer
Output-enable function
48-lead LQFP package
APPLICATIONS
Communication subsystems (microcell, picocell)
Medical and high-end imaging equipment
Test and measurement equipment
GENERAL DESCRIPTION
The AD9244 is a monolithic, single 5 V supply, 14-bit,
40 MSPS/65 MSPS ADC with an on-chip, high performance
sample-and-hold amplifier (SHA) and voltage reference.
The AD9244 uses a multistage differential pipelined architecture with output error correction logic to provide 14-bit
accuracy at 40 MSPS/65 MSPS data rates, and guarantees no
missing codes over the full operating temperature range.
The AD9244 has an on-board, programmable voltage reference.
An external reference can also be used to suit the dc accuracy
and temperature drift requirements of the application.
A differential or single-ended clock input controls all internal
conversion cycles. The digital output data can be presented in
straight binary or in twos complement format. An out-of-range
(OTR) signal indicates an overflow condition that can be used
with the most significant bit to determine low or high overflow.
AD9244
FUNCTIONAL BLOCK DIAGRAM
VDDDRVDD
AD9244
VIN+
VIN–
CLK+
CLK–
DCS
SHA
TIMING
AGNDDGNDVREF SENSE
Fabricated on an advanced CMOS process, the AD9244 is
available in a 48-lead LQFP and is specified for operation over
the industrial temperature range (–40°C to +85°C).
PRODUCT HIGHLIGHTS
1. Low Power—The AD9244, at 550 mW, consumes a fraction
of the power of currently available ADCs in existing high
speed solutions.
2. IF Sampling—The AD9244 delivers outstanding
performance at input frequencies beyond the first Nyquist
zone. Sampling at 65 MSPS with an input frequency of
100 MHz, the AD9244 delivers 71 dB SNR and 86 dB SFDR.
input can be configured for either single-ended or
differential inputs.
5. Out-of-Range (OTR) Indicator—The OTR output bit
indicates when the input signal is beyond the AD9244’s
input range.
6. Single Supply—The AD9244 uses a single 5 V power
supply, simplifying system power supply design. It also
features a separate digital output driver supply to
accommodate 3.3 V and 5 V logic families.
VRCML
REFT REFB
10-STAGE
PIPELINE ADC
REFERENCE
Figure 1.
14
REF
GND
AD9226.
OUTPUT
REGISTER
14
DFS
OTR
D13 TO D0
OEB
02404-001
Rev. C
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Anal og Devices for its use, nor for any infringements of patents or ot her
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarks and registered trademarks are the property of their respective owners.
AVDD = 5 V, DRVDD = 3 V, f
differential analog inputs, unless otherwise noted.
Table 1.
Test AD9244BST-65 AD9244BST-40
Parameter Temp Level Min Typ Max Min Typ Max Unit
RESOLUTION Full VI 14 14 Bits
DC ACCURACY
No Missing Codes Full VI Guaranteed Guaranteed Bits
Offset Error Full VI ±0.3 ±1.4 ±0.3 ±1.4 % FSR
Gain Error
Differential Nonlinearity (DNL)
25°C V ±0.7 ±0.6 LSB
Integral Nonlinearity (INL)
Full VI −4 +4 −4 +4 LSB
TEMPERATURE DRIFT
Offset Error Full V ±2.0 ±2.0 ppm/°C
Gain Error (EXT VREF)
Gain Error (INT VREF)
INTERNAL VOLTAGE REFERENCE
Output Voltage Error (2 VREF) Full VI ±29 ±29 mV
Load Regulation @ 1 mA Full V 0.5 0.5 mV
Output Voltage Error (1 VREF) Full IV ±15 ±15 mV
Load Regulation @ 0.5 mA Full V 0.25 0.25 mV
Input Resistance Full V 5 5 kΩ
INPUT REFERRED NOISE
VREF = 2 V 25°C V 0.8 0.8 LSB rms
VREF = 1 V 25°C V 1.5 1.5 LSB rms
ANALOG INPUT
Input Voltage Range (Differential)
Common-Mode Voltage Full V 0.5 4 0.5 4 V
Input Capacitance
Input Bias Current
Analog Bandwidth (Full Power) 25°C V 750 750 MHz
POWER SUPPLIES
Supply Voltages
Supply Current
POWER CONSUMPTION
DC Input
Sine Wave Input Full VI 590 640 345 370 mW
1
Gain error is based on the ADC only (with a fixed 2.0 V external reference).
2
Measured at maximum clock rate, fIN = 2.4 MHz, full-scale sine wave, with approximately 5 pF loading on each output bit.
3
Includes internal voltage reference error.
4
Input capacitance refers to the effective capacitance between one differential input pin and AGND. Refer to Figure 7 for the equivalent analog input structure.
5
Input bias current is due to the input looking like a resistor that is dependent on the clock rate.
6
Measured with dc input at maximum clock rate.
1
2
1
3
VREF = 2 V Full V 2 2 V p-p
VREF = 1 V Full V 1 1 V p-p
4
5
AVDD Full IV 4.75 5 5.25 4.75 5 5.25 V
DRVDD Full IV 2.7 5.25 2.7 5.25 V
IAVDD Full V 109 64 mA
IDRVDD Full V 12 8 mA
PSRR Full V ±0.05 ±0.05 % FSR
= –0.5 dBFS, differential analog inputs, unless otherwise noted.
IN
Table 2.
Test AD9244BST-65 AD9244BST-40
Parameter Temp Level Min Typ Max Min Typ Max Unit
1
SNR
fIN = 2.4 MHz Full VI 72.4 73.4 dBc
25°C I 74.8 75.3 dBc
fIN = 15.5 MHz (–1 dBFS) Full IV 72.0 dBc
25°C V 73.7 dBc
fIN = 20 MHz Full VI 72.1 dBc
25°C I 74.7 dBc
fIN = 32.5 MHz Full IV 70.8 dBc
25°C I 73.0 dBc
fIN = 70 MHz Full IV 69.9 dBc
25°C V 72.2 dBc
fIN = 100 MHz 25°C V 71.2 72.8 dBc
fIN = 200 MHz 25°C V 67.2 68.3 dBc
1
SINAD
fIN = 2.4 MHz Full VI 72.2 73.2 dBc
25°C I 74.7 75.1 dBc
fIN = 20 MHz Full VI 72 dBc
25°C I 74.4 dBc
fIN = 32.5 MHz Full IV 70.6 dBc
25°C I 72.6 dBc
fIN = 70 MHz Full IV 69.7 dBc
25°C V 71.9 dBc
fIN = 100 MHz 25°C V 71 72.4 dBc
fIN = 200 MHz 25°C V 59.8 56.3 dBc
ENOB
fIN = 2.4 MHz Full VI 11.7 11.9 Bits
25°C I 12.1 12.2 Bits
fIN = 20 MHz Full VI 11.7 Bits
25°C I 12.1 Bits
fIN = 32.5 MHz Full IV 11.4 Bits
25°C I 11.8 Bits
fIN = 70 MHz Full IV 11.3 Bits
25°C V 11.7 Bits
fIN = 100 MHz 25°C V 11.5 11.7 Bits
fIN = 200 MHz 25°C V 9.6 9.1 Bits
1
THD
fIN = 2.4 MHz Full VI −78.4 −80.7 dBc
25°C I −90.0 −89.7 dBc
fIN = 20 MHz Full VI −80.4 dBc
25°C I −89.4 dBc
fIN = 32.5 MHz Full IV −79.2 dBc
25°C I −84.6 dBc
fIN = 70 MHz Full IV −78.7 dBc
25°C V −84.1 dBc
fIN = 100 MHz 25°C V −83.0 −83.2 dBc
fIN = 200 MHz 25°C V −60.7 −56.6 dBc
Test AD9244BST-65 AD9244BST-40
Parameter Temp Level Min Typ Max Min Typ Max Unit
WORST HARMONIC (SECOND or THIRD)
fIN = 2.4 MHz 25°C V −94.5 −93.7 dBc
fIN = 20 MHz 25°C V −92.8 dBc
fIN = 32.5 MHz 25°C V −86.5 dBc
fIN = 70 MHz 25°C V −86.1 dBc
fIN = 100 MHz 25°C V −86.2 −84.5 dBc
fIN = 200 MHz 25°C V −60.7 −56.6 dBc
1
SFDR
fIN = 2.4 MHz Full VI 78.6 82.5 dBc
25°C I 94.5 93.7 dBc
fIN = 15.5 MHz (–1 dBFS) Full IV 83 dBc
25°C V 90 dBc
fIN = 20 MHz Full IV 81.4 dBc
25°C I 91.8 dBc
fIN = 32.5 MHz Full IV 80.0 dBc
25°C I 86.4 dBc
fIN = 70 MHz Full IV 79.5 dBc
25°C V 86.1 dBc
fIN = 100 MHz 25°C V 86.2 84.5 dBc
fIN = 200 MHz 25°C V 60.7 56.6 dBc
1
AC specifications can be reported in dBc (degrades as signal levels are lowered) or in dBFS (always related back to converter full scale).
Test AD9244BST-65 AD9244BST-40
Parameter Temp Level Min Typ Max Min Typ Max Unit
DIGITAL INPUTS
Logic 1 Voltage (OEB, DRVDD = 3 V) Full IV 2 2 V
Logic 1 Voltage (OEB, DRVDD = 5 V) Full IV 3.5 3.5 V
Logic 0 Voltage (OEB) Full IV 0.8 0.8 V
Logic 1 Voltage (DFS, DCS) Full IV 3.5 3.5 V
Logic 0 Voltage (DFS, DCS) Full IV 0.8 0.8 V
Input Current Full IV 10 10 µA
Input Capacitance Full V 5 5 pF
CLOCK INPUT PARAMETERS
Differential Input Voltage Full IV 0.4 0.4 V p-p
CLK− Voltage
Internal Clock Common-Mode Full V 1.6 1.6 V
Single-Ended Input Voltage
Logic 1 Voltage Full IV 2 2 V
Logic 0 Voltage Full IV 0.8 0.8 V
Input Capacitance Full V 5 5 pF
Input Resistance Full V 100 100 kΩ
DIGITAL OUTPUTS (DRVDD = 5 V)
Logic 1 Voltage (IOH = 50 µA) Full IV 4.5 4.5 V
Logic 0 Voltage (IOL = 50 µA) Full IV 0.1 0.1 V
Logic 1 Voltage (IOH = 0.5 mA) Full IV 2.4 2.4 V
Logic 0 Voltage (IOL = 1.6 mA) Full IV 0.4 0.4 V
1
1
Full IV 0.25 0.25 V
Rev. C | Page 5 of 36
AD9244
Test AD9244BST-65 AD9244BST-40
Parameter Temp Level Min Typ Max Min Typ Max Unit
DIGITAL OUTPUTS (DRVDD = 3 V)
Logic 1 Voltage (IOH = 50 µA) Full IV 2.95 2.95 V
Logic 0 Voltage (IOL = 50 µA) Full IV 0.05 0.05 V
Logic 1 Voltage (IOH = 0.5 mA) Full IV 2.8 2.8 V
Logic 0 Voltage (IOL = 1.6 mA) Full IV 0.4 0.4 V
1
See the Clock Overview section for more details.
2
Output voltage levels measured with 5 pF load on each output.
SWITCHING SPECIFICATIONS
AVDD = 5 V, DRVDD = 3 V, unless otherwise noted.
Table 4.
Test AD9244BST-65 AD9244BST-40
Parameter Temp Level Min Typ Max Min Typ Max Unit
CLOCK INPUT PARAMETERS
Maximum Conversion Rate Full VI 65 40 MHz
Minimum Conversion Rate Full V 500 500 kHz
Clock Period
Clock Pulse Width High
Clock Pulse Width Low
Clock Pulse Width High
Clock Pulse Width Low
DATA OUTPUT PARAMETERS
Output Delay (tPD)
Pipeline Delay (Latency) Full V 8 8 Clock cycles
Aperture Delay (tA) Full V 1.5 1.5 ns
Aperture Uncertainty (Jitter) Full V 0.3 0.3 ps rms
Output Enable Delay Full V 15 15 ns
OUT-OF-RANGE RECOVERY TIME Full V 2 1 Clock cycles
1
The clock period can be extended to 2 µs with no degradation in specified performance at 25°C.
2
With duty cycle stabilizer enabled.
3
With duty cycle stabilizer disabled.
4
Measured from clock 50% transition to data 50% transition with 5 pF load on each output.
AVDD AGND –0.3 V to +6.5 V
DRVDD DGND −0.3 V to +6.5 V
AGND DGND –0.3 V to +0.3 V
AVDD DRVDD –6.5 V to +6.5 V
REFGND AGND –0.3 V to +0.3 V
CLK+, CLK–, DCS AGND –0.3 V to AVDD + 0.3 V
DFS AGND –0.3 V to AVDD + 0.3 V
VIN+, VIN– AGND –0.3 V to AVDD + 0.3 V
VREF AGND –0.3 V to AVDD + 0.3 V
SENSE AGND –0.3 V to AVDD + 0.3 V
REFB, REFT AGND –0.3 V to AVDD + 0.3 V
CML AGND –0.3 V to AVDD + 0.3 V
VR AGND –0.3 V to AVDD + 0.3 V
OTR DGND –0.3 V to DRVDD + 0.3 V
D0 to D13 DGND –0.3 V to DRVDD + 0.3 V
OEB DGND –0.3 V to DRVDD + 0.3 V
ENVIRONMENTAL
Junction Temperature 150°C
Storage Temperature −65°C to +150°C
Operating Temperature −40°C to +85°C
Lead Temperature (10 sec) 300°C
1
Typical thermal impedances; θJA = 50.0°C/W; θJC = 17.0°C/W. These
measurements were taken on a 4-layer board in still air, in accordance with
EIA/JESD51-7.
Respect to
1
Rating
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
sections of this specification is not implied. Exposure to
absolute maximum ratings for extended periods may affect
device reliability.
EXPLANATION OF TEST LEVELS
Table 6.
Te st
Level
I 100% production tested.
II
III Sample tested only.
IV
V Parameter is a typical value only.
VI
Description
100% production tested at 25°C and sample tested at
specified temperatures.
Parameter is guaranteed by design and characterization
testing.
100% production tested at 25°C; guaranteed by design
and characterization testing for industrial temperature
range; 100% production tested at temperature extremes
for military devices.
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the
human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
1, 2, 5, 32, 33 AGND Analog Ground.
3, 4, 31, 34 AVDD Analog Supply Voltage.
6, 7 CLK–, CLK+ Differential Clock Inputs.
8, 44 NIC No Internal Connection.
9 OEB Digital Output Enable (Active Low).
10 D0 (LSB) Least Significant Bit, Digital Output.
11 to 13,
16 to 21,
24 to 26
D1 to D3,
D4 to D9,
D10 to D12
Digital Outputs.
14, 22, 30 DGND Digital Ground.
15, 23, 29 DRVDD Digital Supply Voltage.
27 D13 (MSB) Most Significant Bit, Digital Output.
28 OTR Out-of-Range Indicator (Logic 1 Indicates OTR).
35 DFS Data Format Select. Connect to AGND for straight binary, AVDD for twos complement.
36 SENSE Internal Reference Control.
37 VREF Internal Reference.
38 REFGND Reference Ground.
39 to 42 REFB, REFT Internal Reference Decoupling.
43 DCS
50% Duty Cycle Stabilizer. Connect to AVDD to activate 50% duty cycle stabilizer, AGND for
external control of both clock edges.
45 CML Common-Mode Reference (0.5 × AVDD).
46, 47 VIN+, VIN– Differential Analog Inputs.
48 VR Internal Bias Decoupling.
Rev. C | Page 8 of 36
AD9244
TERMINOLOGY
Analog Bandwidth (Full Power Bandwidth)
The analog input frequency at which the spectral power of the
fundamental frequency (as determined by the FFT analysis) is
reduced by 3 dB.
Aperture Delay
The delay between the 50% point of the rising edge of the clock
and the instant at which the analog input is sampled.
Aperture Uncertainty (Jitter)
The sample-to-sample variation in aperture delay.
Differential Analog Input Voltage Range
The peak-to-peak differential voltage must be applied to the
converter to generate a full-scale response. Peak differential
voltage is computed by observing the voltage on a single pin
and subtracting the voltage from the other pin, which is 180°
out of phase. Peak-to-peak differential is computed by rotating
the input phase 180° and taking the peak measurement again. The
difference is then found between the two peak measurements.
Differential Nonlinearity (DNL, No Missing Codes)
An ideal ADC exhibits code transitions that are exactly 1 LSB
apart. DNL is the deviation from this ideal value. Guaranteed
no missing codes to 14-bit resolution indicates that all 16,384
codes must be present over all operating ranges.
Dual-Tone SFDR
1
The ratio of the rms value of either input tone to the rms value
of the peak spurious component. The peak spurious component
may or may not be an IMD product.
Effective Number of Bits (ENOB)
The ENOB for a device for sine wave inputs at a given input
frequency can be calculated directly from its measured SINAD by
N = (SINAD − 1.76)/6.02
Gain Error
The first code transition should occur at an analog value ½ LSB
above negative full scale. The last code transition should occur
at an analog value 1½ LSB below the nominal full scale. Gain
error is the deviation of the actual difference between first and
last code transitions and the ideal difference between first and
last code transitions.
Common-Mode Rejection Ratio (CMRR)
Common-mode (CM) signals appearing on VIN+ and VIN–
are ideally rejected by the differential front end of the ADC.
With a full-scale CM signal driving both VIN+ and VIN–,
CMRR is the ratio of the amplitude of the full-scale input CM
signal to the amplitude of signal that is not rejected, expressed
in dBFS.
1
IF Sampling
Due to the effects of aliasing, an ADC is not necessarily limited
to Nyquist sampling. Higher sampled frequencies are aliased
down into the first Nyquist zone (DC − f
/2) on the output
CLOCK
of the ADC. Care must be taken that the bandwidth of the sampled signal does not overlap Nyquist zones and alias onto itself.
Nyquist sampling performance is limited by the bandwidth of
the input SHA and clock jitter (noise caused by jitter increases
as the input frequency increases).
Integral Nonlinearity (INL)
INL refers to the deviation of each individual code from a line
drawn from negative full scale through positive full scale. The
point used as negative full scale occurs ½ LSB before the first
code transition. Positive full scale is defined as a level 1½ LSB
beyond the last code transition. The deviation is measured from
the middle of each particular code to the true straight line.
Minimum Conversion Rate
The clock rate at which the SNR of the lowest analog signal
frequency drops by no more than 3 dB below the guaranteed limit.
Maximum Conversion Rate
The clock rate at which parametric testing is performed.
Nyquist Sampling
When the frequency components of the analog input are below
the Nyquist frequency (f
CLOCK
/2).
Out-of-Range Recovery Time
The time it takes for the ADC to reacquire the analog input
after a transition from 10% above positive full scale to 10%
above negative full scale, or from 10% below negative full scale
to 10% below positive full scale.
Power Supply Rejection Ratio (PSRR)
The change in full scale from the value with the supply at its
minimum limit to the value with the supply at its maximum limit.
Signal-to-Noise-and-Distortion (SINAD)
1
TThe ratio of the rms signal amplitude to the rms value of the
sum of all other spectral components below the Nyquist
frequency, including harmonics, but excluding dc.
Signal-to-Noise Ratio (SNR)
1
The ratio of the rms signal amplitude to the rms value of the
sum of all other spectral components below the Nyquist
frequency, excluding the first six harmonics and dc.
Rev. C | Page 9 of 36
AD9244
Spurious-Free Dynamic Range (SFDR)
1
The difference in dB between the rms amplitude of the input
signal and the peak spurious signal.
Total Harmonic Distortion (THD)
The ratio of the rms sum of the first six harmonic components
to the rms value of the measured input signal.
1
Tem p er at u re Dr i ft
The temperature drift for offset error and gain error specifies
the maximum change from initial (25°C) value to the value at
T
MIN
or T
MAX
.
Offset Error
The major carry transition should occur for an analog value
½ LSB below VIN+ = VIN−. Offset error is defined as the
deviation of the actual transition from that point.
1
AC specifications can be reported in dBc (degrades as signal levels are
lowered) or in dBFS (always related back to converter full scale).
Rev. C | Page 10 of 36
AD9244
TYPICAL APPLICATION CIRCUITS
DRVDD DRVDD
AVDD
DGND
Figure 4. D0 to D13, OTR
DRVDD
200Ω
DGND
Figure 5. Three-State (OEB)
AVDD
200Ω
AGND
CLK
BUFFER
Figure 6. CLK+, CLK−
02404-005
02404-006
02404-004
AGND
02404-007
Figure 7. VIN+, VIN−
AVDD
200Ω
AGND
02404-008
Figure 8. DFS, DCS, SENSE
AVDD
AGND
02404-009
Figure 9. VREF, REFT, REFB, VR, CML
Rev. C | Page 11 of 36
Loading...
+ 25 hidden pages
You need points to download manuals.
1 point = 1 manual.
You can buy points or you can get point for every manual you upload.