Eight ADCs integrated into 1 package
100 mW ADC power per channel at 65 MSPS
SNR = 60.8 dB (to Nyquist)
Excellent linearity
DNL = ±0.3 LSB (typical)
INL = ±0.4 LSB (typical)
Serial LVDS (ANSI-644, default)
Low power reduced signal option, IEEE 1596.3 similar
Data and frame clock outputs
325 MHz, full power analog bandwidth
2 V p-p input voltage range
1.8 V supply operation
Serial port control
Full-chip and individual-channel power-down modes
Flexible bit orientation
Built-in and custom digital test pattern generation
Programmable clock and data alignment
Programmable output resolution
Standby mode
APPLICATIONS
Medical imaging and nondestructive ultrasound
Portable ultrasound and digital beam forming systems
Quadrature radio receivers
Diversity radio receivers
Tap e dr ive s
Optical networking
Test equipment
GENERAL DESCRIPTION
The AD9212 is an octal, 10-bit, 40/65 MSPS analog-to-digital
converter (ADC) with an on-chip sample-and-hold circuit that
is designed for low cost, low power, small size, and ease of use.
The product operates at a conversion rate of up to 65 MSPS and
is optimized for outstanding dynamic performance and low
power in applications where a small package size is critical.
The ADC requires a single 1.8 V power supply and LVPECL-/
CMOS-/LVDS-compatible sample rate clock for full performance
operation. No external reference or driver components are
required for many applications.
The ADC automatically multiplies the sample rate clock for
the appropriate LVDS serial data rate. A data clock (DCO)
for capturing data on the output and a frame clock (FCO) for
signaling a new output byte are provided. Individual channel
power-down is supported and typically consumes less than
2 mW when all channels are disabled.
Rev. 0
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Anal og Devices for its use, nor for any infringements of patents or ot her
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarks and registered trademarks are the property of their respective owners.
Serial LVDS 1.8 V A/D Converter
AD9212
FUNCTIONAL BLOCK DIAGRAM
AGND
PDWN
0.5V
CSB
ADC
ADC
ADC
ADC
ADC
ADC
ADC
ADC
SERI AL P ORT
INTERFA CE
SDIO/
ODM
Figure 1.
SCLK/
DTP
12
SERIAL
LVDS
12
SERIAL
LVDS
12
SERIAL
LVDS
12
SERIAL
LVDS
12
SERIAL
LVDS
12
SERIAL
LVDS
12
SERIAL
LVDS
12
SERIAL
LVDS
DATA RATE
MULTI PLI ER
CLK+
DRGND
CLK–
DDDRVDD
AD9212
VIN+A
VIN–A
VIN+B
VIN–B
VIN+C
VIN–C
VIN+D
VIN–D
VIN+E
VIN–E
VIN+F
VIN–F
VIN+G
VIN–G
VIN+H
VIN–H
VREF
SENSE
REFT
REFB
REF
SELECT
RBIAS
The ADC contains several features designed to maximize
flexibility and minimize system cost, such as programmable
clock and data alignment and programmable digital test pattern
generation. The available digital test patterns include built-in
deterministic and pseudorandom patterns, along with custom userdefined test patterns entered via the serial port interface (SPI®).
The AD9212 is available in a Pb-free, 64-lead LFCSP package. It is
specified over the industrial temperature range of −40°C to +85°C.
PRODUCT HIGHLIGHTS
1. Small Footprint. Eight ADCs are contained in a small, space-
saving package; low power of 100 mW/channel at 65 MSPS.
2. Ease of Use. A data clock output (DCO) operates up to
300 MHz and supports double data rate operation (DDR).
3. User Flexibility. Serial port interface (SPI) control offers a wide
range of flexible features to meet specific system requirements.
4. Pin-Compatible Family. This includes the AD9222 (12-bit),
AVDD = 1.8 V, DRVDD = 1.8 V, 2 V p-p differential input, 1.0 V internal reference, AIN = −0.5 dBFS, unless otherwise noted.
Table 1.
AD9212-40 AD9212-65
Parameter
RESOLUTION 10 10 Bits
ACCURACY
No Missing Codes Full Guaranteed Guaranteed
Offset Error Full ±1.5 ±8 ±1.5 ±8 mV
Offset Matching Full ±3 ±8 ±3 ±8 mV
Gain Error Full ±0.4 ±1.2 ±3.2 ±4.3 % FS
Gain Matching Full ±0.3 ±0.7 ±0.4 ±0.9 % FS
Differential Nonlinearity (DNL) Full ±0.1 ±0.4 ±0.3 ±0.65 LSB
Integral Nonlinearity (INL) Full ±0.15 ±0.5 ±0.4 ±1 LSB
TEMPERATURE DRIFT
Offset Error Full ±2 ±2 ppm/°C
Gain Error Full ±17 ±17 ppm/°C
Reference Voltage (1 V Mode) Full ±21 ±21 ppm/°C
REFERENCE
Output Voltage Error (VREF = 1 V) Full ±2 ±30 ±2 ±30 mV
Load Regulation @ 1.0 mA (VREF = 1 V) Full 3 3 mV
Input Resistance Full 6 6 kΩ
ANALOG INPUTS
Differential Input Voltage Range (VREF = 1 V) Full 2 2 V p-p
Common-Mode Voltage Full AVDD/2 AVDD/2 V
Differential Input Capacitance Full 7 7 pF
Analog Bandwidth, Full Power Full 325 325 MHz
POWER SUPPLY
AVDD Full 1.7 1.8 1.9 1.7 1.8 1.9 V
DRVDD Full 1.7 1.8 1.9 1.7 1.8 1.9 V
IAVDD Full 252 260 390 405 mA
IDRVDD Full 49.5 53 54 58 mA
Total Power Dissipation (Including Output Drivers) Full 542 560 800 833 mW
Power-Down Dissipation Full 3 11 3 11 mW
Standby Dissipation
CROSSTALK Full −90 −90 dB
CROSSTALK (Overrange Condition)
1
See the AN-835 Application Note, Understanding High Speed ADC Testing and Evaluation, for a complete set of definitions and how these tests were completed.
2
Can be controlled via SPI.
3
Overrange condition is specific with 6 dB of the full-scale input range.
1
2
3
Temperature Min Typ Max Min Typ Max Unit
Full 83 95 mW
Full −90 −90 dB
Rev. 0 | Page 3 of 56
AD9212
AC SPECIFICATIONS
AVDD = 1.8 V, DRVDD = 1.8 V, 2 V p-p differential input, 1.0 V internal reference, AIN = −0.5 dBFS, unless otherwise noted.
Table 2.
AD9212-40 AD9212-65
Parameter
SIGNAL-TO-NOISE RATIO (SNR) fIN = 2.4 MHz Full 61.2 60.8 dB
f
f
f
SIGNAL-TO-NOISE AND DISTORTION RATIO (SINAD) fIN = 2.4 MHz Full 61.2 60.7 dB
f
f
f
EFFECTIVE NUMBER OF BITS (ENOB) fIN = 2.4 MHz Full 9.87 9.81 Bits
f
f
f
SPURIOUS-FREE DYNAMIC RANGE (SFDR) fIN = 2.4 MHz Full 87 81 dBc
f
f
f
f
WORST HARMONIC (Second or Third) fIN = 2.4 MHz Full −87 −81 dBc
f
f
f
f
WORST OTHER (Excluding Second or Third) fIN = 2.4 MHz Full −90 −86 dBc
f
f
f
TWO-TONE INTERMODULATION DISTORTION (IMD)—
AIN1 AND AIN2 = −7.0 dBFS
1
See the AN-835 Application Note, Understanding High Speed ADC Testing and Evaluation, for a complete set of definitions and how these tests were completed.
1
Temperature Min Typ Max Min Typ Max Unit
= 19.7 MHz Full 60.2 61.2 60.8 dB
IN
= 35 MHz Full 61.2 58.5 60.8 dB
IN
= 70 MHz Full 61.0 60.7 dB
IN
= 19.7 MHz Full 60.0 61.0 60.6 dB
IN
= 35 MHz Full 61.0 57.0 60.5 dB
IN
= 70 MHz Full 60.8 60.4 dB
IN
= 19.7 MHz Full 9.71 9.87 9.81 Bits
IN
= 35 MHz Full 9.87 9.43 9.81 Bits
IN
= 70 MHz Full 9.84 9.79 Bits
IN
= 19.7 MHz Full 72 85 79 dBc
IN
= 35 MHz Full 79 62 77 dBc
IN
= 35 MHz 25°C 69 77 dBc
IN
= 70 MHz Full 74 72 dBc
IN
= 19.7 MHz Full −85 −72 −79 dBc
IN
= 35 MHz Full −79 −77 −62 dBc
IN
= 35 MHz 25°C −77 −69 dBc
IN
= 70 MHz Full −74 −72 dBc
IN
= 19.7 MHz Full −85 −72 −86 dBc
IN
= 35 MHz Full −85 −85 −70 dBc
IN
= 70 MHz Full −85 −85 dBc
IN
f
= 15 MHz,
IN1
= 16 MHz
f
IN2
= 70 MHz,
f
IN1
= 71 MHz
f
IN2
25°C 80.0 77.0 dBc
25°C 77.0 77.0 dBc
Rev. 0 | Page 4 of 56
AD9212
DIGITAL SPECIFICATIONS
AVDD = 1.8 V, DRVDD = 1.8 V, 2 V p-p differential input, 1.0 V internal reference, AIN = −0.5 dBFS, unless otherwise noted.
See the AN-835 Application Note, Understanding High Speed ADC Testing and Evaluation, for a complete set of definitions and how these tests were completed.
2
This is specified for LVDS and LVPECL only.
1
2
Temperature Min Typ Max Min Typ Max Unit
Full 250 250 mV p-p
Rev. 0 | Page 5 of 56
AD9212
SWITCHING SPECIFICATIONS
AVDD = 1.8 V, DRVDD = 1.8 V, 2 V p-p differential input, 1.0 V internal reference, AIN = −0.5 dBFS, unless otherwise noted.
Table 4.
AD9212-40 AD9212-65
Parameter
CLOCK
OUTPUT PARAMETERS
APERTURE
1
See the AN-835 Application Note, Understanding High Speed ADC Testing and Evaluation, for a complete set of definitions and how these tests were completed.
2
Can be adjusted via the SPI interface.
3
Measurements were made using a part soldered to FR4 material.
4
t
SAMPLE
1
2
Temp
Min Typ Max Min Typ Max Unit
Maximum Clock Rate Full 40 65 MSPS
Minimum Clock Rate Full 10 10 MSPS
Clock Pulse Width High (tEH) Full 12.5 7.7 ns
Clock Pulse Width Low (tEL) Full 12.5 7.7 ns
2, 3
Propagation Delay (tPD) Full 1.5 2.3 3.1 1.5 2.3 3.1 ns
Rise Time (tR) (20% to 80%) Full 300 300 ps
Fall Time (tF) (20% to 80%) Full 300 300 ps
FCO Propagation Delay (t
DCO Propagation Delay (t
DCO to Data Delay (t
DCO to FCO Delay (t
Data to Data Skew
− t
(t
DATA-MAX
DATA-MIN
) Full 1.5 2.3 3.1 1.5 2.3 3.1 ns
FCO
)4Full t
CPD
DATA
FRAME
)4
)4
Full (t
Full (t
/20) − 300 (t
SAMPLE
/20) − 300 (t
SAMPLE
FCO
(t
+
SAMPLE
SAMPLE
SAMPLE
t
/20)
/20) (t
/20) (t
/20) + 300 (t
SAMPLE
/20) + 300 (t
SAMPLE
/20) − 300 (t
SAMPLE
/20) − 300 (t
SAMPLE
FCO
(t
SAMPLE
SAMPLE
SAMPLE
+
/20)
/20) (t
/20) (t
ns
/20) + 300 ps
SAMPLE
/20) + 300 ps
SAMPLE
Full ±50 ±200 ±50 ±200 ps
)
Wake-Up Time (Standby) 25°C 600 600 ns
Wake-Up Time (Power-Down) 25°C 375 375 μs
Pipeline Latency Full 8 8 CLK
AVDD AGND −0.3 V to +2.0 V
DRVDD DRGND −0.3 V to +2.0 V
AGND DRGND −0.3 V to +0.3 V
AVDD DRVDD −2.0 V to +2.0 V
Digital Outputs
(D+, D−, DCO+,
DCO−, FCO+, FCO−)
CLK+, CLK− AGND −0.3 V to +3.9 V
VIN+, VIN− AGND −0.3 V to +2.0 V
SDIO/ODM AGND −0.3 V to +2.0 V
PDWN, SCLK/DTP, CSB AGND −0.3 V to +3.9 V
REFT, REFB, RBIAS AGND −0.3 V to +2.0 V
VREF, SENSE AGND −0.3 V to +2.0 V
ENVIRONMENTAL
Operating Temperature
Range (Ambient)
Maximum Junction
Temperature
Lead Temperature
(Soldering, 10 sec)
Storage Temperature
Range (Ambient)
Respect To
DRGND −0.3 V to +2.0 V
−40°C to +85°C
150°C
300°C
−65°C to +150°C
Rating
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
THERMAL IMPEDANCE
Table 6.
Air Flow
Velocity (m/s)
0.0 17.7°C/W
1.0 15.5°C/W 8.7°C/W 0.6°C/W
2.5 13.9°C/W
1
θ
for a 4-layer PCB with solid ground plane (simulated). Exposed pad
AVDD 1.8 V Analog Supply
12, 37, 42, 45,
48, 51, 59, 62
13, 36 DRGND Digital Output Driver Ground
14, 35 DRVDD 1.8 V Digital Output Driver Supply
2 VIN+G ADC G Analog Input—True
3 VIN−G ADC G Analog Input—Complement
5 VIN−H ADC H Analog Input—Complement
6 VIN+H ADC H Analog Input—True
9 CLK− Input Clock—Complement
10 CLK+ Input Clock—True
15 D−H ADC H Digital Output—Complement
16 D+H ADC H True Digital Output—True
17 D−G ADC G Digital Output—Complement
18 D+G ADC G True Digital Output—True
19 D−F ADC F Digital Output—Complement
20 D+F ADC F True Digital Output—True
21 D−E ADC E Digital Output—Complement
22 D+E ADC E True Digital Output—True
23 DCO− Data Clock Digital Output—Complement
24 DCO+ Data Clock Digital Output—True
25 FCO− Frame Clock Digital Output—Complement
26 FCO+ Frame Clock Digital Output—True
27 D−D ADC D Digital Output—Complement
28 D+D ADC D True Digital Output—True
29 D−C ADC C Digital Output—Complement
30 D+C ADC C True Digital Output—True
31 D−B ADC B Digital Output—Complement
32 D+B ADC B True Digital Output—True
05968-005
Rev. 0 | Page 10 of 56
AD9212
Pin No. Mnemonic Description
33 D−A ADC A Digital Output—Complement
34 D+A ADC A True Digital Output—True
38 SCLK/DTP Serial Clock/Digital Test Pattern
39 SDIO/ODM Serial Data Input-Output/Output Driver Mode
40 CSB Chip Select Bar
41 PDWN Power Down
43 VIN+A ADC A Analog Input—True
44 VIN−A ADC A Analog Input—Complement
46 VIN−B ADC B Analog Input—Complement
47 VIN+B ADC B Analog Input—True
49 VIN+C ADC C Analog Input—True
50 VIN−C ADC C Analog Input—Complement
52 VIN−D ADC D Analog Input—Complement
53 VIN+D ADC D Analog Input—True
54 RBIAS External Resistor to Set the Internal ADC Core Bias Current
55 SENSE Reference Mode Selection
56 VREF Voltage Reference Input/Output
57 REFB Differential Reference (Negative)
58 REFT Differential Reference (Positive)
60 VIN+E ADC E Analog Input—True
61 VIN−E ADC E Analog Input—Complement
63 VIN−F ADC F Analog Input—Complement
64 VIN+F ADC F Analog Input—True
Rev. 0 | Page 11 of 56
AD9212
S
EQUIVALENT CIRCUITS
DRVDD
VIN
Figure 6. Equivalent Analog Input Circuit
CLK
CLK
10
10k
1.25V
10k
10
V
D–D+
V
05968-006
DRGND
V
V
5968-009
Figure 9. Equivalent Digital Output Circuit
SCLK/DTP OR PDWN
1k
30k
Figure 7. Equivalent Clock Input Circuit
DIO/ODM
350
30k
Figure 8. Equivalent SDIO/ODM Input Circuit
05968-007
05968-010
Figure 10. Equivalent SCLK/DTP or PDWN Input Circuit