Eight ADCs integrated into 1 package
100 mW ADC power per channel at 65 MSPS
SNR = 60.8 dB (to Nyquist)
Excellent linearity
DNL = ±0.3 LSB (typical)
INL = ±0.4 LSB (typical)
Serial LVDS (ANSI-644, default)
Low power reduced signal option, IEEE 1596.3 similar
Data and frame clock outputs
325 MHz, full power analog bandwidth
2 V p-p input voltage range
1.8 V supply operation
Serial port control
Full-chip and individual-channel power-down modes
Flexible bit orientation
Built-in and custom digital test pattern generation
Programmable clock and data alignment
Programmable output resolution
Standby mode
APPLICATIONS
Medical imaging and nondestructive ultrasound
Portable ultrasound and digital beam forming systems
Quadrature radio receivers
Diversity radio receivers
Tap e dr ive s
Optical networking
Test equipment
GENERAL DESCRIPTION
The AD9212 is an octal, 10-bit, 40/65 MSPS analog-to-digital
converter (ADC) with an on-chip sample-and-hold circuit that
is designed for low cost, low power, small size, and ease of use.
The product operates at a conversion rate of up to 65 MSPS and
is optimized for outstanding dynamic performance and low
power in applications where a small package size is critical.
The ADC requires a single 1.8 V power supply and LVPECL-/
CMOS-/LVDS-compatible sample rate clock for full performance
operation. No external reference or driver components are
required for many applications.
The ADC automatically multiplies the sample rate clock for
the appropriate LVDS serial data rate. A data clock (DCO)
for capturing data on the output and a frame clock (FCO) for
signaling a new output byte are provided. Individual channel
power-down is supported and typically consumes less than
2 mW when all channels are disabled.
Rev. 0
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Anal og Devices for its use, nor for any infringements of patents or ot her
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarks and registered trademarks are the property of their respective owners.
Serial LVDS 1.8 V A/D Converter
AD9212
FUNCTIONAL BLOCK DIAGRAM
AGND
PDWN
0.5V
CSB
ADC
ADC
ADC
ADC
ADC
ADC
ADC
ADC
SERI AL P ORT
INTERFA CE
SDIO/
ODM
Figure 1.
SCLK/
DTP
12
SERIAL
LVDS
12
SERIAL
LVDS
12
SERIAL
LVDS
12
SERIAL
LVDS
12
SERIAL
LVDS
12
SERIAL
LVDS
12
SERIAL
LVDS
12
SERIAL
LVDS
DATA RATE
MULTI PLI ER
CLK+
DRGND
CLK–
DDDRVDD
AD9212
VIN+A
VIN–A
VIN+B
VIN–B
VIN+C
VIN–C
VIN+D
VIN–D
VIN+E
VIN–E
VIN+F
VIN–F
VIN+G
VIN–G
VIN+H
VIN–H
VREF
SENSE
REFT
REFB
REF
SELECT
RBIAS
The ADC contains several features designed to maximize
flexibility and minimize system cost, such as programmable
clock and data alignment and programmable digital test pattern
generation. The available digital test patterns include built-in
deterministic and pseudorandom patterns, along with custom userdefined test patterns entered via the serial port interface (SPI®).
The AD9212 is available in a Pb-free, 64-lead LFCSP package. It is
specified over the industrial temperature range of −40°C to +85°C.
PRODUCT HIGHLIGHTS
1. Small Footprint. Eight ADCs are contained in a small, space-
saving package; low power of 100 mW/channel at 65 MSPS.
2. Ease of Use. A data clock output (DCO) operates up to
300 MHz and supports double data rate operation (DDR).
3. User Flexibility. Serial port interface (SPI) control offers a wide
range of flexible features to meet specific system requirements.
4. Pin-Compatible Family. This includes the AD9222 (12-bit),
AVDD = 1.8 V, DRVDD = 1.8 V, 2 V p-p differential input, 1.0 V internal reference, AIN = −0.5 dBFS, unless otherwise noted.
Table 1.
AD9212-40 AD9212-65
Parameter
RESOLUTION 10 10 Bits
ACCURACY
No Missing Codes Full Guaranteed Guaranteed
Offset Error Full ±1.5 ±8 ±1.5 ±8 mV
Offset Matching Full ±3 ±8 ±3 ±8 mV
Gain Error Full ±0.4 ±1.2 ±3.2 ±4.3 % FS
Gain Matching Full ±0.3 ±0.7 ±0.4 ±0.9 % FS
Differential Nonlinearity (DNL) Full ±0.1 ±0.4 ±0.3 ±0.65 LSB
Integral Nonlinearity (INL) Full ±0.15 ±0.5 ±0.4 ±1 LSB
TEMPERATURE DRIFT
Offset Error Full ±2 ±2 ppm/°C
Gain Error Full ±17 ±17 ppm/°C
Reference Voltage (1 V Mode) Full ±21 ±21 ppm/°C
REFERENCE
Output Voltage Error (VREF = 1 V) Full ±2 ±30 ±2 ±30 mV
Load Regulation @ 1.0 mA (VREF = 1 V) Full 3 3 mV
Input Resistance Full 6 6 kΩ
ANALOG INPUTS
Differential Input Voltage Range (VREF = 1 V) Full 2 2 V p-p
Common-Mode Voltage Full AVDD/2 AVDD/2 V
Differential Input Capacitance Full 7 7 pF
Analog Bandwidth, Full Power Full 325 325 MHz
POWER SUPPLY
AVDD Full 1.7 1.8 1.9 1.7 1.8 1.9 V
DRVDD Full 1.7 1.8 1.9 1.7 1.8 1.9 V
IAVDD Full 252 260 390 405 mA
IDRVDD Full 49.5 53 54 58 mA
Total Power Dissipation (Including Output Drivers) Full 542 560 800 833 mW
Power-Down Dissipation Full 3 11 3 11 mW
Standby Dissipation
CROSSTALK Full −90 −90 dB
CROSSTALK (Overrange Condition)
1
See the AN-835 Application Note, Understanding High Speed ADC Testing and Evaluation, for a complete set of definitions and how these tests were completed.
2
Can be controlled via SPI.
3
Overrange condition is specific with 6 dB of the full-scale input range.
1
2
3
Temperature Min Typ Max Min Typ Max Unit
Full 83 95 mW
Full −90 −90 dB
Rev. 0 | Page 3 of 56
AD9212
AC SPECIFICATIONS
AVDD = 1.8 V, DRVDD = 1.8 V, 2 V p-p differential input, 1.0 V internal reference, AIN = −0.5 dBFS, unless otherwise noted.
Table 2.
AD9212-40 AD9212-65
Parameter
SIGNAL-TO-NOISE RATIO (SNR) fIN = 2.4 MHz Full 61.2 60.8 dB
f
f
f
SIGNAL-TO-NOISE AND DISTORTION RATIO (SINAD) fIN = 2.4 MHz Full 61.2 60.7 dB
f
f
f
EFFECTIVE NUMBER OF BITS (ENOB) fIN = 2.4 MHz Full 9.87 9.81 Bits
f
f
f
SPURIOUS-FREE DYNAMIC RANGE (SFDR) fIN = 2.4 MHz Full 87 81 dBc
f
f
f
f
WORST HARMONIC (Second or Third) fIN = 2.4 MHz Full −87 −81 dBc
f
f
f
f
WORST OTHER (Excluding Second or Third) fIN = 2.4 MHz Full −90 −86 dBc
f
f
f
TWO-TONE INTERMODULATION DISTORTION (IMD)—
AIN1 AND AIN2 = −7.0 dBFS
1
See the AN-835 Application Note, Understanding High Speed ADC Testing and Evaluation, for a complete set of definitions and how these tests were completed.
1
Temperature Min Typ Max Min Typ Max Unit
= 19.7 MHz Full 60.2 61.2 60.8 dB
IN
= 35 MHz Full 61.2 58.5 60.8 dB
IN
= 70 MHz Full 61.0 60.7 dB
IN
= 19.7 MHz Full 60.0 61.0 60.6 dB
IN
= 35 MHz Full 61.0 57.0 60.5 dB
IN
= 70 MHz Full 60.8 60.4 dB
IN
= 19.7 MHz Full 9.71 9.87 9.81 Bits
IN
= 35 MHz Full 9.87 9.43 9.81 Bits
IN
= 70 MHz Full 9.84 9.79 Bits
IN
= 19.7 MHz Full 72 85 79 dBc
IN
= 35 MHz Full 79 62 77 dBc
IN
= 35 MHz 25°C 69 77 dBc
IN
= 70 MHz Full 74 72 dBc
IN
= 19.7 MHz Full −85 −72 −79 dBc
IN
= 35 MHz Full −79 −77 −62 dBc
IN
= 35 MHz 25°C −77 −69 dBc
IN
= 70 MHz Full −74 −72 dBc
IN
= 19.7 MHz Full −85 −72 −86 dBc
IN
= 35 MHz Full −85 −85 −70 dBc
IN
= 70 MHz Full −85 −85 dBc
IN
f
= 15 MHz,
IN1
= 16 MHz
f
IN2
= 70 MHz,
f
IN1
= 71 MHz
f
IN2
25°C 80.0 77.0 dBc
25°C 77.0 77.0 dBc
Rev. 0 | Page 4 of 56
AD9212
DIGITAL SPECIFICATIONS
AVDD = 1.8 V, DRVDD = 1.8 V, 2 V p-p differential input, 1.0 V internal reference, AIN = −0.5 dBFS, unless otherwise noted.
See the AN-835 Application Note, Understanding High Speed ADC Testing and Evaluation, for a complete set of definitions and how these tests were completed.
2
This is specified for LVDS and LVPECL only.
1
2
Temperature Min Typ Max Min Typ Max Unit
Full 250 250 mV p-p
Rev. 0 | Page 5 of 56
AD9212
SWITCHING SPECIFICATIONS
AVDD = 1.8 V, DRVDD = 1.8 V, 2 V p-p differential input, 1.0 V internal reference, AIN = −0.5 dBFS, unless otherwise noted.
Table 4.
AD9212-40 AD9212-65
Parameter
CLOCK
OUTPUT PARAMETERS
APERTURE
1
See the AN-835 Application Note, Understanding High Speed ADC Testing and Evaluation, for a complete set of definitions and how these tests were completed.
2
Can be adjusted via the SPI interface.
3
Measurements were made using a part soldered to FR4 material.
4
t
SAMPLE
1
2
Temp
Min Typ Max Min Typ Max Unit
Maximum Clock Rate Full 40 65 MSPS
Minimum Clock Rate Full 10 10 MSPS
Clock Pulse Width High (tEH) Full 12.5 7.7 ns
Clock Pulse Width Low (tEL) Full 12.5 7.7 ns
2, 3
Propagation Delay (tPD) Full 1.5 2.3 3.1 1.5 2.3 3.1 ns
Rise Time (tR) (20% to 80%) Full 300 300 ps
Fall Time (tF) (20% to 80%) Full 300 300 ps
FCO Propagation Delay (t
DCO Propagation Delay (t
DCO to Data Delay (t
DCO to FCO Delay (t
Data to Data Skew
− t
(t
DATA-MAX
DATA-MIN
) Full 1.5 2.3 3.1 1.5 2.3 3.1 ns
FCO
)4Full t
CPD
DATA
FRAME
)4
)4
Full (t
Full (t
/20) − 300 (t
SAMPLE
/20) − 300 (t
SAMPLE
FCO
(t
+
SAMPLE
SAMPLE
SAMPLE
t
/20)
/20) (t
/20) (t
/20) + 300 (t
SAMPLE
/20) + 300 (t
SAMPLE
/20) − 300 (t
SAMPLE
/20) − 300 (t
SAMPLE
FCO
(t
SAMPLE
SAMPLE
SAMPLE
+
/20)
/20) (t
/20) (t
ns
/20) + 300 ps
SAMPLE
/20) + 300 ps
SAMPLE
Full ±50 ±200 ±50 ±200 ps
)
Wake-Up Time (Standby) 25°C 600 600 ns
Wake-Up Time (Power-Down) 25°C 375 375 μs
Pipeline Latency Full 8 8 CLK
AVDD AGND −0.3 V to +2.0 V
DRVDD DRGND −0.3 V to +2.0 V
AGND DRGND −0.3 V to +0.3 V
AVDD DRVDD −2.0 V to +2.0 V
Digital Outputs
(D+, D−, DCO+,
DCO−, FCO+, FCO−)
CLK+, CLK− AGND −0.3 V to +3.9 V
VIN+, VIN− AGND −0.3 V to +2.0 V
SDIO/ODM AGND −0.3 V to +2.0 V
PDWN, SCLK/DTP, CSB AGND −0.3 V to +3.9 V
REFT, REFB, RBIAS AGND −0.3 V to +2.0 V
VREF, SENSE AGND −0.3 V to +2.0 V
ENVIRONMENTAL
Operating Temperature
Range (Ambient)
Maximum Junction
Temperature
Lead Temperature
(Soldering, 10 sec)
Storage Temperature
Range (Ambient)
Respect To
DRGND −0.3 V to +2.0 V
−40°C to +85°C
150°C
300°C
−65°C to +150°C
Rating
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
THERMAL IMPEDANCE
Table 6.
Air Flow
Velocity (m/s)
0.0 17.7°C/W
1.0 15.5°C/W 8.7°C/W 0.6°C/W
2.5 13.9°C/W
1
θ
for a 4-layer PCB with solid ground plane (simulated). Exposed pad
AVDD 1.8 V Analog Supply
12, 37, 42, 45,
48, 51, 59, 62
13, 36 DRGND Digital Output Driver Ground
14, 35 DRVDD 1.8 V Digital Output Driver Supply
2 VIN+G ADC G Analog Input—True
3 VIN−G ADC G Analog Input—Complement
5 VIN−H ADC H Analog Input—Complement
6 VIN+H ADC H Analog Input—True
9 CLK− Input Clock—Complement
10 CLK+ Input Clock—True
15 D−H ADC H Digital Output—Complement
16 D+H ADC H True Digital Output—True
17 D−G ADC G Digital Output—Complement
18 D+G ADC G True Digital Output—True
19 D−F ADC F Digital Output—Complement
20 D+F ADC F True Digital Output—True
21 D−E ADC E Digital Output—Complement
22 D+E ADC E True Digital Output—True
23 DCO− Data Clock Digital Output—Complement
24 DCO+ Data Clock Digital Output—True
25 FCO− Frame Clock Digital Output—Complement
26 FCO+ Frame Clock Digital Output—True
27 D−D ADC D Digital Output—Complement
28 D+D ADC D True Digital Output—True
29 D−C ADC C Digital Output—Complement
30 D+C ADC C True Digital Output—True
31 D−B ADC B Digital Output—Complement
32 D+B ADC B True Digital Output—True
05968-005
Rev. 0 | Page 10 of 56
AD9212
Pin No. Mnemonic Description
33 D−A ADC A Digital Output—Complement
34 D+A ADC A True Digital Output—True
38 SCLK/DTP Serial Clock/Digital Test Pattern
39 SDIO/ODM Serial Data Input-Output/Output Driver Mode
40 CSB Chip Select Bar
41 PDWN Power Down
43 VIN+A ADC A Analog Input—True
44 VIN−A ADC A Analog Input—Complement
46 VIN−B ADC B Analog Input—Complement
47 VIN+B ADC B Analog Input—True
49 VIN+C ADC C Analog Input—True
50 VIN−C ADC C Analog Input—Complement
52 VIN−D ADC D Analog Input—Complement
53 VIN+D ADC D Analog Input—True
54 RBIAS External Resistor to Set the Internal ADC Core Bias Current
55 SENSE Reference Mode Selection
56 VREF Voltage Reference Input/Output
57 REFB Differential Reference (Negative)
58 REFT Differential Reference (Positive)
60 VIN+E ADC E Analog Input—True
61 VIN−E ADC E Analog Input—Complement
63 VIN−F ADC F Analog Input—Complement
64 VIN+F ADC F Analog Input—True
Rev. 0 | Page 11 of 56
AD9212
S
EQUIVALENT CIRCUITS
DRVDD
VIN
Figure 6. Equivalent Analog Input Circuit
CLK
CLK
10
10k
1.25V
10k
10
V
D–D+
V
05968-006
DRGND
V
V
5968-009
Figure 9. Equivalent Digital Output Circuit
SCLK/DTP OR PDWN
1k
30k
Figure 7. Equivalent Clock Input Circuit
DIO/ODM
350
30k
Figure 8. Equivalent SDIO/ODM Input Circuit
05968-007
05968-010
Figure 10. Equivalent SCLK/DTP or PDWN Input Circuit
The AD9212 architecture consists of a pipelined ADC that is
divided into three sections: a 4-bit first stage followed by eight
1.5-bit stages and a final 3-bit flash. Each stage provides
sufficient overlap to correct for flash errors in the preceding
stages. The quantized outputs from each stage are combined
into a final 10- result in the digital correction logic. The
pipelined architecture permits the first stage to operate on a
new input sample while the remaining stages operate on preceding
samples. Sampling occurs on the rising edge of the clock.
Each stage of the pipeline, excluding the last, consists of a low
resolution flash ADC connected to a switched-capacitor DAC
and interstage residue amplifier (MDAC). The residue amplifier
magnifies the difference between the reconstructed DAC output
and the flash input for the next stage in the pipeline. One bit of
redundancy is used in each stage to facilitate digital correction
of flash errors. The last stage simply consists of a flash ADC.
The output staging block aligns the data, carries out the error
correction, and passes the data to the output buffers. The data is
then serialized and aligned to the frame and output clock.
ANALOG INPUT CONSIDERATIONS
The analog input to the AD9212 is a differential switched-capacitor
circuit designed for processing differential input signals. The input
can support a wide common-mode range and maintain excellent
performance. An input common-mode voltage of midsupply
minimizes signal-dependent errors and provides optimum
performance.
The clock signal alternately switches the input circuit between
sample mode and hold mode (see Figure 42). When the input
circuit is switched into sample mode, the signal source must be
capable of charging the sample capacitors and settling within
one-half of a clock cycle. A small resistor in series with each
input can help reduce the peak transient current injected from
the output stage of the driving source. In addition, low-Q inductors
or ferrite beads can be placed on each leg of the input to reduce
the high differential capacitance seen at the analog inputs, thus
realizing the maximum bandwidth of the ADC. Such use of
low-Q inductors or ferrite beads is required when driving the
converter front end at high IF frequencies. Either a shunt capacitor
or two single-ended capacitors can be placed on the inputs to
provide a matching passive network. This ultimately creates a
low-pass filter at the input to limit any unwanted broadband
noise. See the AN-742 Application Note, the AN-827 Application
Note, and the Analog Dialogue article “Transformer-Coupled
Front-End for Wideband A/D Converters” for more information
on this subject. In general, the precise values depend on the
application.
The analog inputs of the AD9212 are not internally dc-biased.
In ac-coupled applications, the user must provide this bias
externally. Setting the device so that V
= AV D D /2 is recom-
CM
mended for optimum performance, but the device can function
over a wider range with reasonable performance, as shown in
Figure 45 and Figure 46.
H
C
PAR
IN+
VIN–
C
PAR
Figure 42. Switched-Capacitor Input Circuit
C
SAMPLE
SS
SS
C
SAMPLE
H
H
H
5968-017
Rev. 0 | Page 19 of 56
AD9212
90
90
85
80
75
70
65
SNR/SF DR (dB)
60
55
50
0.3
SFDR (dBc)
SNR (dB)
0.60.91.21.5
ANALOG INPUT COMMON-MO DE VOLTAG E (V)
Figure 43. SNR/SFDR vs. Common-Mode Voltage,
f
= 2.3 MHz, AD9212-40
IN
90
85
80
75
70
SFDR (dBc)
85
80
75
70
65
SNR/SFDR (dB)
60
55
50
0.3
05968-065
SFDR
SNR
0.60.91.21.5
ANALOG INPUT COMMON-MO DE VOLTAG E (V)
05968-067
Figure 45. SNR/SFDR vs. Common-Mode Voltage,
f
= 2.3 MHz, AD9212-65
IN
90
85
80
75
70
SFDR
65
SNR/SFDR (dB)
60
55
50
0.3
SNR (dB)
0.60.91.21.5
ANALOG INPUT COMMON MODE VOLTAG E (V)
Figure 44. SNR/SFDR vs. Common-Mode Voltage,
= 19.7 MHz, AD9212-40
f
IN
5968-066
65
SNR/SF DR (dB)
60
55
50
0.3
0.60.91.21.5
ANALOG INPUT COMMON MODE VOLTAG E (V)
SNR
Figure 46. SNR/SFDR vs. Common-Mode Voltage,
= 35 MHz, AD9212-65
f
IN
05968-068
Rev. 0 | Page 20 of 56
AD9212
A
A
A
V
F
p
For best dynamic performance, the source impedances driving
VIN+ and VIN− should be matched such that common-mode
settling errors are symmetrical. These errors are reduced by the
common-mode rejection of the ADC. An internal reference
buffer creates the positive and negative reference voltages, REFT
and REFB, respectively, that define the span of the ADC core.
The output common mode of the reference buffer is set to
midsupply, and the REFT and REFB voltages and span are
defined as
It can be seen from these equations that the REFT and REFB
voltages are symmetrical about the midsupply voltage and, by
definition, the input span is twice the value of the VREF voltage.
Maximum SNR performance is always achieved by setting the
ADC to the largest span in a differential configuration. In the
case of the AD9212, the largest input span available is 2 V p-p.
Differential Input Configurations
There are several ways in which to drive the AD9212 either
actively or passively. In either case, the optimum performance is
achieved by driving the analog input differentially. One example
is by using the AD8334 differential driver. It provides excellent
performance and a flexible interface to the ADC (see Figure 50)
for baseband applications. This configuration is common for
medical ultrasound systems.
However, the noise performance of most amplifiers is not
adequate to achieve the true performance of the AD9212. For
applications where SNR is a key parameter, differential transformer coupling is the recommended input configuration. Two
examples are shown in Figure 47 and Figure 48.
In any configuration, the value of the shunt capacitor, C, is
dependent on the input frequency and may need to be reduced
or removed.
Figure 48. Differential Transformer-Coupled Configuration for IF Applications
Single-Ended Input Configuration
A single-ended input may provide adequate performance in
cost-sensitive applications. In this configuration, SFDR and
distortion performance degrade due to the large input commonmode swing. If the application requires a single-ended input
configuration, ensure that the source impedances on each input
are well matched in order to achieve the best possible performance.
A full-scale input of 2 V p-p can still be applied to the ADC’s VIN+
pin while the VIN− pin is terminated. Figure 49 details a typical
single-ended input configuration.
DD
C
2V p-p
49.9
0.1µF
0.1µF
AVD D
1k
1k
1k
25
R
1
C
DIFF
R
C
VIN+
VIN–
ADC
AD9212
05968-019
1
C
IS OPTIONAL.
DIFF
05968-020
Figure 49. Single-Ended Input Configuration
0.1
0.1F
VIP
VIN
VGA
VOH
VOL
187
374
187
0.1F
1.0k
1.0k
0.1F
0.1F10F
R
C
R
VIN+
AD9212
VIN–
ADC
VREF
05968-021
1V p-
0.1F
120nH
0.1F
22pF
LOP
18nF
INH
LMD
274
AD8334
LNA
LON
Figure 50. Differential Input Configuration Using the AD8334
Rev. 0 | Page 21 of 56
AD9212
A
A
CLOCK INPUT CONSIDERATIONS
For optimum performance, the AD9212 sample clock inputs
(CLK+ and CLK−) should be clocked with a differential signal.
This signal is typically ac-coupled into the CLK+ and CLK− pins
via a transformer or capacitors. These pins are biased internally
and require no additional bias.
Figure 51 shows one preferred method for clocking the AD9212.
The low jitter clock source is converted from single-ended to
differential using an RF transformer. The back-to-back Schottky
diodes across the secondary transformer limit clock excursions
into the AD9212 to approximately 0.8 V p-p differential. This
helps prevent the large voltage swings of the clock from feeding
through to other portions of the AD9212 and preserves the fast
rise and fall times of the signal, which are critical to low jitter
performance.
MINI-CIRCUITS
ADT1–1WT, 1:1Z
CLOCK
INPUT
50
100
Figure 51. Transformer-Coupled Differential Clock
If a low jitter clock is available, another option is to ac-couple a
differential PECL signal to the sample clock input pins as shown
in Figure 52. The AD9510/AD9511/AD9512/AD9513/AD9514/
AD9515 family of clock drivers offers excellent jitter performance.
CLOCK
INPU T
CLOCK
INPU T
50
1
50 RESISTORS ARE OPT IONAL .
CLOCK
INPU T
CLOCK
INPU T
50
1
50 RESISTORS ARE OPTI ONAL.
0.1µF
CLK
PECL DRIVER
0.1µF
50
CLK
1
1
Figure 52. Differential PECL Sample Clock
0.1µF
CLK
LVDS DRIVER
0.1µF
50
CLK
1
1
Figure 53. Differential LVDS Sample Clock
0.1µF0.1µF
XFMR
0.1µF
0.1µF
AD9510/AD9511/
AD9512/AD9513/
AD9514/AD9515
AD9510/AD9511/
AD9512/AD9513/
AD9514/AD95 15
SCHOTTKY
DIODES:
HSM2812
240240
0.1µF
100
0.1µF
0.1µF
100
0.1µF
CLK+
ADC
AD9212
CLK–
CLK+
ADC
AD9212
CLK–
CLK+
ADC
AD9212
CLK–
05968-022
05968-023
05968-024
In some applications, it is acceptable to drive the sample clock
inputs with a single-ended CMOS signal. In such applications,
CLK+ should be directly driven from a CMOS gate, and the
CLK− pin should be bypassed to ground with a 0.1 F capacitor
in parallel with a 39 kΩ resistor (see Figure 54). Although the
CLK+ input circuit supply is AVDD (1.8 V), this input is
designed to withstand input voltages up to 3.3 V, making the
selection of the drive logic voltage very flexible.
D9510/AD9511/
AD9512/AD9513/
AD9514/AD9515
CLK
CMOS DRIVER
CLK
0.1µF
OPTIONA L
100
39k
0.1µF
CLK+
ADC
AD9212
CLK–
50
0.1µF
1
0.1µF
CLOCK
INPU T
1
50 RESISTOR IS OPTIONAL.
Figure 54. Single-Ended 1.8 V CMOS Sample Clock
D9510/AD9511/
AD9512/AD9513/
AD9514/AD9515
CLK
CMOS DRIVER
CLK
OPTION AL
100
0.1µF
0.1µF
CLK+
ADC
AD9212
CLK–
50
0.1µF
1
0.1µF
CLOCK
INPU T
1
50 RESISTOR IS OPTIONAL.
Figure 55. Single-Ended 3.3 V CMOS Sample Clock
Clock Duty Cycle Considerations
Typical high speed ADCs use both clock edges to generate a
variety of internal timing signals. As a result, these ADCs may
be sensitive to clock duty cycle. Commonly, a 5% tolerance is
required on the clock duty cycle to maintain dynamic performance
characteristics. The AD9212 contains a duty cycle stabilizer (DCS)
that retimes the nonsampling edge, providing an internal clock
signal with a nominal 50% duty cycle. This allows a wide range
of clock input duty cycles without affecting the performance of
the AD9212. When the DCS is on, noise and distortion performance are nearly flat for a wide range of duty cycles. However,
some applications may require the DCS function to be off. If so,
keep in mind that the dynamic range performance can be affected
when operated in this mode. See the Memory Map section for
more details on using this feature.
The duty cycle stabilizer uses a delay-locked loop (DLL) to
create the nonsampling edge. As a result, any changes to the
sampling frequency require approximately eight clock cycles
to allow the DLL to acquire and lock to the new rate.
05968-025
05968-026
Rev. 0 | Page 22 of 56
AD9212
Clock Jitter Considerations
High speed, high resolution ADCs are sensitive to the quality of the
clock input. The degradation in SNR at a given input frequency
(f
) due only to aperture jitter (tJ) can be calculated by
A
SNR degradation = 20 × log 10 [1/2 × π × f
× tJ]
A
In this equation, the rms aperture jitter represents the root mean
square of all jitter sources, including the clock input, analog input
signal, and ADC aperture jitter specifications. IF undersampling
applications are particularly sensitive to jitter (see Figure 56).
The clock input should be treated as an analog signal in cases
where aperture jitter may affect the dynamic range of the AD9212.
Power supplies for clock drivers should be separated from the
ADC output driver supplies to avoid modulating the clock signal
with digital noise. Low jitter, crystal-controlled oscillators make
the best clock sources. If the clock is generated from another
type of source (by gating, dividing, or other methods), it should
be retimed by the original clock at the last step.
Refer to the AN-501 Application Noteand the AN-756
Application Note for more in-depth information about jitter
performance as it relates to ADCs (visit
130
RMS CLO CK JITT ER REQ UIREME NT
120
110
100
90
80
SNR (dB)
70
10 BITS
60
8 BITS
50
40
30
1101001000
ANALOG INPUT FREQUENCY (MHz)
Figure 56. Ideal SNR vs. Input Frequency and Jitter
0.125ps
0.25ps
0.5ps
1.0ps
2.0ps
www.analog.com).
16 BITS
14 BITS
12 BITS
05968-015
Power Dissipation and Power-Down Mode
As shown in Figure 57 and Figure 58, the power dissipated by
the AD9212 is proportional to its sample rate. The digital power
dissipation does not vary much because it is determined primarily
by the DRVDD supply and bias current of the LVDS output drivers.
0.30
0.25
0.20
0.15
CURRENT (A)
0.10
0.05
0
10152025303540
Figure 57. Supply Current vs. f
0.40
0.35
0.30
0.25
0.20
CURRENT (A)
0.15
0.10
0.05
0
102030405060
Figure 58. Supply Current vs. f
AVDD CURRENT
TOTAL POWER
DRVDD CURRENT
ENCODE (MHz)
AVDD CURRENT
TOTAL POWER
DRVDD CURRENT
ENCODE (MHz)
for fIN = 10.3 MHz, AD9212-40
SAMPLE
for fIN = 10.3 MHz, AD9212-65
SAMPLE
0.60
0.58
0.56
0.54
0.52
0.50
0.48
0.46
0.44
0.42
0.40
0.90
0.85
0.80
0.75
0.70
0.65
0.60
0.55
0.50
POWER (W)
POWER (W)
05968-089
05968-090
Rev. 0 | Page 23 of 56
AD9212
By asserting the PDWN pin high, the AD9212 is placed in
power-down mode. In this state, the ADC typically dissipates
11 mW. During power-down, the LVDS output drivers are placed
in a high impedance state. The AD9212 returns to normal
operating mode when the PDWN pin is pulled low. This pin is
both 1.8 V and 3.3 V tolerant.
In power-down mode, low power dissipation is achieved by
shutting down the reference, reference buffer, PLL, and biasing
networks. The decoupling capacitors on REFT and REFB are
discharged when entering power-down mode and must be
recharged when returning to normal operation. As a result, the
wake-up time is related to the time spent in the power-down
mode; shorter cycles result in proportionally shorter wake-up
times. With the recommended 0.1 µF and 4.7 µF decoupling
capacitors on REFT and REFB, it takes approximately 1 sec to
fully discharge the reference buffer decoupling capacitors and
375 µs to restore full operation.
There are a number of other power-down options available
when using the SPI port interface. The user can individually
power down each channel or put the entire device into standby
mode. This allows the user to keep the internal PLL powered
when fast wake-up times (~600 ns) are required. See the
Memory Map section for more details on using these features.
Digital Outputs and Timing
The AD9212 differential outputs conform to the ANSI-644 LVDS
standard on default power-up. This can be changed to a low power,
reduced signal option similar to the IEEE 1596.3 standard using the
SDIO/ODM pin or via the SPI. This LVDS standard can further
reduce the overall power dissipation of the device by approximately
36 mW. See the SDIO/ODM Pin section or Table 15 in the
Memory Map section for more information. The LVDS driver
current is derived on-chip and sets the output current at each
output equal to a nominal 3.5 mA. A 100 Ω differential termination
resistor placed at the LVDS receiver inputs results in a nominal
350 mV swing at the receiver.
The AD9212 LVDS outputs facilitate interfacing with LVDS
receivers in custom ASICs and FPGAs that have LVDS capability
for superior switching performance in noisy environments.
Single point-to-point net topologies are recommended with a
100 Ω termination resistor placed as close to the receiver as
possible. No far-end receiver termination and poor differential
trace routing may result in timing errors. It is recommended
that the trace length is no longer than 24 inches and that the
differential output traces are kept close together and at equal
lengths. An example of the FCO and data stream with proper
trace length and position can be found in Figure 59.
Figure 59. LVDS Output Timing Example in ANSI Mode (Default)
05968-027
An example of the LVDS output using the ANSI standard (default)
data eye and a time interval error (TIE) jitter histogram with
trace lengths less than 24 inches on regular FR-4 material is
shown in Figure 60. Figure 61 shows an example of when the
trace lengths exceed 24 inches on regular FR-4 material. Notice
that the TIE jitter histogram reflects the decrease of the data eye
opening as the edge deviates from the ideal position. It is up to
the user to determine if the waveforms meet the timing budget
of the design when the trace lengths exceed 24 inches. Additional
SPI options allow the user to further increase the internal termination (increasing the current) of all eight outputs in order to
drive longer trace lengths (see Figure 62). Even though this
produces sharper rise and fall times on the data edges and is less
prone to bit errors, the power dissipation of the DRVDD supply
increases when this option is used. Also notice in Figure 62 that
the histogram has improved.
In cases that require increased driver strength to the DCO and
FCO outputs because of load mismatch, Register 15 allows the
user to increase the drive strength by 2×. To do this, set the
appropriate bit in Register 5. Note that this feature cannot be
used with Bit 4 and Bit 5 in Register 15. Bit 4 and Bit 5 will take
precedence over this feature. See the Memory Map section for
more details.
Rev. 0 | Page 24 of 56
AD9212
500
EYE: ALL BI TSULS: 12071/12071
400
300
200
100
0
–100
–200
–300
EYE DIAGRAM VOLTAGE (mV)
–400
–500
–1.0ns–1.5n s–0.5ns0ns0.5ns1.0n s1.5ns
400
EYE: ALL BITS
300
200
100
0
–100
–200
EYE DIAGRA M VOLT AGE (mV)
–300
–400
–0.5ns0ns0. 5ns
–1.0ns1.5ns–1.5ns1.0ns
ULS: 12072/12072
90
80
70
60
50
40
30
20
TIE JIT TER HIST OGRAM (Hi ts)
10
0
–150ps –100ps–50ps0ps50ps100ps150ps
05968-030
Figure 60. Data Eye for LVDS Outputs in ANSI Mode with Trace Lengths Less
than 24 Inches on Standard FR-4
500
EYE: ALL BITS
400
300
200
100
0
–100
–200
–300
EYE DIAGRAM VOLTAG E (mV)
–400
–500
–1.0ns–0.5ns0ns0.5ns1.5ns–1.5ns1.0ns
100
90
80
70
60
50
40
30
TIE JITTER HISTO GRAM (Hits)
20
10
0
–200ps–100ps100ps0ps200ps
ULS: 12067/12067
5968-028
Figure 61. Data Eye for LVDS Outputs in ANSI Mode with Trace Lengths
Greater than 24 Inches on Standard FR-4
80
70
60
50
40
30
20
TIE JIT TER HIST OGRAM (Hi ts)
10
0
Figure 62. Data Eye for LVDS Outputs in ANSI Mode with 100 Ω Termination
–150ps –100ps–50ps0ps50ps100ps150ps
05968-029
on and Trace Lengths Greater than 24 Inches on Standard FR-4
The format of the output data is offset binary by default. An
example of the output coding format can be found in Table 8.
If it is desired to change the output data format to twos
complement, see the Memory Map section.
Data from each ADC is serialized and provided on a separate
channel. The data rate for each serial stream is equal to 10 bits
times the sample clock rate, with a maximum of 650 Mbps
(10 bits × 65 MSPS = 650 Mbps). The lowest typical conversion
rate is 10 MSPS. However, if lower sample rates are required for
a specific application, the PLL can be set up for encode rates
lower than 10 MSPS via the SPI. This allows encode rates as low
as 5 MSPS. See the Memory Map section to enable this feature.
Rev. 0 | Page 25 of 56
AD9212
Two output clocks are provided to assist in capturing data from
the AD9212. The DCO is used to clock the output data and is
equal to five times the sampling clock (CLK) rate. Data is
clocked out of the AD9212 and must be captured on the rising
and falling edges of the DCO that supports double data rate
Table 9. Flex Output Test Modes
Output Test
Mode Bit
Sequence
Pattern Name Digital Output Word 1 Digital Output Word 2
0000 Off (default) N/A N/A N/A
0001 Midscale short
11 1111 1111 1111 (14-bit)
1000 User input Register 0x19 to Register 0x1A Register 0x1B to Register 0x1C No
1001 One/zero bit toggle
1010 1010 (8-bit)
10 1010 1010 (10-bit)
1010 1010 1010 (12-bit)
10 1010 1010 1010 (14-bit)
1010 1× sync
0000 1111 (8-bit)
00 0001 1111 (10-bit)
0000 0011 1111 (12-bit)
00 0000 0111 1111 (14-bit)
1011 One bit high
1000 0000 (8-bit)
10 0000 0000 (10-bit)
1000 0000 0000 (12-bit)
10 0000 0000 0000 (14-bit)
1100 Mixed frequency
1010 0011 (8-bit)
10 0110 0011 (10-bit)
1010 0011 0011 (12-bit)
10 1000 0110 0111 (14-bit)
1
PN, or pseudorandom number, sequence is determined by the number of bits in the shift register. The long sequence is 23 bits and the short sequence is
9 bits. How the sequence is generated and utilized is described in the ITU O.150 standard. In general, the polynomial, X23 + X18 + 1 (long) and X9 + X5 + 1
(short), defines the pseudorandom sequence.
(DDR) capturing. The frame clock out (FCO) is used to signal
the start of a new output byte and is equal to the sampling clock
rate. See the timing diagram shown in Figure 2 for more
information.
When using the serial port interface (SPI), the DCO phase can
be adjusted in 60° increments relative to the data edge. This
enables the user to refine system timing margins if required.
The default DCO timing, as shown in Figure 2, is 90° relative to
the output data edge.
An 8-, 12-, and 14-bit serial stream can also be initiated from
the SPI. This allows the user to implement and test compatibility
to lower and higher resolution systems. When changing the
resolution to a 12-bit serial stream, the data stream is lengthened.
See Figure 3 for the 12-bit example. However, when using the
12-bit option, the data stream stuffs two 0s at the end of the
normal 12-bit serial data.
When using the SPI, all of the data outputs can also be inverted
from their nominal state. This is not to be confused with
inverting the serial stream to an LSB-first mode. In default
mode, as shown in Figure 2, the MSB is represented first in the
data output serial stream. However, this can be inverted so that
the LSB is represented first in the data output serial stream (see
Figure 4).
There are 12 digital output test pattern options available that
can be initiated through the SPI. This is a useful feature when
validating receiver capture and timing. Refer to Table 9 for the
output bit sequencing options available. Some test patterns have
two serial sequential words and can be alternated in various
ways, depending on the test pattern chosen. It should be noted
that some patterns may not adhere to the data format select
option. In addition, customer user patterns can be assigned in
the 0x19, 0x1A, 0x1B, and 0x1C register addresses. All test mode
options can support 8- to 14-bit word lengths in order to verify
data capture to the receiver.
Please consult the Memory Map section for information on how
to change these additional digital output timing features through
the serial port interface or SPI.
SDIO/ODM Pin
This pin is for applications that do not require SPI mode operation.
The SDIO/ODM pin can enable a low power, reduced signal option
similar to the IEEE 1596.3 reduced range link output standard if
this pin and the CSB pin are tied to AVDD during device powerup. This option should only be used when the digital output trace
lengths are less than 2 inches from the LVDS receiver. The FCO,
DCO, and outputs function normally, but the LVDS signal swing
of all channels is reduced from 350 mV p-p to 200 mV p-p. This
output mode allows the user to further lower the power on the
DRVDD supply. For applications where this pin is not used, it
should be tied low. In this case, the device pin can be left open,
and the 30 kΩ internal pull-down resistor pulls this pin low. This
pin is only 1.8 V tolerant. If applications require this pin to be
driven from a 3.3 V logic level, insert a 1 kΩ resistor in series
with this pin to limit the current.
Table 10. Output Driver Mode Pin Settings
Resulting
Selected ODM ODM Voltage
Normal
Operation
ODM AVDD Low power,
10 kΩ to AGND ANSI-644
Output Standard
(default)
reduced signal
option
Resulting
FCO and DCO
ANSI-644
(default)
Low power,
reduced
signal option
SCLK/DTP Pin
This pin is for applications that do not require SPI mode operation.
The serial clock/digital test pattern (SCLK/DTP) pin can enable
a single digital test pattern if this pin and the CSB pin are held
high during device power-up. When the DTP is tied to AVDD,
all the ADC channel outputs shift out the following pattern: 10
0000 0000. The FCO and DCO outputs still work as usual while
all channels shift out the repeatable test pattern. This pattern allows
the user to perform timing alignment adjustments among the
FCO, DCO, and output data. For normal operation, this pin
should be tied to AGND through a 10 kΩ resistor. This pin is
both 1.8 V and 3.3 V tolerant.
Table 11. Digital Test Pattern Pin Settings
Resulting
Selected DTP DTP Voltage
Normal
Operation
DTP AVDD 10 0000 0000 Normal operation
10 kΩ to AGND Normal
D+ and D−
operation
Resulting
FCO and DCO
Normal operation
Additional and custom test patterns can also be observed when
commanded from the SPI port. Consult the Memory Map
section to choose from the different options available.
CSB Pin
The chip select bar (CSB) pin should be tied to AVDD for
applications that do not require SPI mode operation. By tying
CSB high, all SCLK and SDIO information is ignored. This pin
is both 1.8 V and 3.3 V tolerant.
RBIAS Pin
To set the internal core bias current of the ADC, place a resistor
(nominally equal to 10.0 kΩ) to ground at the RBIAS pin. The
resistor current is derived on-chip and sets the ADC’s AVDD
current to a nominal 390 mA at 65 MSPS. Therefore, it is
imperative that at least a 1% tolerance on this resistor be used to
achieve consistent performance. If SFDR performance is not as
critical as power, simply adjust the ADC core current to achieve
a lower power. Figure 63 and Figure 64 show the relationship
between the dynamic range and power as the RBIAS resistance
is changed. Nominally, a 10.0 kΩ value is used, as indicated by
the dashed line.
Rev. 0 | Page 27 of 56
AD9212
90
80
SFDR
70
60
SNR/SFDR (dB)
50
SNR
0.8
0.7
0.6
0.5
0.4
IAVDD (A)
0.3
0.2
0.1
40
0
510201525
RBIAS (k)
05968-069
Figure 63. SNR/SFDR vs. RBIAS, AD9212-40
0.8
0.7
0.6
0.5
0.4
IAVDD (A)
0.3
0.2
0.1
0
0
510201525
RBIAS (k)
05968-070
Figure 64. IAVDD vs. RBIAS, AD9212-40
90
80
70
SFDR
0
0
510201525
RBIAS (k)
05968-085
Figure 66. IAVDD vs. RBIAS, AD9212-65
Voltage Reference
A stable and accurate 0.5 V voltage reference is built into the
AD9212. This is gained up by a factor of 2 internally, setting
V
to 1.0 V, which results in a full-scale differential input span
REF
of 2 V p-p. The V
is set internally by default; however, the
REF
VREF pin can be driven externally with a 1.0 V reference to
achieve more accuracy.
When applying the decoupling capacitors to the VREF, REFT,
and REFB pins, use ceramic low ESR capacitors. These capacitors
should be close to the ADC pins and on the same layer of the
PCB as the AD9212. The recommended capacitor values and
configurations for the AD9212 reference pin can be found in
Figure 67.
Table 12. Reference Settings
Resulting
Selected
Mode
External
Reference
Internal,
2 V p-p FSR
SENSE
Voltage
Resulting
VREF (V)
AVDD N/A 2 × external
AGND to 0.2 V 1.0 2.0
Differential
Span (V p-p)
reference
60
SNR/SFDR (dB)
SNR
Internal Reference Operation
A comparator within the AD9212 detects the potential at the
50
SENSE pin and configures the reference. If SENSE is grounded,
the reference amplifier switch is connected to the internal
40
0
510201525
RBIAS (k)
05968-084
Figure 65. SNR/SFDR vs. RBIAS, AD9212-65
resistor divider (see Figure 67), setting VREF to 1 V.
The REFT and REFB pins establish their input span of the ADC
core from the reference configuration. The analog input fullscale range of the ADC equals twice the voltage at the reference
pin for either an internal or an external reference configuration.
If the reference of the AD9212 is used to drive multiple
converters to improve gain matching, the loading of the reference by the other converters must be considered. Figure 69
depicts how the internal reference voltage is affected by loading.
Rev. 0 | Page 28 of 56
AD9212
External Reference Operation
The use of an external reference may be necessary to enhance
the gain accuracy of the ADC or improve thermal drift characteristics. Figure 70 shows the typical drift characteristics of the
internal reference in 1 V mode.
When the SENSE pin is tied to AVDD, the internal reference is
disabled, allowing the use of an external reference. The external
reference is loaded with an equivalent 6 kΩ load. An internal
reference buffer generates the positive and negative full-scale
references, REFT and REFB, for the ADC core. Therefore, the
external reference must be limited to a nominal of 1.0 V.
5
1µF0.1µ F
SENSE
VIN+
VIN–
V
REF
SELECT
LOGIC
ADC
CORE
0.5V
REFT
0.1µF
0.1µF2.2µF
REFB
0.1µF
+
EXTERNAL
REFERENCE
1
1µF
1
OPTIONAL.
Figure 67. Internal Reference Configuration
VIN+
VIN–
V
REF
1
0.1µF
AVD D
SENSE
SELECT
LOGIC
Figure 68. External Reference Operation
ADC
CORE
0.5V
REFT
0.1µF
0.1µF2.2µF
REFB
0.1µF
05968-031
+
5968-032
0
–5
–10
ERROR (%)
–15
REF
V
–20
–25
–30
01.00.52.01.53.02.53.5
0.02
0
–0.02
–0.04
–0.06
–0.08
ERROR (%)
–0.10
REF
V
–0.12
–0.14
–0.16
–0.18
–40
–20 0 20406080
CURRENT LOAD (mA)
Figure 69. V
Accuracy vs. Load
REF
TEMPERATURE (° C)
Figure 70. Typical V
REF
Drift
05968-087
05968-088
Rev. 0 | Page 29 of 56
AD9212
SERIAL PORT INTERFACE (SPI)
The AD9212 serial port interface allows the user to configure
the converter for specific functions or operations through a
structured register space provided inside the ADC. This gives
the user added flexibility and customization depending on the
application. Addresses are accessed via the serial port and can
be written to or read from via the port. Memory is organized
into bytes that can be further divided down into fields, as documented in the Memory Map section. Detailed operational
information can be found in the Analog Devices, Inc., user
manual Interfacing to High Speed ADCs via SPI.
There are three pins that define the serial port interface, or SPI,
to this particular ADC. They are the SCLK, SDIO, and CSB
pins. The SCLK (serial clock) is used to synchronize the read
and write data presented to the ADC. The SDIO (serial data
input/output) is a dual-purpose pin that allows data to be sent
to and read from the internal ADC memory map registers. The
CSB (chip select bar) is an active low control that enables or
disables the read and write cycles (see Table 13).
Table 13. Serial Port Pins
Pin Function
SCLK
SDIO
CSB
Serial Clock. The serial shift clock in. SCLK is used to
synchronize serial interface reads and writes.
Serial Data Input/Output. A dual-purpose pin. The
typical role for this pin is an input or output, depending
on the instruction sent and the relative position in the
timing frame.
Chip Select Bar (Active Low). This control gates the read
and write cycles.
The falling edge of the CSB in conjunction with the rising edge
of the SCLK determines the start of the framing sequence. During
an instruction phase, a 16-bit instruction is transmitted, followed
by one or more data bytes, which is determined by Bit Fields
W0 and W1. An example of the serial timing and its definitions
can be found in Figure 72 and Table 14. In normal operation,
CSB is used to signal to the device that SPI commands are to be
received and processed. When CSB is brought low, the device
processes SCLK and SDIO to process instructions. Normally,
CSB remains low until the communication cycle is complete.
However, if connected to a slow device, CSB can be brought
high between bytes, allowing older microcontrollers enough
time to transfer data into shift registers. CSB can be stalled
when transferring one, two, or three bytes of data. When W0
and W1 are set to 11, the device enters streaming mode and
continues to process data, either reading or writing, until the
CSB is taken high to end the communication cycle. This allows
complete memory transfers without having to provide additional
instructions. Regardless of the mode, if CSB is taken high in the
middle of any byte transfer, the SPI state machine is reset and
the device waits for a new instruction.
In addition to the operation modes, the SPI port can be
configured to operate in different manners. For applications
that do not require a control port, the CSB line can be tied and
held high. This places the remainder of the SPI pins in their
secondary mode as defined in the Serial Port Interface (SPI)
section. CSB can also be tied low to enable 2-wire mode. When
CSB is tied low, SCLK and SDIO are the only pins required for
communication. Although the device is synchronized during
power-up, caution must be exercised when using this mode to
ensure that the serial port remains synchronized with the CSB
line. When operating in 2-wire mode, it is recommended to use
a 1-, 2-, or 3-byte transfer exclusively. Without an active CSB
line, streaming mode can be entered but not exited.
In addition to word length, the instruction phase determines if
the serial frame is a read or write operation, allowing the serial
port to be used to both program the chip and read the contents
of the on-chip memory. If the instruction is a readback operation,
performing a readback causes the serial data input/output (SDIO)
pin to change direction from an input to an output at the
appropriate point in the serial frame.
Data can be sent in MSB- or LSB-first mode. MSB-first mode
is the default at power-up and can be changed by adjusting the
configuration register. For more information about this and
other features, see the user manual Interfacing to High Speed ADCs via SPI.
HARDWARE INTERFACE
The pins described in Table 13 compose the physical interface
between the user’s programming device and the serial port of
the AD9212. The SCLK and CSB pins function as inputs when
using the SPI interface. The SDIO pin is bidirectional, functioning
as an input during write phases and as an output during readback.
This interface is flexible enough to be controlled by either serial
PROMS or PIC mirocontrollers. This provides the user an
alternative method, other than a full SPI controller, to program
the ADC (see the AN-812 Application Note).
If the user chooses not to use the SPI interface, these pins serve
a dual function and are associated with secondary functions
when the CSB is strapped to AVDD during device power-up.
See the Theory of Operation section for details on which pinstrappable functions are supported on the SPI pins.
If multiple SDIO pins share a common connection, care should be
taken to ensure that proper V
load as the AD9212, Figure 71 shows the number of SDIO pins
that can be connected together and the resulting V
levels are met. Assuming the same
OH
level.
OH
Rev. 0 | Page 30 of 56
AD9212
CSB
SCLK
DON’T CARE
1.800
1.795
1.790
1.785
1.780
1.775
1.770
1.765
1.760
OH
1.755
V
1.750
1.745
1.740
1.735
1.730
1.725
1.720
1.715
0302010405060708090100
NUMBER OF SDI O PINS CONNECTED TOGETHER
05968-059
Figure 71. SDIO Pin Loading
t
DS
t
S
t
DH
t
HI
t
CLK
t
LO
t
H
DON’T CARE
SDIO
R/WW1W0A12A11A10A9A8A7
Figure 72. Serial Timing Details
Table 14. Serial Timing Definitions
Parameter Timing (minimum, ns) Description
t
DS
t
DH
t
CLK
t
S
t
H
t
HI
t
LO
t
EN_SDIO
5 Set-up time between the data and the rising edge of SCLK
2 Hold time between the data and the rising edge of SCLK
40 Period of the clock
5 Set-up time between CSB and SCLK
2 Hold time between CSB and SCLK
16 Minimum period that SCLK should be in a logic high state
16 Minimum period that SCLK should be in a logic low state
1
Minimum time for the SDIO pin to switch from an input to an output relative to the SCLK
falling edge (not shown in Figure 72)
t
DIS_SDIO
5
Minimum time for the SDIO pin to switch from an output to an input relative to the SCLK
rising edge (not shown in Figure 72)
D5D4D3D2D1D0
DON’T C AREDON’T CARE
05968-033
Rev. 0 | Page 31 of 56
AD9212
MEMORY MAP
READING THE MEMORY MAP TABLE
Each row in the memory map table has eight address locations.
The memory map is roughly divided into three sections: chip
configuration register map (Address 0x00 to Address 0x02), device
index and transfer register map (Address 0x05 and Address 0xFF),
and program register map (Address 0x08 to Address 0x25).
The left-hand column of the memory map indicates the register
address number in hexadecimal. The default value of this address is
shown in hexadecimal in the right-hand column. The Bit 7 (MSB)
column is the start of the default hexadecimal value given. For
example, Hexadecimal Address 0x09, Clock, has a hexadecimal
default value of 0x01. This means Bit 7 = 0, Bit 6 = 0, Bit 5 = 0,
Bit 4 = 0, Bit 3 = 0, Bit 2 = 0, Bit 1 = 0, and Bit 0 = 1, or 0000 0001
in binary. This setting is the default for the duty cycle stabilizer in
the on condition. By writing a 0 to Bit 6 at this address, the duty
cycle stabilizer turns off. For more information on this and other
functions, consult the user manual Interfacing to High Speed ADCs via SPI.
RESERVED LOCATIONS
Undefined memory locations should not be written to except
when writing the default values suggested in this data sheet.
Addresses that have values marked as 0 should be considered
reserved and have a 0 written into their registers during power-up.
DEFAULT VALUES
Coming out of reset, critical registers are preloaded with default
values. These values are indicated in Table 15, where an X refers
to an undefined feature.
LOGIC LEVELS
An explanation of various registers follows: “Bit is set” is
synonymous with “bit is set to Logic 1” or “writing Logic 1 for
the bit.” Similarly, “clear a bit” is synonymous with “bit is set to
Logic 0” or “writing Logic 0 for the bit.”
Rev. 0 | Page 32 of 56
AD9212
Table 15. Memory Map Register
Default
Addr.
(Hex)
Chip Configuration Registers
00 chip_port_config 0 LSB first
01 chip_id 10-bit Chip ID Bits 7:0
02 chip_grade X Child ID 6:4
Device Index and Transfer Registers
04 device_index_2 X X X X Data
05 device_index_1 X X Clock
FF device_update X X X X X X X SW
ADC Functions
08 modes X X X X X Internal power-down mode
09 clock X X X X X X X Duty
0D test_io User test mode
Parameter Name
Bit 7
(MSB)
00 = off (default)
01 = on, single alternate
10 = on, single once
11 = on, alternate once
Output test mode—see Table 9 in the
Digital Outputs and Timing section
0000 = off (default)
0001 = midscale short
0010 = +FS short
0011 = −FS short
0100 = checker board output
0101 = PN 23 sequence
0110 = PN 9
0111 = one/zero word toggle
1000 = user input
1001 = one/zero bit toggle
1010 = 1× sync
1011 = one bit high
1100 = mixed bit frequency
(format determined by output_mode)
Channel
G
1 = on
(default)
0 = off
Data
Channel
C
1 = on
(default)
0 = off
000 = chip run (default)
001 = full power-down
010 = standby
011 = reset
1 = on
0 = off
(default)
Data
Channel
F
1 = on
(default)
0 = off
Data
Channel
B
1 = on
(default)
0 = off
0 0x18 The nibbles
Data
Channel
E
1 = on
(default)
0 = off
Data
Channel
A
1 = on
(default)
0 = off
transfer
1 = on
0 = off
(default)
cycle
stabilizer
1 = on
(default)
0 = off
Value
(Hex)
Read
only
only
0x0F Bits are set to
0x0F Bits are set to
0x00 Synchronously
0x00 Determines
0x01 Turns the
0x00 When set, the
Default Notes/
Comments
should be
mirrored so that
LSB- or MSB-first
mode registers
correctly
regardless of
shift mode.
Default is unique
chip ID, different
for each device.
This is a readonly register.
Child ID used to
differentiate
graded devices.
determine which
on-chip device
receives the next
write command.
determine which
on-chip device
receives the next
write command.
transfers data
from the master
shift register to
the slave.
various generic
modes of chip
operation.
internal duty
cycle stabilizer
on and off.
test data is
placed on the
output pins in
place of normal
data.
Rev. 0 | Page 33 of 56
AD9212
Default
Addr.
(Hex)
14 output_mode X 0 = LVDS
15 output_adjust XXOutput driver
16 output_phase XX X X 0011 = output clock phase adjust
LVDS or other
output properties.
Primarily functions to set the
LVDS span and
common-mode
levels in place of
an external
resistor.
utilize global
clock divide,
determines
which phase of
the divider
output is used to
supply the
output clock.
Internal latching
is unaffected.
pattern, 1 LSB.
pattern, 1 MSB.
pattern, 2 LSB.
pattern, 2 MSB.
control. Default
causes MSB first
and the native
bit stream
(global).
down individual
sections of a
converter (local).
Rev. 0 | Page 34 of 56
AD9212
Power and Ground Recommendations
When connecting power to the AD9212, it is recommended
that two separate 1.8 V supplies be used: one for analog (AVDD)
and one for digital (DRVDD). If only one supply is available, it
should be routed to the AVDD first and then tapped off and
isolated with a ferrite bead or a filter choke preceded by
decoupling capacitors for the DRVDD. The user can employ
several different decoupling capacitors to cover both high and
low frequencies. These should be located close to the point of
entry at the PC board level and close to the parts with minimal
trace length.
A single PC board ground plane should be sufficient when
using the AD9212. With proper decoupling and smart partitioning of the PC board’s analog, digital, and clock sections,
optimum performance is easily achieved.
Exposed Paddle Thermal Heat Slug Recommendations
It is required that the exposed paddle on the underside of the
ADC is connected to analog ground (AGND) to achieve the
best electrical and thermal performance of the AD9212. An
exposed continuous copper plane on the PCB should mate to
the AD9212 exposed paddle, Pin 0. The copper plane should
have several vias to achieve the lowest possible resistive thermal
path for heat dissipation to flow through the bottom of the PCB.
These vias should be solder filled or plugged.
To maximize the coverage and adhesion between the ADC and
PCB, partition the continuous copper plane by overlaying a
silkscreen on the PCB into several uniform sections. This provides
several tie points between the two during the reflow process.
Using one continuous plane with no partitions only guarantees
one tie point between the ADC and PCB. See Figure 73 for a
PCB layout example. For detailed information on packaging
and the PCB layout of chip scale packages, see the AN-772
Application Note, A Design and Manufacturing Guide for the Lead Frame Chip Scale Package (LFCSP), at
SILKSCREEN PARTITION
PIN 1 INDICATOR
www.analog.com.
05968-034
Figure 73. Typical PCB Layout
Rev. 0 | Page 35 of 56
AD9212
EVALUATION BOARD
The AD9212 evaluation board provides all of the support circuitry required to operate the ADC in its various modes and
configurations. The converter can be driven differentially through a
transformer (default) or through the AD8334 driver. The ADC
can also be driven in a single-ended fashion. Separate power pins
are provided to isolate the DUT from the AD8334 drive circuitry.
Each input configuration can be selected by proper connection
of various jumpers (see Figure 76 to Figure 80). Figure 74 shows
the typical bench characterization setup used to evaluate the ac
performance of the AD9212. It is critical that the signal sources
used for the analog input and clock have very low phase noise
(<1 ps rms jitter) to realize the optimum performance of the
converter. Proper filtering of the analog input signal to remove
harmonics and lower the integrated or broadband noise at the
input is also necessary to achieve the specified noise performance.
See Figure 76 to Figure 86 for the complete schematics and
layout diagrams that demonstrate the routing and grounding
techniques that should be applied at the system level.
POWER SUPPLIES
This evaluation board comes with a wall-mountable switching
power supply that provides a 6 V, 2 A maximum output. Simply
connect the supply to the rated 100 V ac to 240 V ac wall outlet
at 47 Hz to 63 Hz. The other end is a 2.1 mm inner diameter
jack that connects to the PCB at P701. Once on the PC board,
the 6 V supply is fused and conditioned before connecting to
three low dropout linear regulators that supply the proper bias
to each of the various sections on the board.
When operating the evaluation board in a nondefault condition,
L701 to L704 can be removed to disconnect the switching
power supply. This enables the user to bias each section of the
board individually. Use P702 to connect a different supply for
each section. At least one 1.8 V supply is needed with a 1 A current
WALL OUTLET
100V AC TO 240V AC
47Hz TO 63Hz
6V DC
SWITCHING
ROHDE & SCHWARZ,
SMHU,
2V p-p SIGNAL
SYNTHESIZ ER
ROHDE & SCHWARZ,
SMHU,
2V p-p SIGNAL
SYNTHESIZER
POWER
SUPPLY
2A MAX
BAND-PASS
FILTER
XFMR
INPUT
CLK
5.0V
–+
GND
1.8V
GND
AVDD_5V
EVALUATION BOARD
AVDD_DUT
AD9212
Figure 74. Evaluation Board Connection
–+–+
1.8V
GND
DRVDD_DUT
–+
capability for AVDD_DUT and DRVDD_DUT; however, it is
recommended that separate supplies be used for both analog
and digital. To operate the evaluation board using the VGA
option, a separate 5.0 V analog supply is needed. The 5.0 V
supply, or AVDD_5 V, should have a 1 A current capability. To
operate the evaluation board using the SPI and alternate clock
options, a separate 3.3 V analog supply is needed in addition to
the other supplies. The 3.3 V supply, or AVDD_3.3 V, should
have a 1 A current capability as well.
INPUT SIGNALS
When connecting the clock and analog source, use clean signal
generators with low phase noise, such as Rohde & Schwarz SMHU
or HP8644 signal generators or the equivalent. Use a 1 m, shielded,
RG-58, 50 Ω coaxial cable for making connections to the evaluation board. Enter the desired frequency and amplitude from the
ADC specifications tables. Typically, most Analog Devices
evaluation boards can accept ~2.8 V p-p or 13 dBm sine wave
input for the clock. When connecting the analog input source, it
is recommended to use a multipole, narrow-band, band-pass
filter with 50 Ω terminations. Analog Devices uses TTE, Allen
Avionics, and K&L types of band-pass filters. The filter should
be connected directly to the evaluation board if possible.
OUTPUT SIGNALS
The default setup uses the HSC-ADC-FPGA high speed
deserialization board to deserialize the digital output data and
convert it to parallel CMOS. These two channels interface
directly with the Analog Devices standard dual-channel FIFO
data capture board (HSC-ADC-EVALB-DC). Two of the eight
channels can then be evaluated at the same time. For more
information on channel settings on these boards and their
optional settings, visit www.analog.com/FIFO.
3.3V
GND
AVDD_3.3V
CHA TO CHH
10-BIT
SERIAL
LVD S
SPISPISPISPI
3.3V
–+
GND
HSC-ADC-FPG A
DESERIALIZATION
–+
3.3V_D
HIGH SPEED
BOARD
PARALLEL
1.5V
GND
2-CH
10-BIT
CMOS
1.5V_FPG A
HSC-ADC-EVALB-DC
3.3V
–+
GND
FIFO DATA
CAPTURE
BOARD
CONNECTION
VCC
USB
PC
RUNNING
ADC
ANALYZER
AND SPI
USER
SOFTWARE
5968-035
Rev. 0 | Page 36 of 56
AD9212
DEFAULT OPERATION AND JUMPER SELECTION
SETTINGS
The following is a list of the default and optional settings or
modes allowed on the AD9212 Rev. A evaluation board.
•POWER: Connect the switching power supply that is
supplied in the evaluation kit between a rated 100 V ac
to 240 V ac wall outlet at 47 Hz to 63 Hz and P701.
•AIN: The evaluation board is set up for a transformer-
coupled analog input with optimum 50 Ω impedance
matching out to 150 MHz (see Figure 75). For more
bandwidth response, the differential capacitor across the
analog inputs can be changed or removed. The common
mode of the analog inputs is developed from the center
tap of the transformer or AVDD_DUT/2.
0
–1
–2
–3
–4
–5
–6
–7
–8
–9
AMPLITUDE (dBFS)
–10
–11
–12
–13
–14
050100 150 200 250 300 350 400 450 500
Figure 75. Evaluation Board Full Power Bandwidth
•VREF: VREF is set to 1.0 V by tying the SENSE pin to
ground, R317. This causes the ADC to operate in 2.0 V p-p
full-scale range. A separate external reference option using
the ADR510 or ADR520 is also included on the evaluation
board. Simply populate R312 and R313 and remove C307.
Proper use of the VREF options is noted in the Voltage
Reference section.
•RBIAS: RBIAS has a default setting of 10 kΩ (R301) to
ground and is used to set the ADC core bias current. To
further lower the core power (excluding the LVDS driver
supply), simply change the resistor setting. However,
performance of the ADC will degrade depending on the
resistor chosen. See RBIAS section for more information.
•CLOCK: The default clock input circuitry is derived from a
simple transformer-coupled circuit using a high bandwidth
1:1 impedance ratio transformer (T401) that adds a very
low amount of jitter to the clock path. The clock input is
–3dB CUTOFF = 186MHz
FREQUENCY (MHz)
5968-086
50 Ω terminated and ac-coupled to handle single-ended
sine wave types of inputs. The transformer converts the
single-ended input to a differential signal that is clipped
before entering the ADC clock inputs.
A differential LVPECL clock can also be used to clock the
ADC input using the
AD9515 (U401). Simply populate
R406 and R407 with 0 Ω resistors and remove R215 and
R216 to disconnect the default clock path inputs. In addition,
populate C205 and C206 with a 0.1 F capacitor and remove
C409 and C410 to disconnect the default clock path outputs.
The
AD9515 has many pin-strappable options that are set
to a default working condition. Consult the AD9515 data
sheet for more information about these and other options.
If using an oscillator, two oscillator footprint options are
also available (OSC401) to check the ADC performance.
J401 gives the user flexibility in using the enable pin, which
is common on most oscillators.
•PDWN: To enable the power-down feature, simply short
J301 to the on position (AVDD) on the PDWN pin.
•SCLK/DTP: To enable a digital test pattern on the digital
outputs of the ADC, use J304. If J304 is tied to AVDD during
device power-up, Test Pattern 10 0000 0000 will be enabled.
See the SCLK/DTP Pin section for details.
•SDIO/ODM: To enable the low power, reduced signal option
similar to the IEEE 1595.3 reduced range link LVDS output
standard, use J303. If J303 is tied to AVDD during device
power-up, it enables the LVDS outputs in a low power,
reduced signal option from the default ANSI standard.
This option changes the signal swing from 350 mV p-p to
200 mV p-p, which reduces the power of the DRVDD supply.
See the SDIO/ODM Pin section for more details.
•CSB: To enable the SPI information on the SDIO and
SCLK pins that is to be processed, simply tie J302 low in
the always enable mode. To ignore the SDIO and SCLK
information, tie J302 to AVDD.
•Non-SPI Mode: For users who wish to operate the DUT
without using SPI, simply remove Jumpers J302, J303, and
J304. This disconnects the CSB, SCLK/DTP, and SDIO/OMD
pins from the control bus, allowing the DUT to operate in
its simplest mode. Each of these pins has internal termination
and will float to its respective level.
•D+, D−: If an alternative data capture method to the setup
described in Figure 76 is used, optional receiver terminations,
R318, R320 to R328, can be installed next to the high speed
backplane connector.
Rev. 0 | Page 37 of 56
AD9212
ALTERNATIVE ANALOG INPUT DRIVE
CONFIGURATION
The following is a brief description of the alternative analog
input drive configuration using the AD8334 dual VGA. If this
particular drive option is in use, some components may need to
be populated, in which case all the necessary components are
listed in Table 16. For more details on the AD8334 dual VGA,
including how it works and its optional pin settings, consult the
AD8334 data sheet.
To configure the analog input to drive the VGA instead of the
default transformer option, the following components need to
be removed and/or changed.
R206, R207, R223, R224, R239, R240, R257, and R258 with
10 kΩ resistors to provide an input common-mode level to
the analog input.
•Populate R105, R113, R118, R124, R131, R137, R151, and
R160, R205, R213, R221, R222, R239, R240, R255, and
R256 with 0 Ω resistors in the analog input path.
Currently, L505 to L520 and L605 to L620 are populated with 0 Ω
resistors to allow signal connection. This area allows the user to
design a filter if additional requirements are necessary.
Rev. 0 | Page 38 of 56
AD9212
VIN_D
VIN_C
VIN_C
DNP
R154
AVDD_DUT
R134
33Ω
10Ω
FB108
R132
DNP
CM3
5
6
R131
0Ω−DNP
T103
1234
CH_C
CM3
0.1µF
C115
R130
0Ω
DNP
P106
Ain
R127
0Ω−DNP
Connection
VGA Input
INH3
Channel C
DNP
R135
1kΩ
R158
AVDD_DUT
DNP
C119
2.2pF
C118
DNP
C117
R136
33Ω
10Ω
FB109
R163
499Ω
DNP
C120
DNP
R133
0.1µF
R137
CH_C
C116
10Ω
FB107
P105
Ain
C121
0Ω−DNP
CM3
1kΩ
1
R139
R138
1kΩ
0.1µF
E103
AVDD_DUT
0Ω
R129
R128
64.9Ω
DNP
R155
AVDD_DUT
R151
0Ω−DNP
C122
VGA Input
Connection
R140
0Ω−DNP
INH4
Channel D
VIN_D
R148
1kΩ
DNP
R159
DNP
C126
2.2pF
C125
DNP
C124
499Ω
R164
R144
DNP
R145
CM4
5
34
2
CM4
DNP
P108
Ain
R141
64.9Ω
33Ω
R147
10Ω
FB112
DNP
C127
R160
0Ω−DNP
CM4
CH_D
1
E104
C123
0.1µF
AVDD_DUT
R143
0Ω
0Ω
R142
R146
33Ω
Ω
FB111
10
6
T104
1
CH_D
0.1µF
10Ω
FB110
P107
Ain
05968-072
AVDD_DUT
DNP
0.1µF
C128
1kΩ
R150
R149
1kΩ
VIN_A
VIN_A
R109
1kΩ
DNP
R152
AVDD_DUT
R108
33Ω
10Ω
FB102
R106
DNP
CM1
5
6
R105
0Ω−DNP
T101
1
2
CH_A
CM1
0.1µF
C101
R104
0Ω
DNP
P102
Ain
VGA Input
Connection
R101
0Ω−DNP
INH1
Channel A
DNP
R156
AVDD_DUT
2.2pF
C104
DNP
C105
DNP
C103
R110
33Ω
10Ω
FB103
499Ω
R161
DNP
R107
4
R113
3
0.1µF
C102
FB101
P101
Ain
DNP
C106
0Ω−DNP
CM1
CH_A
1
E101
AVDD_DUT
10Ω
0Ω
R103
R102
64.9Ω
AVDD_DUT
0.1µF
C107
1kΩ
R112
R111
1kΩ
VGA Input
Connection
R153
INH2
VIN_B
DNP
R121
33Ω
10Ω
FB105
6
R118
0Ω−DNP
T102
1234
CH_B
0.1µF
C108
10Ω
FB104
R114
0Ω−DNP
P103
Channel B
Ain
Figure 76. Evaluation Board Schematic, DUT Analog Inputs
VIN_B
DNP
R123
1kΩ
R157
AVDD_DUT
DNP
C112
2.2pF
C111
DNP
C110
R122
33Ω
10Ω
FB106
R162
499Ω
R119
DNP
DNP
R120
CM2
5
R124
CM2
0.1µF
C109
R116
DNP
P104
Ain
R115
64.9Ω
DNP
C113
0.1µF
0Ω−DNP
CH_B
0Ω
R117
C114
CM2
0Ω
1kΩ
R126
1
R125
1KΩ
E102
AVDD_DUT
DNP: DO NOT POPULATE.
Rev. 0 | Page 39 of 56
AD9212
VIN_G
VIN_G
DNP
R248
AVDD_DUT
R242
33Ω
10Ω
FB208
R239
6
R237
T203
0Ω−DNP
1
25
CH_G
0.1µF
C215
R236
0Ω
DNP
P206
Ain
R233
0Ω−DNP
INH7
VGA Input
Connection
Channel G
R246
1kΩ
2.2pF
C218
DNP
C217
R241
499Ω
DNP
DNP
R240
CM7
R238
34
CH_G
CM7
10Ω
FB207
P205
Ain
DNP
R247
AVDD_DUT
AVDD_DUT
DNP
C219
R245
33Ω
10Ω
FB209
DNP
C220
0.1µF
0Ω−DNP
C216
C221
CM7
1
R250
1kΩ
R249
1kΩ
0.1µF
E203
AVDD_DUT
0Ω
R235
R234
64.9kΩ
Connection
VGA Input
VIN_H
VIN_H
R262
1kΩ
2.2pF
C225
DNP
C224
499Ω
R259
DNP
DNP
R258
CM8
R256
34
CH_H
CM8
C223
R254
P208
Ain
R252
64.9Ω
DNP
R263
DNP
C226
R261
33Ω
10Ω
FB212
DNP
C227
0Ω−DNP
CM8
1
E204
0.1µF
AVDD_DUT
0Ω
0Ω
R253
DNP
R264
R260
33Ω
10Ω
FB211
R257
6
R255
T204
0Ω−DNP
1
25
CH_H
0.1µF
C222
10Ω
FB210
DNP
R251
0Ω−DNP
INH8
DNP
P207
Channel H
Ain
05968-073
AVDD_DUT
0.1µF
C228
R266
1kΩ
R265
1kΩ
VIN_E
VIN_E
R214
1kΩ
R215
2.2pF
C204
DNP
C203
R210
33Ω
FB203
499Ω
DNP
R207
R213
0Ω−DNP
34
CH_E
0.1µF
C202
10Ω
FB201
R203
R202
DNP
AVDD_DUT
DNP
C205
10Ω
DNP
C206
CM5
1
E201
0Ω
64.9Ω
AVDD_DUT
0.1µF
C207
R212
1kΩ
R211
1kΩ
AVDD_DUT
VGA Input
Connection
DNP
R216
AVDD_DUT
R209
33Ω
10Ω
FB202
R208
R206
DNP
CM5
6
R205
T201
0Ω−DNP
1
25
CH_E
CM5
0.1µF
C201
R204
0Ω
DNP
P202
Ain
VGA Input
Connection
R201
0Ω−DNP
INH5
VIN_F
VIN_F
DNP
R228
1kΩ
2.2pF
C211
DNP
C210
R227
33Ω
FB206
R225
499Ω
R223
DNP
DNP
R224
CM6
R222
0Ω−DNP
25
34
CH_F
CM6
0.1µF
C209
R220
0Ω
DNP
P204
Ain
64.9Ω
R218
R229
AVDD_DUT
DNP
C212
10Ω
DNP
C213
0.1µF
C214
CM6
0Ω
R219
1kΩ
R232
1
R231
1kΩ
E202
AVDD_DUT
DNP
R230
R226
33Ω
10Ω
FB205
6
R221
0Ω−DNP
T202
1
CH_F
0.1µF
C208
10Ω
FB204
R217
0Ω−DNP
INH6
P203
Channel F
P201
Channel E
Ain
Ain
Figure 77. Evaluation Board Schematic, DUT Analog Inputs (Continued)
Rev. 0 | Page 40 of 56
DNP: DO NOT POPULATE.
AD9212
Optional Output
Terminations
R318,R320−R328
DNP
DNP
DNP
DNP
DNP
R318
DCO
FCO
49
D9
D10
GNDCD9
GNDCD10
C10
C9
P301
39
59
DNP
R320
R321
R322
CHB
CHC
CHA
46
47
48
D6
D7
D8
GNDCD6
GNDCD7
GNDCD8
C6
C7
C8
37
38
56
57
58
36
DNP
R323
R324
R325
CHD
CHE
CHF
45
43
44
D5
D3
D4
GNDCD3
GNDCD4
GNDCD5
C3
C4
C5
33
34
53
54
55
35
DNP
DNP
DNP
R328
R326
R327
CHG
CHHCHH
18
19
415042
D1
D2
GNDCD1
GNDCD2
GNDAB10
C1
C2
314032
516052
B8
B9
B10
GNDAB7
GNDAB8
GNDAB9
A10
A8
A9
8
9
28
29
SCLK_CHA
SDI_CHA
CSB1_CHA
CSB2_CHA
SDO_CHA
112012
13
14
15
16
17
B7
GNDAB6
A7
7
27
B4
B5
B6
GNDAB3
GNDAB4
GNDAB5
A4
A5
A6
4
5
6
24
25
26
B1
B2
B3
GNDAB1
GNDAB2
A1
A2
A3
1102
3
213022
23
05968-074
Digital O utputs
CHF
DCO
CHA
FCO
CHB
AVDD_DUT
CHC
R302
DNP
CHD
CHE
CHG
SDI_CHB
SCLK_CHB
ALWAYS ENABLE SPI
ODM Enable
PDWN ENABLE
3
3
2
2
J302
J301
1
1
R304
100kΩ DNP
R303
CSB_DUT
DTP Enable
3
3
2
2
J303
J304
1
1
SDIO_ODM
R307
10kΩ
SCLK_DTP
R306
100kΩ
R305
100kΩ
CSB3_CHB
CSB4_CHB
SDO_CHB
NC
VSENSE_DUT
Vref Select
VREF_DUT
= External
= 0.5V
REF
REF
V
V
DNP
R315
DNP
R314
= 1V
= 0.5V(1 + R219/R220)
REF
REF
V
V
0Ω
R317
DNP
R31
AVDD_DUT
DNP
R312
DNP
R313
1µF
C307
0.1µF
1kΩ
VIN_B
AVDD_DUT
48
AVDD
49
VIN_C
VIN_C
AVDD_DUT
VIN_D
R301
VIN_D
10kΩ
VSENSE_DUT
VREF_DUT
C304
0.1µF
AVDD_DUT
VIN_E
C303
Reference
4.7µF
Decoupling
VIN_E
AVDD_DUT
VIN_F
C301
0.1µF
VIN_F
C302
0.1µF
VIN+C
50
VIN−C
51
AVDD
52
VIN−D
53
VIN+D
54
RBIAS
55
SENSE
56
VREF
57
REFB
58
REFT
59
AVDD
60
VIN+E
61
VIN−E
62
AVDD
63
VIN−F
64
VIN+F
0
SLUG
AVDD
1
AVDD_DUT
AVDD_DUT
VIN_B
47
45
46
AVDD
VIN−B
VIN+B
VIN+G
VIN−G
AVDD
4
2
3
VIN_G
VIN_G
AVDD_DUT
AVDD_DUT
VIN_A
VIN_A
43
44
VIN−A
40
42
41
CSB
AVDD
VIN+A
PDWN
AD9212BCPZ-50
CLK−
VIN−H
5
VIN_H
AVDD
VIN+H
AVDD
7109118
6
AVDD_DUT
CLK
AVDD_DUT
VIN_H
AVDD_DUT
GND
38
39
37
AVDD
DRGND
SCLK/DTP
SDIO/ODM
U301
CLK+
CLK
AVDD
AVDD_DUT
DRGND
AVDD
12
1336
GND
AVDD_DUT
CHA
CHA
DRVDD_DUT
33
34
D+A
D−A
DRVDD
DRVDD
1435
32
D+B
D−B
D+C
D−C
D+D
D−D
FCO+
FCO−
DCO+
DCO−
D+E
D−E
D+F
D−F
D+G
D−G
D+H
D−H
16
15
CHH
CHH
CHB
31
CHB
30
CHC
29
CHC
28
CHD
27
CHD
26
FCO
25
FCO
24
DCO
23
DCO
22
CHE
21
CHE
20
CHF
19
CHF
18
CHG
17
CHG
AVDD_DUT
DNP
R311
Reference Circuitry
4.99kΩ
R309
VOUT
GND
1.0V
CW
10kΩ
R310
C305
0.1µF
ADR510ARTZ
OPTIONA L
EXT REF
TRIM/NC
U302
470kΩ
R308
DRVDD_DUT
R319
C306
Remove C214 when
using external Vref
DNP: DO NOT POPULATE.
Figure 78. Evaluation Board Schematic, DUT, VREF, and Digital Output Interface
Analog Devices AD8334ACPZ-REEL
ultralow noise
precision dual VGA
58 1 U706 IC SOT-223 ADP33339AKC-5-RL7 Analog Devices ADP3339AKCZ-5-RL7
59 1 U705 IC SOT-223 ADP33339AKC-3.3-RL Analog Devices ADP3339AKCZ-3.3-RL
60 1 U301 IC CP-64-3
AD9212BCPZ-50, octal,
Analog Devices AD9212BCPZ-65
10-bit, 65 MSPS serial
LVDS 1.8 V ADC
61 1 U302 IC SOT-23
ADR510ARTZ, 1.0 V,
Analog Devices ADR510ARTZ
precision low noise
shunt voltage
reference
62 1 U401 IC
LFCSP
CP-32-2
63 1 U702 IC
SC70,
MAA06A
64 1 U703 IC
SC70,
MAA06A
65 1 U701 IC 8-SOIC
AD9515BCPZ, 1.6 GHz
clock distribution IC
NC7WZ07P6X_NL,
UHS dual buffer
NC7WZ16P6X_NL,
UHS dual buffer
Flash prog
Analog Devices AD9515BCPZ
Fairchild NC7WZ07P6X_NL
Fairchild NC7WZ16P6X_NL
Microchip PIC12F629-I/SNG
mem 1kx14,
RAM size 64 × 8,
20 MHz speed, PIC12F
controller series
1
This BOM is RoHS compliant.
Manufacturer
Part Number
Rev. 0 | Page 54 of 56
AD9212
OUTLINE DIMENSIONS
7.50
REF
0.30
0.25
0.18
PIN 1
16
1
INDICATOR
7.25
7.10 SQ
6.95
0.25 MIN
64
17
1.00
0.85
0.80
SEATING
PLANE
12° MAX
9.00
BSC SQ
PIN 1
INDICATOR
TOP
VIEW
0.80 MAX
0.65 TYP
0.50 BSC
8.75
BSC SQ
0.20 REF
0.60 MAX
0.50
0.40
0.30
0.05 MAX
0.02 NOM
49
48
33
32
0.60 MAX
EXPOSED PAD
(BOTTOM VIEW)
COMPLIANT TO JEDEC S TANDARDS MO-220- VMMD-4
063006-B
Figure 87. 64-Lead Lead Frame Chip Scale Package [LFCSP_VQ]
9 mm × 9 mm Body, Very Thin Octal
(CP-64-3)
Dimensions shown in millimeters
ORDERING GUIDE
Model Temperature Range Package Description Package Option
AD9212BCPZ-40
AD9212BCPZRL7-401 −40°C to +85°C 64-Lead Lead Frame Chip Scale Package [LFCSP_VQ] Tape and Reel CP-64-3
AD9212BCPZ-651 −40°C to +85°C 64-Lead Lead Frame Chip Scale Package [LFCSP_VQ] CP-64-3
AD9212BCPZRL7-651 −40°C to +85°C 64-Lead Lead Frame Chip Scale Package [LFCSP_VQ] Tape and Reel CP-64-3
AD9212-65EBZ1 Evaluation Board
1
Z = Pb-free part.
1
−40°C to +85°C 64-Lead Lead Frame Chip Scale Package [LFCSP_VQ] CP-64-3