1.0 SCOPEThis specification documents the detail requirements for space qualified product manufactured on
Analog Devices, Inc.'s QML certified line per MIL-PRF-38535 Level V except as modified herein.
The manufacturing flow described in the STANDARD SPACE LEVEL PRODUCTS PROGRAM
brochure is to be considered a part of this specification. http://www.analog.com/aerospaceThis data sheet specifically details the space grade version of this product. A more detailed operational
description and a complete data sheet for commercial product grades can be found at
www.analog.com/AD9054
2.0 Part Number. The complete part number(s) of this specification follow:
Part Number
Description
AD9054-703J44 8-Bit, 200 MSPS ADC
2.1 Case Outline.
Letter
Descriptive designator Case Outline (Lead Finish per MIL-PRF-38535)
J44 J 44-Lead ceramic JLCC
3.0 Terminal Connections:
Pin Number Mnemonic Pin Number Mnemonic
1 AIN 23 GND
2 GND 24 VDD
3 VDD 25
4
5
____________
DEMUX
____
DS
26
27
6 DS 28
7 ENCODE 29
8
_____________
ENCODE
30
9 VDD 31
10 GND 32
11 VDD 33 GND
12 GND 34 VDD
DA
DA
DA5
DA4
DA
DA
DA
DA0
7
6
35 GND
36 VDD
37 VDD
38 GND
3
2
1
39 VREF OUT
40 VREF IN
41 GND
42 VDD
13
14
15
16
17
18
19
20
21 VDD 43 GND
22 GND 44
Figure 1 - Terminal connections
.
DB0
DB
DB
DB3
DB4
DB
DB6
DB7
______
AIN
1
2
5
ASD0015375 Rev. D
Information furnished by Analog Devices is believed to be accurate and
reliable. However, no responsibility is assumed by Analog Devices for its use,
nor for any infringements of patents or other rights of third parties that may
result from its use. Specifications subject to change without notice. No license
is granted by implication or otherwise under any patent or patent rights of
Analog Devices. Trademarks and registered trademarks are the property of
their respective companies.
Digital Output Current.................................................................................................20mA
Operating Temperature..............................................................................-55°C to +125°C
Storage Temperature..................................................................................-65°C to +150°C
Maximum Junction Temperature..............................................................................+150°C
Maximum Case Temperature ...................................................................................+150°C
NOTES
Absolute maximum ratings are limiting values to be applied individually, and beyond which the serviceability
of the circuit may be impaired. Functional operability is not necessarily implied. Exposure to absolute
maximum rating conditions for an extended period of time may affect device reliability.
1/ PDA applies to subgroup 1 only. Delta's excluded from PDA.
/ See Table III for delta parameters. See Table I for test conditions.
2
/ Table I parameters with Note 8/ are 100% production tested at 25°C; guaranteed by design and
3
characterization testing for full mil temperature range.
4.4 Table III - Life Test Endpoint and Delta Parameter (Product is tested in accordance with Table I
with the following exceptions)
Parameter Symbol
V
Supply Current
DD
I
DD
Input Offset Voltage VOS
Gain Error
A
Post Burn
Sub-
groups
1
1
e
1
in Limit
Max
156 - 171.6 ±15.6 mA
±23 ±7 ±30 ±7 mV
±9 ±2 ±13 ±4 %FS
Burn In
Delta
Post Life
Test Limit
Max
Life Test
Delta
Units
5.0 MIL-STD-38535 QMLV exceptions:
5.1 Full WLA per MIL-STD-883 TM 5007 is not available for this product fabricated in a
QMLQ wafer process facility. SEM Inspection only is available per MIL-STD-883,
TM2018.
ASD0015375 Rev. D | Page 4 of 5
Rev Description of Change Date
A Initiate 10/18/2004
B Typical values for Dynamic Performance for subgroup 10 & 11 deleted 06/15/2005
C
Clarify SEM vs. WLA availability for QMLQ fab process
11/12/2007
D Update header/footer and add to 1.0 Scope description. March 17, 2008