FEATURES
16 Independently Addressable Voltage Outputs
Full-Scale Set by External Reference
2 µs Settling Time
Double Buffered 8-Bit Parallel Input
High Speed Data Load Rate
Data Readback
Operates from Single +5 V
Optional ±6 V Supply Extends Output Range
APPLICATIONS
Phased Array Ultrasound & Sonar
Power Level Setting
Receiver Gain Setting
Automatic Test Equipment
LCD Clock Level Setting
GENERAL DESCRIPTION
The AD8600 contains 16 independent voltage output digital-toanalog converters that share a common external reference input
voltage. Each DAC has its own DAC register and input register
to allow double buffering. An 8-bit parallel data input, four address pins, a
digital interface.
The AD8600 is constructed in a monolithic CBCMOS process
which optimizes use of CMOS for logic and bipolar for speed
and precision. The digital-to-analog converter design uses voltage mode operation ideally suited to single supply operation.
The internal DAC voltage range is fixed at DACGND to V
The voltage buffers provide an output voltage range that approaches ground and extends to 1.0 V below V
reference voltage values and digital inputs will settle within
±1 LSB in 2 µs.
Data is preloaded into the input registers one at a time after the
internal address decoder selects the input register. In the write
mode (R/
the positive edge of the
be used to load the data. After changes have been submitted to
the input registers, the DAC registers are simultaneously updated by a common load
put voltages simultaneously appear on all 16 outputs.
CS select, a LD, EN, R/W, and RS provide the
.
REF
. Changes in
CC
W low) data is latched into the input register during
EN pulse. Pulses as short as 40 ns can
EN × LD strobe. The new analog out-
Multiplying DAC
AD8600*
FUNCTIONAL BLOCK DIAGRAM
V
RS
DB7
DB6
DB5
DB4
DB3
DB2
DB1
DB0
CS
EN
A3
A2
A1
A0
R/W
CONTROL
ADDRESS
REGISTERS
LOGIC
DECODE
16 x 8
INPUT
D
GND1
DD1
At system power up or during fault recovery the reset (RS) pin
forces all DAC registers into the zero state which places zero
volts at all DAC outputs.
The AD8600 is offered in the PLCC-44 package. The device is
designed and tested for operation over the extended industrial
temperature range of –40°C to +85°C.
R/
W•CS•ADDR•EN
DB7...DB0
RS
D
GND1
R/W•CS•ADDRESS
V
INPUT
REGISTER
DD1
Figure 1. Equivalent DAC Channel
V
LD
DD2VREFVCC
16 x 8
DAC
REGISTERS
AD8600
D
GND2
V
DD2
DAC
REGISTER
D
GND2
LD•EN
RS
8-BIT
DAC
DACGND
DACGND
16
V
REF
R-2R
DAC
O0
O1
O2
O3
O4
O5
O6
O7
O8
S
O9
O10
O11
O12
O13
O14
O15
V
EE
V
CC
O
X
V
EE
*Patent pending.
REV. 0
Information furnished by Analog Devices is believed to be accurate and
reliable. However, no responsibility is assumed by Analog Devices for its
use, nor for any infringements of patents or other rights of third parties
which may result from its use. No license is granted by implication or
otherwise under any patent or patent rights of Analog Devices.
One Technology Way, P.O. Box 9106, Norwood. MA 02062-9106, U.S.A.
Tel: 617/329-4700 Fax: 617/326-8703
AD8600–SPECIFICATIONS
(@ V
= V
SINGLE SUPPLY
DD1
= VCC = +5 V ± 5%, V
DD2
ParameterSymbolConditionMinTypMaxUnits
STATIC PERFORMANCE
ResolutionN8Bits
Relative Accuracy
2
Differential Nonlinearity
Full-Scale VoltageV
Full-Scale TempcoTCV
Zero Scale ErrorV
Reference Input ResistanceR
ANALOG OUTPUT
Output Voltage Range
Output CurrentI
Capacitive LoadC
1
2
2
INL–1±1/2+1LSB
DNLGuaranteed Monotonic–1±1/4+1LSB
FS
ZSE
V
ZSE
REF
OVR
OUT
L
Data = FF
Data = FF
FS
Data = 00H, RS = “0,” TA= +25°C+3.5LSB
Data = 00H, RS = “0”+5LSB
Data = AB
Slew RateSRFor ∆V
Voltage Output Settling Time
Voltage Output Settling Time2t
OH
OL
2
t
S1
S2
IOH = –0.4 mA3.5V
IOL = 1.6 mA0.4V
REF
±1 LSB of Final Value, Full-Scale Data Change2µs
±1 LSB of Final Value, ∆V
POWER SUPPLIES
V
Positive Supply CurrentI
Logic Supply CurrentsI
Power DissipationP
CC
DD1&2
DISS
= 5 V, VIL = 0 V, No Load2435mA
IH
V
= 5 V, VIL = 0 V, No Load0.1mA
IH
V
= 5 V, VIL = 0 V, No Load120175mW
IH
Power Supply SensitivityPSS∆VCC = ±5%0.007%/%
Logic Power Supply RangeV
Positive Power Supply Range3V
NOTES
1
When V
2
Single supply operation does not include the final 2 LSBs near analog ground. If this performance is critical, use a negative supply (VEE) pin of at least –0.7 V to
–5.25 V. Note that for the INL measurement zero-scale voltage is extrapolated using codes 7
3
Guaranteed by design not subject to production test.
ResolutionN8Bits
Total Unadjusted ErrorTUEAll Other DACs Loaded with Data = 55
Relative AccuracyINL–1±1/2+1LSB
Differential NonlinearityDNLGuaranteed Monotonic–1±1/4+1LSB
Full-Scale VoltageV
Full-Scale Voltage ErrorV
FS
FSE
Full-Scale TempcoTCV
Zero Scale ErrorV
Zero Scale ErrorV
Zero Scale ErrorV
ZSE
ZSE
ZSE
Zero Scale TempcoTCV
Reference Input ResistanceR
Reference Input Capacitance2C
REF
REF
Data = FFH, V
Data = FFH, V
Data = FFH, V
FS
Data = 00H, RS = “0,” TA = +25°C–2±1+2 mV
Data = 00H, All Other DACs Data = 00
Data = 00H, All Other DACs Data = 55
Data = 00H, VCC = +5 V, VEE = –5 V±10µV/°C
ZS
Data = AB
Data = AB
ANALOG OUTPUT
V
Output Voltage RangeOVR
Output Voltage Range
Output CurrentI
Capacitive Load
Reference In BandwidthBW–3 dB Frequency, V
Slew RateSRFor ∆ V
Voltage Noise Densitye
Digital FeedthroughFTDigital Inputs to DAC Outputs10nVs
Voltage Output Settling Time
Voltage Output Settling Time3t
N
3
t
S1
S2
f = 1 kHz, V
±1 LSB of Final Value, FS Data Change12µs
±1 LSB of Final Value, ∆V
Clock (
Data Setup Timet
Data Hold Timet
Address Setup Timet
Address Hold Timet
Valid Address to Data Validt
Load Enable Setup Timet
Load Enable Hold Timet
Read/Write to Clock (
Read/Write to DataBus Hi-Zt
Read/Write to DataBus Activet
EN) to Read/Writet
Clock (
EN) to Chip Selectt
Clock (
Chip Select to Clock (
Chip Select to Data Validt
Chip Select to DataBus Hi-Zt
Reset Pulse Widtht
NOTES
1
Guaranteed by design not subject to production test.
2
All logic input signals have maximum rise and fall times of 2 ns.
Specifications subject to change without notice.
1, 2
CLK
CH
CL
DS
DH
AS
AH
AD
LS
EN)t
EN)t
LH
RWC
RWZ
RWD
TWH
TCH
CSC
CSD
CSZ
RS
Data Loading12.5MHz
= –5 V, V
EE
= +3.500 V, –40°C ≤ TA ≤ +85°C,
REF
40ns
40ns
40ns
10ns
0ns
0ns
160ns
0ns
0ns
30ns
120ns
120ns
0ns
0ns
30ns
120ns
150ns
25ns
R/W
DATA
ADDR
EN
CS
t
RWZ
t
t
RWC
AS
t
DS
t
CSC
Figure 2. Write Timing
R/W
t
TWH
t
DH
t
AH
t
CH
t
CL
t
TCH
HIGH-Z
DATA
ADDR
EN
CS
HIGH -Z
t
t
RWD
CSD
t
AD
t
CSZ
Figure 3. Readback Timing
LD
t
LS
EN
RS
OUT
t
LH
t
RS
t
S1
t
S1
Figure 4. Write to DAC Register & Voltage Output Settling
16DB0Data Bit Zero I/O (LSB)
17DB1Data Bit I/O
18DB2Data Bit I/O
19DB3Data Bit I/O
20DB4Data Bit I/O
21DB5Data Bit I/O
22DB6Data Bit I/O
23DB7Most Significant Data Bit I/O (MSB)
24A0Address Bit Zero (LSB)
25A1Address Bit
26A2Address Bit
27A3Most Significant Addr Bit (MSB)
28R/
29
30
31
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection.
Although the AD8600 features proprietary ESD protection circuitry, permanent damage may
occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD
precautions are recommended to avoid performance degradation or loss of functionality.
REV. 0
–5–
WARNING!
ESD SENSITIVE DEVICE
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