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Low power: 4 mW
Low input leakage current: −1.5 pA typical
Low input referred noise (QNI): 993 e
Linearity error: 0.03% typical
Compact 17 mm × 17 mm BGA
Selectable filter time constants
4 selectable input charge ranges
10 selectable gain ranges
APPLICATION
High performance digital X-ray systems
Medical X-ray
Security (baggage scanner) systems
and LF noise
OS
−
rms typical
GENERAL DESCRIPTION
The AD8488 is a 128-channel, analog front end (AFE) designed for
use in high performance digital X-ray systems. The analog channels
consist of an integrator followed by a gain selectable single-ended
to low impedance differential output. The analog channel converts
the charge acquired by X-ray or photodiode detectors to a voltage.
The channels are composed of CMOS transistors, using typical
high input impedance CMOS gates. The integrators generate charge
dependent voltages using a range of selectable capacitance values that
accommodate a broad range of input charge values. The integrators
are followed by single-ended input to differential output voltage
amplifiers where offset and low frequency noise voltages are
subtracted from the input voltages. A 128:1 channel differential
MUX follows the buffers and drives the analog output buffer.
Switch drivers and certain digital timing functions are included, and
all are mounted on a 255-lead BGA substrate. Charge conversion
for all 128 channels is simultaneous followed by a sequential voltage
output read of the channels using a 7-bit address code. The sequence
occurs twice, sampling all 128 channels. Logic control inputs,
CS_B
and
, select the lower and upper 64 blocks of the channel
addresses.
The AD8488 is packaged in a 17 mm × 17 mm, 255-lead, RoHScompliant ball grid array (BGA). The operating temperature range
is 0°C to 85°C ambient.
FUNCTIONAL BLOCK DIAGRAM
128-Channel
CS_A
responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other
rights of third parties that may result from its use. Specifications subject to change without notice. No
Figure 1.
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Tel: 781.329.4700
www.analog.com
AD8488 Data Sheet
TABLE OF CONTENTS
Features ...................................................................................................1
Normal 0.03 + 1 % + LSB
Low Power 0.2 + 8.2 % + LSB
OPERATING TEMPERATURE Ambient, normal and low power 0 85 °C
1
Defined as the output voltage divided by the input charge (number of electrons in this case) with the gain amp setting (G = 1). This includes the gain error of the gain amp.
2
Each gain at G = 2, G = 4, G = 8, and G = 10 is calculated as the ratio of each output voltage to that at G = 1. Each measurement corresponds to the selection of each gain
setting capacitor.
3
Gain deviation over temperature.
4
The output noise voltage is measured and converted into the input referred noise electrons.
5
It is defined as the deviation from a best fit line, including the origin. The output voltage is measured with five different input conditions.
CF1 = 0.9 pF, G = 10
= 38 pF 993 e−rms
PAN EL
= 61 pF 2000 e−rms
PAN EL
Rev. A | Page 4 of 20
Data Sheet AD8488
Supply (AVDD, DVDD)
5.5 V
50°C
14.0
0.53
7.7
4.4
°C/W
25°C
21.2
0.15
8.3
4.4
°C/W
50°C
16.2
0.29
8.1
4.4
°C/W
ABSOLUTE MAXIMUM RATINGS
Table 2.
Parameter Rating
Voltage
Charge Input IN0 to IN127 −0.3 V to VREF + 0.3 V
Reference (VREF, VREF_ESD) 5.5 V
Logic Inputs −0.3 V to +5.5 V
Maximum Junction Temperature 125°C
Storage Temperature Range −30°C to +150°C
Input Charge to Integrator Channels 20 pC
Stresses above those listed under Absolute Maximum Ratings may
cause permanent damage to the device. This is a stress rating only;
functional operation of the device at these or any other conditions
above those indicated in the operational section of this
specification is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device
reliability.
THERMAL DATA
ΨJB is the junction-to-board thermal characterization parameter
with a unit of °C/W. The Ψ
and calculation using a 4-layer board. The JESD51-12, Guidelines for Reporting and Using Package Thermal Information, states that
thermal characterization parameters are not the same as thermal
resistances. Ψ
measures the component power flowing through
JB
multiple thermal paths rather than a single path, as in thermal
resistance, θ
. Therefore, ΨJB thermal paths include convection
JB
from the top of the package as well as radiation from the package,
factors that make Ψ
JB
Maximum junction temperature (T
temperature (T
T
= TB + (PD × ΨJB)
J
) and power dissipation (PD) using the formula
B
Refer to JESD51-8 and JESD51-12 for more detailed information
about Ψ
AGND See Table 6 and Table 7 O Analog Power Ground (0 V).
AVDD F6, F7, F8, F9, F10, G6, G11, H6, H11, H12, J6,
J11, K6, K11, L6, L8, L9, L10, L11
CLK D15 I Clock for Mux Operation.
CK_ENa E14 I Clock Gate for Channel 0 to Channel 63.
CK_ENb F14 I Clock Gate for Channel 64 to Channel 127.
N14 I Logic Level to Enable Channel 0 to Channel 63.
CS_A
M15 I Logic Level to Enable Channel 64 to Channel 127.
CS_B
CF1SEL0,
B15, C15 I Binary Coded Logic Pins to Select One of Four Values of Integrator
DVDD B16, C16, D16, E16, F15, L15, M16, N16, P16, R16 I Power Supply for Digital Circuit (5 V).
FSEL0, FSEL1 R14, T14 I Filter Time Constant Select (see Table 10).
GNSEL0 to
A14, B14, C14, D14 I Gain Select for the Gain Amp. Select one of four hold capacitors. The
GNSEL3
GRST H14 I Gain Amp Reset. Closes the switch across Integrator Capacitor CF2
HOLD T16 I Gain Amp Hold. Connect the hold capacitor to the signal chain.
four values are arranged in one of ten parallel options to establish ten
gain values (see Table 11).
setting the output of the gain amplifier to zero.
Rev. A | Page 7 of 20
AD8488 Data Sheet
A16 I Reset Gray Mode Counter for Mux.
Mnemonic Pin No. I/O Description
IN0 to IN127 See Table 6 and Table 7 I Analog Inputs.
IRST E15 I Integrator Reset. Closes a switch across the integration capacitor, CF1,
to set the output to zero.
NC A13, A15, B13, C13, D13, E10, E12, E13, F11,
F13, G13, H13, J12, J13, K13, L13, M12, M13,
N13, P13, R13, T13
OUTLO W F12 O Inverting Analog Output (Negative) of the Differential Output.
OUTHIGH G12 O Noninverting Analog Output (Positive) of the Differential Output.
PWR P14 I Normal state is logic low; reduces analog bias current by approximately
RST
TST_MODE J14 I Test Mode Enable. This control line is used together with the TST0 to
TST0 to TST6 T15, R15, P15, N15, M14, L14, K14 I Channel Address Select Bits When in Test Mode (see Table 8).
VREF L12 I Reference Input for Analog Circuit (2.048 V).
VREF_ESD K12 I ESD Reference. Connect to VREF (2.048 V).
G14 I Write Digital Instruction Word to the AFE.
WR
No connect. Connect these pins to GND on the PCB.
80% when high.
TST6 address bits to test or debug a system by continuously selecting a
channel.
Rev. A | Page 8 of 20
Data Sheet AD8488
A7
IN110
A11
IN119
B3
IN101
B11
IN120
C7
IN81
C11
IN121
D3
IN89
D7
IN85
D15
CLK
E11
IN122
E15
IRST
F7
AVDD
F15
DVDD
G3
IN71
G11
AVDD
H3
IN65
H15
DGND
J3
IN61
J11
AVDD
J15
DGND
K7
AGND
L3
IN53
L7
AGND
L15
DVDD
M7
AGND
M11
AGND
N3
IN45
N11
IN0
R3
IN27
R7
IN23
R15
TST1
T11
IN2
T15
TST0
SIGNAL MNEMONICS
Table 6. 255-Ball CSP_BGA Ball Assignment (Numerically by Ball Number)
Figure 5. Input Referred Noise (QNI) vs. Channel, C
Figure 6. Gain vs. Channel for Four Values of Gain
PANEL
= 38 pF, T
CASE
= 40°C
Rev. A | Page 11 of 20
Figure 8. Input Referred Noise (QNI) vs. Temperature
Figure 9. Gain Drift vs. Channel for Various Temperature Spans
AD8488 Data Sheet
0
0.12
CHANNEL NUMBER
100908070605010403020130120110
PERCENTAGE OF OUTPUT STEP (%)
0.10
0.08
0.06
0.04
0.02
0
–0.02
–0.04
–0.06
–0.08
–0.10
–0.12
G = 5V/V
CF1 = 0.9pF
T
CASE
= 30°C
F
SEL
= 160k
V
IN
= 0 TO –4.16mV
09801-010
0100908070605010403020130120110
1
0
2
3
4
5
–5
CHANNEL NUMBER
–1
–2
–3
–4
ANALOG INPUT LE AKAGE (pA)
G = 10V/V
CF1 = 0.9pF
T
CASE
= 30°C
C
PANEL
= 38pF
09801-011
2
0
–2
0
4
6
8
10
CHANNEL NUMBER
100908070605010403020130120110
–10
–8
–6
–4
CF1 = 0.45p F
CF1 = 7.0p F
CF1 = 3.5p F
CF1 = 0.9p F
G = 1V/V
T
CASE
= 30°C
C
PANEL
= 38pF
V
IN
= 0V
V
OS
(mV)
09801-012
0
0.10
CHANNEL NUMBER
100908070605010403020130120110
PERCENT OF OUTPUT STEP (%)
0.08
0.06
0.04
0.02
0
–0.02
–0.04
–0.06
–0.08
–0.10
G = 5V/V
CF1 = 0.9pF
T
CASE
= 30°C
F
SEL
= 160k
V
IN
= 0 TO –4.16mV
09801-013
180
0
140
160
200
220
240
260
T
CASE
(°C)
320
300
280
605010403020
340
60
80
100
120
IAVDD
NORMAL PO WER
LOW POWER
65
SUPPLY CURRENT (mA)
09801-014
0
TEMPERATURE (°C)
605010403020
–5.5
G = 10V/V
CF1 = 7 pF
T
CASE
= 30°C
C
PANEL
= 38pF
V
IN
= 0V
DIFFERENTIAL OFFSET VOLTAGE (mV)
–5.6
–5.7
–5.8
–5.9
–6.0
–6.1
–6.2
–6.3
–6.4
–6.5
09801-015
Figure 10. Adjacent Channel Crosstalk as Measured by the Percent of Output
Step for Each Channel
Figure 13. Crosstalk from All Nonadjacent Channels as Measured by the
Percent of Output Step for Each Channel
Figure 11. Input Leakage vs. Channel
Figure 12. Differential Offset Voltage vs. Channel for Four Values of CF1
Figure 14. Supply Current vs. Temperature (T
CASE
)
Figure 15. Differential Offset Voltage vs. Temperature
Rev. A | Page 12 of 20
Data Sheet AD8488
IN0 TO IN127
+
–
+
–
SWIRST
SWHOLD
TO
MUX
VREF
INTEGRATOR
GAIN
AMPLIFIER
CM
SWHOLD
SWGRST
SWGRST
CFx: FEE DBACK CAP ACITOR
C
H
: HOLD CAPACITOR
GNSEL0
TO
GNSEL3
GNSEL0
TO
GNSEL3
R1 (×4)
R1 (×4)
CF1 (×4)
CF2 = 0.5p F
CF2 = 0.5p F
09801-017
CH (×4)
C
H
(×4)
THEORY OF OPERATION
OVERVIEW
The AD8488 is a 128-channel AFE intended for interfacing thin film
transistor (TFT) detector panel arrays in various digital X-ray
applications (see Figure 1). The device includes a 128 dual stage,
charge conversion amplifiers, internal timing, and control circuitry,
a 128:1 differential output multiplexer, and an analog output buffer.
Only the detector panel and a minimal amount of analog circuitry are
required to complete a 128-channel analog X-ray interface. The
AD8488 AFE is packaged in a compact, 17 mm × 17 mm,
255-lead BGA.
Analog Amplifier
The AD8488 analog inputs are suitable for ac or dc connection to
128 X-ray detector panel outputs. The analog amplifier consists of
two stages: an integrator followed by a correlated double sampling
gain amplifier. Figure 16 is a simplified block diagram showing the
basic elements of an analog channel.
The characteristic CMOS high gate impedance of the integrator
minimizes source loading. Prior to sampling a gate line, all 128 mux
analog channels are initialized with
During the 6.1 µs GRST period, the gain amplifier acquires the
reference level (2.048 V) and any low frequency ambient noise.
Just prior to gate sampling, both op amps are unlocked and the
feedback capacitors, CF1 and CF2, are connected. When a TFT gate
line is activated (reference the bottom signal, TFT_GATE, in
Figure 17), the charge of each detector cell is applied simultaneously
RST
, as shown in Figure 17.
to all 128 MOSFET integrator circuits, which begin to ramp over a
12 µs interval. As seen in Figure 16, the op amps are biased at the
reference voltage, plus offset and low frequency noise error voltages.
Together, the resultant differential output voltage comprises the
CDS or correlated double sampled composite. Following the sampling
period, the pixel charges are stored, and the charge is held for the
next 133 clock cycles while the 128 channels are muxed and sampled
sequentially. As the channels are selected in sequence, their outputs
are applied to a dual channel, high precision, current feedback, high
frequency op amp. The AD8488 was designed to drive an ADC such
as the AD9244 differential input high speed converter.
The mux channels are enabled and selected by the timing inputs,
CK_ENa and CK_ENb. These two signals gate the clock and internal
counter that actually selects the mux channel. The multiplexers must
be read sequentially as one interprets from the CK_ENa and CK_ENb
lines in Figure 17. The read time for each channel is 1 clock cycle. The
timing signals, GATED CLKa and GATED CLKb, are developed
internally and are shown in Figure 17 for reference only.
Troubleshooting Channels
Using the TST_MODE enable pin, individual channels are accessible
for troubleshooting. Referring to Ta ble 8 , the channel address follows
two initialization words, 0x01 and 0x02, while the enable pin,
TST_MODE, is asserted high.
Figure 16. Block Diagram of an Integrator Channel
Rev. A | Page 13 of 20
AD8488 Data Sheet
RST
t
DELAY3 (SEE NOTE 3)
t
DELAY3 (SEE NOTE 3)
67 CLKS
t
DELAY2
(SEE NOTE2)
67 CLKS
t
CLK (SEE NOTE 1)
t
DELAY2 (SEE NOTE 2)
NOTES
1. IN THIS EXAMPLE
t
CLK
= 67ns (15MHz) .
2. ¼ CLK <
t
DELAY2
< ½ CLK.
3. 0 CLK <
t
DELAY3
< ¼ CLK.
4.
t
GATE
=
t
GRST
+
t
INT
+
t
READ
= 27µs.
5. ALL LOGIC LEVELS EXCEPT RST ARE ACTIVE HIGH.
6. SHOW N AS ACTIVE HI GH – CHARGE IS TRANSFERRED TO ALL CHANNELS DURI NG THIS INTERVAL .
IRST
GRST
HOLD
CLK
CK_ENa
GATED CL Ka
CK_ENb
GATED CL Kb
TFT_GATE
(SEE NOTE 5)
t
INT
(12µs)
≥6µs
t
CLK (SEE NOTE 1)
≥ 67ns
1 GATE LINE:
t
GATE
(27ms) (WI TH 15MHz CLO CK; S E E NOTE 4)
18.1µs
t
READ
(133 CLKS)
t
IRST
(130 CLKS)
09801-018
t
GRST
≥ 6.1µs
TIMING SIGNALS
Figure 17 is the gate line timing diagram. The gate line sequence
requires 405 clock cycles for channel integration and the sequential
transfer to an ADC. The timing signals, IRST, GRST, and HOLD,
control the integration, gain, and hold switches, respectively, and
define the timing intervals required by each of the integrator
channels. These signals may be generated by an FPGA, ROM,
or similar device.
The balance of the signals shown in Figure 16 are user discretionary
and encoded according to Table 8 through Ta b l e 11 for select gain,
hold capacitor values, low-pass filter values, and mux output channels
for troubleshooting.
Timing Notes
Refer to Figure 17 and the following timing notes:
1. The CLK frequency can range from 1 MHz to 15 MHz.
RST
2.
must be low (active) for the first half clock of the gate
line cycle.
3. t
4. t
must be ≥ 6.1 µs.
GRST
must be ≥ 12 µs.
INT
5. The CK_ENa and CK_ENb intervals must be exactly 67
clocks. The time can be longer if t
6. The t
interval must be exactly 130 CLKs.
IRST
exceeds 67 ns.
CLK
Figure 17. Gate Line Timing Diagram
Rev. A | Page 14 of 20
Data Sheet AD8488
0 0 0 1 1 0 0
5
0 0 1 1 1 1 0
17
0 1 1 0 1 1 1
34
APPLICATIONS INFORMATION
CONTROL REGISTER BIT MAPS
Table 8. Mux Switch Test Register Address Bits, Addresses Valid When TST = High