−3 dB bandwidth of 2.2 GHz (AV = 10 dB)
Single resistor gain adjust: 3 dB ≤ A
Single resistor and capacitor distortion adjust
Input resistance: 3 kΩ, independent of gain (A
Differential or single-ended input to differential output
Low noise input stage: 2.7 nV/√Hz RTI @ AV = 10 dB
Low broadband distortion
190 MHz: −81 dBc HD2, −87 dBc HD3
OIP3 of 41 dBm @ 150 MHz
Slew rate: 8 V/ns
Fast settling and overdrive recovery of 2 ns
Single-supply operation: 3 V to 5.0 V
Low power dissipation: 37 mA @ 5 V
Power down capability: 5 mA @ 5 V
Fabricated using the high speed XFCB3 SiGe process
APPLICATIONS
Differential ADC drivers
Single-ended to differential conversion
RF/IF gain blocks
SAW filter interfacing
≤ 25 dB
V
)
V
Differential RF/IF Amplifier
AD8352
FUNCTIONAL BLOCK DIAGRAM
ENB
RGP
RDP
C
D
R
G
60
–65
–70
–75
–80
HD3 (dBc)
–85
–90
VIP
R
D
VIN
RDN
RGN
BIAS CELL
+
–
AD8352
Figure 1.
VCM
VCC
VOP
VON
GND
5728-001
44
42
40
38
36
IP3 (dBm)
34
32
GENERAL DESCRIPTION
The AD8352 is a high performance differential amplifier
optimized for RF and IF applications. It achieves better than
80 dB SFDR performance at frequencies up to 200 MHz, and
65 dB beyond 500 MHz, making it an ideal driver for high
speed 12-bit to 16-bit analog-to-digital converters (ADCs).
Unlike other wideband differential amplifiers, the AD8352 has
buffers that isolate the gain setting resistor (R
inputs. As a result, the AD8352 maintains a constant 3 kΩ input
resistance for gains of 3 dB to 25 dB, easing matching and input
drive requirements. The AD8352 has a nominal 100 Ω differential
output resistance.
Rev. A
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Anal og Devices for its use, nor for any infringements of patents or ot her
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarks and registered trademarks are the property of their respective owners.
) from the signal
G
–95
–100
406080 100 120 140 160 180 200
20220
FREQUENCY (MHz)
Figure 2. IP3 and Third Harmonic Distortion vs. Frequency,
Measured Differentially
The device is optimized for wideband, low distortion performance at frequencies beyond 500 MHz. These attributes, together
with its wide gain adjust capability, make this device the amplifier
of choice for general-purpose IF and broadband applications
where low distortion, noise, and power are critical. In particular,
it is ideally suited for driving not only ADCs, but also mixers,
pin diode attenuators, SAW filters, and multielement discrete
devices. The device is available in a compact 3 mm × 3 mm,
16-lead LFCSP package and operates over a temperature range
of −40°C to +85°C.
VS = 5 V, RL = 200 Ω differential, RG = 118 Ω (AV = 10 dB), f = 100 MHz, T = 25°C; parameters specified differentially (in/out), unless
otherwise noted. C
Table 1.
Parameter Conditions Min Typ Max Unit
DYNAMIC PERFORMANCE
−3 dB Bandwidth AV = 6 dB, V
A
A
Bandwidth for 0.1 dB Flatness 3 dB ≤ AV ≤ 20 dB, V
Bandwidth for 0.2 dB Flatness 3 dB ≤ AV ≤ 20 dB, V
Gain Accuracy Using 1% resistor for RG, 0 dB ≤ AV ≤ 20 dB ±1 dB
Gain Supply Sensitivity VS ± 5% 0.06 dB/V
Gain Temperature Sensitivity −40°C to +85°C 4 mdB/°C
Slew Rate RL = 1 kΩ, V
R
Settling Time 2 V step to 1% <2 ns
Overdrive Recovery Time VIN = 4 V to 0 V step, V
Reverse Isolation (S12) −80 dB
INPUT/OUTPUT CHARACTERISTICS
Common-Mode Nominal VCC/2 V
Voltage Adjustment Range 1.2 to 3.8 V
Maximum Output Voltage Swing 1 dB compressed 6 V p-p
Output Common-Mode Offset Referenced to VCC/2 −100 +20 mV
Output Common-Mode Drift −40°C to +85°C 0.25 mV/°C
Output Differential Offset Voltage −20 +20 mV
CMRR 57 dB
Output Differential Offset Drift −40°C to +85°C 0.15 mV/°C
Input Bias Current ±5 μA
Input Resistance 3 kΩ
Input Capacitance (Single-Ended) 0.9 pF
Output Resistance 100 Ω
Output Capacitance 3 pF
POWER INTERFACE
Supply Voltage 3 5 5.5 V
ENB Threshold 1.5 V
ENB Input Bias Current ENB at 3 V 75 nA
ENB at 0.6 V −125 μA
Quiescent Current ENB at 3 V 35 37 39 mA
ENB at 0.6 V 5.3 mA
and RD are selected for differential broadband operation (see Tabl e 5 and Ta b le 6 ).
D
≤ 1.0 V p-p 2500 MHz
OUT
= 10 dB, V
V
= 14 dB, V
V
= 200 Ω, V
L
≤ 1.0 V p-p 2200 MHz
OUT
≤ 1.0 V p-p 1800 MHz
OUT
≤ 1.0 V p-p 190 MHz
OUT
≤ 1.0 V p-p 300 MHz
OUT
= 2 V step 9 V/ns
OUT
= 2 V step 8 V/ns
OUT
≤ ±10 mV <3 ns
OUT
Rev. A | Page 3 of 20
AD8352
NOISE DISTORTION SPECIFICATIONS
VS = 5 V, RL = 200 Ω differential, RG = 118 Ω (AV = 10 dB), V
otherwise noted. C
and RD are selected for differential broadband operation (see Tabl e 5 and Ta b le 6 ). See the Applications section for
D
single-ended to differential performance characteristics.
Noise Spectral Density (RTI) +2.7 nV/√Hz
1 dB Compression Point (RTO) +13.9 dBm
1
When using the evaluation board at frequencies below 50 MHz, replace the Output Balun T1 with a transformer such as Mini-Circuits® ADT1-1WT to obtain the low
frequency balance required for differential HD2 cancellation.
2
CD and RD can be optimized for broadband operation below 180 MHz. For operation above 300 MHz, CD and RD components are not required.
= 2 V p-p −82/−85 dBc
OUT
= 2 V p-p −81/−87 dBc
OUT
−83 dBc
−81 dBc
= 2 V p-p −82/−76 dBc
OUT
= 2 V p-p −80/−73 dBc
OUT
−85 dBc
−77 dBc
= 2 V p-p −72/−68 dBc
OUT
= 2 V p-p −74/−69 dBc
OUT
−74 dBc
−70 dBc
= 2 V p-p −71/−64 dBc
OUT
−61 dBc
Rev. A | Page 5 of 20
AD8352
ABSOLUTE MAXIMUM RATINGS
Table 3.
Parameter Rating
Supply Voltage VCC 5.5 V
VIP, VIN VCC + 0.5 V
Internal Power Dissipation 210 mW
θ
JA
Maximum Junction Temperature 125°C
Operating Temperature Range −40°C to +85°C
Storage Temperature Range −65°C to +150°C
Lead Temperature (Soldering 60 sec) 300°C
91.4°C/W
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
ESD CAUTION
Rev. A | Page 6 of 20
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