0.5 mV Typical Input Offset Voltage
Small Packaging
SOIC-8, MSOP, and SC70 Packages Available
Hz Input Voltage Noise
√
Hz Input Inverting Current Noise
√
High Speed Amplifiers
AD8007/AD8008
CONNECTION DIAGRAMS
SOIC (RN-8)SC70 (KS-5)
AD8007
1
NC
(Top View)
2
–IN
3
+IN
–V
4
S
NC = NO CONNECT
8
NC
7
+V
6
V
5
NC
SOIC (RN) and MSOP (RM)
1
V
OUT1
–IN1
27
36
+IN1
–V
45
S
S
OUT
AD8008
(Top View)
V
1
OUT
–V
2
S
3
+IN
8
+V
V
–IN2
+IN2
AD8007
(Top View)
S
OUT2
5
+V
S
4
–IN
APPLICATIONS
Instrumentation
IF and Baseband Amplifiers
Filters
A/D Drivers
DAC Buffers
GENERAL DESCRIPTION
The AD8007 (single) and AD8008 (dual) are high performance current feedback amplifiers with ultralow distortion
and noise. Unlike other high performance amplifiers, the low
price and low quiescent current allow these amplifiers to be
used in a wide range of applications. ADI’s proprietary second
generation eXtra-Fast Complementary Bipolar (XFCB)
process enables such high performance amplifiers with low
power consumption.
The AD8007/AD8008 have 650 MHz bandwidth, 2.7 nV/√Hz
voltage noise, –83 dB SFDR @ 20 MHz (AD8007), and –77 dBc
SFDR @ 20 MHz (AD8008).
With the wide supply voltage range (5 V to 12 V) and wide bandwidth, the AD8007/AD8008 are designed to work in a variety of
applications. The AD8007/AD8008 amplifiers have a low power
supply current of 9 mA/amplifier.
The AD8007 is available in a tiny SC70 package as well as a
standard 8-lead SOIC. The dual AD8008 is available in both
REV. C
Information furnished by Analog Devices is believed to be accurate and
reliable. However, no responsibility is assumed by Analog Devices for its
use, nor for any infringements of patents or other rights of third parties that
may result from its use. No license is granted by implication or otherwise
under any patent or patent rights of Analog Devices.
8-lead SOIC and 8-lead MSOP packages. These amplifiers are
rated to work over the industrial temperature range of –40°C
to +85°C.
Figure 1. AD8007 Second and Third Harmonic
Distortion vs. Frequency
G = +1, V
Bandwidth for 0.1 dB FlatnessVo = 0.2 V p-p, G = +2, R
Overdrive Recovery Time2.5 V Input Step, G = +2, R
Slew RateG = +1, V
Settling Time to 0.1%G = +2, V
= 0.2 V p-p, RL = 1 kΩ520580MHz
O
= 0.2 V p-p, RL = 150 Ω350490MHz
O
= 0.2 V p-p, RL = 150 Ω190260MHz
O
= 1 V p-p, RL = 1 kΩ270320MHz
O
= 2 V Step665740V/µs
O
= 2 V Step18ns
O
= 150 Ω72120MHz
L
= 1 kΩ30ns
L
Settling Time to 0.01%G = +2, VO = 2 V Step35ns
NOISE/HARMONIC PERFORMANCE
Second HarmonicfC = 5 MHz, VO = 1 V p-p–96/–95dBc
= 20 MHz, VO = 1 V p-p–83/–80dBc
f
Third Harmonicf
IMDf
Third Order Interceptf
C
= 5 MHz, VO = 1 V p-p–100dBc
C
f
= 20 MHz, VO = 1 V p-p–85/–88dBc
C
= 19.5 MHz to 20.5 MHz, RL = 1 kΩ,–89/–87dBc
C
V
= 1 V p-p
O
= 5 MHz, RL = 1 kΩ43.0dBm
C
= 20 MHz, RL = 1 kΩ42.5/41.5dBm
f
C
Crosstalk (AD8008)Output to Output f = 5 MHz, G = +2–68dB
Input Voltage Noisef = 100 kHz2.7nV/√Hz
Input Current Noise–Input, f = 100 kHz22.5pA/√Hz
+Input, f = 100 kHz2pA/√Hz
DC PERFORMANCE
Input Offset Voltage0.54mV
Input Offset Voltage Drift3µV/°C
Input Bias Current+Input48µA
–Input0.76µA
Input Bias Current Drift+Input15nA/°C
–Input8nA/°C
TransimpedanceV
= 1.5 V to 3.5 V, RL = 1 kΩ0.51.3MΩ
O
RL = 150 Ω0.40.6MΩ
INPUT CHARACTERISTICS
Input Resistance+Input4MΩ
Input Capacitance+Input1pF
Input Common-Mode Voltage Range1.1 to 3.9V
Common-Mode Rejection RatioVCM = 1.75 V to 3.25 V5456dB
Operating Temperature Range . . . . . . . . . . . –40°C to +85°C
Lead Temperature Range (soldering 10 sec) . . . . . . . . . 300°C
*Stresses above those listed under Absolute Maximum Ratings may cause perma-
nent damage to the device. This is a stress rating only; functional operation of the
device at these or any other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect device reliability.
MAXIMUM POWER DISSIPATION
The maximum safe power dissipation in the AD8007/AD8008
packages is limited by the associated rise in junction temperature
) on the die. The plastic encapsulating the die will locally reach
(T
J
the junction temperature. At approximately 150°C, which is the
glass transition temperature, the plastic will change its properties. Even temporarily exceeding this temperature limit may
change the stresses that the package exerts on the die, permanently shifting the parametric performance of the AD8007/
AD8008. Exceeding a junction temperature of 175°C for an
extended period of time can result in changes in the silicon
devices, potentially causing failure.
The still-air thermal properties of the package and PCB (θ
ambient temperature (T
package (P
) determine the junction temperature of the die.
D
), and the total power dissipated in the
A
),
JA
The junction temperature can be calculated as follows:
TT P
=+ ×
ADA
JJ
θ
()
The power dissipated in the package (PD) is the sum of the quiescent power dissipation and the power dissipated in the package
due to the load drive for all outputs. The quiescent power is the
voltage between the supply pins (V
(I
). Assuming the load (RL) is referenced to midsupply, the
S
total drive power is V
/2 ⫻ I
S
package and some in the load (V
) times the quiescent current
S
, some of which is dissipated in the
OUT
OUT
⫻I
). The difference
OUT
between the total drive power and the load power is the drive
power dissipated in the package.
P
= quiescent power + (total drive power – load power):
D
PVI
=×
()
DSS
+×
VVRV
SOUT
2
L
2
OUT
−
R
L
RMS output voltages should be considered. If RL is referenced
to V
, as in single-supply operation, then the total drive power
S
is V
⫻ I
OUT
.
S
If the rms signal levels are indeterminate, then consider the
worst case, when V
= VS/4 for RL to midsupply:
OUT
V
S
4
PVI
=×
()
DSS
+
R
L
2
In single-supply operation, with RL referenced to VS, worst case is:
V
V
OUT
S
=
2
Airflow will increase heat dissipation, effectively reducing θJA.
Also, more metal directly in contact with the package leads from
metal traces, through holes, ground, and power planes will
reduce the θ
. Care must be taken to minimize parasitic capaci-
JA
tances at the input leads of high speed op amps as discussed in
the board layout section.
Figure 2 shows the maximum safe power dissipation in the package versus the ambient temperature for the SOIC-8 (125°C/
W),
MSOP (150°C/W), and SC70 (210°C/W) packages on a
JEDEC standard 4-layer board. θ
2.0
1.5
MSOP-8
1.0
SC70-5
0.5
MAXIMUM POWER DISSIPATION – W
0
–60100–40
–20020406080
AMBIENT TEMPERATURE – ⴗC
values are approximations.
JA
SOIC-8
Figure 2. Maximum Power Dissipation vs.
Temperature for a 4-Layer Board
OUTPUT SHORT CIRCUIT
Shorting the output to ground or drawing excessive current for
the AD8007/AD8008 will likely cause catastrophic failure.
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate
on the human body and test equipment and can discharge without detection. Although the AD8007/
AD8008 features proprietary ESD protection circuitry, permanent damage may occur on devices
subjected to high energy electrostatic discharges. Therefore, proper ESD precautions are recommended
to avoid performance degradation or loss of functionality.
REV. C–4–
AD8007/AD8008
ORDERING GUIDE
ModelTemperature Range
AD8007AR+85ºC8-Lead SOICRN-8
AD8007AR-REEL+85ºC8-Lead SOICRN-8
AD8007AR-REEL7+85ºC8-Lead SOICRN-8
AD8007AKS-REEL+85ºC5-Lead SC70KS-5HTA
AD8007AKS-REEL7–40ºC to +85ºC5-Lead SC70KS-5HTA
AD8008AR –40ºC to +85ºC8-Lead SOICRN-8
AD8008AR-REEL7 –40ºC to +85ºC8-Lead SOICRN-8
AD8008AR-REEL –40ºC to +85ºC8-Lead SOICRN-8
AD8008ARM-REEL+85ºC8-Lead MSOPRM-8H2B
AD8008ARM-REEL7+85ºC8-Lead MSOPRM-8H2B
TPC 35. AD8008 Crosstalk vs. Frequency (Output to Output)
–30
–40
CMRR – dB
–50
–60
REV. C
–70
100k
1M
FREQUENCY – Hz
TPC 33. CMRR vs. Frequency
10M
100M1G
TPC 36. PSRR vs. Frequency
–11–
AD8007/AD8008
R
G = ⴙ1
= 150⍀, VS = ⴙ5V AND ⴞ5V
L
G = +2
R
= 150⍀, VS = +5V AND 5V
L
R
= 1k⍀, VS = ⴙ5V AND ⴞ5V
L
50mV/DIV
010
20304050
TIME – ns
TPC 37. Small Signal Transient Response for
= 150Ω, 1 kΩ and VS = +5 V, ±5 V
R
L
G = +1
1V/DIV
R
L
R
= 150⍀
= 1k⍀
L
RL = 1k⍀, VS = +5V AND 5V
50mV/DIV
01020304050
TIME – ns
TPC 40. Small Signal Transient Response for
R
= 150 Ω, 1 kΩ and VS = +5 V, ±5 V
L
G = –1
INPUT
OUTPUT
1V/DIV
01020304050
TIME – ns
TPC 38. Large Signal Transient Response for
R
= 150 Ω, 1 k
L
G = ⴙ2
010 20304050
1V/DIV
Ω
C
= 0pF
LOAD
C
= 10pF
LOAD
C
= 20pF
LOAD
TIME – ns
TPC 39. Large Signal Transient Response
for Capacitive Load = 0 pF, 10 pF, and 20 pF
010203040 50
TIME – ns
TPC 41. Large Signal Transient Response, G = –1,
R
= 150
L
Ω
499⍀
200⍀
49.9⍀
50mV/DIV
CL = 0pF
CL = 20pF
499⍀
–
+
C
LOAD
TIME – ns
CL = 20pF
= 10⍀
R
SNUB
R
SNUB
G = ⴙ2
010 20304050
TPC 42. Small Signal Transient Response: Effect of
Series Snub Resistor when Driving Capacitive Load
REV. C–12–
ⴙV
AD8007/AD8008
4
G = ⴙ2
S
RL = 1k⍀
3
2
G = +10
V
= 5V
S
= 0.75V
V
IN
RL = 150⍀
OUTPUT (2V/DIV)
ⴚV
S
0100200
INPUT (1V/DIV)
TIME – ns
300400500
TPC 43. Output Overdrive Recovery, RL = 1 kΩ,
Ω
, VIN = ±2.5 V
150
0.5
0.4
0.3
0.2
0.1
0
ⴚ0.1
ⴚ0.2
SETTLING TIME – %
ⴚ0.3
ⴚ0.4
ⴚ0.5
0
18ns
51015202530354045
TIME – ns
G = +2
1
– V
0
OUT
V
–1
–2
–3
–4
TPC 45. V
=±0.75 V
V
IN
2000
Swing vs. R
OUT
400600
RL – ⍀
LOAD
8001000
, VS=±5 V, G = +10,
TPC 44. 0.1% Settling Time, 2 V Step
REV. C
–13–
AD8007/AD8008
THEORY OF OPERATION
The AD8007 (single) and AD8008 (dual) are current feedback
amplifiers optimized for low distortion performance. A simplified
conceptual diagram of the AD8007 is shown in Figure 3. It closely
resembles a classic current feedback amplifier comprised of a
complementary emitter-follower input stage, a pair of signal mirrors, and a diamond output stage. However, in the case of the
AD8007/AD8008, several modifications have been made to greatly
improve the distortion performance over that of a classic current
feedback topology.
+V
Q5
Q6
OUT
S
–V
S
IN+
M1
I
–
I
–
1
CJ1
+V
D1
D2
I
–
2
Q1
IN–
I
DI
Q2
S
HiZ
–V
S
CJ2
M2
R
G
3
Q3
I
DO
Q4
–
I
4
R
F
Figure 3. Simplified Schematic of AD8007
The signal mirrors have been replaced with low distortion, high
precision mirrors. They are shown as “M1” and “M2” in Figure 3.
Their primary function from a distortion standpoint is to greatly
reduce the effect of highly nonlinear distortion caused by capacitances C
1 and CJ2. These capacitors represent the collector-to-base
J
capacitances of the mirrors’ output devices.
A voltage imbalance arises across the output stage, as measured
from the high impedance node “HiZ” to the output node “Out.”
This imbalance is a result of delivering high output currents and
is the primary cause of output distortion. Circuitry is included
to sense this output voltage imbalance and generate a compensating
current “I
.” When injected into the circuit, IDO reduces the
DO
distortion that would be generated at the output stage. Similarly,
the nonlinear voltage imbalance across the input stage (measured
from the noninverting to the inverting input) is sensed, and a current “I
” is injected to compensate for input-generated distortion.
DI
The design and layout are strictly top-to-bottom symmetric in
order to minimize the presence of even-order harmonics.
USING THE AD8007/AD8008
Supply Decoupling for Low Distortion
Decoupling for low distortion performance requires careful
consideration. The commonly adopted practice of returning the
high frequency supply decoupling capacitors to physically separate (and possibly distant) grounds can lead to degraded
even-order harmonic performance. This situation is shown in
Figure 4 using the AD8007 as an example. Note that for a sinusoidal input, each decoupling
quasi-rectified current carrying
R
G
499⍀
IN
capacitor returns to its ground a
high even-order harmonics.
R
F
499⍀
GND 1
AD8007
GND 2
10F
+
10F
+
OUT
+V
R
200⍀
–V
0.1F
S
S
S
0.1F
Figure 4. High Frequency Capacitors Returned
to Physically Separate Grounds (Not Recommended)
The decoupling scheme shown in Figure 5 is preferable. Here,
the two high frequency decoupling capacitors are first tied
together at a common node, and are then returned to the
ground plane through a single connection. By first adding the
two currents flowing through each high frequency decoupling
capacitor, one is ensuring that the current returned into the
ground plane is only at the fundamental frequency.
R
F
499⍀
10F
AD8007
10F
+
0.1F
OUT
0.1F
+
R
499⍀
IN
+V
S
G
R
S
200⍀
–V
S
Figure 5. High Frequency Capacitors Returned
to Ground at a Single Point (Recommended)
Whenever physical layout considerations prevent the decoupling
scheme shown in Figure 5, the user can connect one of the high
frequency decoupling capacitors directly across the supplies and
connect the other high frequency decoupling capacitor to ground.
This is shown in Figure 6.
REV. C–14–
R
F
499⍀
10F
+
+V
S
C1
0.1F
R
G
499⍀
R
S
AD8007
200⍀
IN
–V
S
10F
C2
0.1F
+
OUT
Figure 6. High Frequency Capacitors Connected
across the Supplies (Recommended)
Layout Considerations
The standard noninverting configuration with recommended power
supply bypassing is shown in Figure 6. This is also the bypassing
scheme used on the evaluation board shown in Figure 7. The
0.1 µF high frequency decoupling capacitors should be X7R or
NPO chip components. Connect C2 from the +VS pin to the –V
S
pin. Connect C1 from the +VS pin to signal ground.
The length of the high frequency bypass capacitor leads is critical.
Parasitic inductance due to long leads will work against the low
impedance created by the bypass capacitor. The ground for the
load impedance should be at the same physical location as the
bypass capacitor grounds. For the larger value capacitors, which
are intended to be effective at lower frequencies, the current
return path distance is less critical.
LAYOUT AND GROUNDING CONSIDERATIONS
Grounding
A ground plane layer is important in densely packed PC boards
to minimize parasitic inductances. However, an understanding of
where the current flows in a circuit is critical to implementing
effective high speed circuit design. The length of the current path
is directly proportional to the magnitude of parasitic inductances and thus the high frequency impedance of the path. High
speed currents in an inductive ground return will create an
unwanted voltage noise. Broad ground plane areas will reduce
the parasitic inductance.
Input Capacitance
Along with bypassing and ground, high speed amplifiers can be
sensitive to parasitic capacitance between the inputs and ground.
Even 1 pF or 2 pF of capacitance will reduce the input impedance at high frequencies, in turn increasing the amplifier’s gain,
causing peaking of the frequency response or even oscillations
if severe enough. It is recommended that the external passive components that are connected to the input pins be placed as close as
possible to the inputs to avoid parasitic capacitance. The ground
and power planes must be kept at a distance of at least 0.05 mm
from the input pins on all layers of the board.
AD8007/AD8008
Output Capacitance
To a lesser extent, parasitic capacitances on the output can cause
peaking of the frequency response. There are two methods to
effectively minimize its effect:
1. Put a small value resistor in series with the output to isolate
the load capacitance from the amplifier’s output stage.
(See TPC 7.)
2. Increase the phase margin by (a) increasing the amplifier’s
gain or (b) adding a pole by placing a capacitor in parallel
with the feedback resistor.
Input-to-Output Coupling
To minimize capacitive coupling, the input and output signal
traces should not be parallel. This helps reduce unwanted positive feedback.
External Components and Stability
The AD8007 and AD8008 are current feedback amplifiers and,
to a first order, the feedback resistor determines the bandwidth
and stability. The gain, load impedance, supply voltage, and
input impedances also have an effect.
TPC 6 shows the effect of changing R
for a gain of +2. Increasing R
F
reduce the bandwidth. TPC 1 shows that for a given R
the gain will also reduce peaking and bandwidth. Table I shows
the recommended R
The load resistor will also affect bandwidth as shown in TPCs 2
and 5. A comparison between TPCs 2 and 5 also demonstrates
the effect of gain and supply voltage.
When driving loads with a capacitive component, stability is
improved by using a series snub resistor “R
The frequency and pulse responses for various capacitive loads
are illustrated in TPCs 7 and 42, respectively.
For noninverting configurations, a resistor in series with the input,
R
, is needed to optimize stability for Gain = +1, as illustrated
S
in TPC 3. For larger noninverting gains, the effect of a series
resistor is reduced.
on bandwidth and peaking
F
will reduce peaking but also
, increasing
F
(Ω)R
G
SNUB
” at the output.
S
REV. C
–15–
AD8007/AD8008
R
F
+V
S
C4
10F
+
C1
4
AD8007
3
0.1F
C2
0.1F
C3
10F
AGND
1
+
5
2
–V
S
R
GN
SMA
INPUT
R
T
AGND
R
GP
AGND
R
S
Figure 7. Schematic of AD8007 Evaluation Board
for the SC70 Package
RBT
OUTPUT
SMA
EVALUATION BOARD
The SC70 board schematic is shown in Figure 7. To use the
SC70 board in an inverting configuration, R
left open. The position of R
can be shifted so that it connects
S
Pin 3 to ground. When used as a noninverter, R
and R
is left open. In both configurations, RT allows for a 50 Ω
GN
is used and RGP is
GN
is populated
GP
termination resistor. Universal (inverting or noninverting) AD8007
SOIC, AD8008 SOIC, and AD8008 MSOP boards are also available. The SC70 and MSOP evaluation boards are shown in
Figures 8–15.
REV. C–16–
AD8007/AD8008
Figure 8. SC70 Evaluation Board Silkscreen (Top)
Figure 10. SC70 Evaluation Board, Amplifier Side (Top)
Figure 14. MSOP Evaluation Board, Amplifier Side (Top)
Figure 15. MSOP Evaluation Board, Amplifier
Side (Bottom)
REV. C–18–
OUTLINE DIMENSIONS
8-Lead Standard Small Outline Package [SOIC]
Narrow Body
(RN-8)
Dimensions shown in millimeters and (inches)
5.00 (0.1968)
4.80 (0.1890)
4.00 (0.1574)
3.80 (0.1497)
85
6.20 (0.2440)
5.80 (0.2284)
41
AD8007/AD8008
1.27 (0.0500)
0.25 (0.0098)
0.10 (0.0040)
COPLANARITY
0.10
CONTROLLING DIMENSIONS ARE IN MILLIMETERS; INCH DIMENSIONS
(IN PARENTHESES) ARE ROUNDED-OFF MILLIMETER EQUIVALENTS FOR
REFERENCE ONLY AND ARE NOT APPROPRIATE FOR USE IN DESIGN