16-bit resolution with no missing codes
Throughput: 250 kSPS
INL: ±0.6 LSB typical, ±2 LSB maximum (±0.003% of FSR)
SINAD: 93.5 dB @ 20 kHz
THD: −110 dB @ 20 kHz
Pseudo differential analog input range
0 V to V
No pipeline delay
Single-supply operation 2.3 V to 5.5 V with
1.8 V to 5 V logic interface
Serial interface SPI®-/QSPI™-/MICROWIRE™-/DSP-compatible
Daisy-chain multiple ADCs, BUSY indicator
Power dissipation
The AD7685 is a 16-bit, charge redistribution successive
approximation, analog-to-digital converter (ADC) that operates
from a single power supply, VDD, between 2.3 V to 5.5 V. It
contains a low power, high speed, 16-bit sampling ADC with no
missing codes, an internal conversion clock, and a versatile serial
interface port. The part also contains a low noise, wide bandwidth,
short aperture delay, track-and-hold circuit. On the CNV rising
edge, it samples an analog input IN+ between 0 V to REF with
respect to a ground sense IN−. The reference voltage, REF, is
applied externally and can be set up to the supply voltage.
Power dissipation scales linearly with throughput.
The SPI-compatible serial interface also features the ability,
using the SDI input, to daisy chain several ADCs on a single
3-wire bus or provides an optional BUSY indicator. It is
compatible with 1.8 V, 2.5 V, 3 V, or 5 V logic using the
separate supply VIO.
The AD7685 is housed in a 10-lead MSOP or a 10-lead QFN
(LFCSP) with operation specified from −40°C to +85°C.
1.8V TO VDD
400 kSPS
to
500 kSPS
3- OR 4-WIRE I NTERFACE
(SPI, DAISY CHAIN, CS)
1000
kSPS
ADC
Driver
02968-001
Rev. C
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Anal og Devices for its use, nor for any infringements of patents or ot her
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarks and registered trademarks are the property of their respective owners.
Changes to Ordering Guide.......................................................... 28
4/04—Revision 0: Initial Revision
Mode 4-Wire No Busy Indicator Section ......... 21
CS
Mode 4-Wire with Busy Indicator Section....... 22
CS
Rev. C | Page 2 of 28
AD7685
SPECIFICATIONS
VDD = 2.3 V to 5.5 V, VIO = 2.3 V to VDD, V
Table 2.
A Grade B Grade C Grade
Parameter Conditions Min Typ Max Min Typ Max Min Typ Max Unit
RESOLUTION 16 16 16 Bits
ANALOG INPUT
Voltage Range IN+ − IN− 0 V
Absolute Input Voltage IN+ −0.1 VDD +
IN− −0.1 +0.1 −0.1 +0.1 −0.1 +0.1 V
Analog Input CMRR fIN = 250 kHz 65 65 65 dB
Leakage Current at 25°C Acquisition phase 1 1 1 nA
Input Impedance See the
ACCURACY
No Missing Codes 15 16 16 Bits
Differential Linearity Error −1 ±0.7 −1 ±0.5 +1.5 LSB1
Integral Linearity Error −6 +6 −3 ±1 +3 −2 ±0.6 +2 LSB
Transition Noise REF = VDD = 5 V 0.5 0.5 0.45 LSB
Gain Error2, T
Gain Error Temperature Drift ±0.3 ±0.3 ±0.3 ppm/°C
Offset Error2, T
VDD = 2.3 V to 4.5 V ±0.7 ±3.5 ±0.7 ±3.5 ±0.7 ±3.5 mV
Offset Temperature Drift ±0.3 ±0.3 ±0.3 ppm/°C
Power Supply Sensitivity VDD = 5 V ± 5% ±0.05 ±0.05 ±0.05 LSB
THROUGHPUT
Conversion Rate VDD = 4.5 V to 5.5 V 0 250 0 250 0 250 kSPS
VDD = 2.3 V to 4.5 V 0 200 0 200 0 200 kSPS
Transient Response Full-scale step 1.8 1.8 1.8 μs
AC ACCURACY
Signal-to-Noise Ratio fIN = 20 kHz,
f
Spurious-Free Dynamic
Range
Total Harmonic Distortion fIN = 20 kHz −100 −106 −110 dB
Signal-to-(Noise + Distortion) fIN = 20 kHz,
f
f
Intermodulation Distortion4 −110 −115 dB
1
LSB means least significant bit. With the 5 V input range, 1 LSB is 76.3 μV.
2
See Terminology section. These specifications do include full temperature range variation but do not include the error contribution from the external reference.
3
All specifications in dB are referred to a full-scale input FS. Tested with an input signal at 0.5 dB below full-scale, unless otherwise specified.
4
f
= 21.4 kHz, f
IN1
to T
MIN
MIN
±2 ±30 ±2 ±30 ±2 ±15 LSB
MAX
to T
MAX
VDD = 4.5 V to 5.5 V ±0.1 ±1.6 ±0.1 ±1.6 ±0.1 ±1.6 mV
= 5 V
V
REF
= 20 kHz,
IN
= 2.5 V
V
REF
fIN = 20 kHz −100 −106 −110 dB
= 5 V
V
REF
= 20 kHz,
IN
= 5 V,
V
REF
−60 dB input
= 20 kHz,
IN
= 2.5 V
V
REF
= 18.9 kHz, each tone at −7 dB below full scale.
IN2
= VDD, TA = –40°C to +85°C, unless otherwise noted.
REF
0 V
REF
0.1
Analog Inputs section
−0.1 VDD +
See the
Analog Inputs section
0 V
REF
−0.1 VDD +
0.1
See the
Analog Inputs section
REF
0.1
90 90 92 91.5 93.5 dB
86 86 88 87.5 88.5 dB
89 90 92 91.5 93.5 dB
32 33.5 dB
86 85.5 87.5 87 88.5 dB
V
V
3
Rev. C | Page 3 of 28
AD7685
VDD = 2.3 V to 5.5 V, VIO = 2.3 V to VDD, V
Table 3.
Parameter Conditions Min Typ Max Unit
REFERENCE
Voltage Range 0.5 VDD + 0.3 V
Load Current 250 kSPS, REF = 5 V 50 μA
SAMPLING DYNAMICS
−3 dB Input Bandwidth 2 MHz
Aperture Delay VDD = 5 V 2.5 ns
DIGITAL INPUTS
Logic Levels
VIL –0.3 0.3 × VIO V
VIH 0.7 × VIO VIO + 0.3 V
IIL −1 +1 μA
IIH −1 +1 μA
DIGITAL OUTPUTS
Data Format Serial 16 bits straight binary
Pipeline Delay
VOL I
VOH I
= +500 μA 0.4 V
SINK
= −500 μA VIO − 0.3 V
SOURCE
POWER SUPPLIES
VDD Specified performance 2.3 5.5 V
VIO Specified performance 2.3 VDD + 0.3 V
VIO Range 1.8 VDD + 0.3 V
Standby Current
With all digital inputs forced to VIO or GND as required.
2
During acquisition phase.
3
Contact sales for extended temperature range.
MIN
to T
= VDD, TA = –40°C to +85°C, unless otherwise noted.
REF
Conversion results available immediately
after completed conversion
−40 +85 °C
MAX
Rev. C | Page 4 of 28
AD7685
TIMING SPECIFICATIONS
−40°C to +85°C, VIO = 2.3 V to 5.5 V or VDD + 0.3 V, whichever is the lowest, unless otherwise stated.
Table 4. VDD = 4.5 V to 5.5 V
Parameter Symbol Min Typ Max Unit
Conversion Time: CNV Rising Edge To Data Available t
Acquisition Time t
Time Between Conversions t
CNV Pulse Width (CS Mode)
SCK Period (CS Mode)
SCK Period (Chain Mode) t
VIO Above 4.5 V 17 ns
VIO Above 3 V 18 ns
VIO Above 2.7 V 19 ns
VIO Above 2.3 V 20 ns
SCK Low Time t
SCK High Time t
SCK Falling Edge to Data Remains Valid t
SCK Falling Edge to Data Valid Delay t
VIO Above 4.5 V 14 ns
VIO Above 3 V 15 ns
VIO Above 2.7 V 16 ns
VIO Above 2.3 V 17 ns
CNV or SDI Low to SDO D15 MSB Valid (CS Mode)
VIO Above 4.5 V 15 ns
VIO Above 2.7 V 18 ns
VIO Above 2.3 V 22 ns
CNV or SDI High or Last SCK Falling Edge to SDO High Impedance (CS Mode)
SDI Valid Setup Time from CNV Rising Edge (CS Mode)
SDI Valid Hold Time from CNV Rising Edge (CS Mode)
SCK Valid Setup Time from CNV Rising Edge (Chain Mode) t
SCK Valid Hold Time from CNV Rising Edge (Chain Mode) t
SDI Valid Setup Time from SCK Falling Edge (Chain Mode) t
SDI Valid Hold Time from SCK Falling Edge (Chain Mode) t
SDI High to SDO High (Chain Mode with Busy Indicator) t
VIO Above 4.5 V 15 ns
VIO Above 2.3 V 26 ns
1
See Figure 3 and Figure 4 for load conditions.
1
0.5 2.2 μs
CONV
1.8 μs
ACQ
4 μs
CYC
t
10 ns
CNVH
t
15 ns
SCK
SCK
7 ns
SCKL
7 ns
SCKH
5 ns
HSDO
DSDO
t
EN
t
25 ns
DIS
t
15 ns
SSDICNV
t
0 ns
HSDICNV
5 ns
SSCKCNV
5 ns
HSCKCNV
3 ns
SSDISCK
4 ns
HSDISCK
DSDOSDI
Rev. C | Page 5 of 28
AD7685
−40°C to +85°C, VIO = 2.3 V to 4.5 V or VDD + 0.3 V, whichever is the lowest, unless otherwise stated.
Table 5. VDD = 2.3V to 4.5 V
Parameter Symbol Min Typ Max Unit
Conversion Time: CNV Rising Edge to Data Available t
Acquisition Time t
Time Between Conversions t
CNV Pulse Width (CS Mode)
SCK Period (CS Mode)
SCK Period (Chain Mode) t
VIO Above 3 V 29 ns
VIO Above 2.7 V 35 ns
VIO Above 2.3 V 40 ns
SCK Low Time t
SCK High Time t
SCK Falling Edge to Data Remains Valid t
SCK Falling Edge to Data Valid Delay t
VIO Above 3 V 24 ns
VIO Above 2.7 V 30 ns
VIO Above 2.3 V 35 ns
CNV or SDI Low to SDO D15 MSB Valid (CS Mode)
VIO Above 2.7 V 18 ns
VIO Above 2.3 V 22 ns
CNV or SDI High or Last SCK Falling Edge to SDO High Impedance (CS Mode)
SDI Valid Setup Time from CNV Rising Edge (CS Mode)
SDI Valid Hold Time from CNV Rising Edge (CS Mode)
SCK Valid Setup Time from CNV Rising Edge (Chain Mode) t
SCK Valid Hold Time from CNV Rising Edge (Chain Mode) t
SDI Valid Setup Time from SCK Falling Edge (Chain Mode) t
SDI Valid Hold Time from SCK Falling Edge (Chain Mode) t
SDI High to SDO High (Chain Mode with Busy Indicator) t
1
See Figure 3 and Figure 4 for load conditions.
1
0.7 3.2 μs
CONV
1.8 μs
ACQ
5 μs
CYC
t
10 ns
CNVH
t
25 ns
SCK
SCK
12 ns
SCKL
12 ns
SCKH
5 ns
HSDO
DSDO
t
EN
t
25 ns
DIS
t
30 ns
SSDICNV
t
0 ns
HSDICNV
5 ns
SSCKCNV
8 ns
HSCKCNV
5 ns
SSDISCK
4 ns
HSDISCK
36 ns
DSDOSDI
70% VIO
t
DELAY
1
2
2V OR VIO – 0.5V
0.8V OR 0.5V
1
2
02968-003
TO SDO
50pF
C
L
500µAI
500µAI
OL
1.4V
OH
02968-002
Figure 3. Load Circuit for Digital Interface Timing
30% VIO
t
DELAY
2V OR VIO – 0.5V
0.8V OR 0.5V
NOTES
1. 2V IF VIO ABOVE 2.5V, VIO – 0.5V IF VIO BELOW 2.5V.
2. 0.8V IF VI O ABOVE 2.5V, 0.5V IF VIO BELOW 2.5V.
Figure 4. Voltage Levels for Timing
Rev. C | Page 6 of 28
AD7685
ABSOLUTE MAXIMUM RATINGS
Table 6.
Parameter Rating
Analog Inputs
IN+1, IN−1, REF
Supply Voltages
VDD, VIO to GND −0.3 V to +7 V
VDD to VIO ±7 V
Digital Inputs to GND −0.3 V to VIO + 0.3 V
Digital Outputs to GND −0.3 V to VIO + 0.3 V
Storage Temperature Range −65°C to +150°C
Junction Temperature 150°C
θJA Thermal Impedance 200°C/W (MSOP-10)
θJC Thermal Impedance 44°C/W (MSOP-10)
Lead Temperature
Vapor Phase (60 sec) 215°C
Infrared (15 sec) 220°C
1
See the Analog Inputs section.
GND − 0.3 V to VDD + 0.3 V
or ±130 mA
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
ESD CAUTION
Rev. C | Page 7 of 28
AD7685
T
PIN CONFIGURATION AND FUNCTION DESCRIPTIONS
REF
VDD
IN+
IN–
GND
1
2
AD7685
3
TOP VIEW
(Not to Scale)
4
5
VIO
10
SDI
9
SCK
8
7
SDO
CNV
6
02968-004
Figure 5. 10-Lead MSOP Pin Configuration
1REF
2VDD
AD7685
3IN+
TOP VIEW
(Not to Scale)
4IN–
5GND
NOTES
1. EXPOSED PAD CONNECTED TO GND. THIS
CONNECTI ON IS NO T REQUI RED TO MEE
THE ELECTRICAL PERFORMANCES.
Figure 6. 10-Lead QFN (LFCSP) Pin Configuration
10 VIO
9SDI
8SCK
7SDO
6CNV
02968-005
Table 7. Pin Function Descriptions
Pin No Mnemonic Type1 Description
1 REF AI
Reference Input Voltage. The REF range is from 0.5 V to VDD. It is referred to the GND pin. This pin should
be decoupled closely to the pin with a 10 μF capacitor.
2 VDD P Power Supply.
3 IN+ AI Analog Input. It is referred to IN−. The voltage range, that is, the difference between IN+ and IN−, is 0 V to V
.
REF
4 IN− AI Analog Input Ground Sense. Connect to the analog ground plane or to a remote sense ground.
5 GND P Power Supply Ground.
6 CNV DI
Convert Input. This input has multiple functions. On its leading edge, it initiates the conversions and
selects the interface mode of the part, chain, or CS
mode. In CS mode, it enables the SDO pin when low.
In chain mode, the data should be read when CNV is high.
7 SDO DO Serial Data Output. The conversion result is output on this pin. It is synchronized to SCK.
8 SCK DI Serial Data Clock Input. When the part is selected, the conversion result is shifted out by this clock.
9 SDI DI Serial Data Input. This input provides multiple features. It selects the interface mode of the ADC as follows:
Chain mode is selected if SDI is low during the CNV rising edge. In this mode, SDI is used as a data input
to daisy chain the conversion results of two or more ADCs onto a single SDO line. The digital data level
on SDI is output on SDO with a delay of 16 SCK cycles.
CS mode is selected if SDI is high during the CNV rising edge. In this mode, either SDI or CNV can enable
the serial output signals when low, and if SDI or CNV is low when the conversion is complete, the BUSY
indicator feature is enabled.
10 VIO P Input/Output Interface Digital Power. Nominally at the same supply as the host interface (1.8 V, 2.5 V, 3 V, or 5 V).
EPAD
Exposed Pad. Exposed pad connected to GND. This connection is not required to meet the electrical
performances.
1
AI = analog input, DI = digital input, DO = digital output, and P = power.
Rev. C | Page 8 of 28
AD7685
TERMINOLOGY
Integral Nonlinearity Error (INL)
INL refers to the deviation of each individual code from a line
drawn from negative full scale through positive full scale. The
point used as negative full scale occurs ½ LSB before the first
code transition. Positive full scale is defined as a level 1½ LSB
beyond the last code transition. The deviation is measured from
the middle of each code to the true straight line (see Figure 26).
Differential Nonlinearity Error (DNL)
In an ideal ADC, code transitions are 1 LSB apart. DNL is the
maximum deviation from this ideal value. It is often specified in
terms of resolution for which no missing codes are guaranteed.
Offset Error
The first transition should occur at a level ½ LSB above analog
ground (38.1 μV for the 0 V to 5 V range). The offset error is
the deviation of the actual transition from that point.
Gain Error
The last transition (from 111 . . . 10 to 111 . . . 11) should
occur for an analog voltage 1½ LSB below the nominal full
scale (4.999886 V for the 0 V to 5 V range). The gain error is the
deviation of the actual level of the last transition from the ideal
level after the offset is adjusted out.
Spurious-Free Dynamic Range (SFDR)
The difference, in decibels (dB), between the rms amplitude of
the input signal and the peak spurious signal.
Effective Number of Bits (ENOB)
ENOB is a measurement of the resolution with a sine wave
input. It is related to SINAD by
ENOB = (SINAD
and is expressed in bits.
Total Harmonic Distortion (THD)
THD is the ratio of the rms sum of the first five harmonic
components to the rms value of a full-scale input signal and is
expressed in dB.
Signal-to-Noise Ratio (SNR)
SNR is the ratio of the rms value of the actual input signal to the
rms sum of all other spectral components below the Nyquist
frequency, excluding harmonics and dc. The value for SNR is
expressed in dB.
Signal-to-(Noise + Distortion), SINAD
SINAD is the ratio of the rms value of the actual input signal to
the rms sum of all other spectral components below the Nyquist
frequency, including harmonics but excluding dc. The value for
SINAD is expressed in dB.
Aperture Delay
Aperture delay is a measure of the acquisition performance and
is the time between the rising edge of the CNV input and when
the input signal is held for a conversion.
Transi ent Res p ons e
The time required for the ADC to accurately acquire its input
after a full-scale step function is applied.
− 1.76)/6.02
dB
Rev. C | Page 9 of 28
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