8 simultaneously sampled inputs
True bipolar analog input ranges: ±10 V, ±5 V
Single 5 V analog supply and 2.3 V to 5.25 V V
Fully integrated data acquisition solution
Analog input clamp protection
Input buffer with 1 MΩ analog input impedance
Second-order antialiasing analog filter
On-chip accurate reference and reference buffer
18-bit ADC with 200 kSPS on all channels
Oversampling capability with digital filter
Flexible parallel/serial interface
SPI/QSPI™/MICROWIRE™/DSP compatible
Pin compatible solutions from 14-bits to 18-bits
Performance
7 kV ESD rating on analog input channels
98 dB SNR, −107 dB THD
Low power: 100 mW
Standby mode: 25 mW
64-lead LQFP package
DRIVE
Simultaneous Sampling ADC
AD7608
APPLICATIONS
Power line monitoring and protection systems
Multiphase motor controls
Instrumentation and control systems
Multiaxis positioning systems
Data acquisition systems (DAS)
COMPANION PRODUCTS
External References: ADR421, ADR431
Digital Isolators: ADuM1402, ADuM5000, ADuM5402
Voltage Regulator Design Tool: ADIsimPower, Supervisor
Parametric Search
Complete list of complements on AD7608 product page
Table 1. High Resolution, Bipolar Input, Simultaneous
Sampling DAS Solutions
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarks and registered trademarks are the property of their respective owners.
/SER SEL = 0)...................................... 24
PA R
/SER SEL = 1)......................................... 25
REVISION HISTORY
4/11—Revision 0: Initial Version
Rev. 0 | Page 2 of 32
AD7608
GENERAL DESCRIPTION
The AD7608 is an 18-bit, 8-channel simultaneous sampling,
analog-to-digital data acquisition system (DAS). The part
contains analog input clamp protection, a second-order
antialiasing filter, a track-and-hold amplifier, an 18-bit charge
redistribution successive approximation analog-to-digital
converter (ADC), a flexible digital filter, a 2.5 V reference and
reference buffer, and high speed serial and parallel interfaces.
The AD7608 operates from a single 5 V supply and can
accommodate ±10 V and ±5 V true bipolar input signals while
sampling at throughput rates up to 200 kSPS for all channels.
The input clamp protection circuitry can tolerate voltages up
to ±16.5 V. The AD7608 has 1 MΩ analog input impedance
regardless of sampling frequency. The single supply operation,
on-chip filtering, and high input impedance eliminate the need
for driver op amps and external bipolar supplies. The AD7608
antialiasing filter has a 3 dB cutoff frequency of 22 kHz and
provides 40 dB antialias rejection when sampling at 200 kSPS.
The flexible digital filter is pin driven, yields improvements in
SNR, and reduces the 3 dB bandwidth.
Rev. 0 | Page 3 of 32
AD7608
SPECIFICATIONS
V
= 2.5 V external/internal, AVCC = 4.75 V to 5.25 V, V
REF
Table 2.
Parameter Test Conditions/Comments Min Typ Max Unit
DYNAMIC PERFORMANCE fIN = 1 kHz sine wave unless otherwise noted
Signal-to-Noise Ratio (SNR)
2, 3
Oversampling by 16; ±10 V range; fIN = 130 Hz 98 99.5 dB
Oversampling by 16; ±5 V range; fIN = 130 Hz 95.5 97.5 dB
No oversampling; ±10 V range 89.5 90.9 dB
No oversampling; ±5 V range 88.5 90 dB
Signal-to-(Noise + Distortion) (SINAD)2 No oversampling; ±10 V range 88.5 90.5 dB
No oversampling; ±5 V range 88 89.5 dB
Dynamic Range No oversampling; ±10 V range 91.5 dB
No oversampling; ±5 V range 90.5 dB
Total Harmonic Distortion (THD)2 −107 −95 dB
Peak Harmonic or Spurious Noise (SFDR)2 −108 dB
Intermodulation Distortion (IMD)2 fa = 1 kHz, fb = 1.1 kHz
Second-Order Terms −110 dB
Third-Order Terms −106 dB
Channel-to-Channel Isolation2 f
on unselected channels up to 160 kHz −95 dB
IN
ANALOG INPUT FILTER
Full Power Bandwidth −3 dB, ±10 V range 23 kHz
−3 dB, ±5 V range 15 kHz
−0.1 dB, ±10 V range 10 kHz
−0.1 dB, ±5 V range 5 kHz
t
GROUP DELAY
±10 V range 11 µs
±5 V range 15 µs
DC ACCURACY
Resolution No missing codes 18 Bits
Differential Nonlinearity2 ±0.75 −0.99/+2.6 LSB4
Integral Nonlinearity2 ±2.5 ±7.5 LSB
Total Unadjusted Error (TUE) ±10 V range ±15 LSB
±5 V range ±40 LSB
Positive Full-Scale Error
2, 5
External reference ±15 ±128 LSB
Internal reference ±40 LSB
Positive Full-Scale Error Drift External reference ±2 ppm/°C
Internal reference ±7 ppm/°C
Positive Full-Scale Error Matching2 ±10 V range 12 95 LSB
±5 V range 30 128 LSB
Bipolar Zero Code Error2, 6 ±10 V range ±3.5 ±24 LSB
± 5 V range ±3.5 ±48 LSB
Bipolar Zero Code Error Drift ±10 V range 10 µV/°C
± 5 V range 5 µV/°C
Bipolar Zero Code Error Matching2 ±10 V range 3 30 LSB
±5 V range 21 65 LSB
Negative Full-Scale Error
2, 5
External reference ±15 ±128 LSB
Internal reference ±40 LSB
Negative Full-Scale Error Drift External reference ±4 ppm/°C
Internal reference ±8 ppm/°C
Negative Full-Scale Error Matching2 ±10 V range 12 95 LSB
±5 V range 30 128 LSB
= 2.3 V to 5.25 V; f
DRIVE
= 200 kSPS, TA = T
SAMPLE
MIN
to T
, unless otherwise noted.1
MAX
Rev. 0 | Page 4 of 32
AD7608
Parameter Test Conditions/Comments Min Typ Max Unit
ANALOG INPUT
Input Voltage Ranges RANGE = 1 ±10 V
RANGE = 0 ±5 V
Analog Input Current 10 V; see Figure 28 5.4 µA
5 V; see Figure 28 2.5 µA
Input Capacitance7 5 pF
Input Impedance 1 MΩ
REFERENCE INPUT/OUTPUT
Reference Input Voltage Range 2.475 2.5 2.525 V
DC Leakage Current ±1 µA
Input Capacitance7 REF SELECT = 1 7.5 pF
Reference Output Voltage REFIN/REFOUT
2.49/
2.505
Reference Temperature Coefficient ±10 ppm/°C
LOGIC INPUTS
Input High Voltage (V
Input Low Voltage (V
) 0.9 × V
INH
) 0.1 × V
INL
V
DRIVE
Input Current (IIN) ±2 µA
Input Capacitance (CIN)7 5 pF
LOGIC OUTPUTS
Output High Voltage (VOH) I
Output Low Voltage (VOL) I
Conversion Time All eight channels included; see Table 3 4 µs
Track-and-Hold Acquisition Time 1 µs
Throughput Rate Per channel, all eight channels included 200 kSPS
POWER REQUIREMENTS
AVCC 4.75 5.25 V
V
2.3 5.25 V
DRIVE
I
Digital inputs = 0 V or V
TOTAL
DRIVE
Normal Mode (Static) 16 22 mA
Normal Mode (Operational)8 f
= 200 kSPS 20 27 mA
SAMPLE
Standby Mode 5 8 mA
Shutdown Mode 2 11 µA
Power Dissipation
Normal Mode (Static) 80 115.5 mW
Normal Mode (Operational)8 f
= 200 kSPS 100 142 mW
SAMPLE
Standby Mode 25 42 mW
Shutdown Mode 10 58 µW
1
Temperature range for B version is −40°C to +85°C.
2
See the Terminology section.
3
This specification applies when reading during a conversion or after a conversion. If reading during a conversion in parallel mode with V
and THD by 3 dB.
4
LSB means least significant bit. With ±5 V input range, 1 LSB = 38.14 µV. With ±10 V input range, 1 LSB = 76.29 µV.
5
These specifications include the full temperature range variation and contribution from the internal reference buffer but do not include the error contribution from
the external reference.
6
Bipolar zero code error is calculated with respect to the analog input voltage.
7
Sample tested during initial release to ensure compliance.
8
Operational power/current figure includes contribution when running in oversampling mode.
= 5 V, SNR typically reduces by 1.5 dB
DRIVE
V
V
DRIVE
Rev. 0 | Page 5 of 32
AD7608
TIMING SPECIFICATIONS
AVCC = 4.75 V to 5.25 V, V
Table 3.
Limit at T
Parameter Min Typ Max Unit Description
PARALLEL/SERIAL/BYTE MODE
t
1/throughput rate
CYCLE
5 µs
5 µs Serial mode reading during conversion; V
10.5 µs Serial mode reading after a conversion; V
t
Conversion time
CONV
3.45 4 4.15 µs Oversampling off
7.87 9.1 µs Oversampling by 2
16.05 18.8 µs Oversampling by 4
33 39 µs Oversampling by 8
66 78 µs Oversampling by 16
133 158 µs Oversampling by 32
257 315 µs Oversampling by 64
t
WAKE -UP S TANDBY
t
WAKE -UP S HUTDO WN
100 µs
Internal Reference 30 ms
External Reference 13 ms
t
50 ns RESET high pulse width
RESET
t
20 ns BUSY to OS x pin setup time
OS_SETUP
t
OS_HOLD
t1 40 ns CONVST x high to BUSY high
t2 25 ns Minimum CONVST x low pulse
t3 25 ns Minimum CONVST x high pulse
t4 0 ns
2
t
0.5 ms Maximum delay allowed between CONVST A, CONVST B rising edges
5
t6 25 ns
t7 25 ns Minimum delay between RESET low to CONVST x high
PARALLEL/BYTE READ
OPERATION
t8 0 ns
t9 0 ns
t10
16 ns V
21 ns V
25 ns V
32 ns V
t11 15 ns
t12 22 ns
= 2.3 V to 5.25 V, V
DRIVE
= 2.5 V external reference/internal reference, TA = T
REF
, T
MIN
MAX
Parallel mode, reading during or after conversion; or serial mode: V
3.3 V to 5.25 V, reading during a conversion using D
rising edge to CONVST x rising edge; power-up time from
STBY
standby mode
rising edge to CONVST x rising edge; power-up time from
STBY
shutdown mode
rising edge to CONVST x rising edge; power-up time from
STBY
shutdown mode
20 ns BUSY to OS x pin hold time
BUSY falling edge to CS
Maximum time between last CS
to RD setup time
CS
to RD hold time
CS
low pulse width
RD
above 4.75 V
DRIVE
above 3.3 V
DRIVE
above 2.7 V
DRIVE
above 2.3 V
DRIVE
high pulse width
RD
high pulse width (see ); Figure 5 CS and RD linked
CS
to T
MIN
MAX
= 2.7 V
DRIVE
= 2.3 V, D
DRIVE
falling edge setup time
rising edge and BUSY falling edge
, unless otherwise noted.1
=
OUT
OUT
DRIVE
B lines
B lines
A and D
OUT
OUT
A and D
Rev. 0 | Page 6 of 32
AD7608
Limit at T
Parameter Min Typ Max Unit Description
t13
16 ns V
20 ns V
25 ns V
30 ns V
3
t
14
16 ns V
21 ns V
25 ns V
32 ns V
t15 6 ns
t16 6 ns
t17 22 ns
SERIAL READ OPERATION
f
Frequency of serial read clock
SCLK
23.5 MHz V
17 MHz V
14.5 MHz V
11.5 MHz V
t18
15 ns V
20 ns V
30 ns V
3
t
Data access time after SCLK rising edge
19
17 ns V
23 ns V
27 ns V
34 ns V
t20 0.4 t
t21 0.4 t
SCLK
SCLK
t22 7 SCLK rising edge to D
t23 22 ns
FRSTDATA OPERATION
t24
15 ns V
20 ns V
25 ns V
30 ns V
t25 ns
15 ns V
20 ns V
25 ns V
30 ns V
t26
16 ns V
20 ns V
25 ns V
30 ns V
, T
MIN
MAX
Delay from CS
above 4.75 V
DRIVE
above 3.3 V
DRIVE
above 2.7 V
DRIVE
above 2.3 V
DRIVE
until DB[15:0] three-state disabled
Data access time after RD
above 4.75 V
DRIVE
above 3.3 V
DRIVE
above 2.7 V
DRIVE
above 2.3 V
DRIVE
Data hold time after RD
to DB[15:0] hold time
CS
Delay from CS
above 4.75 V
DRIVE
above 3.3 V
DRIVE
above 2.7 V
DRIVE
above 2.3 V
DRIVE
Delay from CS
rising edge to DB[15:0] three-state enabled
until D
OUT
MSB valid
above 4.75 V
DRIVE
above 3.3 V
DRIVE
= 2.3 V to 2.7 V
DRIVE
above 4.75 V
DRIVE
above 3.3 V
DRIVE
above 2.7 V
DRIVE
above 2.3 V
DRIVE
ns SCLK low pulse width
ns SCLK high pulse width
rising edge to D
CS
Delay from CS
above 4.75 V
DRIVE
above 3.3 V
DRIVE
above 2.7 V
DRIVE
above 2.3 V
DRIVE
OUT
falling edge until FRSTDATA three-state disabled
Delay from CS falling edge until FRSTDATA high, serial mode
above 4.75 V
DRIVE
above 3.3 V
DRIVE
above 2.7 V
DRIVE
above 2.3 V
DRIVE
Delay from RD
above 4.75 V
DRIVE
above 3.3 V
DRIVE
above 2.7 V
DRIVE
above 2.3 V
DRIVE
falling edge to FRSTDATA high
falling edge
falling edge
A/D
B three-state disabled/delay from CS until
OUT
A/D
OUT
A/D
B valid hold time
OUT
B three-state enabled
OUT
Rev. 0 | Page 7 of 32
AD7608
Limit at T
Parameter Min Typ Max Unit Description
t27
19 ns V
24 ns V
t28 Delay from 16th SCLK falling edge to FRSTDATA low
17 ns V
22 ns V
t29 24 ns
1
Sample tested during initial release to ensure compliance. All input signals are specified with tR = tF = 5 ns (10% to 90% of VDD) and timed from a voltage level of 1.6 V.
2
The delay between the CONVST x signals was measured as the maximum time allowed while ensuring a <40 LSB performance matching between channel sets.
3
A buffer is used on the data output pins for these measurements, which is equivalent to a load of 20 pF on the output pins.
Timing Diagrams
CONVST A/
CONVST B
CONVST A/
CONVST B
BUSY
CS
RESET
CONVST A/
CONVST B
CONVST A/
CONVST B
BUSY
, T
t
5
RESET
MAX
Delay from RD
Delay from CS
t
1
= 3.3 V to 5.25 V
DRIVE
= 2.3 V to 2.7 V
DRIVE
= 3.3 V to 5.25 V
DRIVE
= 2.3 V to 2.7 V
DRIVE
t
CYCLE
t
falling edge to FRSTDATA low
rising edge until FRSTDATA three-state enabled
t
3
CONV
MIN
t
7
t
Figure 2.CONVST x Timing—Reading After a Conversion
t
5
t
CYCLE
t
3
t
CONV
t
1
t
2
t
4
08938-002
t
2
t
6
CS
RESET
t
7
t
RESET
08938-003
Figure 3. CONVST x Timing—Reading During a Conversion
CS
t
V8
[1:0]
9
t
16
t
17
t
29
08938-004
RD
DATA:
DB[15:0]
FRSTDATA
t
8
t
13
INVALI D
t
24
t
t
10
V1
[17:2]
t
26
11
V1
[1:0]
Figure 4. Parallel Mode Separate
t
V2
[17:2]
t
27
14
V2
[1:0]
CS
and RD Pulses
t
V8
[17:2]
15
Rev. 0 | Page 8 of 32
AD7608
A
t
12
CS, RD
t
16
V8
[17:2]V8[1:0]
t
17
DATA:
DB[15:0]
t
13
V1
[17:2]V1[1:0]
V2
[17:2]
V2
[1:0]V7[17:2]V7[1:0]
FRSTDATA
Figure 5.
CS
and RD Linked Parallel Mode
08938-005
CS
t21t
SCLK
D
OUT
D
OUT
FRSTDAT
t
t
A,
B
18
19
DB17DB16DB15DB1DB0
t
25
20
t
22
t
28
t
23
t
29
8938-006
Figure 6. Serial Read Operation (Channel 1)
Rev. 0 | Page 9 of 32
AD7608
ABSOLUTE MAXIMUM RATINGS
TA = 25°C, unless otherwise noted.
Table 4.
Parameter Rating
AVCC to AGND −0.3 V to +7 V
V
to AGND −0.3 V to AVCC + 0.3 V
DRIVE
Analog Input Voltage to AGND1 ±16.5 V
Digital Input Voltage to AGND −0.3 V to V
Digital Output Voltage to AGND −0.3 V to V
REFIN to AGND −0.3 V to AVCC + 0.3 V
Input Current to Any Pin Except Supplies1 ±10 mA
Operating Temperature Range
B Version −40°C to +85°C
Storage Temperature Range −65°C to +150°C
Junction Temperature 150°C
Pb/SN Temperature, Soldering
Transient currents of up to 100 mA do not cause SCR latch-up.
DRIVE
DRIVE
+ 0.3 V
+ 0.3 V
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
THERMAL RESISTANCE
θJA is specified for the worst-case conditions, that is, a device
soldered in a circuit board for surface-mount packages. These
specifications apply to a 4-layer board.
Table 5. Thermal Resistance
Package Type θJA θ
64-Lead LQFP 45 11 °C /W
Unit
JC
ESD CAUTION
Rev. 0 | Page 10 of 32
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