0.12 mW typical at 100 kSPS with 1.6 V supplies
Fast throughput rate: 200 kSPS
Wide input bandwidth:
71 dB SNR at 30 kHz input frequency
Flexible power/serial clock speed management
No pipeline delays
High speed serial interface:
SPI/QSPI™/MICROWIRE™/DSP compatible
Automatic power-down
Power-down mode: 8 nA typical
6-lead SOT-23 package
8-lead MSOP package
APPLICATIONS
Battery-powered systems
Medical instruments
Remote data acquisition
Isolated data acquisition
of 1.6 V to 3.6 V
DD
AD7466/AD7467/AD7468
FUNCTIONAL BLOCK DIAGRAM
V
DD
12-/10-/8-BIT
T/H
IN
SUCCESSIVE
APPROXIMATION
ADC
CONTROL
LOGIC
AD7466/AD7467/AD7468
GND
Figure 1.
SCLK
SDATA
CS
02643-001
GENERAL DESCRIPTION
The AD7466/AD7467/AD74681 are 12-/10-/8-bit, high speed,
low power, successive approximation analog-to-digital
converters (ADCs), respectively. The parts operate from a single
1.6 V to 3.6 V power supply and feature throughput rates up to
200 kSPS with low power dissipation. The parts contain a low
noise, wide bandwidth track-and-hold amplifier, which can
handle input frequencies in excess of 3 MHz.
The conversion process and data acquisition are controlled
CS
usin
g
and the serial clock, allowing the devices to interface
with microprocessors or DSPs. The input signal is sampled on
the falling edge of
point. There are no pipeline delays associated with the part.
The reference for the part is taken internally from V
allows the widest dynamic input range to the ADC. Thus, the
analog input range for the part is 0 V to V
rate is determined by the SCLK.
1
Protected by U.S. Patent No. 6,681,332.
CS
, and the conversion is also initiated at this
. This
DD
. The conversion
DD
PRODUCT HIGHLIGHTS
1. Specified for supply voltages of 1.6 V to 3.6 V.
2. 12-, 10-, an
igh throughput rate with low power consumption.
3. H
Power consumption in normal mode of operation at
100 kSPS and 3 V is 0.9 mW maximum.
4. Flexi
The conversion rate is determined by the serial clock,
allowing the conversion time to be reduced through
increases in the serial clock speed. Automatic power-down
after conversion allows the average power consumption to
be reduced when in power-down. Current consumption is
0.1 μA maximum and 8 nA typically when in power-down.
5. Refer
6. No
pipeline delay.
he part features a standard successive approximation
7. T
ADC with accurate control of conversions via a
d 8-bit ADCs in SOT-23 and MSOP packages.
ble power/serial clock speed management.
ence derived from the power supply.
CS
input.
Rev. C
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Anal og Devices for its use, nor for any infringements of patents or ot her
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarks and registered trademarks are the property of their respective owners.
Changes to Ordering Guide.......................................................... 27
5/03—Revision 0: Initial Version
Rev. C | Page 2 of 28
AD7466/AD7467/AD7468
www.BDTIC.com/ADI
SPECIFICATIONS
AD7466
VDD = 1.6 V to 3.6 V, f
The temperature range for the B version is −40°C to +85°C.
Table 1.
Parameter B Version Unit Test Conditions/Comments
DYNAMIC PERFORMANCE fIN = 30 kHz sine wave
Signal-to-Noise and Distortion (SINAD) 69 dB min 1.8 V ≤ VDD ≤ 2 V; see the Terminology section
70 dB min 2.5 V ≤ VDD ≤ 3.6 V
70 dB typ VDD = 1.6 V
Signal-to-Noise Ratio (SNR) 70 dB min 1.8 V ≤ VDD ≤ 2 V; see the Terminology section
71 dB typ 1.8 V ≤ VDD ≤ 2 V
71 dB min 2.5 V ≤ VDD ≤ 3.6 V
70.5 dB typ VDD = 1.6 V
Total Harmonic Distortion (THD) −83 dB typ See the Terminology section
Peak Harmonic or Spurious Noise (SFDR) −85 dB typ See the Terminology section
Intermodulation Distortion (IMD)
Second-Order Terms −84 dB typ
Third-Order Terms −86 dB typ
Aperture Delay 10 ns typ
Aperture Jitter 40 ps typ
Full Power Bandwidth 3.2 MHz typ @ 3 dB, 2.5 V ≤ VDD ≤ 3.6 V
1.9 MHz typ @ 3 dB, 1.6 V ≤ VDD ≤ 2.2 V
750 kHz typ @ 0.1 dB, 2.5 V ≤ VDD ≤ 3.6 V
450 kHz typ @ 0.1 dB, 1.6 V ≤ VDD ≤ 2.2 V
DC ACCURACY
Resolution 12 Bits
Integral Nonlinearity ±1.5 LSB max See the Terminology section
Differential Nonlinearity −0.9/+1.5 LSB max
Offset Error ±1 LSB max See the Terminology section
Gain Error ±1 LSB max See the Terminology section
Total Unadjusted Error (TUE) ±2 LSB max See the Terminology section
ANALOG INPUT
Input Voltage Ranges 0 to VDD V
DC Leakage Current ±1 μA max
Input Capacitance 20 pF typ
LOGIC INPUTS
Input High Voltage, V
2 V min 2.7 V ≤ VDD ≤ 3.6 V
Input Low Voltage, V
0.3 × VDD V max 1.8 V ≤ VDD < 2.7 V
0.8 V max 2.7 V ≤ VDD ≤ 3.6 V
Input Current, IIN, SCLK Pin ±1 μA max Typically 20 nA, VIN = 0 V or VDD
Input Current, IIN, CS Pin
Input Capacitance, CIN 10 pF max Sample tested at 25°C to ensure compliance
= 3.4 MHz, f
SCLK
0.7 × VDD V min 1.6 V ≤ VDD < 2.7 V
INH
0.2 × VDD V max 1.6 V ≤ VDD < 1.8 V
INL
= 100 kSPS, unless otherwise noted. TA = T
SAMPLE
±1 μA t
yp
to T
MIN
fa = 29.1 kHz, fb = 29.9 kHz; see the Terminology
tion
sec
Maximum specifications apply as typical figures when
= 1.6 V
V
DD
Guaranteed no missed codes to 12 bits; see the
Terminology section
, unless otherwise noted.
MAX
Rev. C | Page 3 of 28
AD7466/AD7467/AD7468
www.BDTIC.com/ADI
Parameter B Version Unit Test Conditions/Comments
LOGIC OUTPUTS
Output High Voltage, VOH V
Output Low Voltage, VOL 0.2 V max I
Floating-State Leakage Current ±1 μA max
Floating-State Output Capacitance 10 pF max
Output Coding
CONVERSION RATE
Conversion Time 4.70 μs max 16 SCLK cycles with SCLK at 3.4 MHz
Throughput Rate 200 kSPS max See the Serial Interface section
POWER REQUIREMENTS
VDD 1.6/3.6 V min/max
IDD Digital inputs = 0 V or VDD
Normal Mode (Operational) 300 μA max VDD = 3 V, f
110 μA typ VDD = 3 V, f
20 μA typ VDD = 3 V, f
240 μA max VDD = 2.5 V, f
80 μA typ VDD = 2.5 V, f
16 μA typ VDD = 2.5 V, f
165 μA max VDD = 1.8 V, f
50 μA typ VDD = 1.8 V, f
10 μA typ VDD = 1.8 V, f
Power-Down Mode 0.1 μA max SCLK on or off, typically 8 nA
Power Dissipation See the Power Consumption section
Normal Mode (Operational) 0.9 mW max VDD = 3 V, f
0.6 mW max VDD = 2.5 V, f
0.3 mW max VDD = 1.8 V, f
Power-Down Mode 0.3 μW max VDD = 3 V
− 0.2 V min I
DD
Straight (natural)
y
binar
= 200 μA, VDD = 1.6 V to 3.6 V
SOURCE
= 200 μA
SINK
= 100 kSPS
SAMPLE
= 50 kSPS
SAMPLE
= 10 kSPS
SAMPLE
= 100 kSPS
SAMPLE
= 50 kSPS
SAMPLE
= 10 kSPS
SAMPLE
= 100 kSPS
SAMPLE
= 50 kSPS
SAMPLE
= 10 kSPS
SAMPLE
= 100 kSPS
SAMPLE
= 100 kSPS
SAMPLE
= 100 kSPS
SAMPLE
Rev. C | Page 4 of 28
AD7466/AD7467/AD7468
www.BDTIC.com/ADI
AD7467
VDD = 1.6 V to 3.6 V, f
The temperature range for the B version is −40°C to +85°C.
Table 2.
Parameter B Version Unit Test Conditions/Comments
DYNAMIC PERFORMANCE
Signal-to-Noise and Distortion (SINAD) 61 dB min See the Terminology section
Total Harmonic Distortion (THD) −72 dB max See the Terminology section
Peak Harmonic or Spurious Noise (SFDR) −74 dB max See the Terminology section
Intermodulation Distortion (IMD) fa = 29.1 kHz, fb = 29.9 kHz; see the Terminology section
Second-Order Terms −83 dB typ
Third-Order Terms −83 dB typ
Aperture Delay 10 ns typ
Aperture Jitter 40 ps typ
Full Power Bandwidth 3.2 MHz typ @ 3 dB, 2.5 V ≤ VDD ≤ 3.6 V
1.9 MHz typ @ 3 dB, 1.6 V ≤ VDD ≤ 2.2 V
750 kHz typ @ 0.1 dB, 2.5 V ≤ VDD ≤ 3.6 V
450 kHz typ @ 0.1 dB, 1.6 V ≤ VDD ≤ 2.2 V
DC ACCURACY
Resolution 10 Bits
Integral Nonlinearity ±0.5 LSB max See the Terminology section
Differential Nonlinearity ±0.5 LSB max
Offset Error ±0.2 LSB max See the Terminology section
Gain Error ±0.2 LSB max See the Terminology section
Total Unadjusted Error (TUE) ±1 LSB max See the Terminology section
ANALOG INPUT
Input Voltage Ranges 0 to VDD V
DC Leakage Current ±1 μA max
Input Capacitance 20 pF typ
LOGIC INPUTS
Input High Voltage, V
2 V min 2.7 V ≤ VDD ≤ 3.6 V
Input Low Voltage, V
0.3 × VDD V max 1.8 V ≤V DD < 2.7 V
0.8 V max 2.7 V ≤ VDD ≤ 3.6 V
Input Current, IIN, SCLK Pin ±1 μA max Typically 20 nA, VIN = 0 V or VDD
Input Current, IIN, CS Pin
Input Capacitance, CIN 10 pF max Sample tested at 25°C to ensure compliance
LOGIC OUTPUTS
Output High Voltage, VOH V
Output Low Voltage, VOL 0.2 V max I
Floating-State Leakage Current ±1 μA max
Floating-State Output Capacitance 10 pF max Sample tested at 25°C to ensure compliance
Output Coding
CONVERSION RATE
Conversion Time 3.52 μs max 12 SCLK cycles with SCLK at 3.4 MHz
Throughput Rate 275 kSPS max See the Serial Interface section
= 3.4 MHz, f
SCLK
0.7 × VDD V min 1.6 V ≤ VDD < 2.7 V
INH
0.2 × VDD V max 1.6 V ≤ VDD < 1.8 V
INL
= 100 kSPS, unless otherwise noted. TA = T
SAMPLE
±1 μA t
− 0.2 V min I
DD
Straight (natural)
y
binar
yp
MIN
Maximum/minimum specifications apply as typical figures
when V
Maximum specifications apply as typical figures when
V
DD
Guaranteed no missed codes to 10 bits; see the
Terminology section
SOURCE
SINK
= 1.6 V, fIN = 30 kHz sine wave
DD
= 1.6 V
= 200 μA, VDD = 1.6 V to 3.6 V
= 200 μA
to T
, unless otherwise noted.
MAX
Rev. C | Page 5 of 28
AD7466/AD7467/AD7468
www.BDTIC.com/ADI
Parameter B Version Unit Test Conditions/Comments
POWER REQUIREMENTS
VDD 1.6/3.6 V min/max
IDD Digital inputs = 0 V or VDD
Normal Mode (Operational) 210 μA max VDD = 3 V, f
170 μA max VDD = 2.5 V, f
140 μA max VDD = 1.8 V, f
Power-Down Mode 0.1 μA max SCLK on or off, typically 8 nA
Power Dissipation See the Power Consumption section
Normal Mode (Operational) 0.63 mW max VDD = 3 V, f
0.42 mW max VDD = 2.5 V, f
0.25 mW max VDD = 1.8 V, f
Power-Down Mode 0.3 μW max VDD = 3 V
= 100 kSPS
SAMPLE
SAMPLE
SAMPLE
= 100 kSPS
SAMPLE
SAMPLE
SAMPLE
= 100 kSPS
= 100 kSPS
= 100 kSPS
= 100 kSPS
Rev. C | Page 6 of 28
AD7466/AD7467/AD7468
www.BDTIC.com/ADI
AD7468
VDD = 1.6 V to 3.6 V, f
The temperature range for the B version is −40°C to +85°C.
Table 3.
Parameter B Version Unit Test Conditions/Comments
DYNAMIC PERFORMANCE
Signal-to-Noise and Distortion (SINAD) 49 dB min See the Terminology section
Total Harmonic Distortion (THD) −66 dB max See the Terminology section
Peak Harmonic or Spurious Noise
(SFDR)
Intermodulation Distortion (IMD) fa = 29.1 kHz, fb = 29.9 kHz; see the Terminology section
Second-Order Terms −77 dB typ
Third-Order Terms −77 dB typ
Aperture Delay 10 ns typ
Aperture Jitter 40 ps typ
Full Power Bandwidth 3.2 MHz typ @ 3 dB, 2.5 V ≤ VDD ≤ 3.6 V
1.9 MHz typ @ 3 dB, 1.6 V ≤ VDD ≤ 2.2 V750 kHz typ @ 0.1 dB, 2.5 V ≤ VDD ≤ 3.6 V450 kHz typ @ 0.1 dB, 1.6 V ≤ VDD ≤ 2.2 V
DC ACCURACY
Resolution 8 Bits
Integral Nonlinearity ±0.2 LSB max See the Terminology section
Differential Nonlinearity ±0.2 LSB max
Offset Error ±0.1 LSB max See the Terminology section
Gain Error ±0.1 LSB max See the Terminology section
Total Unadjusted Error (TUE) ±0.3 LSB max See the Terminology section
ANALOG INPUT
Input Voltage Ranges 0 to VDD V
DC Leakage Current ±1 μA max
Input Capacitance 20 pF typ
LOGIC INPUTS
Input High Voltage, V
2 V min 2.7 V ≤ VDD ≤ 3.6 V
Input Low Voltage, V
0.3 × VDD V max 1.8 V ≤ VDD < 2.7 V
0.8 V max 2.7 V ≤ VDD ≤ 3.6 V
Input Current, IIN, SCLK Pin ±1 μA max Typically 20 nA, VIN = 0 V or VDD
Input Current, IIN, CS Pin
Input Capacitance, CIN 10 pF max Sample tested at 25°C to ensure compliance
LOGIC OUTPUTS
Output High Voltage, VOH V
Output Low Voltage, VOL 0.2 V max I
Floating-State Leakage Current ±1 μA max
Floating-State Output Capacitance 10 pF max Sample tested at 25°C to ensure compliance
Output Coding
CONVERSION RATE
Conversion Time 2.94 μs max 10 SCLK cycles with SCLK at 3.4 MHz
Throughput Rate 320 kSPS max See the Serial Interface section
= 3.4 MHz, f
SCLK
0.7 × VDD V min 1.6 V ≤ VDD < 2.7 V
INH
0.2 × VDD V max 1.6 V ≤ VDD < 1.8 V
INL
= 100 kSPS, unless otherwise noted. TA = T
SAMPLE
Maximum/minimum specifications apply as typical figures
when V
−66 dB max See the Terminology section
Maximum specifications apply as typical figures when
V
Guaranteed no missed codes to 8 bits; see the Terminology
sec
±1 μA t
− 0.2 V min I
DD
Straight (natural)
y
binar
yp
SOURCE
SINK
= 1.6 V, fIN = 30 kHz sine wave
DD
= 1.6 V
DD
tion
= 200 μA; VDD = 1.6 V to 3.6 V
= 200 μA
MIN
to T
, unless otherwise noted.
MAX
Rev. C | Page 7 of 28
AD7466/AD7467/AD7468
www.BDTIC.com/ADI
Parameter B Version Unit Test Conditions/Comments
POWER REQUIREMENTS
VDD 1.6/3.6 V min/max
IDD Digital inputs = 0 V or VDD
Normal Mode (Operational) 190 μA max VDD = 3 V, f
155 μA max VDD = 2.5 V, f
120 μA max VDD = 1.8 V, f
Power-Down Mode 0.1 μA max SCLK on or off, typically 8 nA
Power Dissipation See the Power Consumption section
Normal Mode (Operational) 0.57 mW max VDD = 3 V, f
0.4 mW max VDD = 2.5 V, f
0.2 mW max VDD = 1.8 V, f
Power-Down Mode 0.3 μW max VDD = 3 V
SAMPLE
SAMPLE
SAMPLE
SAMPLE
SAMPLE
SAMPLE
= 100 kSPS
= 100 kSPS
= 100 kSPS
= 100 kSPS
= 100 kSPS
= 100 kSPS
Rev. C | Page 8 of 28
AD7466/AD7467/AD7468
www.BDTIC.com/ADI
TIMING SPECIFICATIONS
For all devices, VDD = 1.6 V to 3.6 V; TA = T
signals are specified with tr = tf = 5 ns (10% to 90% of V
Table 4.
Parameter Limit at T
f
3.4 MHz max Mark/space ratio for the SCLK input is 40/60 to 60/40.
SCLK
MIN
, T
Unit Description
MAX
10 kHz min 1.6 V ≤ VDD ≤ 3 V; minimum f
20 kHz min VDD = 3.3 V; minimum f
150 kHz min VDD = 3.6 V; minimum f
t
16 × t
CONVER T
12 × t
10 × t
AD7466.
SCLK
AD7467.
SCLK
AD7468.
SCLK
Acquisition Time
780 ns max VDD = 1.6 V.
640 ns max 1.8 V ≤ VDD ≤ 3.6 V.
t
10 ns min
QUIET
t1 10 ns min
t2 55 ns min
t3 55 ns max
t4 140 ns max
t5 0.4 t
t6 0.4 t
ns min SCLK low pulse width.
SCLK
ns min SCLK high pulse width.
SCLK
t7 10 ns min
t8 60 ns max
7 ns min SCLK falling edge to SDATA three-state.
MIN
to T
, unless otherwise noted. Sample tested at 25°C to ensure compliance. All input
MAX
) and timed from a voltage level of 1.4 V.
DD
at which specifications are guaranteed.
SCLK
at which specifications are guaranteed.
SCLK
at which specifications are guaranteed.
SCLK
Acquisition time/power-up time from power-down. See the Terminology section.
quisition time is the time required for the part to acquire a full-scale step
The ac
input value within ±1 LSB or a 30 kHz ac input value within ±0.5 LSB.
Minimum quiet time required between bus relinquish and the start of the next
nversion.
co
Minimum CS
to SCLK setup time. If VDD = 1.6 V and f
CS
pulse width.
= 3.4 MHz, t2 has to be 192 ns
SCLK
minimum in order to meet the maximum figure for the acquisition time.
Delay from CS
until SDATA is three-state disabled. Measured with the load circuit
in Figure 2 and defined as the time required for the output to cross the VIH or VIL
voltage.
Data access time after SCLK falling edge. M
and defined as t
he time required for the output to cross the V
SCLK to data valid hold time. Measur
defined as the ti
me required for the output to cross the V
SCLK falling edge to SDATA three-state. t
easured with the load circuit in Figure 2
ed with the load circuit in Figure 2 and
or VIL voltage.
IH
is derived from the measured time taken
8
by the data outputs to change 0.5 V when loaded with the circuit in Figure 2. The
ed number is then extrapolated back to remove the effects of charging or
measur
discharging the 50 pF capacitor. This means that the time, t
, quoted in the timing
8
characteristics, is the true bus relinquish time of the part, and is independent of
the bus loading.
or VIL voltage.
IH
200μAI
TO OUTPUT
PIN
C
L
50pF
200μAI
Figure 2. Load Circuit for Digital Out
Rev. C | Page 9 of 28
OL
1.4V
OH
put Timing Specifications
02643-002
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