20 MHz maximum external clock rate
Second-order modulator
16 bits no missing codes
±2 LSB INL typical at 16 bits
3.5 μV/°C maximum offset drift
On-board digital isolator
On-board reference
Low power operation: 20 mA maximum at 5.25 V
−40°C to +105°C operating range
16-lead SOIC package
Safety and regulatory approvals
UL recognition
5000 V rms for 1 minute per UL 1577
CSA Component Acceptance Notice #5A
VDE Certificate of Conformity
DIN V VDE V 0884-10 (VDE V 0884-10):2006-12
V
= 891 V peak
IORM
APPLICATIONS
AC motor controls
Data acquisition systems
A/D + opto-isolator replacements
FUNCTIONAL BLOCK DIAGRAM
DD1
AD7401
GENERAL DESCRIPTION
The AD74011 is a second-order, sigma-delta (Σ-Δ) modulator
that converts an analog input signal into a high speed, 1-bit data
stream with on-chip digital isolation based on Analog Devices,
Inc. iCoupler® technology. The AD7401 operates from a 5 V
power supply and accepts a differential input signal of ±200 mV
(±320 mV full scale). The analog input is continuously sampled
by the analog modulator, eliminating the need for external
sample-and-hold circuitry. The input information is contained
in the output stream as a density of ones with a data rate up to
20 MHz. The original information can be reconstructed with an
appropriate digital filter. The serial I/O can use a 5 V or a 3 V
supply (V
The serial interface is digitally isolated. High speed CMOS,
combined with monolithic air core transformer technology,
means the on-chip isolation provides outstanding performance
characteristics, superior to alternatives such as optocoupler
devices. The part contains an on-chip reference. The AD7401
is offered in a 16-lead SOIC and has an operating temperature
range of −40°C to +105°C.
An internal clock version, AD7400, is also available.
1
Protected by U.S. Patents 5,952,849; 6,873,065; and 7,075,329.
DD2
).
DD2
VIN+
VIN–
REF
H
/
T
U
B
F
Σ-∆ ADC
CONTROL LOGIC
GND
1
Rev. D
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Anal og Devices for its use, nor for any infringements of patents or ot her
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarks and registered trademarks are the property of their respective owners.
Updated VDE Certification Throughout ......................................1
Changes to Table 6.............................................................................7
12/06—Rev. 0 to Rev. A
Changes to Features and General Description ..............................1
Changes to Table 1.............................................................................3
Changes to Table 2.............................................................................4
Changes to Table 6.............................................................................7
Changes to Table 8.............................................................................8
Changes to Circuit Information Section ..................................... 13
Changes to Figure 27...................................................................... 15
1/06—Revision 0: Initial Version
Rev. D | Page 2 of 20
AD7401
SPECIFICATIONS
V
= 4.5 V to 5.25 V, V
DD1
f
= 16 MHz maximum, tested with Sinc3 filter, 256 decimation rate, as defined by Verilog code, unless otherwise noted.
MCLK
= 3 V to 5.5 V, VIN+ = −200 mV to +200 mV, and VIN− = 0 V (single-ended); TA = T
DD2
MIN
to T
MAX
,
Table 1.
Parameter Y Version
STATIC PERFORMANCE
Resolution
Integral Nonlinearity
3
16 Bits min Filter output truncated to 16 bits
±15 LSB max −40°C to +85°C; ±2 LSB typical; f
1, 2
Unit Test Conditions/Comments
= 20 MHz maximum4
MCLK
±25 LSB max >85°C to 105°C
±55 LSB max f
Differential Nonlinearity
Offset Error
3
3
±0.9 LSB max
±0.6 mV max f
= 20 MHz maximum4; VIN+ = −250 mV to +250 mV
MCLK
Guaranteed no missed codes to 16 bits;
f
= 20 MHz maximum4; VIN+ = −250 mV to +250 mV
MCLK
= 20 MHz maximum4; VIN+ = −250 mV to +250 mV
MCLK
±50 μV typ TA = 25°C
Offset Drift vs. Temperature
3.5 μV/°C max −40°C to +105°C
1 μV/°C typ
Offset Drift vs. V
DD1
120 μV/V typ
Gain Error3 ±1.6 mV max −40°C to +85°C
±2 mV max >85°C to 105°C
±1 mV typ f
= 20 MHz maximum4; VIN+ = −250 mV to +250 mV
MCLK
Gain Error Drift vs. Temperature 23 μV/°C typ −40°C to +105°C
Gain Error Drift vs. V
110 μV/V typ
DD1
ANALOG INPUT
Input Voltage Range
±200 mV min/mV max For specified performance; full range ±320 mV
Dynamic Input Current ±9 μA max VIN+ = 400 mV, VIN− = 0 V
DC Leakage Current ±0.5 μA max
Input Capacitance 10 pF typ
DYNAMIC SPECIFICATIONS VIN+ = 5 kHz, 400 mV p-p sine
Signal-to-(Noise + Distortion) Ratio (SINAD)3 70 dB min −40°C to +85°C; f
68 dB min −40°C to +85°C; f
= 9 MHz to 20 MHz4
MCLK
= 5 MHz to <9 MHz
MCLK
65 dB min >85°C to 105°C
65 dB min f
= 20 MHz maximum4; VIN+ = −250 mV to +250 mV
MCLK
81 dB typ
Signal-to-Noise Ratio (SNR) 80 dB min −40°C to +105°C; 82 dB typ
80 dB min f
Total Harmonic Distortion (THD)3 −92 dB typ f
= 20 MHz maximum4; VIN+ = −250 mV to +250 mV
MCLK
= 20 MHz maximum4; VIN+ = −250 mV to +250 mV
MCLK
Peak Harmonic or Spurious Noise (SFDR)3 −92 dB typ
Effective Number of Bits (ENOB)3 11.5 Bits
Isolation Transient Immunity3 25 kV/μs min
LOGIC INPUTS
Input High Voltage, VIH 0.8 × V
Input Low Voltage, VIL 0.2 × V
30 kV/μs typ
V min
DD2
V max
DD2
Input Current, IIN ±0.5 μA max
Input Capacitance, C
5
10 pF max
IN
Rev. D | Page 3 of 20
AD7401
T
Parameter Y Version
1, 2
Unit Test Conditions/Comments
LOGIC OUTPUTS
Output High Voltage, VOH V
− 0.1 V min IO = −200 μA
DD2
Output Low Voltage, VOL 0.4 V max IO = +200 μA
POWER REQUIREMENTS
V
4.5/5.25 V min/V max
DD1
V
3/5.5 V min/V max
DD2
6
I
12 mA max V
DD1
7
I
DD2
8 mA max V
4 mA max V
1
Temperature range is −40°C to +85°C.
2
All voltages are relative to their respective ground.
3
See the section. Terminology
4
For f
> 16 MHz to 20 MHz, mark space ratio is 48/52 to 52/48, V
MCLK
5
Sample tested during initial release to ensure compliance.
6
See . Figure 15
7
See .Figure 17
= V
= 5 V ± 5%, and TA = −40°C to +85°C.
DD1
DD2
= 5.25 V
DD1
= 5.5 V
DD2
= 3.3 V
DD2
TIMING SPECIFICATIONS
V
= 4.5 V to 5.25 V, V
DD1
Table 2.
Parameter Limit at T
2, 3
f
20 MHz max Master clock input frequency
MCLKIN
5 MHz min Master clock input frequency
4
t
1
4
t
2
t3 0.4 × t
t
4
1
Sample tested during initial release to ensure compliance
2
Mark space ratio for clock input is 40/60 to 60/40 for f
3
V
= V
= 5 V ± 5% for f
DD1
DD2
4
Measured with the load circuit of and defined as the time required for the output to cross 0.8 V or 2.0 V. Figure 2
= 3 V to 5.5 V, TA = T
DD2
, T
MIN
MAX
to T
MAX
, unless otherwise noted.1
MIN
Unit Description
25 ns max Data access time after MCLK rising edge
15 ns min Data hold time after MCLK rising edge
ns min Master clock low time
MCLKIN
0.4 × t
ns min Master clock high time
MCLKIN
> 16 MHz to 20 MHz.
MCLKIN
to 16 MHz and 48/52 to 52/48 for f
MCLKIN
> 16 MHz to 20 MHz.
MCLKIN
O OUTPUT
PIN
25pF
C
200µAI
L
200µAI
OL
1.6V
OH
05851-002
Figure 2. Load Circuit for Digital Output Timing Specifications
t
4
MCLKIN
MDAT
t
1
Figure 3. Data Timing
Rev. D | Page 4 of 20
t
2
t
3
05851-003
AD7401
INSULATION AND SAFETY-RELATED SPECIFICATIONS
Table 3.
Parameter Symbol Value Unit Conditions
Input-to-Output Momentary Withstand Voltage V
Minimum External Air Gap (Clearance) L(I01) 8.1 min mm
Minimum External Tracking (Creepage) L(I02) 7.46 min mm
Minimum Internal Gap (Internal Clearance) 0.017 min mm Insulation distance through insulation
Tracking Resistance (Comparative Tracking Index) CTI >175 V DIN IEC 112/VDE 0303 Part 1
Isolation Group IIIa Material Group (DIN VDE 0110, 1/89, Table I)
REGULATORY INFORMATION
Table 4.
UL1 CSA VDE2
Recognized under 1577
Component Recognition Program
5000 V rms Isolation Voltage
File E214100 File 205078 File 2471900-4880-0001
1
In accordance with UL 1577, each AD7401 is proof tested by applying an insulation test voltage ≥ 6000 V rms for 1 second (current leakage detection limit = 15 μA).
2
In accordance with DIN V VDE V 0884-10, each AD7401 is proof tested by applying an insulation test voltage ≥ 1671 V peak for 1 second (partial discharge detection
limit = 5 pC).
Approved under CSA Component
1
Acceptance Notice #5A
Reinforced insulation per CSA
60950-1-03 and IEC 60950-1, 630 V
rms maximum working voltage
5000 min V rms 1-minute duration
ISO
Measured from input terminals to output
terminals, shortest distance through air
Measured from input terminals to output
terminals, shortest distance path along body
Certified according to DIN V VDE V 0884-10 (VDE V 0884-
10):2006-122
Reinforced insulation per DIN V VDE V 0884-10 (VDE V 0884-
10):2006-12, 891V peak
Rev. D | Page 5 of 20
AD7401
DIN V VDE V 0884-10 (VDE V 0884-10) INSULATION CHARACTERISTICS
This isolator is suitable for reinforced electrical isolation only within the safety limit data. Maintenance of the safety data is ensured by
means of protective circuits.
Table 5.
Description Symbol Characteristic Unit
INSTALLATION CLASSIFICATION PER DIN VDE 0110
For Rated Mains Voltage ≤ 300 V rms I–IV
For Rated Mains Voltage ≤ 450 V rms I–II
For Rated Mains Voltage ≤ 600 V rms I–II
CLIMATIC CLASSIFICATION 40/105/21
POLLUTION DEGREE (DIN VDE 0110, TABLE I) 2
MAXIMUM WORKING INSULATION VOLTAGE V
INPUT-TO-OUTPUT TEST VOLTAGE, METHOD B1
V
× 1.875 = VPR, 100% Production Test, tm = 1 sec, Partial Discharge < 5 pC VPR 1671 V peak
HIGHEST ALLOWABLE OVERVOLTAGE (TRANSIENT OVERVOLTAGE, tTR = 10 sec) VTR 6000 V peak
SAFETY-LIMITING VALUES (MAXIMUM VALUE ALLOWED IN THE EVENT OF A FAILURE, ALSO SEE Figure 4)
Case Temperature TS 150 °C
Side 1 Current IS1 265 mA
Side 2 Current IS2 335 mA
INSULATION RESISTANCE AT TS, VIO = 500 V RS >109 Ω
350
891 V peak
IORM
300
250
200
150
100
SAFETY-LIMI TING CURRENT (mA)
50
0
0
Figure 4. Thermal Derating Curve, Dependence of Safety-Limiting Values
with Case Temperature per DIN V VDE V 0884-10
SIDE #2
SIDE #1
50100150200
CASE TEMPE RATURE (°C)
5851-004
Rev. D | Page 6 of 20
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