ANALOG DEVICES AD7156 Service Manual

Ultralow Power, 1.8 V, 3 mm × 3 mm,
V
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FEATURES

Ultralow power
Power supply voltage: 1.8 V to 3.6 V Operation power supply current: 70 μA typical Power-down current: 2 μA typical
Fast response time
Conversion time: 10 ms per channel
Wake-up time from serial interface: 300 μs Adaptive environmental compensation 2 capacitance input channels
Sensor capacitance (C
Sensitivity up to 3 fF 2 modes of operation
Standalone with fixed settings
Interfaced to a microcontroller for user-defined settings 2 detection output flags 2-wire serial interface (I Operating temperature: −40°C to +85°C 10-lead LFCSP package (3 mm × 3 mm × 0.8 mm)

APPLICATIONS

Buttons and switches Proximity sensing Contactless switching Position detection Level detection Portable products
): 0 pF up to 13 pF
SENS
2
C-compatible)
2-Channel Capacitance Converter
AD7156

GENERAL DESCRIPTION

The AD7156 delivers a complete signal processing solution for capacitive sensors, featuring an ultralow power converter with fast response time.
The AD7156 uses an Analog Devices, Inc., capacitance-to­digital converter (CDC) technology, which combines features important for interfacing to real sensors, such as high input sensitivity and high tolerance of both input parasitic ground capacitance and leakage current.
The integrated adaptive threshold algorithm compensates for any variations in the sensor capacitance due to environmental factors like humidity and temperature or due to changes in the dielectric material over time.
By default, the AD7156 operates in standalone mode using the fixed power-up settings and indicates detection on two digital outputs. Alternatively, the AD7156 can be interfaced to a micro­controller via the serial interface, the internal registers can be programmed with user-defined settings, and the data and status can be read from the part.
The AD7156 operates with a 1.8 V to 3.6 V power supply. It is specified over the temperature range of −40°C to +85°C.

FUNCTIONAL BLOCK DIAGRAM

C
SENS1
C
SENS2
Rev. 0
Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Anal og Devices for its use, nor for any infringements of p atents or other rights of third parties that may result from its use. Specifications subject to change without notice. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Trademarks and registered trademarks are the property of their respective owners.
CIN1
EXC1
CIN2
EXC2
MUX
- CDC
AD7156
EXCITATION
DD
DIGITAL
FILTER
THRESHOLD
THRESHOLD
GND
Figure 1.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 781.329.4700 www.analog.com Fax: 781.461.3113 ©2008 Analog Devices, Inc. All rights reserved.
SERIAL
INTERFACE
SCL
SDA
OUT1
OUT2
7726-001
AD7156
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TABLE OF CONTENTS

Features .............................................................................................. 1
Applications ....................................................................................... 1
General Description ......................................................................... 1
Functional Block Diagram .............................................................. 1
Revision History ............................................................................... 2
Specifications ..................................................................................... 3
Timing Specifications .................................................................. 5
Absolute Maximum Ratings ............................................................ 6
ESD Caution .................................................................................. 6
Pin Configuration and Function Descriptions ............................. 7
Typical Performance Characteristics ............................................. 8
Theory of Operation ...................................................................... 11
Capacitance-to-Digital Converter ............................................ 11
CAPDAC ..................................................................................... 11
Comparator and Threshold Modes .......................................... 12
Adaptive Threshold .................................................................... 12
Sensitivity..................................................................................... 12
Data Average ............................................................................... 13
Hysteresis ..................................................................................... 13
Timeout ........................................................................................ 13
Auto-DAC Adjustment .............................................................. 14
Power-Down Timer ................................................................... 14
Register Descriptions ..................................................................... 15
Status Register ............................................................................. 16
Data Registers ............................................................................. 17
Average Registers ........................................................................ 18
Fixed Threshold Registers ......................................................... 18
Sensitivity Registers ................................................................... 18
Timeout Registers ....................................................................... 18
Setup Registers ............................................................................ 19
Configuration Register .............................................................. 20
Power-Down Timer Register .................................................... 21
CAPDAC Registers .................................................................... 21
Serial Number Register .............................................................. 21
Chip ID Register ......................................................................... 21
Serial Interface ................................................................................ 22
Read Operation........................................................................... 22
Write Operation.......................................................................... 22
AD7156 Reset ............................................................................. 23
General Call ................................................................................ 23
Hardware Design Considerations ................................................ 24
Overview ..................................................................................... 24
Parasitic Capacitance to Ground .............................................. 24
Parasitic Resistance to Ground ................................................. 24
Parasitic Parallel Resistance ...................................................... 24
Parasitic Serial Resistance ......................................................... 25
Input Overvoltage Protection ................................................... 25
Input EMC Protection ............................................................... 25
Power Supply Decoupling and Filtering .................................. 25
Application Examples ................................................................ 26
Outline Dimensions ....................................................................... 27
Ordering Guide .......................................................................... 27

REVISION HISTORY

10/08—Revision 0: Initial Version
Rev. 0 | Page 2 of 28
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SPECIFICATIONS

VDD = 1.8 V to 3.6 V, GND = 0 V, temperature range = −40°C to +85°C, unless otherwise noted.
Table 1.
Parameter Min Typ Max Unit
CAPACITIVE INPUT
2, 3
Conversion Input Range, CIN to EXC
3.2 4 pF 4 pF input range
1.6 2 pF 2 pF input range
0.8 1 pF 1 pF input range
0.4 0.5 pF 0.5 pF input range
Resolution
4, 5
2.0 fF 4 pF input range
1.6 fF 2 pF input range
1.4 fF 1 pF input range
1.0 fF 0.5 pF input range
4, 6
Maximum Allowed Capacitance, CIN to GND
Minimum Allowed Resistance, CIN to GND
Maximum Allowed Serial Resistance
4, 6
50 kΩ See Figure 14
4, 6
50 pF
10 MΩ See Figure 10 and Figure 11
Gain Error −20 +20 %
Gain Deviation over Temperature
Gain Matching Between Ranges
Offset Error
4
50 fF CIN and EXC pins disconnected
Offset Deviation over Temperature
Integral Nonlinearity (INL)
Channel-to-Channel Isolation
Power Supply Rejection
4
4 fF/V
4
0.5 %FSR See Figure 17
4
−2 +2 %
4
4
0.05 %
4
60 dB
5 fF
CAPDAC
Full Range 10 12.5 pF
Resolution (LSB)
Differential Nonlinearity (DNL)
Auto-DAC Increment/Decrement
4
200 fF
4
0.25 LSB
4, 7
25 75 % of C
EXCITATION
4, 7
Voltage
±VDD/2 V
Frequency 16 kHz See Figure 18
4, 6
Maximum Allowed Capacitance EXC to GND
Minimum Allowed Resistance EXC to GND
4, 6
1 MΩ See Figure 12 and Figure 13
1000 pF
LOGIC OUTPUTS (OUT1, OUT2)
Output Low Voltage (VOL) 0.4 V I
Output High Voltage (VOH) VDD – 0.6 V I SERIAL INTERFACE INPUTS (SCL, SDA)
Input High Voltage (VIH) 70 % of VDD
Input Low Voltage (VIL) 25 % of VDD
Input Leakage Current ±0.1 ±5 µA
Input Pin Capacitance 6 pF OPEN-DRAIN OUTPUT (SDA)
Output Low Voltage (VOL) 0.4 V
Output High Leakage Current (IOH) 0.1 5 µA V
1
range
IN
Test Conditions/Comments
See Figure 4, Figure 5, and Figure 6
CIN and EXC pins disconnected See Figure 16
See Figure 7, Figure 8, and
= −3 mA
SINK
= +3 mA
SOURCE
= 6.0 mA
SINK
= VDD
OUT
Figure 9
I
Rev. 0 | Page 3 of 28
AD7156
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Parameter Min Typ Max Unit
1
Test Conditions/Comments
POWER REQUIREMENTS
VDD-to-GND Voltage 1.8 3.6 V IDD Current
4, 8
65 75 µA V
≤ 2.7 V, see Figure 20
DD
70 85 µA VDD = 3.6 V, see Figure 20 IDD Current Power-Down Mode
4, 8
2 10 µA V
≤ 2.7 V, see Figure 21
DD
2 17 µA VDD = 3.6 V, see Figure 21
1
Capacitance units: 1 pF = 1 × 10
2
The CAPDAC can be used to shift (offset) the input range. The total capacitance of the sensor can therefore be up to the sum of the CAPDAC value and the conversion
input range. With the auto-DAC feature, the CAPDAC is adjusted automatically when the CDC input value is lower than 25% or higher than 75% of the CDC nominal input range.
3
The maximum capacitance of the sensor connected between the EXCx and CINx pins is equal to the sum of the minimum guaranteed value of the CAPDAC and the
minimum guaranteed input range.
4
The maximum specification is not production tested but is supported by characterization data at initial product release.
5
The resolution of the converter is not limited by the output data format or output data LSB (least significant bit) size, but by the converter and system noise level. The
noise-free resolution is defined as level of peak-to-peak noise coming from the converter itself, with no connection to the CIN and EXC pins.
6
These specifications are understood separately. Any combination of the capacitance to ground and serial resistance may result in additional errors, for example gain
error, gain drift, offset error, offset drift, and power supply rejection.
7
Specification is not production tested but is guaranteed by design.
8
Digital inputs equal to VDD or GND.
−12
F; 1 fF = 10
−15
F.
Rev. 0 | Page 4 of 28
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TIMING SPECIFICATIONS

VDD = 1.8 V to 3.6 V, GND = 0 V, Input Logic 0 = 0 V, Input Logic 1 = VDD, temperature range = −40°C to +85°C, unless otherwise noted.
Table 2.
Parameter Min Typ Max Unit Test Conditions/Comments
CONVERTER
Conversion Time
Wake-Up Time from Power-Down Mode
Power-Up Time
Reset Time SERIAL INTERFACE
SCL Frequency 0 400 kHz
SCL High Pulse Width, t
SCL Low Pulse Width, t
SCL, SDA Rise Time, tR 0.3 µs
SCL, SDA Fall Time, t
Hold Time (Start Condition), t
Setup Time (Start Condition), t
Data Setup Time, t
Setup Time (Stop Condition), t
Data Hold Time (Master), t
Bus-Free Time (Between Stop and Start Conditions), t
1
Conversion time is 304 internal clock cycles for both channels (nominal clock 16 kHz); the internal clock frequency is equal to the specified excitation frequency.
2
Specification is not production tested but is supported by characterization data at initial product release.
3
Wake-up time is the maximum delay between the last SCL edge writing the configuration register and the start of conversion.
4
Power-up time is the maximum delay between the VDD crossing the minimum level (1.8 V) and either the start of conversion or when ready to receive a serial
interface command.
5
Reset time is the maximum delay between the last SCL edge writing the reset command and either the start of conversion or when ready to receive a serial
interface command.
6
Sample tested during initial release to ensure compliance.
7
All input signals are specified with input rise/fall times = 3 ns, measured between the 10% and 90% points. Timing reference points at 50% for inputs and outputs.
Output load = 10 pF.
1
2, 3
2, 4
2 ms
2, 5
6, 7
0.6 µs
HIGH
1.3 µs
LOW
F
0.6 µs After this period, the first clock is generated.
HD;STA
SU;STA
0.1 µs
SU;DAT
SU;STO
10 ns
HD;DAT
t
LOW
0.3 ms
0.6 µs Relevant for repeated start condition.
0.6 µs
t
R
20 ms Both channels, 10 ms per channel.
2 ms See Figure 2.
0.3 µs
1.3 µs
BUF
t
F
t
HD;STA
SCL
SDA
t
t
BUF
PS
HD;STA
t
HD;DAT
t
HIGH
t
SU;DAT
t
SU;STA
S
Figure 2. Serial Interface Timing Diagram
Rev. 0 | Page 5 of 28
t
SU;STO
P
07726-002
AD7156
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ABSOLUTE MAXIMUM RATINGS

TA = 25°C, unless otherwise noted.
Table 3.
Parameter Rating
Positive Supply Voltage VDD to GND
Voltage on Any Input or Output to GND –0.3 V to VDD + 0.3 V ESD Rating
ESD Association Human Body Model, S5.1
Field-Inducted Charged Device Model Operating Temperature Range −40°C to +85°C Storage Temperature Range –65°C to +150°C Maximum Junction Temperature 150°C LFCSP Package
θJA, Thermal Impedance to Air
θJC, Thermal Impedance to Case
Reflow Soldering (Pb-Free)
Peak Temperature 260(0/−5)°C
Time at Peak Temperature 10 sec to 40 sec
0.3 V to +3.9 V
4 kV 500 V
49°C/W 3°C/W
Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those indicated in the operational section of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.

ESD CAUTION

Rev. 0 | Page 6 of 28
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PIN CONFIGURATION AND FUNCTION DESCRIPTIONS

1
GND
VDD
2
CIN2
CIN1
EXC2
NOTES
1. THE EXPOSED PAD MUST BE CONNECTED TO GND OR IT MUST BE ISOLATED (FLOATING).
AD7156
3
TOP VIEW
(Not to Scale)
4
5
Figure 3. Pin Configuration
Table 4. Pin Function Descriptions
Pin No. Mnemonic Description
1 GND Ground Pin. 2 VDD
Power Supply Voltage. This pin should be decoupled to GND using a low impedance capacitor, such as a
0.1 F X7R multilayer ceramic capacitor.
3 CIN2
CDC Capacitive Input Channel 2. The measured capacitance (sensor) is connected between the EXC2 pin and the CIN2 pin. If not used, this pin can be left open circuit or be connected to GND. When a conversion is performed on Channel 2, the CIN2 pin is internally connected to a high impedance input of the Σ-∆ modulator. When a conversion is performed on the other channel or in idle mode or power-down mode,
the CIN2 pin is internally disconnected and left floating by the part.
4 CIN1
CDC Capacitive Input Channel 1. The measured capacitance (sensor) is connected between the EXC1 pin and the CIN1 pin. If not used, this pin can be left open circuit or be connected to GND. When a conversion is performed on Channel 1, the CIN1 pin is internally connected to a high impedance input of the Σ-∆ modulator. When a conversion is performed on the other channel or in idle mode or power-down mode,
the CIN1 pin is internally disconnected and left floating by the part.
5 EXC2
CDC Excitation Output Channel 2. The measured capacitance is connected between the EXC2 pin and the CIN2 pin. If not used, this pin should be left as an open circuit. When a conversion is performed on Channel 2, the EXC2 pin is internally connected to the output of the excitation signal driver. When a conversion is per­formed on the other channel or in idle mode or power-
to GND.
6 EXC1
CDC Excitation Output Channel 1. The measured capacitance is connected between the EXC1 pin and the CIN1 pin. If not used, this pin should be left as an open circuit. When a conversion is performed on Channel 1, the EXC1 pin is internally connected to the output of the excitation signal driver. When a conversion is per­formed on the other channel or in idle mode or power-
to GND.
7 OUT1 Logic Output Channel 1. A high level on this output indicates proximity detected on CIN1. 8 OUT2 Logic Output Channel 2. A high level on this output indicates proximity detected on CIN2. 9 SCL
Serial Interface Clock Input. This pin connects to the master clock line and requires a pull-up resistor if not provided elsewhere in the system.
10 SDA
Serial Interface Bidirectional Data. This pin connects to the master data line and requires a pull-up resistor if not provided elsewhere in the system.
10
SDA
SCL
9
OUT2
8
7
OUT1
EXC1
6
07726-003
down mode, the EXC2 pin is internally connected
down mode, the EXC1 pin is internally connected
Rev. 0 | Page 7 of 28
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TYPICAL PERFORMANCE CHARACTERISTICS

2.0
1.8
1.6
1.4
1.2
1.0
0.8
OFFSET ERROR (pF)
0.6
0.4
0.2
0
0 50 100 150 200 250 300
CAPACITANCE CIN T O GROUND (pF )
1.8V
3.3V
Figure 4. Capacitance Input Offset Error vs. Capacitance CIN to GND,
= 1.8 V and 3.3 V, EXC Pin Open Circuit
V
DD
5
0
–5
–10
1.8V
–15
GAIN ERROR (%F SR)
–20
3.3V
1
0
–1
–2
OFFSET ERROR (fF)
–3
07726-004
–4
0 500 1000 1500 2000
CAPACITANCE EXC TO GROUND (pF )
3.3V
1.8V
07726-007
Figure 7. Capacitance Input Offset Error vs. Capacitance EXC to GND,
VDD = 1.8 V and 3.3 V, CIN Pin Open Circuit
1
0
–1
–2
GAIN ERROR (%F SR)
–3
3.3V
1.8V
–25
0 50 100 150 200 250 300
CAPACITANCE CIN T O GROUND (pF )
Figure 5. Capacitance Input Gain Error vs. Capacitance CIN to GND,
= 1.8 V and 3.3 V, CIN to EXC = 3 pF
V
DD
5
0
–5
–10
–15
GAIN ERROR (%F SR)
–20
–25
0 50 100 150 200 250 300
1.8V
CAPACITANCE CIN T O GROUND (pF )
3.3V
Figure 6. Capacitance Input Gain Error vs. Capacitance CIN to GND,
= 1.8 V and 3.3 V, CIN to EXC = 9 pF
V
DD
07726-005
07726-006
Rev. 0 | Page 8 of 2
–4
0 500 1000 1500 2000
CAPACITANCE EXC TO GROUND (pF )
Figure 8. Capacitance Input Gain Error vs. Capacitance EXC to GND,
VDD = 1.8 V and 3.3 V, CIN to EXC = 3 pF
1
0
–1
–2
GAIN ERROR (%F SR)
–3
–4
0 500 1000 1500 2000
CAPACITANCE EXC TO GROUND (pF )
3.3V
1.8V
Figure 9. Capacitance Input Gain Error vs. Capacitance EXC to GND,
= 1.8 V and 3.3 V, CIN to EXC = 9 pF
V
DD
8
07726-008
07726-009
AD7156
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2
0.2
0
3.3V
–2
–4
–6
GAIN ERROR (%F SR)
–8
–10
1 10 100 1k
1.8V
RESISTANCE CIN T O GND (M)
Figure 10. Capacitance Input Gain Error vs. Resistance CIN to GND,
= 1.8 V and 3.3 V, CIN to EXC = 3 pF
V
DD
2
0
3.3V
–2
–4
–6
GAIN ERROR (%F SR)
–8
–10
1 10 100 1k
1.8V
RESISTANCE CI N TO GND (M)
Figure 11. Capacitance Input Gain Error vs. Resistance CIN to GND,
= 1.8 V and 3.3 V, CIN to EXC = 9 pF
V
DD
0
–0.2
–0.4
–0.6
GAIN ERROR (%F SR)
–0.8
07726-010
–1.0
3.3V
1.8V
07726-013
0.1 1 10 100 1k
RESISTANCE EXC TO GROUND (M )
Figure 13. Capacitance Input Gain Error vs. Resistance EXC to GND,
= 1.8 V and 3.3 V, CIN to EXC = 9 pF
V
DD
1
0
–1
–2
–3
–4
GAIN ERROR (%F SR)
–5
1
07726-01
–6
–7
0 20406080100
SERIAL RESI STANCE (k)
1.8V
3.3V
07726-014
Figure 14. Capacitance Input Gain Error vs. Serial Resistance,
= 1.8 V and 3.3 V, CIN to EXC = 3 pF
V
DD
0.2
0
–0.2
–0.4
–0.6
GAIN ERROR (%F SR)
–0.8
–1.0
1.8V
3.3V
0.1 1 10 100 1k
RESISTANCE EXC TO GROUND (M )
Figure 12. Capacitance Input Gain Error vs. Resistance EXC to GND,
= 1.8 V and 3.3 V, CIN to EXC = 3 pF
V
DD
2
07726-01
10
1.8V
0
–10
–20
–30
GAIN ERROR (%F SR)
–40
–50
1 10 100 1k
Figure 15. Capacitance Input Gain Error vs. Parallel Resistance,
= 1.8 V and 3.3 V, CIN to EXC = 3 pF
V
DD
Rev. 0 | Page 9 of 28
3.3V
07726-015
PARELLEL RE SISTANCE (M)
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