116 dB dynamic range
Digital VGA
I/Q demodulators
Active low-pass filters
Dual wideband ADC
Programmable decimation and channel filters
VCO and phase-locked loop circuitry
Serial data output ports
Intermediate frequencies of 70 MHz to 260 MHz
10 dB noise figure
+43 dBm input IP2 at 70 MHz IF
−9.5 dBm input IP3 at 70 MHz IF
3.3 V I/O and CMOS core
Microprocessor interface
JTAG boundary scan
APPLICATIONS
PHS or GSM/EDGE single carrier, diversity receivers
Microcell and picocell systems
Wireless local loop
GSM/EDGE Narrow-Band Receiver
AD6650
Smart antenna systems
Software radios
In-building wireless telephony
PRODUCT DESCRIPTION
The AD6650 is a diversity intermediate frequency-to-baseband
(IF-to-baseband) receiver for GSM/EDGE. This narrow-band
receiver consists of an integrated DVGA, IF-to-baseband I/Q
demodulators, low-pass filtering, and a dual wideband ADC.
The chip can accommodate IF input from 70 MHz to 260 MHz.
The receiver architecture is designed such that only one external
surface acoustic wave (SAW) filter for main and one for diversity
are required in the entire receive signal path to meet GSM/EDGE
blocking requirements.
Digital decimation and filtering circuitry provided on-chip
remove unwanted signals and noise outside the channel of
interest. Programmable RAM coefficient filters allow antialiasing,
matched filtering, and static equalization functions to be combined
in a single cost-effective filter. The output of the channel filters
is provided to the user via serial output I/Q data streams.
AIN
AIN
CPOUT
VLDO
BIN
BIN
FUNCTIONAL BLOCK DIAGRAM
TWEAK GAIN
DAC
I
LPF
12-BIT
REF/4
12-BIT
SYNC
LPF
LPF
LPF
TDI
MUX
Q
Q
MUX
I
DAC
TWEAK GAIN
TDO
TMS
VGA
PLL/
LF
VCO
VGA
0
90
JTAG
TRST
TCLK
ADC
ADC
CLK
DIVIDER
CLK
COARSE
COARSE
CLK
DCC
DCC
AGC
RELIN
CTRL
AGC
RELIN
CTRL
DVDD
AVDD
DGND
AGND
TH
4
ORDER
CIC
TH
4
ORDER
CIC
LP
FILTER
LP
FILTER
TH
7
ORDER
IIR
TH
7
ORDER
IIR
RESET
Figure 1.
AD6650 GSM/
EDGE IF RECEIVER
CS
PROG.
(RCF)
PROG.
(RCF)
R/W
FIR
FIR
MICRO
DS
FINE
DCC
FINE
DCC
A[2:0]
MODE [2:0]
BIST
SCL
SERIAL
PORT
BIST
D[7:0]
DTACK
SDFS
SDO0
SDO1
DR
03683-001
Rev. A
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Anal og Devices for its use, nor for any infringements of patents or ot her
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarks and registered trademarks are the property of their respective owners.
Changes to Specifications................................................................ 3
Changes to Figure 18...................................................................... 13
Changes to Power Supplies Section.............................................. 27
Changes to Ordering Guide.......................................................... 44
3/06—Revision 0: Initial Version
Rev. A | Page 2 of 44
AD6650
www.BDTIC.com/ADI
SPECIFICATIONS
EXPLANATION OF TEST LEVELS
I. 100% production tested.
II. 100% p
III. S
IV. P
V. P
VI. 100% p
VII. 100% p
C
= 40 pF on all outputs, unless otherwise specified. All timing specifications valid over VDD range of 3.0 V to 3.45 V and VDDIO
LOAD
range of 3.0 V to 3.45 V.
AC SPECIFICATIONS
AVDD and DVDD = 3.3 V, CLK = 52 MSPS (driven differentially), 50% duty cycle, unless otherwise noted. All minimum ac
specifications are guaranteed from −25°C to +85°C. AC minimum specifications degrade slightly from −25°C to −40°C.
Table 1.
Parameter Temp Test Level Min Typ Max Unit
OVERALL FUNCTION
Frequency Range Full V 70 260 MHz
GAIN CONTROL
Gain Step Size 25°C V 0.094 dB
Gain Step Accuracy 25°C V ±0.047 dB
AGC Range 25°C V 36 dB
BASEBAND FILTERS
Bandwidth Full IV 3.36 3.5 3.64 MHz
Alias Rejection at 25.9 MHz 25°C V 77 dB
LO PHASE NOISE
At 10 kHz Offset 25°C V −79 dBc/Hz
At 20 kHz Offset 25°C V −87 dBc/Hz
At 50 kHz Offset 25°C V −103 dBc/Hz
At 100 kHz Offset 25°C V −112 dBc/Hz
At 200 kHz Offset 25°C V −119 dBc/Hz
At 400 kHz Offset 25°C V −125 dBc/Hz
At 600 kHz Offset 25°C V −130 dBc/Hz
At 800 kHz Offset 25°C V −133 dBc/Hz
At 1600 kHz Offset 25°C V −138 dBc/Hz
At 3000 kHz Offset 25°C V −143 dBc/Hz
GAIN ERROR 25°C V −0.7 dB
PSRR (AVDD with 20 mV RMS Ripple)
At 5 kHz 25°C V −13.4 dBc
At 10 kHz 25°C V −17 dBc
At 50 kHz 25°C V −34 dBc
At 100 kHz 25°C V −39.8 dBc
At 150 kHz 25°C V −45.7 dBc
f = 70 MHz
Coarse DC Correction V −70 dB
Noise Figure2 V 10 dB
Input IP2
Input IP3
Image Rejection Full IV −49 −33 dBc
Full-Scale Input Power V 4 dBm
Input Impedance V 189.6 − j33.6 Ω
roduction tested at 25°C; sample tested at specified temperatures.
ample tested only.
arameter guaranteed by design and analysis.
arameter is typical value only.
roduction tested at 25°C; sample tested at temperature extreme.
roduction tested at +85°C.
1
2
2
Full IV 24 43 dBm
Full IV −15 −9.5 dBm
Rev. A | Page 3 of 44
AD6650
www.BDTIC.com/ADI
Parameter Temp Test Level Min Typ Max Unit
f = 150 MHz
Coarse DC Correction V −70 dB
Noise Figure2 V 10 dB
Input IP22 Full IV 24 37 dBm
Input IP32 Full IV −15 −11.5 dBm
Image Rejection Full IV −46.5 −33 dBc
Full-Scale Input Power V 4 dBm
Input Impedance V 169.3 − j59.2 Ω
f = 200 MHz
Coarse DC Correction V −70 dB
Noise Figure2 V 10 dB
Input IP22 Full IV 24 35 dBm
Input IP32 Full IV −16 −12 dBm
Image Rejection Full IV −46.5 −33 dBc
Full-Scale Input Power V 4 dBm
Input Impedance V 159.3 − j66.9 Ω
f = 250 MHz
Coarse DC Correction V −70 dB
Noise Figure2 V 10 dB
Input IP22 Full VII 24 33 dBm
Input IP32 Full VII −16 −13 dBm
Image Rejection Full VII −45 −33 dBc
Full-Scale Input Power V 4 dBm
Input Impedance V 137.1 − j72.7 Ω
1
See Figure 40 and Figure 41 for additional PSRR specifications.
2
This measurement applies for maximum gain (36 dB).
DVDD Full IV 3.0 3.3 3.45 V
AVDD Full IV 3.0 3.3 3.45 V
1
T
IV −25 +25 +85 °C
AMBIENT
1
The AD6650 is guaranteed fully functional from −40°C to +85°C. All ac minimum specifications are guaranteed from −25°C to +85°C, but degrade slightly from −25°C
to −40°C.
Rev. A | Page 4 of 44
AD6650
www.BDTIC.com/ADI
ELECTRICAL CHARACTERISTICS
Table 3.
Parameter (Conditions) Temp Test Level Min Typ Max Unit
LOGIC INPUTS
Logic Compatibility Full IV 3.3 V CMOS
Digital Logic
Logic 1 Voltage Full IV 2.0 VDD V
Logic 0 Voltage Full IV 0 0.8 V
Logic 1 Current 25°C V 60 μA
Logic 0 Current 25°C V 7 μA
Input Capacitance 25°C V 5 pF
CLOCK INPUTS
Differential Input Voltage
Common-Mode Input Voltage 25°C V DVDD/2 V
Differential Input Resistance 25°C V 7.5 kΩ
Differential Input Capacitance 25°C V 5 pF
LOGIC OUTPUTS
Logic Compatibility Full 3.3 V CMOS/TTL
Logic 1 Voltage (IOH = 0.25 mA) Full IV 2.4 VDD − 0.2 V
Logic 0 Voltage (IOL = 0.25 mA) Full IV 0.2 0.8 V
IDD SUPPLY CURRENT
CLK = 52 MHz (GSM Example)
I
Full VII 155 mA
DVDD
I
Full VII 360 mA
AVDD
POWER DISSIPATION
CLK = 52 MHz (GSM/EDGE Example) Full VII 1.7 2.1 W
1
All ac specifications are tested by driving CLK and
GENERAL TIMING CHARACTERISTICS
Table 4.
Parameter (Conditions) Symbol Temp Test Level Min Typ Max Unit
CLK TIMING REQUIREMENTS
CLK Period
CLK Width Low t
CLK Width High t
RESET TIMING REQUIREMENTS
RESET Width Low
PIN_SYNC TIMING REQUIREMENTS
SYNC to ↑ CLK Setup Time
SYNC to ↑ CLK Hold Time
SERIAL PORT TIMING REQUIREMENTS: SWITCHING CHARACTERISTICS
↑ CLK to ↑ SCLK Delay (Divide-by-1)
↑ CLK to ↑ SCLK Delay (For Any Other Divisor)
↑ CLK to ↓ SCLK Delay (Divide-by-2 or Even Number)
↓ CLK to ↓ SCLK Delay (Divide-by-3 or Odd Number)
↑ SCLK to SDFS Delay
↑ SCLK to SDO0 Delay
↑ SCLK to SDO1 Delay
↑ SCLK to DR Delay
1
Minimum specification is based on a 104 MSPS clock rate (an internal divide-by-2 must be used with a 104 MSPS clock rate); maximum specification is based on a
52 MSPS clock rate. This device is optimized to operate at a clock rate of 52 MSPS or 104 MSPS.
2
The timing parameters for SCLK, SDFS, SDO0, SDO1, and DR apply to both Channel 0 and Channel 1.
1
1
CLK
differentially.
25°C V 0.4 3.6 V p-p
t
Full I 9.6 19.2 ns
CLK
Full IV 0.5 × t
CLKL
Full IV 0.5 × t
CLKH
ns
CLK
ns
CLK
t
Full IV 30 ns
SSF
Full IV −3 ns
t
SS
tHS Full IV 6 ns
2
t
Full IV 3.2 12.5 ns
DSCLK1
t
Full IV 4.4 16 ns
DSCLKH
t
Full IV 4.7 16 ns
DSCLKL
Full IV 4 14 ns
t
DSCLKLL
Full IV 1 2.6 ns
t
DSDFS
Full IV 0.5 3.5 ns
t
DSDO0
t
Full IV 0.5 3.5 ns
DSDO1
t
Full IV 1 3.5 ns
DSDR
Rev. A | Page 5 of 44
AD6650
www.BDTIC.com/ADI
MICROPROCESSOR PORT TIMING CHARACTERISTICS
All timing specifications valid over VDD range of 3.0 V to 3.45 V and VDDIO range of 3.0 V to 3.45 V.
WR (R/W) to RDY (DTACK) Hold Time
Address/Data to WR (R/W) Setup Time
Address/Data to RDY (DTACK) Hold Time
WR (R/W) to RDY (DTACK) Delay
WR (R/W) to RDY (DTACK) High Delay
READ TIMING
Address to RD (DS) Setup Time
Address to Data Hold Time
Data Three-state Delay
RDY (DTACK) to Data Delay
1
1
1
RD (DS) to RDY (DTACK) Delay
RD (DS) to RDY (DTACK) High Delay
1
Timing is guaranteed by design.
2
Specification pertains to control signals R/W, WR, DS, RD, and CS such that the minimum specification is valid after the last control signal has reached a valid logic level.
1
1
1
1
1
t
Full IV 0.0 ns
HWR
t
Full IV 0.0 ns
SAM
t
Full IV 0.0 ns
HAM
2
t
t
t
t
DRDY
ACC
SAM
HAM
Full IV 9.0 15.0 ns
Full IV 4 × t
13 × t
CLK
ns
CLK
Full IV 0.0 ns
Full IV 0.0 ns
tZD Full V 12 ns
tDD Full IV 0.0 ns
2
t
1
t
DRDY
ACC
Full IV 9.0 15.0 ns
Full IV 4 × t
13 × t
CLK
CLK
ns
Table 6. Microprocessor Port, Mode MNM (MODE = 1)
Parameter Symbol Temp Test Level Min Typ Max Unit
WRITE TIMING
t
DS (RD) to DTACK (RDY) Hold Time
R/W (WR) to DTACK (RDY) Hold Time
Address/Data to R/W (WR) Setup Time
Address/Data to R/W (WR) Hold Time
DS (RD) to DTACK (RDY) Delay
2
R/W (WR) to DTACK (RDY) Low Delay
1
1
1
Full IV 15.0 ns
HDS
t
Full IV 15.0 ns
HRW
t
Full IV 0.0 ns
SAM
t
Full IV 0.0 ns
HAM
t
Full V 16 ns
DDTACK
t
Full IV 4 × t
ACC
13 × t
CLK
ns
CLK
READ TIMING
t
DS (RD) to DTACK (RDY) Hold Time
Address to DS (RD) Setup Time
Address to Data Hold Time
1
1
Full IV 15.0 ns
HDS
t
Full IV 0.0 ns
SAM
t
Full IV 0.0 ns
HAM
Data Three-State Delay tZD Full V 13 ns
DTACK (RDY) to Data Delay
DS (RD) to DTACK (RDY) Delay
DS (RD) to DTACK (RDY) Low Delay
1
Timing is guaranteed by design.
2
DTACK
is an open-drain device and must be pulled up with a 1 kΩ resistor.
ACCESS TIME DEPENDS ON THE ADDRESS ACCESS ED. ACCESS TI ME IS MEASURED
ACC
FROM FALLING EDGE OF DSTO THE FALLING EDGE OF DTACK.
2.
t
REQUIRES A MAXIMUM O F 13 CLK PERIODS.
ACC
VALID ADDRESS
t
DD
t
DDTACK
VALID DATA
t
HAM
t
ZD
03683-013
Figure 13. MNM Microport Read Timing Requirements
Rev. A | Page 9 of 44
AD6650
www.BDTIC.com/ADI
ABSOLUTE MAXIMUM RATINGS
Table 7.
Parameter Rating
Supply Voltage −0.3 V to +3.6 V
Input Voltage −0.3 V to +3.6 V
Output Voltage Swing −0.3 V to VDDIO + 0.3 V
Load Capacitance 200 pF
Junction Temperature Under Bias 125°C
Storage Temperature Range −65°C to +150°C
Lead Temperature (5 sec) 280°C
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
THERMAL CHARACTERISTICS
121-lead chip scale package ball grid array:
= 22.8°C/W, no airflow, measurements made in the
θ
JA
horizontal position on a 4-layer board.
= 20.2°C/W, 200 LFPM airflow, measurements made in the
θ
JA
horizontal position on a 4-layer board.
= 20.7°C/W, no airflow, soldered on an 8-layer board with
SCLK Bidirectional Serial Clock. 1
SDFS Bidirectional Serial Data Frame Sync. 1
SDO[1:0] Output Serial Data Outputs. Three-stated when inactive. 2
DR Output Output Data Ready Indicator. 1
Input Chip Select. 1
Input Active Low Data Strobe (Active Low Read). 1
Rev. A | Page 11 of 44
AD6650
www.BDTIC.com/ADI
Mnemonic Type Description No. of Pins
DTACK (RDY)
R/W (WR)
MODE [2:0] Input Selects Control Port Mode. 3
JTAG
TRST
TCLK Input Test Clock Input. 1
TMS Input Test Mode Select Input. 1
TDO Output Test Data Output. Three-stated when JTAG is in reset. 1
TDI Input Test Data input. 1
ANALOG INPUTS
AIN Input Main Analog Input. 1
AIN
BIN Input Diversity Analog Input. 1
BIN
REFGND Ground ADC Ground Reference. See Figure 39 for recommended connection. 1
CLOCK INPUTS
CLK Input Encode Input. Conversion initiated on rising edge. 1
CLK
DNC Do Not Connect. 5
Output
Input Read Write (Active Low Write). 1
Input Test Reset Pin. 1
Input Complement of AIN. Differential analog input. 1
Input Complement of BIN. Differential analog input. 1
Input Complement of Encode. 1
Active Low Data Acknowledge (Microport Status Bit). Open-drain output, requires
external pull-up resistor of 1 kΩ.
Compensation for Internal Low Dropout Regulator. Bypass to ground with a 220
nF chip ca
Internal ADC Voltage Reference. Bypass to ground with capacitors. See Figure 39
or recommended connection.
f
Internal ADC Voltage Reference. Bypass to ground with capacitors. See Figure 39
or recommended connection.
f
Internal ADC Voltage Reference. Bypass to ground with capacitors. See Figure 39
or recommended connection.
f
pacitor.
1
1
1
1
1
Rev. A | Page 12 of 44
AD6650
–
–
www.BDTIC.com/ADI
TYPICAL PERFORMANCE CHARACTERISTICS
44
42
40
38
IIP2 (dBm)
36
34
32
30
–25°C
7090110130150 170190210230250
+25°C
+85°C
IF FREQUENCY ( MHz)
Figure 15. Input IP2 vs. Frequency
6
–7
–8
–9
–10
–11
IIP3 (dBm)
–25°C
–12
–13
–14
–15
7090110130150 170190210230250
+25°C
+85°C
IF FREQUENCY ( MHz)
Figure 16. Input IP3 vs. Frequency
44
–45
–46
–47
–48
IMAGE (d Bc)
–49
–50
03683-016
–51
7090110130150 170190210230250
IF FREQUENCY ( MHz)
+25°C
–25°C
+85°C
03683-018
Figure 17. Image vs. Frequency
0.2
0
–0.2
–0.4
–0.6
–0.8
GAIN ERROR (dB)
–1.0
–1.2
03683-017
–1.4
7090110130150 170190210230250
–25°C
+25°C
+85°C
IF FREQUENCY ( MHz)
03683-019
Figure 18. Gain Error vs. Frequency
Rev. A | Page 13 of 44
AD6650
www.BDTIC.com/ADI
TERMINOLOGY
Analog Bandwidth
The analog input frequency at which the spectral power of the
f
undamental frequency (as determined by the FFT analysis) is
reduced by 3 dB.
Noise Figure (NF)
The degradation in SNR performance (in dB) of an IF input
sig
nal after it passes through a component or system.
The AD6650 noise figure is determined by the equation
NF
⎛
⎜
=
⎜
⎝
2
⎛
rms
⎜
log10
⎜
⎝
⎞
ZV
in
⎟
−
⎟
001.0
⎠
SNR
⎞
⎟
−
FS
⎟
⎠
kTB
⎞
⎛
log10
⎜
⎝
(1)
⎟
001.0
⎠
where:
−23
k is the B
oltzmann constant = 1.38 × 10
.
T is the temperature in kelvin.
B is the channel bandwidth in hertz (200 kHz typical).
2
V
is the full-scale input voltage.
rms
Z
is the input impedance.
in
is the computed signal-to-noise ratio referred to full scale
SNR
FS
with a small input signal and the AD6650 in maximum gain.
Input Second-Order Intercept (IIP2)
A figure of merit used to determine a component’s or system’s
su
sceptibility to intermodulation distortion (IMD) from its
second-order nonlinearities. Two unmodulated carriers at a
specified frequency relationship (f1 and f2) are injected into a
nonlinear system exhibiting second-order nonlinearities
producing IMD components at f1 − f2 and f2 − f1. IIP2
graphically represents the extrapolated intersection of the
carrier’s input power with the second-order IMD component
when plotted in decibels.
Input Third-Order Intercept (IIP3)
A figure of merit used to determine a component’s or system’s
su
sceptibility to intermodulation distortion (IMD) from its
third-order nonlinearities. Two unmodulated carriers at a
specified frequency relationship (f1 and f2) are injected into a
nonlinear system exhibiting third-order nonlinearities
producing IMD components at (2 × f1) – f2 and (2 × f2) – f1.
IIP3 graphically represents the extrapolated intersection of the
carrier’s input power with the third-order IMD component
when plotted in decibels.
Image
The AD6650 incorporates a quadrature demodulator that mixes
t
he IF frequency to a baseband frequency. The phase and amplitude
imbalance of this quadrature demodulator is observed in a complex
FFT as an image of the fundamental frequency. The term image
arises from the mirror-like symmetry of signal and image
frequencies about the beating-oscillator frequency (in this
case, this is dc).
Differential Analog Input Resistance, Differential Analog
Capacitance, and Differential Analog Input Impedance
Input
The real and complex impedances measured at each analog
put port. The resistance is measured statically, and the
in
capacitance and differential input impedances are measured
with a network analyzer.
Differential Analog Input Voltage Range
The peak-to-peak differential voltage that must be applied to
t
he converter to generate a full-scale response. Peak differential
voltage is computed by observing the voltage on a single pin
and subtracting the voltage from the other pin, which is 180°
out of phase. The peak-to-peak differential voltage is computed
by rotating the phases of the inputs 180° and taking the peak
measurement again. Then the difference is computed between
both peak measurements.
Full-Scale Input Power
Expressed in dBm. It is computed using the following equation:
Power
where Z
⎛
⎜
=
scaleFull
⎜
log10
⎜
⎜
⎜
⎝
is the input impedance.
Input
2
V
Z
scaleFull
Input
001.0
⎞
rms
⎟
⎟
(2)
⎟
⎟
⎟
⎠
Noise
The noise, including both thermal and quantization noise, for
a
ny range within the ADC is computed as
−−
SignalSNRFS
⎛
⎜
⎜
⎝
××=
ZV (3)
noise
10001.0
10
⎞
dBFSdBcdBm
⎟
⎟
⎠
where:
Z is t
he input impedance.
is the full scale of the device for the frequency in question.
FS
dBm
SNR
is the value for the particular input level.
dBc
Signal
is the signal level within the ADC reported in decibels
dBFS
below full scale.
Rev. A | Page 14 of 44
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