SNR = 75 dB, fIN 15 MHz, up to 105 MSPS
SNR = 72 dB, f
SFDR = 89 dBc, f
100 dBFS multitone SFDR
IF sampling to 200 MHz
Sampling jitter: 0.1 ps
1.5 W power dissipation
Differential analog inputs
Pin compatible to AD6644
Twos complement digital output format
3.3 V CMOS compatible
Data-ready for output latching
APPLICATIONS
Multichannel, multimode receivers
Base station infrastructures
AMPS, IS-136, CDMA, GSM, W-CDMA
Single channel digital receivers
Antenna array processing
Communications instrumentation
Radars, infrared imaging
Instrumentation
GENERAL DESCRIPTION
The AD6645 is a high speed, high performance, monolithic 14-bit
analog-to-digital converter (ADC). All necessary functions,
including track-and-hold (T/H) and reference, are included on the
chip to provide a complete conversion solution. The AD6645
provides CMOS-compatible digital outputs. It is the fourth
200 MHz, up to 105 MSPS
IN
70 MHz, up to 105 MSPS
IN
A/D Converter
AD6645
generation in a wideband ADC family, preceded by the AD9042
(12-bit, 41 MSPS), the AD6640 (12-bit, 65 MSPS, IF sampling),
and the AD6644 (14-bit, 40 MSPS/65 MSPS).
Designed for multichannel, multimode receivers, the AD6645 is
part of the Analog Devices, Inc., SoftCell® transceiver chipset.
The AD6645 maintains 100 dB multitone, spurious-free dynamic
range (SFDR) through the second Nyquist band. This breakthrough
performance eases the burden placed on multimode digital
receivers (software radios) that are typically limited by the ADC.
Noise performance is exceptional; typical signal-to-noise ratio
(SNR) is 74.5 dB through the first Nyquist band.
The AD6645 is built on the Analog Devices extra fast
complementary bipolar (XFCB) process and uses an innovative,
multipass circuit architecture. Units are available in thermally
enhanced 52-lead PowerQuad 4 (LQFP_PQ4) and 52-lead
exposed pad (TQFP_EP) packages specified from −40°C to
+85°C at 80 MSPS and −10°C to +85°C at 105 MSPS.
PRODUCT HIGHLIGHTS
1. IF Sampling. The AD6645 maintains outstanding ac
performance up to input frequencies of 200 MHz, suitable
for multicarrier 3G wideband cellular IF sampling receivers.
2. Pin Compatibility. The ADC has the same footprint and
pin layout as the AD6644 14-bit, 40 MSPS/65 MSPS ADC.
3. SFDR Performance and Oversampling. Multitone SFDR
performance of 100 dBFS can reduce the requirements of
high end RF components and allows the use of receive
signal processors, such as the AD6620, AD6624/AD6624A,
or AD6636.
FUNCTIONAL BLOCK DIAGRAM
DV
AV
AIN
AIN
VREF
ENCODE
ENCODE
Rev. D
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarks and registered trademarks are the property of their respective owners.
Change to DC Specifications ........................................................... 3
Rev. D | Page 2 of 24
AD6645
SPECIFICATIONS
DC SPECIFICATIONS
AVCC = 5 V, DVCC = 3.3 V; T
Table 1.
AD6645ASQ-80/AD6645ASV-80 AD6645ASQ-105/AD6645ASV-105
Parameter Temp Test Level Min Typ Max Min Typ Max Unit
RESOLUTION 14 14 Bits
ACCURACY
No Missing Codes Full II Guaranteed Guaranteed
Offset Error Full II −10 +1.2 +10 −10 +1.2 +10 mV
Gain Error Full II −10 0 +10 −10 0 +10 % FS
Differential Nonlinearity (DNL) Full II −1.0 ±0.25 +1.5 −1.0 ±0.5 +1.5 LSB
Integral Nonlinearity (INL) Full V ±0.5 ±1.5 LSB
TEMPERATURE DRIFT
Offset Error Full V 1.5 1.5 ppm/°C
Gain Error Full V 48 48 ppm/°C
POWER SUPPLY REJECTION RATIO
(PSRR)
REFERENCE OUT (VREF)
ANALOG INPUTS (AIN, AIN)
Differential Input Voltage Range Full V 2.2 2.2 V p-p
Differential Input Resistance Full V 1 1 kΩ
Differential Input Capacitance 25°C 1.5 1.5 pF
POWER SUPPLY
Supply Voltages
AVCC Full II 4.75 5.0 5.25 4.75 5.0 5.25 V
DVCC Full II 3.0 3.3 3.6 3.0 3.3 3.6 V
Supply Current
IAVCC (AVCC = 5.0 V) Full II 275 320 275 320 mA
IDVCC (DVCC = 3.3 V) Full II 32 45 32 45 mA
Rise Time
2
AVCC Full IV 250 5.0 250 ms
POWER CONSUMPTION Full II 1.5 1.75 1.5 1.75 W
1
VREF is provided for setting the common-mode offset of a differential amplifier, such as the AD8138, when a dc-coupled analog input is required. VREF should be
buffered if used to drive additional circuit functions.
2
Specified for dc supplies with linear rise time characteristics.
MIN
and T
at rated speed grade, unless otherwise noted.
MAX
25°C V ±1.0 ±1.0 mV/V
1
Full V 2.4 2.4 V
Rev. D | Page 3 of 24
AD6645
DIGITAL SPECIFICATIONS
AVCC = 5 V, DVCC = 3.3 V; T
Table 2.
Test AD6645ASQ-80/AD6645ASV-80 AD6645ASQ-105/AD6645ASV-105
Parameter Temp Level Min Typ Max Min Typ Max Unit
ENCODE INPUTS (ENCODE, ENCODE)
Differential Input Voltage
Differential Input Resistance 25°C V 10 10 kΩ
Differential Input Capacitance 25°C V 2.5 2.5 pF
LOGIC OUTPUTS (D13 to D0, DRY, OVR)
Logic Compatibility CMOS CMOS
Logic 1 Voltage (DVCC = 3.3 V)
Logic 0 Voltage (DVCC = 3.3 V)
Output Coding Twos complement Twos complement
DMID Full V DVCC/2 DVCC/2 V
1
All ac specifications tested by driving ENCODE and
2
Digital output logic levels: DVCC = 3.3 V, C
AC SPECIFICATIONS
All ac specifications tested by driving ENCODE and
T
Parameter Temp Level Min Typ Max Min Typ Max Unit Conditions
SNR
Analog Input @ −1 dBFS 25°C V 75.0 75.0 dB At 15.5 MHz
Full II 72.5 74.5 dB At 30.5 MHz
25°C I 72.5 74.5 dB At 37.7 MHz
Full II 72.0 73.5 72.0 73.5 dB At 70.0 MHz
25°C V 73.0 73.0 dB At 150.0 MHz
25°C V 72.0 72.0 dB At 200.0 MHz
SINAD
Analog Input @ −1 dBFS 25°C V 75.0 75.0 dB At 15.5 MHz
Full II 72.5 74.5 dB At 30.5 MHz
25°C I 72.5 74.5 dB At 37.7 MHz
Full V 73.0 73.0 dB At 70.0 MHz
25°C V 68.5 67.5 dB At 150.0 MHz
25°C V 62.5 62.5 dB At 200.0 MHz
WORST HARMONIC (SECOND OR THIRD)
Analog Input @ −1 dBFS 25°C V 93.0 93.1 dBc At 15.5 MHz
Full II 85.0 93.0 dBc At 30.5 MHz
25°C I 85.0 93.0 dBc At 37.7 MHz
Full V 89.0 87.0 dBc At 70.0 MHz
25°C V 70.0 70.0 dBc At 150.0 MHz
25°C V 63.5 63.5 dBc At 200.0 MHz
Rev. D | Page 4 of 24
AD6645
AD6645ASQ-80/
Test
AD6645ASV-80
Parameter Temp Level Min Typ Max Min Typ Max Unit Conditions
WORST HARMONIC (FOURTH OR HIGHER)
Analog Input @ −1 dBFS 25°C V 96.0 96.0 dBc At 15.5 MHz
Full II 85.0 95.0 dBc At 30.5 MHz
25°C I 86.0 95.0 dBc At 37.7 MHz
Full V 90.0 90.0 dBc At 70.0 MHz
25°C V 90.0 90.0 dBc At 150.0 MHz
25°C V 88.0 88.0 dBc At 200.0 MHz
TWO-TONE SFDR 25°C V 100 98.0 dBFS At 30.5 MHz
25°C V 100 98.0 dBFS At 55.0 MHz
25°C V 98.0 dBFS At 70.0 MHz
2, 3
TWO-TONE IMD REJECTION
F1, F2 @ −7 dBFS 25°C V 90 90 dBc
ANALOG INPUT BANDWIDTH 25°C V 270 270 MHz
1
Analog input signal power swept from −10 dBFS to −100 dBFS.
2
F1 = 30.5 MHz, F2 = 31.5 MHz.
3
F1 = 55.25 MHz, F2 = 56.25 MHz.
4
F1 = 69.1 MHz, F2 = 71.1 MHz.
SWITCHING SPECIFICATIONS
AVCC = 5 V, DVCC = 3.3 V; ENCODE,
ENCODE
, T
MIN
and T
at rated speed grade, unless otherwise noted.
MAX
AD6645ASQ-105/
AD6645ASV-105
1, 2
1, 3
1, 4
Table 4.
AD6645ASQ-80/
Test
AD6645ASV-80
AD6645ASQ-105/
AD6645ASV-105
Parameter Symbol Temp Level Min Typ Max Min Typ Max Unit
ENCODE INPUT PARAMETERS
1
Maximum Conversion Rate Full II 80 105 MSPS
Minimum Conversion Rate Full IV 30 30 MSPS
ENCODE Pulse Width High, t
ENCH
2
Full IV 5.625 4.286 ns
Full V 6.25 4.75 ns
ENCODE Pulse Width Low, t
2
Full IV 5.625 4.286 ns
ENCL
Full V 6.25 4.75 ns
ENCODE Period
1
t
Full V 12.5 9.5 ns
ENC
ENCODE/DATA-READY
ENCODE Rising to Data-Ready Falling tDR Full V 1.0 2.0 3.1 1.0 2.0 3.1 ns
ENCODE Rising to Data-Ready Rising t
Full V t
E_DR
+ tDR t
ENCH
+ tDR ns
ENCH
50% Duty Cycle Full V 7.3 8.3 9.4 5.7 6.75 7.9 ns
ENCODE/DATA (D13:0), OVR
ENCODE to DATA Falling Low t
ENCODE to DATA Rising Low
3
ENCODE to DATA Delay3 (Hold Time) t
ENCODE to DATA Delay (Setup Time) t
Full V 2.4 4.7 7.0 2.4 4.7 7.0 ns
E_FL
t
Full V 1.4 3.0 4.7 1.4 3.0 4.7 ns
E_RL
Full V 1.4 3.0 4.7 1.4 3.0 4.7 ns
H_E
Full V
S_E
t
ENC
t
E_FL(max)
−
−
t
ENC
t
E_FL(typ)
−
t
ENC
t
E_FL(max)
−
t
ENC
t
E_FL(min)
ns
t
ENC
t
E_FL(typ)
−
ns
−
t
ENC
t
E_FL(min)
ns
50% Duty Cycle Full V 5.3 7.6 10.0 2.3 4.8 7.0 ns
Rev. D | Page 5 of 24
AD6645
AD6645ASQ-80/
Test
AD6645ASV-80
Parameter Symbol Temp Level Min Typ Max Min Typ Max Unit
DATA-READY (DRY4)/DATA(D13:0),, OVR
Data-Ready to DATA Delay (Hold Time) t
Full V Note 5
H_DR
5
Note 5
50% Duty Cycle Full V 6.6 7.2 7.9 5.1 5.7 6.4 ns
Data-Ready to DATA Delay (Setup Time) t
Full V Note 5
S_DR
5
Note 5
50% Duty Cycle Full V 2.1 3.6 5.1 0.6 2.1 3.5 ns
APERTURE DELAY tA 25°C V −500 −500 ps
APERTURE UNCERTAINTY (JITTER) tJ 25°C V 0.1 0.1 ps rms
1
Several timing parameters are a function of t
2
Several timing parameters are a function of t
3
ENCODE TO DATA Delay (Hold Time) is the absolute minimum propagation delay through the ADC, t
4
DRY is an inverted and delayed version of the encode clock. Any change in the duty cycle of the clock will correspondingly change the duty cycle of DRY.
5
Data-ready to DATA Delay (t
H_DR
and t
S_DR
and t
and t
ENCH
ENCH
.
.
E_RL
ENC
ENCL
) is calculated relative to rated speed grade and is dependent on t
= t
.
H_E
and duty cycle.
ENC
t
A
N
N + 3
AD6645ASQ-105/
AD6645ASV-105
5
5
AIN
ENCODE,
ENCODE
D[13:0], OV R
DRY
t
E_RL
t
ENC
t
E_FL
N + 1
t
ENCHtENCL
N – 2
N + 2
N + 4
N + 4N + 3N + 2N + 1N
t
E_DR
t
S_DR
t
DR
t
H_DR
t
S_E
t
H_E
NN – 1N – 3
2647-002
Figure 2. Timing Diagram
Rev. D | Page 6 of 24
AD6645
ABSOLUTE MAXIMUM RATINGS
Table 5.
Parameter Rating
Electrical
AV
Voltage 0 V to 7 V
CC
DV
Voltage 0 V to 7 V
CC
Analog Input Voltage 0 V to AVCC
Analog Input Current 25 mA
Digital Input Voltage 0 V to AVCC
Digital Output Current 4 mA
Environmental
Operating Temperature Range (Ambient)
AD6645-80 −40°C to +85°C
AD6645-105 −10°C to +85°C
Maximum Junction Temperature 150°C
Lead Temperature (Soldering, 10 sec) 300°C
Storage Temperature Range (Ambient) −65°C to +150°C
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
Val u es o f θJA are provided for package comparison and PCB
design considerations. θ
approximation of T
= TA + (θJA × PD)
T
J
can be used for a first-order
JA
by the equation
J
where:
T
is the ambient temperature (°C).
A
PD is the power dissipation (W).
EXPLANATION OF TEST LEVELS
I. 100% production tested.
II. 100% production tested at 25°C and guaranteed by design
and characterization at temperature extremes.
III. Sample tested only.
IV. Parameter is guaranteed by design and characterization
testing.
V. Parameter is a typical value only.
ESD CAUTION
THERMAL RESISTANCE
The heat sink of the AD6645ASVZ, 52-lead TQFP_EP (SV-52-1)
package must be soldered to the PCB GND plane to meet thermal
specifications.
Table 6. Thermal Characteristics
Package Type Rating
52-Lead TQFP_EP
θJA (0 m/sec airflow)
θ
(1.0 m/sec airflow)
JMA
6, 7
θ
2°C/W, soldered heat sink
JC
52-Lead LQFP_PQ4
θJA (0 m/sec airflow)
θ
(1.0 m/sec airflow)
JMA
θJA (0 m/sec airflow)
θ
(1.0 m/sec airflow)
JMA
6, 7
θ
2°C/W
JC
1
Per JEDEC JESD51-2 (heat sink soldered to PCB).
2
2S2P JEDEC test board.
3
Values of θJA are provided for package comparison and PCB design
considerations.
4
Per JEDEC JESD51-6 (heat sink soldered to PCB).
5
Airflow increases heat dissipation, effectively reducing θJA. Furthermore, the
more metal that is directly in contact with the package leads from metal
traces, throughholes, ground, and power planes, the more θ
6
Per MIL-STD-883, Method 1012.1.
7
Values of θJC are provided for package comparison and PCB design
considerations when an external heat sink is required.
27, 29, 34, 42
3 VREF 2.4 V Reference. Bypass to ground with a 0.1 μF microwave chip capacitor.
5 ENCODE Encode Input. Conversion initiated on rising edge.
6
ENCODE
Complement of
ENCODE
, Differential Input.
8, 9, 14, 16, 18, 22, 26, 28, 30 AVCC 5 V Analog Power Supply.
11 AIN Analog Input.
12
AIN
Complement of AIN, Differential Analog Input.
20 C1 Internal Voltage Reference. Bypass to ground with a 0.1 μF chip capacitor.
24 C2 Internal Voltage Reference. Bypass to ground with a 0.1 μF chip capacitor.
31 DNC Do not connect this pin.
32 OVR Overrange Bit. A logic level high indicates analog input exceeds ±FS.
35 DMID Output Data Voltage Midpoint. Approximately equal to (DVCC)/2.
36 D0 (LSB) Digital Output Bit (Least Significant Bit); Twos Complement.
37 to 41, 44 to 50 D1 to D5, D6 to D12 Digital Output Bits in Twos Complement.
51 D13 (MSB) Digital Output Bit (Most Significant Bit); Twos Complement.
52 DRY Data-Ready Output.
53 (EPAD) Exposed Paddle (EPAD) Exposed Pad. Connect the exposed pad to GND.
The analog input frequency at which the spectral power of the
fundamental frequency (as determined by the FFT analysis) is
reduced by 3 dB.
Aperture Delay
The delay between the 50% point of the rising edge of the
encode command and the instant at which the analog input is
sampled.
Aperture Uncertainty (Jitter)
The sample-to-sample variation in aperture delay.
Differential Analog Input Resistance, Differential Analog
Input Capacitance, and Differential Analog Input Impedance
The real and complex impedances measured at each analog
input port. The resistance is measured statically and the
capacitance and differential input impedances are measured
with a network analyzer.
Differential Analog Input Voltage Range
The peak-to-peak differential voltage that must be applied to
the converter to generate a full-scale response. The peak differential
voltage is computed by observing the voltage on a single pin and
subtracting the voltage from the other pin, which is 180° out of
phase. The peak-to-peak differential is computed by rotating the
inputs’ phase 180°and taking the peak measurement again. The
difference is then computed between both peak measurements.
Differential Nonlinearity
The deviation of any code width from an ideal 1 LSB step.
Encode Pulse Width/Duty Cycle
Pulse width high is the minimum amount of time that the
encode pulse should be left in a high state to achieve rated
performance; pulse width low is the minimum time that
the encode pulse should be left in a low state. See timing
implications of changing t
these specifications define an acceptable encode duty cycle.
Full-Scale Input Power
The full-scale input power is expressed in dBm and can be
calculated by using the following equation:
Power
−
ScaleFull
in Tabl e 4. At a given clock rate,
ENCH
2
⎡
V
−
⎢
⎢
Z
⎢
=
log10
⎢
⎢
⎢
⎣
rmsScaleFull
Input
001.0
⎤
⎥
⎥
⎥
⎥
⎥
⎥
⎦
Harmonic Distortion, Second
The ratio of the rms signal amplitude to the rms value of the
second harmonic component, reported in dBc.
Harmonic Distortion, Third
The ratio of the rms signal amplitude to the rms value of the
third harmonic component, reported in dBc.
Integral Nonlinearity
The deviation of the transfer function from a reference line
measured in fractions of 1 LSB using a best straight line
determined by a least square curve fit.
Maximum Conversion Rate
The encode rate at which parametric testing is performed.
Minimum Conversion Rate
The encode rate at which the SNR of the lowest analog signal
frequency drops by no more than 3 dB below the guaranteed limit.
Noise (for Any Range Within the ADC)
SignalSNRFS
⎛
NOISE
where:
Z is the input impedance.
FS is the full scale of the device for the frequency in question.
SNR is the value for the particular input level.
Signal is the signal level within the ADC reported in dB below
full scale. This value includes both thermal noise and quantization noise.
Output Propagation Delay
The delay between a differential crossing of ENCODE and
ENCODE
valid logic levels.
Power Supply Rejection Ratio (PSSR)
The ratio of a change in input offset voltage to a change in
power supply voltage.
Power Supply Rise Time
The time from when the dc supply is initiated until the supply
output reaches the minimum specified operating voltage for the
ADC. The dc level is measured at the supply pin(s) of the ADC.
Signal-to-Noise-and-Distortion (SINAD)
The ratio of the rms signal amplitude (set at 1 dB below full scale)
to the rms value of the sum of all other spectral components,
including harmonics, but excluding dc.
Signal-to-Noise Ratio (Without Harmonics)
The ratio of the rms signal amplitude (set at 1 dB below full scale)
to the rms value of the sum of all other spectral components,
excluding the first five harmonics and dc.
ZV
and the time when all output data bits are within
10001.0
××=
⎜
⎝
−−
10
⎞
dBFSdBcdBm
⎟
⎠
Rev. D | Page 15 of 24
AD6645
Spurious-Free Dynamic Range (SFDR)
The ratio of the rms signal amplitude to the rms value of the
peak spurious spectral component. The peak spurious component
may or may not be a harmonic. May be reported in dBc (that is,
degrades as signal level is lowered) or dBFS (always related back
to converter full scale).
Two-Tone Intermodulation Distortion Rejection
The ratio of the rms value of either input tone to the rms value
of the worst third-order intermodulation product, reported in dBc.
Two -Tone SFDR
The ratio of the rms value of either input tone to the rms value
of the peak spurious component. The peak spurious component
may or may not be an IMD product, and may be reported in
dBc (that is, degrades as signal level is lowered) or in dBFS
(always related back to converter full scale).
Worst Other Spur
The ratio of the rms signal amplitude to the rms value of the
worst spurious component (excluding the second and third
harmonics), reported in dBc.
Rev. D | Page 16 of 24
AD6645
V
THEORY OF OPERATION
The AD6645 ADC employs a three-stage subrange architecture.
This design approach achieves the required accuracy and speed
while maintaining low power and small die size.
As shown in the functional block diagram (see Figure 1), the
AD6645 has complementary analog input pins, AIN and
Each analog input is centered at 2.4 V and should swing ±0.55 V
around this reference (see ). Because AIN and Figure 32
180° out of phase, the differential analog input signal is 2.2 V p-p.
Both analog inputs are buffered prior to the first track-and-hold,
TH1. The high state of the encode pulse places TH1 in hold
mode. The held value of TH1 is applied to the input of a 5-bit
coarse ADC1. The digital output of ADC1 drives a 5-bit digitalto-analog converter, DAC1. DAC1 requires 14 bits of precision
that is achieved through laser trimming. The output of DAC1 is
subtracted from the delayed analog signal at the input of TH3 to
generate a first residue signal. TH2 provides an analog pipeline
delay to compensate for the digital delay of ADC1.
The first residual signal is applied to a second conversion stage
consisting of a 5-bit ADC2, a 5-bit DAC2, and a pipeline TH4.
The second DAC requires 10 bits of precision, which is met by
the process with no trim. The input to TH5 is a second residual
signal generated by subtracting the quantized output of DAC2
from the first residual signal held by TH4. TH5 drives a final
6-bit ADC3.
The digital outputs from ADC1, ADC2, and ADC3 are added
together and corrected in the digital error correction logic to
generate the final output data. The result is a 14-bit parallel
digital CMOS-compatible word, coded as twos complement.
APPLYING THE AD6645
Encoding the AD6645
The AD6645 encode signal must be a high quality, extremely
low phase noise source to prevent degradation of performance.
Maintaining 14-bit accuracy places a premium on encode clock
phase noise. SNR performance can easily degrade by 3 dB to
4 dB with 70 MHz analog input signals when using a high jitter
clock source. See the AN-501 application note, Aperture Uncertainty and ADC System Performance, for complete details.
For optimum performance, the AD6645 must be clocked
differentially. The encode signal is usually ac-coupled into the
ENCODE and
These pins are biased internally and require no additional bias.
Figure 38 shows one preferred method for clocking the AD6645.
The clock source (low jitter) is converted from single-ended to
differential using an RF transformer. The back-to-back Schottky
diodes across the transformer secondary limit excessive amplitude
swings from the clock into the AD6645 to approximately 0.8 V p-p
differential. This helps to prevent the large voltage swings of the
clock from feeding through to other portions of the AD6645
and limits the noise presented to the encode inputs.
If a low jitter clock is available, another option is to ac-couple a
differential ECL/PECL signal to the encode input pins, as
shown in Figure 39. The MC100EL16 (or same family) from
ON Semiconductor offers excellent jitter performance.
T
0.1µF
0.1µF
ENCODE
AD6645
ENCODE
02647-039
ECL/
PECL
VT
Figure 39. Differential ECL for Encode
Driving the Analog Inputs
As with most new high speed, high dynamic range ADCs, the
analog input to the AD6645 is differential. Differential inputs
improve on-chip performance as signals are processed through
attenuation and gain stages. Most of the improvement is a result
of differential analog stages having high rejection of even-order
harmonics. There are also benefits at the PCB level. First,
differential inputs have high common-mode rejection of stray
signals, such as ground and power noise. Second, they provide
good rejection of common-mode signals, such as local oscillator
feedthrough.
The AD6645 analog input voltage range is offset from ground
by 2.4 V. Each analog input connects through a 500 Ω resistor to
the 2.4 V bias voltage and to the input of a differential buffer (see
Figure 32). The resistor network on the input properly biases the
followers for maximum linearity and range. Therefore, the analog
source driving the AD6645 should be ac-coupled to the input pins.
Because the differential input impedance of the AD6645 is 1 kΩ,
the analog input power requirement is only −2 dBm, simplifying
the driver amplifier in many cases. To take full advantage of this
high input impedance, a 20:1 RF transformer is required. This is a
large ratio and can result in unsatisfactory performance. In this
case, a lower step-up ratio can be used. The recommended method
for driving the differential analog input of the AD6645 is to use
a 4:1 RF transformer. For example, if R
is set to 60.4 Ω and RS is set
T
to 25 Ω, along with a 4:1 impedance ratio transformer, the input
would match to a 50 Ω source with a full-scale drive of 4.8 dBm.
Series resistors (R
) on the secondary side of the transformer
S
should be used to isolate the transformer from the A/D.
Rev. D | Page 17 of 24
AD6645
ANA
V
This limits the amount of dynamic current from the A/D
flowing back into the secondary of the transformer. The 50 Ω
impedance matching can also be incorporated on the secondary
side of the transformer, as shown in the evaluation board
schematic (see Figure 43).
R
R
0.1µF
S
AIN
S
AD6645
AIN
02647-040
R
ADT4-1WT
T
LOG INPUT
SIGNAL
Figure 40. Transformer-Coupled Analog Input Circuit
In applications where dc coupling is required, a differential
output op amp, such as the AD8138, can be used to drive the
AD6645 (see Figure 41). The AD8138 op amp provides singleended-to-differential conversion, which reduces overall system
cost and minimizes layout requirements.
C
F
5V
499Ω
IN
499Ω
V
OCM
AD8138
499Ω
499Ω
C
F
Figure 41. DC-Coupled Analog Input Circuit
25Ω
25Ω
AIN
AD6645
AIN
VREF
DIGIT AL
OUTPUTS
Power Supplies
Care should be taken when selecting a power source. The use of
linear dc supplies with rise times of <45 ms is highly recommended.
Switching supplies tend to have radiated components that can
be received by the AD6645. Decouple each of the power supply
pins as close to the package as possible using 0.1 μF chip capacitors.
The AD6645 has separate digital and analog power supply pins.
The analog supplies are AV
DV
. Although analog and digital supplies can be tied together,
CC
and the digital supply pins are
CC
the best performance is achieved when the supplies are separate
because the fast digital output swings can couple switching
currents back into the analog supplies. Note that AV
held within 5% of 5 V. The AD6645 is specified for DV
must be
CC
= 3.3 V, a
CC
common supply for digital ASICs.
Digital Outputs
Care must be taken when designing the data receivers for the
AD6645. It is recommended that the digital outputs drive a
series resistor followed by a gate, such as the 74LCX574.
02647-041
To minimize capacitive loading, there should be only one gate
on each output pin. An example of this is shown in the evaluation
board schematic of Figure 43. The digital outputs of the AD6645
have a constant output slew rate of 1 V/ns. A typical CMOS gate
combined with a PCB trace have a load of approximately 10 pF.
Therefore, as each bit switches, 10 mA (10 pF × 1 V ÷ 1 ns) of
dynamic current per bit flow in or out of the device. A full-scale
transition can cause up to 140 mA (14 bits × 10 mA/bit) of current
to flow through the output stages. Place the series resistors as close
to the AD6645 as possible to limit the amount of current that can
flow into the output stage. These switching currents are confined
between ground and DV
. Standard TTL gates should be avoided
CC
because they can add appreciably to the dynamic switching
currents of the AD6645. Note that extra capacitive loading
increases output timing and invalidates timing specifications.
Digital output timing is guaranteed for output loads up to
10 pF. Digital output states for given analog input levels are
shown in Tab l e 8.
Grounding
For optimum performance, it is highly recommended that a
common ground be used between the analog and digital power
planes. The primary concern with splitting grounds is that
dynamic currents may be forced to travel significant distances
in the system before recombining back at the common source
ground. This can result in a large, undesirable ground loop. The
most common place for this to occur is on the digital outputs of
the ADC. Ground loops can contribute to digital noise being
coupled back onto the ADC front end. This can manifest itself
as either harmonic spurs, or very high-order spurious products
that can cause excessive spikes on the noise floor. This noise
coupling is less likely to occur at lower clock speeds because the
digital noise has more time to settle between samples. In general,
splitting the analog and digital grounds can frequently contribute
to undesirable EMI-RFI and should, therefore, be avoided.
Conversely, if not properly implemented, common grounding
can actually impose additional noise issues because the digital
ground currents ride on top of the analog ground currents in
close proximity to the ADC input. To further minimize the
potential for noise coupling, it is highly recommended that
multiple ground return traces/vias be placed such that the
digital output currents do not flow back toward the analog front
end but are routed quickly away from the ADC. This does not
require a split in the ground plane and can be accomplished by
simply placing substantial ground connections directly back to
the supply at a point between the analog front end and the
digital outputs. In addition, the judicious use of ceramic chip
capacitors between the power supply and ground planes helps
to suppress digital noise. The layout should incorporate enough
bulk capacitance to supply the peak current requirements
during switching periods.
Rev. D | Page 18 of 24
AD6645
−
=
LAYOUT INFORMATION
The schematic of the evaluation board (see Figure 43)
represents a typical implementation of the AD6645. A multilayer board is recommended to achieve best results. It is highly
recommended that high quality, ceramic chip capacitors be
used to decouple each supply pin to ground directly at the
device. The pinout of the AD6645 facilitates ease of use in the
implementation of high frequency, high resolution design practices.
All of the digital outputs are segregated to two sides of the chip,
with the inputs on the opposite side for isolation purposes.
Care should be taken when routing the digital output traces. To
prevent coupling through the digital outputs into the analog
portion of the AD6645, minimal capacitive loading should be
placed on these outputs. It is recommended that a fanout of
only one gate should be used for all AD6645 digital outputs.
The layout of the encode circuit is equally critical. Any noise
received on this circuitry results in corruption in the digitization
process and lower overall performance. The encode clock must be
isolated from the digital outputs and the analog inputs.
Table 8. Twos Complement Output Coding
AIN Level
AIN
Level
VREF + 0.55 V VREF − 0.55 V Positive FS
VREF VREF Midscale
VREF − 0.55 V VREF + 0.55 V Negative FS
Output State Output Code
01 1111 1111 1111
00 … 0/11 … 1
10 0000 0000 0000
JITTER CONSIDERATIONS
The SNR for an ADC can be predicted. When normalized to
ADC codes, the following equation accurately predicts the SNR
based on three terms: jitter, average DNL error, and thermal
noise. Each of these terms contributes to the noise within the
converter.
SNR
where:
f
t
and internal encode circuitry).
ε is the average DNL of the ADC (typically 0.41 LSB).
n is the number of bits in the ADC.
V
analog input of the ADC (typically 0.9 LSB rms).
For a 14-bit ADC, such as the AD6645, aperture jitter can
greatly affect the SNR performance as the analog frequency is
increased. Figure 42 shows a family of curves that demonstrate the
expected SNR performance of the AD6645 as jitter increases.
The chart is derived from the preceding equation.
For a complete discussion of aperture jitter, see the AN-756
application note, Sampled Systems and the Effects of Clock Phase Noise and Jitter. The AN-756 application note can be found on
www.analog.com.
76.1
2
2
⎡
()
2log20
⎢
ANALOG
⎣
is the analog input frequency.
ANALOG
is the rms jitter of the encode (rms sum of encode source
j rms
is the voltage rms thermal noise that refers to the