16-bit resolution and monotonicity
Dynamic power control for thermal management
or external PMOS mode
Current output ranges: 0 mA to 20 mA, 4 mA to 20 mA,
or 0 mA to 24 mA
±0.05% total unadjusted error (TUE) maximum
User programmable offset and gain
On-chip diagnostics
On-chip reference (±10 ppm/°C maximum)
−40°C to +105°C temperature range
APPLICATIONS
Process control
Actuator control
PLCs
HART network connectivity
GENERAL DESCRIPTION
The AD5757 is a quad, current output DAC that operates with a
power supply range from 10.8 V to 33 V. On-chip dynamic
power control minimizes package power dissipation by regulating the voltage on the output driver from 7.4 V to 29.5 V using
AD5757
a dc-to-dc boost converter optimized for minimum on-chip
power dissipation.
Each channel has a corresponding CHART pin so that HART
signals can be coupled onto the current output of the AD5757.
The part uses a versatile 3-wire serial interface that operates at
clock rates of up to 30 MHz and is compatible with standard
SPI, QSPI™, MICROWIRE™, DSP, and microcontroller interface
standards. The interface also features optional CRC-8 packet
error checking, as well as a watchdog timer that monitors
activity on the interface.
Additional companion products on the AD5757 product page
FUNCTIONAL BLOCK DIAGRAM
AV
DD
+15V
AGND
DV
DD
DGND
LDAC
SCLK
SDIN
SYNC
SDO
CLEAR
FAULT
ALERT
AD1
AD0
REFOUT
REFIN
NOTES
1. x = A, B, C, AND D.
Rev. B
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Anal og Devices for its use, nor for any infringements of patents or ot her
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarks and registered trademarks are the property of their respective owners.
−0.04 ±0.007 +0.04 % FSR TA = 25°C
Offset Error Drift2 ±6 ppm FSR/°C
Gain Error −0.12 +0.12 % FSR
−0.06 ±0.002 +0.06 % FSR TA = 25°C
Gain TC2 ±9 ppm FSR/°C
Full-Scale Error
−0.1 ±0.007 +0.1 % FSR TA = 25°C
Full-Scale TC2 ±14 ppm FSR/°C
DC Crosstalk4 −0.011 % FSR Internal R
OUTPUT CHARACTERISTICS2
Current Loop Compliance Voltage V
Output Current Drift vs. Time Drift after 1000 hours, ¾ scale output, TJ = 150°C
90 ppm FSR External R
140 ppm FSR Internal R
Resistive Load 1000 Ω The dc-to-dc converter has been characterized
Output Impedance 100 MΩ
DC PSRR 0.02 1 μA/V
REFERENCE INPUT/OUTPUT
Reference Input2
Reference Input Voltage 4.95 5 5.05 V For specified performance
DC Input Impedance 45 150 MΩ
= 15 V; DVDD = 2.7 V to 5.5 V; AVCC = 4.5 V to 5.5 V; dc-to-dc converter disabled; AGND = DGND = GNDSWx = 0 V;
BOOST_x
= 300 Ω; all specifications T
L
)
SET
MIN
to T
, unless otherwise noted.
MAX
Assumes ideal resistor; see the External Current
Setting Resistor section for more information
SET
)
SET
3, 4
−0.14 +0.14 % FSR
3, 4
−0.05 +0.05 % FSR
3, 4
−0.14 +0.14 % FSR
SET
−
V
−
BOOST_x
2.4
BOOST_x
2.7
V
SET
SET
with a maximum load of 1 kΩ, chosen such that
compliance is not exceeded; see Figure 31
DC-DC MaxV
bits in Table 24
and
Rev. B | Page 5 of 44
AD5757 Data Sheet
Parameter1 Min Typ Max Unit Test Conditions/Comments
Reference Output
Output Voltage 4.995 5 5.005 V TA = 25°C
Reference TC2 −10 ±5 +10 ppm/°C
Output Noise (0.1 Hz to 10 Hz)2 7 μV p-p
Noise Spectral Density2 100 nV/√Hz At 10 kHz
Output Voltage Drift vs. Time2 180 ppm Drift after 1000 hours, TJ = 150°C
Capacitive Load2 1000 nF
Load Current 9 mA
Short-Circuit Current 10 mA
Line Regulation2 3 ppm/V
Load Regulation2 95 ppm/mA
Thermal Hysteresis2 160 ppm First temperature cycle
5 ppm Second temperature cycle
DC-TO-DC
Switch
Switch On Resistance 0.425 Ω
Switch Leakage Current 10 nA
Peak Current Limit 0.8 A
Oscillator
Oscillator Frequency 11.5 13 14.5 MHz This oscillator is divided down to give the dc-to-dc
Maximum Duty Cycle 89.6 % At 410 kHz dc-to-dc switching frequency
DIGITAL INPUTS2 JEDEC compliant
VIH, Input High Voltage 2 V
VIL, Input Low Voltage 0.8 V
Input Current −1 +1 μA Per pin
Pin Capacitance 2.6 pF Per pin
DIGITAL OUTPUTS2
SDO, ALERT
VOL, Output Low Voltage 0.4 V Sinking 200 μA
VOH, Output High Voltage DVDD − 0.5 V Sourcing 200 μA
High Impedance Leakage Current −1 +1 μA
High Impedance Output
2.5 pF
Capacitance
FAULT
VOL, Output Low Voltage 0.4 V 10 kΩ pull-up resistor to DVDD
VOL, Output Low Voltage 0.6 V At 2.5 mA
VOH, Output High Voltage 3.6 V 10 kΩ pull-up resistor to DVDD
POWER REQUIREMENTS
AVDD 9 33 V
DVDD 2.7 5.5 V
AVCC 4.5 5.5 V
AIDD 7 7.5 mA
DICC 9.2 11 mA VIH = DVDD, VIL = DGND, internal oscillator running,
AICC 1 mA Over supplies
5
I
1 mA Per channel, current output mode, 0 mA output
Temperature range: −40°C to +105°C; typical at +25°C.
2
Guaranteed by design and characterization; not production tested.
3
For current outputs with internal R
loaded with the same code.
4
See the Current Output Mode with Internal R
5
Efficiency plots in Figure 33, Figure 34, Figure 35, and Figure 36 include the I
, the offset, full-scale, and TUE measurements exclude dc crosstalk. The measurements are made with all four channels enabled
SET
section for more explanation of the dc crosstalk.
SET
quiescent current.
BOOST
See Figure 42
See Figures 43
See Figure 42
converter switching frequency
over supplies
current output mode, outputs disabled
Rev. B | Page 6 of 44
Data Sheet AD5757
AC PERFORMANCE CHARACTERISTICS
AVDD = V
REFIN = 5 V; R
Table 2.
Parameter1 Min Typ Max Unit Test Conditions/Comments
DYNAMIC PERFORMANCE
Current Output
Output Current Settling Time 15 μs To 0.1% FSR (0 mA to 24 mA)
Output Noise (0.1 Hz to 10 Hz
Bandwidth)
Output Noise Spectral Density 0.5 nA/√Hz
1
Guaranteed by design and characterization; not production tested.
TIMING CHARACTERISTICS
AVDD = V
REFIN = 5 V; R
= 15 V; DVDD = 2.7 V to 5.5 V; AVCC = 4.5 V to 5.5 V; dc-to-dc converter disabled; AGND = DGND = GNDSWx = 0 V;
BOOST_x
= 300 Ω; all specifications T
L
MIN
to T
, unless otherwise noted.
MAX
See test conditions/
ms See Figure 26, Figure 27, and Figure 28
comments
0.15 LSB p-p 16-bit LSB, 0 mA to 24 mA range
Measured at 10 kHz, midscale output, 0
mA to 24 mA range
= 15 V; DVDD = 2.7 V to 5.5 V; AVCC = 4.5 V to 5.5 V; dc-to-dc converter disabled; AGND = DGND = GNDSWx = 0 V;
BOOST_x
= 300 Ω; all specifications T
L
MIN
to T
, unless otherwise noted.
MAX
Table 3.
Parameter
1, 2, 3
Limit at T
, T
Unit Description
MIN
MAX
t1 33 ns min SCLK cycle time
t2 13 ns min SCLK high time
t3 13 ns min SCLK low time
t4 13 ns min
t5 13 ns min
t6 198 ns min
falling edge to SCLK falling edge setup time
SYNC
th
/32nd SCLK falling edge to SYNC rising edge (see ) Figure 54
24
high time
SYNC
t7 5 ns min Data setup time
t8 5 ns min Data hold time
t9 20 μs min
rising edge to LDAC falling edge (all DACs updated or any channel has
SYNC
digital slew rate control enabled)
5 μs min
t10 10 ns min
t11 500 ns max
t12
See the AC Performance
μs max DAC output settling time
rising edge to LDAC falling edge (single DAC updated)
SYNC
pulse width low
LDAC
falling edge to DAC output response time
LDAC
Characteristics section
t13 10 ns min CLEAR high time
t14 5 μs max CLEAR activation time
t15 40 ns max SCLK rising edge to SDO valid
t16 21 μs min
5 μs min
t17 500 ns min
t18 800 ns min
4
t
20 μs min
19
5 μs min
rising edge to DAC output response time (LDAC = 0) (all DACs updated)
SYNC
rising edge to DAC output response time (LDAC = 0) (single DAC updated)
SYNC
falling edge to SYNC rising edge
LDAC
pulse width
RESET
high to next SYNC low (digital slew rate control enabled) (all DACs updated)
SYNC
high to next SYNC low (digital slew rate control disabled) (single DAC
SYNC
updated)
1
Guaranteed by design and characterization; not production tested.
2
All input signals are specified with t
3
See Figure 3, Figure 4, Figure 5, and Figure 6.
4
This specification applies if
LDAC
= t
= 5 ns (10% to 90% of DVDD) and timed from a voltage level of 1.2 V.
RISE
FALL
is held low during the write cycle; otherwise, see t9.
Rev. B | Page 7 of 44
AD5757 Data Sheet
Timing Diagrams
t
1
SCLK
SYNC
SDIN
LDAC
I
OUT_x
LDAC = 0
I
OUT_x
CLEAR
I
OUT_x
1224
t
6
t
4
t
7
MSB
t
13
t
t
3
t
8
14
t
2
t
10
t
5
t
19
LSB
t
t
9
t
17
t
16
10
t
t
11
t
12
12
t
RESET
18
09225-002
Figure 3. Serial Interface Timing Diagram
SCLK
SYNC
SDIN
SDO
11
MSBMSBLSBLSB
INPUT WORD SPECIFIES
REGISTER TO BE READ
UNDEFINEDSELECTED REGISTER DATA
2424
t
6
NOP CONDITI ON
MSBLSB
t
15
CLOCKED OUT
Figure 4. Readback Timing Diagram
09225-003
Rev. B | Page 8 of 44
Data Sheet AD5757
SCLK
SYNC
SDIN
SDO
LSBMSB
1216
DUT_
R/W
DUT_
AD1
SDO DISABLED
XXXD15D14D1D0
AD0
SDO_
ENAB
STATUSSTATUSSTATUSSTATUS
09225-004
Figure 5. Status Readback During Write
TO OUTPUT
PIN
50pF
C
200µAI
L
200µAI
OL
OH
VOH (MIN) OR
(MAX)
V
OL
09225-005
Figure 6. Load Circuit for SDO Timing Diagram
Rev. B | Page 9 of 44
AD5757 Data Sheet
ABSOLUTE MAXIMUM RATINGS
TA = 25°C, unless otherwise noted. Transient currents of up to
100 mA do not cause SCR latch-up.
Table 4.
Parameter Rating
AVDD, V
to AGND, DGND −0.3 V to +33 V
BOOST_x
AVCC to AGND −0.3 V to +7 V
DVDD to DGND −0.3 V to +7 V
Digital Inputs to DGND
−0.3 V to DV
+ 0.3 V or +7 V
DD
(whichever is less)
Digital Outputs to DGND
−0.3 V to DV
+ 0.3 V or +7 V
DD
(whichever is less)
REFIN, REFOUT to AGND
−0.3 V to AV
+ 0.3 V or +7 V
DD
(whichever is less)
I
OUT_x
to AGND
AGND to V
or 33 V if using
BOOST_x
the dc-to-dc circuitry
SWx to AGND −0.3 V to +33 V
AGND, GNDSWx to DGND −0.3 V to +0.3 V
Operating Temperature Range ( TA)
Industrial1 −40°C to +105°C
Storage Temperature Range −65°C to +150°C
Junction Temperature (TJ max) 125°C
64-Lead LFCSP
θJA Thermal Impedance2 20°C/W
Power Dissipation (TJ max – TA)/θJA
Lead Temperature JEDEC industry standard
Soldering J-STD-020
1
Power dissipated on chip must be derated to keep the junction temperature
below 125°C.
2
Based on a JEDEC 4-layer test board.
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
ESD CAUTION
Rev. B | Page 10 of 44
Data Sheet AD5757
PIN CONFIGURATION AND FUNCTION DESCRIPTIONS
DCDC_D
PIN 1
INDICATO R
SET_CRSET_D
R
REFOUT
REFINNCCHARTD
646362616059585756555453525150
BOOST_D
OUT_D
IGATED
COMP
V
NC
I
AGNDNCCHARTCNCIGATEC
49
R
1
SET_B
R
2
SET_A
REFGND
REFGND
NOTES
1. NC = NO CONNECT. DO NOT CONNECT TO T HIS PIN.
2. THE EXPOSED PAD SHOULD BE CONNECTED TO AGND, OR ALTERNATIVELY,
IT CAN BE LE FT EL ECTRICALLY UNCONNECT ED. IT IS RECOMMENDED THAT
THE PAD BE THE RMALLY CO NNECTED TO A COPPER PLANE FO R ENHANCED
THERMAL PE RFORMANCE.
AD0
AD1
SYNC
SCLK
SDIN
SDO
DV
DGND
LDAC
CLEAR
ALERT
FAULT
3
4
5
6
7
8
9
10
11
DD
12
13
14
15
16
171819202122232425262728293031
DGND
RESET
AV
DD
NC
AD5757
TOP VIEW
(Not to Scale)
NC
DCDC_A
IGATEA
BOOST_A
CHARTA
V
COMP
32
NC
NC
OUT_A
AGND
I
DCDC_B
IGATEB
CHARTB
COMP
48
47
46
45
44
43
42
41
40
39
38
37
36
35
34
33
COMP
I
OUT_C
V
BOOST_C
AV
CC
SW
C
GNDSW
GNDSW
SW
D
AGND
SW
A
GNDSW
GNDSW
SW
B
AGND
V
BOOST_B
I
OUT_B
DCDC_C
C
D
A
B
09225-006
Figure 7. Pin Configuration
Table 5. Pin Function Descriptions
Pin No. Mnemonic Description
1 R
SET_B
An external, precision, low drift 15 kΩ current setting resistor can be connected to this pin to improve the I
temperature drift performance. See the Device Features section.
2 R
SET_A
An external, precision, low drift 15 kΩ current setting resistor can be connected to this pin to improve the I
temperature drift performance. See the Device Features section.
3, 4 REFGND Ground Reference Point for Internal Reference.
5 AD0 Address Decode for the Device Under Test (DUT) on the Board.
6 AD1 Address Decode for the DUT on the Board.
7
Active Low Input. This is the frame synchronization signal for the serial interface. While SYNC is low, data is
SYNC
transferred in on the falling edge of SCLK.
8 SCLK
Serial Clock Input. Data is clocked into the input shift register on the falling edge of SCLK. This pin operates at
clock speeds of up to 30 MHz.
9 SDIN Serial Data Input. Data must be valid on the falling edge of SCLK.
10 SDO Serial Data Output. Used to clock data from the serial register in readback mode. See Figure 4 and Figure 5.
11 DVDD Digital Supply. The voltage range is from 2.7 V to 5.5 V.
12, 17 DGND Digital Ground.
13
Load DAC, Active Low Input. This is used to update the DAC register and consequently the DAC outputs. When
LDAC
tied permanently low, the addressed DAC data register is updated on the rising edge of SYNC. If LDAC is held
high during the write cycle, the DAC input register is updated, but the DAC output update only takes place at
14 CLEAR
the falling edge of LDAC
LDAC
pin must not be left unconnected.
Active High, Edge Sensitive Input. Asserting this pin sets the output current and voltage to the preprogrammed
(see ). Using this mode, all analog outputs can be updated simultaneously. The Figure 3
clear code bit setting. Only channels enabled to be cleared are cleared. See the Device Features section for more
information. When CLEAR is active, the DAC output register cannot be written to.
OUT_B
OUT_A
Rev. B | Page 11 of 44
AD5757 Data Sheet
Pin No. Mnemonic Description
15 ALERT
16
18
FAU LT
RESET
19 AVDD Positive Analog Supply. The voltage range is from 10.8 V to 33 V.
20, 25,
NC No Connect. Do not connect to this pin.
28, 30,
50, 52,
55, 60
21 CHARTA HART Input Connection for DAC Channel A.
22 IGATEA
23 COMP
24 V
26 I
DCDC_A
BOOST_A
Current Output Pin for DAC Channel A.
OUT_A
27, 40, 53 AGND Ground Reference Point for Analog Circuitry. This must be connected to 0 V.
29 CHARTB HART Input Connection for DAC Channel B.
31 IGATEB
32 COMP
33 I
34 V
DCDC_B
Current Output Pin for DAC Channel B.
OUT_B
BOOST_B
35 AGND Ground Reference Point for Analog Circuitry. This pin must be connected to 0 V.
36 SWB
37 GNDSWB Ground Connection for DC-to-DC Switching Circuit. This pin should always be connected to ground.
38 GNDSWA Ground Connection for DC-to-DC Switching Circuit. This pin should always be connected to ground.
39 SWA
41 SWD
42 GNDSWD Ground Connections for DC-to-DC Switching Circuit. This pin should always be connected to ground.
43 GNDSWC Ground Connections for DC-to-DC Switching Circuit. This pin should always be connected to ground.
44 SWC
45 AVCC Supply for DC-to-DC Circuitry.
46 V
47 I
48 COMP
BOOST_C
Current Output Pin for DAC Channel C.
OUT_C
DCDC_C
49 IGATEC
Active High Output. This pin is asserted when there has been no SPI activity on the interface pins for a
predetermined time. See the Device Features section for more information.
Active Low Output. This pin is asserted low when an open circuit in current mode is detected, a short circuit in
voltage mode is detected, a PEC error is detected, or an overtemperature is detected (see the Device Features
section). Open-drain output.
Hardware Reset. Active Low Input.
Optional Connection for External Pass Transistor. Should be left unconnected when using the dc-to-dc converter. See
the External PMOS Mode section for more information.
DC-to-DC Compensation Capacitor. Connect a 10 nF capacitor from this pin to ground. Used to regulate the
feedback loop of the Channel A dc-to-dc converter. Alternatively, if using an external compensation resistor,
place a resistor in series with a capacitor to ground from this pin (see the DC-to-DC Converter Compensation
Capacitors and the AICC Supply Requirements—Slewing sections in the Device Features section for more
information).
Supply for Channel A Current Output Stage (see Figure 49). To use the dc-to-dc feature of the device, connect as
shown in Figure 56.
Optional Connection for External Pass Transistor. Should be left unconnected when using the dc-to-dc converter.
See the External PMOS Mode section for more information.
DC-to-DC Compensation Capacitor. Connect a 10 nF capacitor from this pin to ground. Used to regulate the
feedback loop of the Channel B dc-to-dc converter. Alternatively, if using an external compensation resistor,
place a resistor in series with a capacitor to ground from this pin (see the DC-to-DC Converter Compensation
Capacitors and AI
Supply Requirements—Slewing sections in the Device Features section for more
CC
information).
Supply for Channel B Current Output Stage (see Figure 49). To use the dc-to-dc feature of the device, connect as
shown in Figure 56.
Switching Output for Channel B DC-to-DC Circuitry. To use the dc-to-dc feature of the device, connect as shown
in Figure 56.
Switching Output for Channel A DC-to-DC Circuitry. To use the dc-to-dc feature of the device, connect as shown
in Figure 56.
Switching Output for Channel D DC-to-DC Circuitry. To use the dc-to-dc feature of the device, connect as shown
in Figure 56.
Switching Output for Channel C DC-to-DC Circuitry. To use the dc-to-dc feature of the device, connect as shown
in Figure 56.
Supply for Channel C Current Output Stage (see Figure 49). To use the dc-to-dc feature of the device, connect as
shown in Figure 56.
DC-to-DC Compensation Capacitor. Connect a 10 nF capacitor from this pin to ground. Used to regulate the
feedback loop of the Channel C dc-to-dc converter. Alternatively, if using an external compensation resistor,
place a resistor in series with a capacitor to ground from this pin (see the DC-to-DC Converter Compensation
Capacitors and AICC Supply Requirements—Slewing sections in the Device Features section for more
information).
Optional Connection for External Pass Transistor. Should be left unconnected when using the dc-to-dc converter. See
the External PMOS Mode section for more information.
Rev. B | Page 12 of 44
Data Sheet AD5757
Pin No. Mnemonic Description
51 CHARTC HART Input Connection for DAC Channel C.
54 I
56 V
57 COMP
58 IGATED
59 CHARTD HART Input Connection for DAC Channel D.
61 REFIN External Reference Voltage Input.
62 REFOUT
63 R
64 R
EPAD
Current Output Pin for DAC Channel D.
OUT_D
BOOST_D
Supply for Channel D Current Output Stage (see Figure 49). To use the dc-to-dc feature of the device, connect as
shown in Figure 56.
DCDC_D
DC-to-DC Compensation Capacitor. Connect a 10 nF capacitor from this pin to ground. Used to regulate the
feedback loop of the Channel D dc-to-dc converter. Alternatively, if using an external compensation resistor,
place a resistor in series with a capacitor to ground from this pin (see the DC-to-DC Converter Compensation
Capacitors and AICC Supply Requirements—Slewing sections in the Device Features section for more
information).
Optional Connection for External Pass Transistor. Should be left unconnected when using the dc-to-dc converter.
See the External PMOS Mode section for more information.
Internal Reference Voltage Output. It is recommended to place a 0.1 μF capacitor between REFOUT and
REFGND.
SET_D
An external, precision, low drift 15 kΩ current setting resistor can be connected to this pin to improve the I
temperature drift performance. See the Device Features section.
SET_C
An external, precision, low drift 15 kΩ current setting resistor can be connected to this pin to improve the I
temperature drift performance. See the Device Features section.
Exposed Pad. This exposed pad should be connected to AGND, or, alternatively, it can be left electrically
unconnected. It is recommended that the pad be thermally connected to a copper plane for enhanced thermal
performance.
OUT_D
OUT_C
Rev. B | Page 13 of 44
AD5757 Data Sheet
TYPICAL PERFORMANCE CHARACTERISTICS
CURRENT OUTPUTS
–0.0005
INL ERROR (%FSR)
–0.0010
–0.0015
–0.0020
–0.0025
0.0025
0.0020
0.0015
0.0010
0.0005
AVDD = 15V
T
= 25°C
A
0
4mA TO 20mA, EXTERNAL R
4mA TO 20mA, EXTERNAL R
4mA TO 20mA, INTERNAL R
4mA TO 20mA, INTERNAL R
4mA TO 20mA, EXTERNAL R
01000020000 30000400005000060000
SET
, WIT H DC-TO-DC CO NVERTER
SET
SET
, WIT H DC-TO-DC CO NVERTER
SET
, EXTERNAL PM OS MODE
SET
CODE
Figure 8. Integral Nonlinearity vs. Code
09225-149
0.0010
0.0008
0.0006
0.0004
0.0002
–0.0002
INL ERROR (%FSR)
–0.0004
4mA TO 20mA RANGE MAX INL
0mA TO 24mA RANGE MAX INL
0mA TO 20mA RANGE MIN INL
0
0mA TO 20mA RANGE MAX INL
4mA TO 20mA RANGE MAX INL
0mA TO 24mA RANGE MIN INL
AVDD = 15V
–0.0006
–0.0008
–0.0010
–40–20020406080100
TEMPERATURE (°C)
Figure 11. Integral Nonlinearity vs. Temperature, Internal R
09225-152
SET
1.0
4mA TO 20mA, EXTERNA L R
4mA TO 20mA, EXTERNA L R
0.8
4mA TO 20mA, INTERNAL R
4mA TO 20mA, INTERNAL R
0.6
4mA TO 20mA, EXTERNA L R
0.4
0.2
0
–0.2
DNL ERROR (LSB)
–0.4
–0.6
AVDD = 15V
–0.8
T
= 25°C
A
–1.0
01000020000 30000400005000060000
SET
, WIT H DC-TO-DC CO NVERTER
SET
SET
, WIT H DC-TO-DC CO NVERTER
SET
, EXTERNAL PM OS MODE
SET
CODE
Figure 9. Differential Nonlinearity vs. Code
0.035
AVDD = 15V
T
= 25°C
0.030
A
ALL CHANNELS ENABLED
0.025
–0.005
TOTAL UNADJUSTED ERROR (%FSR)
–0.010
–0.015
0.020
0.015
0.010
0.005
4mA TO 20mA, EXTERNAL R
4mA TO 20mA, EXTERNAL R
4mA TO 20mA, INTERNAL R
4mA TO 20mA, INTERNAL R
4mA TO 20mA, EXTERNAL R
0
01000020000 300004000050000 60000
SET
, WIT H DC-TO-DC CO NVERTER
SET
SET
, WITH DC-TO-DC CO NVERTER
SET
, EXTERNAL PM OS MO DE
SET
CODE
Figure 10. Total Unadjusted Error vs. Code
0.0020
4mA TO 20mA RANGE MAX INL
0.0015
0.0010
0.0005
0
–0.0005
INL ERROR (%FSR)
–0.0010
–0.0015
–0.0020
–40–20020406080100
09225-150
Figure 12. Integral Nonlinearity vs. Temperature, External R
1.0
AVDD = 15V
ALL RANGE S
0.8
INTERNAL AND EXTERNAL R
0.6
0mA TO 24mA RANGE MAX INL
0mA TO 20mA RANGE MI N INL
0mA TO 20mA RANGE MAX INL
4mA TO 20mA RANGE MI N INL
0mA TO 24mA RANGE MI N INL
AVDD = 15V
TEMPERATURE (°C)
SET
09225-153
SET
0.4
0.2
0
DNL ERROR M AX
DNL ERROR M IN
–0.2
DNL ERROR (LSB)
–0.4
–0.6
–0.8
–1.0
–40–20020406080100
09225-151
TEMPERATURE (°C)
09225-154
Figure 13. Differential Nonlinearity vs. Temperature
Rev. B | Page 14 of 44
Data Sheet AD5757
0.03
0.02
0.01
0
–0.01
–0.02
–0.03
–0.04
–0.05
–0.06
TOTAL UNADJSUTED ERROR (%FSR)
–0.07
–0.08
–40–20020406080100
AVDD = 15V
4mA TO 20mA INTERNAL R
0mA TO 20mA INTERNAL R
0mA TO 24mA INTERNAL R
4mA TO 20mA EXTE RNAL R
0mA TO 20mA EXTE RNAL R
0mA TO 24mA EXTE RNAL R
TEMPERATURE (°C)
SET
SET
SET
SET
SET
SET
Figure 14. Total Unadjusted Error vs. Temperature
0.03
0.02
0.01
0
–0.01
–0.02
–0.03
–0.04
–0.05
FULL-SCAL E ERROR (%FSR)
–0.06
–0.07
–0.08
–40–20020406080100
AVDD = 15V
4mA TO 20mA INTERNAL R
0mA TO 20mA INTERNAL R
0mA TO 24mA INTERNAL R
4mA TO 20mA EXTE RNAL R
0mA TO 20mA EXTE RNAL R
0mA TO 24mA EXTE RNAL R
TEMPERATURE (°C)
SET
SET
SET
SET
SET
SET
Figure 15. Full-Scale Error vs. Temperature
0.020
09225-155
09225-157
0.02
0.01
0
–0.01
–0.02
–0.03
GAIN ERRO R (%FSR)
–0.04
–0.05
–0.06
–40–20020406080100
AVDD = 15V
4mA TO 20mA INT ERNAL R
0mA TO 20mA INT ERNAL R
0mA TO 24mA INT ERNAL R
4mA TO 20mA EXTERNAL R
0mA TO 20mA EXTERNAL R
0mA TO 24mA EXTERNAL R
TEMPERATURE (°C)
Figure 17. Gain Error vs. Temperature
0.0025
0.0020
0.0015
0.0010
0.0005
–0.0005
INL ERROR (%FSR)
–0.0010
–0.0015
–0.0020
4mA TO 20mA RANGE MAX INL
4mA TO 20mA RANGE MIN I NL
T
= 25°C
A
0
1015202530
SUPPLY (V)
Figure 18. Integral Nonlinearity Error vs. AV
Over Supply, External R
0.0015
SET
SET
SET
SET
SET
SET
SET
09225-159
09225-056
,
DD
0.015
0.010
0.005
0
–0.005
OFFSET ERROR (%FSR)
–0.010
–0.015
–0.020
–40–20020406080100
AVDD = 15V
4mA TO 20mA INTERNAL R
0mA TO 20mA INTERNAL R
0mA TO 24mA INTERNAL R
4mA TO 20mA EXTERNAL R
0mA TO 20mA EXTERNAL R
0mA TO 24mA EXTERNAL R
TEMPERATURE (°C)
Figure 16. Offset Error vs. Temperature
SET
SET
SET
SET
SET
SET
09225-158
Rev. B | Page 15 of 44
0.0010
0.0005
0
–0.0005
–0.0010
INL ERROR (%FSR)
–0.0015
–0.0020
–0.0025
4mA TO 20mA RANGE MAX INL
4mA TO 20mA RANGE MIN I NL
T
= 25°C
A
1015202530
SUPPLY (V)
Figure 19. Integral Nonlinearity Error vs. AV
Over Supply, Internal R
09225-057
,
DD
SET
AD5757 Data Sheet
1.0
ALL RANGES
INTERNAL AND EXT ERNAL R
0.8
TA = 25°C
0.6
0.4
0.2
DNL ERROR MAX
0
DNL ERROR MIN
–0.2
DNL ERROR (LSB)
–0.4
–0.6
–0.8
–1.0
1015202530
SET
SUPPLY (V)
Figure 20. Differential Nonlinearity Error vs. AV
09225-162
DD
0.006
0.004
0.002
0
–0.002
–0.004
–0.006
–0.008
TOTAL UNADJUST ED ERROR (%FS R)
–0.010
–0.012
1015202530
MAX OF TUE
MIN OF TUE
V
BOOST_ X
Figure 23. Total Unadjusted Error vs. V
TA = 25°C
EXTERNAL PMOS (NTL JS4149)
4mA TO 20mA RANGE
R
= 300Ω
LOAD
SUPPLY (V)
, Using External PMOS Mode
BOOST_X
09225-188
0.012
0.010
0.008
0.006
0.004
4mA TO 20mA RANG E MAX TUE
TOTAL UNADJUSTED ERROR ( %FSR)
0.002
4mA TO 20mA RANG E MIN TUE
= 25°C
T
A
0
1015202530
SUPPLY (V)
Figure 21. Total Unadjusted Error vs. AV
0
–0.002
–0.004
TOTAL UNADJUSTED ERRO R (%FSR)
–0.006
–0.008
–0.010
–0.012
–0.014
–0.016
–0.018
–0.020
4mA TO 20mA RANG E MAX TUE
4mA TO 20mA RANG E MIN TUE
= 25°C
T
A
1015202530
SUPPLY (V)
Figure 22. Total Unadjusted Error vs. AV
, External R
DD
, Internal R
DD
6
5
4
3
CURRENT (µA)
2
1
0
09225-060
SET
09225-061
SET
0215105
TIME (µs)
Figure 24. Output Current vs. Time on Power-Up
4
2
0
–2
–4
VOLTAGE (µA)
–6
–8
–10
0123456
TIME (µs)
Figure 25. Output Current vs. Time on Output Enable
Figure 27. Output Current Settling with DC-to-DC Converter vs. Time and
Temperature (See Figure 56)
25
20
I
15
10
OUTPUT CURRENT (mA)
5
0
–0.2500.25 0. 50 0.75 1.00 1.25 1. 50 1.75
, AVCC = 4.5V
OUT
I
, AVCC = 5.0V
OUT
I
, AVCC = 5.5V
OUT
0mA TO 24mA RANGE
1kΩ LOAD
f
= 410kHz
SW
INDUCTOR = 10µH (XAL 4040-103)
T
= 25°C
A
TIME (ms)
09225-169
Figure 28. Output Current Settling with DC-to-DC Converter vs. Time and
(See Figure 56)
AV
CC
25
I
(4mA TO 20mA STEP)
20
15
10
5
TOTAL UNADJUST ED ERROR (%FSR)
0
–5501015
OUT
TA = 25°C
EXTERNAL PMOS (NTLJS4149)
4mA TO 20mA RANGE
R
= 300Ω
LOAD
V
= 24V
BOOST_X
I
(20mA TO 4mA STEP)
OUT
TIME (µs)
20
09225-189
Figure 29. Output Current Settling Time with External PMOS Transistor
Rev. B | Page 17 of 44
AD5757 Data Sheet
10
8
6
4
2
0
–2
–4
CURRENT (AC COUPLED) (µA)
–6
–8
–10
02468101214
20mA OUTPUT
10mA OUTPUT
AVCC = 5V
f
= 410kHz
SW
INDUCTOR = 10µH (XAL4040-103)
TIME (µs)
0mA TO 2 4mA RANG E
1kΩ LOAD
EXTERNAL R
SET
TA = 25°C
09225-170
Figure 30. Output Current vs. Time with DC-to-DC Converter (See Figure 56)
0
AVDD = 15V
V
= 15V
–20
–40
–60
PSRR (dB)
OUT_x
I
–80
–100
–120
BOOST
T
= 25°C
A
101001k10k100k1M10M
Figure 32. I
FREQUENCY (Hz )
PSRR vs. Frequency
OUT_x
09225-068
8
7
6
5
4
3
2
HEADROOM VOL TAGE (V)
1
0
05101520
0mA TO 24mA RANGE
1kΩ LOAD
f
= 410kHz
SW
INDUCTOR = 10µ H (XAL4040-103)
T
= 25°C
A
CURRENT (mA)
09225-067
Figure 31. DC-to-DC Converter Headroom vs. Output Current (See Figure 56)
Rev. B | Page 18 of 44
Data Sheet AD5757
DC-TO-DC BLOCK
90
85
80
75
AVCC = 4.5V
AV
= 5V
CC
AV
= 5.5V
CC
80
20mA
70
60
70
EFFICIENCY (%)
65
BOOST_x
V
60
55
50
0220161284
Figure 33. Efficiency at V
EFFICIE NCY (%)
BOOST_ x
V
90
85
80
75
70
65
60
55
50
–40100406080200–20
20mA
0mA TO 24mA RANGE
1kΩ LOAD
EXTERNAL R
AVCC = 5V
f
= 410kHz
SW
INDUCTOR = 10µ H (XAL4040-103)
Figure 34. Efficiency at V
0mA TO 24mA RANGE
1kΩ LOAD
EXTERNAL R
f
SW
INDUCTOR = 10µH (X AL4040-103)
T
= 25°C
A
CURRENT (mA)
vs. Output Current (See Figure 56)
BOOST_x
SET
TEMPERATURE ( °C)
vs. Temperature (See Figure 56)
BOOST_x
= 410kHz
SET
50
EFFICIENCY (%)
40
OUT_x
I
4
09225-016
0mA TO 24mA RANGE
1kΩ LOAD
EXTERNAL R
AVCC = 5V
30
f
SW
INDUCTOR = 10µH (XAL4040-103)
20
–40100406080200–20
SET
= 410 kHz
TEMPERAT URE (°C)
Figure 36. Output Efficiency vs. Temperature (See Figure 56)
0.6
0.5
0.4
0.3
0.2
SWITCH RESISTANCE (Ω)
0.1
0
–40–20020406080100
09225-017
TEMPERATURE (°C)
Figure 37. Switch Resistance vs. Temperature
09225-019
09225-123
80
70
60
50
EFFICIENCY (%)
40
OUT_x
I
30
20
0220161284
AVCC = 4.5V
= 5V
AV
CC
= 5.5V
AV
CC
0mA TO 24mA RANGE
1kΩ LOAD
EXTERNAL R
f
SW
INDUCTOR = 10µH (X AL4040-103)
= 25°C
T
A
CURRENT (mA)
= 410kHz
SET
Figure 35. Output Efficiency vs. Output Current (See Figure 56)
4
09225-018
Rev. B | Page 19 of 44
AD5757 Data Sheet
REFERENCE
16
14
12
10
VOLTAGE (V)
–2
AV
DD
REF
OUT
TA = 25°C
8
6
4
2
0
00.20.40.60.81.01.2
TIME (ms)
Figure 38. REFOUT Turn-On Transient
4
AVDD = 15V
T
= 25°C
A
3
09225-010
5.0050
5.0045
5.0040
5.0035
5.0030
5.0025
5.0020
REFOUT (V)
5.0015
5.0010
5.0005
5.0000
–40–20 0 20406080100
30 DEVICES SHOWN
= 15V
AV
DD
TEMPERAT URE (°C)
09225-163
Figure 41. REFOUT vs. Temperature (When the AD5757 is soldered onto a
PCB, the reference shifts due to thermal shock on the package. The average
output voltage shift is –4 mV. Measurement of these parts after seven days
shows that the outputs typically shift back 2 mV toward their initial values.
This second shift is due to the relaxation of stress incurred during soldering.)
Figure 46. Internal Oscillator Frequency vs. Temperature
09225-020
8
7
6
5
4
3
CURRENT (mA)
2
1
0
1015202530
VOLTAGE (V)
Figure 45. AI
vs. AVDD
DD
AI
DD
TA = 25°C
I
= 0mA
OUT
09225-009
14.4
14.2
14.0
13.8
13.6
FREQUENCY ( MHz)
13.4
13.2
DVCC = 5.5V
= 25°C
T
13.0
Figure 47. Internal Oscillator Frequency vs. DV
A
2.53. 03.54. 04.55.05.5
VOLTAGE (V)
Supply Voltage
CC
09225-021
Rev. B | Page 21 of 44
AD5757 Data Sheet
V
I
×
TERMINOLOGY
Relative Accuracy or Integral Nonlinearity (INL)
For the DAC, relative accuracy, or integral nonlinearity, is a
measure of the maximum deviation, in LSBs, from the best fit
line through the DAC transfer function. A typical INL vs. code
plot is shown in Figure 8.
Differential Nonlinearity (DNL)
Differential nonlinearity (DNL) is the difference between the
measured change and the ideal 1 LSB change between any two
adjacent codes. A specified differential nonlinearity of ±1 LSB
maximum ensures monotonicity. This DAC is guaranteed
monotonic by design. A typical DNL vs. code plot is shown in
Figure 9.
Monotonicity
A DAC is monotonic if the output either increases or remains
constant for increasing digital input code. The AD5757 is
monotonic over its full operating temperature range.
Offset Error
Offset error is the deviation of the analog output from the ideal
zero-scale output when all DAC registers are loaded with
0x0000.
Gain Error
This is a measure of the span error of the DAC. It is the deviation in slope of the DAC transfer characteristic from the ideal,
expressed in % FSR.
Gain TC
This is a measure of the change in gain error with changes in
temperature. Gain TC is expressed in ppm FSR/°C.
Full-Scale Error
Full-Scale error is a measure of the output error when full-scale
code is loaded to the DAC register. Ideally, the output should be
full-scale − 1 LSB. Full-scale error is expressed in percent of
full-scale range (% FSR).
Full-Scale TC
Full-scale TC is a measure of the change in full-scale error with
changes in temperature and is expressed in ppm FSR/°C.
Tot a l U n ad ju s te d E rr o r
Total unadjusted error (TUE) is a measure of the output error
taking all the various errors into account, including INL error,
offset error, gain error, temperature, and time. TUE is expressed
in % FSR.
DC Crosstalk
This is the dc change in the output level of one DAC in response
to a change in the output of another DAC. It is measured with a
full-scale output change on one DAC while monitoring another
DAC, which is at midscale.
Current Loop Compliance Voltage
The maximum voltage at the I
pin for which the output
OUT_x
current is equal to the programmed value.
Voltage Reference Thermal Hysteresis
Voltage reference thermal hysteresis is the difference in output
voltage measured at +25°C compared to the output voltage
measured at +25°C after cycling the temperature from +25°C to
−40°C to +105°C and back to +25°C. The hysteresis is specified
for the first and second temperature cycles and is expressed in ppm.
Power-On Glitch Energy
Power-on glitch energy is the impulse injected into the analog
output when the AD5757 is powered-on. It is specified as the area
of the glitch in nV-sec. See Figure 24.
Power Supply Rejection Ratio (PSRR)
PSRR indicates how the output of the DAC is affected by
changes in the power supply voltage.
Reference TC
Reference TC is a measure of the change in the reference output
voltage with a change in temperature. It is expressed in ppm/°C.
Line Regulation
Line regulation is the change in reference output voltage due to
a specified change in supply voltage. It is expressed in ppm/V.
Load Regulation
Load regulation is the change in reference output voltage due to
a specified change in load current. It is expressed in ppm/mA.
DC-to-DC Converter Headroom
This is the difference between the voltage required at the
current output and the voltage supplied by the dc-to-dc
converter. See Figure 31.
Output Efficiency
2
RI
×
LOAD
OUT
×
AIAV
CCCC
This is defined as the power delivered to a channel’s load vs. the
power delivered to the channel’s dc-to-dc input.
Efficiency at V
×
This is defined as the power delivered to a channel’s V
BOOST_x
AIAV
CCCC
_
xBOOSTOUT
BOOST_x
supply vs. the power delivered to the channel’s dc-to-dc input.
The V
quiescent current is considered part of the dc-to-
BOOST_x
dc converter’s losses.
Rev. B | Page 22 of 44
Data Sheet AD5757
V
V
THEORY OF OPERATION
The AD5757 is a quad, precision digital-to-current loop
converter designed to meet the requirements of industrial
process control applications. It provides a high precision, fully
integrated, low cost, single-chip solution for generating current
loop outputs. The current ranges available are 0 mA to 20 mA,
0 mA to 24 mA, and 4 mA to 20 mA. The desired output
configuration is user selectable via the DAC control register.
On-chip dynamic power control minimizes package power
dissipation in current mode.
DAC ARCHITECTURE
The DAC core architecture of the AD5757 consists of two
matched DAC sections. A simplified circuit diagram is shown
in Figure 48. The four MSBs of the 16-bit data-word are
decoded to drive 15 switches, E1 to E15. Each of these switches
connects one of 15 matched resistors to either ground or the
reference buffer output. The remaining 12 bits of the data-word
drive Switch S0 to Switch S11 of a 12-bit voltage mode R-2R
ladder network.
OUT
2R 2R
12-BIT R-2-R LADDERFOUR MSBs DECODED INTO
The voltage output from the DAC core is converted to a current
(see Figure 49), which is then mirrored to the supply rail so that
the application simply sees a current source output. The current
outputs are supplied by V
Reference Buffers
The AD5757 can operate with either an external or internal
reference. The reference input requires a 5 V reference for
specified performance. This input voltage is then buffered
before it is applied to the DAC.
After device power-on or a device reset, it is recommended to
wait 100 s or more before writing to the device to allow time
for internal calibrations to take place.
pins are in tristate mode.
OUT_x
SERIAL INTERFACE
The AD5757 is controlled over a versatile 3-wire serial interface
that operates at clock rates of up to 30 MHz and is compatible
with SPI, QSPI, MICROWIRE, and DSP standards. Data coding
is always straight binary.
Input Shift Register
The input shift register is 24 bits wide. Data is loaded into the
device MSB first as a 24-bit word under the control of a serial
clock input, SCLK. Data is clocked in on the falling edge of SCLK.
If packet error checking, or PEC (see the Device Features
section), is enabled, an additional eight bits must be written to
the AD5757, creating a 32-bit serial interface.
There are two ways in which the DAC outputs can be updated:
individual updating or simultaneous updating of all DACs.
Individual DAC Updating
In this mode,
the DAC data register. The addressed DAC output is updated on
the rising edge of
information.
Simultaneous Updating of All DACs
In this mode,
into the DAC data register. Only the first write to each channel’s
DAC data register is valid after
quent writes while
they are loaded into the DAC data register. All the DAC outputs
are updated by taking
LDAC
is held low while data is being clocked into
SYNC
. See and for timing
Table 3Figure 3
LDAC
is held high while data is being clocked
LDAC
is brought high. Any subse-
LDAC
is still held high are ignored, although
LDAC
low after
V
REFIN
LDAC
SCLK
SYNC
SDIN
Figure 50. Simplified Serial Interface of Input Loading Circuitry
16-BIT
DAC
DAC
REGISTER
DAC INPUT
REGISTER
DAC DATA
REGISTER
INTERFACE
LOGIC
for One DAC Channel
SYNC
OUTPUT
I/V AMPLIFIER
OFFSET
AND GAIN
CALIBRATIO N
SDO
is taken high.
V
OUT_x
09225-072
Rev. B | Page 23 of 44
AD5757 Data Sheet
TRANSFER FUNCTION
For the 0 mA to 20 mA, 0 mA to 24 mA, and 4 mA to 20 mA
current output ranges, the output current is respectively
expressed as
mA20
⎡
=
OUT
⎢
⎣
⎡
=
OUT
⎢
⎣
⎡
=DI
OUT
⎢
⎣
where:
D is the decimal equivalent of the code loaded to the DAC.
N is the bit resolution of the DAC.
⎤
DI
×
⎥
N
2
⎦
mA24
⎤
DI
×
N
⎥
2
⎦
mA16
⎤
N
2
+×
⎥
⎦
mA4
Rev. B | Page 24 of 44
Data Sheet AD5757
REGISTERS
Tabl e 6 shows an overview of the registers for the AD5757.
Table 6. Data, Control, and Readback Registers for the AD5757
Register Description
Data
DAC Data Register (×4)
Gain Register (×4)
Offset Register (×4)
Clear Code Register (×4)
Control
Main Control Register
Software Register
Slew Rate Control Register (×4)
DAC Control Register (×4) These registers are used to control the following:
DC-to-DC Control Register
Readback
Status Register This contains any fault information, as well as a user toggle bit.
Used to write a DAC code to each DAC channel. AD5757 data bits = D15 to D0. There are four DAC
data registers, one per DAC channel.
Used to program gain trim, on a per channel basis. AD5757 data bits = D15 to D0. There are four gain
registers, one per DAC channel.
Used to program offset trim, on a per channel basis. AD5757 data bits = D15 to D0. There are four
offset registers, one per DAC channel.
Used to program clear code on a per channel basis. AD5757 data bits = D15 to D0. There are four clear
code registers, one per DAC channel.
Used to configure the part for main operation. Sets functions such as status readback during write,
enables output on all channels simultaneously, powers on all dc-to-dc converter blocks
simultaneously, and enables and sets conditions of the watchdog timer. See the Device Features
section for more details.
Has three functions. Used to perform a reset, to toggle the user bit and, as part of the watchdog timer
feature, to verify correct data communication operation.
Used to program the slew rate of the output. There are four slew rate control registers, one per
channel.
Set the output range, for example, 4 mA to 20 mA.
Set whether an internal/external sense resistor is used.
Enable/disable a channel for CLEAR.
Enable/disable internal circuitry on a per channel basis.
Enable/disable output on a per channel basis.
Power on dc-to-dc converters on a per channel basis.
There are four DAC control registers, one per DAC channel.
Use to set the dc-to-dc control parameters. Can control dc-to-dc maximum voltage, phase, and
frequency.
Rev. B | Page 25 of 44
AD5757 Data Sheet
PROGRAMMING SEQUENCE TO WRITE/ENABLE
THE OUTPUT CORRECTLY
To correctly write to and set up the part from a power-on
condition, use the following sequence:
1.
Perform a hardware or software reset after initial power-on.
The dc-to-dc converter supply block must be configured.
2.
Set the dc-to-dc switching frequency, maximum output
voltage allowed, and the phase that the four dc-to-dc
channels clock at.
Configure the DAC control register on a per channel basis.
3.
The output range is selected, and the dc-to-dc converter
block is enabled (DC_DC bit). Other control bits can be
configured at this point. Set the INT_ENABLE bit;
however, the output enable bit (OUTEN) should not be set.
Write the required code to the DAC data register. This
4.
implements a full DAC calibration internally. Allow at least
200 µs before Step 5 for reduced output glitch.
Write to the DAC control register again to enable the
5.
output (set the OUTEN bit).
CHANGING AND REPROGRAMMING THE RANGE
When changing between ranges, the same sequence as
described in the Programming Sequence to Write/Enable the
Output Correctly section should be used. It is recommended to
set the range to zero scale prior to disabling the output. Because
the dc-to-dc switching frequency, maximum voltage, and phase
have already been selected, there is no need to reprogram these.
A flowchart of this sequence is shown in Figure 52.
CHANNEL’S O UTPUT I S ENABLED.
STEP 1: W RITE TO CHANNE L’S DAC DATA
REGISTER. SET THE OUTPUT
TO 0V (ZERO OR MIDSCALE).
STEP 2: W RITE TO DAC CO NTROL REG ISTER.
DISABLE THE OUTPUT (OUTEN = 0), AND
SET THE NE W OUTP UT RANGE. KEEP THE
DC_DC BIT AND THE INT_ENABL E BIT SE T.
STEP 3: WRITE VALUE TO THE DAC DATA REGISTER.
A flowchart of this sequence is shown in Figure 51.
POWER ON.
STEP 1: PERFORM A SO FTWARE /HARDWARE RESET.
STEP 2: W RITE TO DC-TO- DC CONTROL REGIST ER TO
SET DC-TO -DC CLOCK F REQUENCY, PHASE,
AND MAXIMUM VOLTAGE.
STEP 3: WRITE TO DAC CONTROL REGISTER. SELECT
THE DAC CHANNEL AND OUTPUT RANGE.
SET T HE DC_DC BIT AND O THER CONT ROL
BITS AS REQUIRED. SET THE INT_ENABLE BIT
BUT DO NOT SELECT THE OUTEN BIT.
STEP 4: WRITE TO EACH/ALL DAC DATA REGI STERS.
ALLOW AT LEAST 200µs BETWEEN STEP 3
AND STEP 5 FOR REDUCED O UTPUT GLITCH.
STEP 5: W RITE TO DAC CONTRO L REGISTER. REL OAD
SEQUENCE AS I N STEP 3 ABO VE. THI S TIME
SELECT T HE OUTEN BI T TO ENABLE
THE OUTPUT.
Figure 51. Programming Sequence for Enabling the Output Correctly
STEP 4: W RITE TO DAC CO NTROL REG ISTER.
RELOAD SEQUENCE AS IN ST EP 2 ABOVE.
THIS TIME SELECT THE OUTEN BIT TO
ENABLE THE OUTPUT.
09225-074
Figure 52. Steps for Changing the Output Range
09225-073
Rev. B | Page 26 of 44
Data Sheet AD5757
DATA REGISTERS
The input register is 24 bits wide. When PEC is enabled, the
input register is 32 bits wide, with the last eight bits corresponding to the PEC code (see the Packet Error Checking section for
more information on PEC). When writing to a data register, the
format in Tabl e 7 must be used.
Table 7. Writing to a Data Register
MSB LSB
D23 D22 D21 D20 D19 D18 D17 D16 D15 to D0
R/W
DUT_AD1 DUT_AD0 DREG2 DREG1 DREG0 DAC_AD1 DAC_AD0 Data
Table 8. Input Register Decode
Bit Description
R/W
DUT_AD1, DUT_AD0
0 0 Addresses part with Pin AD1 = 0, Pin AD0 = 0
0 1 Addresses part with Pin AD1 = 0, Pin AD0 = 1
1 0 Addresses part with Pin AD1 = 1, Pin AD0 = 0
1 1 Addresses part with Pin AD1 = 1, Pin AD0 = 1
DREG2, DREG1, DREG0
DAC_AD1, DAC_AD0 These bits are used to decode the DAC channel.
0 0 DAC A
0 1 DAC B
1 0 DAC C
1 1 DAC D
X X These are don’t cares if they are not relevant to the operation being performed.
Indicates a read from or a write to the addressed register.
Used in association with the external pins, AD1 and AD0, to determine which AD5757 device is being addressed
by the system controller.
DUT_AD1 DUT_AD0 Function
Selects whether a data register or a control register is written to. If a control register is selected, a further decode
of CREG bits (see Table 16) is required to select the particular control register, as follows.
DREG2 DREG1 DREG0 Function
0 0 0 Write to DAC data register (individual channel write)
0 1 0 Write to gain register
0 1 1 Write to gain register (all DACs)
1 0 0 Write to offset register
1 0 1 Write to offset register (all DACs)
1 1 0 Write to clear code register
1 1 1 Write to a control register
DAC_AD1 DAC_AD0 DAC Channel/Register Address
DAC Data Register
When writing to the AD5757 DAC data registers, D15 to D0 are
used for the DAC data bits. Tabl e 9 shows the register format
and Tabl e 8 describes the function of Bit D23 to Bit D16.
Table 9. Programming the DAC Data Registers
MSB LSB
D23 D22 D21 D20 D19 D18 D17 D16 D15 to D0
R/W
DUT_AD1 DUT_AD0 DREG2 DREG1 DREG0 DAC_AD1 DAC_AD0 DAC data
Rev. B | Page 27 of 44
AD5757 Data Sheet
Gain Register
The 16-bit gain register, as shown in Ta ble 10 , allows the user to
adjust the gain of each channel in steps of 1 LSB. This is done by
setting the DREG[2:0] bits to 010. It is possible to write the
same gain code to all four DAC channels at the same time by
setting the DREG[2:0] bits to 011. The gain register coding is
straight binary as shown in Tab l e 1 1 . The default code in the
gain register is 0xFFFF. In theory, the gain can be tuned across
the full range of the output. In practice, the maximum recommended gain trim is about 50% of programmed range to maintain
accuracy. See the Digital Offset and Gain Control section for
more information.
DUT_AD1 DUT_AD0 DREG2 DREG1 DREG0 DAC_AD1 DAC_AD0 D15 to D0
Offset Register
The 16-bit offset register, as shown in Ta bl e 12 , allows the user to
adjust the offset of each channel by −32,768 LSBs to +32,767 LSBs
in steps of 1 LSB. This is done by setting the DREG[2:0] bits to
100. It is possible to write the same offset code to all four DAC
channels at the same time by setting the DREG[2:0] bits to 101.
The offset register coding is straight binary as shown in Tab l e 1 3 .
The default code in the offset register is 0x8000, which results in
zero offset programmed to the output. See the Digital Offset
and Gain Control section for more information.
Clear Code Register
The 16-bit clear code register allows the user to set the clear
value of each channel as shown in Tabl e 1 4 . It is possible, via
software, to enable or disable on a per channel basis which
channels are cleared when the CLEAR pin is activated. The
default clear code is 0x0000. See the Asynchronous Clear
section for more information.
DUT_AD1 DUT_AD0 DREG2 DREG1 DREG0 DAC_AD1 DAC_AD0 D15 to D0
Rev. B | Page 28 of 44
Data Sheet AD5757
CONTROL REGISTERS
When writing to a control register, the format shown in Tab le 1 5
must be used. See Ta b l e 8 for information on the configuration
of Bit D23 to Bit D16. The control registers are addressed by setting
the DREG[2:0] bits to 111 and then setting the CREG[2:0] bits
to the appropriate decode address for that register, according to
Tabl e 1 6 . These CREG bits select among the various control
registers.
0 0 0 Slew rate control register (one per channel)
0 0 1 Main control register
0 1 0 DAC control register (one per channel)
0 1 1 DC-to-dc control register
1 0 0 Software register
Main Control Register
The main control register options are shown in Tab l e 1 7 and
Tabl e 1 8 . See the Device Features section for more information
on the features controlled by the main Control Register.
WD1, WD0 Timeout select bits. Used to select the timeout period for the watchdog timer.
0 0 5
0 1 10
1 0 100
1 1 200
OUTEN_ALL Enables the output on all four DACs simultaneously.
DCDC_ALL When set, powers up the dc-to-dc converter on all four channels simultaneously.
WD1 WD0 Timeout Period (ms)
Do not use the OUTEN_ALL bit when using the OUTEN bit in the DAC control register.
To power down the dc-to-dc converters, all channel outputs must first be disabled.
Do not use the DCDC_ALL bit when using the DC_DC bit in the DAC control register.
Rev. B | Page 29 of 44
AD5757 Data Sheet
DAC Control Register
The DAC control register is used to configure each DAC channel. The DAC control register options are shown in Tabl e 19 and Ta bl e 20 .
CLR_EN Per channel clear enable bit. Selects if this channel clears when the CLEAR pin is activated.
OUTEN Enables/disables the selected output channel.
RSET Selects an internal or external current sense resistor for the selected DAC channel.
DC_DC Powers the dc-to-dc converter on the selected channel.
R2, R1, R0 Selects the output range to be enabled.
1 0 0 4 mA to 20 mA current range
1 0 1 0 mA to 20 mA current range
1 1 0 0 mA to 24 mA current range
Powers up the dc-to-dc converter, DAC, and internal amplifiers for the selected channel. Does not enable the output. Can
only be done on a per channel basis. It is recommended to set this bit and allow a >200 μs delay before enabling the
output because this results in a reduced output enable glitch. Plots of this glitch can be found in Figure 25.
CLR_EN = 1, channel clears when the part is cleared.
CLR_EN = 0, channel does not clear when the part is cleared (default).
OUTEN = 1, enables the channel.
OUTEN = 0, disables the channel (default).
RSET = 0, selects the external resistor (default).
RSET = 1, selects the internal resistor.
DC_DC = 1, power up the dc-to-dc converter.
DC_DC = 0, power down the dc-to-dc converter (default).
This allows per channel dc-to-dc converter power-up/power-down. To power down the dc-to-dc converter, the OUTEN and
INT_ENABLE bits must also be set to 0.
All dc-to-dc converters can also be powered up simultaneously using the DCDC_ALL bit in the main control register.
R2 R1 R0 Output Range Selected
Rev. B | Page 30 of 44
Data Sheet AD5757
Software Register
The software register has three functions. It allows the user to
perform a software reset to the part. It can be used to set the
user toggle bit, D11, in the status register. It is also used as part
of the watchdog feature when it is enabled. This feature is useful
to ensure that communication has not been lost between the
MCU and the AD5757 and that the datapath lines are working
SYNC
properly (that is, SDIN, SCLK, and
).
Table 21. Programming the Software Register
MSB LSB
D15 D14 D13 D12 D11 to D0
1 0 0 User program Reset code/SPI code
Table 22. Software Register Functions
Bit Description
User Program
This bit is mapped to Bit D11 of the status register. When this bit is set to 1, Bit D11 of the status register is set
to 1. Likewise, when D12 is set to 0, Bit D11 of the status register is also set to zero. This feature can be used to
ensure that the SPI pins are working correctly by writing a known bit value to this register and reading back
the corresponding bit from the status register.
Reset Code/SPI Code
Option Description
Reset code Writing 0x555 to D[11:0] performs a reset of the AD5757.
SPI code
If the watchdog timer feature is enabled, 0x195 must be written to the software
register (D11 to D0) within the programmed timeout period.
When the watchdog feature is enabled, the user must write
0x195 to the software register within the timeout period. If this
command is not received within the timeout period, the ALERT
pin signals a fault condition. This is only required when the
watchdog timer function is enabled.
DC-to-DC Control Register
The dc-to-dc control register allows the user control over
the dc-to-dc switching frequency and phase, as well as the
maximum allowable dc-to-dc output voltage. The dc-to-dc
control register options are shown in Ta b le 2 3 and Tab l e 2 4 .
Table 23. Programming the DC-to-DC Control Register
MSB LSB
D15 D14 D13 D12 to D7 D6 D5 to D4 D3 to D2 D1 to D0
Selects between an internal and external compensation resistor for the dc-to-dc converter. See the DC-to-DC Converter
Compensation Capacitors and AI
Supply Requirements—Slewing sections in the Device Features section for more
CC
information.
0 = selects the internal 150 kΩ compensation resistor (default).
1 = bypasses the internal compensation resistor for the dc-to-dc converter. In this mode, an external dc-to-dc
compensation resistor must be used; this is placed at the COMP
pin in series with the 10 nF dc-to-dc compensation
DCDC_x
capacitor to ground. Typically, a ~50 kΩ resistor is recommended.
DC-DC Phase User programmable dc-to-dc converter phase (between channels).
00 = all dc-to-dc converters clock on the same edge (default).
01 = Channel A and Channel B clock on the same edge, Channel C and Channel D clock on opposite edges.
10 = Channel A and Channel C clock on the same edge, Channel B and Channel D clock on opposite edges.
11 = Channel A, Channel B, Channel C, and Channel D clock 90° out of phase from each other.
DC-DC Freq DC-to-dc switching frequency; these are divided down from the internal 13 MHz oscillator (see Figure 46 and Figure 47).
00 = 23 V + 1 V/−1.5 V (default).
01 = 24.5 V ± 1 V.
10 = 27 V ± 1 V.
11 = 29.5 V ± 1V.
Rev. B | Page 31 of 44
AD5757 Data Sheet
Slew Rate Control Register
This register is used to program the slew rate control for the
selected DAC channel. The slew rate control is enabled/
disabled and programmed on a per channel basis. See Tab l e 2 5
and the Digital Slew Rate Control section for more information.
READBACK OPERATION
Readback mode is invoked by setting the R/W bit = 1 in the
serial input register write. See for the bits associated
with a readback operation. The DUT_AD1 and DUT_AD0 bits,
in association with Bits RD[4:0], select the register to be read.
The remaining data bits in the write sequence are don’t cares.
During the next SPI transfer (see ), the data appearing
on the SDO output contains the data from the previously
addressed register. This second SPI transfer should either be a
request to read yet another register on a third data transfer or a
Table 25. Programming the Slew Rate Control Register
D15 D14 D13 D12 D11 to D7 D6 to D3 D2 to D0
0 0 0 SREN X1 SR_CLOCK SR_STEP
1
X = don’t care.
Table 26. Input Shift Register Contents for a Read Operation
D23 D22 D21 D20 D19 D18 D17 D16 D15 to D0
R/W
1
X = don’t care.
DUT_AD1 DUT_AD0 RD4 RD3 RD2 RD1 RD0 X
Table 2 6
Figure 4
no operation command. The no operation command for
DUT_AD[1:0] = 00 is 0x1CE000; for other DUT addresses,
Bit D22 and Bit D21 are set accordingly.
Readback Example
To read back the gain register of Device 1, Channel A on the
AD5757, implement the following sequence:
1.
Write 0xA80000 to the AD5757 input register. This
configures the AD5757 Device Address 1 for read mode
with the gain register of Channel A selected. All the data
bits, D15 to D0, are don’t cares.
Follow with another read command or a no operation
2.
command (0x3CE000). During this command, the data
from the Channel A gain register is clocked out on the
SDO line.
1
Table 27. Read Address Decoding
RD4 RD3 RD2 RD1 RD0 Function
0 0 0 0 0 Read DAC A data register
0 0 0 0 1 Read DAC B data register
0 0 0 1 0 Read DAC C data register
0 0 0 1 1 Read DAC D data register
0 0 1 0 0 Read DAC A control register
0 0 1 0 1 Read DAC B control register
0 0 1 1 0 Read DAC C control register
0 0 1 1 1 Read DAC D control register
0 1 0 0 0 Read DAC A gain register
0 1 0 0 1 Read DAC B gain register
0 1 0 1 0 Read DAC C gain register
0 1 0 1 1 Read DAC D gain register
0 1 1 0 0 Read DACA offset register
0 1 1 0 1 Read DAC B offset register
0 1 1 1 0 Read DAC C offset register
0 1 1 1 1 Read DAC D offset register
1 0 0 0 0 Clear DAC A code register
1 0 0 0 1 Clear DAC B code register
1 0 0 1 0 Clear DAC C code register
1 0 0 1 1 Clear DAC D code register
1 0 1 0 0 DAC A slew rate control register
1 0 1 0 1 DAC B slew rate control register
1 0 1 1 0 DAC C slew rate control register
1 0 1 1 1 DAC D slew rate control register
1 1 0 0 0 Read status register
1 1 0 0 1 Read main control register
1 1 0 1 0 Read dc-to-dc control register
Rev. B | Page 32 of 44
Data Sheet AD5757
Status Register
The status register is a read only register. This register contains
any fault information as a well as a ramp active bit and a user
toggle bit. When the STATREAD bit in the main control
This bit is set on Channel D if the dc-to-dc converter cannot maintain compliance (it may be reaching its V
voltage). In this case, the I
fault bit is also set. See the DC-to-DC Converter V
OUT_D
information on this bit’s operation under this condition.
DC-DCC
This bit is set on Channel C if the dc-to-dc converter cannot maintain compliance (it may be reaching its V
voltage). In this case, the I
fault bit is also set. See the DC-to-DC Converter V
OUT_C
information on this bit’s operation under this condition.
DC-DCB
This bit is set on Channel B if the dc-to-dc converter cannot maintain compliance (it may be reaching its V
voltage). In this case, the I
fault bit is also set. See the DC-to-DC Converter V
OUT_B
information on this bit’s operation under this condition.
DC-DCA
This bit is set on Channel A if the dc-to-dc converter cannot maintain compliance (it may be reaching its V
voltage). In this case, the I
fault bit is also set. See the DC-to-DC Converter V
OUT_A
information on this bit’s operation under this condition.
User toggle
User toggle bit. This bit is set or cleared via the software register. This can be used to verify data communications if
needed.
PEC Error Denotes a PEC error on the last data-word received over the SPI interface.
Ramp Active This bit is set while any one of the output channels is slewing (slew rate control is enabled on at least one channel).
Over TEMP This bit is set if the AD5757 core temperature exceeds approximately 150°C.
I
Fault This bit is set if a fault is detected on the I
OUT_D
I
Fault This bit is set if a fault is detected on the I
OUT_C
I
Fault This bit is set if a fault is detected on the I
OUT_B
I
Fault This bit is set if a fault is detected on the I
OUT_A
OUT_D
OUT_C
OUT_B
OUT_A
register is set, the status register contents can be read back on
the SDO pin during every write sequence. Alternatively, if the
STATREAD bit is not set, the status register can be read using
the normal readback operation.
1
X
X
1
X
1
X
1
MAX
Functionality section for more
MAX
Functionality section for more
MAX
MAX
I
I
OUT_D
fault
OUT_C
fault
Functionality section for more
Functionality section for more
pin.
pin.
pin.
pin.
I
OUT_B
fault
MAX
MAX
MAX
MAX
I
OUT_A
fault
Rev. B | Page 33 of 44
AD5757 Data Sheet
+
DEVICE FEATURES
OUTPUT FAULT
The AD5757 is equipped with a
drain output allowing several AD5757 devices to be connected
together to one pull-up resistor for global fault detection. The
FAU LT
pin is forced active by any one of the following fault
scenarios:
• The voltage at I
OUT_x
range, due to an open-loop circuit or insufficient power
supply voltage. The internal circuitry that develops the
fault output avoids using a comparator with windowed
limits because this requires an actual output error before
FAU LT
the
output becomes active. Instead, the signal is
generated when the internal amplifier in the output stage
has less than approximately 1 V of remaining drive
capability. Thus, the
the compliance limit is reached.
• An interface error is detected due to a PEC failure. See the
Packet Error Checking section.
• If the core temperature of the AD5757 exceeds
approximately 150°C.
The I
fault, PEC error, and over TEMP bits of the status
OUT_x
register are used in conjunction with the
inform the user which one of the fault conditions caused the
FAU LT
output to be activated.
FAU LT
pin, an active low open-
attempts to rise above the compliance
FAU LT
output activates slightly before
FAU LT
output to
DIGITAL OFFSET AND GAIN CONTROL
Each DAC channel has a gain (M) and offset (C) register, which
allow trimming out of the gain and offset errors of the entire
signal chain. Data from the DAC data register is operated on by
a digital multiplier and adder controlled by the contents of the
M and C registers. The calibrated DAC data is then stored in the
DAC input register.
INPUT
REGISTER
M
REGISTER
C
REGISTER
Figure 53. Digital Offset and Gain control
Although Figure 53 indicates a multiplier and adder for each
channel, there is only one multiplier and one adder in the device,
and they are shared among all four channels. This has
implications for the update speed when several channels are
updated at once (see Tabl e 3).
Each time data is written to the M or C register, the output is
not automatically updated. Instead, the next write to the DAC
channel uses these M and C values to perform a new calibration
and automatically updates the channel.
The output data from the calibration is routed to the DAC input
register. This is then loaded to the DAC as described in the
DAC
REGISTE R
DAC
09225-075
Rev. B | Page 34 of 44
Theory of Operation section. Both the gain register and the
offset register have 16 bits of resolution. The correct method to
calibrate the gain/offset is to first calibrate out the gain and then
calibrate the offset.
The value (in decimal) that is written to the DAC input register
can be calculated by
DCode
rDACRegiste
M
×=C
16
2
15
2
−+
(1)
)1(
where:
D is the code loaded to the DAC channel’s input register.
M is the code in the gain register (default code = 2
C is the code in the offset register (default code = 2
16
– 1).
15
).
STATUS READBACK DURING A WRITE
The AD5757 has the ability to read back the status register
contents during every write sequence. This feature is enabled
via the STATREAD bit in the main control register. This allows
the user to continuously monitor the status register and act
quickly in the case of a fault.
When status readback during a write is enabled, the contents of
the 16-bit status register (see Tab l e 2 9 ) are output on the SDO
pin, as shown in Figure 5.
The AD5757 powers up with this feature disabled. When this is
enabled, the normal readback feature is not available, except for
the status register. To read back any other register, clear the
STATREAD bit first before following the readback sequence.
STATREAD can be set high again after the register read.
ASYNCHRONOUS CLEAR
CLEAR is an active high, edge-sensitive input that allows the
output to be cleared to a preprogrammed 16-bit code. This code
is user programmable via a per channel 16-bit clear code register.
For a channel to clear, that channel must be enabled to be
cleared via the CLR_EN bit in the channel’s DAC control
register. If the channel is not enabled to be cleared, the output
remains in its current state independent of the CLEAR pin level.
When the CLEAR signal is returned low, the relevant outputs
remain cleared until a new value is programmed.
PACKET ERROR CHECKING
To verify that data has been received correctly in noisy environments, the AD5757 offers the option of packet error checking
based on an 8-bit cyclic redundancy check (CRC-8). The device
controlling the AD5757 should generate an 8-bit frame check
sequence using the polynomial
C(x) = x
This is added to the end of the data-word, and 32 bits are sent
to the AD5757 before taking
32-bit frame, it performs the error check when
If the check is valid, the data is written to the selected register.
+ x2 + x1 + 1
8
SYNC
high. If the AD5757 sees a
SYNC
goes high.
Data Sheet AD5757
If the error check fails, the
error bit in the status register is set. After reading the status
FAU LT
register,
returns high (assuming there are no other
faults), and the PEC error bit is cleared automatically.
SYNC
FAU LT
pin goes low and the PEC
UPDATE ON SYNC H IGH
INTERNAL REFERENCE
The AD5757 contains an integrated 5 V voltage reference with
initial accuracy of ±5 mV maximum and a temperature drift
coefficient of ±10 ppm maximum. The reference voltage
is buffered and externally available for use elsewhere within
the system.
SCLK
SDIN
SYNC
SCLK
SDIN
FAULT
MSB
D23
24-BIT DATA
24-BIT DATA TRANSFER—NO ERROR CHECKING
MSB
D31
24-BIT DATA8-BIT CRC
32-BIT DATA TRANSFER WI TH ERROR CHE CKING
Figure 54. PEC Timing
LSB
D0
UPDATE ON SYNC HIGH
ONLY IF ERROR CHECK PASSED
LSB
D8
D7D0
FAULT PIN GOES LOW
IF ERROR CHECK FAILS
The PEC can be used for both transmit and receive of data
packets. If status readback during a write is enabled, the PEC
values returned during the status readback during a write
operation should be ignored. If status readback during a write is
disabled, the user can still use the normal readback operation to
monitor status register activity with PEC.
WATCHDOG TIMER
When enabled, an on-chip watchdog timer generates an alert
signal if 0x195 has not been written to the software register
within the programmed timeout period. This feature is useful
to ensure that communication has not been lost between the
MCU and the AD5757 and that these datapath lines are working
SYNC
properly (that is, SDIN, SCLK, and
). If 0x195 is not
received by the software register within the timeout period,
the ALERT pin signals a fault condition. The ALERT signal is
active high and can be connected directly to the CLEAR pin to
enable a CLEAR in the event that communication from the
MCU is lost.
The watchdog timer is enabled, and the timeout period (5 ms,
10 ms, 100 ms, or 200 ms) is set in the main control register (see
Tabl e 1 7 and Tabl e 18).
OUTPUT ALERT
The AD5757 is equipped with an ALERT pin. This is an active
high CMOS output. The AD5757 also has an internal watchdog
timer. When enabled, it monitors SPI communications. If 0x195
is not received by the software register within the timeout period,
the ALERT pin goes active.
EXTERNAL CURRENT SETTING RESISTOR
Referring to Figure 49, R
of the voltage to current conversion circuitry. The stability of
the output current value over temperature is dependent on the
stability of the value of R
stability of the output current over temperature, an external
15 kΩ low drift resistor can be connected to the R
the AD5757 to be used instead of the internal resistor, R1.
The external resistor is selected via the DAC control register
(see Tabl e 1 9 ).
Tabl e 1 outlines the performance specifications of the AD5757
with both the internal R
resistor. Using an external R
performance over the internal R
resistor specification assumes an ideal resistor; the actual
R
SET
09225-008
performance depends on the absolute value and temperature
coefficient of the resistor used. This directly affects the gain error
of the output, and thus the total unadjusted error. To arrive at
the gain/TUE error of the output with a particular external R
resistor, add the percentage absolute error of the R
directly to the gain/TUE error of the AD5757 with the external
resistor, shown in Tabl e 1 (expressed in % FSR).
R
SET
is an internal sense resistor as part
SET
. As a method of improving the
SET
SET_x
resistor and an external, 15 kΩ R
SET
resistor allows for improved
SET
resistor option. The external
SET
SET
pin of
SET
resistor
SET
HART
The AD5757 has four CHART pins, one corresponding to each
output channels. A HART signal can be coupled into these pins.
The HART signal appears on the corresponding current output,
if the output is enabled. Tab le 3 0 shows the recommended input
voltages for the HART signal at the CHART pin. If these
voltages are used, the current output should meet the HART
amplitude specifications. Figure 55 shows the recommended
circuit for attenuating and coupling in the HART signal.
Table 30. CHART Input Voltage to HART Output Current
CHART Input
R
SET
Internal R
External R
Voltage
150 mV p-p 1 mA p-p
SET
170 mV p-p 1 mA p-p
SET
C1
HART MODEM
OUTPUT
Figure 55. Coupling HART Signal
A minimum capacitance of C1 + C2 is required to ensure that
the 1.2 kHz and 2.2 kHz HART frequencies are not significantly
attenuated at the output. The recommended values are C1 =
22 nF, C2 = 47 nF.
Current Output
(HART)
CHARTx
C2
09225-076
Rev. B | Page 35 of 44
AD5757 Data Sheet
=
Digitally controlling the slew rate of the output is necessary to
meet the analog rate of change requirements for HART.
DIGITAL SLEW RATE CONTROL
The slew rate control feature of the AD5757 allows the user to
control the rate at which the output value changes. With the
slew rate control feature disabled, the output value changes at a
rate limited by the output drive circuitry and the attached load.
To reduce the slew rate, this can be achieved by enabling the
slew rate control feature. With the feature enabled via the SREN
bit of the slew rate control register (see Ta b le 2 5), the output,
instead of slewing directly between two values, steps digitally at
a rate defined by two parameters accessible via the slew rate
control register, as shown in Tab l e 2 5 . The parameters are
SR_CLOCK and SR_STEP. SR_CLOCK defines the rate at
which the digital slew is updated, for example, if the selected
update rate is 8 kHz, the output updates every 125 µs. In conjunction with this, SR_STEP defines by how much the output value
changes at each update. Together, both parameters define the
rate of change of the output value. Ta bl e 31 and Tabl e 32 outline
the range of values for both the SR_CLOCK and SR_STEP
parameters.
Table 31. Slew Rate Update Clock Options
SR_CLOCK Update Clock Frequency (Hz)1
0000 64 k
0001 32 k
0010 16 k
0011 8 k
0100 4 k
0101 2 k
0110 1 k
0111 500
1000 250
1001 125
1010 64
1011 32
1100 16
1101 8
1110 4
1111 0.5
1
These clock frequencies are divided down from the 13 MHz internal
oscillator. See Table 1, Figure 46, and Figure 47.
The following equation describes the slew rate as a function of
the step size, the update clock frequency, and the LSB size:
TimeSlew
ChangeOutput
××
SizeLSBFrequencyClockUpdateSizeStep
where:
Slew Time is expressed in seconds.
Output Change is expressed in amps for I
OUT_x
.
When the slew rate control feature is enabled, all output
changes occur at the programmed slew rate (see the DC-to-DC
Converter Settling Time section for additional information).
For example, if the CLEAR pin is asserted, the output slews to
the clear value at the programmed slew rate (assuming that the
clear channel is enabled to be cleared). If a number of channels
are enabled for slew, care must be taken when asserting the
CLEAR pin. If one of the channels is slewing when CLEAR is
asserted, other channels may change directly to their clear
values not under slew rate control. The update clock frequency
for any given value is the same for all output ranges. The step
size, however, varies across output ranges for a given value of
step size because the LSB size is different for each output range.
POWER DISSIPATION CONTROL
The AD5757 contains integrated dynamic power control using
a dc-to-dc boost converter circuit, allowing reductions in power
consumption from standard designs.
In standard current input module designs, the load resistor
values can range from typically 50 Ω to 750 Ω. Output module
systems must source enough voltage to meet the compliance
voltage requirement across the full range of load resistor values.
For example, in a 4 mA to 20 mA loop when driving 20 mA, a
compliance voltage of >15 V is required. When driving 20 mA
into a 50 Ω load, only 1 V compliance is required.
The AD5757 circuitry senses the output voltage and regulates
this voltage to meet compliance requirements plus a small
headroom voltage. The AD5757 is capable of driving up to
24 mA through a 1 kΩ load.
DC-TO-DC CONVERTERS
The AD5757 contains four independent dc-to-dc converters.
These are used to provide dynamic control of the V
voltage for each channel (see Figure 49). Figure 56 shows the
discreet components needed for the dc-to-dc circuitry, and the
following sections describe component selection and operation
of this circuitry.
AV
CC
≥10µF
L
DCDC
10µH
C
IN
D
SWx
Figure 56. DC-to-DC Circuit
DCDC
C
DCDC
4.7µF
R
FILTER
10Ω
C
FILTER
0.1µF
V
BOOST
BOOST_X
supply
09225-077
Rev. B | Page 36 of 44
Data Sheet AD5757
Table 33. Recommended DC-to-DC Components
Symbol Component Value Manufacturer
L
XAL4040-103 10 μH Coilcraft®
DCDC
C
GRM32ER71H475KA88L 4.7 μF Murata
DCDC
D
PMEG3010BEA 0.38 VF NXP
DCDC
It is recommended to place a 10 Ω, 100 nF low-pass RC filter
after C
reduces the amount of ripple on the V
. This consumes a small amount of power but
DCDC
supply.
BOOST_x
DC-to-DC Converter Operation
The on-board dc-to-dc converters use a constant frequency,
peak current mode control scheme to step up an AV
input of
CC
4.5 V to 5.5 V to drive the AD5757 output channel. These are
designed to operate in discontinuous conduction mode (DCM)
with a duty cycle of <90% typical. Discontinuous conduction
mode refers to a mode of operation where the inductor current
goes to zero for an appreciable percentage of the switching
cycle. The dc-to-dc converters are nonsynchronous; that is,
they require an external Schottky diode.
DC-to-DC Converter Output Voltage
When a channel current output is enabled, the converter regulates
the V
supply to 7.4 V (±5%) or (I
BOOST_x
OUT
× R
LOAD
+ Headroom),
whichever is greater (see Figure 31 for a plot of headroom
supplied vs. output current). When the output is disabled, the
converter regulates the V
supply to 7.4 V (±5%).
BOOST_x
DC-to-DC Converter Settling Time
The settling time for a step greater than ~1 V (I
OUT
× R
LOAD
) is
dominated by the settling time of the dc-to-dc converter. The
exception to this is when the required voltage at the I
OUT_x
pin plus
the compliance voltage is below 7.4 V (±5%). A typical plot of the
output settling time can be found in Figure 26. This plot is for a
1 kΩ load. The settling time for smaller loads is faster. The
settling time for current steps less than 24 mA is also faster.
DC-to-DC Converter V
The maximum V
BOOST_x
Functionality
MAX
voltage is set in the dc-to-dc control
register (23 V, 24.5 V, 27 V, or 29.5 V; see Tab l e 2 4 ). On reaching
this maximum voltage, the dc-to-dc converter is disabled, and
the V
V
BOOST_x
is reenabled, and the voltage ramps up again to V
voltage is allowed to decay by ~0.4 V. After the
BOOST_x
voltage has decayed by ~0.4 V, the dc-to-dc converter
, if still
MAX
required. This operation is shown in Figure 57.
29.6
V
MAX
DC_DC BIT
29.5
29.4
29.3
29.2
29.1
VOLTAGE (mV)
BOOST
V
DC-DCx BIT = 1
29.0
28.9
28.8
28.7
DC-DCx BIT = 0
28.6
00.51.01.52.02.53.03.54.0
Figure 57. Operation on Reaching V
0mA TO 24mA RANGE, 24mA OUTPUT
OUTPUT UNLOADED
DC-DCMaxV = 29.5V
f
= 410kHz
SW
= 25°C
T
A
TIME (ms)
MAX
As shown in Figure 57, the DC-DCx bit in the status register
asserts when the AD5757 is ramping to the V
deasserts when the voltage is decaying to V
MAX
− ~0.4 V.
MAX
value but
DC-to-DC Converter On-Board Switch
The AD5757 contains a 0.425 Ω internal switch. The switch
current is monitored on a pulse by pulse basis and is limited to
0.8 A peak current.
DC-to-DC Converter Switching Frequency and Phase
The AD5757 dc-to-dc converter switching frequency can be
selected from the dc-to-dc control register. The phasing of the
channels can also be adjusted so that the dc-to-dc converter can
clock on different edges (see Tabl e 2 4 ). For typical applications,
a 410 kHz frequency is recommended. At light loads (low output
current and small load resistor), the dc-to-dc converter enters a
pulse-skipping mode to minimize switching power dissipation.
DC-to-DC Converter Inductor Selection
For typical 4 mA to 20 mA applications, a 10 µH inductor (such
as the XAL4040-103 from Coilcraft), combined with a switching frequency of 410 kHz, allows up to 24 mA to be driven into a
load resistance of up to 1 kΩ with an AV
supply of 4.5 V to
CC
5.5 V. It is important to ensure that the inductor is able to handle
the peak current without saturating, especially at the maximum
ambient temperature. If the inductor enters into saturation mode,
it results in a decrease in efficiency. The inductance value also
drops during saturation and may result in the dc-to-dc converter
circuit not being able to supply the required output power.
DC-to-DC Converter External Schottky Selection
The AD5757 requires an external Schottky for correct
operation. Ensure that the Schottky is rated to handle the
maximum reverse breakdown expected in operation and that
the rectifier maximum junction temperature is not exceeded.
The diode average current is approximately equal to the I
LOAD
current. Diodes with larger forward voltage drops result in a
decrease in efficiency.
09225-183
Rev. B | Page 37 of 44
AD5757 Data Sheet
DC-to-DC Converter Compensation Capacitors
As the dc-to-dc converter operates in DCM, the uncompensated
transfer function is essentially a single-pole transfer function.
The pole frequency of the transfer function is determined by
the dc-to-dc converter’s output capacitance, input and output
voltage, and output load. The AD5757 uses an external capacitor in conjunction with an internal 150 kΩ resistor to compensate
the regulator loop. Alternatively, an external compensation
resistor can be used in series with the compensation capacitor
by setting the DC-DC Comp bit in the dc-to-dc control register.
In this case, a ~50 kΩ resistor is recommended. A description
of the advantages of this can be found in the AI
Supply
CC
Requirements—Slewing section. For typical applications, a
10 nF dc-to-dc compensation capacitor is recommended.
DC-to-DC Converter Input and Output Capacitor
Selection
The output capacitor affects ripple voltage of the dc-to-dc converter and indirectly limits the maximum slew rate at which the
channel output current can rise. The ripple voltage is caused by
a combination of the capacitance and equivalent series resistance
(ESR) of the capacitor. For the AD5757, a ceramic capacitor
of 4.7 µF is recommended for typical applications. Larger
capacitors or paralleled capacitors improve the ripple at the
expense of reduced slew rate. Larger capacitors also impact
the AV
AI
supplies current requirements while slewing (see the
CC
Supply Requirements—Slewing section). This capacitance
CC
at the output of the dc-to-dc converter should be >3 µF under
all operating conditions.
The input capacitor provides much of the dynamic current
required for the dc-to-dc converter and should be a low ESR
component. For the AD5757, a low ESR tantalum or ceramic
capacitor of 10 µF is recommended for typical applications.
Ceramic capacitors must be chosen carefully because they can
exhibit a large sensitivity to dc bias voltages and temperature.
X5R or X7R dielectrics are preferred because these capacitors
remain stable over wider operating voltage and temperature
ranges. Care must be taken if selecting a tantalum capacitor to
ensure a low ESR value.
AICC SUPPLY REQUIREMENTS—STATIC
The dc-to-dc converter is designed to supply a V
V
= I
× R
BOOST
OUT
+ Headroom (2)
LOAD
See Figure 31 for a plot of headroom supplied vs. output
voltage. This means that, for a fixed load and output voltage,
the dc-to-dc converter output current can be calculated by
the following formula:
AI
=
CC
OutPower
×
=
AVEfficiency
CC
VI
×
BOOSTOUT
AV
×
η
V
BOOST
where:
I
is the output current from I
OUT
η
is the efficiency at V
V
BOOST
BOOST_x
in amps.
OUT_x
as a fraction (see Figure 33
and Figure 34).
voltage of
BOOST_x
(3)
CC
Rev. B | Page 38 of 44
AICC SUPPLY REQUIREMENTS—SLEWING
The AICC current requirement while slewing is greater than in
static operation because the output power increases to charge
the output capacitance of the dc-to-dc converter. This transient
current can be quite large (see Figure 58), although the methods
described in the Reducing AI
can reduce the requirements on the AV
current can be provided, the AVCC voltage drops. Due to
AI
CC
this AV
drop, the AICC current required to slew increases
CC
further. This means that the voltage at AV
Equation 3) and the V
BOOST_x
age, may never reach its intended value. Because this AV
voltage is common to all channels, this may also affect other
channels.
0.8
0.7
0.6
0.5
0.4
CURRENT (A)
0.3
CC
AI
0.2
AI
CC
0.1
0
00.51.01.52.02.5
Figure 58. AI
I
OUT
V
BOOST
Current vs. Time for 24 mA Step Through 1 kΩ Load
CC
with Internal Compensation Resistor
Reducing AICC Current Requirements
There are two main methods that can be used to reduce the
AI
current requirements. One method is to add an external
CC
compensation resistor, and the other is to use slew rate control.
Both of these methods can be used in conjunction.
A compensation resistor can be placed at the COMP
in series with the 10 nF compensation capacitor. A 51 kΩ external
compensation resistor is recommended. This compensation
increases the slew time of the current output but eases the AI
transient current requirements. Figure 59 shows a plot of AI
current for a 24 mA step through a 1 kΩ load when using a
51 kΩ compensation resistor. This method eases the current
requirements through smaller loads even further, as shown in
Figure 60.
Current Requirements section
CC
supply. If not enough
CC
drops further (see
CC
voltage, and thus the output volt-
CC
30
25
0mA TO 24mA RANGE
INDUCTOR = 10µ H (XAL4040-103)
TIME (ms)
1kΩ LOAD
f
= 410kHz
SW
T
A
= 25°C
20
15
10
5
0
DCDC_x
VOLTAGE (V)
CURRENT (mA) / V
I
pin
CC
BOOST_x
OUT_x
CC
09225-184
Data Sheet AD5757
A
V
0.8
0mA TO 24mA RANGE
1kΩ LOAD
f
= 410kHz
0.7
SW
INDUCTOR = 10µ H (XAL4040-103)
= 25°C
T
A
0.6
0.5
0.4
CURRENT (A)
0.3
CC
AI
0.2
AI
CC
0.1
0
00.51.01.52.02.5
Figure 59. AI
Current vs. Time for 24 mA Step Through 1 kΩ Load
CC
I
OUT
V
BOOST
TIME (ms)
32
28
24
VOLTAGE (V)
20
BOOST_x
16
12
8
CURRENT (mA) / V
4
OUT_x
I
0
with External 51 kΩ Compensation Resistor
0.8
AI
CC
0.7
0.6
0.5
0.4
CURRENT (A)
0.3
CC
AI
0.2
0.1
0
00.51.01.52.02.5
Figure 60. AI
I
OUT
V
BOOST
Current vs. Time for 24 mA Step Through 500 Ω Load
CC
INDUCTOR = 10µH (XAL4040- 103)
TIME (ms)
0mA TO 24mA RANGE
500Ω LOAD
f
SW
= 410kHz
= 25°C
T
A
32
28
24
VO LTAG E (V )
20
BOOST_x
16
12
8
CURRENT (mA )/ V
4
OUT_x
I
0
with External 51 kΩ Compensation Resistor
Using slew rate control can greatly reduce the AV
supplies cur-
CC
rent requirements, as shown in Figure 61. When using slew rate
control, attention should be paid to the fact that the output cannot
slew faster than the dc-to-dc converter. The dc-to-dc converter
slews slowest at higher currents through large (for example, 1
kΩ) loads. This slew rate is also dependent on the configuration
of the dc-to-dc converter. Two examples of the dc-to-dc converter’s
output slew are shown in Figure 59 and Figure 60 (V
BOOST
corre-
sponds to the dc-to-dc converter’s output voltage).
5.0V
CC
(LEFT FLOATING)
SW
A
09225-185
09225-186
V
BOOST_A
0.8
0mA TO 24mA RANGE
1kΩ LOAD
0.7
f
= 410kHz
SW
INDUCTOR = 10µ H (XAL4040-103)
T
= 25°C
0.6
0.5
0.4
CURRENT (A)
0.3
CC
AI
0.2
0.1
A
AI
CC
I
OUT
V
BOOST
0
01 2345 6
TIME (ms)
32
28
24
VOLTAGE (V)
20
BOOST_x
16
12
8
CURRENT (mA) / V
4
OUT_x
I
0
Figure 61. AICC Current vs. Time for 24 mA Step Through 1 kΩ Load
with Slew Rate Control
EXTERNAL PMOS MODE
The AD5757 can also be used with an external PMOS transistor
per channel, as shown in Figure 62. This mode can be used to
limit the on-chip power dissipation of the AD5757, though this
will not reduce the power dissipation of the total system. The
IGATE functionality is not typically required when using the
dynamic power control feature so Figure 62 shows the configuration of the device for a fixed V
In this configuration the SW
GNDSW
pin is grounded. The V
x
minimum supply of 7.5 V and a maximum supply of 33 V. This
supply can be sized according to the maximum load required to
be driven.
The IGATE functionality works by holding the gate of the
external PMOS transistor at (V
the majority of the channels power dissipation will take place in
this external PMOS transistor.
The external PMOS transistor should be chosen tolerate a V
voltage of at least −V
, as well as to handle the power
BOOST_x
dissipation required. This external PMOS transistor typically
has minimal effect on the current output performance.
supply.
BOOST_x
pin are left floating and the
x
pin is connected to a
BOOST_x
− 5 V). This means that
BOOST_x
DS
09225-187
R2R3
DAC A
DAC CHANNEL A
SWGND
(V
R1
A
BOOST_ A
–5V)
I
OUT_A
IGATEA
R
SET_A
CHARTA
CURRENT OUTPUT
R
LOAD
09225-190
Figure 62. Configuration off a Particular Channel Using IGATE
Rev. B | Page 39 of 44
AD5757 Data Sheet
APPLICATIONS INFORMATION
CURRENT OUTPUT MODE WITH INTERNAL R
When using the internal R
resistor in current output mode,
SET
SET
the output is significantly affected by how many other channels
using the internal R
these channels. The internal R
for all channels enabled with the internal R
are enabled and by the dc crosstalk from
SET
specifications in Ta b le 1 are
SET
selected and
SET
outputting the same code.
For every channel enabled with the internal R
, the offset error
SET
decreases. For example, with one current output enabled using
the internal R
, the offset error is 0.075% FSR. This value
SET
decreases proportionally as more current channels are enabled;
the offset error is 0.056% FSR on each of two channels, 0.029%
on each of three channels, and 0.01% on each of four channels.
Similarly, the dc crosstalk when using the internal R
is propor-
SET
tional to the number of current output channels enabled with
the internal R
. For example, with the measured channel at
SET
0x8000 and one channel going from zero to full scale, the dc
crosstalk is −0.011% FSR. With two channels going from zero to
full scale, it is −0.019% FSR, and with all three other channels
going from zero to full scale, it is −0.025% FSR.
For the full-scale error measurement in Tab le 1 , all channels are
at 0xFFFF. This means that, as any channel goes to zero scale,
the full-scale error increases due to the dc crosstalk. For example,
with the measured channel at 0xFFFF and three channels at
zero scale, the full-scale error is 0.025%. Similarly, if only one
channel is enabled in current output mode with the internal
, the full-scale error is 0.025% FSR + 0.075% FSR = 0.1% FSR.
R
SET
PRECISION VOLTAGE REFERENCE SELECTION
To achieve the optimum performance from the AD5757 over its
full operating temperature range, a precision voltage reference
must be used. Thought should be given to the selection of a
precision voltage reference. The voltage applied to the reference
inputs is used to provide a buffered reference for the DAC cores.
Therefore, any error in the voltage reference is reflected in the
outputs of the device.
There are four possible sources of error to consider when choosing
a voltage reference for high accuracy applications: initial
accuracy, temperature coefficient of the output voltage, longterm drift, and output voltage noise.
Initial accuracy error on the output voltage of an external reference can lead to a full-scale error in the DAC. Therefore, to
minimize these errors, a reference with low initial accuracy
error specification is preferred. Choosing a reference with an
output trim adjustment, such as the ADR425, allows a system
designer to trim system errors out by setting the reference
voltage to a voltage other than the nominal. The trim adjustment can be used at any temperature to trim out any error.
Long-term drift is a measure of how much the reference output
voltage drifts over time. A reference with a tight long-term drift
specification ensures that the overall solution remains relatively
stable over its entire lifetime.
The temperature coefficient of a reference’s output voltage affects
INL, DNL, and TUE. A reference with a tight temperature
coefficient specification should be chosen to reduce the dependence of the DAC output voltage to ambient temperature.
In high accuracy applications, which have a relatively low noise
budget, reference output voltage noise must be considered.
Choosing a reference with as low an output noise voltage as practical for the system resolution required is important. Precision
voltage references such as the ADR435 (XFET design) produce
low output noise in the 0.1 Hz to 10 Hz region. However, as the
circuit bandwidth increases, filtering the output of the reference
may be required to minimize the output noise.
DRIVING INDUCTIVE LOADS
When driving inductive or poorly defined loads, a capacitor
may be required between I
0.01 µF capacitor between I
a load of 50 mH. The capacitive component of the load may
cause slower settling, although this may be masked by the settling time of the AD5757. There is no maximum capacitance
limit for the current output of the AD5757.
Long-Term Drift
(ppm Typical) Temperature Drift (ppm/°C Maximum)
0.1 Hz to 10 Hz Noise
(μV p-p Typical)
Rev. B | Page 40 of 44
Data Sheet AD5757
TRANSIENT VOLTAGE PROTECTION
The AD5757 contains ESD protection diodes that prevent damage from normal handling. The industrial control environment
can, however, subject I/O circuits to much higher transients. To
protect the AD5757 from excessively high voltage transients,
external power diodes and a surge current limiting resistor (R
are required, as shown in Figure 63. A typical value for R
The two protection diodes and the resistor (R
) must have appro-
P
is 10 Ω.
P
P
priate power ratings.
(FROM
DC-TO-DC
CONVERTER)
R
FILTER
10Ω
C
C
DCDC
4.7µF
Figure 63. Output Transient Voltage Protection
FILTER
0.1µF
V
AD5757
BOOST_x
I
OUT_x
AGND
D1
R
D2
P
R
LOAD
Additional protection can be provided using transient voltage
suppressors (TVSs), also referred to as transorbs. These components are available as unidirectional suppressors, which protect
against positive high voltage transients, and as bidirectional
suppressors, which protect against both positive and negative
high voltage transients. Transient voltage suppressors are available in a wide range of standoff and breakdown voltage ratings.
The TVS should be sized with the lowest breakdown voltage
possible while not conducting in the functional range of the
current output.
It is recommended that all field connected nodes be protected.
MICROPROCESSOR INTERFACING
Microprocessor interfacing to the AD5757 is via a serial bus that
uses a protocol compatible with microcontrollers and DSP
processors. The communications channel is a 3-wire minimum
interface consisting of a clock signal, a data signal, and a latch
signal. The AD5757 requires a 24-bit data-word with data valid
on the falling edge of SCLK.
The DAC output update is initiated on either the rising edge of
or, if
LDAC
is held low, on the rising edge of
LDAC
contents of the registers can be read using the readback function.
AD5757-TO-ADSP-BF527 INTERFACE
The AD5757 can be connected directly to the SPORT interface
of the ADSP-BF527, an Analog Devices, Inc., Blackfin® DSP.
Figure 64 shows how the SPORT interface can be connected to
control the AD5757.
SYNC
. The
Rev. B | Page 41 of 44
SPORT_TFS
SPORT_TSCK
SPORT_DTO
)
ADSP-BF527
Figure 64. AD5757-to-ADSP-BF527 SPORT Interface
GPIO0
LAYOUT GUIDELINES
Grounding
In any circuit where accuracy is important, careful consideration
of the power supply and ground return layout helps to ensure
the rated performance. The printed circuit board on which the
AD5757 is mounted should be designed so that the analog and
digital sections are separated and confined to certain areas of the
09225-013
board. If the AD5757 is in a system where multiple devices
require an AGND-to-DGND connection, the connection should
be made at one point only. The star ground point should be
established as close as possible to the device.
The GNDSW
and ground connection for the AVCC supply are
x
referred to as PGND. PGND should be confined to certain areas
of the board, and the PGND-to-AGND connection should be
made at one point only.
Supply Decoupling
The AD5757 should have ample supply bypassing of 10 µF
in parallel with 0.1 µF on each supply located as close to the
package as possible, ideally right up against the device. The
10 µF capacitors are the tantalum bead type. The 0.1 µF capacitor should have low effective series resistance (ESR) and low
effective series inductance (ESL), such as the common ceramic
types, which provide a low impedance path to ground at high
frequencies to handle transient currents due to internal logic
switching.
Traces
The power supply lines of the AD5757 should use as large a
trace as possible to provide low impedance paths and reduce the
effects of glitches on the power supply line. Fast switching signals
such as clocks should be shielded with digital ground to prevent
radiating noise to other parts of the board and should never be
run near the reference inputs. A ground line routed between the
SDIN and SCLK lines helps reduce crosstalk between them (not
required on a multilayer board that has a separate ground plane,
but separating the lines helps). It is essential to minimize noise
on the REFIN line because it couples through to the DAC output.
Avoid crossover of digital and analog signals. Traces on
opposite sides of the board should run at right angles to each
other. This reduces the effects of feedthrough on the board. A
microstrip technique is by far the best but not always possible
with a double-sided board. In this technique, the component
side of the board is dedicated to ground plane, whereas signal
traces are placed on the solder side.
SYNC
SCLK
SDIN
LDAC
AD5757
09225-080
AD5757 Data Sheet
DC-to-DC Converters
To achieve high efficiency, good regulation, and stability, a welldesigned printed circuit board layout is required.
Follow these guidelines when designing printed circuit boards
(see Figure 56):
• Keep the low ESR input capacitor, C
, close to AVCC
IN
and PGND.
• Keep the high current path from C
, to SWX and PGND as short as possible.
L
DCDC
• Keep the high current path from C
rectifier, D
, to the output capacitor, C
DCDC
through the inductor,
IN
through L
IN
DCDC
and the
DCDC
, as short as
possible.
• Keep high current traces as short and as wide as possible.
The path from C
through the inductor, L
IN
, to SWX and
DCDC
PGND should be able to handle a minimum of 1 A.
• Place the compensation components as close as possible to
DCDC_x
.
COMP
• Avoid routing high impedance traces near any node
connected to SW
or near the inductor to prevent radiated
x
noise injection.
GALVANICALLY ISOLATED INTERFACE
In many process control applications, it is necessary to provide
an isolation barrier between the controller and the unit being
controlled to protect and isolate the controlling circuitry from
any hazardous common-mode voltages that may occur. Analog
Devices
excess of 2.5 kV. The serial loading structure of the AD5757
makes it ideal for isolated interfaces because the number of
interface lines is kept to a minimum. Figure 65 shows a 4-channel
isolated interface to the AD5757 using an ADuM1400. For
more information, visit www.analog.com.
iCoupler® products can provide voltage isolation in
MICROCONTRO LLER
SERIAL CLOCK
SERIAL DATA
SYNC OUT
CONTROL OUT
*ADDITI ONAL PINS OM ITTED F OR CLARI TY.
ADuM1400*
V
IA
OUT
OUT
ENCODEDECODE
V
IB
ENCODEDECODE
V
IC
ENCODEDECODE
V
ID
ENCODEDECODE
Figure 65. Isolated Interface
V
OA
TO SCLK
V
OB
TO SDIN
V
OC
TO SYNC
V
OD
TO LDAC
09225-081
Rev. B | Page 42 of 44
Data Sheet AD5757
OUTLINE DIMENSIONS
49
48
0.60 MAX
EXPOSED PAD
(BOTTOM VIEW)
PIN 1
64
INDICATOR
1
7.25
7.10 SQ
6.95
PIN 1
INDICATOR
9.00
BSC SQ
TOP VIEW
8.75
BSC SQ
0.60
MAX
0.50
BSC
1.00
0.85
0.80
SEATING
PLANE
12° MAX
0.50
0.40
0.30
0.80 MAX
0.65 TYP
0.30
0.23
0.18
COMPLIANT TO JEDEC S TANDARDS MO-220-VMMD-4
Figure 66. 64-
Lead Lead Frame Chip Scale Package [LFCSP_VQ]
0.05 MAX
0.02 NOM
0.20 REF
33
32
7.50
REF
16
17
FOR PROPER CONNECTION O F
THE EXPOSED PAD, REFER TO
THE PIN CONF IGURATIO N AND
FUNCTION DESCRIPTIO NS
SECTION OF THIS DATA SHEET.
0.25 MIN
080108-C
9 mm × 9 mm Body, Very Thin Quad
Dimensions shown in millimeters
(CP-64-3)
ORDERING GUIDE
Model1 Resolution (Bits) Temperature Range Package Description Package Option
AD5757ACPZ 16 −40°C to +105°C 64-Lead Lead Frame Chip Scale Package [LFCSP_VQ] CP-64-3
AD5757ACPZ-REEL7 16 −40°C to +105°C 64-Lead Lead Frame Chip Scale Package [LFCSP_VQ] CP-64-3
EVAL-AD5757SDZ Evaluation Board