AD5669R: 16 bits
16-lead LFCSP and 16-lead TSSOP
On-chip 1.25 V/2.5 V, 5 ppm/°C reference
Power down to 400 nA at 5 V, 200 nA at 3 V
2.7 V to 5.5 V power supply
Guaranteed monotonic by design
Power-on reset to zero scale or midscale
3 power-down functions
Hardware
2
I
C-compatible serial interface supports standard (100 kHz)
LDAC
and fast (400 kHz) modes
APPLICATIONS
Process control
Data acquisition systems
Portable battery-powered instruments
Digital gain and offset adjustment
Programmable voltage and current sources
GENERAL DESCRIPTION
The AD5629R/AD5669R devices are low power, octal, 12-/16bit, buffered voltage-output DACs. All devices are guaranteed
monotonic by design.
The AD5629R/AD5669R have an on-chip reference with an
internal gain of 2. The AD5629R-1/AD5669R-1 have a 1.25 V,
5 ppm/°C reference, giving a full-scale output range of 2.5 V.
The AD5629R-2/AD5629R-3 and the AD5669R-2/AD5669R-3
have a 2.5 V 5 ppm/°C reference, giving a full-scale output range
of 5 V depending on the option selected. Devices with 1.25 V
reference selected operate from a single 2.7 V to 5.5 V supply.
Devices with 2.5 V reference selected operate from 4.5 V to 5.5 V.
The on-chip reference is off at power-up, allowing the use of an
external reference. The internal reference is enabled via a
software write.
and
CLR
functions
with 5 ppm/°C On-Chip Reference
AD5629R/AD5669R
FUNCTIONAL BLOCK DIAGRAM
DD
AD5629R/AD5669R
SCL
SD
LDAC
INTERFACE LOGIC
A0
LDAC
CLRGND
INPUT
REGISTER
INPUT
REGISTER
INPUT
REGISTER
INPUT
REGISTER
INPUT
REGISTER
INPUT
REGISTER
INPUT
REGISTER
INPUT
REGISTER
POWER-ON RESETPOWER-DOWN LOGIC
DAC
REGISTER
DAC
REGISTER
DAC
REGISTER
DAC
REGISTER
DAC
REGISTER
DAC
REGISTER
DAC
REGISTER
DAC
REGISTER
Figure 1.
The parts incorporate a power-on reset circuit to ensure that the
DAC output powers up to 0 V (AD5629R-1/AD5629R-2,
AD5669R-1/AD5669R-2) or midscale (AD5629R-3/AD5669R-3)
and remains powered up at this level until a valid write takes
place. The part contains a power-down feature that reduces the
current consumption of the device to 400 nA at 5 V and
provides software-selectable output loads while in power-down
mode for any or all DAC channels.
PRODUCT HIGHLIGHTS
1. Octal, 12-/16-bit DACs.
2. On-chip 1.25 V/2.5 V, 5 ppm/°C reference.
3. Available in 16-lead LFCSP and TSSOP.
4. Power-on reset to 0 V or midscale.
5. Power-down capability. When powered down, the DAC
typically consumes 200 nA at 3 V and 400 nA at 5 V.
REFIN
STRING
STRING
STRING
STRING
STRING
STRING
STRING
STRING
V
REFOUT
1.25V/2.5V REF
DAC A
DAC B
DAC C
DAC D
DAC E
DAC F
DAC G
DAC H
BUFFER
BUFFER
BUFFER
BUFFER
BUFFER
BUFFER
BUFFER
BUFFER
V
OUT
V
OUT
V
OUT
V
OUT
V
OUT
V
OUT
V
OUT
V
OUT
A
B
C
D
E
F
G
H
08819-001
Rev. A
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Anal og Devices for its use, nor for any infringements of patents or ot her
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarks and registered trademarks are the property of their respective owners.
Zero-Code Error 6 19 6 19 mV All 0s loaded to DAC register (see Figure 18)
Zero-Code Error Drift ±2 ±2 µV/°C
Full-Scale Error −0.2 −1 −0.2 −1 % FSR All 1s loaded to DAC register (see Figure 19)
Gain Error ±1 ±1 % FSR
Gain Temperature Coefficient ±2.5 ±2.5 ppm Of FSR/°C
Offset Error ±6 ±19 ±6 ±19 mV
DC Power Supply Rejection
–80 –80 dB V
Ratio
DC Crosstalk
10 10 µV
(External Reference)
5 5 µV/mA Due to load current change
10 10 µV Due to powering down (per channel)
DC Crosstalk
25 25 µV
(Internal Reference)
10 10 µV/mA Due to load current change
OUTPUT CHARACTERISTICS3
Output Voltage Range 0 VDD 0 VDD V
Capacitive Load Stability 2 2 nF RL = ∞
10 10 nF RL = 2 kΩ
DC Output Impedance 0.5 0.5 Ω
Short-Circuit Current 30 30 mA VDD = 5 V
Power-Up Time 4 4 µs Coming out of power-down mode, VDD = 5 V
REFERENCE INPUTS
Reference Current 40 50 40 50 µA V
Reference Input Range 0 VDD 0 VDD V
Reference Input Impedance 14.6 14.6 kΩ
REFERENCE OUTPUT (1.25 V)
Output Voltage 1.247 1.253 1.247 1.253 µA TA = 25°C
Reference Input Range
±15
Output Impedance 7.5 7.5 kΩ
REFERENCE OUTPUT (2.5 V)
Output Voltage 2.495 2.505 2.495 2.505 µA TA = 25°C
Reference Input Range
±15
Output Impedance 7.5 7.5 kΩ
= VDD. All specifications T
REFIN
±5 ±15
±5 ±10
ppm/°C
ppm/°C
MIN
to T
, unless otherwise noted.
MAX
Guaranteed monotonic by design
(see Figure 8)
Guaranteed monotonic by design
(see Figure 7)
± 10%
DD
Due to full-scale output change,
R
= 2 kΩ to GND or VDD
L
Due to full-scale output change,
= 2 kΩ to GND or VDD
R
L
= VDD = 5.5 V (per DAC channel)
REFIN
Rev. A | Page 3 of 28
AD5629R/AD5669R
A Grade1 B Grade1
Parameter Min Typ Max Min Typ Max Unit Test Conditions/Comments
LOGIC INPUTS3
Input Current ±3 ±3 µA All digital inputs
Input Low Voltage, V
Input High Voltage, V
Pin Capacitance 3 3 pF
POWER REQUIREMENTS
VDD 4.5 5.5 4.5 5.5 V
IDD (Normal Mode)4 VIH = VDD and VIL = GND
VDD = 4.5 V to 5.5 V 1.3 1.8 1.3 1.8 mA Internal reference off
2 2.5 2 2.5 mA Internal reference on
IDD (All Power-Down Modes)5
VDD = 4.5 V to 5.5 V 0.4 1 0.4 1 µA VIH = VDD and VIL = GND
1
Temperature range is −40°C to +105°C, typical at 25°C.
2
Linearity calculated using a reduced code range of the AD5629R (Code 32 to Code 4064) and the AD5669R (Code 512 to 65,024). Output unloaded.
3
Guaranteed by design and characterization; not production tested.
4
Interface inactive. All DACs active. DAC outputs unloaded.
5
All eight DACs powered down.
0.8 0.8 V VDD = 5 V
INL
2 2 V VDD = 5 V
INH
All digital inputs at 0 or V
DAC active, excludes load current
,
DD
Rev. A | Page 4 of 28
AD5629R/AD5669R
VDD = 2.7 V to 3.6 V, RL = 2 kΩ to GND, CL = 200 pF to GND, V
Table 2.
A Grade1 B Grade1
Parameter Min Typ Max Min Typ Max Unit Conditions/Comments
STATIC PERFORMANCE
2
AD5629R
Resolution 12 12 Bits
Relative Accuracy ±0.5 ±4 ±0.5 ±1 LSB See Figure 6
Differential Nonlinearity ±0.25 ±0.25 LSB Guaranteed monotonic by design (see Figure 8)
AD5669R
Resolution 16 16 Bits
Relative Accuracy ±8 ±32 ±8 ±16 LSB See Figure 5
Differential Nonlinearity ±1 ±1 LSB Guaranteed monotonic by design (see Figure 7)
Zero-Code Error 6 19 6 19 mV All 0s loaded to DAC register (see Figure 18)
Zero-Code Error Drift ±2 ±2 µV/°C
Full-Scale Error −0.2 −1 −0.2 −1 % FSR All 1s loaded to DAC register (see Figure 19)
Gain Error ±1 ±1 % FSR
Gain Temperature Coefficient ±2.5 ±2.5 ppm Of FSR/°C
Offset Error ±6 ±19 ±6 ±19 mV
DC Power Supply Rejection
–80 –80 dB V
Ratio
DC Crosstalk
10 10 µV
(External Reference)
5 5 µV/mA Due to load current change
10 10 µV Due to powering down (per channel)
DC Crosstalk
25 25 µV
(Internal Reference)
10 10 µV/mA Due to load current change
OUTPUT CHARACTERISTICS3
Output Voltage Range 0 VDD 0 VDD V
Capacitive Load Stability 2 2 nF RL = ∞
10 10 nF RL = 2 kΩ
DC Output Impedance 0.5 0.5 Ω
Short-Circuit Current 30 30 mA VDD = 3 V
Power-Up Time 4 4 µs Coming out of power-down mode, VDD = 3 V
REFERENCE INPUTS
Reference Current 40 50 40 50 µA V
Reference Input Range 0 VDD 0 VDD
Reference Input Impedance 14.6 14.6 kΩ
REFERENCE OUTPUT
Output Voltage
AD5629R/AD5669R 1.247 1.253 1.247 1.253 V TA = 25°C
Reference Tempco3 ±15 ±5 ±15 ppm/°C
Reference Output Impedance 7.5 7.5 kΩ
LOGIC INPUTS3
Input Current ±3 ±3 µA All digital inputs
Input Low Voltage, V
Input High Voltage, V
0.8 0.8 V VDD = 3 V
INL
2 2 V VDD = 3 V
INH
Pin Capacitance 3 3 pF
= VDD. All specifications T
REFIN
MIN
± 10%
DD
to T
, unless otherwise noted.
MAX
Due to full-scale output change,
R
= 2 kΩ to GND or VDD
L
Due to full-scale output change,
= 2 kΩ to GND or VDD
R
L
= VDD = 3.6 V (per DAC channel)
REFIN
Rev. A | Page 5 of 28
AD5629R/AD5669R
A Grade1 B Grade1
Parameter Min Typ Max Min Typ Max Unit Conditions/Comments
POWER REQUIREMENTS
VDD 2.7 3.6 2.7 3.6 V
All digital inputs at 0 or V
DAC active, excludes load current
IDD (Normal Mode)4 V
= VDD and VIL = GND
IH
VDD = 2.7 V to 3.6 V 1.0 1.5 1.0 1.5 mA Internal reference off
1.8 2.25 1.7 2.25 mA Internal reference on
IDD (All Power-Down Modes)5
VDD = 2.7 V to 3.6 V 0.2 1 0.2 1 µA VIH = VDD and VIL = GND
1
Temperature range is −40°C to +105°C, typical at 25°C.
2
Linearity calculated using a reduced code range of the AD5629R (Code 32 to Code 4064) and the AD5669R (Code 512 to 65,024). Output unloaded.
3
Guaranteed by design and characterization; not production tested.
4
Interface inactive. All DACs active. DAC outputs unloaded.
5
All eight DACs powered down.
AC CHARACTERISTICS
VDD = 2.7 V to 5.5 V, RL = 2 kΩ to GND, CL = 200 pF to GND, V
= VDD. All specifications T
REFIN
MIN
to T
, unless otherwise noted.
MAX
,
DD
Table 3.
Parameter
1, 2
Min Typ Max Unit Conditions/Comments3
Output Voltage Settling Time 2.5 7 µs ¼ to ¾ scale settling to ±2 LSB
Slew Rate 1.2 V/µs
Digital-to-Analog Glitch Impulse 4 nV-s 1 LSB change around major carry (see Figure 34)
19 nV-s From Code 59904 to Code 59903
Digital Feedthrough 0.1 nV-s
Reference Feedthrough −90 dB V
= 2 V ± 0.1 V p-p, frequency = 10 Hz to 20 MHz
REFIN
Digital Crosstalk 0.2 nV-s
Analog Crosstalk 0.4 nV-s
DAC-to-DAC Crosstalk 0.8 nV-s
Multiplying Bandwidth 320 kHz V
Total Harmonic Distortion −80 dB V
Guaranteed by design and characterization; not production tested.
2
See the Terminology section.
3
Temperature range is −40°C to +105°C, typical at 25°C.
Rev. A | Page 6 of 28
AD5629R/AD5669R
I2C TIMING CHARACTERISTICS
VDD = 2.7 V to 5.5 V; all specifications T
Table 4.
Parameter Conditions Min Max Unit Description
1
f
Standard mode 100 kHz Serial clock frequency
SCL
Fast mode 400 kHz
t1 Standard mode 4 s t
Fast mode 0.6 s
t2 Standard mode 4.7 s t
Fast mode 1.3 s
t3 Standard mode 250 ns t
Fast mode 100 ns
t4 Standard mode 0 3.45 s t
Fast mode 0 0.9 s
t5 Standard mode 4.7 s t
Fast mode 0.6 s
t6 Standard mode 4 s t
Fast mode 0.6 s
t7 Standard mode 4.7 s t
Fast mode 1.3 s
t8 Standard mode 4 s t
Fast mode 0.6 s
t9 Standard mode 1000 ns t
Fast mode 300 ns
t10 Standard mode 300 ns t
Fast mode 300 ns
t11 Standard mode 1000 ns t
Fast mode 300 ns
t
Standard mode 1000 ns
11A
Fast mode 300 ns
t12 Standard mode 300 ns t
Fast mode 300 ns
t13 Standard mode 10 ns
Fast mode 10 ns
t14 Standard mode 300 ns
Fast mode 300 ns
t15 Standard mode 20 ns
Fast mode 20 ns
2
t
Fast mode 0 50 ns Pulse width of spike suppressed
SP
1
The SDA and SCL timing is measured with the input filters enabled. Switching off the input filters improves the transfer rate but has a negative effect on the EMC
behavior of the part.
2
Input filtering on the SCL and SDA inputs suppresses noise spikes that are less than 50 ns for fast mode or less than 10 ns for high speed mode.
MIN
to T
, f
= 400 kHz, unless otherwise noted.
MAX
SCL
HIGH
LOW
SU;DAT
HD;DAT
SU;STA
HD;STA
BUF
SU;STO
RDA
FDA
RCL
t
RCL1
after an acknowledge bit
FCL
LDAC
Falling edge of ninth SCL clock pulse of last byte of a valid write to
the LDAC falling edge
CLR
, SCL high time
, SCL low time
, data setup time
, data hold time
, setup time for a repeated start condition
, hold time (repeated) start condition
, bus-free time between a stop and a start condition
, setup time for a stop condition
, rise time of SDA signal
, fall time of SDA signal
, rise time of SCL signal
, rise time of SCL signal after a repeated start condition and
, fall time of SCL signal
pulse width low
pulse width low
Rev. A | Page 7 of 28
AD5629R/AD5669R
t
t
SCL
SDA
t
7
PSSP
LDAC*
CLR
*ASYNCHRONOUS LDAC UPDAT E MODE.
2
t
6
11
t
4
t
12
t
1
t
3
t
15
t
6
t
5
t
10
t
8
t
14
t
9
t
13
08819-002
Figure 2. Serial Write Operation
Rev. A | Page 8 of 28
AD5629R/AD5669R
ABSOLUTE MAXIMUM RATINGS
T
= 25°C, unless otherwise noted.
A
Table 5.
Parameter Rating
VDD to GND −0.3 V to +7 V
Digital Input Voltage to GND −0.3 V to VDD + 0.3 V
V
to GND −0.3 V to VDD + 0.3 V
OUT
V
REFIN/VREFOUT
Operating Temperature Range
Industrial −40°C to +105°C
Storage Temperature Range −65°C to +150°C
Junction Temperature (TJ
Power Dissipation (TJ
Thermal Impedance, θJA
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
ESD CAUTION
Rev. A | Page 9 of 28
AD5629R/AD5669R
V
PIN CONFIGURATION AND FUNCTION DESCRIPTIONS
AD5629R/AD5669R
LDAC
SCL
16 A0
SDA
13
15
14
1
V
DD
2
V
A
OUT
V
OUT
V
OUT
NOTES
1. EXPOSED PAD MUST BE TIED TO GND.
C
E
3
4
TOP VIEW
(Not to Scale)
6
5
G
OUT
V
REFOUT
/V
REFIN
V
Figure 3. 16-Lead LFCSP (CP-16-17)
12
GND
B
11
V
OUT
10
D
V
OUT
9
F
V
OUT
8
7
H
CLR
OUT
V
08819-003
REFIN/VREFOUT
LDAC
V
OUT
V
OUT
V
OUT
V
OUT
V
A0
DD
A
C
E
G
1
2
3
AD5629R/
AD5669R
4
5
(Not to Scale)
6
7
8
TOP VIEW
Figure 4. 16-Lead TSSOP (RU-16)
Table 6. Pin Function Descriptions
Pin No.
16-Lead
LFCSP
15
16-Lead
TSSOP Mnemonic
1
LDAC
Description
Pulsing this pin low allows any or all DAC registers to be updated if the input registers have
new data. This allows all DAC outputs to simultaneously update. Alternatively, this pin can
be tied permanently low.
16 2 A0 Address Input. Sets the least significant bit of the 7-bit slave address.
1 3 V
DD
Power Supply Input. These parts can be operated from 2.7 V to 5.5 V. Decouple the supply
with a 10 µF capacitor in parallel with a 0.1 µF capacitor to GND.
2 4 V
3 5 V
4 6 V
5 7 V
6 8 V
A Analog Output Voltage from DAC A. The output amplifier has rail-to-rail operation.
OUT
C Analog Output Voltage from DAC C. The output amplifier has rail-to-rail operation.
OUT
E Analog Output Voltage from DAC E. The output amplifier has rail-to-rail operation.
OUT
G Analog Output Voltage from DAC G. The output amplifier has rail-to-rail operation.
OUT
REFIN/VREFOUT
The AD5629R/AD5669R have a common pin for reference input and reference output.
When using the internal reference, this is the reference output pin. When using an external
reference, this is the reference input pin. The default for this pin is as a reference input.
7 9
Asynchronous Clear Input. The CLR input is falling edge sensitive. When CLR is low, all LDAC
CLR
pulses are ignored. When CLR
updated with the data contained in the CLR
is activated, the input register and the DAC register are
code register—zero scale, midscale, or full
scale. The default setting clears the output to 0 V.
8 10 V
9 11 V
10 12 V
11 13 V
12 14 GND
13 15 SDA
H Analog Output Voltage from DAC H. The output amplifier has rail-to-rail operation.
OUT
F Analog Output Voltage from DAC F. The output amplifier has rail-to-rail operation.
OUT
D Analog Output Voltage from DAC D. The output amplifier has rail-to-rail operation.
OUT
B Analog Output Voltage from DAC B. The output amplifier has rail-to-rail operation.
OUT
Ground Reference Point for All Circuitry on the Parts.
Serial Data Input. This is used in conjunction with the SCL line to clock data into or out of
the 32-bit input shift register. It is a bidirectional, open-drain data line that should be
14 16 SCL
pulled to the supply with an external pull-up resistor.
Serial Clock Line. This is used in conjunction with the SDA line to clock data into or out of
the 32-bit input shift register.
17 N/A Exposed Pad (EPAD) The exposed pad must be tied to GND.
16
SCL
15
SDA
14
GND
13
V
B
OUT
12
V
D
OUT
11
V
F
OUT
10
H
V
OUT
9
CLR
08819-004
Rev. A | Page 10 of 28
AD5629R/AD5669R
TYPICAL PERFORMANCE CHARACTERISTICS
10
8
6
4
2
0
INL (LSB)
–2
–4
–6
–8
–10
010k20k30k40k50k60k 65535
CODES
VDD = 5V
EXT REF = 5V
T
Figure 5. INL AD5669R—External Reference
= 25°C
A
08819-106
0.20
VDD = 5V
EXT REF = 5V
0.15
T
= 25°C
A
0.10
0.05
0
DNL (LSB)
–0.05
–0.10
–0.15
–0.20
05001000 1500 2000 2500 3000 35004095
CODES
Figure 8. DNL AD5629R—External Reference
08819-111
1.0
0.8
0.6
0.4
0.2
0
INL (LSB)
–0.2
–0.4
–0.6
–0.8
–1.0
05001000 1500 2000 2500 3000 35004095
CODES
VDD = 5V
EXT REF = 5V
T
Figure 6. INL AD5629R—External Reference
1.0
VDD = 5V
EXT REF = 5V
0.8
T
= 25°C
A
0.6
0.4
0.2
0
DNL (LSB)
–0.2
–0.4
–0.6
–0.8
–1.0
010k20k30k40k50k60k 65535
CODES
Figure 7. DNL AD5669R—External Reference
= 25°C
A
10
5
0
INL (LSB)
–5
–10
010k20k30k40k50k60k 65535
08819-108
CODES
VDD = 5V
INT REF = 2.5V
T
= 25°C
A
08819-112
Figure 9. INL AD5669R-2—Internal Reference
1.0
0.5
0
INL (LSB)
–0.5
–1.0
05001000 1500 2000 2500 3000 35004095
08819-109
CODES
VDD = 5V
INT REF = 2.5V
T
= 25°C
A
08819-114
Figure 10. INL AD5629R-2—Internal Reference
Rev. A | Page 11 of 28
AD5629R/AD5669R
1.0
VDD = 5V
INT REF = 2.5V
T
A
0.5
= 25°C
1.0
VDD = 3V
INT REF = 1.25V
T
= 25°C
A
0.5
0
DNL (LSB)
–0.5
–1.0
010k20k30k40k50k60k 65535
CODES
Figure 11. DNL AD5669R-2—Internal Reference
0.20
VDD = 5V
INT REF = 2.5V
0.15
T
= 25°C
A
0.10
0.05
0
DNL (LSB)
–0.05
–0.10
–0.15
–0.20
05001000 1500 2000 2500 3000 35004095
CODES
Figure 12. DNL AD5629R-2— Internal Reference
0
INL (LSB)
–0.5
–1.0
05001000 1500 2000 2500 3000 35004095
08819-115
CODES
08819-120
Figure 14. INL AD5629R-1—Internal Reference
1.0
0.5
0
DNL (LSB)
–0.5
–1.0
010k20k30k40k50k60k 65535
08819-117
CODES
VDD = 3V
INT REF = 1.25V
T
= 25°C
A
08819-121
Figure 15. DNL AD5669R-1—Internal Reference
10
8
6
4
2
0
INL (LSB)
–2
–4
–6
–8
–10
010k20k30k40k50k60k 65535
CODES
VDD = 3V
INT REF = 1.25V
T
= 25°C
A
Figure 13. INL AD5669R-1—Internal Reference
08819-118
Rev. A | Page 12 of 28
0.20
0.15
0.10
0.05
0
DNL (LSB)
–0.05
–0.10
–0.15
–0.20
05001000 1500 2000 2500 3000 35004095
CODES
VDD = 3V
INT REF = 1.25V
T
A
Figure 16. DNL AD5629R-1—Internal Reference
= 25°C
08819-123
AD5629R/AD5669R
–
–0.05
0
VDD = 5V
1.95
1.90
TA = 25°C
–0.10
FULL-SCALE ERROR
GAIN ERROR
TEMPERATURE ( °C)
ERROR (% F SR)
–0.15
–0.20
–0.25
–0.30
–401251109580655035205–10–25
Figure 17. Gain Error and Full-Scale Error vs. Temperature
6
VDD = 5V
5
OFFSET ERRO R
4
ZERO-CODE ERROR
3
ERROR (mV)
2
1.85
1.80
1.75
ERROR (mV)
1.70
1.65
1.60
1.55
08819-124
2.75.55.14.74.33.93.53.1
OFFSET ERROR
ZERO-CODE ERROR
VDD (V)
08819-127
Figure 20. Zero-Code Error and Offset Error vs. Supply Voltage
21
18
15
12
9
NUMBER OF HITS
6
1
0
–401251109580655035205–10–25
TEMPERATURE ( °C)
Figure 18. Zero-Code Error and Offset Error vs. Temperature
0.16
FULL-SCALE ERROR
GAIN ERROR
VDD (V)
ERROR (% F SR)
–0.17
–0.18
–0.19
–0.20
–0.21
–0.22
–0.23
–0.24
–0.25
–0.26
2.75.55.14.74.33.93.53.1
Figure 19. Gain Error and Full-Scale Error vs. Supply Voltage
Figure 45. 1.25 V Reference Temperature Coefficient vs. Temperature
5.5
5.0
4.5
4.0
3.5
3.0
2.5
2.0
VOLTAGE (V)
1.5
1.0
0.5
0
–0.5
–101050–5
CLR PULSE
TIME (µs)
Figure 43. Hardware
V
CLR
OUT
EXT REF = 5V
A
08819-150
2.503
2.502
2.501
2.500
2.499
2.498
REFERENCE (ppm/°C)
2.497
2.496
2.495
10525–40
TEMPERATURE ( °C)
Figure 46. 2.5 V Reference Temperature Coefficient vs. Temperature
08819-153
Rev. A | Page 17 of 28
AD5629R/AD5669R
TERMINOLOGY
Relative Accuracy
For the DAC, relative accuracy, or integral nonlinearity (INL), is
a measure of the maximum deviation in LSBs from a straight line
passing through the endpoints of the DAC transfer function.
Figure 5, Figure 6, Figure 9, Figure 10, Figure 13, and Figure 14
show plots of typical INL vs. code.
Differential Nonlinearity
Differential nonlinearity (DNL) is the difference between the
measured change and the ideal 1 LSB change between any two
adjacent codes. A specified differential nonlinearity of ±1 LSB
maximum ensures monotonicity. This DAC is guaranteed
monotonic by design. Figure 7, Figure 8, Figure 11, Figure 12,
Figure 15, and Figure 16 show plots of typical DNL vs. code.
Offset Error
Offset error is a measure of the difference between the actual
V
and the ideal V
OUT
, expressed in millivolts in the linear
OUT
region of the transfer function. Offset error is measured on the
AD5669R between Code 512 and Code 65024 loaded into the
DAC register. It can be negative or positive and is expressed in
millivolts.
Zero-Code Error
Zero-code error is a measure of the output error when zero
code (0x0000) is loaded into the DAC register. Ideally, the
output should be 0 V. The zero-code error is always positive
because the output of the DAC cannot go below 0 V. It is due to
a combination of the offset errors in the DAC and output
amplifier. Zero-code error is expressed in millivolts. Figure 18
shows a plot of typical zero-code error vs. temperature.
Gain Error
Gain error is a measure of the span error of the DAC. It is the
deviation in slope of the DAC transfer characteristic from the
ideal, expressed as a percentage of the full-scale range.
Zero-Code Error Drift
Zero-code error drift is a measure of the change in zero-code
error with a change in temperature. It is expressed in μV/°C.
Gain Error Drift
Gain error drift is a measure of the change in gain error with
changes in temperature. It is expressed in (ppm of full-scale
range)/°C.
Full-Scale Error
Full-scale error is a measure of the output error when full-scale
code (0xFFFF) is loaded into the DAC register. Ideally, the
output should be V
− 1 LSB. Full-scale error is expressed as
REF
a percentage of the full-scale range. Figure 17 shows a plot of
typical full-scale error vs. temperature.
Digital-to-Analog Glitch Impulse
Digital-to-analog glitch impulse is the impulse injected into the
analog output when the input code in the DAC register changes
state. It is normally specified as the area of the glitch in nV-s and
is measured when the digital input code is changed by 1 LSB at
the major carry transition (0x7FFF to 0x8000). Figure 34 shows
a typical digital-to-analog glitch impulse plot.
DC Power Supply Rejection Ratio (PSRR)
PSRR indicates how the output of the DAC is affected by changes
in the supply voltage. PSRR is the ratio of the change in V
a change in V
2 V, and V
for full-scale output of the DAC. V
DD
is varied ±10%. It is measured in decibels.
DD
REF
to
OUT
is held at
DC Crosstalk
DC crosstalk is the dc change in the output level of one DAC in
response to a change in the output of another DAC. It is measured
with a full-scale output change on one DAC (or soft power-down
and power-up) while monitoring another DAC kept at midscale.
It is expressed in microvolts.
DC crosstalk due to load current change is a measure of the
impact that a change in load current on one DAC has on another
DAC kept at midscale. It is expressed in microvolts per milliamp.
Digital Feedthrough
Digital feedthrough is a measure of the impulse injected into
the analog output of a DAC from the digital input pins of the
device, but is measured when the DAC is not being written to. It
is specified in nV-s and measured with a full-scale change on
the digital input pins, that is, from all 0s to all 1s or vice versa.
Digital Crosstalk
Digital crosstalk is the glitch impulse transferred to the output
of one DAC at midscale in response to a full-scale code change
(all 0s to all 1s or vice versa) in the input register of another DAC.
It is measured in standalone mode and is expressed in nV-s.
Analog Crosstalk
Analog crosstalk is the glitch impulse transferred to the output
of one DAC due to a change in the output of another DAC. It is
measured by loading one of the input registers with a full-scale
code change (all 0s to all 1s or vice versa) while keeping
LDAC
high and then pulsing
low and monitoring the output of
LDAC
the DAC whose digital code has not changed. The area of the
glitch is expressed in nV-s.
Rev. A | Page 18 of 28
AD5629R/AD5669R
DAC-to-DAC C rosst a l k
DAC-to-DAC crosstalk is the glitch impulse transferred to the
output of one DAC due to a digital code change and subsequent
output change of another DAC. This includes both digital and
analog crosstalk. It is measured by loading one of the DACs
with a full-scale code change (all 0s to all 1s or vice versa) with
LDAC
low and monitoring the output of another DAC. The
energy of the glitch is expressed in nV-s.
Multiplying Bandwidth
The amplifiers within the DAC have a finite bandwidth. The
multiplying bandwidth is a measure of this. A sine wave on the
reference (with full-scale code loaded to the DAC) appears on
the output. The multiplying bandwidth is the frequency at
which the output amplitude falls to 3 dB below the input.
Total Harmonic Distortion (THD)
Total harmonic distortion is the difference between an ideal
sine wave and its attenuated version using the DAC. The sine
wave is used as the reference for the DAC, and the THD is a
measure of the harmonics present on the DAC output. It is
measured in decibels.
Rev. A | Page 19 of 28
AD5629R/AD5669R
V
V
THEORY OF OPERATION
DIGITAL-TO-ANALOG CONVERTER (DAC) SECTION
The AD5629R/AD5669R are fabricated on a CMOS process.
The architecture consists of a string of DACs followed by an
output buffer amplifier. Each part includes an internal
1.25 V/2.5 V, 5 ppm/°C reference with an internal gain of 2.
Figure 47 and Figure 48 show block diagrams of the DAC
architecture.
REFIN/VREFOUT
RESISTOR STRING
The resistor string section is shown in Figure 49. It is simply a
string of resistors, each of value R. The code loaded into the
DAC register determines at which node on the string the
voltage is tapped off to be fed into the output amplifier. The
voltage is tapped off by closing one of the switches connecting
the string to the amplifier. Because it is a string of resistors, it
is guaranteed monotonic.
INTERNAL
REFERENCE
1
CAN BE OVERDRIVEN
BY V
REFIN/VREFOUT
Figure 47. DAC Architecture for Internal Reference Configuration
1
DAC
REGISTER
.
REF (+)
RESISTOR
STRING
REF (–)
GND
OUTPUT
AMPLIFIER
GAIN = ×2
V
OUT
08819-045
REFIN/VREFOUT
REF
R
R
Figure 48. DAC Architecture for External Reference Configuration
BUFFER
REF (+)
RESISTOR
STRING
REF (–)
GND
OUTPUT
AMPLIFIER
GAIN = ×2
V
OUT
08819-046
Because the input coding to the DAC is straight binary, the ideal
output voltage when using an external reference is given by
OUT
VV
REFIN
⎟
⎜
N
2
⎠
⎝
D
⎞
⎛
×=
The ideal output voltage when using the internal reference is
given by
D
⎞
⎛
VV
2
××=
⎟
REFOUTOUT
⎜
N
2
⎠
⎝
where:
D = decimal equivalent of the binary code that is loaded to the
DAC register as follows:
0 to 4095 for AD5629R (12 bits).
0 to 65,535 for AD5669R (16 bits).
N = the DAC resolution.
R
R
R
R
R
Figure 49. Resistor String
TO OUTPUT
AMPLIFIER
08819-047
INTERNAL REFERENCE
The AD5629R/AD5669R have an on-chip reference with an
internal gain of 2. The AD5629R-1/AD5669R-1 have a 1.25 V,
5 ppm/°C reference, giving a full-scale output of 2.5 V or the
AD5629R-2/AD5629R-3/AD5669R-2/AD5629R-3 have a 2.5 V,
5 ppm/°C reference, working between a supply from 4.5 V to
5.5 V giving a full-scale output of 5 V. The on-board reference
is off at power-up, allowing the use of an external reference. The
internal reference is enabled via a write to the control register
(see Tabl e 8 ).
The internal reference associated with each part is available at
the V
used to drive external loads. When using the internal reference,
it is recommended that a 100 nF capacitor be placed between
the reference output and GND for reference stability.
Individual channel power-down is not supported while using
the internal reference.
pin. A buffer is required if the reference output is
REFOUT
Rev. A | Page 20 of 28
AD5629R/AD5669R
(
OUTPUT AMPLIFIER
The output buffer amplifier can generate rail-to-rail voltages
on its output, which gives an output range of 0 V to V
DD
. The
amplifier is capable of driving a load of 2 kΩ in parallel with
1000 pF to GND. The source and sink capabilities of the output
amplifier can be seen in Figure 24 and Figure 25. The slew rate
is 1.5 V/μs with a ¼ to ¾ scale settling time of 10 μs.
SERIAL INTERFACE
The AD5629R/AD5669R have 2-wire I2C-compatible serial
interfaces (refer to
January 2000, available from Philips Semiconductor). The
AD5629R/AD5669R can be connected to an I
device under the control of a master device. See Figure 2 for a
timing diagram of a typical write sequence.
The AD5629R/AD5669R support standard (100 kHz) and fast
(400 kHz) modes. High speed operation is only available on
selected models. See the Ordering Guide for a full list of
models. Support is not provided for 10-bit addressing and
general call addressing.
The AD5629R/AD5669R each have a 7-bit slave address.
The parts have a slave address whose five MSBs are 10101,
and the two LSBs are set by the state of the A0 address pin,
which determines the state of the A0 and A1 address bits.
The facility to make hardwired changes to the A0 pin allows the
user to incorporate up to three of these devices on one bus, as
outlined in Tab l e 7 .
Table 7. ADDR Pin Settings
A0 Pin Connection A1 A0
VDD 0 0
NC 1 0
GND 1 1
The 2-wire serial bus protocol operates as follows:
The master initiates data transfer by establishing a start
1.
condition when a high-to-low transition on the SDA line
occurs while SCL is high. The following byte is the address
byte, which consists of the 7-bit slave address. The slave
SCL
The I2C-Bus Specification, Version 2.1,
2
C bus as a slave
1991
address corresponding to the transmitted address responds
by pulling SDA low during the ninth clock pulse (this is
termed the acknowledge bit). At this stage, all other devices
on the bus remain idle while the selected device waits for
data to be written to or read from its shift register.
Data is transmitted over the serial bus in sequences of nine
2.
clock pulses (eight data bits followed by an acknowledge
bit). The transitions on the SDA line must occur during
the low period of SCL and remain stable during the high
period of SCL.
When all data bits have been read or written, a stop
3.
condition is established. In write mode, the master pulls
th
the SDA line high during the 10
clock pulse to establish
a stop condition. In read mode, the master issues a no
acknowledge for the ninth clock pulse (that is, the SDA
line remains high). The master brings the SDA line low
th
before the 10
clock pulse and then high during the 10th
clock pulse to establish a stop condition.
WRITE OPERATION
When writing to the AD5629R/AD5669R, the user must begin
W
with a start command followed by an address byte (R/
= 0),
after which the DAC acknowledges that it is prepared to receive
data by pulling SDA low. The AD5629R/AD5669R require two
bytes of data for the DAC and a command byte that controls
various DAC functions. Three bytes of data must, therefore, be
written to the DAC, the command byte followed by the most
significant data byte and the least significant data byte, as shown in
Figure 50
. After these data bytes are acknowledged by the
AD5629R/AD5669R, a stop condition follows.
READ OPERATION
When reading data back from the AD5629R/AD5669R, the
user begins with a start command followed by an address byte
W
= 1), after which the DAC acknowledges that it is prepared
(R/
to transmit data by pulling SDA low. Two bytes of data are then
read from the DAC, which are both acknowledged by the master as
shown in . A stop condition follows. Figure 51
SDA
START BY
MASTER
SCL
CONTINUED)
SDA
(CONTINUED)
191
DB15 DB14 DB13 DB12 DB11 DB10 DB9
FRAME 1
SLAVE ADDRESS
MOST SIGNIFICANT
FRAME 3
DATA BYTE
R/W
ACK. BY
AD5629R/AD5669R
Figure 50. I
DB23A0A111010DB22 DB21 DB20 DB19 DB18 DB17 DB16
FRAME 2
COMMAND BYTE
DB8
ACK. BY
AD5629R/AD5669R
Rev. A | Page 21 of 28
DB7 DB6 DB5 DB4 DB3 DB2 DB1 DB0
FRAME 4
LEAST SIGNIFICANT
2
C Write Operation
DATA BYTE
ACK. BY
AD5629R/AD5669R
9
ACK. BY
AD5629R/AD5669R
STOP BY
MASTER
08819-048
AD5629R/AD5669R
(
SCL
SDA
CONTINUED)
(CONTINUED)
1991
START BY
MASTER
SCL
SDA
191
DB15 DB14 DB13 DB12 DB11 DB10 DB9
FRAME 1
SLAVE ADDRESS
MOST SIGNIFICANT
FRAME 3
DATA BYTE
R/W
AD5629R/AD5669R
Figure 51. I
Table 8. Command Definitions
Command
C3 C2 C1 C0 Description
0 0 0 0 Write to Input Register n
0 0 0 1 Update DAC Register n
0 0 1 0
Write to Input Register n; update all
(software LDAC)
0 0 1 1 Write to and update DAC Channel n
0 1 0 0 Power down/power up DAC
0 1 0 1 Load clear code register
0 1 1 0
0 0 0 0 DAC A
0 0 0 1 DAC B
0 0 1 0 DAC C
0 0 1 1 DAC D
0 1 0 0 DAC E
0 1 0 1 DAC F
0 1 1 0 DAC G
0 1 1 1 DAC H
1 1 1 1 All DACs
ACK. BY
DB8
DB23A0A111010DB22 DB21 DB20 DB19 DB18 DB17 DB16
FRAME 2
COMMAND BYTE
DB7 DB6 DB5 DB4 DB3 DB2 DB1 DB0
ACK. BY
MASTER
2
C Read Operation
FRAME 4
LEAST SI GNIFICANT
DATA BYT E
INPUT SHIFT REGISTER
The input shift register is 24 bits wide. Data is loaded into the
device as a 24-bit word under the control of a serial clock input,
SCL. The input register contents for this operation is shown in
Figure 52 and Figure 53. The eight MSBs make up the command
byte. DB23 to DB20 are the command bits, C3, C2, C1, and C0,
that control the mode of operation of the device (see Ta b le 9 for
details). The last four bits of the first byte are the address bits,
A3, A2, A1, and A0, (see Tab l e 9 for details). The rest of the bits
are the 16-/12-bit data-word.
The AD5669R data-word comprises the 16-bit input code (see
Figure 52) while the AD5629R data word is comprised of 12bits followed by four don’t cares (see Figure 53).
MULTIPLE BYTE OPERATION
Multiple byte operation is supported on the AD5629R/ AD5669R.
Command 1001 is reserved for multiple byte operation (see
Tabl e 8 ) A 2-byte operation is useful for applications that
require fast DAC updating and do not need to change the
command byte. The S bit (DB22) in the command register
can be set to 1 for the 2-byte mode of operation. For standard
3-byte and 4-byte operation, the S bit (DB22) in the command
byte should be set to 0.
ACK. BY
MASTER
9
STOP BY
NO ACK.
MASTER
08819-049
Rev. A | Page 22 of 28
AD5629R/AD5669R
INTERNAL REFERENCE REGISTER
The internal reference is available on all versions. The on-board
reference is off at power-up by default. The on-board reference
can be turned off or on by a user-programmable internal REF
register by setting Bit DB0 high or low (see Tabl e 1 0 ). DB1
selects the internal reference value. Command 1000 is reserved
for setting the internal REF register (see Tab le 8 ). Tab l e 1 1
shows how the state of the bits in the input shift register
corresponds to the mode of operation of the device.
The AD5629R/AD5669R contain a power-on reset circuit that
controls the output voltage during power-up. The AD5629R/
AD5669R DAC output powers up to 0 V and the AD5669R-3
DAC output powers up to midscale. The output remains
powered up at this level until a valid write sequence is made
to the DAC. This is useful in applications where it is important
to know the state of the output of the DAC while it is in the
process of powering up. There is also a software executable
reset function that resets the DAC to the power-on reset code.
Command 0111 is reserved for this reset function (see Ta b le 8 ).
Any events on
ignored.
The AD5629R/AD5669R contain four separate modes of
operation. Command 0100 is reserved for the power-down
function (see Tabl e 8 ). These modes are software-programmable
by setting two bits, Bit DB9 and Bit DB8, in the control register.
Tabl e 1 2 shows how the state of the bits corresponds to the
mode of operation of the device. Any or all DACs (DAC H to
DAC A) can be powered down to the selected mode by setting
the corresponding eight bits (DB7 to DB0) to 1. See Tab l e 1 3 for
the contents of the input shift register during power-down/powerup operation.
When both bits are set to 0, the part works normally with its
normal power consumption of 1.3 mA at 5 V. However, for the
three power-down modes, the supply current falls to 0.4 μA at
5 V (0.2 μA at 3 V). Not only does the supply current fall, but
the output stage is also internally switched from the output of
the amplifier to a resistor network of known values. This has the
advantage that the output impedance of the part is known while
the part is in power-down mode. There are three different
options. The output is connected internally to GND through
either a 1 kΩ or a 100 kΩ resistor, or it is left open-circuited
(three-state). The output stage is illustrated in Figure 54.
RESISTOR
STRING DAC
Figure 54. Output Stage During Power-Down
AMPLIFIER
POWER-DOWN
CIRCUITRY
RESISTOR
NETWORK
V
OUT
08819-051
The bias generator of the selected DAC(s), output amplifier,
resistor string, and other associated linear circuitry is shut down
when the power-down mode is activated. The internal reference
is powered down only when all channels are powered down.
However, the contents of the DAC register are unaffected when
in power-down. The time to exit power-down is typically 4 μs
= 5 V and for VDD = 3 V.
for V
DD
Any combination of DACs can be powered up by setting PD1
and PD0 to 0 (normal operation). The output powers up to the
LDAC
value in the input register (
DAC register before powering down (
low) or to the value in the
LDAC
high).
CLEAR CODE REGISTER
The AD5629R/AD5669R have a hardware
is an asynchronous clear input. The
sensitive. Bringing the
CLR
line low clears the contents of the
input register and the DAC registers to the data contained in
CLR
the user-configurable
register and sets the analog outputs
accordingly. This function can be used in system calibration to load
zero scale, midscale, or full scale to all channels together. These
clear code values are user-programmable by setting two bits, Bit
CLR
DB1 and Bit DB0, in the
control register (see ).
The default setting clears the outputs to 0 V. Command 0101
is reserved for loading the clear code register (see ).
The part exits clear code mode at the end of the next valid write
CLR
to the part. If
is activated during a write sequence, the write
is aborted.
CLR
The
pulse activation time (the falling edge of
the output starts to change) is typically 280 ns. However, if
outside the DAC linear region, it typically takes 520 ns after
executing
CLR
for the output to start changing (see ). Figure 43
See Tab le 1 4 for the contents of the input shift register during
the loading clear code register operation.
CLR
pin that
CLR
input is falling edge
Tabl e 1 5
Table 8
CLR
to when
Table 10. Internal Reference Register
Internal REF Register (DB0)Action
0 Reference off (default)
1 Reference on
Command bits (C3 to C0) Address bits (A3 to A0)—don’t cares Don’t cares Clear code register
Table 15. Clear Code Register
Clear Code Register
DB1 DB0
CR1 CR0 Clears to Code
0 0 0x0000
0 1 0x8000
1 0 0xFFFF
1 1 No operation
Don’t cares Power-
down mode
Power-down/power-up channel selection—
set bit to 1 to select
LSB
Rev. A | Page 25 of 28
AD5629R/AD5669R
LDAC FUNCTION
The outputs of all DACs can be updated simultaneously using
LDAC
the hardware
Synchronous
The DAC registers are updated after new data is read in.
can be permanently low or pulsed as in . Figure 2
Asynchronous
The outputs are not updated at the same time that the input
registers are written to. When
registers are updated with the contents of the input register.
Alternatively, the outputs of all DACs can be updated simultaneously using the software
Register n and updating all DAC registers. Command 0011 is
reserved for this software
LDAC
An
register gives the user extra flexibility and control
over the hardware
to 0 for a DAC channel means that this channel’s update is
controlled by the
updates synchronously; that is, the DAC register is updated
after new data is read, regardless of the state of the
It effectively sees the
LDAC
for the
This flexibility is useful in applications where the user wants
to simultaneously update select channels while the rest of the
channels are synchronously updating. Writing to the DAC
using command 0110 loads the 8-bit
DB0). The default for each channel is 0, that is, the
works normally. Setting the bits to 1 means the DAC channel
is updated regardless of the state of the
for the contents of the input shift register during the load
register mode of operation.
pin.
LDAC
LDAC
LDAC
goes low, the DAC
LDAC
function by writing to Input
LDAC
function.
LDAC
pin. Setting the
pin. If this bit is set to 1, this channel
LDAC
LDAC
pin as being tied low. See
register mode of operation.
LDAC
LDAC
LDAC
bit register
LDAC
Tabl e 1 6
register (DB7 to
LDAC
pin. See
Table 1 7
LDAC
pin.
pin
LDAC
POWER SUPPLY BYPASSING AND GROUNDING
When accuracy is important in a circuit, it is helpful to carefully
consider the power supply and ground return layout on the board.
The printed circuit board containing the AD5629R/AD5669R
should have separate analog and digital sections. If the AD5629R/
AD5669R are in a system where other devices require an
AGND-to-DGND connection, the connection should be made
at one point only. This ground point should be as close as
possible to the AD5629R/AD5669R.
The power supply to the AD5629R/AD5669R should be
bypassed with 10 μF and 0.1 μF capacitors. The capacitors
should be as physically close as possible to the device, with the
0.1 μF capacitor ideally right up against the device. The 10 μF
capacitors are the tantalum bead type. It is important that the
0.1 μF capacitor have low effective series resistance (ESR) and
low effective series inductance (ESI), such as is typical of
common ceramic types of capacitors. This 0.1 μF capacitor
provides a low impedance path to ground for high frequencies
caused by transient currents due to internal logic switching.
The power supply line should have as large a trace as possible to
provide a low impedance path and reduce glitch effects on the
supply line. Clocks and other fast switching digital signals should
be shielded from other parts of the board by digital ground. Avoid
crossover of digital and analog signals if possible. When traces
cross on opposite sides of the board, ensure that they run at right
angles to each other to reduce feedthrough effects through the
board. The best board layout technique is the microstrip technique,
where the component side of the board is dedicated to the ground
plane only and the signal traces are placed on the solder side.
However, this is not always possible with a 2-layer board.
Table 16.
LDAC
0 1/0
1 X—don’t care
Table 17. 32-Bit Input Shift Register Contents for
MSB LSB
DB23 DB22 DB21 DB20 DB19 DB18 DB17 DB16
0 1 1 0 X X X X X DAC H DAC G DAC F DAC E DAC D DAC C DAC B DAC A
LDAC
Register
Load DAC Register
Bits (DB7 to DB0)
LDAC
Pin
Operation
LDAC
Determined by LDAC
DAC channels update, overriding the LDAC
LDAC
Command bits (C3 to C0) Address bits (A3 to A0)—
don’t cares
pin.
pin. DAC channels see LDAC as 0.
Register Function
DB15
to DB8 DB7 DB6 DB5 DB4 DB3 DB2 DB1 DB0
Don’t
cares
Setting
LDAC
bit to 1 overrides
LDAC
pin
Rev. A | Page 26 of 28
AD5629R/AD5669R
S
OUTLINE DIMENSIONS
PIN 1
INDICATOR
0.80
0.75
0.70
EATING
PLANE
4.10
4.00 SQ
3.90
0.65
BSC
0.45
0.40
0.35
0.05 MAX
0.02 NOM
0.20 REF
0.35
0.30
0.25
13
12
9
8
BOTTOM VIEWTOP VIEW
COPLANARITY
0.08
N
1
P
I
D
C
I
N
I
16
EXPOSED
1
PAD
4
5
FOR PROPER CONNECTION OF
THE EXPOSED PAD, REFER TO
THE PIN CONFIGURATION AND
FUNCTION DESCRIPTIONS
SECTION OF THIS DATA SHEET.
2.70
2.60 SQ
2.50
0.20 MIN
R
O
A
T
COMPLIANT
TO
JEDEC STANDARDS MO-220-WGGC.
08-16-2010-C
Figure 55. 16-Lead Lead Frame Chip Scale Package [LFCSP_WQ]
4 mm × 4 mm Body, Very Very Thin Quad
(CP-16-17)
Dimensions shown in millimeters
5.10
5.00
4.90
0.15
0.05
4.50
4.40
4.30
PIN 1
16
0.65
BSC
COPLANARITY
COMPLIANT TO JEDEC S T ANDARDS MO-153-AB
0.10
0.30
0.19
9
81
1.20
MAX
SEATING
PLANE
6.40
BSC
0.20
0.09
8°
0°
0.75
0.60
0.45
Figure 56. 16-Lead Thin Shrink Small Outline Package [TSSOP]
(RU-16)
Dimensions shown in millimeters
Rev. A | Page 27 of 28
AD5629R/AD5669R
ORDERING GUIDE
Package
Model1 Temperature Range Package Description
AD5629RARUZ-1 −40°C to +105°C 16-Lead TSSOP RU-16 Zero ±4 LSB INL 1.25 V
AD5629RARUZ-1-RL7 −40°C to +105°C 16-Lead TSSOP RU-16 Zero ±4 LSB INL 1.25 V
AD5629RBRUZ-2 −40°C to +105°C 16-Lead TSSOP RU-16 Zero ±1 LSB INL 2.5 V
AD5629RBRUZ-2-RL7 −40°C to +105°C 16-Lead TSSOP RU-16 Zero ±1 LSB INL 2.5 V
AD5629RACPZ-2-RL7 −40°C to +105°C 16-Lead LFCSP_WQ CP-16-17 Zero ±4 LSB INL 2.5 V
AD5629RACPZ-3-RL7 −40°C to +105°C 16-Lead LFCSP_WQ CP-16-17 Midscale ±4 LSB INL 2.5 V
AD5629RBCPZ-1-RL7 −40°C to +105°C 16-Lead LFCSP_WQ CP-16-17 Zero ±1 LSB INL 1.25 V
AD5629RBCPZ-2-RL7 −40°C to +105°C 16-Lead LFCSP_WQ CP-16-17 Zero ±1 LSB INL 2.5 V
AD5669RARUZ-1 −40°C to +105°C 16-Lead TSSOP RU-16 Zero ±32 LSB INL 1.25 V
AD5669RARUZ-1-RL7 −40°C to +105°C 16-Lead TSSOP RU-16 Zero ±32 LSB INL 1.25 V
AD5669RBRUZ-2 −40°C to +105°C 16-Lead TSSOP RU-16 Zero ±16 LSB INL 2.5 V
AD5669RBRUZ-2-RL7 −40°C to +105°C 16-Lead TSSOP RU-16 Zero ±16 LSB INL 2.5 V
AD5669RACPZ-2-RL7 −40°C to +105°C 16-Lead LFCSP_WQ CP-16-17 Zero ±32 LSB INL 2.5 V
AD5669RACPZ-3-RL7 −40°C to +105°C 16-Lead LFCSP_WQ CP-16-17 Midscale ±32 LSB INL 2.5 V
AD5669RBCPZ-1-RL7 −40°C to +105°C 16-Lead LFCSP_WQ CP-16-17 Zero ±16 LSB INL 1.25 V
AD5669RBCPZ-2-RL7 −40°C to +105°C 16-Lead LFCSP_WQ CP-16-17 Zero ±16 LSB INL 2.5 V
AD5669RBCPZ-1500R7 −40°C to +105°C 16-Lead LFCSP_WQ CP-16-17 Zero ±16 LSB INL 1.25 V
AD5669RBCPZ-2500R7 −40°C to +105°C 16-Lead LFCSP_WQ CP-16-17 Zero ±16 LSB INL 2.5 V
EVAL-AD5629REBRZ Evaluation Board
EVAL-AD5669REBRZ Evaluation Board
1
Z = RoHS Compliant Part.
Option
Power-On
Reset to Code Accuracy
Internal
Reference
I2C refers to a communications protocol originally developed by Philips Semiconductors (now NXP Semiconductors).