AD5669R: 16 bits
16-lead LFCSP and 16-lead TSSOP
On-chip 1.25 V/2.5 V, 5 ppm/°C reference
Power down to 400 nA at 5 V, 200 nA at 3 V
2.7 V to 5.5 V power supply
Guaranteed monotonic by design
Power-on reset to zero scale or midscale
3 power-down functions
Hardware
2
I
C-compatible serial interface supports standard (100 kHz)
LDAC
and fast (400 kHz) modes
APPLICATIONS
Process control
Data acquisition systems
Portable battery-powered instruments
Digital gain and offset adjustment
Programmable voltage and current sources
GENERAL DESCRIPTION
The AD5629R/AD5669R devices are low power, octal, 12-/16bit, buffered voltage-output DACs. All devices are guaranteed
monotonic by design.
The AD5629R/AD5669R have an on-chip reference with an
internal gain of 2. The AD5629R-1/AD5669R-1 have a 1.25 V,
5 ppm/°C reference, giving a full-scale output range of 2.5 V.
The AD5629R-2/AD5629R-3 and the AD5669R-2/AD5669R-3
have a 2.5 V 5 ppm/°C reference, giving a full-scale output range
of 5 V depending on the option selected. Devices with 1.25 V
reference selected operate from a single 2.7 V to 5.5 V supply.
Devices with 2.5 V reference selected operate from 4.5 V to 5.5 V.
The on-chip reference is off at power-up, allowing the use of an
external reference. The internal reference is enabled via a
software write.
and
CLR
functions
with 5 ppm/°C On-Chip Reference
AD5629R/AD5669R
FUNCTIONAL BLOCK DIAGRAM
DD
AD5629R/AD5669R
SCL
SD
LDAC
INTERFACE LOGIC
A0
LDAC
CLRGND
INPUT
REGISTER
INPUT
REGISTER
INPUT
REGISTER
INPUT
REGISTER
INPUT
REGISTER
INPUT
REGISTER
INPUT
REGISTER
INPUT
REGISTER
POWER-ON RESETPOWER-DOWN LOGIC
DAC
REGISTER
DAC
REGISTER
DAC
REGISTER
DAC
REGISTER
DAC
REGISTER
DAC
REGISTER
DAC
REGISTER
DAC
REGISTER
Figure 1.
The parts incorporate a power-on reset circuit to ensure that the
DAC output powers up to 0 V (AD5629R-1/AD5629R-2,
AD5669R-1/AD5669R-2) or midscale (AD5629R-3/AD5669R-3)
and remains powered up at this level until a valid write takes
place. The part contains a power-down feature that reduces the
current consumption of the device to 400 nA at 5 V and
provides software-selectable output loads while in power-down
mode for any or all DAC channels.
PRODUCT HIGHLIGHTS
1. Octal, 12-/16-bit DACs.
2. On-chip 1.25 V/2.5 V, 5 ppm/°C reference.
3. Available in 16-lead LFCSP and TSSOP.
4. Power-on reset to 0 V or midscale.
5. Power-down capability. When powered down, the DAC
typically consumes 200 nA at 3 V and 400 nA at 5 V.
REFIN
STRING
STRING
STRING
STRING
STRING
STRING
STRING
STRING
V
REFOUT
1.25V/2.5V REF
DAC A
DAC B
DAC C
DAC D
DAC E
DAC F
DAC G
DAC H
BUFFER
BUFFER
BUFFER
BUFFER
BUFFER
BUFFER
BUFFER
BUFFER
V
OUT
V
OUT
V
OUT
V
OUT
V
OUT
V
OUT
V
OUT
V
OUT
A
B
C
D
E
F
G
H
08819-001
Rev. A
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Anal og Devices for its use, nor for any infringements of patents or ot her
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarks and registered trademarks are the property of their respective owners.
Zero-Code Error 6 19 6 19 mV All 0s loaded to DAC register (see Figure 18)
Zero-Code Error Drift ±2 ±2 µV/°C
Full-Scale Error −0.2 −1 −0.2 −1 % FSR All 1s loaded to DAC register (see Figure 19)
Gain Error ±1 ±1 % FSR
Gain Temperature Coefficient ±2.5 ±2.5 ppm Of FSR/°C
Offset Error ±6 ±19 ±6 ±19 mV
DC Power Supply Rejection
–80 –80 dB V
Ratio
DC Crosstalk
10 10 µV
(External Reference)
5 5 µV/mA Due to load current change
10 10 µV Due to powering down (per channel)
DC Crosstalk
25 25 µV
(Internal Reference)
10 10 µV/mA Due to load current change
OUTPUT CHARACTERISTICS3
Output Voltage Range 0 VDD 0 VDD V
Capacitive Load Stability 2 2 nF RL = ∞
10 10 nF RL = 2 kΩ
DC Output Impedance 0.5 0.5 Ω
Short-Circuit Current 30 30 mA VDD = 5 V
Power-Up Time 4 4 µs Coming out of power-down mode, VDD = 5 V
REFERENCE INPUTS
Reference Current 40 50 40 50 µA V
Reference Input Range 0 VDD 0 VDD V
Reference Input Impedance 14.6 14.6 kΩ
REFERENCE OUTPUT (1.25 V)
Output Voltage 1.247 1.253 1.247 1.253 µA TA = 25°C
Reference Input Range
±15
Output Impedance 7.5 7.5 kΩ
REFERENCE OUTPUT (2.5 V)
Output Voltage 2.495 2.505 2.495 2.505 µA TA = 25°C
Reference Input Range
±15
Output Impedance 7.5 7.5 kΩ
= VDD. All specifications T
REFIN
±5 ±15
±5 ±10
ppm/°C
ppm/°C
MIN
to T
, unless otherwise noted.
MAX
Guaranteed monotonic by design
(see Figure 8)
Guaranteed monotonic by design
(see Figure 7)
± 10%
DD
Due to full-scale output change,
R
= 2 kΩ to GND or VDD
L
Due to full-scale output change,
= 2 kΩ to GND or VDD
R
L
= VDD = 5.5 V (per DAC channel)
REFIN
Rev. A | Page 3 of 28
AD5629R/AD5669R
A Grade1 B Grade1
Parameter Min Typ Max Min Typ Max Unit Test Conditions/Comments
LOGIC INPUTS3
Input Current ±3 ±3 µA All digital inputs
Input Low Voltage, V
Input High Voltage, V
Pin Capacitance 3 3 pF
POWER REQUIREMENTS
VDD 4.5 5.5 4.5 5.5 V
IDD (Normal Mode)4 VIH = VDD and VIL = GND
VDD = 4.5 V to 5.5 V 1.3 1.8 1.3 1.8 mA Internal reference off
2 2.5 2 2.5 mA Internal reference on
IDD (All Power-Down Modes)5
VDD = 4.5 V to 5.5 V 0.4 1 0.4 1 µA VIH = VDD and VIL = GND
1
Temperature range is −40°C to +105°C, typical at 25°C.
2
Linearity calculated using a reduced code range of the AD5629R (Code 32 to Code 4064) and the AD5669R (Code 512 to 65,024). Output unloaded.
3
Guaranteed by design and characterization; not production tested.
4
Interface inactive. All DACs active. DAC outputs unloaded.
5
All eight DACs powered down.
0.8 0.8 V VDD = 5 V
INL
2 2 V VDD = 5 V
INH
All digital inputs at 0 or V
DAC active, excludes load current
,
DD
Rev. A | Page 4 of 28
AD5629R/AD5669R
VDD = 2.7 V to 3.6 V, RL = 2 kΩ to GND, CL = 200 pF to GND, V
Table 2.
A Grade1 B Grade1
Parameter Min Typ Max Min Typ Max Unit Conditions/Comments
STATIC PERFORMANCE
2
AD5629R
Resolution 12 12 Bits
Relative Accuracy ±0.5 ±4 ±0.5 ±1 LSB See Figure 6
Differential Nonlinearity ±0.25 ±0.25 LSB Guaranteed monotonic by design (see Figure 8)
AD5669R
Resolution 16 16 Bits
Relative Accuracy ±8 ±32 ±8 ±16 LSB See Figure 5
Differential Nonlinearity ±1 ±1 LSB Guaranteed monotonic by design (see Figure 7)
Zero-Code Error 6 19 6 19 mV All 0s loaded to DAC register (see Figure 18)
Zero-Code Error Drift ±2 ±2 µV/°C
Full-Scale Error −0.2 −1 −0.2 −1 % FSR All 1s loaded to DAC register (see Figure 19)
Gain Error ±1 ±1 % FSR
Gain Temperature Coefficient ±2.5 ±2.5 ppm Of FSR/°C
Offset Error ±6 ±19 ±6 ±19 mV
DC Power Supply Rejection
–80 –80 dB V
Ratio
DC Crosstalk
10 10 µV
(External Reference)
5 5 µV/mA Due to load current change
10 10 µV Due to powering down (per channel)
DC Crosstalk
25 25 µV
(Internal Reference)
10 10 µV/mA Due to load current change
OUTPUT CHARACTERISTICS3
Output Voltage Range 0 VDD 0 VDD V
Capacitive Load Stability 2 2 nF RL = ∞
10 10 nF RL = 2 kΩ
DC Output Impedance 0.5 0.5 Ω
Short-Circuit Current 30 30 mA VDD = 3 V
Power-Up Time 4 4 µs Coming out of power-down mode, VDD = 3 V
REFERENCE INPUTS
Reference Current 40 50 40 50 µA V
Reference Input Range 0 VDD 0 VDD
Reference Input Impedance 14.6 14.6 kΩ
REFERENCE OUTPUT
Output Voltage
AD5629R/AD5669R 1.247 1.253 1.247 1.253 V TA = 25°C
Reference Tempco3 ±15 ±5 ±15 ppm/°C
Reference Output Impedance 7.5 7.5 kΩ
LOGIC INPUTS3
Input Current ±3 ±3 µA All digital inputs
Input Low Voltage, V
Input High Voltage, V
0.8 0.8 V VDD = 3 V
INL
2 2 V VDD = 3 V
INH
Pin Capacitance 3 3 pF
= VDD. All specifications T
REFIN
MIN
± 10%
DD
to T
, unless otherwise noted.
MAX
Due to full-scale output change,
R
= 2 kΩ to GND or VDD
L
Due to full-scale output change,
= 2 kΩ to GND or VDD
R
L
= VDD = 3.6 V (per DAC channel)
REFIN
Rev. A | Page 5 of 28
AD5629R/AD5669R
A Grade1 B Grade1
Parameter Min Typ Max Min Typ Max Unit Conditions/Comments
POWER REQUIREMENTS
VDD 2.7 3.6 2.7 3.6 V
All digital inputs at 0 or V
DAC active, excludes load current
IDD (Normal Mode)4 V
= VDD and VIL = GND
IH
VDD = 2.7 V to 3.6 V 1.0 1.5 1.0 1.5 mA Internal reference off
1.8 2.25 1.7 2.25 mA Internal reference on
IDD (All Power-Down Modes)5
VDD = 2.7 V to 3.6 V 0.2 1 0.2 1 µA VIH = VDD and VIL = GND
1
Temperature range is −40°C to +105°C, typical at 25°C.
2
Linearity calculated using a reduced code range of the AD5629R (Code 32 to Code 4064) and the AD5669R (Code 512 to 65,024). Output unloaded.
3
Guaranteed by design and characterization; not production tested.
4
Interface inactive. All DACs active. DAC outputs unloaded.
5
All eight DACs powered down.
AC CHARACTERISTICS
VDD = 2.7 V to 5.5 V, RL = 2 kΩ to GND, CL = 200 pF to GND, V
= VDD. All specifications T
REFIN
MIN
to T
, unless otherwise noted.
MAX
,
DD
Table 3.
Parameter
1, 2
Min Typ Max Unit Conditions/Comments3
Output Voltage Settling Time 2.5 7 µs ¼ to ¾ scale settling to ±2 LSB
Slew Rate 1.2 V/µs
Digital-to-Analog Glitch Impulse 4 nV-s 1 LSB change around major carry (see Figure 34)
19 nV-s From Code 59904 to Code 59903
Digital Feedthrough 0.1 nV-s
Reference Feedthrough −90 dB V
= 2 V ± 0.1 V p-p, frequency = 10 Hz to 20 MHz
REFIN
Digital Crosstalk 0.2 nV-s
Analog Crosstalk 0.4 nV-s
DAC-to-DAC Crosstalk 0.8 nV-s
Multiplying Bandwidth 320 kHz V
Total Harmonic Distortion −80 dB V
Guaranteed by design and characterization; not production tested.
2
See the Terminology section.
3
Temperature range is −40°C to +105°C, typical at 25°C.
Rev. A | Page 6 of 28
AD5629R/AD5669R
I2C TIMING CHARACTERISTICS
VDD = 2.7 V to 5.5 V; all specifications T
Table 4.
Parameter Conditions Min Max Unit Description
1
f
Standard mode 100 kHz Serial clock frequency
SCL
Fast mode 400 kHz
t1 Standard mode 4 s t
Fast mode 0.6 s
t2 Standard mode 4.7 s t
Fast mode 1.3 s
t3 Standard mode 250 ns t
Fast mode 100 ns
t4 Standard mode 0 3.45 s t
Fast mode 0 0.9 s
t5 Standard mode 4.7 s t
Fast mode 0.6 s
t6 Standard mode 4 s t
Fast mode 0.6 s
t7 Standard mode 4.7 s t
Fast mode 1.3 s
t8 Standard mode 4 s t
Fast mode 0.6 s
t9 Standard mode 1000 ns t
Fast mode 300 ns
t10 Standard mode 300 ns t
Fast mode 300 ns
t11 Standard mode 1000 ns t
Fast mode 300 ns
t
Standard mode 1000 ns
11A
Fast mode 300 ns
t12 Standard mode 300 ns t
Fast mode 300 ns
t13 Standard mode 10 ns
Fast mode 10 ns
t14 Standard mode 300 ns
Fast mode 300 ns
t15 Standard mode 20 ns
Fast mode 20 ns
2
t
Fast mode 0 50 ns Pulse width of spike suppressed
SP
1
The SDA and SCL timing is measured with the input filters enabled. Switching off the input filters improves the transfer rate but has a negative effect on the EMC
behavior of the part.
2
Input filtering on the SCL and SDA inputs suppresses noise spikes that are less than 50 ns for fast mode or less than 10 ns for high speed mode.
MIN
to T
, f
= 400 kHz, unless otherwise noted.
MAX
SCL
HIGH
LOW
SU;DAT
HD;DAT
SU;STA
HD;STA
BUF
SU;STO
RDA
FDA
RCL
t
RCL1
after an acknowledge bit
FCL
LDAC
Falling edge of ninth SCL clock pulse of last byte of a valid write to
the LDAC falling edge
CLR
, SCL high time
, SCL low time
, data setup time
, data hold time
, setup time for a repeated start condition
, hold time (repeated) start condition
, bus-free time between a stop and a start condition
, setup time for a stop condition
, rise time of SDA signal
, fall time of SDA signal
, rise time of SCL signal
, rise time of SCL signal after a repeated start condition and
, fall time of SCL signal
pulse width low
pulse width low
Rev. A | Page 7 of 28
AD5629R/AD5669R
t
t
SCL
SDA
t
7
PSSP
LDAC*
CLR
*ASYNCHRONOUS LDAC UPDAT E MODE.
2
t
6
11
t
4
t
12
t
1
t
3
t
15
t
6
t
5
t
10
t
8
t
14
t
9
t
13
08819-002
Figure 2. Serial Write Operation
Rev. A | Page 8 of 28
AD5629R/AD5669R
ABSOLUTE MAXIMUM RATINGS
T
= 25°C, unless otherwise noted.
A
Table 5.
Parameter Rating
VDD to GND −0.3 V to +7 V
Digital Input Voltage to GND −0.3 V to VDD + 0.3 V
V
to GND −0.3 V to VDD + 0.3 V
OUT
V
REFIN/VREFOUT
Operating Temperature Range
Industrial −40°C to +105°C
Storage Temperature Range −65°C to +150°C
Junction Temperature (TJ
Power Dissipation (TJ
Thermal Impedance, θJA
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
ESD CAUTION
Rev. A | Page 9 of 28
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