Protected by U.S. Patent No. 5,969,657 and 6,823,416; other patents pending.
DAC
REG
0–1
DAC
REG
2
DAC
REG
5
DAC
REG
6–7
Figure 1.
14
14
14
14
×4
/
/
/
/
DAC 0–1
DAC 2
DAC 5
DAC 6–7
V
REF
2(+) V
2(–) REFGND A2
REF
VOUT 0
VOUT 1
VOUT 2
VOUT 3
VOUT 4
VOUT 5
VOUT 6
VOUT 7
VOUT 8
VOUT 31
05292-001
Rev. PrA
Information furnished by Analog Devices is believed to be accurate and reliable.
However, no responsibility is assumed by Analog Devices for its use, nor for any
infringements of patents or other rights of third parties that may result from its use.
Specifications subject to change without notice. No license is granted by implication
or otherwise under any patent or patent rights of Analog Devices. Trademarks and
registered trademarks are the property of their respective owners.
The AD5378 contains 32 14-bit DACs in one CSPBGA package.
The AD5378 provides a bipolar output range determined by the
voltages applied to the V
(+) and V
REF
(−) inputs. The maximum
REF
output voltage span is 17.5 V, corresponding to a bipolar output
range of −8.75 V to +8.75 V, and is achieved with reference voltages of V
The AD5378 guarantees operation over a wide V
(−) = −3.5 V and V
REF
(+) = +5 V.
REF
SS/VDD
supply
range from ±11.4 V to ±16.5 V. The output amplifier headroom
requirement is 2.5 V operating with a load current of 1.5 mA,
and 2 V operating with a load current of 0.5 mA.
The AD5378 contains a double-buffered parallel interface in
which 14 data bits are loaded into one of the input registers
under the control of the
WR, CS
, and DAC channel address
pins, A0 to A7. It also has a 3-wire serial interface, which is
compatible with SPI®, QSPI™, MICROWIRE™, and DSP interface standards and can handle clock speeds of up to 50 MHz.
Table 1. 40-Channel, Bipolar, Voltage Output DAC
Output
Model Resolution Analog Supplies
AD5379ABC 14 Bits ±11.4 V to ±16.5 V 40 ±3 108-Lead CSPBGA BC-108
Channels
Table 2. High Channel Count, Low Voltage, Single-Supply DACs
Output
Model Resolution AVDD Range
AD5380BST-5 14 Bits 4.5 V to 5.5 V 40 ±4 100-Lead LQFP ST-100
AD5380BST-3 14 Bits 2.7 V to 3.6 V 40 ±4 100-Lead LQFP ST-100
AD5381BST-5 12 Bits 4.5 V to 5.5 V 40 ±1 100-Lead LQFP ST-100
AD5381BST-3 12 Bits 2.7 V to 3.6 V 40 ±1 100-Lead LQFP ST-100
AD5384BBC-5 14 Bits 4.5 V to 5.5 V 40 ±4 100-Lead CSPBGA BC-100
AD5384BBC-3 14 Bits 2.7 V to 3.6 V 40 ±4 100-Lead CSPBGA BC-100
AD5382BST-5 14 Bits 4.5 V to 5.5 V 32 ±4 100-Lead LQFP ST-100
AD5382BST-3 14 Bits 2.7 V to 3.6 V 32 ±4 100-Lead LQFP ST-100
AD5383BST-5 12 Bits 4.5 V to 5.5 V 32 ±1 100-Lead LQFP ST-100
AD5383BST-3 12 Bits 2.7 V to 3.6 V 32 ±1 100-Lead LQFP ST-100
AD5390BST-5 14 Bits 4.5 V to 5.5 V 16 ±3 52-Lead LQFP ST-52
AD5390BCP-5 14 Bits 4.5 V to 5.5 V 16 ±3 64-Lead LFCSP CP-64
AD5390BST-3 14 Bits 2.7 V to 3.6 V 16 ±4 52-Lead LQFP ST-52
AD5390BCP-3 14 Bits 2.7 V to 3.6 V 16 ±4 64-Lead LFCSP CP-64
AD5391BST-5 12 Bits 4.5 V to 5.5 V 16 ±1 52-Lead LQFP ST-52
AD5391BCP-5 12 Bits 4.5 V to 5.5 V 16 ±1 64-Lead LFCSP CP-64
AD5391BST-3 12 Bits 2.7 V to 3.6 V 16 ±1 52-Lead LQFP ST-52
AD5391BCP-3 12 Bits 2.7 V to 3.6 V 16 ±1 64-Lead LFCSP CP-64
AD5392BST-5 14 Bits 4.5 V to 5.5 V 8 ±3 52-Lead LQFP ST-52
AD5392BCP-5 14 Bits 4.5 V to 5.5 V 8 ±3 64-Lead LFCSP CP-64
AD5392BST-3 14 Bits 2.7 V to 3.6 V 8 ±4 52-Lead LQFP ST-52
AD5392BCP-3 14 Bits 2.7 V to 3.6 V 8 ±4 64-Lead LFCSP CP-64
Channels
The DAC outputs are updated when the DAC registers receive
new data. All the outputs can be updated simultaneously by
taking the
LDAC
input low. Each channel has a programmable
gain and an offset adjust register.
Each DAC output is gained and buffered on-chip with respect
to an external REFGND input. The DAC outputs can also be
CLR
switched to REFGND via the
pin . Tab l e 1 a n d Ta b le 2
show the product portfolio for high channel count bipolar and
unipolar voltage output DACs.
Package
Linearity Error (LSB)
Linearity Error (LSB)
Description
Package
Description
Package Option
Package Option
Rev. PrA | Page 3 of 28
AD5378
SPECIFICATIONS
VCC = 2.7 V to 5.5 V; VDD = 11.4 V to 16.5 V; VSS = −11.4 V to −16.5 V; V
0 V; V
= 5 V; CL = 200 pF to GND; RL = 11 kΩ to 3 V; gain = 1; offset = 0 V; all specifications T
BIAS
Table 3.
Parameter A Version
1
Unit Test Conditions/Comments
ACCURACY
Resolution 14 Bits
Relative Accuracy ±3 LSB max −40°C to +85°C
±2.5 LSB max 0°C to 70°C
Differential Nonlinearity −1/+1.5 LSB max Guaranteed monotonic by design over temperature
Zero-Scale Error ±12 mV max −40°C to +85°C
±5 mV max 0°C to 70°C
Full-Scale Error ±12 mV max −40°C to +85°C
±8 mV max 0°C to 70°C
Gain Error ±8 mV max −40°C to +85°C
±1/±5 mV typ/max 0°C to 70°C
VOUT Temperature Coefficient 5 ppm FSR/°C typ Includes linearity, offset, and gain drift; see Figure 11
DC Crosstalk
2
0.5 mV max Typically 100 µV
REFERENCE INPUTS2
V
(+) DC Input Impedance 1 MΩ min Typically 100 MΩ
REF
V
(−) DC Input Impedance 8 kΩ min Typically 12 kΩ
REF
V
(+) Input Current ±10 µA max Per input; typically ±30 nA
REF
V
(+) Range 1.5/5 V min/max ±2% for specified operation
REF
V
(−) Range −3.5/0 V min/max ±2% for specified operation
REF
REFGND INPUTS2
DC Input Impedance 80 kΩ min Typically 120 kΩ
Input Range ±0.5 V min/max
OUTPUT CHARACTERISTICS2
Output Voltage Range VSS + 2/VSS + 2.5 V min I
V
− 2/VDD − 2.5 V max I
DD
Short-Circuit Current 15 mA max
Load Current ±1.5 mA max
Capacitive Load 2200 pF max
DC Output Impedance 1 Ω max
DIGITAL INPUTS JEDEC-compliant
Input High Voltage 1.7 V min VCC = 2.7 V to 3.6 V
2.0 V min V
Input Low Voltage 0.8 V max VCC = 2.7 V to 5.5 V
Input Current (with pull-up/pull-down) ±8 µA max
Input Current (no pull-up/pull-down) ±1 µA max All other digital input pins
Input Capacitance2 10 pF max
DIGITAL OUTPUTS (BUSY, SDO)
Output Low Voltage 0.5 V max Sinking 200 µA
Output High Voltage (SDO) VCC − 0.5 V min Sourcing 200 µA
High Impedance Leakage Current −70 µA max SDO only
High Impedance Output Capacitance2 10 pF typ
(+) = +5 V; V
REF
(−) = −3.5 V; AGND = DGND = REFGND =
REF
to T
MIN
= ±0.5 mA/±1.5 mA
LOAD
= ±0.5 mA/±1.5 mA
LOAD
= 3.6 V to 5.5 V
CC
PAR, FIFOEN, and RESET pins only
SER/
, unless otherwise noted.
MAX
Rev. PrA | Page 4 of 28
Preliminary Technical Data AD5378
Parameter A Version
1
Unit Test Conditions/Comments
POWER REQUIREMENTS
V
CC
V
DD
V
SS
2.7/5.5 V min/max
8.5/16.5 V min/max
−3/−16.5 V min/max
Power Supply Sensitivity2
∆ Full Scale/∆ V
∆ Full Scale/∆ V
∆ Full Scale/∆ V
I
CC
I
DD
I
SS
DD
SS
CC
−75 dB typ
−75 dB typ
−90 dB typ
5 mA max VCC = 5.5 V, VIH = VCC, VIL = GND
28 mA max Outputs unloaded; typically 20 mA
23 mA max Outputs unloaded; typically 15 mA
Power Dissipation
Power Dissipation Unloaded (P) 850 mW max VDD = 16.5 V, VSS = −16.5 V
Power Dissipation Loaded (P
Junction Temperature 130 °C max TJ = TA + P
) 2000 mW max P
TOTAL
= P + Σ(VDD − VO) × I
TOTAL
× θ
TOTAL
+ Σ(VO − VSS) × I
SOURCE
3
J
SINK
1
Temperature range for the A version: −40°C to +85°C. Typical specifications are at 25°C.
2
Guaranteed by design and characterization; not production tested.
3
Where θJ represents the package thermal impedance.
AC CHARACTERISTICS
VCC = 2.7 V to 5.5 V; VDD = 11.4 V to 16.5 V; VSS = −11.4 V to −16.5 V; V
AGND = DGND = REFGND = 0 V; V
= 5 V; CL = 220 pF; RL = 11 kΩ to 3 V; gain = 1; offset = 0 V.
BIAS
Table 4.
Parameter A Version
1
Unit Test Conditions/Comments
DYNAMIC PERFORMANCE
Output Voltage Settling Time 20 µs typ Full-scale change to ±1/2 LSB
30 µs max
Slew Rate 1 V/µs typ
Digital-to-Analog Glitch Energy 20 nV-s typ
Glitch Impulse Peak Amplitude 15 mV max
Channel-to-Channel Isolation 100 dB typ V
DAC-to-DAC Crosstalk 40 nV-s typ
10 nV-s typ Between DACs from different groups
Digital Crosstalk 0.1 nV-s typ
Digital Feedthrough 1 nV-s typ Effect of input bus activity on DAC output under test
Output Noise Spectral Density @ 1 kHz 350 nV/(Hz)
1
Guaranteed by design and characterization; not production tested.
(+) = +5 V; V
REF
1/2
typ V
(−) = −3.5 V;
REF
DAC latch contents alternately loaded with all 0s and
all 1s
(+) = 2 V p-p, (1 V
REF
) 1 kHz, V
BIAS
(−) = −1 V
REF
See the Terminology section; between DACs inside a
group
REF
(+) = V
(−) = 0 V
REF
Rev. PrA | Page 5 of 28
AD5378
TIMING CHARACTERISTICS
SERIAL INTERFACE
VCC = 2.7 V to 5.5 V; VDD = 11.4 V to 16.5 V; VSS = −11.4 V to −16.5 V; V
AGND = DGND = REFGND = 0 V; V
= 5 V, FIFOEN = 0 V; all specifications T
BIAS
Table 5.
Parameter
t
1
t
2
t
3
t
4
4
t
5
4
t
6
t
7
t
8
t
9
, 5
4
t
10
t
11
4
t
12
t
13
t
14
t
15
t
16
t
17
t
18
t
19
6, 7
t
20
7
t
21
7
t
22
t
237
5
t
30 ns min
24
t
25
t26
1, , 2 3
Limit at T
MIN
, T
MAX
Unit Description
20 ns min SCLK Cycle Time.
8 ns min SCLK High Time.
8 ns min SCLK Low Time.
10 ns min
15 ns min
25 ns min
10 ns min
5 ns min Data Setup Time.
4.5 ns min Data Hold Time.
30 ns max
330 ns max
20 ns min
20 ns min
150 ns typ
0 ns min
100 ns min
20/30 µs typ/max DAC Output Settling Time.
10 ns min
350 ns max
25 ns max SCLK Rising Edge to SDO Valid.
5 ns min
5 ns min
20 ns min
10 ns min
120 µs max
REF
SYNC Falling Edge to SCLK Falling Edge Setup Time.
24th SCLK Falling Edge to
Minimum
Minimum
24th SCLK Falling Edge to
BUSY Pulse Width Low (Single-Channel Update). See Table 11.
24th SCLK Falling Edge to
LDAC Pulse Width Low.
BUSY Rising Edge to DAC Output Response Time.
BUSY Rising Edge to LDAC Falling Edge.
LDAC Falling Edge to DAC Output Response Time.
SCLK Falling Edge to
SYNC Rising Edge to SCLK Rising Edge.
SYNC Rising Edge to LDAC Falling Edge.
SYNC Rising Edge to BUSY Falling Edge.
RESET Pulse Width Low.
RESET Time Indicated by BUSY Low.
(+) = +5 V; V
to T
MIN
SYNC Low Time.
SYNC High Time.
(−) = −3.5 V;
REF
, unless otherwise noted.
MAX
SYNC Falling Edge.
BUSY Falling Edge.
LDAC Falling Edge.
SYNC Rising Edge.
1
Guaranteed by design and characterization; not production tested.
2
All input signals are specified with tr = tf = 2 ns (10% to 90% of VCC) and timed from a voltage level of 1.2 V.
3
See and . Figure 4Figure 5
4
Standalone mode only.
5
This is measured with the load circuit of . Figure 2
6
This is measured with the load circuit of . Figure 3
7
Daisy-chain mode only.
V
CC
2.2kΩ
R
TO
OUTPUT
PIN
CL50pF
Figure 2. Load Circuit for
L
BUSY
Timing Diagram
V
OL
05292-002
OUTPUT
Rev. PrA | Page 6 of 28
I
OL
V
(min) + VOL(max)
OH
2
I
OH
TO
PIN
200µA
CL 50pF
200µA
Figure 3. Load Circuit for SDO Timing Diagram
(Serial Interface, Daisy- Chain Mode)
05292-003
Preliminary Technical Data AD5378
t
1
SCLK
SYNC
BUSY
LDAC
VOUT
LDAC
VOUT
DIN
122424
t
3
t
4
t
7
DB23DB0
1
1
2
2
t8t
t
6
9
t
18
t
2
t
5
t
10
t
12
t
11
t
13
t
17
t
14
t
15
t
13
t
t
17
16
CLR
t
19
VOUT
1
LDAC ACTIVE DURING BUSY.
2
LDAC ACTIVE AFTER BUSY.
t
25
RESET
VOUT
BUSY
t
19
t
26
05292-004
Figure 4. Serial Interface Timing Diagram (Standalone Mode)
Rev. PrA | Page 7 of 28
AD5378
t
1
SCLK
SYNC
DIN
SDO
LDAC
BUSY
t
t
7
t
4
t8t
INPUT WORD FOR DAC N
3
9
2448
t
2
D0D0'D23'D23
INPUT WORD FOR DAC N+1
t
20
D23D0
INPUT WORD FOR DAC NUNDEFINED
t
t
21
22
t13t
23
t
24
t
11
05292-005
Figure 5. Serial Interface Timing Diagram (Daisy-Chain Mode)
Rev. PrA | Page 8 of 28
Preliminary Technical Data AD5378
PARALLEL INTERFACE
VCC = 2.7 V to 5.5 V; VDD = 11.4 V to 16.5 V; VSS = −11.4 V to −16.5 V; AGND = DGND = DUTGND = 0 V; V
(−) = −3.5 V, FIFOEN = 0 V; all specifications T
V
REF
MIN
to T
, unless otherwise noted.
MAX
Table 6.
Parameter
t
0
t
1
t
2
t
3
t
4
t
5
t
6
t
7
t
8
t
9
4
t
10
4
t
11
t
12
t
13
t
14
4
t
15
t
16
t
17
t
18
t
19
t
20
t
21
t
22
t
23
1, , 2 3
Limit at T
4.5 ns min
4.5 ns min
10 ns min
10 ns min
0 ns min
0 ns min
4.5 ns min
4.5 ns min
20 ns min
240 ns min
0/30 ns min/max
330 ns max
0 ns min
30 ns min
20 ns min
150 ns typ
20 ns min
0 ns min
100 ns typ
MIN
to T
MAX
Unit Description
REG0, REG1, Address to
REG0, REG1, Address to
CS Pulse Width Low.
WR Pulse Width Low.
CS to WR Falling Edge Setup Time.
WR to CS Rising Edge Hold Time.
WR Rising Edge Setup Time.
Data to
WR Rising Edge Hold Time.
Data to
WR Pulse Width High.
Minimum
WR Cycle Time (Single-Channel Write).
WR Rising Edge to BUSY Falling Edge.
BUSY Pulse Width Low (Single-Channel Update). See Table 11.
BUSY Rising Edge to WR Rising Edge.
WR Rising Edge to LDAC Falling Edge.
LDAC Pulse Width Low.
BUSY Rising Edge to DAC Output Response Time.
LDAC Rising Edge to WR Rising Edge.
BUSY Rising Edge to LDAC Falling Edge.
LDAC Falling Edge to DAC Output Response Time.
WR Rising Edge Setup Time.
WR Rising Edge Hold Time.
20/30 µs typ/ max DAC Output Settling Time.
10 ns min
350 ns max
10 ns min
120 µs max
CLR Pulse Width Low.
CLR/RESET Pulse Activation Time.
RESET Pulse Width Low.
RESET Time Indicated by BUSY Low.
(+) = +5 V;
REF
1
Guaranteed by design and characterization; not production tested.
2
All input signals are specified with tr = tf = 2 ns (10% to 90% of VCC) and timed from a voltage level of 1.2 V.
3
See . Figure 6
4
Measured with load circuit in Figure 2.
Rev. PrA | Page 9 of 28
AD5378
t
t
0
REG0,
REG1,
A7–A02
CS
WR
DB12–DB0
BUSY
LDAC
VOUT
LDAC
VOUT
t
4
t
2
t
3
t
1
1
2
2
1
t
5
t
9
t
8
t
6
7
t
10
t
13
t
20
t
11
t
14
t
16
t
12
t
19
t
15
t
17
t
14
t
19
t
18
CLR
VOUT
RESET
VOUT
BUSY
1
LDAC ACTIVE DURING BUSY.
2
LDAC ACTIVE AFTER BUSY.
t
22
Figure 6. Parallel Interface Timing Diagram
t
21
t
21
t
23
05292-006
Rev. PrA | Page 10 of 28
Preliminary Technical Data AD5378
ABSOLUTE MAXIMUM RATINGS
TA = 25°C, unless otherwise noted.
Transient currents of up to 100 mA do not cause SCR latch-up.
Table 7.
Parameter Rating
VDD to AGND −0.3 V to +17 V
VSS to AGND −17 V to +0.3 V
VCC to DGND −0.3 V to +7 V
Digital Inputs to DGND −0.3 V to VCC + 0.3 V
Digital Outputs to DGND −0.3 V to VCC + 0.3 V
V
1(+), V
REF
V
1(−), V
REF
V
to AGND −0.3 V to +7 V
BIAS
VOUT0–VOUT31 to AGND VSS − 0.3 V to VDD + 0.3 V
REFGND to AGND VSS − 0.3 V to VDD + 0.3 V
AGND to DGND −0.3 V to +0.3 V
Operating Temperature Range (TA)
Industrial (A Version) −40°C to +85°C
Storage Temperature Range −65°C to +150°C
Junction Temperature (TJ max) 150°C
108-Lead CSPBGA Package
θJA Thermal Impedance 37.5°C/W
θJC Thermal Impedance 8.5°C/W
Reflow Soldering
Peak Temperature 230°C
Time at Peak Temperature 10 sec to 40 sec
2(+) to AGND −0.3 V to +7 V
REF
2(−) to AGND VSS − 0.3 V to VDD + 0.3 V
REF
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those listed in the operational sections
of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability. Only one absolute maximum rating may be
applied at any one time.
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on
the human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
Rev. PrA | Page 11 of 28
AD5378
PIN CONFIGURATION AND FUNCTION DESCRIPTIONS
123456789101112
A
B
C
D
E
F
G
H
J
K
L
M
123456789101112
AD5378
TOP VIEW
A
B
C
D
E
F
G
H
J
K
L
M
05292-007
Figure 7. Pin Configuration
Table 8. 108-Lead CSPBGA Ball Configuration
CSPBGA No. Ball Name
A1 REG0
A2 VCC3
A3 DB10
A4 AGND4
A5 V
BIAS
A6 VOUT5
A7 AGND3
A8 REFGNDA1
A9 V
A10 V
A11 V
A12 V
M4 AGND1
M5 VOUT13
M6 VOUT9
M7 REFGNDB1
M8 V
M9 V
M10 V
M11 V
1(+)
REF
1
SS
2
SS
2
DD
M12 REFGNDC1
Rev. PrA | Page 12 of 28
Preliminary Technical Data AD5378
Table 9. Pin Function Descriptions
Pin Description
VCC(1–3)
VSS(1–5)
VDD(1–5)
AGND(1–4) Ground for All Analog Circuitry. All AGND pins should be connected to the AGND plane.
DGND(1–4) Ground for All Digital Circuitry. All DGND pins should be connected to the DGND plane.
V
V
V
REF
REF
BIAS
1(+), V
2(+), V
1(−) Reference Inputs for DACs 0 to 5, 8 to 13, 16 to 21, and 24 to 30. These voltages are referred to AGND.
REF
2(−) Reference Inputs for DACs 6, 7, 14, 15, 22, 23, 30, and 31. These reference voltages are referred to AGND.
REF
VOUT0 to VOUT31
SER/PARInterface Select Input. This pin allows the user to select whether the serial or parallel interface is used. This pin has an
1
SYNC
SCLK1
DIN1 Serial Data Input. Data must be valid on the falling edge of SCLK.
SDO1
DCEN1
CS
WRParallel Interface Write Input. Edge sensitive. The rising edge of WR is used in conjunction with CS low and the
DB13 to DB0
A0 to A7
REG0
REG1
CLRAsynchronous Clear Input. Level sensitive, active low. When CLR is low, the input to each of the DAC output buffer
BUSYDigital Input/Open-Drain Output. This pin must be pulled high with a pull-up resistor for correct operation. BUSY goes
LDACLoad DAC Logic Input. Active low. If LDAC is taken low while BUSY is inactive (high), the contents of the input
Logic Power Supply. 2.7 V to 5.5 V. These pins should be decoupled with 0.1 µF ceramic capacitors and 10 µF tantalum
capacitors.
Negative Analog Power Supply. −11.4 V to −16.5 V for specified performance. These pins should be decoupled with
0.1 µF ceramic capacitors and 10 µF tantalum capacitors.
Positive Analog Power Supply. +11.4 V to +16.5 V for specified performance. These pins should be decoupled with
0.1 µF ceramic capacitors and 10 µF tantalum capacitors.
DAC Bias Voltage Input/Output. This pin provides an access to the on-chip voltage generator voltage. It is provided
for bypassing and overdriving purposes only.
If V
(+) > 4.25 V, V
REF
(+) < 4.25 V, the on-chip bias generator can be used. In this case, the V
If V
REF
must be pulled high externally to an equal or higher potential, for example, 5 V.
BIAS
pin should be decoupled with a 10 nF
BIAS
capacitor to AGND.
DAC Outputs. Buffered analog outputs for each of the 32 DAC channels. Each analog output can drive an output load
of 5 kΩ to ground. Typical output impedance of these amplifiers is 1 Ω.
internal 1 MΩ pull-down resistor, meaning that the default state at power-on is parallel mode. If this pin is tied high,
the serial interface is used.
Active Low Input. This is the frame synchronization signal for the serial interface.
Serial Clock Input. Data is clocked into the shift register on the falling edge of SCLK. This pin operates at clock speeds
up to 50 MHz.
Serial Data Output. CMOS output. SDO can be used for daisy-chaining several devices together. Data is clocked out on
SDO on the rising edge of SCLK and is valid on the falling edge of SCLK.
Daisy-Chain Select Input. Level sensitive, active high. When high, this signal is used in conjunction with SER/
PAR high
to enable serial interface daisy-chain mode.
Parallel Interface Chip Select Input. Level sensitive, active low. When this pin is low, the device is selected.
address bus inputs to write to the selected AD5378 registers.
Parallel Data Inputs. The AD5378 can accept a straight 14-bit parallel word on DB0 to DB13, where DB13 is the MSB
and DB0 is the LSB.
Parallel Address Inputs. A7 to A4 are decoded to select one group or multiple groups of registers (input registers, gain
registers (m), or offset registers (c)) for a data transfer. This pin is used in conjunction with the REG1 and REG0 pins to
determine the destination register for the input data. See the Parallel Interface section for details of the address
decoding.
Parallel Interface Register Select Input. This pin is used together with REG1 to select data registers, gain registers,
offset registers, increment/decrement mode, or the soft reset function. See Table 12.
Parallel Interface Register Select Input. This pin is used together with REG0 to select data registers, gain registers,
offset registers, increment/decrement mode, or the soft reset function. See Table 12.
stages, VOUT0 to VOUT31, is switched to the externally set potential on the relevant REFGND pin. While
CLR is low, all
LDAC pulses are ignored. When CLR is taken high again, the DAC outputs remain cleared until LDAC is taken low. The
contents of input registers and DAC Registers 0 to 31 are not affected by taking
CLR low.
low during internal calculations of x2. During this time, the user can continue writing new data to additional ×1, c,
and m registers (these are stored in a FIFO), but no further updates to the DAC registers and DAC outputs can take
place. If
externally to delay
LDAC is taken low while BUSY is low, this event is stored. Because BUSY is bidirectional, it can be pulled low
LDAC action. BUSY also goes low during power-on reset or when the RESET pin is low. During a
RESET operation, the parallel interface is disabled and any events on LDAC are ignored.
registers are transferred to the DAC registers, and the DAC outputs are updated. If
active and internal calculations are taking place, the
LDAC event is stored and the DAC registers are updated when
LDAC is taken low while BUSY is
BUSY goes inactive. However, any events on LDAC during power-on reset or RESET are ignored.
Rev. PrA | Page 13 of 28
AD5378
Pin Description
FIFOEN
RESETAsynchronous Digital Reset Input. Falling edge sensitive. If unused, RESET can be left unconnected; an internal pull-
REFGNDA1 Reference Ground for DACs 0 to 5. VOUT0 to VOUT5 are referenced to this voltage.
REFGNDA2 Reference Ground for DACs 6 and 7. VOUT6 and VOUT7 are referenced to this voltage.
REFGNDB1 Reference Ground for DACs 8 to 13. VOUT8 to VOUT13 are referenced to this voltage.
REFGNDB2 Reference Ground for DACs 14 and 15. VOUT14 and VOUT15 are referenced to this voltage.
REFGNDC1 Reference Ground for DACs 16 to 21. VOUT16 to VOUT21 are referenced to this voltage.
REFGNDC2 Reference Ground for DACs 22 and 23. VOUT22 and VOUT23 are referenced to this voltage.
REFGNDD1 Reference Ground for DACs 24 to 29. VOUT24 to VOUT29 are referenced to this voltage.
REFGNDD2 Reference Ground for DACs 30 and 31. VOUT30 and VOUT31 are referenced to this voltage.
1
These serial interface signals do not require separate pins, but share parallel interface pins.
FIFO Enable. Level sensitive, active high. When connected to DVDD, the internal FIFO is enabled, allowing the user to
write to the device at full speed. FIFO is available in both serial and parallel modes. The FIFOEN pin has an internal
1 MΩ pull-down resistor connected to ground, meaning that the FIFO is disabled by default.
up resistor (1 MΩ) ensures that the
power-on reset generator. When this pin is taken low, the AD5378 state machine initiates a reset sequence to digitally
reset the x1, m, c, and x2 registers to their default power-on values. This sequence takes 100 µs (typ). Furthermore, the
input to each of the DAC output buffer stages, VOUT0 to VOUT31, is switched to the externally set potential on the
relevant REFGND pin. During
until BUSY goes high. When
RESET input is held high. The function of this pin is equivalent to that of the
RESET, BUSY goes low and the parallel interface is disabled. All LDAC pulses are ignored
RESET goes high again, the DAC ouputs remain at REFGND until LDAC is taken low.
Rev. PrA | Page 14 of 28
Preliminary Technical Data AD5378
TYPICAL PERFORMANCE CHARACTERISTICS
INL (LSBs)
FREQUENCY
1.5
1.0
0.5
–0.5
–1.0
–1.5
1400
1200
1000
800
600
400
200
0
VDD = +12V
V
V
V
0
3
2
1
8624010121
AD5378 CODE (10
Figure 8. Typical INL Plot
= –12V
SS
(+) = +5V
REF
(–) = –3.5V
REF
–10–3–2123
INL ERROR (LSB)
Figure 9. INL Error Distribution
(−40°C, +25°C, +85°C Superimposed)
VDD = +12V
V
= –12V
SS
V
(+) = +5V
REF
V
(–) = –3.5V
REF
T
= 85°C
MAX
3
)
VDD = +12V
V
= –12V
SS
V
(+) = +5V
REF
V
(–) = –3.5V
REF
T
= 25°C
A
416
05292-008
05292-009
3
2
1
0
–1
ERROR (mV)
–2
–3
–4
FS
TEMPERATURE (°C)
VDD = +12V
V
= –12V
SS
V
(+) = +5V
REF
V
(–) = –3.5V
REF
T
= 85°C
MAX
ZC
4020–200–406080
Figure 11. Typical Full-Scale and Zero-Scale Errors vs. Temperature
Figure 18. Supply Current vs. Digital Input Voltage
–0.208
TA = 25°C
= +12V
V
DD
V
V
SS
REF
= –12V
(+) = +5V
V
REF
(–) = –3.5V
5mV10V
Figure 17. DAC-to-DAC Crosstalk
TA = 25°C
V
V
V
V
V
1.21.62.02.42.83.20.40.80
INPUT VOLTAGE (V)
= +12V
DD
= –12V
SS
(+) = +5V
REF
(–) = –3.5V
REF
= +3.3V
CC
05292-017
05292-018
–0.209
AMPLITUDE (V)
–0.210
–0.211
01.42.84.25.66.0
TIME (µs)
05292-016
Figure 16. Digital Feedthrough
Rev. PrA | Page 16 of 28
Preliminary Technical Data AD5378
TERMINOLOGY
Relative Accuracy
Relative accuracy or endpoint linearity is a measurement of the
maximum deviation from a straight line passing through the
endpoints of the DAC transfer function. It is measured after
adjusting for zero-scale error and full-scale error and is
expressed in least significant bits (LSB).
Differential Nonlinearity
Differential nonlinearity is the difference between the measured
change and the ideal 1 LSB change between any two adjacent
codes. A specified differential nonlinearity of 1 LSB maximum
ensures monotonicity.
Zero-Scale Error
Zero-scale error is the error in the DAC output voltage when all
0s are loaded into the DAC register.
Ideally, with all 0s loaded to the DAC and m is all 1s,
c is 10 0000 0000 0000:
VOUT
(zero-scale)
= 2.5 × V
(−) − AGND) + REFGND
REF
Zero-scale error is a measurement of the difference between
VOUT (actual) and VOUT (ideal) expressed in mV. Zero-scale
error is mainly due to offsets in the output amplifier.
Full-Scale Error
Full-scale error is the error in DAC output voltage when all 1s
are loaded into the DAC register.
Ideally, with all 1s loaded to the DAC and m is all 1s,
c is 10 0000 0000 0000:
DC Crosstalk
The 32 DAC outputs are buffered by op amps that share
common V
and VSS power supplies. If the dc load current
DD
changes in one channel (due to an update), this can result in a
further dc change in one or more channel outputs. This effect is
more significant at high load currents and reduces as the load
currents are reduced. With high impedance loads, the effect is
virtually unmeasurable. Multiple V
and VSS terminals are
DD
provided to minimize dc crosstalk.
Output Voltage Settling Time
This is the amount of time it takes for the output of a DAC to
settle to a specified level for a full-scale input change.
Digital-to-Analog Glitch Energy
This is the amount of energy injected into the analog output at
the major code transition. It is specified as the area of the glitch
in nV-s. It is measured by toggling the DAC register data
between 0x1FFF and 0x2000.
Channel-to-Channel Isolation
Channel-to-channel isolation refers to the proportion of input
signal from one DAC’s reference input that appears at the
output of another DAC operating from another reference. It is
expressed in dB and measured at midscale.
DAC-to-DAC Crosstalk
DAC-to-DAC crosstalk is the glitch impulse that appears at the
output of one converter due to both the digital change and
subsequent analog output change at another converter. It is
specified in nV-s.
VOUT
(V
REF
= 3.5 × (V
(full-scale)
(−)− AGND) + REFGND
(+) − AGND) + 2.5 ×
REF
Full-scale error is a measurement of the difference between
VOUT (actual) and VOUT (ideal) expressed in mV. It does not
include zero-scale error.
Gain Error
Gain error is the difference between full-scale error and zeroscale error. It is expressed in mV.
Gain Error = Full-Scale Error − Zero-Scale Error
VOUT Temperature Coefficient
This includes output error contributions from linearity, offset,
and gain drift.
DC Output Impedance
DC output impedance is the effective output source resistance.
It is dominated by package lead resistance.
Rev. PrA | Page 17 of 28
Digital Crosstalk
The glitch impulse transferred to the output of one converter
due to a change in the DAC register code of another converter is
defined as the digital crosstalk and is specified in nV-s.
Digital Feedthrough
When the device is not selected, high frequency logic activity
on the device’s digital inputs can be capacitively coupled both
across and through the device to show up as noise on the
VOUT pins. It can also be coupled along the supply and ground
lines. This noise is digital feedthrough.
Output Noise Spectral Density
This is a measurement of internally generated random noise.
Random noise is characterized as a spectral density (voltage per
√Hz). It is measured by loading all DACs to midscale and
measuring noise at the output. It is measurement in nV/(Hz)
1/2
.
AD5378
FUNCTIONAL DESCRIPTION
DAC ARCHITECTURE—GENERAL
The AD5378 contains 32 DAC channels and 32 output amplifiers
in a single package. The architecture of a single DAC channel
consists of a 14-bit resistor-string DAC followed by an output
buffer amplifier. The resistor-string section is simply a string of
resistors, each of value R, from V
architecture guarantees DAC monotonicity. The 14-bit binary
digital code loaded to the DAC register determines at which
node on the string the voltage is tapped off before being fed into
the output amplifier. The output amplifier translates the output
of the DAC to a wider range. The DAC output is gained up by a
factor of 3.5 and offset by the voltage on the V
Transfe r Fu nc tion s ecti o n .
CHANNEL GROUPS
The 32 DAC channels on the AD5378 are arranged into four
groups (A, B, C, D) of eight channels. In each group, six
channels are connected to V
two channels are connected to V
group has two individual REFGND pins. For example, in
Group A, six channels are connected to REFGNDA1, and the
remaining two channels are connected to REFGNDA2. In
addition to an input register (x1) and a DAC register (x2), each
channel has a gain register (m) and an offset register (c). See
Table 18. Including these registers allows the user to calibrate
out errors in the complete signal chain, including the DAC
errors.
Table 10 shows the reference and REFGND inputs, and the
m and c registers for Group A. Groups B, C, and D are similar.
Table 10. Inputs and Registers for Group A
Channel Reference REFGND m, c Registers
0…5 V
6…7 V
REF
REF
1(+), V
2(+), V
1(−) REFGNDA1 m REG0…5
REF
2(−) REFGNDA2 m REG6…7
REF
TRANSFER FUNCTION
The digital input transfer function for each DAC can be
represented as
13
x2 = [(m + 1)/2
where:
x2 is the data-word loaded to the resistor string DAC.
The default is 10 0000 0000 0000.
x1 is the 14-bit data-word written to the DAC input register.
The default is 10 0000 0000 0000.
m is the 13-bit gain coefficient. The default is 1 1111 1111 1111.
c is the 14-bit offset coefficient. The default is 10 0000 0000 0000.
n is the DAC resolution. n = 14.
× x1] + (c − 2
(+) to AGND. This type of
REF
1(+) and V
REF
REF
2(+) and V
n−1
1(−); the remaining
REF
)
(−) pin. See the
REF
2(−). Each
REF
c REG0…5
c REG6…7
Figure 19 shows a single DAC channel and its associated
registers. The power-on values for the m and c registers are full
scale and 0x2000, respectively. The user can individually adjust
the voltage range on each DAC channel by overwriting the
power-on values of m and c. The AD5378 has digital overflow
and underflow detection circuitry to clamp the DAC output at
full scale or at zero scale when the values chosen for x1, m, and
c result in x2 being out of range.
V
INPUT
DATA
DAC
x1 INPUT
REG
m REG
c REG
Figure 19. Single DAC Channel
REG
LDAC
DAC
x2
REG
DACx2
AGND
REF
(+)
VDAC
The complete transfer function for the AD5378 can be
represented as
VOUT = 3.5 × ((V
2.5 × (V
(+)− AGND) × x2/214) +
REF
(−)− AGND) + REFGND
REF
where:
x2 is the data-word loaded to the resistor string DAC.
(+) is the voltage at the positive reference pin.
V
REF
V
(−) is the voltage at the negative reference pin.
REF
Figure 20 shows the output amplifier stage of a single channel.
VDAC is the voltage output from the resistor string DAC. The
nominal range of VDAC is 1 LSB to full scale.
V
REF
REFGND
VDAC
R
(–)
2.5R
AGND
Figure 20. Output Amplifier Stage
R
2.5R
R
VOUT
05292-019
05292-020
Rev. PrA | Page 18 of 28
Preliminary Technical Data AD5378
V
FUNCTION
BIAS
The AD5378 on-chip voltage generator provides a bias voltage
of 4.25 V (min). The V
pin is provided for bypassing and
BIAS
overdriving purposes only. It is not intended to be used as a
supply or a reference. If V
(+) > 4.25 V, V
REF
must be pulled
BIAS
high externally to an equal or higher potential such as 5 V. The
external voltage source should be capable of driving a 50 µA
(typical) current sink load.
REFERENCE SELECTION
The voltages applied to V
output voltage range and span on VOUT0 to VOUT31. If the
offset and gain features are not used (m and c are left at their
power-on values), the reference levels required can be
calculated as follows:
(+)
V
REF
V
REF
= (VOUT
min
(−)
= (AGND + VOUT
max
If the offset and gain features of the AD5378 are used, the
output range required is slightly different. The output range
chosen should take into account the offset and gain errors that
need to be trimmed out. Therefore, the output range should be
larger than the actual required range.
The reference levels required can be calculated as follows:
(+) and V
REF
− VOUT
max
(−) determine the
REF
)/3.5
min
)/2.5
min
If this offset error too large to calibrated out, it is possible to
adjust the negative reference value to account for this by using
the following equation:
V
(−)
= V
REF
NEW
(−)A − V
REF
OFFSET
/2.625
Reference Selection Example
Nominal Output Range = 10 V; (−2 V to +8 V)
Offset Error = ±100 mV
Gain Error = ±3%
REFGND = AGND = 0 V
1. Gain Error = ±3%;
=> Maximum Positive Gain Error = +3%
=> Output Range including Gain Error =
10 + 0.03 (10) = 10.3 V
2. Offset Error = ±100 mV;
=> Maximum Offset Error Span = 2(100) mV = 0.2 V
=> Output Range including Gain Error and Offset Error =
10.3 + 0.2 = 10.5 V
3. V
(+) and V
REF
(−) Calculation:
REF
Actual Output Range = 10.5 V, that is, −2.25 V to +8.25 V
(centered);
(+) = (8.25 + 2.25)/3.5 = 3 V and
=> V
REF
(−) = −2.25/2.5 = −0.9 V
V
REF
1. Identify the nominal output range on VOUT.
2. Identify the maximum offset span and the maximum gain
required on the full output signal range.
3. Calculate the new maximum output range on VOUT,
including the maximum offset and gain errors expected.
4. Choose the new VOUT
and VOUT
max
required, keeping
min
the new VOUT limits centered on the nominal values and
assuming REFGND is 0 V (or equal to AGND). V
must provide sufficient headroom.
V
SS
− VOUT
max
(+) and V
REF
min
)/3.5
min
)/2.5
REF
5. Calculate the values of V
V
(+)
REF
V
REF
= (VOUT
min
(−)
= (AGND + VOUT
max
(−) as follows:
DD
and
In addition, when using reference values other than those
suggested (V
(+) = 5 V and V
REF
(−) = −3.5 V), the expected
REF
offset error component changes as follows:
V
OFFSET
= 0.125 × (V
(−)A + 0.7 × V
REF
REF
(+)A)
where:
(−)A is the new negative reference value.
V
REF
(+)A is the new positive reference value.
V
REF
If the solution yields inconvenient reference levels, the user can
adopt one of these approaches:
•Use a resistor divider to divide down a convenient, higher
reference level to the required level.
(+)
•Select convenient reference levels above V
(−)
V
REF
. Modify the gain and offset registers to downsize
max
REF
or below
min
the references digitally. In this way, the user can use almost
any convenient reference level, but can reduce performance
by overcompaction of the transfer function.
•Use a combination of these two approaches.
Rev. PrA | Page 19 of 28
AD5378
CALIBRATION
The user can perform a system calibration by overwriting the
default values in the m and c registers for any individual DAC
channel as follows:
1. Calculate the nominal offset and gain coefficients for the
new output range (see the revious example).
2. Calculate the new m and c values for each channel based
−156 LSBs
=> Load 01 1111 0110 0100 to c Register 1
CLEAR FUNCTION
The clear function on the AD5378 can be implemented in
hardware or software.
Hardware Clear
Bringing the
VOUT31, to the externally set potential on the REFGND pin.
This is achieved by switching in REFGND and reconfiguring
the output amplifier stages into unity gain buffer mode, thus
ensuring that VOUT is equal to REFGND. The contents of the
input registers and DAC registers are not affected by taking
CLR
low. When
cleared until
LDAC
CLR
LDAC
is ignored.
pin low switches the outputs, VOUT0 to
CLR
is brought high, the DAC outputs remain
is taken low. While
CLR
is low, the value of
Software Clear
Loading a clear code to the x1 registers also enables the user to
set VOUT0 to VOUT31 to the REFGND level. The default clear
code corresponds to m at full scale and c at midscale (x2 = x1).
Default Clear Code
14
× (−Output Offset)/(Output Range)
= 2
14
× 2.5 × (AGND − V
= 2
(−))/(3.5 × (V
REF
(+)− AGND))
REF
The more general expression for the clear code is as follows:
14
Clear Code = (2
)/(m + 1) × (Default Clear Code − c)
BUSY AND LDAC FUNCTIONS
The value of x2 is calculated each time the user writes new data
to the corresponding x1, c, or m registers. During the calculation of x2, the
BUSY
output goes low. While
user can continue writing new data to the x1, m, or c registers,
but no DAC output updates can take place. The DAC outputs
are updated by taking the
BUSY
while
is active, the
outputs update immediately after
also hold the
LDAC
LDAC
input low. If
LDAC
event is stored and the DAC
BUSY
input permanently low. In this case, the
DAC outputs update immediately after
Table 11.
Action
Loading x1, c, or m to 1 channel 530 330
Loading x1, c, or m to 2 channels 700 500
Loading x1, c, or m to 3 channels 900 700
Loading x1, c, or m to 4 channels 1050 850
Loading x1, c, or m to all 32
channels
BUSY
Pulse Width
BUSY
FIFO
Enabled
5500 5300
The value of x2 for a single channel or group of channels is
recalculated each time there is a write to any x1 register(s), c
register(s), or m register(s). During the calculation of x2,
goes low. The duration of this
BUSY
pulse depends on the
number of channels being updated. For example, if x1, c, or m
data is written to one DAC channel,
BUSY
(max). However, if data is written to two DAC channels,
goes low for 700 ns (max). There are approximately 200 ns of
overhead due to FIFO access. See Table 11.
The AD5378 contains an additional feature whereby a DAC
register is not updated unless its x2 register is written to since
LDAC
the last time
was brought low. Normally, when
brought low, the DAC registers are filled with the contents of
the x2 registers. However, the AD5378 updates the DAC register
only if the x2 data changes, thereby removing unnecessary
digital crosstalk.
BUSY
is low, the
LDAC
goes low
goes high. A user can
BUSY
goes high.
Pulse Width (ns max)
FIFO
Disabled
BUSY
goes low for 550 ns
BUSY
LDAC
is
Rev. PrA | Page 20 of 28
Preliminary Technical Data AD5378
FIFO VS. NON-FIFO OPERATION
Data can be loaded to the AD5378 registers with FIFO disabled
or enabled. Operation with FIFO disabled is optimum for single
writes to the device. If the system requires significant data
transfers to the AD5378, however, operation with FIFO enabled
is more efficient.
When FIFO is enabled, the AD5378 uses an internal FIFO
memory to allow high speed successive writes in both serial and
parallel modes. This optimizes the interface speed and
efficiency, minimizes the total conversion time due to internal
digital efficiencies, and minimizes the overhead on the master
controller when managing the data transfers. The BUSY signal
goes low while instructions in the state machine are being
executed.
Table 11 compares operation with FIFO enabled and FIFO
disabled for different data transfers to the AD5378. Operation
with FIFO enabled is more efficient for all operations except
single write operations. When using the FIFO, the user can
continue writing new data to the AD5378 while write instructions are being executed. Up to 128 successive instructions can
be written to the FIFO at maximum speed. When the FIFO is
full, additional writes to the AD5378 are ignored.
BUSY INPUT FUNCTION
Because the
correct operation, use a pull-up resistor to digital supply), a
second AD5378 or any other device (such as a system controller), can pull
required. This is a means of delaying any
feature allows synchronous updates of multiple AD5378 devices
in a system at maximum speed. As soon as the last device
connected to the
cally. Tying the
synchronous updating of all DACs without extra hardware.
BUSY
pin is bidirectional and open-drain (for
BUSY
low and, therefore, delay DAC update(s), if
LDAC
BUSY
pin is ready, all DACs update automati-
BUSY
pin of multiple devices together enables
action. This
POWER-ON RESET FUNCTION
The AD5378 contains a power-on reset generator and state
CLR
machine. During power-on,
the power-on state machine resets all internal registers to their
default values, and
(typical). The outputs, VOUT0 to VOUT31, are switched to the
externally set potential on the REFGND pin. During power-on,
BUSY
becomes active (internally),
goes low. This sequence takes 8 ms
the parallel interface is disabled, so it is not possible to write to
the part. Any transitions on
are ignored in order to reject initial
rising edge on
that the parallel interface is enabled. All DACs remain in their
power-on state until
BUSY
LDAC
during the power-on period
LDAC
pin glitching. A
indicates that power-on is complete and
LDAC
is used to update the DAC outputs.
RESET INPUT FUNCTION
The AD5378 can be placed into the power-on reset state at any
RESET
time by activating the
initiates a reset sequence to digitally reset the x1, m, c, and x2
registers to their default power-on values. This sequence takes
95 µs (typical), 120 µs (max), and 70 µs (min). During this
sequence,
on
low, the DAC outputs are switched to REFGND. The outputs
remain at REFGND until an
function can also be implemented via the parallel interface by
setting the REG0 and REG1 pins low and writing all 1s to DB13
to DB0. See Table 17 for soft reset.
BUSY
goes low. While
LDAC
are ignored. As with the
pin. The AD5378 state machine
RESET
is low, any transitions
CLR
input, while
LDAC
pulse is applied. This reset
RESET
is
INCREMENT/DECREMENT FUNCTION
The AD5378 has a special function register that enables the user
to increment or decrement the internal 14-bit input register
data (x1) in steps of 0 to 127 LSBs. The increment/decrement
function is selected by setting both REG1 and REG0 pins (or
bits) low. Address Pins (or bits) A7 to A0 are used to select a
DAC channel or group of channels. The amount by which the
x1 register is incremented or decremented is determined by the
DB6 to DB0 bits/pins. For example, for a 1 LSB increment or
decrement, DB6...DB0 = 0000001, while for a 7 LSB increment
or decrement, DB6...DB0 = 0000111. DB8 determines whether
the input register data is incremented (DB8 = 1) or decremented (DB8 = 0). The maximum amount by which the user is
allowed to increment or decrement the data is 127 LSBs, that is,
DB6...DB0 = 1111111. The 0 LSB step is included to facilitate
software loops in the user’s application. See Table 16.
The AD5378 has digital overflow and underflow detection
circuitry to clamp at full scale or zero scale when the values
chosen for increment or decrement mode are out of range.
Rev. PrA | Page 21 of 28
AD5378
INTERFACES
The AD5378 contains parallel and serial interfaces. The active
PA R
interface is selected via the SER/
The AD5378 uses an internal FIFO memory to allow high
speed successive writes in both serial and parallel modes. The
user can continue writing new data to the AD5378 while write
instructions are being executed. The
while instructions in the FIFO are being executed. Up to
120 successive instructions can be written to the FIFO at
maximum speed. When the FIFO is full, additional writes to the
AD5378 are ignored.
To minimize both the power consumption of the device and
on-chip digital noise, the active interface powers up fully only
when the device is being written to, that is, on the falling edge
WR
or on the falling edge of
of
All digital interfaces are 2.5 V LVTTL-compatible when
operating from a 2.7 V to 3.6 V V
PARALLEL INTERFACE
A pull-down on the SER/
the default. If using the parallel interface, the SER/
be left unconnected. Figure 6 shows the timing diagram for a
parallel write to the AD5378. The parallel interface is controlled
by the following pins.
CS
Pin
Active low device select pin.
WR
Pin
On the rising edge of WR, with CS low, the address values at
Pins A7 to A0 are latched and data values at Pins DB13 to DB0
are loaded into the selected AD5378 input registers.
REG1, REG0 Pins
The REG1 and REG0 pins determine the destination register of
the data being written to the AD5378. See Table 12.
Table 12. Register Selection
REG1 REG0 Register Selected
1 1 Input Data Register (x1)
1 0 Offset Register (c)
0 1 Gain Register (m)
0 0 Special Function Register
DB13 to DB0 Pins
The AD5378 accepts a straight 14-bit parallel word on DB0 to
DB13, where DB13 is the MSB and DB0 is the LSB. See Table 13
to Table 17.
PA R
pin.
BUSY
signal goes low
SYNC
.
supply.
CC
pin makes the parallel interface
PA R
pin can
A7 to A0 Pins
Each of the 32 DAC channels can be addressed individually. In
addition, several channel groupings enable the user to simultaneously write the same data to multiple DAC channels. Address
Bits A7 to A4 are decoded to select one group or multiple
groups of registers. Address Bits A3 to A0 select one of ten
input data registers (x1), offset registers (c), or gain registers
(m). See Table 18.
SERIAL INTERFACE
The SER/
face and disable the parallel interface. The serial interface is
controlled by the following pins.
SYNC
Standard 3-wire interface pins.
DCEN
Selects standalone mode or daisy-chain mode.
SDO
Data out pin for daisy-chain mode.
Figure 4 and Figure 5 show the timing diagrams for a serial
write to the AD5378 in standalone and daisy-chain modes,
respectively.
The 24-bit data-word format for the serial interface is shown in
Figure 21.
MSB
GROUP/CHANNEL
SELECT BITS
Standalone Mode
By connecting the DCEN (daisy-chain enable) pin low,
standalone mode is enabled. The serial interface works with
both a continuous and a burst serial clock. The first falling edge
of
the number of serial clocks to ensure that the correct number of
bits is shifted into the serial shift register. Additional edges on
SYNC
shifted in, the SCLK is ignored. For another serial transfer to
take place, the counter must be reset by the falling edge of
PA R
pin must be tied high to enable the serial inter-
, DIN, SCLK
A7–A0REG1
REGISTER SELECT
BITS
SYNC
starts the write cycle and resets a counter that counts
REG0DB13–DB0
REGISTER DATA BITS
Figure 21. Serial Data Format
are ignored until 24 bits are shifted in. Once 24 bits are
LSB
SYNC
05292-021
.
Rev. PrA | Page 22 of 28
Preliminary Technical Data AD5378
Daisy-Chain Mode
For systems that contain several DACs, the SDO pin can be
used to daisy-chain several devices together. This daisy-chain
mode can be useful in system diagnostics and in reducing the
number of serial interface lines.
Connecting the DCEN (daisy-chain enable) pin high enables
SYNC
daisy-chain mode. The first falling edge of
write cycle. The SCLK is continuously applied to the input shift
SYNC
register when
applied, the data ripples out of the shift register and appears on
the SDO line. This data is clocked out on the rising edge of
SCLK and is valid on the falling edge. By connecting this line to
the DIN input on the next device in the chain, a multidevice
interface is constructed. For each AD5378 in the system,
24 clock pulses are required. Therefore, the total number of
is low. If more than 24 clock pulses are
starts the
clock cycles must equal 24N, where N is the total number of
AD5378 devices in the chain. If fewer than 24 clocks are
applied, the write sequence is ignored.
SYNC
When the serial transfer to all devices is complete,
should be taken high. This latches the input data in each device
in the daisy chain and prevents any additional data from being
clocked into the input shift register.
SYNC
A continuous SCLK source can be used if
the correct number of clock cycles. Alternatively, a burst clock
containing the exact number of clock cycles can be used and
SYNC
taken high after the final clock to latch the data.
When the transfer to all input registers is complete, a common
LDAC
signal updates all DAC registers, and all analog outputs
are updated simultaneously.
is held low for
Rev. PrA | Page 23 of 28
AD5378
DATA DECODING
The AD5378 contains a 14-bit data bus, DB13 to DB0. Depending on the value of REG1 and REG0, this data is loaded into the
addressed DAC input register(s), offset (c) register(s), gain (m)
register(s), or the special function register.
Table 13. DAC Data Format (REG1 = 1, REG0 = 1)
DB13 to DB0 DAC Output
11 1111 1111 1111 (16383/16384) V
11 1111 1111 1110 (16382/16384) V
10 0000 0000 0001 (8193/16384) V
10 0000 0000 0000 (8192/16384) V
01 1111 1111 1111 (8191/16384) V
00 0000 0000 0001 (1/16384) V
00 0000 0000 0000 0 V
The AD5378 contains an 8-bit address bus, A7 to A0. This
address bus allows each DAC input register (x1), each offset (c)
register, and each gain (m) register to be individually updated.
Table 18. DAC Group Addressing
A7 A6 A5 A4 Group
0 0 0 0 All 32 DACs
0 0 0 1 Group A
0 0 1 0 Group B
0 0 1 1 Groups A, B
0 1 0 0 Group C
0 1 0 1 Groups A, C
0 1 1 0 Groups B, C
0 1 1 1 Groups A, B, C
1 0 0 0 Group D
1 0 0 1 Groups A, D
1 0 1 0 Groups B, D
1 0 1 1 Groups A, B, D
1 1 0 0 Groups C, D
1 1 0 1 Groups A, C, D
1 1 1 0 Groups B, C, D
1 1 1 1 Groups A, B, C, D
The REG1 and REG0 bits in the special function register (SFR)
(see Table 10) show the decoding for data, offset, and gain
registers. When all 32 DAC channels are selected, Address
Bits A[3:0] are ignored.
In any circuit where accuracy is important, careful consideration of the power supply and ground return layout helps to
ensure the rated performance. The printed circuit board on
which the AD5378 is mounted should be designed so that the
analog and digital sections are separated and confined to
certain areas of the board. If the AD5378 is in a system where
multiple devices require an AGND-to-DGND connection, the
connection should be made at one point only. The star ground
point should be established as close as possible to the device.
For supplies with multiple pins (V
mended to tie these pins together and to decouple each
supply once.
The AD5378 should have ample supply decoupling of 10 µF in
parallel with 0.1 µF on each supply located as close to the
package as possible, ideally right up against the device. The
10 µF capacitors are the tantalum bead type. The 0.1 µF capacitor should have low effective series resistance (ESR) and
effective series inductance (ESI), such as the common ceramic
types that provide a low impedance path to ground at high
frequencies, to handle transient currents due to internal
logic switching.
Digital lines running under the device should be avoided,
because these couple noise onto the device. The analog ground
plane should be allowed to run under the AD5378 to avoid
noise coupling. The power supply lines of the AD5378 should
use as large a trace as possible to provide low impedance paths
, VDD, VCC), it is recom-
SS
and reduce the effects of glitches on the power supply line. Fast
switching digital signals should be shielded with digital ground
to avoid radiating noise to other parts of the board, and should
never be run near the reference inputs. It is essential to minimize noise on all V
(+) and V
REF
(−) lines. The V
REF
pin should
BIAS
be decoupled with a 10 nF capacitor to AGND.
Avoid crossover of digital and analog signals. Traces on
opposite sides of the board should run at right angles to each
other. This reduces the effects of feedthrough through the
board. A microstrip technique is by far the best, but not always
possible with a double-sided board. In this technique, the
component side of the board is dedicated to ground plane,
while signal traces are placed on the solder side.
As for all thin packages, care must be taken to avoid flexing the
CSPBGA package and to avoid a point load on the surface of
this package during the assembly process.
POWER-ON
An on-chip power supply monitor makes the AD5378 robust to
power sequencing. The supply monitor powers up the analog
section after (V
output buffers power up in
potential, even if V
analog circuitry powers up and the buffered DAC output level
settles linearly within the supply range.
− VSS) is greater than 7 V (typical). The
DD
CLR
mode forced to the DUTGND
remains at 0 V. After VSS is applied, the
CC
Rev. PrA | Page 26 of 28
Preliminary Technical Data AD5378
TYPICAL APPLICATION CIRCUIT
The high channel count of the AD5378 makes it wellsuited to
applications requiring high levels of integration such as optical
and automatic test equipment (ATE) systems. Figure 22 shows
the AD5378 as it is used in an ATE system. Shown here is one
pin of a typical logic tester. It is apparent that a number of
discrete levels are required for the pin driver, active load circuit,
parametric measurement unit, comparators, and clamps.
GUARD AMP
DAC
V
TERM
V
H
DRIVER
V
L
DAC
ACTIVE LOAD
DRIVEN SHIELD
V
V
V
TH
V
TL
DAC
ADC
TIMING DATA
MEMORY
TIMING
GENERATOR
DLL LOGIC
COMPARE
MEMORY
CENTRAL PMU
DAC
DAC
FORMATTER DE-SKEW
DAC
DAC
FORMATTER DE-SKEW
DAC
DAC
DAC
DAC
COMP
I
OL
V
COM
I
OH
Figure 22. Typical Application Circuit for Logic Tester
CH
CL
In addition to the DAC levels required in the ATE system
shown, drivers, loads, comparators, and parametric
measurement unit functions are also required. Analog Devices
provides solutions for all these functions.
DAC
PPMU
ADC
RELAYS
50
GND SENSE
Ω
COAX
DAC
ADC
DUT
DEVICE POWER
SUPPLY
05292-022
Rev. PrA | Page 27 of 28
AD5378
OUTLINE DIMENSIONS
*1.85
1.70
1.55
A1 CORNER
BOTTOM
VIEW
1.00 BSC
INDEX AREA
13.00
BSC SQ
BALL A1
INDICATOR
TOP VIEW
DETAIL A
11.00
BSC SQ
10987654321
12 11
DETAIL A
0.75
0.70
0.65
*
0.64 TYP
BALL DIAMETER
*
COMPLIANT WITH JEDEC STANDARDS MO-192-AAD-1
WITH THE EXCEPTION OF PACKAGE HEIGHT AND BALL DIAMETER.