Low drift 2.5 V on-chip reference: 2 ppm/°C typical
Tiny package: 3 mm × 3 mm, 16-lead LFCSP
Total unadjusted error (TUE): ±0.1% of FSR maximum
Offset error: ±1.5 mV maximum
Gain error: ±0.1% of FSR maximum
High drive capability: 20 mA, 0.5 V from supply rails
User-selectable gain of 1 or 2 (GAIN pin)
Reset to zero scale or midscale (RSTSEL pin)
1.8 V logic compatibility
400 kHz I
4 I
Low glitch: 0.5 nV-sec
Robust 3.5 kV HBM and 1.5 kV FICDM ESD rating
Low power: 3.3 mW at 3 V
2.7 V to 5.5 V power supply
−40°C to +105°C temperature range
APPLICATIONS
Digital gain and offset adjustment
Programmable attenuators
Industrial automation
Data acquisition systems
GENERAL DESCRIPTION
The AD5316R, a member of the nanoDAC® family, is a low power,
quad, 10-bit buffered voltage output DAC. The device includes
a 2.5 V, 2 ppm/°C internal reference (enabled by default) and a
gain select pin giving a full-scale output of 2.5 V (gain = 1) or 5 V
(gain = 2). The device operates from a single 2.7 V to 5.5 V supply,
is guaranteed monotonic by design, and exhibits less than 0.1%
FSR gain error and 1.5 mV offset error performance. The device
is available in a 3 mm × 3 mm LFCSP package and in a TSSOP
package.
The AD5316R also incorporates a power-on reset circuit and a
RSTSEL pin; the RSTSEL pin ensures that the DAC outputs power
up to zero scale or midscale and remain at that level until a valid
write takes place. The part contains a per-channel power-down
feature that reduces the current consumption of the device in
power-down mode to 4 μA at 3 V.
The AD5316R uses a versatile 2-wire serial interface that operates
at clock rates up to 400 kHz and includes a V
for 1.8 V/3 V/5 V logic.
The AD5316R and the AD5316 are not pin-to-pin or software compatible.
PRODUCT HIGHLIGHTS
1. Precision DC Performance.
Total unadjusted error: ±0.1% of FSR maximum
Offset error: ±1.5 mV maximum
Gain error: ±0.1% of FSR maximum
2. Low Drift 2.5 V On-Chip Reference.
2 ppm/°C typical temperature coefficient
5 ppm/°C maximum temperature coefficient
3. Two Pa ckage Opti ons .
3 mm × 3 mm, 16-lead LFCSP
16-lead TSSOP
REF
STRING
DAC A
STRING
DAC B
STRING
DAC C
STRING
DAC D
GAIN =
×1/×2
2.5V
REFERENCE
BUFFER
BUFFER
BUFFER
BUFFER
POWER-
DOWN
LOGIC
V
A
OUT
V
B
OUT
V
C
OUT
V
D
OUT
10819-001
Rev. A
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarks and registered trademarks are the property of their respective owners.
Change to Features Section ............................................................. 1
Change to Relative Accuracy Parameter in Tabl e 2 ..................... 3
Change to Differential Nonlinearity Parameter in Table 2 ......... 3
Changes to Ordering Guide .......................................................... 24
7/12—Revision 0: Initial Version
Rev. A | Page 2 of 24
Data Sheet AD5316R
Resolution
10
Bits
Full-Scale Error
+0.01
±0.1
% of FSR
All 1s loaded to DAC register
DC Power Supply Rejection Ratio4
0.15 mV/V
DAC code = midscale; VDD = 5 V ± 10%
Capacitive Load Stability
2
nF
RL = ∞
Short-Circuit Current6
40 mA
Output Voltage Noise Density4
240 nV/√Hz
At TA, f = 10 kHz, CL = 10 nF
Thermal Hysteresis4
125 ppm
First cycle
SPECIFICATIONS
VDD = 2.7 V to 5.5 V; V
Table 2.
Parameter Min Typ Max Unit Test Conditions/Comments
STATIC PERFORMANCE3
Relative Accuracy ±0.12 ±0.5 LSB
Differential Nonlinearity ±0.5 LSB Guaranteed monotonic by design
Zero-Code Error 0.4 1.5 mV All 0s loaded to DAC register
Offset Error +0.1 ±1.5 mV
Gain Error ±0.02 ±0.1 % of FSR
Total Unadjusted Error ±0.01 ±0.1 % of FSR External reference, gain = 2, TSSOP
±0.2 % of FSR Internal reference, gain = 1, TSSOP
Offset Error Drift4 ±1 µV/°C
Gain Temperature Coefficient4 ±1 ppm Of FSR/°C
= 2.5 V; 1.8 V ≤ V
REF
≤ 5.5 V; RL = 2 kΩ; CL = 200 pF; all specifications T
LOGIC
MIN
to T
, unless otherwise noted.
MAX
1, 2
DC Crosstalk4 ±2 µV
Due to single channel, full-scale output
change
±3 µV/mA Due to load current change
±2 µV Due to power-down (per channel)
OUTPUT CHARACTERISTICS4
Output Voltage Range 0 V
0 2 × V
V Gain = 1
REF
V Gain = 2 (see Figure 26)
REF
10 nF RL = 1 kΩ
Resistive Load5 1 kΩ
Load Regulation DAC code = midscale
80 µV/mA 5 V ± 10%; −30 mA ≤ I
80 µV/mA 3 V ± 10%; −20 mA ≤ I
≤ +30 mA
OUT
≤ +20 mA
OUT
Load Impedance at Rails7 25 Ω See Figure 26
Power-Up Time 2.5 µs Coming out of power-down mode; VDD = 5 V
REFERENCE OUTPUT
Output Voltage8 2.4975 2.5025 V At TA
Reference TC9 2 5 ppm/°C See the Terminology section
Output Impedance4 0.04 Ω
Output Voltage Noise4 12 µV p-p 0.1 Hz to 10 Hz
Load Regulation, Sourcing4 20 µV/mA At TA
Load Regulation, Sinking4 40 µV/mA At TA
Output Current Load Capability4 ±5 mA VDD ≥ 3 V
Line Regulation4 100 µV/V At TA
Long-Term Stability/Drift4 12 ppm After 1000 hours at 125°C
25 ppm Additional cycles
LOGIC INPUTS4
Input Current ±2 µA Per pin
Input Low Voltage, V
Input High Voltage, V
Pin Capacitance 2 pF
0.3 × V
INL
0.7 × V
INH
V
LOGI C
Rev. A | Page 3 of 24
V
LOGI C
AD5316R Data Sheet
V
+ 1.5
5.5 V Gain = 2
Total Harmonic Distortion4
−80 dB
At TA, BW = 20 kHz, VDD = 5 V, f
= 1 kHz
Parameter Min Typ Max Unit Test Conditions/Comments
1, 2
LOGIC OUTPUTS (SDA)4
Output Low Voltage, VOL 0.4 V I
= 3 mA
SINK
Floating State Output Capacitance 4 pF
POWER REQUIREMENTS
V
1.8 5.5 V
LOGI C
I
3 µA
LOGI C
VDD 2.7 5.5 V Gain = 1
REF
IDD VIH = VDD, VIL = GND, VDD = 2.7 V to 5.5 V
Normal Mode10 0.59 0.7 mA Internal reference off
1.1 1.3 mA Internal reference on, at full scale
All Power-Down Modes11 1 4 µA −40°C to +85°C
6 µA −40°C to +105°C
1
Temperature range is −40°C to +105°C.
2
The AD5316R and the AD5316 are not pin-to-pin or software compatible.
3
DC specifications are tested with the outputs unloaded, unless otherwise noted. Upper dead band (10 mV) exists only when V
with gain = 2. Linearity calculated using a reduced code range of 4 to 1020.
4
Guaranteed by design and characterization; not production tested.
5
Channel A and Channel B can have a combined output current of up to 30 mA. Similarly, Channel C and Channel D can have a combined output current of up to
30 mA up to a junction temperature of 110°C.
6
VDD = 5 V. The device includes current limiting that is intended to protect the device during temporary overload conditions. Junction temperature can be exceeded
during current limit. Operation above the specified maximum junction temperature may impair device reliability.
7
When drawing a load current at either rail, the output voltage headroom with respect to that rail is limited by the 25 Ω typical channel resistance of the output
devices. For example, when sinking 1 mA, the minimum output voltage = 25 Ω × 1 mA = 25 mV (see Figure 26).
8
Initial accuracy presolder reflow is ±750 µV; output voltage includes the effects of preconditioning drift. See the Solder Heat Reflow section.
9
Reference is trimmed and tested at two temperatures and is characterized from −40°C to +105°C. Reference temperature coefficient is calculated as per the box method.
See the Terminology section for more information.
10
Interface inactive. All DACs active. DAC outputs unloaded.
11
All DACs powered down.
= VDD with gain = 1 or when V
REF
/2 = VDD
REF
AC CHARACTERISTICS
VDD = 2.7 V to 5.5 V; V
Table 3.
Parameter
1, 2
Min Typ Max Unit Test Conditions/Comments3
Output Voltage Settling Time 5 7 µs ¼ to ¾ scale settling to ±1 LSB
Slew Rate 0.8 V/µs
Digital-to-Analog Glitch Impulse 0.5 nV-sec 1 LSB change around major carry transition
Digital Feedthrough 0.13 nV-sec
Digital Crosstalk 0.1 nV-sec
Analog Crosstalk 0.2 nV-sec
DAC-to-DAC Crosstalk 0.3 nV-sec
Output Noise Spectral Density 300 nV/√Hz DAC code = midscale, 10 kHz, gain = 2
Output Noise 6 µV p-p 0.1 Hz to 10 Hz
1
Guaranteed by design and characterization; not production tested.
2
See the Terminology section.
3
Temperature range is −40°C to +105°C; typical at 25°C.
4
Digitally generated sine wave at 1 kHz.
= 2.5 V; 1.8 V ≤ V
REF
≤ 5.5 V; RL = 2 kΩ; CL = 200 pF; all specifications T
LOGIC
MIN
to T
, unless otherwise noted.
MAX
OUT
Rev. A | Page 4 of 24
Data Sheet AD5316R
t
3
0 0.9
µs
t
, data hold time
t12
20 ns
SCL
SDA
t
1
t
3
LDAC
1
LDAC
2
START
CONDITION
REPEATED START
CONDITION
STOP
CONDITION
NOTES
1
ASYNCHRONOUS LDAC UPDATE MO DE .
2
SYNCHRONOUS LDAC UPDATE MO DE .
t
4
t
6
t
5
t
7
t
8
t
2
t
13
t
4
t
11
t
10
t
12
t
12
t
9
10819-002
TIMING CHARACTERISTICS
VDD = 2.7 V to 5.5 V; 1.8 V ≤ V
≤ 5.5 V; all specifications T
LOGIC
MIN
to T
, unless otherwise noted.
MAX
Table 4.
Parameter
1, 2
Min Max Unit Description
t1 2.5 µs SCL cycle time
t2 0.6 µs t
t3 1.3 µs t
t4 0.6 µs t
t5 100 ns t
6
t7 0.6 µs t
t8 0.6 µs t
t9 1.3 µs t
4
t
0 300 ns tR, rise time of SCL and SDA when receiving
10
4, 5
t
20 + 0.1CB 300 ns tF, fall time of SCL and SDA when transmitting/receiving
11
, SCL high time
HIGH
, SCL low time
LOW
, start/repeated start hold time
HD,STA
, data setup time
SU ,DAT
HD,DAT
, repeated start setup time
SU,STA
, stop condition setup time
SU,STO
, bus free time between a stop condition and a start condition
BUF
LDAC pulse width
t13 400 ns
6
t
0 50 ns Pulse width of suppressed spike
SP
5
C
400 pF Capacitive load for each bus line
B
1
See Figure 2.
2
Guaranteed by design and characterization; not production tested.
3
A master device must provide a hold time of at least 300 ns for the SDA signal (referred to the VIH min of the SCL signal) to bridge the undefined region of the SCL
falling edge.
4
tR and tF are measured from 0.3 × VDD to 0.7 × VDD.
5
CB is the total capacitance of one bus line in pF.
6
Input filtering on the SCL and SDA inputs suppresses noise spikes that are less than 50 ns.
SCL rising edge to
LDAC rising edge
Timing Diagram
Figure 2. 2-Wire Serial Interface Timing Diagram
Rev. A | Page 5 of 24
AD5316R Data Sheet
Human Body Model (HBM)
3.5 kV
16-Lead LFCSP
70
°C/W
ABSOLUTE MAXIMUM RATINGS
TA = 25°C, unless otherwise noted.
Table 5.
Parameter Rating
VDD to GND −0.3 V to +7 V
V
to GND −0.3 V to +7 V
LOGI C
V
to GND −0.3 V to VDD + 0.3 V
OUT
V
to GND −0.3 V to VDD + 0.3 V
REF
Digital Input Voltage to GND1 −0.3 V to V
SDA and SCL to GND −0.3 V to +7 V
Operating Temperature Range −40°C to +105°C
Storage Temperature Range −65°C to +150°C
Junction Temperature 125°C
Reflow Soldering Peak Temperature,
Pb Free (J-STD-020)
ESD
260°C
LOGI C
+ 0.3 V
THERMAL RESISTANCE
θJA is specified for the worst-case conditions, that is, a device
soldered in a circuit board for surface-mount packages. This
value was measured using a JEDEC standard 4-layer board with
zero airflow. For the LFCSP package, the exposed pad must be
tied to GND.
Table 6. Thermal Resistance
Package Type θJA Unit
16-Lead TSSOP 112.6 °C/W
ESD CAUTION
Field-Induced Charged Device
Model (FICDM)
1
Excluding SDA and SCL.
1.5 kV
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
Rev. A | Page 6 of 24
Data Sheet AD5316R
5 7 V
D
Analog Output Voltage from DAC D. The output amplifier has rail-to-rail operation.
14
16
RSTSEL
12
11
10
1
3
4
A1
SCL
A0
9
V
LOGIC
V
OUT
A
V
DD
2
GND
V
OUT
C
6
SDA
5
V
OUT
D
7
LDAC
8
GAIN
16
V
OUT
B
15
V
REF
14
RSTSEL
13
RESET
AD5316R
NOTES
1. THE EXPOSED PAD MUST BE TIED TO GND.
TOP VIEW
(Not to S cale)
10819-006
1
2
3
4
5
6
7
8
V
OUT
B
V
OUT
A
GND
V
OUT
D
V
OUT
C
V
DD
V
REF
SDA
16
15
14
13
12
11
10
9
RESET
A1
SCL
GAIN
LDAC
V
LOGIC
A0
RSTSEL
TOP VIEW
(Not to S cale)
AD5316R
10819-007
PIN CONFIGURATIONS AND FUNCTION DESCRIPTIONS
Figure 3. 16-Lead LFCSP Pin Configuration
Table 7. Pin Function Descriptions
Pin No.
Mnemonic Description LFCSP TSSOP
1 3 V
A Analog Output Voltage from DAC A. The output amplifier has rail-to-rail operation.
OUT
2 4 GND Ground Reference Point for All Circuitry on the Part.
3 5 VDD
Power Supply Input. The part can be operated from 2.7 V to 5.5 V. The supply should be decoupled
with a 10 µF capacitor in parallel with a 0.1 µF capacitor to GND.
4 6 V
6 8 SDA
C Analog Output Voltage from DAC C. The output amplifier has rail-to-rail operation.
OUT
OUT
Serial Data Input. This pin is used in conjunction with the SCL line to clock data into or out of the
24-bit input shift register. SDA is a bidirectional, open-drain data line that should be pulled to the
supply with an external pull-up resistor.
7 9
LDAC LDAC can be operated in two modes, asynchronous update mode and synchronous update mode.
Pulsing this pin low allows any or all DAC registers to be updated if the input registers have new
data; all DAC outputs are simultaneously updated. This pin can also be tied permanently low.
8 10 GAIN
Gain Select Pin. When this pin is tied to GND, all four DAC outputs have a span of 0 V to V
When this pin is tied to V
9 11 V
Digital Power Supply. Voltage ranges from 1.8 V to 5.5 V.
LOGI C
10 12 A0 Address Input. Sets the first LSB of the 7-bit slave address.
11 13 SCL
Serial Clock Line. This pin is used in conjunction with the SDA line to clock data into or out of the
24-bit input shift register.
12 14 A1 Address Input. Sets the second LSB of the 7-bit slave address.
13 15
RESET Asynchronous Reset Input. The RESET input is falling edge sensitive. When RESET is activated
(low), the input register and the DAC register are updated with zero scale or midscale, depending
on the state of the RSTSEL pin. When
15 1 V
16 2 V
17 N/A EPAD Exposed Pad. The exposed pad must be tied to GND.
REF
B Analog Output Voltage from DAC B. The output amplifier has rail-to-rail operation.
OUT
Power-On Reset Pin. When this pin is tied to GND, all four DACs are powered up to zero scale.
When this pin is tied to V
Reference Voltage. The AD5316R has an internal reference. When the internal reference is used,
V
is the reference output pin. When an external reference is used, V
REF
pin. By default, the internal reference is used, and this pin is a reference output.
Rev. A | Page 7 of 24
Figure 4. 16-Lead TSSOP Pin Configuration
, all four DAC outputs have a span of 0 V to 2 × V
DD
RESET is low, all LDAC pulses are ignored.
, all four DACs are powered up to midscale.
DD
.
REF
is the reference input
REF
REF
.
AD5316R Data Sheet
–40–20020406080100120
V
REF
(V)
TEMPERATURE (°C)
DEVICE 1
DEVICE 2
DEVICE 3
DEVICE 4
DEVICE 5
2.4980
2.4985
2.4990
2.4995
2.5000
2.5005
2.5010
2.5015
2.5020
V
DD
= 5V
10819-212
90
0
10
20
30
40
50
60
70
80
00.51.0 1.5 2.0 2.53.0 3.54.0 4.5 5.0
NUMBER OF UNI TS
TEMPERAT URE DRIFT (ppm/°C)
VDD = 5V
10819-250
60
0
10
20
30
40
50
2.4982.4992.5002.5012.502
HITS
V
REF
(V)
0 HOUR
168 HOURS
500 HOURS
1000 HOURS
VDD = 5.5V
10819-251
1600
0
200
400
600
800
1000
1200
1400
101001k10k100k1M
NSD (nV/ Hz)
FREQUENCY ( Hz )
V
DD
= 5V
T
A
= 25°C
10819-111
CH1 2µVM1.0s
1
V
DD
= 5V
T
A
= 25°C
10819-112
2.5000
2.4999
2.4998
2.4997
2.4996
2.4995
2.4994
2.4993
–0.005–0.003–0.0010.0010.0030.005
V
REF
(V)
I
LOAD
(A)
VDD = 5V
T
A
= 25°C
10819-113
TYPICAL PERFORMANCE CHARACTERISTICS
Figure 5. Internal Reference Voltage vs. Temperature
Figure 6. Reference Output Temperature Drift Histogram
Figure 8. Internal Reference Noise Spectral Density vs. Frequency
Figure 9. Internal Reference Noise, 0.1 Hz to 10 Hz
Figure 7. Reference Long-Term Stability (Drift)
Figure 10. Internal Reference Voltage vs. Load Current
Rev. A | Page 8 of 24
Data Sheet AD5316R
2.5002
2.5000
2.4998
2.4996
2.4994
2.4992
2.4990
2.53.03.54.04.55.05.5
V
REF
(V)
SUPPLY VOLTAGE (V)
TA = 25°C
10819-117
DEVICE 1
DEVICE 3
DEVICE 2
10819-118
0.5
–0.5
–0.3
–0.1
0.1
0.3
0156312468624780936
INL (LSB)
CODE
VDD = 5V
T
A
= 25°C
INTERNAL RE FERENCE = 2.5V
DNL (LSB)
CODE
10819-119
0.5
–0.5
–0.3
–0.1
0.1
0.3
CODE
0156312468624780936
VDD = 5V
T
A
= 25°C
INTERNAL RE FERENCE = 2.5V
10
–10
–8
–6
–4
–2
0
2
4
6
8
–401106010
ERROR (LSB)
TEMPERATURE (°C)
INL
DNL
V
DD
= 5V
T
A
= 25°C
INTERNAL RE FERENCE = 2.5V
10819-124
10
–10
–8
–6
–4
–2
0
2
4
6
8
05.04.54.03.53.02.52.01.51.00.5
ERROR (LSB)
V
REF
(V)
INL
DNL
VDD = 5V
T
A
= 25°C
10819-125
10
–10
–8
–6
–4
–2
0
2
4
6
8
2.75.24.74.23.73.2
ERROR (LSB)
SUPPLY VOLTAGE (V)
INL
DNL
VDD = 5V
T
A
= 25°C
INTERNAL RE FERENCE = 2.5V
10819-126
Figure 11. Internal Reference Voltage vs. Supply Voltage
Figure 12. INL
Figure 14. INL Error and DNL Error vs. Temperature
Figure 15. INL Error and DNL Error vs. V
REF
Figure 13. DNL
Figure 16. INL Error and DNL Error vs. Supply Voltage
Rev. A | Page 9 of 24
AD5316R Data Sheet
0.10
–0.10
–0.08
–0.06
–0.04
–0.02
0
0.02
0.04
0.06
0.08
–40–20020406080100120
ERROR (% of FSR)
TEMPERATURE (°C)
GAIN ERROR
FULL-S CALE ERROR
V
DD
= 5V
T
A
= 25°C
INTERNAL RE FERENCE = 2.5V
10819-127
1.4
1.2
1.0
0.8
0.6
0.4
0.2
0
–40–20020406080100120
ERROR (mV)
TEMPERATURE (°C)
OFFSET ERROR
ZERO-CO DE E RROR
V
DD
= 5V
T
A
= 25°C
INTERNAL RE FERENCE = 2.5V
10819-128
0.10
–0.10
–0.08
–0.06
–0.04
–0.02
0
0.02
0.04
0.06
0.08
2.75.24.74.23.73.2
ERROR (% of FSR)
SUPPLY VOLTAGE (V)
GAIN ERROR
FULL-S CALE ERROR
VDD = 5V
T
A
= 25°C
INTERNAL RE FERENCE = 2.5V
10819-129
1.5
–1.5
–1.0
–0.5
0
0.5
1.0
2.75.24.74.23.73.2
ERROR (mV)
SUPPLY VOLTAGE (V)
ZERO-CO DE E RROR
OFFSET ERROR
V
DD
= 5V
T
A
= 25°C
INTERNAL RE FERENCE = 2.5V
10819-130
0.10
0.09
0.08
0.07
0.06
0.05
0.04
0.03
0.02
0.01
0
–40–200
20406080100120
TOTAL UNADJUS TED ERROR (% of FSR)
TEMPERATURE (°C)
VDD = 5V
T
A
= 25°C
INTERNAL RE FERENCE = 2.5V
10819-131
0.10
0.08
0.06
0.04
0.02
0
–0.02
–0.04
–0.06
–0.08
–0.10
2.75.24.74.23.73.2
TOTAL UNADJUS TED ERROR (% of FSR)
SUPPLY VOLTAGE (V)
VDD = 5V
T
A
= 25°C
INTERNAL RE FERENCE = 2.5V
10819-132
Figure 17. Gain Error and Full-Scale Error vs. Temperature
Figure 18. Zero-Code Error and Offset Error vs. Temperature
Figure 20. Zero-Code Error and Offset Error vs. Supply Voltage
Figure 21. TUE vs. Temperature
Figure 19. Gain Error and Full-Scale Error vs. Supply Voltage
Figure 22. TUE vs. Supply Voltage, Gain = 1
Rev. A | Page 10 of 24
Data Sheet AD5316R
10819-133
0
–0.01
–0.02
–0.03
–0.04
–0.05
–0.06
–0.07
–0.08
–0.09
–0.10
0156312468624780936 1023
TOTAL UNADJUS TED ERROR (% of FSR)
CODE
VDD = 5V
T
A
= 25°C
INTERNAL RE FERENCE = 2.5V
25
20
15
10
5
0
540560580600620640
HITS
I
DD
(mA)
V
DD
= 5V
T
A
= 25°C
EXTERNAL
REFERENCE = 2. 5V
10819-135
30
25
20
15
10
5
0
10001020104010601080110011201140
HITS
IDD FULL SCALE (mA)
V
DD
= 5V
T
A
= 25°C
INTERNAL
REFERENCE = 2. 5V
10819-136
1.0
–1.0
–0.8
–0.6
–0.4
–0.2
0
0.2
0.4
0.6
0.8
051015202530
ΔV
OUT
(V)
LOAD CURRENT ( mA)
SOURCING, 2.7V
SOURCING, 5V
SINKING, 2.7V
SINKING, 5V
10819-200
7
–2
–1
0
1
2
3
4
5
6
–0.06–0.04–0.0200.020.040.06
V
OUT
(V)
LOAD CURRENT ( A)
0xFFFF
0x4000
0x8000
0xC000
0x0000
VDD = 5V
T
A
= 25°C
INTERNAL
REFERENCE = 2. 5V
GAIN = 2
10819-138
5
–2
–1
0
1
2
3
4
–0.06–0.04–0.0200.020.040.06
V
OUT
(V)
LOAD CURRENT ( A)
0xFFFF
0x4000
0x8000
0xC000
0x0000
V
DD
= 3V
T
A
= 25°C
EXTERNAL RE FERENCE = 2.5V
GAIN = 1
10819-139
Figure 23. TUE vs. Code
Figure 24. IDD Histogram with External Reference, 5 V
Figure 26. Headroom/Footroom vs. Load Current
Figure 27. Source and Sink Capability at 5 V
Figure 25. I
Histogram with Internal Reference, V
DD
= 2.5 V, Gain = 2
REF
Figure 28. Source and Sink Capability at 3 V
Rev. A | Page 11 of 24
AD5316R Data Sheet
0
0.2
0.4
0.6
0.8
1.0
1.2
1.4
–401106010
CURRENT (mA)
TEMPERATURE (°C)
FULL-SCALE
ZERO CODE
EXTERNAL RE FERENCE, FULL-SCALE
10819-140
0
4.0
3.5
3.0
2.5
2.0
1.5
1.0
0.5
10320160408020
V
OUT
(V)
TIME (µs)
V
OUT
A
V
OUT
B
V
OUT
C
V
OUT
D
V
DD
= 5V
T
A
= 25°C
INTERNAL RE FERENCE = 2.5V
¼ TO ¾ SCALE
10819-141
–0.01
0
0.06
0.01
0.02
0.03
0.04
0.05
–1
0
6
1
2
3
4
5
–10151005–5
V
OUT
(V)
V
DD
(V)
TIME (µs)
V
OUT
D
V
DD
V
OUT
A
V
OUT
B
V
OUT
C
T
A
= 25°C
INTERNAL RE FERENCE = 2.5V
10819-142
0
1
3
2
–51005
V
OUT
(V)
TIME (µs)
V
OUT
D
V
OUT
A
V
OUT
B
V
OUT
C
V
DD
= 5V
T
A
= 25°C
INTERNAL RE FERENCE = 2.5V
GAIN = 1
GAIN = 2
10819-143
2.4988
2.5008
2.5003
2.4998
2.4993
012810462
V
OUT
(V)
TIME (µs)
CHANNEL B
T
A
= 25°C
V
DD
= 5.25V
INTERNAL RE FERENCE = 2.5V
CODE = 0x7FF F TO 0x8000
ENERGY = 0. 227206nV-sec
10819-144
–0.002
–0.001
0
0.001
0.002
0.003
0252010155
V
OUT
AC-COUPLED ( V )
TIME (µs)
10819-145
V
OUT
B
V
OUT
C
V
OUT
D
Figure 29. Supply Current vs. Temperature
Figure 32. Exiting Power-Down to Midscale
Figure 30. Settling Time
Figure 31. Power-On Reset to 0 V
Figure 33. Digital-to-Analog Glitch Impulse
Figure 34. Analog Crosstalk, V
Rev. A | Page 12 of 24
OUT
A
Data Sheet AD5316R
CH1 10µVM1.0sA CH1 802mV
1
T
V
DD
= 5V
T
A
= 25°C
EXTERNAL RE FERENCE = 2.5V
10819-146
CH1 10µVM1.0sA CH1 802mV
1
T
V
DD
= 5V
T
A
= 25°C
INTERNAL RE FERENCE = 2.5V
10819-147
0
200
400
600
800
1000
1200
1400
1600
101M100k1k10k100
NSD (nV/ Hz)
FREQUENCY ( Hz )
FULL-SCALE
MIDSCALE
ZERO-SCALE
V
DD
= 5V
T
A
= 25°C
INTERNAL RE FERENCE = 2.5V
10819-148
–180
–160
–140
–120
–100
–80
–60
–40
–20
0
20
02000016000800012000400020001800010000140006000
THD (dBV)
FREQUENCY ( Hz )
VDD = 5V
T
A
= 25°C
INTERNAL RE FERENCE = 2.5V
10819-149
3.0
3.1
3.2
3.3
3.4
3.5
3.6
3.7
3.8
3.9
4.0
1.5901.6301.6201.6001.6101.6251.6051.6151.595
V
OUT
(V)
TIME (ms)
0nF
0.1nF
0.22nF
4.7nF
10nF
VDD = 5V
T
A
= 25°C
INTERNAL RE FERENCE = 2.5V
10819-150
Figure 35. 0.1 Hz to 10 Hz Output Noise Plot, 2.5 V External Reference
Figure 36. 0.1 Hz to 10 Hz Output Noise Plot, 2.5 V Internal Reference
Figure 38. Total Harmonic Distortion at 1 kHz
Figure 39. Settling Time vs. Capacitive Load
Figure 37. Noise Spectral Density
Rev. A | Page 13 of 24
AD5316R Data Sheet
TERMINOLOGY
Relative Accuracy or Integral Nonlinearity (INL)
Relative accuracy or integral nonlinearity is a measurement of
the maximum deviation, in LSBs, from a straight line passing
through the endpoints of the DAC transfer function. Figure 12
shows a typical INL vs. code plot.
Differential Nonlinearity (DNL)
Differential nonlinearity is the difference between the measured
change and the ideal 1 LSB change between any two adjacent
codes. A specified differential nonlinearity of ±1 LSB maximum
ensures monotonicity. The AD5316R is guaranteed monotonic
by design. Figure 13 shows a typical DNL vs. code plot.
Zero-Code Error
Zero-code error is a measurement of the output error when
zero code (0x0000) is loaded to the DAC register. Ideally, the
output should be 0 V. The zero-code error is always positive in
the AD5316R because the output of the DAC cannot go below
0 V due to a combination of the offset errors in the DAC and
the output amplifier. Zero-code error is expressed in mV.
Figure 18 shows a plot of zero-code error vs. temperature.
Full-Scale Error
Full-scale error is a measurement of the output error when fullscale code (0xFFFF) is loaded to the DAC register. Ideally, the
output should be V
− 1 LSB. Full-scale error is expressed as a
DD
percentage of the full-scale range (% of FSR). Figure 17 shows a
plot of full-scale error vs. temperature.
Gain Error
Gain error is a measurement of the span error of the DAC. It is
the deviation in slope of the DAC transfer characteristic from
the ideal expressed in % of FSR.
Gain Temperature Coefficient
Gain temperature coefficient is a measurement of the change in
gain error with changes in temperature. It is expressed in ppm
of FSR/°C.
Offset Error
Offset error is a measurement of the difference between V
(actual) and V
(ideal) expressed in mV in the linear region
OUT
OUT
of the transfer function. It can be negative or positive.
Offset Error Drift
Offset error drift is a measurement of the change in offset error
with changes in temperature. It is expressed in µV/°C.
DC Power Supply Rejection Ratio (PSRR)
DC PSRR indicates how the output of the DAC is affected by
changes in the supply voltage. PSRR is the ratio of the change
in V
to a change in VDD for midscale output of the DAC. It
OUT
is measured in mV/V. V
is held at 2.5 V, a nd VDD is varied
REF
by ±10%.
Rev. A | Page 14 of 24
Output Voltage Settling Time
The output voltage settling time is the amount of time it takes
for the output of a DAC to settle to a specified level for a ¼ to ¾
full-scale input change.
Digital-to-Analog Glitch Impulse
Digital-to-analog glitch impulse is the impulse injected into the
analog output when the input code in the DAC register changes
state. It is normally specified as the area of the glitch in nV-sec,
and is measured when the digital input code is changed by 1 LSB
at the major carry transition (0x7FFF to 0x8000) (see Figure 33).
Digital Feedthrough
Digital feedthrough is a measurement of the impulse injected
into the analog output of the DAC from the digital inputs of the
DAC, but is measured when the DAC output is not updated. It
is specified in nV-sec and measured with a full-scale code change
on the data bus, that is, from all 0s to all 1s and vice versa.
Noise Spectral Density (NSD)
Noise spectral density is a measurement of the internally generated random noise. Random noise is characterized as a spectral
density (nV/√Hz) and is measured by loading the DAC to midscale and measuring noise at the output. It is measured in nV/√Hz.
Figure 37 shows a plot of noise spectral density.
DC Crosstalk
DC crosstalk is the dc change in the output level of one DAC
in response to a change in the output of another DAC. It is
measured with a full-scale output change on one DAC (or soft
power-down and power-up) while monitoring another DAC
kept at midscale. It is expressed in μV.
DC crosstalk due to load current change is a measurement
of the impact that a change in load current on one DAC has
on another DAC kept at midscale. It is expressed in μV/mA.
Digital Crosstalk
Digital crosstalk is the glitch impulse transferred to the output
of one DAC at midscale in response to a full-scale code change
(all 0s to all 1s and vice versa) in the input register of another
DAC. It is expressed in nV-sec.
Analog Crosstalk
Analog crosstalk is the glitch impulse transferred to the output
of one DAC in response to a change in the output of another DAC.
To measure analog crosstalk, load one of the input registers with
a full-scale code change (all 0s to all 1s and vice versa), and then
execute a software LDAC and monitor the output of the DAC
whose digital code was not changed. The area of the glitch is
expressed in nV-sec.
Data Sheet AD5316R
DAC-to-DAC Crosstalk
DAC-to-DAC crosstalk is the glitch impulse transferred to the
output of one DAC in response to a digital code change and
subsequent analog output change of another DAC. It is measured
by loading one channel with a full-scale code change (all 0s to
all 1s and vice versa) using the write to and update commands
while monitoring the output of another channel that is at midscale. The energy of the glitch is expressed in nV-sec.
Total Harmonic Distortion (THD)
THD is the difference between an ideal sine wave and its
attenuated version using the DAC. The sine wave is used as the
reference for the DAC; THD is a measurement of the harmonics
present on the DAC output. It is measured in dB.
Voltage Reference Temperature Coefficient (TC)
Voltage reference TC is a measurement of the change in the
reference output voltage with a change in temperature. The
reference TC is calculated using the box method, which defines
the TC as the maximum change in the reference output over a
given temperature range expressed in ppm/°C, as follows:
TC
=
REFnom
−
VV
REFminREFmax
×
TempRangeV
6
10×
where:
V
is the maximum reference output measured over the
REFmax
total temperature range.
V
is the minimum reference output measured over the total
REFmin
temperature range.
V
is the nominal reference output voltage, 2.5 V.
REFnom
TempRange is the specified temperature range of −40°C to
+105°C.
Rev. A | Page 15 of 24
AD5316R Data Sheet
×=
N
REF
OUT
D
GainVV
2
INPUT
REGISTER
2.5V
REF
DAC
REGISTER
RESISTOR
STRING
REF (+)
V
REF
GND
REF (–)
V
OUT
X
GAIN
(GAIN = 1 OR 2)
10819-052
R
R
R
R
R
TO OUTPUT
AMPLIFIER
V
REF
10819-053
THEORY OF OPERATION
DIGITAL-TO-ANALOG CONVERTER
The AD5316R is a quad, 10-bit, serial input, voltage output
DAC with an internal reference. The part operates from supply
voltages of 2.7 V to 5.5 V. Data is written to the AD5316R in a
24-bit word format via a 2-wire serial interface. The AD5316R
incorporates a power-on reset circuit to ensure that the DAC
output powers up to a known output state. The device also has
a software power-down mode that reduces the typical current
consumption to 1 µA.
TRANSFER FUNCTION
The internal reference is on by default. Because the input coding
to the DAC is straight binary, the ideal output voltage when using
an external reference is given by
where:
V
is the value of the external reference.
REF
Gain is the gain of the output amplifier and is set to 1 by default.
The gain can be set to 1 or 2 using the gain select pin. When the
GAIN pin is tied to GND, all four DAC outputs have a span of
0 V to V
have a span of 0 V to 2 × V
. When this pin is tied to VDD, all four DAC outputs
REF
.
REF
D is the decimal equivalent of the binary code that is loaded to
the DAC register (0 to 1023).
N is the DAC resolution (10 bits).
DAC ARCHITECTURE
The DAC architecture consists of a string DAC followed by an
output amplifier. Figure 40 shows a block diagram of the DAC
architecture.
Figure 40. Single DAC Channel Architecture Block Diagram
The resistor string structure is shown in Figure 41. Each resistor
in the string has a value R. The code loaded to the DAC register
determines the node on the string from which the voltage is
tapped off and fed into the output amplifier. The voltage is
tapped off by closing one of the switches that connect the string
to the amplifier. Because the AD5316R is a string of resistors, it
is guaranteed monotonic.
Figure 41. Resistor String Structure
Internal Reference
The AD5316R on-chip reference is on at power-up but can be
disabled via a write to a control register. For more information,
see the Internal Reference Setup section.
The 2.5 V, 2 ppm/°C internal reference provides a full-scale
output of 2.5 V or 5 V, depending on the state of the GAIN pin.
The internal reference is available at the V
pin. This buffered
REF
reference is capable of driving external loads of up to 10 mA.
Output Amplifiers
The output buffer amplifier can generate rail-to-rail voltages on
its output for an output range of 0 V to V
depends on the value of V
, the GAIN pin, the offset error,
REF
. The actual range
DD
and the gain error. The GAIN pin selects the gain of the output.
•When this pin is tied to GND, all four outputs have a gain
of 1, and the output range is from 0 V to V
•When this pin is tied to V
, all four outputs have a gain
DD
of 2, and the output range is from 0 V to 2 × V
REF
.
.
REF
The output amplifiers are capable of driving a load of 1 kΩ in
parallel with 2 nF to GND. The slew rate is 0.8 V/µs with a ¼
to ¾ scale settling time of 5 µs.
C3C2C1C0 DAC D DAC C DAC B DAC A D9D8D7D6D5D4D3D2D1D0XXXXXX
COMMANDDAC ADDRESSDAC DATADAC DATA
COMMAND BYTEDATA HIGH BYTEDATA LOW BYTE
10819-300
SERIAL INTERFACE
The AD5316R has a 2-wire, I2C-compatible serial interface (see
2
C-Bus Specification, Version 2.1, January 2000, available
the I
from Philips Semiconductor). See Figure 2 for a timing diagram
of a typical write sequence. The AD5316R can be connected to
2
an I
C bus as a slave device, under the control of a master device.
The AD5316R supports standard (100 kHz) and fast (400 kHz)
data transfer modes. Support is not provided for 10-bit addressing or general call addressing.
Input Shift Register
The input shift register of the AD5316R is 24 bits wide. Data
is loaded into the device, MSB first, as a 24-bit word under the
control of the serial clock input, SCL. The input shift register
consists of an 8-bit command byte and a 16-bit data-word (see
Figure 42). The first eight MSBs make up the command byte.
•The first four bits of the command byte are the command
bits (C3, C2, C1, and C0), which control the mode of
operation of the device (see Tab le 8).
•The last four bits of the command byte are the address bits
(DAC D, DAC C, DAC B, and DAC A), which select the
DAC that is operated on by the command (see Tabl e 9).
Table 8. Command Definitions
Command Bits
C3 C2 C1 C0 Command
0 0 0 0 No operation
0 0 0 1
0 0 1 0
0 0 1 1 Write to and update DAC Channel n
0 1 0 0 Power down/power up DAC
0 1 0 1
0 1 1 0 Software reset (power-on reset)
1 X1 X1 X1 Reserved
1
X = don’t care.
Write to Input Register n (dependent
LDAC)
on
Update DAC Register n with contents
of Input Register n
Hardware
LDAC mask register
Table 9. Address Bits and Selected DACs
Address Bits
Selected DAC Channels
0 0 0 1 DAC A
0 0 1 0 DAC B
0 0 1 1 DAC A and DAC B
0 1 0 0 DAC C
0 1 0 1 DAC A and DAC C
0 1 1 0 DAC B and DAC C
0 1 1 1 DAC A, DAC B, and DAC C
1 0 0 0 DAC D
1 0 0 1 DAC A and DAC D
… … … … …
1
Any combination of DAC channels can be selected using the address bits.
The 8-bit command byte is followed by two data bytes, which contain the data-word. The data-word comprises the 10-bit input code,
followed by six don’t care bits (see Figure 42). The data bits are
transferred to the input register on the 24 falling edges of SCL.
Commands can be executed on one DAC channel, any two or
three DAC channels, or on all four DAC channels, depending
on the address bits selected (see Table 9).
WRITE AND UPDATE COMMANDS
For more information about the
LDAC
DAC (Hardware
Pin) section.
Write to Input Register n (Dependent on
Command 0001 allows the user to write to each DAC’s
dedicated input register individually. When
input register is transparent (if not controlled by the
mask register).
Update DAC Register n with Contents of Input Register n
Command 0010 loads the DAC registers/outputs with the
contents of the input registers selected by the address bits
(see Tabl e 9) and updates the DAC outputs directly.
Write to and Update DAC Channel n (Independent of
Command 0011 allows the user to write to the DAC registers
and update the DAC outputs directly, independent of the state
LDAC
of the
pin.
LDAC
function, see the Load
LDAC
LDAC
)
is low, the
LDAC
LDAC
)
1
DAC D DAC C DAC B DAC A
Figure 42. Input Shift Register Contents
Rev. A | Page 17 of 24
AD5316R Data Sheet
V
GND 1 0
FRAME 2
COMMAND BYTE
FRAME 1
SLAVE ADDRESS
1991
SCL
START BY
MASTER
ACK BY
AD5316R
ACK BY
AD5316R
SDA
R/W
DB23A0A110001DB22 DB21 DB20 DB19 DB18 DB17 DB16
1991
ACK BY
AD5316R
ACK BY
AD5316R
FRAME 4
LEAST SIGNIFICANT
DATA BYTE
FRAME 3
MOST SIGNIFICANT
DATA BYTE
STOP BY
MASTER
SCL
(CONTINUED)
SDA
(CONTINUED)
DB15 DB14 DB13 DB12 DB11 DB10 DB9
DB8
DB7 DB6 DB5 DB4 DB3 DB2 DB1 DB0
10819-303
I2C SLAVE ADDRESS
The AD5316R has a 7-bit I2C slave address. The five MSBs are
00011 and the two LSBs (A1 and A0) are set by the state of the
A1 and A0 address pins. The ability to make hardwired changes
to A1 and A0 allows the user to incorporate up to four AD5316R
devices on one bus (see Table 10).
Table 10. Device Address Selection
A1 Pin Connection A0 Pin Connection A1 Bit A0 Bit
GND GND 0 0
GND V
LOGI C
V
V
LOGI C
0 1
LOGI C
1 1
LOGI C
SERIAL OPERATION
The 2-wire I2C serial bus protocol operates as follows:
1. The master initiates a data transfer by establishing a start
condition when a high-to-low transition on the SDA line
occurs while SCL is high. The following byte is the address
byte, which consists of the 7-bit slave address.
2. The slave device with the transmitted address responds by
pulling SDA low during the 9
the acknowledge bit). At this stage, all other devices on the
bus remain idle while the selected device waits for data to
be written to, or read from, its input shift register.
th
clock pulse (this is called
3. Data is transmitted over the serial bus in sequences of nine
clock pulses (eight data bits followed by an acknowledge bit).
Transitions on the SDA line must occur during the low period
of SCL; SDA must remain stable during the high period of SCL.
4. After all data bits are read or written, a stop condition is
established. In write mode, the master pulls the SDA line high
during the 10
read mode, the master issues a no acknowledge for the 9
th
clock pulse to establish a stop condition. In
th
clock pulse (that is, the SDA line remains high). The master
then brings the SDA line low before the 10
then high again during the 10
th
clock pulse to establish a
th
clock pulse and
stop condition.
WRITE OPERATION
When writing to the AD5316R, the user must begin with a start
W
command followed by an address byte (R/
DAC acknowledges that it is prepared to receive data by pulling
SDA low. The AD5316R requires two bytes of data for the DAC
and a command byte that controls various DAC functions. Three
bytes of data must, therefore, be written to the DAC with the
command byte followed by the most significant data byte and the
least significant data byte, as shown in Figure 43. All these data
bytes are acknowledged by the AD5316R. A stop condition follows.
When reading data back from the AD5316R, the user must begin
W
with a start command followed by an address byte (R/
which the DAC acknowledges that it is prepared to receive data
by pulling SDA low. The address byte must be followed by the
command byte, which determines both the read command that
is to follow and the pointer address to read from; the command
byte is also acknowledged by the DAC. The user configures the
channel to read back the contents of one or more DAC registers
and sets the readback command to active using the command byte.
Following this, the master establishes a repeated start condition,
and the address is resent with R/
W
= 1. This byte is acknowledged
by the DAC, indicating that it is prepared to transmit data. Two
bytes of data are then read from the DAC, as shown in Figure 44.
A NACK condition from the master, followed by a stop condition,
completes the read sequence. If more than one DAC is selected,
Channel A is read back by default.
= 0), after
MULTIPLE DAC READBACK SEQUENCE
When reading data back from multiple AD5316R DACs, the
W
user begins with an address byte (R/
DAC acknowledges that it is prepared to receive data by pulling
SDA low. The address byte must be followed by the command
byte, which is also acknowledged by the DAC. The user selects
the first channel to read back using the command byte.
Following this, the master establishes a repeated start condition,
and the address is resent with R/
by the DAC, indicating that it is prepared to transmit data. The
first two bytes of data are then read from DAC Input Register n
(selected using the command byte), most significant byte first, as
shown in Figure 44. The next two bytes read back are the contents
of DAC Input Register n + 1, and the next bytes read back are the
contents of DAC Input Register n + 2. Data is read from the DAC
input registers in this auto-incremented fashion until a NACK
followed by a stop condition follows. If the contents of DAC Input
Register D are read out, the next two bytes of data that are read
are the contents of DAC Input Register A.
= 0), after which the
W
= 1. This byte is acknowledged
Figure 44. I
2
C Read Operation
Rev. A | Page 19 of 24
AD5316R Data Sheet
RESISTOR
NETWORK
V
OUT
X
DAC
POWER-DOWN
CIRCUITRY
AMPLIFIER
10819-058
SDA
SCL
V
OUT
X
DAC
REGISTER
INPUT SHIFT
REGISTER
OUTPUT
AMPLIFIER
LDAC
V
REF
INPUT
REGISTER
10-BIT
DAC
10819-059
POWER-DOWN OPERATION
Command 0100 is designated for the power-down function.
The AD5316R provides three separate power-down modes
(see Table 11). These power-down modes are software programmable by setting Bit DB7 to Bit DB0 in the input shift register
(see Tabl e 12). Two bits are associated with each DAC channel.
Table 11 shows how the state of these two bits corresponds to
= 5 V.
DD
pin.
the mode of operation of the device.
Table 11. Modes of Operation
Operating Mode PDx1 PDx0
Normal Operation 0 0
Power-Down Modes
1 kΩ to GND 0 1
100 kΩ to GND 1 0
Three-State 1 1
Any or all DACs (DAC A to DAC D) can be powered down
to the selected mode by setting the corresponding bits in the
input shift register. See Table 12 for the contents of the input
shift register during the power-down/power-up operation.
When both Bit PDx1 and Bit PDx0 (where x is the DAC selected)
in the input shift register are set to 0, the part works normally
with its normal power consumption of 1.1 mA at 5 V. When Bit
PDx1, Bit PDx0, or both Bit PDx1 and Bit PDx0 are set to 1, the
part is in power-down mode. In power-down mode, the supply
current falls to 4 μA at 5 V.
In power-down mode, the output stage is internally switched
from the output of the amplifier to a resistor network of known
values. In this way, the output impedance of the part is known
when the part is in power-down mode.
Table 11 lists the three power-down options. The output is
connected internally to GND through either a 1 kΩ or a 100 kΩ
resistor, or it is left open-circuited (three-state). The output stage
is illustrated in Figure 45.
Figure 45. Output Stage During Power-Down
The bias generator, output amplifier, resistor string, and other
associated linear circuitry are shut down when power-down
mode is activated. However, the contents of the DAC registers
are unaffected in power-down mode, and the DAC registers can
be updated while the device is in power-down mode. The time
required to exit power-down is typically 2.5 µs for V
To reduce the current consumption further, the on-chip reference
can be powered off (see the Internal Reference Setup section).
LOAD DAC (HARDWARE LDAC PIN)
The AD5316R DAC has double buffered interfaces consisting of
two banks of registers: input registers and DAC registers. The user
can write to any combination of the input registers (see Tab le 9).
Updates to the DAC registers are controlled by the
Figure 46. Simplified Diagram of Input Loading Circuitry for a Single DAC
LDAC
Table 12. 24-Bit Input Shift Register Contents for Power-Down/Power-Up Operation1
DB23
(MSB) DB22 DB21 DB20 DB19 to DB16
DB15
to DB8 DB7 DB6 DB5 DB4 DB3 DB2 DB1
0 1 0 0 X X PDD1 PDD0 PDC1 PDC0 PDB1 PDB0 PDA1 PDA0
1
X = don’t care.
Command bits (C3 to C0)
Address bits
(don’t care)
Don’t
care
Power-down
select, DAC D
Power-down
select, DAC C
Power-down
select, DAC B
Power-down
select, DAC A
Rev. A | Page 20 of 24
DB0
(LSB)
Data Sheet AD5316R
Instantaneous DAC Updating (
For instantaneous updating of the DACs,
LDAC
Held Low)
LDAC
is held low while
data is clocked into the input register using Command 0001. Both
the addressed input register and the DAC register are updated on
th
the 24
clock, and the output begins to change (see Table 14).
Deferred DAC Updating (
For deferred updating of the DACs,
LDAC
Pulsed Low)
LDAC
is held high while data
is clocked into the input register using Command 0001. All DAC
outputs are asynchronously updated by pulling
th
24
clock. The update occurs on the falling edge of
LDAC
low after the
LDAC
.
LDAC MASK REGISTER
Command 0101 is reserved for the software
When this command is executed, the address bits are ignored.
When writing to the DAC using Command 0101, the 4-bit
mask register (DB3 to DB0) is loaded. Bit DB3 of the
register corresponds to DAC D; Bit DB2 corresponds to DAC C;
Bit DB1 corresponds to DAC B; and Bit DB0 corresponds to
DAC A.
The default value of these bits is 0; that is, the
normally. Setting any of these bits to 1 forces the selected DAC
channel to ignore transitions on the
state of the hardware
LDAC
pin. This flexibility is useful in appli-
LDAC
cations where the user wishes to select which channels respond
LDAC
to the
LDAC
The
control over the hardware
LDAC
ware
pin.
mask register allows the user extra flexibility and
LDAC
pin (see Table 13). Setting the
bit (DB3 to DB0) to 0 for a DAC channel allows the hard-
LDAC
pin to control the updating of that channel.
LDAC
function.
LDAC
LDAC
mask
LDAC
pin works
pin, regardless of the
Table 13.
LDAC
(DB3 to DB0)
0 1 or 0
1 X1
1
X = don’t care.
HARDWARE RESET PIN (
RESET
to either zero scale or midscale. The clear code value is user selectable via the reset select pin (RSTSEL). It is necessary to keep
RESET
When the
the cleared value until a new value is programmed. The outputs
cannot be updated with a new value while the
There is also a software executable reset function that resets the
DAC to the power-on reset code. Command 0110 is designated
for this software reset function (see Table 8). Any events on
LDAC
RESET SELECT PIN (RSTSEL)
The AD5316R contains a power-on reset circuit that controls
the output voltage during power-up. When the RSTSEL pin is
tied to GND, the outputs power up to zero scale (note that this
is outside the linear region of the DAC). When the RSTSEL pin
is tied to V
remain powered up at the level set by the RSTSEL pin until a
valid write sequence is made to the DAC.
LDAC
Overwrite Definition
Load
Bit
LDAC
Register
Pin
LDAC
Operation
LDAC
Determined by the LDAC
DAC channels are updated. (DAC
channels see LDAC
RESET
)
pin as 1.)
is an active low reset that allows the outputs to be cleared
low for a minimum of 30 ns to complete the operation.
RESET
signal is returned high, the output remains at
RESET
pin is low.
RESET
or
during power-on reset are ignored.
, the outputs power up to midscale. The outputs
DD
pin.
Table 14. Write Commands and
Command Description
0001
0010
0011 Write to and update DAC Channel n V
1
A high to low transition on the hardware
masked (blocked) by the
2
When the
Write to Input Register n (dependent on LDAC
Update DAC Register n with contents of Input
Register n
LDAC
pin is permanently tied low, the
LDAC
LDAC
LDAC
mask register.
Pin Truth Table1
)
pin always updates the contents of the DAC register with the contents of the input register on channels that are not
mask bits are ignored.
LDAC
Rev. A | Page 21 of 24
Hardware
Pin State
V
Data update No change (no update)
LOGI C
GND2 Data update Data update
No change
V
LOGI C
GND No change
Data update Data update
LOGI C
GND Data update Data update
LDAC
Input Register
Contents DAC Register Contents
Updated with input register
contents
Updated with input register
contents
AD5316R Data Sheet
60
0
10
20
30
40
50
2.4982.4992.5002.5012.502
HITS
V
REF
(V)
POSTSOLDER
HEAT REFLOW
PRESOLDER
HEAT REFLOW
10819-060
60
0
10
20
30
40
50
2.4982.4992.5002.5012.502
HITS
V
REF
(V)
0 HOUR
168 HOURS
500 HOURS
1000 HOURS
10819-061
9
8
7
6
5
4
3
2
1
0
500–50–100–150–200
HITS
DISTORTION (ppm)
FIRST TEMPERATURE SWEEP
SUBSEQUENT TEMPERATURE SWEEPS
10819-062
INTERNAL REFERENCE SETUP
By default, the internal reference is on at power-up. To re duc e
the supply current, the on-chip reference can be turned off.
Command 0111 is reserved for setting up the internal reference.
To turn off the internal reference, set the software programmable
bit, DB0, in the input shift register using Command 0111, as
shown in Table 16. Tab le 15 shows how the state of the DB0 bit
corresponds to the mode of operation.
As with all IC reference voltage circuits, the reference value
experiences a shift induced by the soldering process. Analog
Devices, Inc., performs a reliability test called precondition to
mimic the effect of soldering a device to a board. The output
voltage specification in Table 2 includes the effect of this
reliability test.
Figure 47 shows the effect of solder heat reflow (SHR) as
measured through the reliability test (precondition).
LONG-TERM TEMPERATURE DRIFT
Figure 48 shows the change in the V
in life test at 150°C.
Figure 48. Reference Drift to 1000 Hours
value after 1000 hours
REF
THERMAL HYSTERESIS
Thermal hysteresis is the voltage difference induced on the
reference voltage by sweeping the temperature from ambient
to cold, then to hot, and then back to ambient.
Thermal hysteresis data is shown in Figure 49. It is measured by
sweeping the temperature from ambient to −40°C, then to +105°C,
and then back to ambient. The V
the two ambient measurements (shown in blue in Figure 49). The
same temperature sweep and measurements were immediately
repeated, and the results are shown in red in Figure 49.
DB23 (MSB) DB22 DB21 DB20 DB19 to DB16 DB15 to DB1 DB0 (LSB)
0 1 1 1 X X 1 or 0
1
X = don’t care.
Command bits (C3 to C0) Address bits (don’t care) Don’t care Reference setup register
Rev. A | Page 22 of 24
Figure 49. Thermal Hysteresis
ADSP-BF531
SCL
GPIO1
SDAGPIO2
LDACPF9
RESETPF8
AD5316R
10819-164
AD5316R
GND
PLANE
BOARD
10819-166
ENCODE
SERIAL
CLOCK IN
CONTROLLER
ADuM1400
SERIAL
DATA OUT
RESET OUT
LOAD DAC
OUT
DECODE
TO
SCL
TO
SDA
TO
RESET
TO
LDAC
V
IA
V
OA
ENCODEDECODE
V
IB
V
OB
ENCODEDECODE
V
IC
V
OC
ENCODE
DECODE
V
ID
V
OD
10819-167
Data Sheet AD5316R
APPLICATIONS INFORMATION
MICROPROCESSOR INTERFACING
Microprocessor interfacing to the AD5316R is via a serial
bus that uses a standard protocol that is compatible with DSP
processors and microcontrollers. The communications channel
requires a 2-wire interface consisting of a clock signal and a
data signal.
AD5316R TO ADSP-BF531 INTERFACE
The I2C interface of the AD5316R is designed for easy connection to industry-standard DSPs and microcontrollers. Figure 50
shows the AD5316R connected to the Analog Devices Blackfin®
processor. The Blackfin processor has an integrated I
that can be connected directly to the I
Figure 50. AD5316R to ADSP-BF531 Interface
2
C pins of the AD5316R.
2
LAYOUT GUIDELINES
In any circuit where accuracy is important, careful consideration of the power supply and ground return layout helps to
ensure the rated performance. The PCB on which the AD5316R
is mounted should be designed so that the AD5316R lies on the
analog plane.
The AD5316R should have ample supply bypassing of 10 µF
in parallel with 0.1 µF on each supply, located as close to the
package as possible, ideally right up against the device. The 10 µF
capacitor is the tantalum bead type. The 0.1 µF capacitor should
have low effective series resistance (ESR) and low effective series
inductance (ESI), such as the common ceramic types; these
capacitors provide a low impedance path to ground at high
frequencies to handle transient currents due to internal logic
switching.
In systems where many devices are on one board, it is often
useful to provide some heat sinking capability to allow the
power to dissipate easily.
The AD5316R LFCSP models have an exposed pad beneath the
device. Connect this pad to the GND supply for the part. For
optimum performance, use special considerations to design the
motherboard and to mount the package.
C port
Rev. A | Page 23 of 24
For enhanced thermal, electrical, and board level performance,
solder the exposed pad on the bottom of the LFCSP package
to the corresponding thermal land paddle on the PCB. Design
thermal vias into the PCB land paddle area to further improve
heat dissipation.
The GND plane on the device can be increased (as shown in
Figure 51) to provide a natural heat sinking effect.
Figure 51. Paddle Connection to Board
GALVANICALLY ISOLATED INTERFACE
In many process control applications, it is necessary to provide
an isolation barrier between the controller and the unit being
controlled to protect and isolate the controlling circuitry from
any hazardous common-mode voltages that may occur.
The Analog Devices iCoupler® products provide voltage isolation
in excess of 2.5 kV. The serial loading structure of the AD5316R
makes the part ideal for isolated interfaces because the number of
interface lines is kept to a minimum. Figure 52 shows a 4-channel
isolated interface to the AD5316R using the ADuM1400. For
more information, visit http://www.analog.com/icouplers.
Figure 52. Isolated Interface
AD5316R Data Sheet
3.10
3.00 SQ
2.90
0.30
0.23
0.18
1.75
1.60 SQ
1.45
08-16-2010-E
1
0.50
BSC
BOTTOM VIEWTOP VIEW
16
5
8
9
12
13
4
EXPOSED
PAD
PIN 1
INDICATOR
0.50
0.40
0.30
SEATING
PLANE
0.05 MAX
0.02 NOM
0.20 REF
0.25 MIN
COPLANARITY
0.08
PIN 1
INDICATOR
FOR PROP E R CONNECTION OF
THE EXPOSED PAD, REFER TO
THE PIN CO NFIGURATI ON AND
FUNCTIO N DE S CRIPTIONS
SECTION OF THIS DATA SHEET.