2.5 V to 5.5 V, 230 A, Dual Rail-to-Rail
Voltage Output 8-/10-/12-Bit DACs
FEATURES
AD5303: 2 Buffered 8-Bit DACs in 1 Package
A Version: ⴞ1 LSB INL, B Version: ⴞ0.5 LSB INL
AD5313: 2 Buffered 10-Bit DACs in 1 Package
A Version: ⴞ4 LSB INL, B Version: ⴞ2 LSB INL
AD5323: 2 Buffered 12-Bit DACs in 1 Package
A Version: ⴞ16 LSB INL, B Version: ⴞ8 LSB INL
16-Lead TSSOP Package
Micropower Operation: 300 A @ 5 V (Including
Reference Current)
Power-Down to 200 nA @ 5 V, 50 nA @ 3 V
2.5 V to 5.5 V Power Supply
Double-Buffered Input Logic
Guaranteed Monotonic by Design over All Codes
Buffered/Unbuffered Reference Input Options
Output Range: 0 V to V
or 0 V to 2 V
REF
REF
Power-On-Reset to 0 V
SDO Daisy-Chaining Option
Simultaneous Update of DAC Outputs via LDAC Pin
Asynchronous CLR Facility
Low Power Serial Interface with Schmitt-Triggered
APPLICATIONS
Portable Battery-Powered Instruments
Digital Gain and Offset Adjustment
Programmable Voltage and Current Sources
Programmable Attenuators
AD5303/AD5313/AD5323
*
GENERAL DESCRIPTION
The AD5303/AD5313/AD5323 are dual 8-, 10-, and 12-bit
buffered voltage output DACs in a 16-lead TSSOP package that
operate from a single 2.5 V to 5.5 V supply consuming 230 µA at
3V. Their on-chip output amplifiers allow the outputs to swing
rail-to-rail with a slew rate of 0.7 V/µs. The AD5303/AD5313/
AD5323 utilize a versatile 3-wire serial interface that operates at
clock rates up to 30 MHz and is compatible with standard SPI
®
,
QSPI™, MICROWIRE™, and DSP interface standards.
The references for the two DACs are derived from two reference
pins (one per DAC). These reference inputs may be configured as
buffered or unbuffered inputs. The parts incorporate a power-on
reset circuit, which ensures that the DAC outputs power-up to
0V and remain there until a valid write to the device takes place.
There is also an asynchronous active low CLR pin that clears
both DACs to 0 V. The outputs of both DACs may be updated
simultaneously using the asynchronous LDAC input. The parts
contain a power-down feature that reduces the current consumption of the devices to 200 nA at 5 V (50 nA at 3 V) and provides
software-selectable output loads while in power-down mode. The
parts may also be used in daisy-chaining applications using the
SDO pin.
The low power consumption of these parts in normal operation
makes them ideally suited to portable battery-operated equipment.
The power consumption is 1.5 mW at 5 V, 0.7 mW at 3 V,
reducing to 1 µW in power-down mode.
FUNCTIONAL BLOCK DIAGRAM
V
DD
BUF A
POWER-ON
RESET
INPUT
REGISTER
SYNC
SCLK
DIN
SDO
*Protected by U.S. Patent No. 5684481; other patents pending.
DCEN
INTERFACE
LOGIC
>
LDAC
CLR
INPUT
REGISTER
PD
DAC
REGISTER
DAC
REGISTER
BUF B
REV. A
Information furnished by Analog Devices is believed to be accurate and
reliable. However, no responsibility is assumed by Analog Devices for its
use, nor for any infringements of patents or other rights of third parties that
may result from its use. No license is granted by implication or otherwise
under any patent or patent rights of Analog Devices. Trademarks and
registered trademarks are the property of their respective companies.
Differential Nonlinearity± 0.2± 1±0.2± 1LSBGuaranteed Monotonic by Design over All Codes
Offset Error± 0.4± 3±0.4± 3% of FSRSee Figures 3 and 4
Gain Error± 0.15± 1±0.15± 1% of FSRSee Figures 3 and 4
Lower Deadband10601060mVSee Figures 3 and 4
Offset Error Drift
Gain Error Drift
Power Supply Rejection Ratio
DC Crosstalk
DAC REFERENCE INPUTS
V
Input Range1VDD1V
REF
V
Input Impedance>10>10MΩBuffered Reference Mode
REF
Reference Feedthrough–90–90dBFrequency = 10 kHz
5
5
5
5
5
–12–12ppm of FSR/°C
–5–5ppm of FSR/°C
–60–60dBVDD = ± 10%
Output Low Voltage0.40.4VI
Output High Voltage4.04.0VI
VDD = 3 V ± 10%
Output Low Voltage0.40.4VI
Output High Voltage2.42.4VI
Floating-State Leakage Current11µADCEN = GND
= 2 mA
SINK
SOURCE
= 2 mA
SINK
SOURCE
= 2 mA
= 2 mA
Floating State O/P Capacitance33pFDCEN = GND
POWER REQUIREMENTS
V
DD
IDD (Normal Mode)Both DACs Active and Excluding Load Currents
2.55.52.55.5VIDD specification is valid for all DAC codes.
VDD = 4.5 V to 5.5 V300450300450µABoth DACs in Unbuffered mode. VIH = VDD and
VDD = 2.5 V to 3.6 V230350230350µAV
IDD (Full Power-Down)
= GND. In Buffered mode, extra current is
IL
typically x µA per DAC where x = 5 µA + V
REF/RDAC
VDD = 4.5 V to 5.5 V0.210.21µA
VDD = 2.5 V to 3.6 V0.0510.051µA
DAC
DAC
.
REV. A–2–
AD5303/AD5313/AD5323
NOTES
1
See Terminology section.
2
Temperature range: A, B Version: –40°C to +105°C.
3
DC specifications tested with the outputs unloaded.
4
Linearity is tested using a reduced code range: AD5303 (Code 8 to 248); AD5313 (Code 28 to 995); AD5323 (Code 115 to 3981).
5
Guaranteed by design and characterization, not production tested.
6
In order for the amplifier output to reach its minimum voltage, offset error must be negative. In order for the amplifier output to reach its maximum voltage, V
and offset plus gain error must be positive.
Specifications subject to change without notice.
REF
= V
DD
(VDD = 2.5 V to 5.5 V; RL = 2 k⍀ to GND; CL = 200 pF to GND; all specifications T
1
AC CHARACTERISTICS
Parameter
2
otherwise noted.)
A, B Version
3
MinTypMaxUnitConditions/Comments
Output Voltage Settling TimeV
= VDD = 5 V
REF
MIN
to T
, unless
MAX
AD530368µs1/4 Scale to 3/4 Scale Change (0x40 to 0xC0)
AD531379µs1/4 Scale to 3/4 Scale Change (0x100 to 0x300)
AD5323810µs1/4 Scale to 3/4 Scale Change (0x400 to 0xC00)
Slew Rate0.7V/µs
Major-Code Transition Glitch Energy12nV-s1 LSB Change around Major Carry
(011 . . . 11 to 100 . . . 00)
Digital Feedthrough0.10nV-s
Analog Crosstalk0.01nV-s
DAC-to-DAC Crosstalk0.01nV-s
Multiplying Bandwidth200kHzV
Total Harmonic Distortion–70dBV
NOTES
1
Guaranteed by design and characterization, not production tested.
2
See Terminology section.
3
Temperature range: A, B Version: –40°C to +105°C.
Specifications subject to change without notice.
TIMING CHARACTERISTICS
Limit at T
MIN
, T
1, 2, 3
MAX
(VDD = 2.5 V to 5.5 V; all specifications T
= 2 V ± 0.1 V p-p, Unbuffered Mode
REF
= 2.5 V ± 0.1 V p-p, Frequency = 10 kHz
REF
to T
MIN
, unless otherwise noted.)
MAX
Parameter(A, B Version)UnitConditions/Comments
t
1
t
2
t
3
t
4
t
5
t
6
t
7
t
8
t
9
t
10
t
11
4, 5
t
12
4, 5
t
13
5
t
14
5
t
15
NOTES
1
Guaranteed by design and characterization, not production tested.
2
All input signals are specified with tr = tf = 5 ns (10% to 90% of VDD) and timed from a voltage level of (VIL + VIH)/2.
3
See Figures 1 and 2.
4
These are measured with the load circuit of Figure 1.
5
Daisy-chain mode only. (See Figure 23.)
Specifications subject to change without notice.
33ns minSCLK Cycle Time
13ns minSCLK High Time
13ns minSCLK Low Time
0ns minSYNC to SCLK Rising Edge Setup Time
5ns minData Setup Time
4.5ns minData Hold Time
0ns minSCLK Falling Edge to SYNC Rising Edge
100ns minMinimum SYNC High Time
20ns minLDAC Pulsewidth
20ns minSCLK Falling Edge to LDAC Rising Edge
20ns minCLR Pulsewidth
5ns minSCLK Falling Edge to SDO Invalid
20ns maxSCLK Falling Edge to SDO Valid
0ns minSCLK Falling Edge to SYNC Rising Edge
10ns minSYNC Rising Edge to SCLK Rising Edge
REV. A
–3–
AD5303/AD5313/AD5323
Figure 1. Load Circuit for Digital Output (SDO) Timing Specifications
SCLK
t
8
SYNC
*
DIN
LDAC
LDAC
DB15
I
2mA
TO
OUTPUT
PIN
C
L
50pF
2mA
t
1
t
t
t
4
t
6
t
5
3
2
DB0
OL
1.6V
I
OH
t
7
t
9
t
10
CLR
*
SEE INPUT SHIFT REGISTER SECTION
Figure 2. Serial Interface Timing Diagram
t
11
REV. A–4–
AD5303/AD5313/AD5323
ABSOLUTE MAXIMUM RATINGS
(TA = 25°C, unless otherwise noted.)
1, 2
VDD to GND . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +7 V
Digital Input Voltage to GND . . . . . . . . –0.3 V to V
Digital Output Voltage to GND . . . . . . –0.3 V to V
Reference Input Voltage to GND . . . . . –0.3 V to V
V
OUT
A, V
B to GND . . . . . . . . . . . . –0.3 V to VDD + 0.3 V
OUT
+ 0.3 V
DD
+ 0.3 V
DD
+ 0.3 V
DD
Operating Temperature Range
Industrial (A, B Version) . . . . . . . . . . . . . .–40°C to +105°C
Storage Temperature Range . . . . . . . . . . . . . –65°C to +150°C
Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only; functional operation of the
device at these or any other conditions above those listed in the operational sections
of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
2
Transient currents of up to 100 mA will not cause SCR latch-up.
AD5303ARU–40°C to +105°CThin Shrink Small Outline Package (TSSOP)RU-16
AD5303ARU-REEL7–40°C to +105°CThin Shrink Small Outline Package (TSSOP)RU-16
AD5313ARU–40°C to +105°CThin Shrink Small Outline Package (TSSOP)RU-16
AD5313ARU-REEL7–40°C to +105°CThin Shrink Small Outline Package (TSSOP)RU-16
AD5323ARU–40°C to +105°CThin Shrink Small Outline Package (TSSOP)RU-16
AD5323ARU-REEL7–40°C to +105°CThin Shrink Small Outline Package (TSSOP)RU-16
AD5303BRU–40°C to +105°CThin Shrink Small Outline Package (TSSOP)RU-16
AD5303BRU-REEL–40°C to +105°CThin Shrink Small Outline Package (TSSOP)RU-16
AD5303BRU-REEL7–40°C to +105°CThin Shrink Small Outline Package (TSSOP)RU-16
AD5313BRU–40°C to +105°CThin Shrink Small Outline Package (TSSOP)RU-16
AD5313BRU-REEL–40°C to +105°CThin Shrink Small Outline Package (TSSOP)RU-16
AD5313BRU-REEL7–40°C to +105°CThin Shrink Small Outline Package (TSSOP)RU-16
AD5323BRU–40°C to +105°CThin Shrink Small Outline Package (TSSOP)RU-16
AD5323BRU-REEL–40°C to +105°CThin Shrink Small Outline Package (TSSOP)RU-16
AD5323BRU-REEL7–40°C to +105°CThin Shrink Small Outline Package (TSSOP)RU-16
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection. Although the
AD5303/AD5313/AD5323 feature proprietary ESD protection circuitry, permanent damage may
occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD precautions
are recommended to avoid performance degradation or loss of functionality.
REV. A
–5–
AD5303/AD5313/AD5323
PIN FUNCTION DESCRIPTIONS
Pin No. Mnemonic Function
1CLRActive Low Control Input that Loads All Zeros to Both Input and DAC Registers.
2LDACActive Low Control Input that Transfers the Contents of the Input Registers to their Respective DAC Registers.
Pulsing this pin low allows either or both DAC registers to be updated if the input registers have new data.
This allows simultaneous update of both DAC outputs
3V
4V
5V
6V
DD
BReference Input Pin for DAC B. This is the reference for DAC B. It may be configured as a buffered or an
REF
AReference Input Pin for DAC A. This is the reference for DAC A. It may be configured as a buffered or an
REF
ABuffered Analog Output Voltage from DAC A. The output amplifier has rail-to-rail operation.
OUT
7BUF AControl Pin that Controls whether the Reference Input for DAC A is Unbuffered or Buffered. If this pin is
8BUF BControl Pin that Controls whether the Reference Input for DAC B is Unbuffered or Buffered. If this pin is
9DCENThis pin is used to enable the daisy-chaining option. This should be tied high if the part is being used in a
10PDActive Low Control Input that Acts as a Hardware Power-Down Option. This pin overrides any software
11V
BBuffered Analog Output Voltage from DAC B. The output amplifier has rail-to-rail operation.
OUT
12SYNCActive Low Control Input. This is the frame synchronization signal for the input data. When SYNC goes
13SCLKSerial Clock Input. Data is clocked into the input shift register on the falling edge of the serial clock input.
14DINSerial Data Input. This device has a 16-bit shift register. Data is clocked into the register on the falling edge
15GNDGround Reference Point for All Circuitry on the Part.
16SDOSerial Data Output. Can be used for daisy-chaining a number of these devices together or for reading back the
Power Supply Input. These parts can be operated from 2.5 V to 5.5 V, and the supply should be decoupled
to GND.
unbuffered input, depending on the state of the BUF B pin. It has an input range from 0 V to V
unbuffered mode and from 1 V to V
in buffered mode.
DD
DD
in
unbuffered input depending on the state of the BUF A pin. It has an input range from 0 to VDD in unbuffered
mode and from 1 V to V
in buffered mode.
DD
tied low, the reference input is unbuffered. If it is tied high, the reference input is buffered.
tied low, the reference input is unbuffered. If it is tied high, the reference input is buffered.
daisy-chain. The pin should be tied low if it is being used in standalone mode.
power-down option. Both DACs go into power-down mode when this pin is tied low. The DAC outputs go
into a high impedance state and the current consumption of the part drops to 200 nA @ 5 V (50 nA @ 3 V).
low, it powers on the SCLK and DIN buffers and enables the input shift register. Data is transferred in on
the falling edges of the following 16 clocks. If SYNC is taken high before the 16th falling edge, the rising
edge of SYNC acts as an interrupt and the write sequence is ignored by the device.
Data can be transferred at rates up to 30 MHz. The SCLK input buffer is powered down after each write cycle.
of the serial clock input. The DIN input buffer is powered down after each write cycle.
data in the shift register for diagnostic purposes. The serial data output is valid on the falling edge of the clock.
TERMINOLOGY
Relative Accuracy
For the DAC, relative accuracy or integral nonlinearity (INL) is
a measure of the maximum deviation, in LSB, from a straight
line passing through the actual endpoints of the DAC transfer
function. A typical INL versus code plot can be seen in TPC 1.
Differential Nonlinearity
Differential nonlinearity (DNL) is the difference between the
measured change and the ideal 1 LSB change between any two
adjacent codes. A specified DNL of ±1 LSB maximum ensures
monotonicity. This DAC is guaranteed monotonic by design.
A typical DNL versus code plot can be seen in TPC 4.
Offset Error
This is a measure of the offset error of the DAC and the output
amplifier. It is expressed as a percentage of the full-scale range.
Gain Error
This is a measure of the span error of the DAC. It is the deviation in slope of the actual DAC transfer characteristic from the
ideal expressed as a percentage of the full-scale range.
Offset Error Drift
This is a measure of the change in offset error with changes in
temperature. It is expressed in (ppm of full-scale range)/°C.
Gain Error Drift
This is a measure of the change in gain error with changes in
temperature. It is expressed in (ppm of full-scale range)/°C.
REV. A–6–
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