AD5251: Dual 64-position resolution
AD5252: Dual 256-position resolution
1 kΩ, 10 kΩ, 50 kΩ, 100 kΩ
Nonvolatile memory
Power-on refreshed with EEMEM settings in 300 μs typ
EEMEM rewrite time = 540 μs typ
Resistance tolerance stored in nonvolatile memory
12 extra bytes in EEMEM for user-defined information
2
C-compatible serial interface
I
Direct read/write access of RDAC
Predefined linear increment/decrement commands
Predefined ±6 dB step change commands
Synchronous or asynchronous dual-channel update
Wiper setting readback
4 MHz bandwidth—1 kΩ version
Single supply 2.7 V to 5.5 V
Dual supply ±2.25 V to ±2.75 V
2 slave address decoding bits allow operation of 4 devices
100-year typical data retention, T
Operating temperature: –40°C to +85°C
APPLICATIONS
Mechanical potentiometer replacement
General-purpose DAC replacement
LCD panel V
COM
White LED brightness adjustment
RF base station power amp bias control
Programmable gain and offset control
Programmable voltage-to-current conversion
Programmable power supply
Sensor calibrations
GENERAL DESCRIPTION
The AD5251/AD5252 are dual-channel, I2C, nonvolatile memory, digitally controlled potentiometers with 64/256 positions,
respectively. These devices perform the same electronic adjustment functions as mechanical potentiometers, trimmers, and
variable resistors. The parts’ versatile programmability allows
multiple modes of operation, including read/write access in the
RDAC and EEMEM registers, increment/decrement of resistance,
resistance changes in ±6 dB scales, wiper setting readback, and
extra EEMEM for storing user-defined information, such as
memory data for other components, look-up table, or system
identification information.
1
stores wiper setting w/write protection
2
and EEMEM registers
= 55°C
A
adjustment
Memory Digital Potentiometers
AD5251/AD5252
FUNCTIONAL BLOCK DIAGRAM
V
DD
V
SS
DGND
WP
SCL
SDA
AD0
AD1
I2C
SERIAL
INTERFACE
POWER-
ON RESET
The AD5251/AD5252 allow the host I
any of the 64-/256-step wiper settings in the RDAC registers
and store them in the EEMEM. Once the settings are stored,
they are restored automatically to the RDAC registers at system
power-on; the settings can also be restored dynamically.
The AD5251/AD5252 provide addi
decrement, +6 dB step change, and –6 dB step change in
synchronous or asynchronous channel update mode. The
increment and decrement functions allow stepwise linear
adjustments, with a ± 6 dB step change equivalent to doubling
or halving the RDAC wiper setting. These functions are useful
for steep-slope, nonlinear adjustments, such as white LED
brightness and audio volume control.
The AD5251/AD5252 have a patented resistance-tolerance
s
toring function that allows the user to access the EEMEM and
obtain the absolute end-to-end resistance values of the RDACs
for precision applications.
The AD5251/AD5252 are available in TSSOP-14 packages in
1 kΩ, 10 kΩ, 50
guaranteed to operate over the –40°C to +85°C extended
industrial temperature range.
1
The terms nonvolatile memory and EEMEM are used interchangeably.
2
The terms digital potentiometer and RDAC are used interchangeably.
RDAC EEMEM
EEMEM
POWER-ON
REFRESH
DATA
CONTROL
RAB
TOL
COMMAND
DECODE LOGIC
ADDRESS
DECODE LOGIC
CONTROL LOGIC
Figure 1.
RDAC1
REGIS-
TER
RDAC3
REGIS-
TER
AD5251/
AD5252
2
C controllers to write
tional increment,
kΩ, and 100 kΩ options. All parts are
RDAC1
RDAC3
A1
W1
B1
A3
W3
B3
03823-0-001
Rev. A
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Anal og Devices for its use, nor for any infringements of patents or ot her
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarks and registered trademarks are the property of their respective owners.
Input Logic High VIH V
V
Input Logic Low VIL V
Output Logic High (SDA) VOH R
Output Logic Low (SDA) VOL R
I
WP Leakage Current
WP
= 5 V, VSS = 0 V 2.4 V
DD
= 2.7 V/0 V or VDD/VSS = ± 2.5 V 2.1 V
DD/VSS
= 5 V, VSS = 0 V 0.8 V
DD
= 2.2 kΩ to VDD = 5 V, VSS = 0 V 4.9 V
PULL-UP
= 2.2 kΩ to VDD = 5 V, VSS = 0 V 0.4 V
PULL-UP
WP
= VDD
5 μA
A0 Leakage Current IA0 A0 = GND 3 μA
Input Leakage Current
(Other than WP
Input Capacitance
and A0)
5
II V
CI 5 pF
= 0 V or VDD ±1 μA
IN
POWER SUPPLIES
Single-Supply Power Range VDD V
= 0 V 2.7 5.5 V
SS
Dual-Supply Power Range VDD/VSS ±2.25 ±2.75 V
Positive Supply Current IDD V
Negative Supply Current ISS
EEMEM Data Storing Mode Current I
EEMEM Data Restoring Mode
Power Dissipation
Current
6
7
V
DD_STORE
I
DD_RESTORE
P
V
V
DISS
= VDD or VIL = GND 5 15 μA
IH
= VDD or VIL = GND, VDD = 2.5 V,
V
IH
= –2.5 V
V
SS
= VDD or VIL = GND 35 mA
IH
= VDD or VIL = GND 2.5 mA
IH
= VDD = 5 V or VIL = GND 0.075 mW
IH
–5 –15 μA
Power Supply Sensitivity PSS ΔVDD = 5 V ± 10% −0.025 +0.010 +0.025 %/%
ΔVDD = 3 V ± 10% –0.04 +0.02 +0.04 %/%
DYNAMIC CHARACTERISTICS
5, 8
Bandwidth –3 dB BW RAB = 1 kΩ 4 MHz
Total Harmonic Distortion THD VA = 1 V rms, VB = 0 V, f = 1 kHz 0.05 %
VW Settling Time tS V
Resistor Noise Voltage e
N_WB
= VDD, VB = 0 V 0.2 μs
A
= 500 Ω, f = 1 kHz
R
WB
3
nV/√Hz
(thermal noise only)
Digital Crosstalk CT
= VDD, VB = 0 V, measure VW with
V
A
–80 dB
adjacent RDAC making full-scale
change
Analog Coupling CAT
1
Typical values represent average readings at 25°C and VDD = 5 V.
2
Resistor position nonlinearity error (R-INL) is the deviation from an ideal value measured between the maximum and minimum resistance wiper positions. R-DNL is the
relative step change from an ideal value measured between successive tap positions. Parts are guaranteed monotonic, except R-DNL of AD52521 kΩ version at V
2.7 V, IW = VDD/R for both VDD = 3 V and VDD = 5 V.
3
INL and DNL are measured at VW with the RDAC configured as a potentiometer divider, similar to a voltage output digital-to-analog converter. VA = VDD and VB = 0 V.
DNL specification limits of ±1 LSB maximum are guaranteed monotonic operating conditions.
4
Resistor Terminal A, Terminal B, and Terminal W have no limitations on polarity with respect to each other.
5
Guaranteed by design and not subject to production test.
6
Command 0 NOP should be activated after Command 1 to minimize I
7
P
is calculated from IDD × VDD = 5 V.
DISS
8
All dynamic characteristics use VDD = 5 V.
Signal input at A1 and measure the
output a
current consumption.
DD_READ
t W3, f = 1 kHz
–72 dB
=
DD
Rev. A | Page 4 of 28
AD5251/AD5252
www.BDTIC.com/ADI
10 kΩ, 50 kΩ, 100 kΩ VERSIONS
VDD = +3 V ± 10% or +5 V ± 10%, VSS = 0 V or VDD/VSS = ± 2.5 V ± 10%, VA = VDD, VB = 0 V, –40°C < TA < +85°C, unless otherwise noted.
Table 2.
ParameterSymbolConditionsMinTyp
DC CHARACTERISTICS—
Typical values represent average readings at 25°C and VDD = 5 V.
2
Resistor position nonlinearity error (R-INL) is the deviation from an ideal value measured between the maximum and minimum resistance wiper positions. R-DNL is the
relative step change from an ideal value measured between successive tap positions. Parts are guaranteed monotonic, except R-DNL of AD52521 kΩ version at VDD = 2.7 V,
IW = VDD/R for both VDD = 3 V and VDD = 5 V.
3
INL and DNL are measured at VW with the RDAC configured as a potentiometer divider, similar to a voltage output DAC. VA = VDD and VB = 0 V. DNL specification limits
of ±1 LSB maximum are guaranteed monotonic operating conditions.
4
Resistor Terminal A, Terminal B, and Terminal W have no limitations on polarity with respect to each other.
5
Guaranteed by design and not subject to production test.
6
Command 0 NOP should be activated after Command 1 to minimize I
7
P
is calculated from IDD × VDD = 5 V.
DISS
8
All dynamic characteristics use VDD = 5 V.
Signal input at A1 and measure
output a
DD_READ
t W3, f = 1 kHz
current consumption.
−72 dB
Rev. A | Page 6 of 28
AD5251/AD5252
www.BDTIC.com/ADI
INTERFACE TIMING CHARACTERISTICS
All input control voltages are specified with tR = tF = 2.5 ns (10% to 90% of 3 V) and timed from a voltage level of 1.5 V. Switching
characteristics are measured using both V
Table 3. Interface Timing and EEMEM Reliability Characteristics (All Parts)
Parameter Symbol Conditions Min Typ Max Unit
INTERFACE TIMING
SCL Clock Frequency f
t
Bus-Free Time Between Stop and Start t1 1.3 μs
BUF
t
Hold Time (Repeated Start) t2
HD;STA
t
Low Period of SCL Clock t3 1.3
LOW
t
High Period of SCL Clock t4 0.6
HIGH
t
Set-up Time for Start Condition t5 0.6
SU;STA
t
Data Hold Time t6 0 0.9 μs
HD;DAT
t
Data Set-up Time t7 100
SU;DAT
tF Fall Time of Both SDA and SCL Signals t8
tR Rise Time of Both SDA and SCL Signals t9
t
Set-up Time for Stop Condition t10 0.6 μs
SU;STO
EEMEM Data Storing Time t
EEMEM Data Restoring Time at Power-On
EEMEM Data Restoring Time upon Restore
Command or Reset Operation
2
EEMEM Data Rewritable Time (Delay Time
After Power-On or Reset Before EEMEM
Can Be Written)
FLASH/EE MEMORY RELIABILITY
Endurance
Data Retention
1
Guaranteed by design; not subject to production test. See Figure 23 for location of measured values.
2
During power-up, all outputs are preset to midscale before restoring the EEMEM contents. RDAC0 has the shortest EEMEM data restoring time, whereas RDAC3 has the longest.
3
Endurance is qualified to 100,000 cycles per JEDEC Standard 22, Method A117, and measured at −40°C, +25°C, and +85°C; typical endurance at +25°C is 700,000 cycles.
4
Retention lifetime equivalent at junction temperature TJ = 55°C per JEDEC Std. 22, Method A117. Retention lifetime based on an activation energy of 0.6 eV derates
with junction temperature in Flash/EE memory.
3
4
= 3 V and 5 V.
DD
SCL
2
EEMEM_STORE
t
EEMEM_RESTORE1
t
EEMEM_RESTORE2
t
EEMEM_REWRITE
100 k cycles
100 Years
1
400 kHz
After this period, the first clock pulse is
ated.
gener
0.6
300 ns
300 ns
μs
μs
μs
μs
ns
26 ms
rise time dependent. Measure
V
DD
without decoupling capacitors at V
and V
.
SS
300 μs
DD
VDD = 5 V. 300 μs
540 μs
Rev. A | Page 7 of 28
AD5251/AD5252
www.BDTIC.com/ADI
ABSOLUTE MAXIMUM RATINGS
TA = 25°C, unless otherwise noted.
Table 4.
Parameter Rating
VDD to GND −0.3 V, +7 V
VSS to GND +0.3 V, −7 V
VDD to VSS 7 V
VA, VB, VW to GND VSS, VDD
Maximum Current
IWB, IWA Pulsed ±20 mA
IWB Continuous (RWB ≤ 1 kΩ, A Open)
IWA Continuous (RWA ≤ 1 kΩ, B Open)1 ±5 mA
IAB Continuous
(R
= 1 kΩ/10 kΩ/50 kΩ/100 kΩ)1
AB
Digital Inputs and Output Voltage to GND 0 V, 7 V
Operating Temperature Range −40°C to +85°C
Maximum Junction Temperature (T
Storage Temperature Range −65°C to +150°C
Lead Temperature (Soldering, 10 sec) 300°C
Vapor Phase (60 sec) 215°C
Infrared (15 sec) 220°C
TSSOP-14 Thermal Resistance2 θJA 136°C/W
1
Maximum terminal current is bound by the maximum applied voltage across
any two of the A, B, and W terminals at a given resistance, the maximum
current handling of the switches, and the maximum power dissipation of the
package. VDD = 5 V.
2
Package power dissipation = (T
− TA)/θJA.
JMAX
1
±5 mA
±5 mA/±500 μA/
±100 μA/±50 μA
) 150°C
JMAX
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on
the human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
Rev. A | Page 8 of 28
AD5251/AD5252
www.BDTIC.com/ADI
PIN CONFIGURATION AND FUNCTION DESCRIPTIONS
V
AD0
WP
W1
B1
A1
SDA
DD
1
2
AD5251/
3
AD5252
4
TOP VIEW
(Not to Scale)
5
6
7
14
W3
13
B3
12
A3
11
AD1
10
DGND
9
SCL
8
V
SS
03823-0-002
Figure 2. Pin Configuration
Table 5. Pin Function Descriptions
Pin No. Mnemonic Description
1 VDD
Positive Power Supply Pin. Connect +2.7 V to +5 V for single supply or ±2.7 V for dual supply, where
VDD – VSS ≤ 5.5 V. VDD must be able to source 35 mA for 26 ms when storing data to EEMEM.
2 AD0 I2C Device Address 0. AD0 and AD1 allow four AD5251/AD5252 devices to be addressed.
3
WP
4 W1 Wiper Terminal of RDAC1. VSS ≤ VW1 ≤ VDD.
5 B1 B Terminal of RDAC1. VSS ≤ VB1 ≤ VDD.
6 A1 A Terminal of RDAC1. VSS ≤ VA1 ≤ VDD.
7 SDA
Write Protect, Active Low. VWP ≤ VDD + 0.3 V.
1
1
1
Serial Data Input/Output Pin. Shifts in one bit a
t a time upon positive clock edges. MSB loaded first.
Open-drain MOSFET requires pull-up resistor.
8 VSS
Negative Supply. Connect to 0 V for single supply or –2.7 V for dual supply, where V
V
9 SCL
Serial Input Register Clock Pin. Shifts in one bit at a time upon positiv
is used in dual supply, VSS must be able to sink 35 mA for 26 ms when storing data to EEMEM.
SS
e clock edges. V
– VSS ≤ +5.5 V. If
DD
SCL
Pull-up resistor is recommended for SCL to ensure minimum power.
10 DGND Digital Ground. Connect to system analog ground at a single point.
11 AD1 I2C Device Address 1. AD0 and AD1 allow four AD5251/AD5252 devices to be addressed.
12 A3 A Terminal of RDAC3. VSS ≤ VA3 ≤ VDD.
13 B3 B Terminal of RDAC3. VSS ≤ VB3 ≤ VDD.
14 W3 Wiper Terminal of RDAC3. VSS ≤ VW3 ≤ VDD.
1
For quad-channel device software compatibility, the dual potentiometers in the parts are designated as RDAC1 and RDAC3.
1
1
1
≤ (VDD + 0.3 V).
Rev. A | Page 9 of 28
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