Datasheet AD1376 Datasheet (Analog Devices)

16-Bit A/D Converters
AD1376/AD1377
FEATURES Complete 16-Bit Converters with Reference and Clock 0.003% Maximum Nonlinearity No Missing Codes to 14 Bits over Temperature Fast Conversion
17 s to 16 Bits (AD1376)
10 s to 16 Bits (AD1377) Short Cycle Capability Parallel Outputs Low Power
645 mW Typical (AD1376)
585 mW Typical (AD1377) Industry-Standard Pinout

GENERAL DESCRIPTION

The AD1376/AD1377 are high resolution, 16-bit analog-to­digital converters with internal reference, clock, and laser-trimmed thin-film applications resistors. They are packaged in compact 32-lead, ceramic seam sealed (her­metic), dual-in-line packages (DIP). Thin-film scaling resistors provide bipolar input ranges of ±2.5 V, ±5 V, ±10 V and unipolar input ranges of 0 V to +5 V, 0 V to +10 V, and 0 V to +20 V.
Digital output data is provided in parallel form with corre­sponding clock and status outputs. All digital inputs and outputs are TTL compatible.

FUNCTIONAL BLOCK DIAGRAM

For the AD1376, the serial output function is nonfunc­tional after date code 0111. For the AD1377, the serial output function is nonfunctional after date code 0210. The user option of applying external clock on the CONVERT START pin to slow down the internally set conversion time is no longer available for either part.

PRODUCT HIGHLIGHTS

1. The AD1376/AD1377 provides 16-bit resolution with a maximum linearity error of ±0.003% (1/2 LSB 25°C.
2. AD1376 conversion time is 14 µs (typical) short cycled to 14 bits, and 16 µs to 16 bits.
3. AD1377 conversion time is 8 µs (typical) short cycled to 14 bits, and 9 µs to 16 bits.
4. Two binary codes are available on the digital output. They are CSB (complementary straight binary) for unipolar input voltage ranges and COB (complementary offset binary) for bipolar input ranges. Complementary twos complement (CTC) coding may be obtained by inverting Pin 1 (MSB).
5. The AD1376 and AD1377 include internal reference and clock, with external clock rate adjust pin, and paral­lel digital outputs.
) at
14
REV. C
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AD1376/AD1377–SPECIFICATIONS
(typical at TA = 25C, VS = 15 V, +5 V, unless otherwise noted.)
Model AD1376JD/AD1377JD AD1376KD/AD1377KD Unit
RESOLUTION 16 (max) 16 (max) Bits
ANALOG INPUTS
Voltage Ranges
Bipolar ± 2.5, ± 5, ± 10 ± 2.5, ± 5, ± 10 V Unipolar 0 to +5, 0 to +10, 0 to +20 0 to +5, 0 to +10, 0 to +20 V
Impedance (Direct Input)
0 V to +5 V, ±2.5 V 1.88 1.88 k 0 V to +10 V, ±5.0 V 3.75 3.75 k 0 V to +20 V, ±10 V 7.50 7.50 k
DIGITAL INPUTS
1
Convert Command Positive Pulse 50 ns Wide (min) Trailing Edge Initiates Conversion Logic Loading 1 1 LS TTL Load
TRANSFER CHARACTERISTICS
ACCURACY
Gain Error ± 0.05 Offset Error
Unipolar ± 0.05
2
3
(±0.2 max) ± 0.053 (±0.2 max) %
3
(±0.1 max) ± 0.053 (±0.1 max) % of FSR
Bipolar ± 0.053 (±0.2 max) ± 0.053 (±0.2 max) % of FSR Linearity Error (Max) ± 0.006 ±0.003 % of FSR Inherent Quantization Error ± 1/2 ±1/2 LSB Differential Linearity Error ± 0.003 ±0.003 % of FSR
POWER SUPPLY SENSITIVITY
± 15 V DC (± 0.75 V) 0.0015 0.0015 % of FSR/% V +5 V DC (± 0.25 V) 0.001 0.001 % of FSR/% ∆V
CONVERSION TIME
5
12 Bits (AD1376) 11.5 (13 max) 11.5 (13 max) µs 14 Bits (AD1376) 13.5 (15 max) 13.5 (15 max) µs 16 Bits (AD1376) 15.5 (17 max) 15.5 (17 max) µs 14 Bits (AD1377) 8.75 max 8.75 max µs 16 Bits (AD1377) 10 max 10 max µs
POWER SUPPLY REQUIREMENTS
Rated Voltage, Analog ± 15, ± 0.5 (max) ± 15, ± 0.5 (max) V dc Rated Voltage, Digital +5, ± 0.25 (max) +5, ±0.25 (max) V dc AD1376 Power Consumption 645 (850 max) 645 (850 max) mW
+15 V Supply Drain +16 +16 mA
–15 V Supply Drain –21 –21 mA
+5 V Supply Drain +18 +18 mA AD1377 Power Consumption 600 (800 max) 600 (800 max) mW
+15 V Supply Drain +10 +10 mA
–15 V Supply Drain –23 –23 mA
+5 V Supply Drain +18 +18 mA
WARM-UP TIME 1 1 minutes
6
DRIFT
Gain ± 15 (max) ±5 (±15 max) ppm/°C Offset
Unipolar ± 2 (± 4 max) ± 2 (± 4 max) ppm of FSR/°C
Bipolar ± 10 (max) ± 3 (± 10 max) ppm of FSR/°C Linearity ± 2 (± 3 max) ± 0.3 (± 2 max) ppm of FSR/°C Guaranteed No Missing Code
Temperature Range 0 to 70 (13 Bits) 0 to 70 (14 Bits) °C
4
S
S
REV. C–2–
AD1376/AD1377
Model AD1376JD/AD1377JD AD1376KD/AD1377KD Unit
DIGITAL OUTPUT
(All Codes Complementary)
Parallel
Output Codes
Unipolar CSB CSB Bipolar COB, CTC Output Drive 5 5 LSTTL Loads
Status Logic 1 during Conversion
Status Output Drive 5 (max) 5 (max) LSTTL Loads
Internal Clock
Clock Output Drive 5 (max) 5 (max) LSTTL Loads Frequency 1040/1750 1040/1750 kHz
TEMPERATURE RANGE
Specification 0 to 70 0 to 70 °C Operating –25 to +85 –25 to +85 °C Storage –55 to +125 –55 to +125 °C
NOTES
1
Logic 0 = 0.8 V, max. Logic 1 = 2.0 V, min for inputs. For digital outputs Logic 0 = 0.4 V max. Logic 1 = 2.4 V min.
2
Tested on ± 10 V and 0 V to +10 V ranges.
3
Adjustable to zero.
4
Full-scale range.
5
Guaranteed but not 100% production tested.
6
Conversion time may be shortened with “short cycle” set for lower resolution.
7
CSB–Complementary Straight Binary. COB–Complementary Offset Binary. CTC–Complementary Twos Complement.
8
CTC coding obtained by inverting MSB (Pin 1).
9
With Pin 23, clock rate controls tied to digital ground.
Specifications subject to change without notice.
1
7
8
9
COB, CTC
8

ABSOLUTE MAXIMUM RATINGS*

Supply Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ± 18 V
Logic Supply Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . +7 V
Analog Inputs (Pins 24 and 25) . . . . . . . . . . . . . . . . . . . ± 25 V
Analog Ground to Digital Ground . . . . . . . . . . . . . . . . . ± 0.3 V
Digital Inputs . . . . . . . . . . . . . . . . . . . . –0.3 V to V
+ 0.3 V
DD
Junction Temperature . . . . . . . . . . . . . . . . . . . . . . . . . . 175°C
Storage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15°C
Lead Temperature (10 sec) . . . . . . . . . . . . . . . . . . . . . . 300°C
*Absolute maximum ratings are limiting values to be applied individually, and
beyond which the service ability of the circuit may be impaired. Functional operability is not necessarily implied. Exposure to absolute maximum rating conditions for an extended period of time may affect device reliability.
Temperature Linearity Time Package
Model Range Error (16 Bits) Option*
AD1376JD 0°C to 70°C ± 0.006% 17 µs DH-32E AD1376KD 0°C to 70°C ± 0.003% 17 µs DH-32E AD1377JD 0°C to 70°C ± 0.006% 10 µs DH-32E AD1377KD 0°C to 70°C ± 0.003% 10 µs DH-32E
*DH-32E = Ceramic DIP.

ORDERING GUIDE

Maximum Conversion
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection. Although the
AD1376/AD1377 feature proprietary ESD protection circuitry, permanent damage may occur on
devices subjected to high energy electrostatic discharges. Therefore, proper ESD precautions are
recommended to avoid performance degradation or loss of functionality.
REV. C
–3–
AD1376/AD1377
Figure 1. Linearity Error vs. Temperature

APPLICATIONS

The AD1376/AD1377 are excellent for use in high resolution applications requiring moderate speed and high accuracy or stability over commercial (0°C to 70°C) temperature ranges (for extended temperature ranges, the pin compatible AD1378 is recommended.) Typical applications include medical and ana­lytic instrumentation, precision measurement for industrial robotics, automatic test equipment (ATE), multichannel data acquisition systems, servo control systems, or anywhere wide dynamic range is required. A proprietary monolithic DAC and laser-trimmed thin-film resistors guarantee a maximum nonlinearity of ±0.003% (1/2 LSB
). The converters may be
14
short cycled to achieve faster conversion times—15 µs to 14 bits for the AD1376 or 8 µs to 14 bits for the AD1377.

DESCRIPTION OF OPERATION

On receipt of a CONVERT START command, the AD1376/ AD1377 converts the voltage at its analog input into an equiva­lent 16-bit binary number. This conversion is accomplished as follows: the 16-bit successive approximation register (SAR) has its 16-bit outputs connected both to the device bit output pins and to the corresponding bit inputs of the feedback DAC. The analog input is successively compared to the feedback DAC output, one hit at a time (MSB first, LSB last). The decision to keep or reject each bit is then made at the completion of each bit comparison period, depending on the state of the compara­tor at that time.
Figure 2. AD1376 Nonlinearity vs. Conversion Time
Figure 3. Gain Drift Error vs. Temperature

GAIN ADJUSTMENT

The gain adjust circuit consists of a 100 ppm/°C potentiometer connected across ±V
with its slider connected through a 300 k
S
resistor to the gain adjust Pin 29 as shown in Figure 4.
If no external trim adjustment is desired, Pin 27 (OFFSET ADJ) and Pin 29 (GAIN ADJ) may be left open.
Figure 4. Gain Adjustment Circuit (±0.2% FSR)

OFFSET ADJUSTMENT

The zero adjust circuit consists of a 100 ppm/°C potentiometer connected across ±V
with its slider connected through a 1.8 M
S
resistor to Comparator Input Pin 27 for all ranges. As shown in Figure 5, the tolerance of this fixed resistor is not critical, and a carbon composition type is generally adequate. Using a carbon composition resistor having a –1200 ppm/°C tempera­ture coefficent contributes a worst-case offset temperature coefficent of 32 LSB
61 ppm/LSB14 1200 ppm/°C =
14
2.3 ppm/°C of FSR, if the OFFSET ADJ potentiometer is set at either end of its adjustment range. Since the maximum offset adjustment required is typically no more than ±16 LSB
, use of
14
a carbon composition offset summing resistor typically con­tributes no more than 1 ppm/°C of FSR offset temperature coefficent.
REV. C–4–
Figure 5. Offset Adjustment Circuit (±0.3% FSR)
An alternate offset adjust circuit, which contributes negligible
offset temperature coefficent if metal film resistors (tempera-
ture coefficent <100 ppm/°C) are used, is shown in Figure 6.
Figure 6. Low Temperature Coefficent Zero Adjustment
Circuit
In either adjust circuit, the fixed resistor connected to Pin 27
should be located close to this pin to keep the pin connection
short. Comparator Input Pin 27 is quite sensitive to external
noise pickup and should be guarded by analog common.

TIMING

The timing diagram is shown in Figure 7. Receipt of a CONVERT
START signal sets the STATUS flag, indicating conversion in
progress. This, in turn, removes the inhibit applied to the gated
clock, permitting it to run through 17 cycles. All the SAR paral-
lel bits, the STATUS flip-flops, and the gated clock inhibit signal
are initialized on the trailing edge of the CONVERT START
signal. At time t
At t
, the Bit 1 decision is made (keep) and Bit 2 is reset uncon-
1
, B1 is reset and B2–B16 are set unconditionally.
0
ditionally. This sequence continues until the Bit 16 (LSB) decision
(keep) is made at t
. The STATUS flag is reset, indicating that
16
the conversion is complete and that the parallel output data is
valid. Resetting the STATUS flag restores the gated clock inhibit
signal, forcing the clock output to the low Logic 0 state. Note
that the clock remains low until the next conversion.
Corresponding parallel data bits become valid on the same
positive going clock edge.
AD1376/AD1377
Figure 7. Timing Diagram (Binary Code
0110011101111010)

DIGITAL OUTPUT DATA

Parallel data from TTL storage registers is in negative true form (Logic 1 = 0 V and Logic 0 = 2.4 V). Parallel data output coding is complementary binary for unipolar ranges and complementary offset binary for bipolar ranges. Parallel data becomes valid at least 20 ns before the STATUS flag returns to Logic 0, permit­ting parallel data transfer to be clocked on the 1 to 0 transition of the STATUS flag (see Figure 8).
Figure 8. LSB Valid to Status Low
REV. C
–5–
AD1376/AD1377

Table I. Short Cycle Connections

Resolution Maximum Conversion Maximum Conversion Connect Short Cycle
Bits (% FSR) Time–s (AD1377) Time–s (AD1376) Status Flag Reset Pin 32 to Pin
16 0.0015 10 17.1 t 15 0.003 9.4 16.1 t 14 0.006 8.7 15.0 t 13 0.012 8.1 13.9 t 12 0.024 7.5 12.9 t 10 0.100 6.3 10.7 t 8 0.390 5.0 8.6 t
16
15
14
13
12
10
8
NC (Open) 16 15 14 13 11 9

Short Cycle Input

A short cycle input, Pin 32, permits the timing cycle shown in Figure 7 to be terminated after any number of desired bits has been converted, permitting somewhat shorter conversion times in applications not requiring full 16-bit resolution. When 10-bit resolution is desired, Pin 32 is connected to Bit 11 output Pin 11. The conversion cycle then terminates and the STATUS flag resets after the Bit 10 decision (timing diagram of Figure 7). Short cycle connections and associated 8-, 10-, 12-, 13-, 14-, and 15-bit conversion times are summarized in Table I, for a
1.6 MHz clock (AD1377) or 933 kHz (AD1376).

INPUT SCALING

The ADC inputs should be scaled as close to the maximum input signal range as possible in order to use the maximum signal resolution of the ADC. Connect the input signal as shown in Table II. See Figure 9 for circuit details.

Table II. Input Scaling Connections

Input Connect Connect Connect Signal Output Pin 26 Pin 24 Input Line Code to Pin to Signal to
± 10 V COB 27 Input 24
Signal
± 5 V COB 27 Open 25 ± 2.5 V COB 27 Pin 27 25
0 V to +5 V CSB 22 Pin 27 25 0 V to +10 V CSB 22 Open 25 0 V to +20 V CSB 22 Input 24
Signal
Pin 27 is extremely sensitive to noise and should be guarded by analog com­mon.
Figure 9. Input Scaling Circuit
REV. C–6–
AD1376/AD1377

Table III. Transition Values vs. Calibration Codes

Code Under Test Low-Side Transition Values
MSB LSB Range ± 10 V ± 5 V ± 2.5 V 0 V to +10 V 0 V to +5 V
000 ……… 000* +Full Scale +10 V +5 V +2.5 V +10 V +5 V
–3/2 LS –3/2 LSB –3/2 LSB –3/2 LSB –3/2 LSB 011 ……… 111 Midscale 0–1/2 LSB 0–1/2 LSB 0–1/2 LSB +5 V–1/2 LSB +2.5 V–1/2 LSB 111 ……… 110 –Full Scale –10 V –5 V –2.5 V 0 V 0 V
+1/2 LSB +1/2 LSB +1/2 LSB +1/2 LSB +1/2 LSB
*Voltages given are the nominal value for transition to the code specified. Note: For LSB value for range and resolution used, see Table IV.

Table IV. Input Voltage Range and LSB Values

Analog Input Voltage Range ± 10 V ± 5 V ± 2.5 V 0 V to +10 V 0 V to +5 V
2
1
2
n
Code COB Designation or CTC
One Least FSR 20 V 10 V 5 V 10 V 5 V Significant 2
n
Bit (LSB)
n = 8 78.13 mV 39.06 mV 19.53 mV 39.06 mV 19.53 mV n = 10 19.53 mV 9.77 mV 4.88 mV 9.77 mV 4.88 mV n = 12 4.88 mV 2.44 mV 1.22 mV 2.44 mV 1.22 mV n = 13 2.44 mV 1.22 mV 0.61 mV 1.22 mV 0.61 mV n = 14 1.22 mV 0.61 mV 0.31 mV 0.61 mV 0.31 mV n = 15 0.61 mV 0.31 mV 0.15 mV 0.31 mV 0.15 mV
NOTES
1
COB = Complementary Offset Binary.
2
CTC = Complementary Twos Complementary—achieved by using an inverter to complement the most significant bit to product (MSB ).
3
CSB = Complementary Straight Binary.
1
COB or CTC
n
2
1
2
COB or CTC
n
2
2
CSB
n
2
3
CSB
n
2
3
REV. C
–7–
AD1376/AD1377
CALIBRATION (14-Bit Resolution Examples)
External ZERO ADJ and GAIN ADJ potentiometers, connected as shown in Figures 4 and 5, are used for device calibration. To prevent interaction of these two adjustments, zero is always adjusted first and then gain. Zero is adjusted with the analog input near the most negative end of the analog range (0 for unipo­lar and –FS for bipolar input ranges). Gain is adjusted with the analog input near the most positive end of the analog range.

0 V to 10 V Range

Set analog input to +1 LSB14 = 0.00061 V. Adjust zero for digital output = 11111111111110.
Zero is now calibrated. Set analog input to +FSR – 2 LSB =
9.99878 V. Adjust gain for 00000000000001 digital output code; full scale (gain) is now calibrated. Half-scale calibration check: set analog input to 5.00000 V; digital output code should be 01111111111111.

–10 V to +10 V Range

Set analog input to 9.99878 V; adjust zero for 1111111111110 digital output (complementary offset binary) code. Set analog input to 9.99756 V; adjust gain for 00000000000001 digital out­put (complementary offset binary) code. Half-scale calibration check-set analog input to 0.00000 V; digital output (comple­mentary offset binary) code should be 01111111111111.
Figure 11. Analog and Power Connections for Bipolar –10 V to +10 V Input Range

Other Ranges

Representative digital coding for 0 V to +10 V and –10 V to +10 V ranges is given above. Coding relationships and calibra­tion points for 0 V to +5 V, –2.5 V to +2.5 V, and –5 V to +5 V ranges can be found by halving proportionally the correspond­ing code equivalents listed for the 0 V to +10 V and –10 V to +10 V ranges, respectively, as indicated in Table III.
Zero- and full-scale calibration can be accomplished to a preci­sion of approximately ± 1/2 LSB using the static adjustment procedure described previously. By summing a small sine or triangular wave voltage with the signal applied to the analog input, the output can be cycled through each of the calibration codes of interest to more accurately determine the center (or end points) of each discrete quantization level. A detailed description of this dynamic calibration technique is presented in Analog-Digital Conversion Handbook, edited by D. H. Sheingold, Prentice Hall, Inc., 1986.
Figure 10. Analog and Power Connections for Unipolar 0 V to 10 V Input Range

GROUNDING, DECOUPLING, AND LAYOUT CONSIDERATIONS

Many data acquisition components have two or more ground pins that are not connected together within the device. These grounds are usually referred to as the logic power return, analog common (analog power return), and analog signal ground. These grounds (Pins 19 and 22) must be tied together at one point for the ADC as close as possible to the converter.
REV. C–8–
Ideally, a single solid analog ground plane under the converter would be desirable. Current flows through the wires and etch stripes of the circuit cards, and since these paths have resistance and inductance, hundreds of millivolts can be generated between the system analog ground point and the ground pins of the ADC. Separate wide conductor stripe ground returns should be provided for high resolution converters to minimize noise and IR losses from the current flow in the path from the converter to the system ground point. In this way, ADC supply currents and other digital logic-gate return currents are not summed into the same return path as analog signals where they would cause measurement errors.
Each of the ADC supply terminals should be capacitively decoupled as close to the ADC as possible. A large value capacitor such as 1 µF in parallel with a 0.1 µF capacitor is usually sufficient. Analog supplies are to be bypassed to the analog power return pin and the logic supply is bypassed to the logic power return pin.
The metal cover is internally grounded with respect to the power supplies, grounds, and electrical signals. Do not exter­nally ground the cover.

CLOCK RATE CONTROL

The AD1376/AD1377 may be operated at faster conversion times by connecting the clock rate control (Pin 23) to an external multiturn trim potentiometer (TCR <100 ppm/°C) as shown in Figure 12.
Figure 12. Clock Rate Control Circuit

HIGH RESOLUTION DATA ACQUISITION SYSTEM

The essential details of a high resolution data acquisition system using the AD386 and AD1376 or AD1377 are shown in Figure 13. Conversion is initiated by the falling edge of the CONVERT START pulse. This edge drives the AD1376’s or AD1377’s STATUS line high. The inverter then drives the AD386 into hold mode. STATUS remains high throughout the conversion and returns low once the conversion is completed. This allows the AD386 to re-enter track mode.
This circuit can exhibit nonlinearities arising from transients produced at the ADC’s input by the falling edge of CONVERT START. This edge resets the ADC’s internal DAC; the result­ing transient depends on the SHA’s present output voltage and the ADC’s prior conversion result. In the circuit of Figure 14, the falling edge of CONVERT START also places the SHA into hold mode (via the ADC’s STATUS output), causing the reset transient to occur at the same moment as the SHA’s track­and-hold transition. Timing skews and capacitive coupling can cause some of the transient signal to add to the signal being acquired by the SHA, introducing nonlinearity.
AD1376/AD1377
Figure 13. Basic Data Acquisition System Interconnections
A much safer approach is to add a flip-flop, as shown in Figure 14. The rising edge of CONVERT START places the track-and­hold device into hold mode before the ADC reset transients begin. The falling edge of STATUS places the AD386 back into track mode. System throughput will be reduced if a long CONVERT START pulse is used. Throughput can be calcu­lated from
1
++
is the duration
CS
CONV
is the
where T
Throughput
is the track-and-hold acquisition time, T
ACQ
=
TT T
ACQ CONV CS
time required for the ADC conversion, and T of CONVERT START. The combination of the AD1376 and AD386 will provide greater than 50 kHz throughput. No signifi­cant track-and-hold droop error will be introduced, provided the width of CONVERT START is small compared with the ADC’s conversion time.
REV. C
Figure 14. Improved Data Acquisition System
–9–
AD1376/AD1377

OUTLINE DIMENSIONS

32-Lead Bottom-Brazed Ceramic DIP [BBCDIP/H]
(DH-32E)
Dimensions shown in inches and (millimeters)
1.750 (44.45) MAX
32
17
1.105 (28.07)
1.075 (27.31)
0.225 (5.72) MAX
0.145 (3.68) MIN
1
PIN 1 INDICATOR
0.023 (0.58)
0.014 (0.36)
0.100 (2.54)
CONTROLLING DIMENSIONS ARE IN INCHES; MILLIMETER DIMENSIONS (IN PARENTHESES) ARE ROUNDED-OFF INCH EQUIVALENTS FOR REFERENCE ONLY AND ARE NOT APPROPRIATE FOR USE IN DESIGN
BSC
0.070 (1.78)
0.030 (0.76)
16
0.035 (0.89)
0.015 (0.38)
0.180 (4.57) MIN
0.120 (3.05) MAX
0.910 (23.11)
0.890 (22.61)
0.015 (0.38)
0.008 (0.20)
REV. C–10–
AD1376/AD1377

Revision History

Location Page
6/03—Data Sheet changed from REV. B to REV. C.
Removed serial output function and adjustable clock rate . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .Universal
Updated format . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .Universal
Changes to GENERAL DESCRIPTION . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1
Changes to PRODUCT HIGHLIGHTS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1
Changes to FUNCTIONAL BLOCK DIAGRAM . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1
Inserted ESD WARNING . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3
Change to ORDERING GUIDE . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3
Change to Figure 7 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5
Deleted text from DIGITAL OUTPUT DATA . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5
Deleted Figure 9 and renumbered remainder of figures . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5
Deleted the Using the AD1376 or AD1377 at Slower Conversion Times section . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
Deleted Figure 16 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
Change to Figure 13 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
Change to Figure 14 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
Updated OUTLINE DIMENSIONS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
REV. C
–11–
C00699–0–6/03(C)
–12–
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