FEATURES
Complete 16-Bit Converters with Reference and Clock
ⴞ0.003% Maximum Nonlinearity
No Missing Codes to 14 Bits over Temperature
Fast Conversion
17 s to 16 Bits (AD1376)
10 s to 16 Bits (AD1377)
Short Cycle Capability
Parallel Outputs
Low Power
645 mW Typical (AD1376)
585 mW Typical (AD1377)
Industry-Standard Pinout
GENERAL DESCRIPTION
The AD1376/AD1377 are high resolution, 16-bit analog-todigital converters with internal reference, clock, and
laser-trimmed thin-film applications resistors. They are
packaged in compact 32-lead, ceramic seam sealed (hermetic), dual-in-line packages (DIP). Thin-film scaling
resistors provide bipolar input ranges of ±2.5 V, ±5 V, ±10 V
and unipolar input ranges of 0 V to +5 V, 0 V to +10 V, and
0 V to +20 V.
Digital output data is provided in parallel form with corresponding clock and status outputs. All digital inputs and
outputs are TTL compatible.
FUNCTIONAL BLOCK DIAGRAM
For the AD1376, the serial output function is nonfunctional after date code 0111. For the AD1377, the serial
output function is nonfunctional after date code 0210. The
user option of applying external clock on the CONVERT
START pin to slow down the internally set conversion time
is no longer available for either part.
PRODUCT HIGHLIGHTS
1. The AD1376/AD1377 provides 16-bit resolution with a
maximum linearity error of ±0.003% (1/2 LSB
25°C.
2. AD1376 conversion time is 14 µs (typical) short
cycled to 14 bits, and 16 µs to 16 bits.
3. AD1377 conversion time is 8 µs (typical) short cycled
to 14 bits, and 9 µs to 16 bits.
4. Two binary codes are available on the digital output.
They are CSB (complementary straight binary) for
unipolar input voltage ranges and COB (complementary
offset binary) for bipolar input ranges. Complementary
twos complement (CTC) coding may be obtained by
inverting Pin 1 (MSB).
5. The AD1376 and AD1377 include internal reference
and clock, with external clock rate adjust pin, and parallel digital outputs.
) at
14
REV. C
Information furnished by Analog Devices is believed to be accurate and
reliable. However, no responsibility is assumed by Analog Devices for its
use, nor for any infringements of patents or other rights of third parties that
may result from its use. No license is granted by implication or otherwise
under any patent or patent rights of Analog Devices. Trademarks and
registered trademarks are the property of their respective companies.
*Absolute maximum ratings are limiting values to be applied individually, and
beyond which the service ability of the circuit may be impaired. Functional
operability is not necessarily implied. Exposure to absolute maximum rating
conditions for an extended period of time may affect device reliability.
Temperature LinearityTimePackage
ModelRangeError(16 Bits)Option*
AD1376JD0°C to 70°C± 0.006%17 µsDH-32E
AD1376KD 0°C to 70°C± 0.003%17 µsDH-32E
AD1377JD0°C to 70°C± 0.006%10 µsDH-32E
AD1377KD 0°C to 70°C± 0.003%10 µsDH-32E
*DH-32E = Ceramic DIP.
ORDERING GUIDE
Maximum Conversion
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection. Although the
AD1376/AD1377 feature proprietary ESD protection circuitry, permanent damage may occur on
devices subjected to high energy electrostatic discharges. Therefore, proper ESD precautions are
recommended to avoid performance degradation or loss of functionality.
REV. C
–3–
AD1376/AD1377
Figure 1. Linearity Error vs. Temperature
APPLICATIONS
The AD1376/AD1377 are excellent for use in high resolution
applications requiring moderate speed and high accuracy or
stability over commercial (0°C to 70°C) temperature ranges (for
extended temperature ranges, the pin compatible AD1378 is
recommended.) Typical applications include medical and analytic instrumentation, precision measurement for industrial
robotics, automatic test equipment (ATE), multichannel data
acquisition systems, servo control systems, or anywhere wide
dynamic range is required. A proprietary monolithic DAC
and laser-trimmed thin-film resistors guarantee a maximum
nonlinearity of ±0.003% (1/2 LSB
). The converters may be
14
short cycled to achieve faster conversion times—15 µs to 14 bits
for the AD1376 or 8 µs to 14 bits for the AD1377.
DESCRIPTION OF OPERATION
On receipt of a CONVERT START command, the AD1376/
AD1377 converts the voltage at its analog input into an equivalent 16-bit binary number. This conversion is accomplished as
follows: the 16-bit successive approximation register (SAR) has
its 16-bit outputs connected both to the device bit output pins
and to the corresponding bit inputs of the feedback DAC. The
analog input is successively compared to the feedback DAC
output, one hit at a time (MSB first, LSB last). The decision to
keep or reject each bit is then made at the completion of each
bit comparison period, depending on the state of the comparator at that time.
Figure 2. AD1376 Nonlinearity vs. Conversion Time
Figure 3. Gain Drift Error vs. Temperature
GAIN ADJUSTMENT
The gain adjust circuit consists of a 100 ppm/°C potentiometer
connected across ±V
with its slider connected through a 300 kΩ
S
resistor to the gain adjust Pin 29 as shown in Figure 4.
If no external trim adjustment is desired, Pin 27 (OFFSET
ADJ) and Pin 29 (GAIN ADJ) may be left open.
Figure 4. Gain Adjustment Circuit (±0.2% FSR)
OFFSET ADJUSTMENT
The zero adjust circuit consists of a 100 ppm/°C potentiometer
connected across ±V
with its slider connected through a 1.8 MΩ
S
resistor to Comparator Input Pin 27 for all ranges. As shown
in Figure 5, the tolerance of this fixed resistor is not critical,
and a carbon composition type is generally adequate. Using a
carbon composition resistor having a –1200 ppm/°C temperature coefficent contributes a worst-case offset temperature
coefficent of 32 LSB
⫻ 61 ppm/LSB14 ⫻ 1200 ppm/°C =
14
2.3 ppm/°C of FSR, if the OFFSET ADJ potentiometer is set
at either end of its adjustment range. Since the maximum offset
adjustment required is typically no more than ±16 LSB
, use of
14
a carbon composition offset summing resistor typically contributes no more than 1 ppm/°C of FSR offset temperature
coefficent.
REV. C–4–
Figure 5. Offset Adjustment Circuit (±0.3% FSR)
An alternate offset adjust circuit, which contributes negligible
offset temperature coefficent if metal film resistors (tempera-
ture coefficent <100 ppm/°C) are used, is shown in Figure 6.
Figure 6. Low Temperature Coefficent Zero Adjustment
Circuit
In either adjust circuit, the fixed resistor connected to Pin 27
should be located close to this pin to keep the pin connection
short. Comparator Input Pin 27 is quite sensitive to external
noise pickup and should be guarded by analog common.
TIMING
The timing diagram is shown in Figure 7. Receipt of a CONVERT
START signal sets the STATUS flag, indicating conversion in
progress. This, in turn, removes the inhibit applied to the gated
clock, permitting it to run through 17 cycles. All the SAR paral-
lel bits, the STATUS flip-flops, and the gated clock inhibit signal
are initialized on the trailing edge of the CONVERT START
signal. At time t
At t
, the Bit 1 decision is made (keep) and Bit 2 is reset uncon-
1
, B1 is reset and B2–B16 are set unconditionally.
0
ditionally. This sequence continues until the Bit 16 (LSB) decision
(keep) is made at t
. The STATUS flag is reset, indicating that
16
the conversion is complete and that the parallel output data is
valid. Resetting the STATUS flag restores the gated clock inhibit
signal, forcing the clock output to the low Logic 0 state. Note
that the clock remains low until the next conversion.
Corresponding parallel data bits become valid on the same
positive going clock edge.
AD1376/AD1377
Figure 7. Timing Diagram (Binary Code
0110011101111010)
DIGITAL OUTPUT DATA
Parallel data from TTL storage registers is in negative true form
(Logic 1 = 0 V and Logic 0 = 2.4 V). Parallel data output coding is
complementary binary for unipolar ranges and complementary
offset binary for bipolar ranges. Parallel data becomes valid at
least 20 ns before the STATUS flag returns to Logic 0, permitting parallel data transfer to be clocked on the 1 to 0 transition
of the STATUS flag (see Figure 8).
Figure 8. LSB Valid to Status Low
REV. C
–5–
AD1376/AD1377
Table I. Short Cycle Connections
ResolutionMaximum ConversionMaximum ConversionConnect Short Cycle
Bits(% FSR)Time–s (AD1377)Time–s (AD1376)Status Flag ResetPin 32 to Pin
A short cycle input, Pin 32, permits the timing cycle shown in
Figure 7 to be terminated after any number of desired bits has
been converted, permitting somewhat shorter conversion times
in applications not requiring full 16-bit resolution. When 10-bit
resolution is desired, Pin 32 is connected to Bit 11 output Pin 11.
The conversion cycle then terminates and the STATUS flag
resets after the Bit 10 decision (timing diagram of Figure 7).
Short cycle connections and associated 8-, 10-, 12-, 13-, 14-,
and 15-bit conversion times are summarized in Table I, for a
1.6 MHz clock (AD1377) or 933 kHz (AD1376).
INPUT SCALING
The ADC inputs should be scaled as close to the maximum input
signal range as possible in order to use the maximum signal
resolution of the ADC. Connect the input signal as shown in
Table II. See Figure 9 for circuit details.
Table II. Input Scaling Connections
InputConnectConnectConnect
SignalOutputPin 26Pin 24Input
LineCodeto PintoSignal to
± 10 VCOB27Input24
Signal
± 5 VCOB27Open25
± 2.5 VCOB27Pin 2725
0 V to +5 VCSB22Pin 2725
0 V to +10 VCSB22Open25
0 V to +20 VCSB22Input24
Signal
ⴱ
Pin 27 is extremely sensitive to noise and should be guarded by analog common.
Figure 9. Input Scaling Circuit
REV. C–6–
AD1376/AD1377
Table III. Transition Values vs. Calibration Codes
Code Under TestLow-Side Transition Values
MSBLSBRange± 10 V± 5 V± 2.5 V0 V to +10 V0 V to +5 V
*Voltages given are the nominal value for transition to the code specified.
Note: For LSB value for range and resolution used, see Table IV.
Table IV. Input Voltage Range and LSB Values
Analog Input
Voltage Range± 10 V± 5 V± 2.5 V0 V to +10 V0 V to +5 V
2
1
2
n
CodeCOB
Designationor CTC
One LeastFSR20 V10 V5 V10 V5 V
Significant 2
n
Bit (LSB)
n = 878.13 mV39.06 mV19.53 mV39.06 mV19.53 mV
n = 1019.53 mV9.77 mV4.88 mV9.77 mV4.88 mV
n = 124.88 mV2.44 mV1.22 mV2.44 mV1.22 mV
n = 132.44 mV1.22 mV0.61 mV1.22 mV0.61 mV
n = 141.22 mV0.61 mV0.31 mV0.61 mV0.31 mV
n = 150.61 mV0.31 mV0.15 mV0.31 mV0.15 mV
NOTES
1
COB = Complementary Offset Binary.
2
CTC = Complementary Twos Complementary—achieved by using an inverter to complement the most significant bit to product (MSB ).
3
CSB = Complementary Straight Binary.
1
COB
or CTC
n
2
1
2
COB
or CTC
n
2
2
CSB
n
2
3
CSB
n
2
3
REV. C
–7–
AD1376/AD1377
CALIBRATION
(14-Bit Resolution Examples)
External ZERO ADJ and GAIN ADJ potentiometers, connected
as shown in Figures 4 and 5, are used for device calibration. To
prevent interaction of these two adjustments, zero is always
adjusted first and then gain. Zero is adjusted with the analog
input near the most negative end of the analog range (0 for unipolar and –FS for bipolar input ranges). Gain is adjusted with the
analog input near the most positive end of the analog range.
0 V to 10 V Range
Set analog input to +1 LSB14 = 0.00061 V. Adjust zero for
digital output = 11111111111110.
Zero is now calibrated. Set analog input to +FSR – 2 LSB =
9.99878 V. Adjust gain for 00000000000001 digital output
code; full scale (gain) is now calibrated. Half-scale calibration
check: set analog input to 5.00000 V; digital output code should
be 01111111111111.
–10 V to +10 V Range
Set analog input to 9.99878 V; adjust zero for 1111111111110
digital output (complementary offset binary) code. Set analog
input to 9.99756 V; adjust gain for 00000000000001 digital output (complementary offset binary) code. Half-scale calibration
check-set analog input to 0.00000 V; digital output (complementary offset binary) code should be 01111111111111.
Figure 11. Analog and Power Connections for
Bipolar –10 V to +10 V Input Range
Other Ranges
Representative digital coding for 0 V to +10 V and –10 V to
+10 V ranges is given above. Coding relationships and calibration points for 0 V to +5 V, –2.5 V to +2.5 V, and –5 V to +5 V
ranges can be found by halving proportionally the corresponding code equivalents listed for the 0 V to +10 V and –10 V to
+10 V ranges, respectively, as indicated in Table III.
Zero- and full-scale calibration can be accomplished to a precision of approximately ± 1/2 LSB using the static adjustment
procedure described previously. By summing a small sine or
triangular wave voltage with the signal applied to the analog
input, the output can be cycled through each of the calibration
codes of interest to more accurately determine the center (or
end points) of each discrete quantization level. A detailed
description of this dynamic calibration technique is presented in
Analog-Digital Conversion Handbook, edited by D. H. Sheingold,
Prentice Hall, Inc., 1986.
Figure 10. Analog and Power Connections for
Unipolar 0 V to 10 V Input Range
GROUNDING, DECOUPLING, AND LAYOUT
CONSIDERATIONS
Many data acquisition components have two or more ground
pins that are not connected together within the device. These
grounds are usually referred to as the logic power return,
analog common (analog power return), and analog signal
ground. These grounds (Pins 19 and 22) must be tied together
at one point for the ADC as close as possible to the converter.
REV. C–8–
Ideally, a single solid analog ground plane under the converter
would be desirable. Current flows through the wires and etch
stripes of the circuit cards, and since these paths have resistance
and inductance, hundreds of millivolts can be generated between
the system analog ground point and the ground pins of the
ADC. Separate wide conductor stripe ground returns should be
provided for high resolution converters to minimize noise and
IR losses from the current flow in the path from the converter to
the system ground point. In this way, ADC supply currents and
other digital logic-gate return currents are not summed into the
same return path as analog signals where they would cause
measurement errors.
Each of the ADC supply terminals should be capacitively
decoupled as close to the ADC as possible. A large value
capacitor such as 1 µF in parallel with a 0.1 µF capacitor is
usually sufficient. Analog supplies are to be bypassed to the
analog power return pin and the logic supply is bypassed to the
logic power return pin.
The metal cover is internally grounded with respect to the
power supplies, grounds, and electrical signals. Do not externally ground the cover.
CLOCK RATE CONTROL
The AD1376/AD1377 may be operated at faster conversion
times by connecting the clock rate control (Pin 23) to an
external multiturn trim potentiometer (TCR <100 ppm/°C) as
shown in Figure 12.
Figure 12. Clock Rate Control Circuit
HIGH RESOLUTION DATA ACQUISITION SYSTEM
The essential details of a high resolution data acquisition
system using the AD386 and AD1376 or AD1377 are shown
in Figure 13. Conversion is initiated by the falling edge of the
CONVERT START pulse. This edge drives the AD1376’s or
AD1377’s STATUS line high. The inverter then drives the
AD386 into hold mode. STATUS remains high throughout the
conversion and returns low once the conversion is completed.
This allows the AD386 to re-enter track mode.
This circuit can exhibit nonlinearities arising from transients
produced at the ADC’s input by the falling edge of CONVERT
START. This edge resets the ADC’s internal DAC; the resulting transient depends on the SHA’s present output voltage and
the ADC’s prior conversion result. In the circuit of Figure 14,
the falling edge of CONVERT START also places the SHA
into hold mode (via the ADC’s STATUS output), causing the
reset transient to occur at the same moment as the SHA’s trackand-hold transition. Timing skews and capacitive coupling can
cause some of the transient signal to add to the signal being
acquired by the SHA, introducing nonlinearity.
AD1376/AD1377
Figure 13. Basic Data Acquisition System
Interconnections
A much safer approach is to add a flip-flop, as shown in Figure 14.
The rising edge of CONVERT START places the track-andhold device into hold mode before the ADC reset transients
begin. The falling edge of STATUS places the AD386 back
into track mode. System throughput will be reduced if a long
CONVERT START pulse is used. Throughput can be calculated from
1
++
is the duration
CS
CONV
is the
where T
Throughput
is the track-and-hold acquisition time, T
ACQ
=
TT T
ACQCONVCS
time required for the ADC conversion, and T
of CONVERT START. The combination of the AD1376 and
AD386 will provide greater than 50 kHz throughput. No significant track-and-hold droop error will be introduced, provided
the width of CONVERT START is small compared with the
ADC’s conversion time.
REV. C
Figure 14. Improved Data Acquisition System
–9–
AD1376/AD1377
OUTLINE DIMENSIONS
32-Lead Bottom-Brazed Ceramic DIP [BBCDIP/H]
(DH-32E)
Dimensions shown in inches and (millimeters)
1.750 (44.45) MAX
32
17
1.105 (28.07)
1.075 (27.31)
0.225 (5.72)
MAX
0.145 (3.68)
MIN
1
PIN 1
INDICATOR
0.023 (0.58)
0.014 (0.36)
0.100 (2.54)
CONTROLLING DIMENSIONS ARE IN INCHES; MILLIMETER DIMENSIONS
(IN PARENTHESES) ARE ROUNDED-OFF INCH EQUIVALENTS FOR
REFERENCE ONLY AND ARE NOT APPROPRIATE FOR USE IN DESIGN