The AD10678 is a 16-bit, high performance, analog-to-digital
converter (ADC) for applications that demand increased SNR
levels. Exceptional noise performance and a typical signal-tonoise ratio of 80 dBFS are obtained by digitally postprocessing
the outputs of four ADCs. A single analog input and PECL
sampling clock and 3.3 V and 5 V power supplies are required.
FUNCTIONAL BLOCK DIAGRAM
NALO
POWER
AIN
AIN
AGND
5VA
3.3VE
AGND
ADC
ADC
ADC
ADC
CLOCK DISTRIBUTION
CIRCUIT
Figure 1.
AD10678
14
14
DIGITAL
POST-
PROCES-
14
SING
14
DGNDDGND
DIGITAL POWERENCODE ENCODE
PRODUCT HIGHLIGHTS
1. Guaranteed sample rate of 80 MSPS.
nput signal conditioning with optimized noise
2. I
performance.
3. F
ully tested and guaranteed performance.
AD10678
0
D
OUT
OUTPUT
DATA
BITS
D
15
OUT
DRY
3.3V
03376-A-001
The AD10678 is assembled using a 0.062-inch laminate board
wi
th three sets of connector interface pads to accommodate
analog and digital isolation. Analog Devices recommends
using the FSI-110-03-G-D-AD-K-TR connector from Samtec.
The overall board fits a 2.2 inch × 2.8 inch PCB specified from
0°C to 70°C.
Rev. C
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Anal og Devices for its use, nor for any infringements of patents or ot her
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarks and registered trademarks are the property of their respective owners.
@ −6 dBFS 10 MHz I 77.5 80.5 dBFS
30 MHz I 77 80.2 dBFS
70 MHz I 76 78 dBFS
2
SINAD
Analog Input 2.5 MHz I 77.2 80.3 dBFS
@ −6 dBFS 10 MHz I 77.2 80.3 dBFS
30 MHz I 76.6 79.7 dBFS
70 MHz I 74.7 77.4 dBFS
3
SFDR
Analog Input 2.5 MHz I 88 97.2 dBFS
@ −6 dBFS 10 MHz I 88 97.2 dBFS
30 MHz I 84 94.2 dBFS
70 MHz I 81 91.7 dBFS
TWO-TONE
Analog Input
@ −7 dBFS IMD
f1 = 10 MHz, f2 = 12 MHz V 96 dBFS
f1 = 70 MHz, f2 = 72 MHz V 84 dBFS
1
Analog input signal power at −6 dBFS; signal-to-noise (SNR) is the ratio of signal level to total noise (first five harmonics removed). Encode = 80 MSPS. SNR is reported
in dBFS, related back to converter full scale.
2
Analog input signal power at −6 dBFS; signal-to-noise and distortion (SINAD) is the ratio of signal level to total noise + harmonics. Encode = 80 MSPS. SINAD is
reported in dBFS, related back to converter full scale.
3
Analog input signal equals −6 dBFS; SFDR is the ratio of the converter full scale to the worst spur.
4
Both input tones at −7 dBFS; two-tone intermodulation distortion (IMD) rejection is the ratio of either tone to the worst third-order intermodulation product.
MAXIMUM CONVERSION RATE I 80 MSPS
MINIMUM CONVERSION RATE IV 30 MSPS
DUTY CYCLE IV 40 60 %
ENCODE INPUTS PARAMETERS
Encode Period @ 80 MSPS, t
ENC
Encode Pulse Width High @ 80 MSPS, t
Encode Pulse Width Low @ 80 MSPS, t
ENCH
ENCL
V 12.5 ns
V 6.25 ns
V 6.25 ns
ENCODE/DATA (D15:D0)
Propagation Delay, t
Valid Time, t
PDL
ENCODE/DATA READY
PDH
1
Encode Rising to Data Ready Falling, t
Encode Rising to Data Ready Rising, t
DATA READY/DATA
1
Data Ready to Data (Hold Time) t
Data Ready to Data (Setup Time) t
APERTURE DELAY, t
A
APERTURE UNCERTAINTY (JITTER), t
DR_F
DR_R
H_DR
S_DR
J
6.7 ns
7.3 ns
12.6 ns
6.4 ns
10 ns
1 ns
V 480 ps
V 500 fs rms
PIPELINE DELAYS V 10 Cycles
1
Duty cycle = 50%.
≤ 10 pF, unless otherwise noted.
LOAD
Rev. C | Page 5 of 20
AD10678
www.BDTIC.com/ADI
ABSOLUTE MAXIMUM RATINGS
Table 5.
Parameter Rating
AVCC to AGND 0 V to 7 V
EVCC to AGND 0 V to 6 V
V
to DGND –0.5 V to +3.8 V
DD
Analog Input Voltage 0 V to AV
Analog Input Current 25 mA
Encode Input Voltage 0 V to 5 V
Digital Output Voltage –0.5 V to V
Maximum Junction Temperature 150°C
Storage Temperature Range Ambient –65°C to +150°C
Maximum Operating Temperature Ambient 92°C
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
EXPLANATION OF TEST LEVELS
I. 100% production tested.
II. 100% p
III. S
IV. P
V. P
100% production tested at 25°C; guaranteed by design and
c
haracterization testing for industrial temperature range; 100%
production tested at temperature extremes for military devices.
roduction tested at 25°C and sample tested at
specified temperatures.
ample tested only.
arameter is guaranteed by design and characterization
testing.
arameter is a typical value only.
OPERATING RANGE
Operating ambient temperature range: 0°C to 70°C. See the
Thermal Considerations section.
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the
human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
Rev. C | Page 6 of 20
Preliminary Technical Data AD10678
www.BDTIC.com/ADI
TEST CIRCUITS
t
ANALOG INPUT
A
NN+1
t
ENC
t
ENCL
N+2N+3
t
ENCH
N+4
N+5
N+6
ENCODE, ENCODE
DATA BITS, D[15:0]
DATA-READY
OUTPUT
ENC
ENC
Figure 4. Equivalent Encode Input
100Ω
N
N
N+1
N–10N–9N–8N–7N–6N–5
N+1
N+2
t
PDH
N+2
t
S_DR
N+3
t
PDL
t
H_DR
N+3
N+4
t
DR_R
N+4
N+5
t
N+6
DR_F
N+5
N+6
03376-A-002
Figure 2. Timing Diagram
VCHAV
CC
1:1
200Ω500Ω
PECL
DRIVER
EV
AIN
AIN
CC
37.5kΩ
BUF
25Ω
25Ω
V
CL
VCHAV
×4
V
CL
500Ω
CC
500Ω
BUF
Figure 3. Analog Input Stage
MACROCELL
LOGIC
03376-A-004
T/H
BUF
T/H
V
DD
Figure 5. Digital Ou
V
REF
03376-A-003
V
DD
P
120Ω
D0–D
15
N
03376-A-005
tput Stage
V
DD
MACROCELL
LOGIC
Figure 6. Data-Ready Output
V
DD
P
DRY
1kΩ
N
03376-A-023
Rev. C | Page 7 of 20
AD10678
www.BDTIC.com/ADI
PIN CONFIGURATIONS AND FUNCTION DESCRIPTIONS
DGND
1
D
15
3
OUT
5
D
14
OUT
7
D
13
OUT
D
OUT
D
OUT
D
OUT
D
D
DGND
OUT
OUT
AD10678
12
9
TOP VIEW
11
11
(Not to Scale)
10
13
9
15
17
8
19
NC = NO CONNECT
Figure 7. Pin Configuration P1
(See Figure 22)
DGND
2
NC
4
6
DGND
8
NC
DGND
10
NC
12
DGND
14
NC
16
18
DGND
20
DRY
03376-A-026
DGND
1DGND2
+3.3VD 3D
5
+3.3VD
7
+3.3VD
DGND 9D
DGND 11D
DGND 13D
DGND 15D
+3.3VD
+3.3VD
AD10678
TOP VIEW
(Not to Scale)
17
19
6
8
18
20
Figure 8. Pin Configuration P2
(See Figure 22)
OUT
D
OUT
D
OUT
OUT
OUT
OUT
OUT
D
OUT
DGND
+3.3VE
04
1
2
310
412
514
616
7
03376-A-027
ENCODE
ENCODE
+3.3VE
AGND
AGND
AGND
AGND
AGND
AGND
1
3
5
7
AD10678
9
TOP VIEW
11
(Not to Scale)
13
15
17
19
2
4
6
8
10
12
14
16
18
20
+5.0VA
+5.0VA
+5.0VA
+5.0VA
AGND
AIN
AIN
AGND
AGND
AGND
INTERFACE NOTES:
SUGGESTE D INTERFACE MANUFACTURER: SAMTE C
HOLES 1–4 ACCOMMODATE 2-56 THREADED HARDWARE. USE FOUR 2- 56 NUTS FOR SECURING
THE PART TO INTERFACE PCB.
MANUFACTURER: BUILDING FASTENERS
DIGIKEY #: H723-ND
ALL METAL HARDWARE TO BE TORQUED TO 1.0 INCH-POUND.
CARE MUST BE TAKEN WHEN TIGHT ENING HARDWARE ADJACENT TO SURFACE-MOUNTED
COMPONENTS TO AVOID DAMAGE.
2
0.925
MH1
INTERFACE PART NUMBERS F OR P1-P3: FS I-110-03-G-D-AD-K-T R ( 20 -PIN)
Figure 20. SFDR and SNR vs. Analog Input Frequency
700 102030405060
03376-A-024
Rev. C | Page 11 of 20
AD10678
www.BDTIC.com/ADI
TERMINOLOGY
Analog Bandwidth
The analog input frequency at which the spectral power of the
fundamental frequency (as determined by the FFT analysis) is
reduced by 3 dB.
Output Propagation Delay
The de
lay between the 50% point of the rising edge of the
ENCODE command and the time when all output data bits
are within valid logic levels.
Aperture Delay
The de
lay between the 50% point on the rising edge of the
ENCODE command and the instant at which the analog input
is sampled.
Aperture Uncertainty (Jitter)
The s
ample-to-sample variation in aperture delay.
Differential Nonlinearity (DNL)
T
he deviation of any code from an ideal 1 LSB step.
Encode Pulse Width/Duty Cycle
lse width high is the minimum amount of time that the
Pu
encode pulse should be left in Logic 1 state to achieve rated
performance; pulse width low is the minimum time that the
encode pulse should be left in low state. At a given clock rate,
these specifications define an acceptable encode duty cycle.
Integral Nonlinearity (INL)
The de
viation of the transfer function from a reference line
measured in fractions of 1 LSB using a best straight line
determined by a least square curve fit.
Harmonic Distortion
The ra
tio of the rms signal amplitude to the rms value of the
worst harmonic component.
Maximum Conversion Rate
ncode rate at which parametric testing is performed.
The e
Minimum Conversion Rate
Th
e encode rate at which the SNR of the lowest analog signal
frequency drops by no more than 3 dB below the guaranteed limit.
Power Supply Rejection Ratio (PSRR)
he ratio of a change in output offset voltage to a change in
T
power supply voltage.
Signal-to-Noise and Distortion (SINAD)
tio of the rms signal amplitude (set at 1 dB below full
The ra
scale) to the rms value of the sum of all other spectral
components, including the first five harmonics and dc. Can be
reported in dBc (that is, degrades as signal level is lowered) or
in dBFS (always related back to converter full scale).
Signal-to-Noise Ratio (SNR)
Th
e ratio of the rms signal amplitude (set at 1 dB below full scale)
to the rms value of the sum of all other spectral components,
excluding the first five harmonics and dc. Can be reported in dBc
(that is, degrades as signal level is lowered) or in dBFS (always
related back to converter full scale).
Spurious-Free Dynamic Range (SFDR)
The
ratio of the rms signal amplitude to the rms value of the peak
spurious spectral component. The peak spurious component may
or may not be an harmonic. Can be reported in dBc (such as,
degrades as signal level is lowered) or in dBFS (always related
back to converter full scale).
atio of the rms value of either input tone to the rms value of the
worst third-order intermodulation product; reported in dBc.
Voltage Standing-Wave Ratio (VSWR)
tio of the amplitude of the elective field at a voltage
The ra
maximum to that at an adjacent voltage minimum.
Rev. C | Page 12 of 20
Preliminary Technical Data AD10678
www.BDTIC.com/ADI
THEORY OF OPERATION
The AD10678 uses four parallel, high speed ADCs in a
correlation technique to improve the dynamic range of the
ADCs. The technique consists of summing the parallel outputs
of the four converters to reduce the uncorrelated noise
introduced by the individual converters. Signals processed
through the high speed adder are correlated and summed
coherently. Noise is not correlated and sums on an rms basis.
The four high speed ADCs use a three-stage subrange architect
ure. The AD10678 provides complementary analog input pins,
AIN and
AIN
. Each analog input is centered around 2.4 V and
should swing ±0.55 V around the reference. Because AIN and
AIN
are 180 degrees out of phase, the differential analog input
signal is 2.15 V p-p.
The analog input is designed for a 50 Ω input impedance for
asy interface to commercially available cables, filters, drivers,
e
and so on.
The AD10678 encode inputs are ac-coupled to a PECL
dif
ferential receiver/driver. The output of the receiver/driver
provides a clock source for a 1:5 PECL clock driver and a PECLto-TTL translator. The 1:5 PECL clock driver provides the
differential encode signal for each of the four high speed ADCs.
The PECL-to-TTL translator provides a clock source for the
complex programmable logic device (CPLD).
The digital outputs from the four ADCs drive 120 Ω series
output terminators and are applied to the CPLD for postprocessing. The digital outputs are added together in the
complex programmable logic device through a ripple-carry
adder, which provides the 16-bit data output. The AD10678
provides valid data following 10 pipeline delays. The result
is a 16-bit parallel digital CMOS-compatible word coded as
true binary.
THERMAL CONSIDERATIONS
Due to the high power nature of the part, it is critical that the
following thermal conditions be met for the part to perform to
data sheet specifications. This also ensures that the maximum
junction temperature (150°C) is not exceeded.
peration temperature (T
•O
l mounting standoffs should be fastened to the interface
•Al
PCB assembly with 2-56 nuts. This ensures good thermal
paths as well as excellent ground points.
•The uni
t rises to ~72°C (T
(0 linear feet per minute (LFM)). The minimum
recommended air flow is 100 linear feet per minute (LFM)
in either direction across the heat sink (see Figure 21).
) must be within 0°C to 70°C.
A
) on the heat sink in still air
C
75
70
65
60
55
50
45
40
TEMPERATURE (CASE) (°C)
35
30
AIR FLOW (AMBIENT) (LFM)
Figure 21. Temperature (Case) vs. Air Flow (Ambient)
300010015050200250
03376-A-025
INPUT STAGE
The user is provided with a single-to-differential transformercoupled input. The input impedance is 50 Ω and requires a
2.15 V p-p input level to achieve full scale.
ENCODING THE AD10678
The AD10678 encode signal must be a high quality, low phase
noise source to prevent performance degradation. The clock
input must be treated as an analog input signal because aperture
jitter can affect dynamic performance. For optimum performance, the AD10678 must be clocked differentially.
OUTPUT LOADING
Take care when designing the data receivers for the AD10678.
The complex, programmable logic device, 16-bit outputs drive
120 Ω series resistors to limit the amount of current that can
flow into the output stage. To minimize capacitive loading,
there should be only one gate on each of the output pins. A
typical CMOS gate combined with the PCB trace has a load of
approximately 10 pF. Note that extra capacitive loading
increases output timing and invalidates timing specifications.
Digital output timing is guaranteed with a 10 pF load.
ANALOG AND DIGITAL POWER SUPPLIES
Care must be taken when selecting a power source. Linear
supplies are recommended. Switching supplies tend to have
radiated components that can be coupled into the ADCs. The
AD10678 features separate analog and digital supply and
ground currents, helping to minimize digital corruption of
sensitive analog signals.
Rev. C | Page 13 of 20
AD10678
www.BDTIC.com/ADI
The +3.3 VE supply provides power to the clock distribution
circuit. The +3.3 VD supply provides power to the digital
output section of the ADCs, the PECL-to-TTL translator, and
the CPLD. Separate +3.3 VE and +3.3 VD supplies are used to
prevent modulation of the clock signal with digital noise.
The +5.0 VA supply provides power to the analog sections
f the ADCs. Decoupling capacitors are strategically placed
o
throughout the circuit to provide low impedance noise shunts
to ground. The +5.0 VA supply (analog power) should be
decoupled to analog ground (AGND), and +3.3 VD (digital
power) should be decoupled to digital ground (DGND). The
+3.3 VE supply (analog power) should be decoupled to AGND.
The evaluation board schematic and layout data provide a
typical PCB implementation of the AD10678.
PCB b
ill of materials.
ANALOG AND DIGITAL GROUNDING
Although the AD10678 provides separate analog and digital
ground pins, the device should be treated as an analog
component. Proper grounding is essential in high speed, high
resolution systems. Multilayer printed circuit boards are
recommended to provide optimal grounding and power
distribution. The use of power and ground planes provides
distinct advantages. Power and ground planes minimize the
loop area encompassed by a signal and its return path,
minimize the impedance associated with power and ground
paths, and provide a distributed capacitor formed by the power
plane, printed circuit board material, and ground plane. The
AD10678 unit has four metal standoffs (see
cated in the center of the unit and MH1 is located directly
lo
below analog header P3. Both of these standoffs are tied to
analog ground and should be connected accordingly on the
Tabl e 8 shows the
Figure 10). MH2 is
next level assembly for optimum performance. The two
st
andoffs located near P1 and P2 (MH3 and MH4) are tied to
digital ground and should be connected accordingly on the
next-level assembly.
OTHER NOTES
The circuit is configured on a 2.2 inch × 2.8 inch laminate
board with three sets of connector interface pads. The pads
are configured to provide easy keying for the user. The pads
are made for low profile applications and have a total height of
0.12 inches after mating. The part numbers for the header mates
are provided in
s
ections are described in the Pin Configurations and Function
De
scriptions section.
Figure 10. All pins of the analog and digital
EVALUATION BOARD
The AD10678 evaluation board provides an easy way to test
the 16-bit, 80 MSPS ADC. The board requires a clock source,
an analog input signal, two 3.3 V power supplies, and a 5 V
power supply. The clock source is buffered on the board to
provide a latch, a data ready signal, and the clock for the
AD10678. To use the AD10678 data ready output to clock
the buffer memory, remove R24 (0.0 Ω) and install a 0.0 Ω
resistor at R31 (DNI). The ADC digital outputs are latched on
board by a 74LCX16374. The digital outputs and output clock
are available on a 40-pin connector, J1. Power is supplied to the
board via uninsulated metal banana jacks.
The analog input is connected via an SMA connector, AIN. The
a
nalog input section provides a single-ended input option or a
differential input option. The board is shipped in a single-ended
analog input option. Removing a ground tie at E17 converts the
circuit to a differential analog input configuration.
Table 8. PCB Bill of Materials
Item Quantity Reference Designator Description
1 1 J1 Connector, 40-position header, male straight
2 1 U1 IC, LV 16-bit, D-type flip-flop with 5 V tolerant I/O
3 3 L1 to L3 Common-mode surface-mount ferrite bead 20 Ω
4 3 J11 to J13 Connector, 1 mm single-element interface
5 6 P1, P2, P8 to P10, P12 Uninsulated banana jack, all metal
6 2 U5, U6 IC, 3.3 V/5 V ECL differential receiver/driver
7 1 U7 IC, 3.3 V dual differential LVPECL to LVTTL translator
8 1 R24 RES 0.0 Ω 1/10 W 5% 0805 SMD
9 19 R0 to R16, R20, R23 RES 51.1 Ω 1/10 W 1% 0805 SMD
10 1 R17 RES 18.2 kΩ 1/10 W 1% 0805 SMD
11 4 R18, R19, R21, R22 RES 100 Ω 1/10 W 1% 0805 SMD
12 17 C1, C10 to C13, C16 to C18, C23 to C26, C28 to C32 CAP 0.1 μF 16 V ceramic X7R 0805
13 6 C8, C9, C4, C15, C27, C33 CAP 10 μF 10 V ceramic Y5V 1206
14 4 J2, J3, J5, J6 Connector, SMA jack 200 Mil STR gold
15 1 A1 Assembly, AD10678BWS
16 1 AD106xx Evaluation Board GS04483 (PCB)