133 MHz f
38 Inputs; 210A Inputs have built-in pull-up
resistors
Industrial
PD
CNT
GENERAL DESCRIPTION
The MACH210 is a member of AMD’s high-performance
EE CMOS MACH 2
approximately six times the logic macrocell capability of
the popular PAL22V10 without loss of speed.
The MACH210 consists of four PAL blocks interconnected by a programmable switch matrix. The four PAL
blocks are essentially “PAL22V16” structures complete
with product-term arrays and programmable macrocells, including additional buried macrocells. The switch
matrix connects the PAL blocks to each other and to all
input pins, providing a high degree of connectivity
between the fully-connected PAL blocks. This allows
designs to be placed and routed efficiently.
The MACH210 has two kinds of macrocell: output and
buried. The MACH210 output macrocell provides regis-
device family. This device has
Peripheral Component Interconnect (PCI)
compliant
32 Outputs
64 Flip-flops; 2 clock choices
4 “PAL22V16” blocks with buried macrocells
Pin-compatible with MACH110, MACH111,
MACH211, and MACH215
tered, latched, or combinatorial outputs with programmable polarity. If a registered configuration is chosen,
the register can be configured as D-type or T-type to
help reduce the number of product terms. The register
type decision can be made by the designer or by the
software. All output macrocells can be connected to an
I/O cell. If a buried macrocell is desired, the internal
feedback path from the macrocell can be used, which
frees up the I/O pin for use as an input.
The MACH210 has dedicated buried macrocells which,
in addition to the capabilities of the output macrocell,
also provide input registers or latches for use in
synchronizing signals and reducing setup time requirements.
Advanced
Micro
Devices
Publication# 14128 Rev. IAmendment/0
Issue Date: May 1995
AMD
BLOCK DIAGRAM
–I/O
I/O
0
7
I/O8–I/O
I0–I
1,
I3–I
15
4
I/O Cells
8
Macrocells
8
8
I/O Cells
8
Macrocells
OE
Macrocells
44 x 68
AND Logic Array
and
Logic Allocator
2222
Switch Matrix
2222
44 x 68
AND Logic Array
and
Logic Allocator
OE
8
44 x 68
AND Logic Array
and
Logic Allocator
44 x 68
AND Logic Array
and
Logic Allocator
8
8
Macrocells
OE
OE
8
2
4
2
Macrocells
8
I/O Cells
I/O24–I/O
Macrocells
8
Macrocells
8
Macrocells
8
88
2
I/O Cells
16
–I/O
8
23
CLK0/I
CLK1/I
2,
5
14128I-1
8
31
I/O
MACH210-7/10/12/15/20, Q-12/15/202
CONNECTION DIAGRAM
Top View
AMD
PLCC
I/O
I/O
I/O
GND
CLK0/I
I/O
I/O
I/O
I/O
10
I
I
11
3
I/O4I/O
5613244443424140
7
5
8
6
9
7
10
0
11
1
12
13
2
14
8
15
9
16
17
18282726252423222119 20
13
I/O12I/O
2
I/O
14
I/O
1
I/O
15
I/O
0
I/O
CC
V
GND
GND
CC
V
16
I/O
30
31
I/O
I/O
18
I/O17I/O
28
I/O29I/O
39
38
37
36
35
34
33
32
31
30
29
19
20
I/O
I/O
I/O
27
I/O
26
I/O
25
I/O
24
CLK1/I
GND
I
4
I
3
I/O
23
I/O
22
I/O
21
14128I-2
5
Note:
Pin-compatible with MACH110, MACH111, MACH211, and MACH215.
CLK/I =Clock or Input
GND=Ground
I=Input
I/O=Input/Output
V
=Supply Voltage
CC
MACH210-7/10/12/15/20, Q-12/15/204
AMD
ORDERING INFORMATION
Commercial Products
AMD programmable logic products for commercial applications are available with several ordering options. The order number
(Valid Combination) is formed by a combination of:
The Valid Combinations table lists configurations
planned to be supported in volume for this device. Consult the local AMD sales office to confirm availability of
specific valid combinations or to check on newly released combinations.
°C to +70°C)
MACH210-7/10/12/15/20, Q-12/15/20 (Com’l)
5
AMD
ORDERING INFORMATION
Industrial Products
AMD programmable logic products for industrial applications are available with several ordering options. The order number (Valid
Combination) is formed by a combination of:
The Valid Combinations table lists configurations
planned to be supported in volume for this device. Consult the local AMD sales office to confirm availability of
specific valid combinations or to check on newly released combinations.
°C to +85°C)
6MACH210-12/14/18/24 (Ind)
AMD
FUNCTIONAL DESCRIPTION
The MACH210 consists of four PAL blocks connected
by a switch matrix. There are 32 I/O pins and 4
dedicated input pins feeding the switch matrix. These
signals are distributed to the four PAL blocks for efficient
design implementation. There are two clock pins that
can also be used as dedicated inputs.
The MACH210A inputs and I/O pins have built-in pull-up
resistors. While it is always a good design practice to tie
unused pins high, the 210A pull-up resistors provide
design security and stability in the event that unused
pins are left disconnected.
The PAL Blocks
Each PAL block in the MACH210 (Figure 1) contains a
64-product-term logic array, a logic allocator, 8 output
macrocells, 8 buried macrocells, and 8 I/O cells. The
switch matrix feeds each PAL block with 22 inputs. This
makes the PAL block look effectively like an independent “PAL22V16” with 8 buried macrocells.
In addition to the logic product terms, two output enable
product terms, an asynchronous reset product term,
and an asynchronous preset product term are provided.
One of the two output enable product terms can be
chosen within each I/O cell in the PAL block. All flip-flops
within the PAL block are initialized together.
The Switch Matrix
The MACH210 switch matrix is fed by the inputs and
feedback signals from the PAL blocks. Each PAL block
provides 16 internal feedback signals and 8 I/O
feedback signals. The switch matrix distributes these
signals back to the PAL blocks in an efficient manner
that also provides for high performance. The design
software automatically configures the switch matrix
when fitting a design into the device.
The Product-term Array
The MACH210 product-term array consists of 64
product terms for logic use, and 4 special-purpose
product terms. Two of the special-purpose product
terms provide programmable output enable; one provides asynchronous reset, and one provides asynchronous preset.
The Logic Allocator
The logic allocator in the MACH210 takes the 64 logic
product terms and allocates them to the 16 macrocells
as needed. Each macrocell can be driven by up to 16
product terms. The design software automatically
configures the logic allocator when fitting the design into
the device.
Table 1 illustrates which product term clusters are
available to each macrocell within a PAL block. Refer to
Figure 1 for cluster and macrocell numbers.
Table 1. Logic Allocation
Macrocell
OutputBuriedClusters
M
0
M
1
M
2
M
3
M
4
M
5
M
6
M
7
M
8
M
9
M
10
M
11
M
12
M
13
M
14
M
15
Available
C0, C1, C
C0, C1, C2, C
C1, C2, C3, C
C2, C3, C4, C
C3, C4, C5, C
C4, C5, C6, C
C5, C6, C7, C
C6, C7, C8, C
C7, C8, C9, C
2
3
4
5
6
7
8
9
10
C8, C9, C10, C
C9, C10, C11, C
C10, C11, C12, C
C11, C12, C13, C
C12, C13, C14, C
C13, C14, C
C14, C
15
15
11
12
13
14
15
The Macrocell
The MACH210 has two types of macrocell: output and
buried. The output macrocells can be configured as
either registered, latched, or combinatorial, with programmable polarity. The macrocell provides internal
feedback whether configured with or without the flipflop. The registers can be configured as D-type or
T-type, allowing for product-term optimization.
The flip-flops can individually select one of two clock/
gate pins, which are also available as data inputs. The
registers are clocked on the LOW-to-HIGH transition of
the clock signal. The latch holds its data when the gate
input is HIGH, and is transparent when the gate input is
LOW. The flip-flops can also be asynchronously initialized with the common asynchronous reset and preset
product terms.
The buried macrocells are the same as the output
macrocells if they are used for generating logic. In that
case, the only thing that distinguishes them from the
output macrocells is the fact that there is no I/O cell
connection, and the signal is only used internally. The
buried macrocell can also be configured as an input
register or latch.
7MACH210-7/10/12/15/20, Q-12/15/20
AMD
The I/O Cell
The I/O cell in the MACH210 consists of a three-state
output buffer. The three-state buffer can be configured
in one of three ways: always enabled, always disabled,
or controlled by a product term. If product term control is
chosen, one of two product terms may be used to
provide the control. The two product terms that are
available are common to all I/O cells in a PAL block.
These choices make it possible to use the macrocell as
an output, an input, a bidirectional pin, or a three-state
output for use in driving a bus.
PCI Compliance
The MACH210A-7/10 is fully compliant with the
Local Bus Specification
Interest Group. The MACH210A-7/10’s predictable
timing ensures compliance with the PCI AC specifications independent of the design. On the other hand, in
CPLD and FPGA architectures without predictable
timing, PCI compliance is dependent upon routing and
product term distribution.
Stresses above those listed under Absolute Maximum Ratings
may cause permanent device failure. Functionality at or above
these limits is not implied. Exposure to Absolute Maximum
Ratings for extended periods may affect device reliability. Programming conditions may differ.
DC CHARACTERISTICS over COMMERCIAL operating ranges unless otherwise specified
1. These are absolute values with respect to device ground and all overshoots due to system or tester noise are included.
2. I/O pin leakage is the worst case of I
3. Not more than one output should be shorted at a time and duration of the short-circuit should not exceed one second.
V
= 0.5 V has been chosen to avoid test problems caused by tester ground degradation.
OUT
4. This parameter is measured with a 16-bit up/down counter pattern. This pattern is programmed in each PAL block and
capable of being loaded, enabled, and reset.
Output HIGH VoltageIOH = –3.2 mA, VCC = Min2.4V
= V
IH
or V
IL
V
IN
Output LOW VoltageIOL = 16 mA, VCC = Min0.5V
= V
IH
or V
IL
V
IN
Input HIGH VoltageGuaranteed Input Logical HIGH2.0V
Voltage for all Inputs (Note 1)
Input LOW VoltageGuaranteed Input Logical LOW0.8V
Voltage for all Inputs (Note 1)
Input HIGH Leakage CurrentVIN = 5.25 V, VCC = Max (Note 2)10µA
Input LOW Leakage CurrentV
Current HIGHV
Current LOWV
Output Short-Circuit CurrentV
Supply CurrentV
Input, I/O, or Feedback to Combinatorial Output7.5ns
Setup Time from Input, I/O or Feedback to ClockD-Type5.5ns
T-Type6.5ns
-7
t
H
t
CO
t
WL
t
WH
f
MAX
t
SL
t
HL
t
GO
t
GWL
t
PDL
t
SIR
t
HIR
t
ICO
t
ICS
Register Data Hold Time0ns
Clock to Output5ns
Clock Width LOW3ns
HIGH3ns
D-Type100MHz
Maximum
D-Type133MHz
Frequency
External Feedback
Internal Feedback (f
No Feedback
CNT
T-Type91MHz
)
T-Type125MHz
166.7MHz
Setup Time from Input, I/O, or Feedback to Gate5.5ns
Latch Data Hold Time0ns
Gate to Output6ns
Gate Width LOW3ns
Input, I/O, or Feedback to Output Through9.5ns
Transparent Input or Output Latch
Input Register Setup Time2ns
Input Register Hold Time2ns
Input Register Clock to Combinatorial Output11ns
Input Register Clock to Output Register SetupD-Type9ns
T-Type10ns
t
WICL
t
WICH
f
MAXIR
t
SIL
t
HIL
t
IGO
t
IGOL
t
SLL
Input Register Clock WidthLOW3ns
HIGH3ns
Maximum Input Register Frequency166.7MHz
Input Latch Setup Time2ns
Input Latch Hold Time2ns
Input Latch Gate to Combinatorial Output12ns
Input Latch Gate to Output Through Transparent Output Latch14ns
Setup Time from Input, I/O, or Feedback Through7.5ns
Transparent Input Latch to Output Latch Gate
11MACH210A-7 (Com’l)
AMD
SWITCHING CHARACTERISTICS over COMMERCIAL operating ranges (continued)
Parameter
-7
SymbolParameter DescriptionMinMaxUnit
t
IGS
t
WIGL
t
PDLL
Input Latch Gate to Output Latch Setup10ns
Input Latch Gate Width LOW3ns
Input, I/O, or Feedback to Output Through Transparent11.5ns
Input and Output Latches
t
AR
t
ARW
t
ARR
t
AP
t
APW
t
APR
t
EA
t
ER
Asynchronous Reset to Registered or Latched Output12ns
Asynchronous Reset Width8ns
Asynchronous Reset Recovery Time8ns
Asynchronous Preset to Registered or Latched Output12ns
Asynchronous Preset Width8ns
Asynchronous Preset Recovery Time8ns
Input, I/O, or Feedback to Output Enable7.5ns
Input, I/O, or Feedback to Output Disable7.5ns
Note:
1. These parameters are not 100% tested, but are evaluated at initial characterization and at any time the design is modified
where capacitance may be affected.
Stresses above those listed under Absolute Maximum Ratings
may cause permanent device failure. Functionality at or above
these limits is not implied. Exposure to Absolute Maximum
Ratings for extended periods may affect device reliability.
Programming conditions may differ.
= 0°C to +70°C)200 mA. . . . . .
A
DC CHARACTERISTICS over COMMERCIAL operating ranges unless otherwise specified
Parameter
SymbolParameter DescriptionTest Conditions MinTyp Max Unit
V
OH
V
OL
V
IH
V
IL
I
IH
I
IL
I
OZH
I
OZL
I
SC
I
CC
Output HIGH VoltageIOH = –3.2 mA, VCC = Min 2.4V
V
= VIH or V
IN
IL
Output LOW VoltageIOL = 16 mA, VCC = Min0.5 V
= VIH or V
V
IN
IL
Input HIGH VoltageGuaranteed Input Logical HIGH 2.0V
Voltage for all Inputs (Note 1)
Input LOW VoltageGuaranteed Input Logical LOW0.8 V
Voltage for all Inputs (Note 1)
Input HIGH Leakage CurrentVIN = 5.25 V, VCC = Max (Note 2) 10 µA
Input LOW Leakage CurrentVIN = 0 V, V
Off-State Output LeakageV
Current HIGHV
Off-State Output LeakageV
Current LOWV
Output Short-Circuit CurrentV
Supply Current (Typical)V
= 5.25 V, VCC = Max10 µA
OUT
= V
IN
= 0 V, VCC = Max–100 µA
OUT
= V
IN
= 0.5 V, VCC = Max (Note 3) –30–160 mA
OUT
= 5V, TA= 25°C, f = 25 MHz 135 mA
CC
= Max (Note 2)–100 µA
CC
or VIL (Note 2)
IH
or VIL (Note 2)
IH
(Note 4)
Notes:
1. These are absolute values with respect to device ground and all overshoots due to system or tester noise are included.
2. I/O pin leakage is the worst case of I
and I
IL
(or IIH and I
OZL
OZH
).
3. Not more than one output should be shorted at a time and duration of the short-circuit should not exceed one second.
= 0.5 V has been chosen to avoid test problems caused by tester ground degradation.
V
OUT
4. Measured with a 16-bit up/down counter pattern. This pattern is programmed in each PAL block and is capable of being
Register Data Hold Time00ns
Clock to Output (Note 3)68ns
Clock LOW56ns
Width HIGH56ns
D-Type8066.7MHz
f
MAX
t
t
t
t
GWL
t
PDL
SL
HL
GO
Maximum
External Feedback 1/(tS + tCO)
Frequency
D-Type10083.3MHz
(Note 1)
Internal Feedback (f
CNT
No Feedback 1/(t
)
S
+ t
)
H
Setup Time from Input, I/O, or Feedback to Gate6.57ns
Latch Data Hold Time00ns
Gate to Output (Note 3)710ns
Gate Width LOW56ns
Input, I/O, or Feedback to Output Through
T-Type7462.5MHz
T-Type9176.9MHz
Transparent Input or Output Latch1214ns
t
SIR
t
HIR
t
ICO
t
ICS
Input Register Setup Time22ns
Input Register Hold Time22ns
Input Register Clock to Combinatorial Output1315ns
Input Register Clock to Output Register SetupD-Type1012ns
T-Type1113ns
t
WICL
t
WICH
f
MAXIR
t
SIL
t
HIL
t
IGO
t
IGOL
Input RegisterLOW56ns
Clock WidthHIGH56ns
Maximum Input Register Frequency 1/(t
WICL
+ t
)10083.3MHz
WICH
Input Latch Setup Time22ns
Input Latch Hold Time22ns
Input Latch Gate to Combinatorial Output1417ns
Input Latch Gate to Output Through Transparent
Output Latch1619ns
t
SLL
Setup Time from Input, I/O, or Feedback Through
Transparent Input Latch to Output Latch Gate 8.59ns
t
IGS
Input Latch Gate to Output Latch Setup1113ns
-10-12
10083.3MHz
14
MACH210A-10/12 (Com’l)
AMD
SWITCHING CHARACTERISTICS over COMMERCIAL operating ranges (Note 2)
(continued)
Parameter
SymbolParameter DescriptionMinMaxMinMaxUnit
t
WIGL
t
PDLL
t
AR
t
ARW
t
ARR
t
AP
t
APW
t
APR
t
EA
t
ER
Notes:
1. These parameters are not 100% tested, but are evaluated at initial characterization and at any time the design is modified
where capacitance may be affected.
2. See Switching Test Circuit, for test conditions.
3. Parameters measured with 16 outputs switching.
Input Latch Gate Width LOW56ns
Input, I/O, or Feedback to Output Through Transparent
Input and Output Latches1416ns
Asynchronous Reset to Registered or Latched Output2516ns
Asynchronous Reset Width (Note 1)1012ns
Asynchronous Reset Recovery Time (Note 1)108ns
Asynchronous Preset to Registered or Latched Output1516ns
Asynchronous Preset Width (Note 1)1012ns
Asynchronous Preset Recovery Time (Note 1)108ns
Input, I/O, or Feedback to Output Enable (Note 3)1012ns
Input, I/O, or Feedback to Output Disable (Note 3)1012ns
Stresses above those listed under Absolute Maximum Ratings
may cause permanent device failure. Functionality at or above
these limits is not implied. Exposure to Absolute Maximum
Ratings for extended periods may affect device reliability.
Programming conditions may differ.
= 0°C to +70°C)200 mA. . . . . .
A
DC CHARACTERISTICS over COMMERCIAL operating ranges unless otherwise specified
Parameter
SymbolParameter DescriptionTest Conditions MinTyp Max Unit
V
OH
V
OL
V
IH
V
IL
I
IH
I
IL
I
OZH
I
OZL
I
SC
I
CC
Output HIGH VoltageIOH = –3.2 mA, VCC = Min 2.4V
V
= VIH or V
IN
IL
Output LOW VoltageIOL = 16 mA, VCC = Min0.5 V
= VIH or V
V
IN
IL
Input HIGH VoltageGuaranteed Input Logical HIGH 2.0V
Voltage for all Inputs (Note 1)
Input LOW VoltageGuaranteed Input Logical LOW0.8 V
Voltage for all Inputs (Note 1)
Input HIGH Leakage CurrentVIN = 5.25 V, VCC = Max (Note 2) 10 µA
Input LOW Leakage CurrentVIN = 0 V, V
Off-State Output LeakageV
Current HIGHV
Off-State Output LeakageV
Current LOWV
Output Short-Circuit CurrentV
Supply Current (Typical)V
= 5.25 V, VCC = Max10 µA
OUT
= V
IN
= 0 V, VCC = Max–100 µA
OUT
= V
IN
= 0.5 V, VCC = Max (Note 3) –30–160 mA
OUT
= 5V, TA= 25°C, f = 25 MHz 135 mA
CC
= Max (Note 2)–100 µA
CC
or VIL (Note 2)
IH
or VIL (Note 2)
IH
(Note 4)
Notes:
1. These are absolute values with respect to device ground and all overshoots due to system or tester noise are included.
2. I/O pin leakage is the worst case of I
and I
IL
(or IIH and I
OZL
OZH
).
3. Not more than one output should be shorted at a time and duration of the short-circuit should not exceed one second.
= 0.5 V has been chosen to avoid test problems caused by tester ground degradation.
V
OUT
4. Measured with a 16-bit up/down counter pattern. This pattern is programmed in each PAL block and is capable of being
loaded, enabled, and reset.
16
MACH210A-12/14 (Ind)
Loading...
+ 35 hidden pages
You need points to download manuals.
1 point = 1 manual.
You can buy points or you can get point for every manual you upload.