preprograms and erases the entire chip or any
combination of designated sectors
— Embedded Program algorithm automatically
writes and verifies data at specified addresses
sector
— 48-ball FBGA
— 48-pin TSOP
— 44-pin SO
— Provides device-specific information to the
system, allowing host software to easily
reconfigure for different Flash devices
— Pinout and software compatible with single-
power supply Flash
— Superior inadvertent write protection
— Provides a software method of detecting
program or erase operation completion
— Provides a hardware method of detecting
program or erase cycle completion (not
available on 44-pin SO)
— Suspends an erase operation t o read data from,
or program data to, a sector that is not being
erased, then resumes the erase operation
— Hardware method to reset the de vice to reading
array data
Publication# 21358 Rev: F Amendment/+2
Issue Date: March 1998
PRELIMINARY
GENERAL DESCRIPTION
The Am29LV160B is a 16 Mbit, 3.0 Vo lt-only Flash memor y
organized as 2,097,152 bytes or 1,048,576 words. The
device is offered in 48-ball FBGA, 44-pin SO, and 48-pin
TSOP packages. The word-wide data (x16) appears on
DQ15–DQ0; the byte -wide (x8) data appea rs on DQ7–DQ0 .
This device is designed to be progr ammed in-sys tem with
the standard syste m 3.0 volt V
are not required for write or erase operations. The
V
CC
device can also be programmed in standard
EPROM programmers.
The device offers access times of 80, 90, and 120 ns,
allowing high speed microprocessors to operate
without wait states. To eliminate bus contention the
device has separate chip enable (CE#), write enable
(WE#) and output enable (OE#) controls.
The device requires only a single 3. 0 v o lt po wer sup-ply for both read and write functions. Internally generated and regulated voltages are provided for the
program and erase operations.
The Am29LV160B is entirely command set compatible
with the JEDEC single-power-supply Flashstandard. Commands are written to t he command register using standard microprocessor write timings. Register contents ser ve as input to an internal state machine that controls the erase and programming circuitry. Write cycles also internally latch addresses and
data needed for the programming and erase op erations. Reading data out of the device is similar to
reading from other Flash or EPROM devices.
Device programming occurs by executing the program
command sequence. This initiates the EmbeddedProgram algorithm—an internal algorithm that automatically times the program pulse widths and verifies
proper cell margin. The Unlock Bypass mode facilitates faster programming times by requir ing only two
write cycles to program data instead of four.
Device erasure occurs by executing the erase command sequence. This initiates the Embedded Erase
algorithm—an internal algorithm that automatically preprograms the array (if it is not already progr ammed) before executing the erase operation. During erase, the
device automatically times the erase pulse widths and
verifies proper cell margin.
supply. A 12.0 V VPP or 5.0
CC
The host system can detect whether a program or
erase operation is complete by observing the RY/BY#
pin, or by reading the DQ7 (Data# Polling) and DQ6
(toggle) status bits. After a program or erase cycle
has been completed, the device is ready to read array
data or accept another command.
The sector erase ar chitecture allo ws memo ry secto rs
to be erased and reprogrammed without affecting the
data contents of other sectors. The device is fully
erased when shipped from the factory.
Hardwar e data pr otecti on measures include a low V
CC
detector that automatically inhibits wr ite operations during power transitions. The hardware sector protection
feature disables both program and erase operatio ns in
any combination of the sectors of memor y. This can be
achieved in-system or via programming equipment.
The Erase Suspend/Erase Resume feature enables
the user to put erase on hold for any period of time to
read data from, or program data to, any sector that is
not selected for erasure. Tr ue background erase can
thus be achieved.
The hardware RESET# pin terminates any operation
in progress and resets the internal state machine to
reading array dat a. The RESET# pin ma y be tied to the
system reset circuitry. A system reset would thus also
reset the device, enabling the system microprocessor
to read the boot-up firmware from the Flash memory.
The device offers two power-saving features. When
addresses have been stable for a specified amount of
time, the device enters the automatic sleep m ode.
The system can also place the de vice into the standbymode. Power consumption is greatly reduced in both
these modes.
AMD’s Flash technology combines years of Flash
memory manufacturing experience to produce the
highest lev els of quality, reliability and cost effect iv eness .
The device electrically erases all bits within a sector
simultaneously via Fowler-Nordheim tunneling. The
data is programmed us ing hot el ec tr on i nject ion.
2Am29LV160B
PRELIMINARY
PRODUCT SELECTOR GUIDE
Family Part NumberAm29LV160B
Speed Option
Max access time, ns (t
Max CE# access time, ns (tCE)8090120
Max OE# access time, ns (tOE)303550
Regulated Voltage Range: VCC =3.0–3.6 V80R
Full Voltage Range: VCC = 2.7–3.6 V90120
)8090120
ACC
Note: See “AC Characteristics ” for full specifications.
Special handling is required for Flash Memory products
in FBGA packages.
CE#A0A1A2A4A3
BYTE#A16A15A14A12A13
OE#V
DQ9DQ1DQ8DQ0A5A6A17A7
DQ11DQ3DQ10DQ2NCA18NCRY/BY#
V
CC
DQ13DQ6DQ14DQ7A11A10A8A9
DQ15/A-1 V
SS
DQ4DQ12DQ5A19NCRESET#WE#
SS
21358F-1
Flash memory devices in FBGA packages may be
damaged if exposed to ultrasonic cleaning methods.
The package and/or data integrity may be compromised
if the package body is exposed to temperatures above
150°C for prolonged periods of time.
Am29LV160B5
PRELIMINARY
PIN CONFIGURATION
A0–A19= 20 addresses
DQ0–DQ14 = 15 data inputs/outputs
DQ15/A-1 = DQ15 (data input/output, word mode),
AMD standard products are available in several packages and operating ranges. The order number (Valid Combination) is formed by a combination of the elements below.
CE80RAM29LV160BT
OPTIONAL PROCESSING
Blank = Standard Processing
B = Burn-in
(Contact an AMD representative for more information)
TEMPERATURE RANGE
C=Commercial (0°C to +70°C)
I = Industrial (–40°C to +85°C)
E = Extended (–55°C to +125°C)
Am29LV160B
16 Megabit (2M x 8-Bit/1M x 16-Bit) CMOS Flash Memory
3.0 Volt-only Read, Program, and Erase
Valid Combinations
Valid Combinations list configurations planned to be supported in volume for this device. Consult the local AMD sales
office to confirm availability of specific valid combinations and
to check on newly released combinations.
Am29LV160B7
PRELIMINARY
DEVICE BUS OPERATIONS
This section describes the requirements and use of the
device bus operations, which are initiated through the
internal command register. The command register itself
does not occupy any addressable memory loc ation.
The register is composed of latches that store the commands, along with the address and data information
needed to execute the command. The contents of the
Table 1. Am29LV160B Device Bus Operations
OperationCE#OE# WE# RESET#
ReadLLHHA
WriteLHLHA
±
V
Standby
Output DisableLHHHXHigh-ZHigh-ZHigh-Z
ResetXXXLXHigh-ZHigh-ZHigh-Z
Sector Protect (Note 2)LHLV
Sector Unprotect (Note 2)LHLV
Temporary Sector
Unprotect
CC
0.3 V
XX
XXX V
VCC ±
0.3 V
ID
ID
ID
register serve as inputs to the internal state machine.
The state machine outputs d ictate the function of the
device. Table 1 lists the device bus operations, the inputs and control levels they require, and the resulting
output. The following subsections describe each of
these operations in further detail.
DQ8–DQ15
Addresses
(Note 1)
IN
IN
XHigh-ZHigh-ZHigh-Z
Sector Address,
A6 = L, A1 = H,
A0 = L
Sector Address,
A6 = H, A1 = H,
A0 = L
A
IN
DQ0–
DQ7
D
OUT
D
IN
D
IN
D
IN
D
IN
BYTE#
= V
IH
D
OUT
D
IN
XX
XX
D
IN
BYTE#
= V
IL
DQ8–DQ14 = High-Z,
DQ15 = A-1
High-Z
Legend:
L = Logic Low = V
, H = Logic High = VIH, VID = 12.0 ± 0.5 V, X = Don’t Care, AIN = Address In, DIN = Data In, D
IL
= Data Out
OUT
Notes:
1. Addresses are A19:A0 in word mode (BYTE# = V
), A19:A-1 in byte mode (BYTE# = VIL).
IH
2. The sector protect and sector unprotect functions may also be implemented via programming equipment. See the “Sector
Protection/Unprotection” section.
Word/Byte Configuration
The BYTE# pin controls whether the device data I/O
pins DQ15–DQ0 operate in the by te or word configur ation. If the BYTE# pin is set at logic ‘1’, the device is in
word configuration, DQ15–DQ0 are activ e and c ontrolled by CE# and OE#.
If the BYTE# pin is set at logic ‘0’, the device is in byte
configuration, and only data I/O pins DQ0–DQ7 are active and controlled by CE# and OE#. The data I/O pins
DQ8–DQ14 are tri-stated, and the DQ15 pin is used as
an input for the LSB (A-1) address function.
Requirements for Reading Array Data
To read array data from the outputs, the system must
drive the CE# and OE# pins to V
control and selects the device. OE# is the output control
and gates array data to the output pins. WE# should re-
. CE# is the power
IL
main at V
vice outputs array data in word s or b yt e s.
The internal state machine is set for reading array
data upon device po wer-u p , or after a hardw are res et.
This ensure s that no sp urious alteration of the memory content occurs dur ing the power transition. No
command is nece ssary in this mode to ob tain array
data. Standard microprocessor read cycles that assert valid addresses on the de vice addr ess inputs produce valid data on the device data outputs. The
device remains enab led f or read access until t he command register contents are altered.
See “Reading Array Data” for more information. Refer
to the AC Read Operations table for timing specifications and to Figure 13 for the timing diagram. I
the DC Characteristics table represents the active current specification for reading array data.
. The BYTE# pin determines whether the de-
IH
CC1
in
8Am29LV160B
PRELIMINARY
Writing Commands/Command Sequences
To wr ite a command or command sequence (which includes programming data to the device and erasing
sectors of memory), the system must drive WE# and
CE# to V
, and OE# to VIH.
IL
For program operations, the BYTE# pin deter mines
whether the device accepts p rogram data in bytes
or words. Refer to “Word/Byte Configuration” for
more information.
The device features an Unlock Bypass mode to facili-
tate faster programming. Once the device enters the Unlock Bypass mode, only two write cycles are required to
program a word or byte, instead of four. The “Word/Byte
Program Command Sequence” section has details on
programming data to the device using both standard and
Unlock Bypass command sequences.
An erase operation can erase one sect or, multiple sectors, or the entire device. Tables 2 and 3 i ndicate the
address space that each sector occupies. A “sector address” consists of the addres s bits required t o un iquely
select a sector. The “Command Definitions” section
has details on erasing a sector or the entire chip, or
suspending/resuming the erase operation.
After the system writes the autoselect command sequence, the device enters the autoselect mode. The
system can then read autoselect codes from the internal register (which is separate from the memory array)
on DQ7–DQ0. Standard read cycle timings apply in this
mode. Refer to the “Autoselect Mode” and “Autoselect
Command Sequence” sections for more information.
in the DC Characteristics table represents the ac-
I
CC2
tive current specification for the w rite mode. The “AC
Characteristics” section contains timing specification
tables and timing diagrams for write operations.
Program and Erase Operation Status
During an erase or program operation, the system ma y
check the status of the operation by reading the status
bits on DQ7–DQ0. Standard read cycle timings and I
CC
read specifica tions apply. Refer to “Write Ope ration
Status” for more information, and to “AC Characteristics” for timing diagrams.
Standby Mode
When the system is not reading or writing to the device ,
it can place the device in the standby mode. In this
mode, current consumption is gr eatly reduced, and the
outputs are placed in the high impedance state, independent of the OE# input.
The device enters the CMOS standby mode when the
CE# and RESET# pins are both held at V
CC
± 0.3 V.
(Note that this is a more restricted voltage range than
.) If CE# and RESET# ar e held at VIH, but not within
V
IH
± 0.3 V, the device will be in the standby mode, b ut
V
CC
the standby current will be grea ter. The device req uires
standard access time (t
) for read access when the
CE
device is in either of these standby modes, before it is
ready to read data.
If the device is deselected during erasure or programming, the device draws active current until the
operation is completed.
In the DC Characteristics table, I
CC3
and I
CC4
repre-
sents the standby current specification.
Automatic Sleep Mode
The automatic sleep mode minimizes Flash device
energy consumption. The device automatically
enables this mode when addres ses remain stable for
+ 30 ns. The automatic sleep mode is
t
ACC
independent of the CE#, WE#, and OE# control
signals. Standard address access timings provide new
data when addresses are chan ged. While in sleep
mode, output data is latched and always available to
the system. I
represents the automatic sleep mode current
specification.
in the DC Characteristics table
CC4
Am29LV160B9
PRELIMINARY
RESET#: Hardware Reset Pin
The RESET# pin provides a har dware method of resetting the device to readi ng arr ay data. When the system
drives the RESET# pin to V
the device immediately terminates any operati on in
progress, tristates all data output pins, and ignores all
read/wri te attempts for the durati on of the RESET#
pulse. The device also resets the inter nal state machine to reading array data. The operation that was interrupted should be reinitiated once the device is ready
to accept another command sequence, to ensure data
integrity.
Current is reduced for the duration of the RESET#
pulse. When RESET# is held at V
draws CMOS standby current (I
but not within VSS±0.3 V, the standby current will
at V
IL
be greater.
The RESET# pin may be tied to the system reset cir-
cuitry. A system reset would thus also reset the Flash
for at least a p eriod of tRP,
IL
±0.3 V, the device
SS
). If RESET# is held
CC4
memory, enabling the system to read the boot-up
firmware from the Flash memory.
If RESET# is asserted during a program or erase operation, the RY/BY# pin remains a “0” (busy) until the
internal reset operation is complete, which requires a
time of t
(during Embedded Algorithms). The
READY
system can thus monitor RY/BY# to determine
whether the reset oper ation is c omplete . If RESE T# is
asserted when a program or erase oper ation is not e xecuting (RY/BY# pin is “1”), the reset operation is
completed within a time of t
ded Algorithms). The system can read data t
the RESET# pin return s to V
(not during Embed-
READY
.
IH
RH
after
Refer to the AC Characteristics tables for RESET# parameters and to Figure 14 for the timing diagram.
Output Disable Mode
When the OE# input is at VIH, output from the device is
disabled. The output pins are placed in t he high impedance state.
Note: Address range is A19:A-1 in byte mode and A19:A0 in word mode. See “Word/Byte Configuration” section for more
information.
12Am29LV160B
PRELIMINARY
Autoselect Mode
The autoselect mode provides manufacturer and device identification, and sector protection verification,
through identifier codes output on DQ7–DQ0. This
mode is primarily intended for progr amming equipment
to automatically match a device to be progr ammed with
its correspondi ng programming al gorithm. However,
the autoselect codes can also be accessed in-system
through the command register.
When using programming equipment, the autoselect
mode requires V
A9. Address pins A6, A1, and A0 must be as shown in
DescriptionModeCE#OE# WE#
Manufacturer ID: AMDLLHXXV
Device ID:
Am29LV160B
(Top Boot Block)
(11.5 V to 12.5 V) on address pin
ID
Table 4. Am29L V160B Autoselect Codes (High Voltage Method)
A19
A11
to
to
A12
A10A9
WordLLH
ByteLLHXC4h
XXVIDXLXLH
Ta ble 4. In addition, when verifying s ector protection,
the sector address must appear on the appropriate
highest order address bits (see Tables 2 and 3). Table
4 shows the remaining address bits that are don’t care .
When all necessary bits have been set as required, the
programming equipment may then read the corresponding identifier code on DQ7-DQ0.
To access the autoselect codes in-system, the host
system can issue the autoselect command via the
command register, as shown in Table 9. This method
does not require V
. See “Command Definitions” for
ID
details on using the autoselect mode.
A8
to
A7A6
XLXLL X01h
ID
A5
to
A2A1A0
DQ8
to
DQ15
22hC4h
DQ7
DQ0
to
Device ID:
Am29LV160B
(Bottom Boot Block)
Sector Protection VerificationLLHSAXV
L = Logic Low = VIL, H = Logic High = VIH, SA = Sector Address, X = Don’t care.
Note: The autoselect codes may also be accessed in-system via command sequences. See Table 9.
Sector Protection/Unprotection
The hardware sector protection feature disables both
program and erase operations in any sect or. The hardware sector unprotection feature re-enables both program and erase operations in previously protected
sectors.
The device is shipped with all sectors unprotected.
AMD offers the option of programming and protecting
sectors at its factory prior to shipping the device
through AMD’s ExpressFlash™ Servic e. Contact an
AMD representative for details.
It is possible to determine whether a sector is protected
or unprotected. See “Autoselect Mode” for details.
Sector protection/unprotection can be implemented via
two methods.
The primary method requires V
only, and can be implemented either in-system or via
programming equipment. Figure 1 shows the algorithms and Figure 23 shows the timing diagram. This
method uses standard m icroprocessor bus cycle tim-
WordLLH
ByteLLHX49h
XXVIDXLXLH
XLXHL
ID
ing. For sector unprotect, all unprotected sectors must
first be protected prior to the first sect or unprotect write
cycle.
The alternate method intended o nly for programming
equipment requires V
on address pin A9 and OE#.
ID
This method is compatible with programmer routines
written for earlier 3.0 volt-only AMD flash devices. Details on this method are pro vided in a supplement, publication number 21468. Contact an AMD representativ e
to request a copy.
Temporary Sector Unprotect
This feature allows temporary unprotection of previously protected sectors to change data in-system. The
Sector Unprotect mode is activated by setting the RE-
. During this mode, formerly protected
ID
is removed from the RE-
ID
on the RESET# pin
ID
SET# pin to V
sectors can be programmed or erased b y selecting the
sector addresses. Once V
SET# pin, all the previously protected sectors are
protected again. Figure 2 shows the algorithm, and
Figure 22 shows the timing diagrams, for this feature.