preprograms and erases the entire chip or any
combination of designated sectors
— Embedded Program algorithm automatically
writes and verifies data at specified addresses
■ Minimum 1,000,000 write cycle guarantee per
sector
■ Package option
— 40-pin TSOP
■ CFI (Common Flash Interface) compliant
— Provides device-specific information to the
system, allowing host software to easily
reconfigure for different Flash devices
■ Compatibility with JEDEC standards
— Pinout and software compatible with single-
power supply Flash
— Superior inadvertent write protection
■ Data# Polling and toggle bits
— Provides a software method of detecting
program or erase operation completion
■ Ready/Busy# pin (RY/BY#)
— Provides a hardware method of detecting
program or erase cycle completion
■ Erase Suspend/Erase Resume
— Suspends an erase operati on to read dat a from,
or program data to, a sector that is not being
erased, then resumes the erase operation
■ Hardware reset pin (RESET#)
— Hardware method to reset the de vi ce to reading
array data
This document contains information on a product under development at Advanced Micro Devices. The information
is intended to help you ev aluate this product. AMD reserves the right to change or dis continue work on thi s proposed
product without notice.
Publication# 21359 Rev: C Amendment/+2
Issue Date: March 1998
PRELIMINARY
GENERAL DESCRIPTION
The Am29LV116B is a 16 Mbit, 3.0 Volt-only Flash
memory organized as 2,097,152 bytes. The device is
offered in a 40-pin TSOP package. The byte-wide (x8)
data appears on DQ7–DQ0. All read, program, and
erase operations are accomplished using only a single
power supply. The device can also be programmed in
standard EPROM programmers.
The standard device off ers access times of 80, 90, and
120 ns, allowing high speed microprocessors to
operate without wait s tates. To eliminate bus contention the device has separate chip enable (CE#), write
enable (WE#) and output enable (OE#) controls.
The device requires only a single 3. 0 v o lt po wer sup-ply for both read and write functions. Internally generated and regulated voltages are provided for the
program and erase operations.
The device is entirely command set compatible with the
JEDEC single-power-supply Flash standard. Commands are written to the command regis ter using
standard micropr ocessor wri te timings. Register co ntents serve as input to an internal state-machine that
controls the erase and programming circuitry. Write
cycles also internally latch addresses and data needed
for the programming and erase operations. Reading
data out of the device is similar to reading from other
Flash or EPROM devices.
Device programming occurs by executing the program
command sequence. This initiates the EmbeddedProgram algorithm—an internal algorithm that automatically times the program pulse widths and verifies
proper cell margin. The Unlock Bypass mode facilitates faster programming times by requir ing only two
write cycles to program data instead of four.
Device erasure occurs by executing the erase command sequence. This initiates the Embedded Erase
algorithm—an internal algorithm that automatically preprograms the array (if it is not already progr ammed) before executing the erase operation. During erase, the
device automatically times the erase pulse widths and
verifies proper cell margin.
The host system can detect whether a program or
erase operation is complete by observing the RY/BY#
pin, or by reading the DQ7 (Data# Polling) and DQ6
(toggle) status bits. After a program or erase cycle
has been completed, the device is ready to read array
data or accept another command.
The sector erase ar chitecture allo ws memo ry secto rs
to be erased and reprogrammed without affecting the
data contents of other sectors. The device is fully
erased when shipped from the factory.
Hardware data protection measures include a low
detector that automatically in hibits write opera-
V
CC
tions during power transitions. The hardware sector
protection feature disables both program and erase
operations in any combination of the sectors of memory. This can be achieved in-system or via programming equipment.
The Erase Suspend feature enables the user to put
erase on hold for any period of time to read data from,
or program data to, any sector that is not selected for
erasure. True background erase can thus be achieved.
The hardware RESET# pi n terminates any operation
in progress and resets the internal state machine to
reading array dat a. The RESET# pin ma y be tied to the
system reset circuitry. A system reset would thus also
reset the device, enabling the system microprocessor
to read the boot-up firmware from the Flash memory.
The device offers two power-saving features. When
addresses have been stable for a specified amount of
time, the device enters the automatic sleep m ode.
The system can also place the de vice into the standbymode. Power consumption is greatly reduced in both
these modes.
AMD’s Flash technology combines years of Flash
memory manufacturing experience to produce the
highest levels of quality, reliability and cost effectiveness. The device electrically erases a ll bit s within
a sector simultaneously via Fowler-Nordheim tunneling. The data is programmed using hot electron
injection.
Am29LV116B2
PRELIMINARY
PRODUCT SELECTOR GUIDE
Family Part NumberAm29LV116B
Speed Options
Max access time, ns (t
Max CE# access time, ns (tCE)8090120
Max OE# access time, ns (tOE)303550
Regulated Voltage Range: VCC =3.0–3.6 V80R
Full Voltage Range: VCC = 2.7–3.6 V90120
)8090120
ACC
Note: See “AC Characteristics” for full specifications.
AMD standard products are available in s everal packages and operating ranges. The order number (Valid Combination) is formed by a combination of the elements below.
CE80RAm29LV116BT
OPTIONAL PROCESSING
Blank = Standard Processing
B = Burn-in
(Contact an AMD representative for more information)
TEMPERATURE RANGE
C=Commercial (0°C to +70°C)
I = Industrial (–40°C to +85°C)
E = Extended (–55°C to +125°C)
PACKAGE TYPE
E= 40-Pin Thin Small Outline Package (TSOP)
Standard Pinout (TS 040)
F= 40-Pin Thin Small Outline Package (TSOP)
Reverse Pinout (TSR040)
Am29LV116BT80R,
Am29LV116BB80R
Am29LV116BT90,
Am29LV116BB90
Am29LV116BT120,
Am29LV116BB120
Valid Combinations
EC, EI, EE,
FC, FI, FE
SPEED OPTION
See Product Selector Guide and Valid Combinations
BOOT CODE SECTOR ARCHITECTURE
T = Top Sector
B = Bottom Sector
DEVICE NUMBER/DE SCR IP TIO N
Am29LV116B
16 Megabit (2 M x 8-Bit) CMOS Flash Memory
3.0 Volt-only Read, Program, and Erase
Valid Combinations list configurations planned to be sup-
EC, FC
ported in volume for this device. Consult the local AMD sales
office to confirm availability of specific valid combinations and
to check on newly released combinations.
Valid Combinations
Am29LV116B6
PRELIMINARY
DEVICE BUS OPERATIONS
This section describes the requirements and use of the
device bus operations, which are initiated through the
internal command register. The command register itself
does not occupy any addressable memory loc ation.
The register is composed of latches that store the commands, along with the address and data information
needed to execute the command. The contents of the
Table 1.Am29LV116B Device Bus Operations
OperationCE#OE#WE#RESET#AddressesDQ0–DQ7
ReadLLHHA
WriteLHLHA
Standby
Output DisableLHHHXHigh-Z
ResetXXXLXHigh-Z
Sector Protect (See Note)LHLV
Sector Unprotect (See Note)LHLV
Temporary Sector UnprotectXXXV
Legend:
L = Logic Low = V
Note: The sector protect and sector unprotect functions may also be implemented via programming equipment. See the “Sector
Protection/Unprotection” section.
, H = Logic High = VIH, VID = 12.0 ± 0.5 V, X = Don’t Care, AIN = Address In, DIN = Data In, D
IL
VCC ±
0.3 V
XX
register serve as inputs to the internal state machine.
The state machine outputs d ictate the function of the
device. Table 1 lists the device bus operations, the inputs and control levels they require, and the resulting
output. The following subsections describe each of
these operations in further detail.
D
D
D
, D
IN
D
, D
IN
D
= Data Out
OUT
OUT
IN
OUT
OUT
IN
VCC ±
0.3 V
ID
ID
ID
IN
IN
XHigh-Z
Sector Addresses,
A6 = L, A1 = H, A0 = L
Sector Addresses
A6 = H, A1 = H, A0 = L
A
IN
Requirements for Reading Array Data
To read array data from the outputs, the system must
drive the CE# and OE# pins to V
control and selects the dev ice. OE# is the output control and gates array data to the output pins. WE#
should remain at V
.
IH
The internal state machine is set for reading arr ay data
upon device power-up, or after a hardware reset. This
ensures that no spurious alteration of the memory content occurs during the power transition. No command is
necessary in this mode to obtain array data. Standard
microprocessor read cycles that assert valid addresses
on the device address input s produc e valid data on the
device data outputs. The device remains enabled for
read access until the command register contents are
altered.
See “Reading Array Data” for more information. Refer
to the AC Read Operations table for timing specifications and to Figure 13 for the timing diagram. I
the DC Characteristics table represents the active current specification for reading array data.
. CE# is the power
IL
CC1
in
Writing Commands/Command Sequences
To write a command or command sequence (which includes programming data to the device and erasing
sectors of memory), the system must drive WE# and
CE# to V
The device features an Unlock Bypass mode to facil-
itate faster programming. Once the device enters the
Unlock Bypass mode, only two write cycles are required to program a byte, instead of four. The “Byte
Program Command Sequence” section has details on
programming data to the device using both standard
and Unlock Bypass command sequences.
An erase operation can erase one sect or, multiple sectors, or the entire device. Tables 2 and 3 indicate the
address space that each sector occupies. A “sector address” consists of the address b its requ ired to uni quely
select a sector. The “Command D efinitions” section
has details on erasing a sector or the entire chip, or
suspending/resuming the erase operation.
After the system writes the autoselect command sequence, the device enters the autoselect mode. The
system can then read autoselect codes from the internal register (which is separate from the memory array)
on DQ7–DQ0. Standard read cycle timings apply in this
, and OE# to VIH.
IL
7Am29LV116B
PRELIMINARY
mode. Refer to the Autoselect Mode and Autoselect
Command Sequence sections for more information.
in the DC Characteristics table represents the ac-
I
CC2
tive current specification for the write m ode. The “AC
Characteristics” section contains timing specification
tables and timing diagrams for w r ite operations.
Program and Erase Operation Status
During an erase or program operation, the system ma y
check the status of the operation by reading the status
bits on DQ7–DQ0. Standard read cycle timings and I
CC
read specifications apply. Refer to “Write Operation
Status” for more information, and to “AC Characteristics” for timing diagrams.
Standby Mode
When the system is not reading or writing to the device ,
it can place the device in the standby mode. In this
mode, current consumption is great ly reduc ed, and the
outputs are placed in the high impedance state, independent of the OE# input.
The device enters the CMOS standby mode when the
CE# and RESET# pin s are both held at V
CC
± 0.3 V.
(Note that this is a more restricted voltage range than
.) If CE# and RESET# ar e held a t VIH, but not within
V
IH
± 0.3 V, the device will be in the standb y mode, b ut
V
CC
the standby current will be greater. The device requires
standard access time (t
) for read access when the
CE
device is in either of these standby modes, before it is
ready to read data.
The device also enters the standb y mode when the RESET# pin is driven low. Refer to the next section, “RESET#: Hardware Reset Pin”.
If the device is deselected during erasure or programming, the device draws active current until the
operation is completed.
in the DC Characteristics table represents the
I
CC3
standby current specification.
Automatic Sleep Mode
The automatic sleep mode minimizes Flash device
energy consumption. The device automatically
enables this mode when addres ses remain stable for
+ 30 ns. The automatic sleep mode is
t
ACC
independent of the CE#, WE#, and OE# control
signals. Standard address access timings provide new
data when addresses are chan ged. While in sleep
mode, output data is latched and always available to
the system. I
in the DC Characteristics table
CC5
represents the automatic sleep mode current
specification.
RESET#: Hardware Reset Pin
The RESET# pin provides a hardw are method of resetting the device to reading array data. When the RESET# pin is driven low for at least a period of t
RP
, the
device immediately terminates any operation in
progress, tristates all output pins, and ignores all
read/write commands for the duration of the RESET#
pulse. The device also resets the inter nal state machine to reading array data. The operation that was interrupted should be reinitiated once the device is ready
to accept another command sequence, to ensure data
integrity.
Current is reduced for the duration of the RESET#
pulse. When RESET# is held at V
draws CMOS standby c urrent (I
but not within VSS±0.3 V, the standby current will
at V
IL
±0.3 V, the device
SS
). If RESET# is held
CC4
be greater.
The RESET# pin may be tied to the system reset cir-
cuitry. A system reset would thus also reset the Flash
memory, enabling the system to read the boot-up
firmware from the Flash memory.
If RESET# is asserted during a program or erase operation, the RY/BY# pin remains a “0” (busy) until the internal reset operatio n is complete, which requires a
time of t
(during Embedded Algorithms). The
READY
system can thus monitor RY/BY# to determine whether
the reset operation is complete. If RESET# is asserted
when a program or erase operation is not executing
(RY/BY# pin is “1”), the reset operation is completed
within a time of t
rithms). The system can read data t
SET# pin returns to V
(not during Embe dded Algo-
READY
.
IH
RH
after the RE-
Refer to the AC Characteristics tables for RESET# parameters and to Figure 14 for the timing diagram.
Output Disable Mode
When the OE# input is at VIH, output from the device is
disabled. The output pins are placed in t he high impedance state.
Am29LV116B8
PRELIMINARY
Table 2. Am29LV116BT Top Boot Sector Address Table
The autoselect mode provides manufacturer and device identification, and sector protection verification,
through identifier codes output on DQ7–DQ0. This
mode is primarily intended for progr amming equipment
to automatically match a device to be progr ammed with
its correspondi ng programming al gorithm. However,
the autoselect codes can also be accessed in-system
through the command register.
When using programming equipment, the autoselect
mode requires V
A9. Address pins A6, A1, and A0 must be as shown in
(11.5 V to 12.5 V) on address pin
ID
Table 4. In addition, when verifying sector protec tion,
the sector address must appear on the appropriate
highest order address bits (see Tables 2 and 3). Table
4 shows the remaining address bits that are don’t care .
When all necessary bits have been set as required, the
programming equipment may then read the corresponding identifier code on DQ7-DQ0.
To access the autoselect codes in-system, the host
system can issue the autoselect command via the
command register, as shown in Table 9. This method
does not require V
details on using the autoselect mode.
Table 4. Am29LV116B Autoselect Codes (High Voltage Method)
A20
A12
to
to
DescriptionCE#OE#WE#
Manufacturer ID: AMDLLHXXV
Device ID: Am29LV1 16B
(Top Boot Block)
Device ID: Am29LV1 16B
(Bottom Boot Block)
LLHXXV
LLHXXVIDXLXLH4Ch
A13
A10A9
. See “Command Definitions” for
ID
A8
to
A7A6
XLXLL01h
ID
XLXLHC7h
ID
A5
to
A2A1A0
DQ7
to
DQ0
Sector Protection VerificationLLHSAXV
L = Logic Low = VIL, H = Logic High = VIH, SA = Sector Address, X = Don’t care.
Sector Protection/Unprotection
The hardware sector protection feature disables both
program and erase operations in any sect or. The hardware sector unprotection feature re-enables both program and erase operations in previously protected
sectors. Sector protection/unprotecti on can be implemented via two methods.
The primary method requires V
only, and c an be implemented either in-system or via
on the RESET# pin
ID
lication number 21586 contains further details; contact
an AMD representative to request a copy.
The device is shipped with all sectors unprotected.
AMD offers the option of programming and protecting
sectors at its factory prior to shipping the device
through AMD’s ExpressFlash™ Servic e. Contact an
AMD representative for details.
It is possible to determine whether a sector is protected
or unprotected. See “Autoselect Mode” for details.
XLXHL
ID
programming equipment. Figure 1 shows the algorithms and Figure 21 shows the timing diagram. This
method uses standard m icroprocessor bus cycle timing. For sector unprotect, all unprotected sectors must
first be protected prior to the first sector unpro tect write
cycle.
The alternate method intended on ly for programming
equipment requires V
on address pin A9 and OE#.
ID
This method is compatible with programmer routines
written for earlier 3.0 v olt-only AMD flash de vices. Pub-
Temporary Sector Unprotect
This feature allows temporary unprotection of previously protected sectors to change data in-system. The
Sector Unprotect mode is activated by setting the RESET# pin to V
sectors can be programmed or erased b y selecting the
sector addresses. Once V
SET# pin, all the previously protected sectors are
protected again. Figure 2 shows the algorithm, and
Figure 20 shows the tim ing diagrams, for this feature.