preprograms and erases the entire chip or any
combination of designated sectors
— Embedded Program algorithm automatically
writes and verifies data at specified addresses
sector
— 48-pin TSOP
— 44-pin SO
— Pinout and software compatible with single-
power supply Flash
— Superior inadvertent write protection
— Provides a software method of detecting
program or erase operation completion
— Provides a hardware method of detecting
program or erase cycle completion
— Suspends an erase operati on to read dat a from,
or program data to, a sector that is not being
erased, then resumes the erase operation
— Hardware method to reset the de vi ce to reading
array data
This document contains information on a product under development at Advanced Micro Devices. The information
is intended to help you ev aluate this product. AMD reserves the right to change or dis continue work on thi s proposed
product without notice.
Refer to AMD’s Website (www.amd.com) for the latest information.
Publication# 21518 Rev: A Amendment/+3
Issue Date: March 1998
ADVANCE INFORMATION
GENERAL DESCRIPTION
The Am29LL800B is an 8 M bit, 2.2 volt-only Flash
memory organized as 1,048,576 bytes or 524,288
words. The device is offered in 44-pin SO and 48-pin
TSOP packages. The word-wide data (x16) appears on
DQ15–DQ0; the byte-wide (x8) data appears on DQ7–
DQ0. This device requires only a single, 2.2 volt V
supply to perform read, program, and erase operations. A standard EPROM programmer can also be
used to program and erase the device.
This device is manufactured using AMD’ s 0. 35 µm process technology, and offers all the features and benefits of the Am29LV800, which was manufactured using
0.5 µm process technology. In addition, the
Am29LL800B features unlock bypass programming
and in-system sector protection/unprotection.
The standard device offers access times of 150 and
200 ns, allowing high speed microprocessors to operate without wait states. To eliminate bus contention the
device has separate chip enable (CE#), write enable
(WE#) and output enable (OE#) controls.
The device requires only a single 2. 2 v o lt po wer sup-ply for both read and write functions. Internally generated and regulated voltages are provided for the
program and erase operations.
The device is entirely command set compatible with the
JEDEC single-power-supply Flash standard. Commands are written to the command register using standard microproc essor write timing s. Register contents
serve as input to an internal sta te-machine that co ntrols the erase and programming circuit ry. Write cycles
also internally latch addresses and data needed f or the
programming and erase operations. Reading data out
of the device is similar to reading from other Flash or
EPROM devices.
Device programming occurs by executing the program
command sequence. This initiates the EmbeddedProgram algorithm—an internal algorithm that automatically times the program pulse widths and verifies
proper cell margin. The Unlock Bypass mode facilitates faster programming times by requir ing only two
write cycles to program data instead of four.
Device erasure occurs by ex ecuting the erase command
sequence. This initiates the Embedded Erase algorithm—an i nternal algorithm that autom atically prepro grams the array (if it is not already programmed) before
CC
executing the erase operation. During erase, the device
automatically times the erase pulse widths and verifies
proper cell margin.
The host system can detect whether a program or
erase operation is complete by observing the RY/BY#
pin, or by reading the DQ7 (Data# Polling) and DQ6
(toggle) status bits. After a program or erase cycle has
been completed, the device is ready to read array data
or accept another command.
The sector erase archite cture allo ws m emory sect ors
to be erased and reprogrammed without affecting the
data contents of other sectors. The device is fully
erased when shipped from the factory.
Hardware data protection measures include a low
detector that automatically in hibits write opera-
V
CC
tions during power transitions. The hardware sector
protection feature disables both program and erase
operations in any combination of the sectors of memory. This can be achieved in-system or via programming equipment.
The Erase Suspend feature enables the user to put
erase on hold for any period of time to read data from,
or program data to, any sector that is not selected for
erasure. True background erase can thus be achiev ed.
The hardware RESET# pi n terminates any operation
in progress and resets the internal state machine to
reading array dat a. The RESET# pin ma y be tied to the
system reset circuitry. A system reset would thus also
reset the device, enabling the system microprocessor
to read the boot-up firmware from the Flash memory.
The device off ers two power-sa ving f eatures. When addresses have been stable for a specified amount of
time, the device enters the automatic sleep m ode.
The system can also place the de vice into the standbymode. Power consumption is greatly reduced in both
these modes.
AMD’s Flash technology combines years of Flash
memory manufacturing experience to produce the
highest levels of quality, reliability and cost effectiveness. The device electrically erases all bits within
a sector simultaneously via Fowler-Nordheim tunneling. The data is programmed using hot electron injection.
2Am29LL800B
ADVANCE INFORMATION
PRODUCT SELECTOR GUIDE
Family Part NumberAm29LL800B
Speed Options-150-200
Max access time, ns (t
Max CE# access time, ns (tCE)150200
Max OE# access time, ns (tOE)5555
)150200
ACC
Note: See “AC Characteristics” for full specifications.
AMD standard products are available in several packages and operating ranges. The order number (Valid Combination) is formed by a combination of the elements below.
CE-150Am29LL800BT
OPTIONAL PROCESSING
Blank = Standard Processing
B = Burn-in
(Contact an AMD representative for more information)
TEMPERATURE RANGE
C=Commercial (0°C to +70°C)
I = Industrial (–40°C to +85°C)
PACKAGE TYPE
E= 48-Pin Thin Small Outline Package (TSOP)
Standard Pinout (TS 048)
F= 48-Pin Thin Small Outline Package (TSOP)
Reverse Pinout (TSR048)
S= 44-Pin Small Outline Package (SO 044)
Am29LL800BT-150,
Am29LL800BB-150
Am29LL800BT-200,
Am29LL800BB-2 00
Valid Combinations
EC, EI, FC, FI, SC, SI
SPEED OPTION
See Product Selector Guide and Valid Combinations
BOOT CODE SECTOR ARCHITECTURE
T = Top Sector
B = Bottom Sector
DEVICE NUMBER/DESCRIPTION
Am29LL800B
8 Megabit (1 M x 8-Bit/512 K x 16-Bit) CMOS Flash Memory
2.2 Volt-only Read, Program, and Erase
Valid Combinations
Valid Combinations list configurations planned to be supported in volume for this device. Consult the local AMD sales
office to confirm availability of specific valid combinations and
to check on newly released combinations.
6Am29LL800B
ADVANCE INFORMATION
DEVICE BUS OPERATIONS
This section describes the requirements and use of the
device bus operations, which are initiated through the
internal c ommand register. The command register itself does not occupy any addressable memory location. The register is composed of l atches that store the
commands, along with the address and data information needed to execute the command. The contents of
2. The sector protect and sector unprotect functions may also be implemented via programming equipment. See the “Sector
Protection/Unprotection” section.
, H = Logic High = VIH, VID = 10.0 ± 0.5 V, X = Don’t Care, AIN = Address In, DIN = Data In, D
IL
VCC ±
0.3 V
XX
VCC ±
0.3 V
), A18:A-1 in byte mode (BYTE# = VIL).
IH
the register serve as inputs to the internal state machine. The state machine outputs dictate the function of
the device. Table 1 lists the device bus operations, the
inputs and control lev els t he y requ ire , and t he resulting
output. The following subsections describe each of
these operations in further detail.
DQ8–DQ15
Addresses
Sector Addresses,
A6 = L, A1 = H,
ID
Sector Addresses,
A6 = H, A1 = H,
ID
ID
(Note 1)
IN
IN
XHigh-ZHigh-ZHigh-Z
A0 = L
A0 = L
A
IN
DQ0–
DQ7
D
OUT
D
IN
D
IN
D
OUT
D
IN
D
OUT
D
IN
BYTE#
= V
IH
D
,
,
DQ8–DQ14 = High-Z,
OUT
D
IN
XX
XX
XX
DQ15 = A-1
BYTE#
= V
IL
= Data Out
OUT
Word/Byte Configuration
The BYTE# pin controls whether the device data I/O
pins DQ15–DQ0 operate in the by te or word configur ation. If the BYTE# pin is set at logic ‘1’, the device is in
word configuration, DQ15–DQ0 are active and controlled by CE# and OE#.
If the BYTE# pin is set at logic ‘0’, the device is in byte
configuration, and only data I/O pins DQ0–DQ7 are active and controlled by CE# and OE#. The data I/O pins
DQ8–DQ14 are tri-stated, and the DQ15 pin is used as
an input for the LSB (A-1) address function.
Requirements for Reading Array Data
To read array data from the outputs, the system must
drive the CE# and OE# pins to V
control and selects the device. OE# is the output control and gates arra y data to the output pins . WE# should
remain at V
. The BYTE# pin determines whether the
IH
device outputs array data in words or bytes.
. CE# is the power
IL
Am29LL800B7
The internal state machine is set for reading array
data upon device po wer-u p , or after a hardw are res et.
This ensure s that no sp urious alteration of the memory content occurs dur ing the power transition. No
command is nece ssary in this mode to ob tain array
data. Standard microprocessor read cycles that assert valid addresses on the de vice addr ess inputs produce valid dat a on the de vice da ta outputs . The de vice
remains enabled for read access until the command
register contents are altered.
See “Reading Array Data” for more information. Refer
to the AC Read Operations table for timing specifications and to Figure 14 for the timing diagram. I
CC1
in
the DC Characteristics table represents the active current specification for reading array data.
Writing Commands/Command Sequences
To write a command or command sequence (which includes programming data to the device and erasing
ADVANCE INFORMATION
sectors of memory), the system must drive WE# and
CE# to V
, and OE# to VIH.
IL
For program operations, the BYT E# pin determin es
whether the device accepts program data in bytes or
words. Refer to “Word/Byte Configuration” for more information.
The device features an Unlock Bypass mode to facili-
tate faster programming. Once the device enters the Unlock Bypass mode, only two write cycles are required to
program a word or byte, instead of four. The “Word/Byte
Program Command Sequence” section has details on
programming data to the device using both standard and
Unlock Bypass command sequences.
An erase operation can erase one sect or, multiple sectors, or the entire device. Tables 2 and 3 indic ate the
address space that each sector occupies. A “sector address” consists of the addres s bits required t o un iquely
select a sector. The “Command Definitions” section
has details on erasing a sector or the entire chip, or
suspending/resuming the erase operation.
After the system writes the autoselect command sequence, the device enters the autoselect mode. The
system can then read autoselect codes from the internal register (which is separate from the memory array)
on DQ7–DQ0. Standard read cycle timings apply in this
mode. Refer to the Autoselect Mode and Autoselect
Command Sequence sections for more information.
in the DC Characteristics table represents the ac-
I
CC2
tive current specification for the w rite mode. The “AC
Characteristics” section contains timing specification
tables and timing diagrams for write operations.
Program and Erase Operation Status
During an erase or program operation, the system ma y
check the status of the operation by reading the status
bits on DQ7–DQ0. Standard read cycle timings and I
read specifications apply. Refer to “Write Operation
CC
Status” for more information, and to “AC Characteristics” for timing diagrams.
Standby Mode
When the system is not reading or writing to the device, it can place the device in the standby mode. In
this mode, current consumption is greatly reduced,
and the outputs are placed in the high impedance
state, independent of the OE# input.
The device enters the CMOS standby mode when the
CE# and RESET# pins are both held at V
CC
± 0.3 V.
(Note that this is a more restricted voltage range than
.) If CE# and RESET# ar e held at VIH, but not within
V
IH
± 0.3 V, the device will be in the standby mode, b ut
V
CC
the standby current will be grea ter. The device requires
standard access time (t
) for read access when the
CE
device is in either of these standby modes, before it is
ready to read data.
The device also enters the standb y mode when the RESET# pin is driven low. Refer to the next section, RESET#: Hardware Reset Pin.
If the device is deselected during erasure or programming, the device draws active current until the
operation is completed.
in the DC Characteristics table represents the
I
CC3
standby current specification.
Automatic Sleep Mode
The automatic sleep mode minimizes Flash device
energy consumption. The de vice automatically enables
this mode when addresses remain stable f or t
ns. The automatic sleep mode is independent of the
CE#, WE#, and OE# control signals. Standard addres s
access timings provide new data when addresses are
changed. While in sleep mode, output data is latched
and always available to the system. I
CC4
Characteristics table represents the automatic sleep
+ 30
ACC
in the DC
8Am29LL800B
ADVANCE INFORMATION
RESET#: Hardware Reset Pin
The RESET# pin provides a har dware method of resetting the device to reading array data. When the RESET# pin is driven low for at least a period of t
device immediately terminates any operation in
progress, tristates all output pins, and igno res all
read/write commands for the duration of the RESET#
pulse. The device also resets the inter nal state machine to reading array data. The operation that was interrupted should be reinitiated once the device is ready
to accept another command sequence, to ensure data
integrity.
Current is reduced for the duration of the RESET#
pulse. When RESET# is held at V
draws CMOS standby current (I
but not within VSS±0.3 V, the standby current will
at V
IL
±0.3 V, the device
SS
). If RESET# is held
CC4
be greater.
The RESET# pin may be tied to the system reset cir-
cuitry. A system reset would thus also reset the Flash
memory, enabling the system to read the boot-up firmware from the Flash memory. During power-up, the
RP
, the
system must ensure that RESET# is high t
RSTW
before
asserting a valid address (see Fi gure 1 and the
Erase/Program Operations table).
If RESET# is asserted during a program or erase operation, the RY/BY# pin remains a “0” (busy) until the
internal reset operation is complete, which requires a
time of t
(during Embedded Algorithms). The
READY
system can thus monitor RY/BY# to determine
whether the reset oper ation is c omplete . If RESE T# is
asserted when a program or erase oper ation is not e xecuting (RY/BY# pin is “1”), the reset operation is
completed within a time of t
ded Algorithms). The system can read data t
the RESET# pin returns to V
(not during Embed-
READY
.
IH
RH
after
Refer to the AC Characteristics tables for RESET# parameters and to Figure 15 for the timing diagram.
Output Disable Mode
When the OE# input is at VIH, output from the device is
disabled. The output pins are placed in t he high impedance state.
RESET#
V
CC
Address
Data
2.2 – 2.7 V
0 V
t
CE
t
ACC
t
RSTW
Figure 1. Power-up and Reset Timings
VALID
VALID OUTPUT
Am29LL800B9
ADVANCE INFORMATION
Table 2. Am29LL800BT Top Boot Block Sector Address Table
Note for Tables 2 and 3: Address range is A18:A-1 in byte mode and A18:A0 in word mode. See “Word/Byte Configuration”
section for more information.
10Am29LL800B
ADVANCE INFORMATION
Autoselect Mode
The autoselect mode provides manufacturer and device identification, and sector protection verification,
through identifier codes output on DQ7–DQ0. This
mode is primarily intended for progr amming equipment
to automatically match a device to be progr ammed with
its correspondi ng programming al gorithm. However,
the autoselect codes can also be accessed in-system
through the command register.
When using programming equipment, the autoselect
mode requires V
A1, and A0 must be as shown in Table 4. In addition,
DescriptionModeCE# OE# WE#
Manufacturer ID: AMDLLHXXV
Device ID:
Am29LL800B
(Top Boot Block)
on address pin A9. Address pins A6,
ID
Table 4. Am29LL800B Autoselect Codes (High Voltage Method)
A18
A11
to
to
A12
A10A9
WordLLH
ByteLLHXEAh
XXVIDXLXLH
when verifying sector protection, the sector address
must appear on the appropria te highest order address
bits (see Tables 2 and 3). Ta ble 4 shows the remaining
address bits that are don’t care. When all necessary bits
have been set as required, the programming equipment
may then read the corresponding identifier code on
DQ7–DQ0.
To access the autoselect codes in-system, the host
system can issue the autoselect command via the
command register, as shown in Table 5. This method
does not require V
. See “Command Definitions” for
ID
details on using the autoselect mode.
A8
to
A7A6
XLXLL X01h
ID
A5
to
A2A1A0
DQ8
to
DQ15
22hEAh
DQ7
DQ0
to
Device ID:
Am29LL800B
(Bottom Boot
Block)
Sector Protection
Verification
L = Logic Low = VIL, H = Logic High = VIH, SA = Sector Address, X = Don’t care.
Sector Protection/Unprotection
The hardware sector protection feature disables both
program and erase operations in any sect or. The hardware sector unprotection feature re-enables both program and erase operations in previously protected
sectors. Sector protection/unprotecti on can be implemented via two methods.
The primary method requires V
only, and can be implemented either in-system or via
programming equipment. Figure 2 shows the algorithms and Figure 24 shows the timing diagram. This
method uses standard m icroprocessor bus cycle timing. For sector unprotect, all unprotected sectors must
first be protected prior to the first sector unpro tect write
cycle.
The alternate method intended on ly for programming
equipment requires V
This method is compatible with programmer routines
WordLLH
ByteLLHX6Bh
XXV
LLHSAXV
XLXLH
ID
XLXHL
ID
The device is shipped with all sectors unprotected.
AMD offers the option of programming and protecting
sectors at its factory prior to shipping the device
through AMD’s ExpressFlash™ Servic e. Contact an
AMD representative for details.
It is possible to determine whether a sector is protected
or unprotected. See “Autoselect Mode” for details.
on the RESET# pin
ID
Temporary Sector Unprotect
This feature allows temporary unprotection of previously protected sectors to change data in-system. The
Sector Unprotect mode is activated by setting the RESET# pin to V
sectors can be programmed or erased b y selecting the
sector addresses. Once V
SET# pin, all the previously protected sectors are
on address pin A9 and OE#.
ID
protected again. Figure 3 shows the algorithm, and
Figure 23 shows the timing diagrams, for this feature.
written for earlier 3.0 v olt-only AMD flash de vices. Publication number 21466 contains further details; contact
an AMD representative to request a copy.