1 Megabit (128 K x 8-bit/64 K x 16-bit)
CMOS 5.0 Volt-only, Boot Sector Flash Memory
DISTINCTIVE CHARACTERISTICS
■ Single power supply operation
—5.0 V ± 10% for read, erase, and program
operations
— Simplifies system-level power requirements
■ High performance
— 70 ns maximum access time
■ Low power consumption
— 20 mA typical active read current for byte mode
— 28 mA typical active read current for word mode
— 30 mA typical program/erase current
— 25 µA typical standby current
■ Flexible sector architecture
— One 16 Kbyte, two 8 Kbyte, one 32 Kbyte, and
one 64 Kbyte sectors (byte mode)
— One 8 Kword, two 4 Kword, one 16 Kword, and
one 32 Kword sectors (word mode)
— Any combination of sectors can be erased
— Supports full chip erase
■ Top or bottom boot block configurations
available
■ Sector protection
— Hardware-based feature that disables/re-
enables program and erase operations in any
combination of sectors
— Sector protection/unprotection can be
pre-programs and erases the chip or any
combination of designated sector
— Embedded Program algorithm automatically
programs and verifies data at specified address
■ Minimum 100,000 program/erase cycles
guaranteed
■ Package options
— 44-pin SO
— 48-pin TSOP
■ Compatible with JEDEC standards
— Pinout and software compatible with
single-power-supply flash
— Superior inadvertent write protection
■ Data# Polling and Toggle Bits
— Provides a software method of detecting
program or erase cycle completion
■ Ready/Busy pin (R Y/BY#)
— Provides a hardware method for detecting
program or erase cycle completion
■ Erase Suspend/Erase Resume
— Suspends an erase operation to read data fr om,
or program data to, a sector that is not being
erased, then resumes the erase operation
■ Hardware RESET# pin
— Hardware method of resetting the device to
reading array data
Publication# 18926 Rev: C Amendment/+2
Issue Date: March 1998
GENERAL DESCRIPTION
The Am29F100 is a 1 Mbit, 5.0 V olt-only Flash memory
organized as 131,072 bytes or 65,536 words. The
Am29F100 is offered in 44-pin SO and 48-pin TSOP
packages. Word-wide data appears on DQ0-DQ15;
byte-wide data on DQ0-DQ7. The device is designed to
be programmed in-system with the standard system
5.0 Volt V
program or erase operations. The device can also be
programmed or erased in standard EPROM programmers.
The standard device offers access times of 70, 90,
120, and 150 ns, allowing high-speed microprocessors to operate without wait states. To eliminate bus
contention the device has separate chip enable
(CE#), write enable (WE#) and output enable (OE#)
controls.
supply. A 12.0 volt VPP is not required for
CC
device automatically times the erase pulse widths and
verifies proper cell margin.
The host system can detect whether a program or
erase operation is complete by observing the RY/BY#
pin, or by re ading the DQ7 (D ata# Polling) and DQ6
(toggle) status bits. After a program or erase cycle
has been completed, the device is ready to read array
data or accept another command.
The Erase Suspend feature enables the sys tem to put
erase on hold for any period of time to read data from,
or program data to, a sector that is not being erased.
The sec tor erase arc hitecture allows memory sectors
to be erased and reprogrammed without affecting the
data contents of other sectors. The device is erased
when shipped from the factory.
The device requires only a single 5.0 volt power supply for both read and write functions. Internally gener-
ated and regulated voltages are provided for the
program and erase operations.
The device is entirely command set compatible with the
JEDEC single-power-supply Flash standard. Commands are written to the command register using standard microprocessor write timings. Register contents
serve as input to an internal stat e machine that controls
the erase and programming circuitry. Write cycles also
internally latch addresses and data needed for t he programming and erase operations. Reading data out of
the device is similar to reading from other Flash or
EPROM devices.
Device programming occurs by executing the program
command sequence. This invokes the Embedded
Program algorithm—an internal algorithm that automatically times the program pulse widths and verifies
proper cell margin.
Device erasure occurs by executing the erase command sequence. This invokes the Embedded Erase
algorithm—an internal algorithm that automatically preprograms the array (if it is not already programmed) before executing the erase operation. During erase, the
The hardware data protection measures include a
low V
detector automatically inhibits write operat ions
CC
during power transitions. The hardware sector protection feature disables both program and erase oper-
ations in any combination of the sectors of memory,
and is implemented using standard EPROM programmers. The temporary sector unprotect feature allows
in-system changes to protected sectors.
The hardware RESET# pin terminates any operation
in progress and resets the internal state machine to
reading array data. The RESET# pin may be tied to the
system reset circuitry. A system reset would thus also
reset the device, enabling the system microprocessor
to read the boot-up firmware from the Flash memory.
The system can place the device into the standby mode.
Power consumption is greatly reduced in t his mode.
AMD’s Flash technology combines years of Flash
memory manufacturing experience to produce the
highest levels of quality, reliability, and cost
effectiveness. The device electrically erases all bits
within a sector simultaneously via Fowler-Nordheim
tunneling. The bytes are programmed one byte at a
time using the EPROM programming mechanism of
hot electron injection.
2Am29F100
PRODUCT SELECTOR GUIDE
Family Part Number Am29F100
Speed Option (V
Max Access Time (ns)7090120150
CE# Access (ns)7090120150
OE# Access (ns)30355055
= 5.0 V ± 10%)-70-90-120-150
CC
Note: See the AC Characteristics section for full specifications.
AMD standard products are available in several packages and operating ranges. The order number (V alid Combination) is formed
by a combination of the elements below.
Am29F100-70EC
T
B
OPTIONAL PROCESSING
Blank = Sta ndard Pro ces sin g
B = Burn-In
(Contact an AMD representative for more information.)
TEMPERATURE RANGE
C = Commercial (0
I=Industrial (–40
E = Extended (–55
PACKAGE TYPE
E = 48-Pin Thin Small Outline Package
(TSOP) Standard Pinout (TS 048)
F = 48-Pin Thin Small Outline Package
(TSOP) Reverse Pinout (TS R0 48)
S = 44-Pin Small Outline Package
(SO 044)
SPEED OPTION
See Product Selector Guide and
Valid Combinations
°C to +70°C)
°C to +85°C)
°C to +125°C)
AM29F100T-70,
AM29F100B-70
AM29F100T-90,
AM29F100B-90
AM29F100T-120,
AM29F100B-120
AM29F100T-150,
AM29F100B-150
DEVICE NUMBER/DESCRIPTION
Am29F100
1 Megabit (128 K x 8-Bit/64 K x 16-Bit) CMOS Flash Memory
5.0 Volt-only Read, Program, and Erase
Valid Combinations
Valid Combinations list configurations planned to be supported in volume for this device. Consult the local AMD sales
office to confirm availability of specific valid combinations and
to check on newly released combinations.
EC, EI, EE,
FC, FI, FE,
SC, SI, SE
BOOT CODE SECTOR ARCHITECTURE
T = Top sector
B = Bottom sector
Valid Combinations
6Am29F100
DEVICE BUS OPERATIONS
This section describes the re quirements and us e of the
device bus operations, which are initiated through the
internal command register . The command register itself
does not occupy any ad dressable memory locatio n.
The register is composed of latches that store the commands, along with the address and data information
needed to execute the command. The contents of the
Table 1. Am29F100 Device Bus Operations
register serve as inputs to the internal state machine.
The state machine outputs d ictate the function of the
device. The appropriate device bus operations table
lists the inputs and control levels required, and the resulting output. The following subsections describe
each of these operations in further detail.
2. The sector protect and sector unprotect functions must be implemented via programming equipment. See the “Sector Pro-
tection/Unprotection” section.
, H = Logic High = VIH, VID = 12.0 ± 0.5 V , X = Don’t Care, AIN = Addresses In, DIN = Data In, D
IL
XXXV
ID
), A15:A-1 in byte mode (BYTE# = VIL).
IH
Word/Byte Configuration
The BYTE# pin controls whether the device data I/O
pins DQ15–DQ0 operate in the byte or word configuration. If the BYTE# pin is set at logic ‘1’, the device is in
word configuration, DQ15–D Q0 are active and controlled by CE# and OE#.
If the BYTE# pin is set at logic ‘0’, the device is in byte
configuration, and only data I/O pins DQ0–DQ7 ar e active and controlled by CE# and OE#. The data I/O pins
DQ8–DQ14 are tri-stated, and the DQ15 pin is used as
an input for the LSB (A-1) address function.
Requirements for Reading Array Data
To read array data from the outputs, the system must
drive the CE# and OE# pins to V
control and selects the device. OE# is the output control
and gates array data to the output pins. WE# should remain at V
. The BYTE# pin determines whether the de-
IH
vice outputs array data in words or bytes.
The internal state machine is set for reading array
data upon device power-up , or after a hardware reset. This ensures that no spurious alteration of the
. CE# is the power
IL
(Note 1)
IN
IN
A
IN
memory content occurs during th e power transition.
No command is necessary in this mode to obtain
array data. Standard microprocessor read cycles that
assert valid addresses on the device address inputs
produce valid data on the device data outputs. The
device remains enabled for read access until the
command register contents are altered.
See “Reading Array Data” for more information. Refer
to the AC Read Operations table for timing specifications and to the Read Operations Timings diagram for
the timing waveforms. I
table represents the active current specification for
reading array data.
Writing Commands/Command Sequences
To write a command or command sequence (which includes programming data to the device and erasing
sectors of memory), the system must drive WE# and
CE# to V
For program operations, the BYTE# pin determines
whether the device accepts prog ram data in bytes
or words. Refer to “Word/Byte Configuration” for
more information.
DQ0–
DQ7
D
OUT
D
IN
D
IN
, and OE# to VIH.
IL
BYTE#
= V
IH
D
OUT
D
IN
D
IN
in the DC Characteristics
CC1
BYTE#
= V
IL
DQ8–DQ14 = High-Z,
DQ15 = A-1
High-Z
= Data Out
OUT
Am29F1007
An erase operation can erase one sector, multiple sectors, or the entire device. The Sector Address Tables
indicate the address space that each sector occupies.
A “sector address” consists of the address bits required
to uniquely select a sector. See the “Command Definitions” section for details on erasing a sector or the entire chip, or suspending/resuming the erase operation.
After the system writes the autoselect command sequence, the device enters the autoselect mode. The
system can then read autoselect codes from the internal register (which is separate from the memory array)
on DQ7–DQ0. Standard read cycle timings apply in this
mode. Refer to the “Autoselect Mode” and “Autoselect
Command Sequence” sections for more information.
in the DC Characteristics table represents the ac-
I
CC2
tive current specification for the write mode. The “AC
Characteristics” section contains timing specification
tables and timing diagrams for write operations.
Program and Erase Operation Status
During an erase or program operation, t he system may
check the status of the operation by reading the status
bits on DQ7–DQ0. Standard read cycle timings and I
CC
read specificat ions apply. Refer to “Write Operation
Status” for more information, and to each AC Characteristics section for timing diagrams.
Standby Mode
When the system is not reading or writing to the device,
it can place the device in the standby mo de. In this
mode, current consumption is greatly reduced, and the
outputs are placed in the high impedance state, independent of the OE# input.
The device enters the CMOS standby mode when CE#
and RESET# pins are both held at V
that this is a more restricted voltage rang e than V
The device e nters the TTL standby mode when CE#
and RESET# pins are both held at V
quires standard access time (t
CE
when the device is in either of these standby modes ,
before it is ready to read data.
The device also enters the standby mode when th e
RESET# pin is driven low. Refer to the next section,
“RESET#: Hardware Reset Pin”.
± 0.5 V. (Note
CC
IH
. The device re-
IH
) for read access
If the device is deselected during erasure or programming, the device draws active current until the
operation is completed.
In the DC Charac teristics tables, I
CC3
standby current specification.
RESET#: HARDWARE RESET PIN
The RESET# pin provides a hardware method of resetting the device to reading array data. When the system
drives the RESET# pin low for at least a period of t
the device immediately terminates any oper ation in
progress, tristates all data output pins, and ignores all
read/write atte mpts for the duration of the RESET#
pulse. The device a lso resets the internal sta te machine to reading array data. The operation that was interrupted should be reinitiated once the devic e is ready
to accept another command sequence, to ensure data
integrity.
Current is reduced for the duration of the RESET#
pulse. When RESET# is held at V
, the device enters
IL
the TTL standby mode; if RESET# is held at V
0.5 V, the device enters the CMOS standby mode.
The RESET# pin may be tied to the system reset cir-
cuitry. A system reset would thus also reset the Flash
memory, enabling the system to read the boot-up firmware from the Flash memory.
If RESET# is asserted during a program or erase operation, the RY/BY# pin remains a “0” (busy) until the internal reset operation is complete, which re quires a
time of t
(during Embedded Algorithms). The
READY
system can thus monitor RY/BY# to determine whether
the reset operation is co mplete. If RESET# is asserted
when a program or erase operation is not executing
(RY/BY# pin is “1”), the reset opera tion is completed
within a time of t
.)
rithms). The system can read data t
SET# pin returns to V
(not during Embedded Algo-
READY
.
IH
RH
Refer to the AC Characteristics tables for RESET# parameters and timing diagram.
Output Disable Mode
When the OE# input is at VIH, output from the device is
disabled. The output pins are placed in the high impedance state.
represents the
RP
SS
after the RE -
,
±
8Am29F100
Table 2. Sector Addresses Tables (Am29F100T)
A15A14A13A12(x8) Address Range(x16 ) Address Rang e
A15A14A13A12(x8) Address Range(x16 ) Address Rang e
SA0000X00000h-03FFFh00000h-01FFFh
SA1001004000 h-0 5F FFh02000h-02F FF h
SA2001106000 h-0 7F FFh03000h-03F FF h
SA301XX08000h-0FFFFh04000h-07FFFh
SA41XXX10000h-1FF FFh08000h-0FFFFh
Autoselect Mode
The autoselect mode provides manu facturer and device identification, and sector protection verification,
through identifier codes output on DQ7–DQ0. This
mode is primarily intended for programming equipment
to automatically match a device to be programmed with
its corresponding progra mming algorithm. However,
the autoselect codes can also be accessed in-system
through the command register.
When using programming equipment, the autoselect
mode requires V
(11.5 V to 12.5 V) on address pin
ID
A9. Address pins A6, A1, and A0 must be as shown in
Autoselect Codes (High Voltage Method) table. In addition, when verifying sector protection, the sector ad-
dress must appear on the appropriate highest order
address bits. Refer to the corresponding Sector Address Tables. The Command Definitions table shows
the remaining address bits that are don’t c are. When all
necessary bits have been set as required, the programming equipment may then read the corresponding
identifier code on DQ7–DQ0.
To access the autoselect codes in-system, the host
system can issue the autoselect command via the
command register, as shown in the Command Definitions table. This method does not require V
“Command Definitions” for details on using the autoselect mode.
ID
. See
Table 4. Am29F100 Autoselect Codes (High Voltage Method)
A15
A11
to
to
DescriptionModeCE#OE# WE#
Manufacturer ID: AMDLLHXXV
Device ID:
Am29F100
(Top Boot Block)
Device ID:
Am29F100
(Bottom Boot Block)
Sector Protection VerificationLLHSAXV
L = Logic Low = VIL, H = Logic High = VIH, SA = Sector Address, X = Don’t care.
WordLLH
ByteLLHXD9h
WordLLH
ByteLLHXDFh
A12
A10A9
XXV
XXV
A8
to
A7A6
XLXLL X01h
ID
XLXLH
ID
XLXLH
ID
XLXHL
ID
Am29F1009
A5
to
A2A1A0
DQ8
to
DQ15
22hD9h
22hDFh
X
X
DQ7
DQ0
(protected)
(unprotected)
to
01h
00h
Sector Protection/Unprotection
The hardware sector protection feature disables both
program and erase operations in any sector. The
hardware sector unprotection feature re-enables
both program and erase operations in previously protected sectors.
Sector protection/unprotection must be implemented
using programming equipment. The procedure requires a high voltage (V
control pins. Details on this method are provided in a
supplement, publication number 20373. Contact an
AMD representative to obtain a copy of the appropriate
document.
) on address pin A9 and the
ID
START
RESET# = V
(Note 1)
Perform Erase or
Program Operations
RESET# = V
ID
IH
The device is shipped with all sectors unprotected.
AMD offers the option of programming and protecting
sectors at its factory prior to shipping the device
through AMD’s ExpressFlash™ Service. Contact a n
AMD representative for details.
It is possible to determine whether a sector is protected
or unprotected. See “Autoselect Mode” for details.
Temporary Sector Unprotect
This feature allows temporary unprotection of previously protected sectors to change data in-system.
The Sector Unprotect mo de is activ ated by setti ng the
RESET# pin to V
tected sectors can be programmed or erased by selecting the sector addresses. Once V
from the RESET# pin, all the previously protected
sectors are protected again. Figure 1 shows the algorithm, and the Temporary Sector Unprotect (Figure
17) diagram shows the t imin g wave fo rms, fo r thi s feature.
. During this mode, formerly pro-
ID
is removed
ID
Temporary Sector
Unprotect
Completed (Note 2)
18926C-6
Notes:
1. All protected sectors unprotected.
2. All previously protected sectors are protected once
again.
Figure 1. Temporary Sector Unprotect Operation
10Am29F100
Hardware Data Protection
The command sequence requirement of unlock cycles
for programming or erasing provides data protection
against inadvertent writes (refer to t he Comma nd Definitions table). In addition, the following hardware data
protection measures prevent accidental era sure or programming, which might otherwise be caused by spurious system level signals during V
power-up and
CC
power-down transitions, or from system noise.
Low V
When V
cept any write cycles. This protects data during V
Write Inhibit
CC
is less than V
CC
, the device does not ac-
LKO
CC
power-up and power-down. The command register and
all internal program/erase circuits are disabled, and the
device resets. Subsequent writes are ignored until V
is greater than V
. The system must provide the
LKO
CC
COMMAND DEFINITIONS
Writing specific address and data command s or sequences into the command register initiates device operations. The Command Defini tions table defines the
valid register command sequences. Writing incorrect
address and data values or writing them in the im-
proper sequence resets the device to reading array
data.
All addresses are latched on the falling edge of WE# or
CE#, whichever happens later. All data is latched on
the rising edge of WE# or CE#, whichever happens
first. Refer to the appropriate timing diagrams in the
“AC Characteristics” section.
Reading Array Data
The device is a utomatically set to reading array data
after device power-up. No commands are required to
retrieve data. The device is also ready to read array
data after completing an Em bedded Program or Embedded Erase algorithm.
After the device accepts an Erase Suspend command,
the device enters the Erase Suspend mode. The system can read array data using the standard read timings, except that if it reads at an address within erasesuspended sectors, the device outputs status data.
After completing a programming operation in the Erase
Suspend mode, the system may once again read array
data with the same exception. See “Erase Suspend/
Erase Resume Commands” for more information on
this mode.
must
The system
able the device for reading array data if DQ5 goes high,
or while in the autoselect mode. See the “Reset Command” section, next.
issue the reset command to re-en-
proper signals to the control pins to prevent unintentional writes when V
is greater than V
CC
LKO
.
Write Pulse “Glitch” Protection
Noise pulses of less than 5 ns (typical) on OE#, CE# or
WE# do not initiate a write cycle.
Logical Inhibit
Write cycles are inhibited by holding any one of OE#
, CE# = VIH or WE# = VIH. To initia te a write c y-
= V
IL
cle, CE# and WE# must be a logical zero while OE#
is a logical one.
Power-Up Write Inhibit
If WE# = CE# = V
and OE# = VIH during power
IL
up, the device does not accept commands on the
rising edge of WE#. The internal state machine is
automatically reset to reading array data on
power-up.
See also “Requirements for Reading Array Data” in the
“Device Bus Operations” section for more information.
The Read Operations table provides the read parameters, and Read Operation Timings diagram shows the
timing diagram.
Reset Command
Writing the reset command to the device resets the device to reading array data. Address bits are don’t care
for this command.
The reset command may be written between the sequence cycles in an erase command sequence before
erasing begins. This resets the device to reading array
data. Once erasure begins, however, the device ignores reset commands until the operation is complete.
The reset command may be written between the sequence cycles in a program command sequence before programming begins. This resets the device to
reading array data (also applies to programming in
Erase Suspend mode). Once programming begins,
however, the device ignores reset commands until the
operation is complete.
The reset command may be written between the sequence cycles in an autoselect command sequence.
Once in the autoselect mode, the reset command
be written to return to reading array data (also applies
to autoselect during Erase Suspend).
If DQ5 goes high during a program or erase operat ion,
writing the reset command returns the device to reading array data (also applies during Erase Suspend).
must
Am29F10011
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