AMD Advanced Micro Devices AM29F100T-90FC, AM29F100T-90EIB, AM29F100T-90EI, AM29F100T-90EEB, AM29F100T-90EE Datasheet

...
FINAL
Am29F100
1 Megabit (128 K x 8-bit/64 K x 16-bit) CMOS 5.0 Volt-only, Boot Sector Flash Memory

DISTINCTIVE CHARACTERISTICS

Single power supply operation
operations
— Simplifies system-level power requirements
High performance
— 70 ns maximum access time
Low power consumption
— 20 mA typical active read current for byte mode — 28 mA typical active read current for word mode — 30 mA typical program/erase current — 25 µA typical standby current
Flexible sector architecture
— One 16 Kbyte, two 8 Kbyte, one 32 Kbyte, and
one 64 Kbyte sectors (byte mode)
— One 8 Kword, two 4 Kword, one 16 Kword, and
one 32 Kword sectors (word mode) — Any combination of sectors can be erased — Supports full chip erase
Top or bottom boot block configurations
available
Sector protection
— Hardware-based feature that disables/re-
enables program and erase operations in any
combination of sectors — Sector protection/unprotection can be
implemented using standard PROM
programming equipment — Temporary Sector Unprote ct feature allows in-
system code changes in protected sectors
Embedded Algorithms
— Embedded Erase algorithm automatically
pre-programs and erases the chip or any combination of designated sector
— Embedded Program algorithm automatically
programs and verifies data at specified address
Minimum 100,000 program/erase cycles
guaranteed
Package options
— 44-pin SO — 48-pin TSOP
Compatible with JEDEC standards
— Pinout and software compatible with
single-power-supply flash
— Superior inadvertent write protection
Data# Polling and Toggle Bits
— Provides a software method of detecting
program or erase cycle completion
Ready/Busy pin (R Y/BY#)
— Provides a hardware method for detecting
program or erase cycle completion
Erase Suspend/Erase Resume
— Suspends an erase operation to read data fr om,
or program data to, a sector that is not being erased, then resumes the erase operation
Hardware RESET# pin
— Hardware method of resetting the device to
reading array data
Publication# 18926 Rev: C Amendment/+2 Issue Date: March 1998

GENERAL DESCRIPTION

The Am29F100 is a 1 Mbit, 5.0 V olt-only Flash memory organized as 131,072 bytes or 65,536 words. The Am29F100 is offered in 44-pin SO and 48-pin TSOP packages. Word-wide data appears on DQ0-DQ15; byte-wide data on DQ0-DQ7. The device is designed to be programmed in-system with the standard system
5.0 Volt V program or erase operations. The device can also be programmed or erased in standard EPROM program­mers.
The standard device offers access times of 70, 90, 120, and 150 ns, allowing high-speed microproces­sors to operate without wait states. To eliminate bus contention the device has separate chip enable (CE#), write enable (WE#) and output enable (OE#) controls.
supply. A 12.0 volt VPP is not required for
CC
device automatically times the erase pulse widths and verifies proper cell margin.
The host system can detect whether a program or erase operation is complete by observing the RY/BY# pin, or by re ading the DQ7 (D ata# Polling) and DQ6 (toggle) status bits. After a program or erase cycle has been completed, the device is ready to read array data or accept another command.
The Erase Suspend feature enables the sys tem to put erase on hold for any period of time to read data from, or program data to, a sector that is not being erased.
The sec tor erase arc hitecture allows memory sectors to be erased and reprogrammed without affecting the data contents of other sectors. The device is erased when shipped from the factory.
The device requires only a single 5.0 volt power sup­ply for both read and write functions. Internally gener-
ated and regulated voltages are provided for the program and erase operations.
The device is entirely command set compatible with the JEDEC single-power-supply Flash standard. Com­mands are written to the command register using stan­dard microprocessor write timings. Register contents serve as input to an internal stat e machine that controls the erase and programming circuitry. Write cycles also internally latch addresses and data needed for t he pro­gramming and erase operations. Reading data out of the device is similar to reading from other Flash or EPROM devices.
Device programming occurs by executing the program command sequence. This invokes the Embedded
Program algorithm—an internal algorithm that auto­matically times the program pulse widths and verifies proper cell margin.
Device erasure occurs by executing the erase com­mand sequence. This invokes the Embedded Erase algorithm—an internal algorithm that automatically pre­programs the array (if it is not already programmed) be­fore executing the erase operation. During erase, the
The hardware data protection measures include a low V
detector automatically inhibits write operat ions
CC
during power transitions. The hardware sector pro­tection feature disables both program and erase oper-
ations in any combination of the sectors of memory, and is implemented using standard EPROM program­mers. The temporary sector unprotect feature allows in-system changes to protected sectors.
The hardware RESET# pin terminates any operation in progress and resets the internal state machine to reading array data. The RESET# pin may be tied to the system reset circuitry. A system reset would thus also reset the device, enabling the system microprocessor to read the boot-up firmware from the Flash memory.
The system can place the device into the standby mode. Power consumption is greatly reduced in t his mode.
AMD’s Flash technology combines years of Flash memory manufacturing experience to produce the highest levels of quality, reliability, and cost effectiveness. The device electrically erases all bits within a sector simultaneously via Fowler-Nordheim tunneling. The bytes are programmed one byte at a time using the EPROM programming mechanism of hot electron injection.
2 Am29F100

PRODUCT SELECTOR GUIDE

Family Part Number Am29F100 Speed Option (V Max Access Time (ns) 70 90 120 150 CE# Access (ns) 70 90 120 150 OE# Access (ns) 30 35 50 55
= 5.0 V ± 10%) -70 -90 -120 -150
CC
Note: See the AC Characteristics section for full specifications.

BLOCK DIAGRAM

DQ0
DQ15
Input/Output
Buffers
Data
Latch
V
CC
V
SS
WE#
BYTE#
RESET#
CE# OE#
RY/BY#
Buffer
State
Control
Command
Register
RY/BY#
PGM Voltage
Generator
Erase Voltage
Generator
Chip Enable
Output Enable
Logic
STB
A0–A15
A-1
VCC Detector
Timer
STB
Address Latch
Y-Decoder
X-Decoder
Y-Gating
Cell Matrix
18926C-1
Am29F100 3

CONNECTION DIAGRAMS

A15 A14 A13 A12 A11 A10
A9
A8 NC NC
WE#
RESET#
NC NC
RY/BY#
NC NC
A7
A6
A5
A4
A3
A2
A1
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22
23 24
Standard TSOP
48 47 46 45 44 43 42 41 40 39 38 37 36 35 34 33 32 31 30 29 28 27 26 25
NC BYTE# V
SS
DQ15/A-1 DQ7 DQ14 DQ6
DQ13 DQ5 DQ12 DQ4 V
CC
DQ11 DQ3 DQ10 DQ2 DQ9 DQ1 DQ8 DQ0 OE#
V
SS
CE# A0
18926C-2
NC
BYTE#
V
SS
DQ15/A-1
DQ7
DQ14
DQ6
DQ13
DQ5
DQ12
DQ4
V
CC
DQ11
DQ3
DQ10
DQ2
DQ9
DQ1
DQ8
DQ0
OE#
V
SS
CE#
A0
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22
23 24
Reverse TSOP
48 47 46 45 44 43 42 41 40 39 38 37 36 35 34 33 32 31 30 29 28 27 26 25
A15 A14 A13 A12 A11 A10 A9 A8 NC NC WE# RESET# NC NC RY/BY# NC NC A7 A6 A5 A4 A3 A2 A1
4 Am29F100
18926C-3
CONNECTION DIAGRAMS
RY/BY#

PIN CONFIGURATION

A0–A15 = 16 Addresses
NC NC
A7 A6 A5 A4 A3 A2 A1 A0
CE#
V
SS
OE# DQ0 DQ8 DQ1 DQ9 DQ2
DQ10
DQ3
DQ11
10 11 12 13 14 15 16 17 18 19 20 21 22
1 2 3 4 5 6 7 8 9
SO
44 43 42 41 40 39 38 37 36 35 34 33 32 31 30 29 28 27 26 25 24 23
RESET# WE# A8 A9 A10 A11 A12 A13 A14 A15 NC BYTE# V
SS
DQ15/A-1 DQ7 DQ14 DQ6 DQ13 DQ5 DQ12 DQ4 V
CC
18926C-4

LOGIC SYMBOL

DQ0–DQ14= 15 Data Inputs/Outputs DQ15/A-1 = DQ15 (Data Input/Output, word mode),
A-1 (LSB Address Input, byte mode) CE# = Chip Enable OE# = Output Enable WE# = Write Enable BYTE# = Selects 8-bit or 16-bit mode RESET# = Hardware Reset Pin, Active Low RY/BY# = Ready/Busy Output V
CC
= +5.0 Volt Single Power Supply
(See Product Selector Guide for speed
options and voltage supply tolerances) V
SS
= Device Ground
NC = Pin Not Connected Internally
16
A0–A15
CE# OE#
WE# RESET#
BYTE#
16 or 8
DQ0–DQ15
(A-1)
RY/BY#
18926C-5
Am29F100 5
ORDERING INFORMATION Standard Pr od ucts
AMD standard products are available in several packages and operating ranges. The order number (V alid Combination) is formed by a combination of the elements below.
Am29F100 -70 E C
T
B
OPTIONAL PROCESSING
Blank = Sta ndard Pro ces sin g
B = Burn-In
(Contact an AMD representative for more infor­mation.)
TEMPERATURE RANGE
C = Commercial (0 I=Industrial (–40
E = Extended (–55
PACKAGE TYPE
E = 48-Pin Thin Small Outline Package
(TSOP) Standard Pinout (TS 048)
F = 48-Pin Thin Small Outline Package
(TSOP) Reverse Pinout (TS R0 48)
S = 44-Pin Small Outline Package
(SO 044)
SPEED OPTION
See Product Selector Guide and Valid Combinations
°C to +70°C)
°C to +85°C)
°C to +125°C)
AM29F100T-70, AM29F100B-70
AM29F100T-90, AM29F100B-90
AM29F100T-120, AM29F100B-120
AM29F100T-150, AM29F100B-150
DEVICE NUMBER/DESCRIPTION
Am29F100 1 Megabit (128 K x 8-Bit/64 K x 16-Bit) CMOS Flash Memory
5.0 Volt-only Read, Program, and Erase
Valid Combinations
Valid Combinations list configurations planned to be sup­ported in volume for this device. Consult the local AMD sales office to confirm availability of specific valid combinations and to check on newly released combinations.
EC, EI, EE,
FC, FI, FE, SC, SI, SE
BOOT CODE SECTOR ARCHITECTURE
T = Top sector B = Bottom sector
Valid Combinations
6 Am29F100

DEVICE BUS OPERATIONS

This section describes the re quirements and us e of the device bus operations, which are initiated through the internal command register . The command register itself does not occupy any ad dressable memory locatio n. The register is composed of latches that store the com­mands, along with the address and data information needed to execute the command. The contents of the
Table 1. Am29F100 Device Bus Operations
register serve as inputs to the internal state machine. The state machine outputs d ictate the function of the device. The appropriate device bus operations table lists the inputs and control levels required, and the re­sulting output. The following subsections describe each of these operations in further detail.
DQ8–DQ15
Addresses
Operation CE# OE# WE# RESET#
Read L L H H A
Write L H L H A Standby VCC ± 0.5 V X X VCC ± 0.5 V X High-Z High-Z High-Z Output Disable L H H H X High-Z High-Z High-Z Hardware Reset X X X L X High-Z High-Z High-Z Temporary Sector
Unprotect
Legend:
L = Logic Low = V
Notes:
1. Addresses are A15:A0 in word mode (BYTE# = V
2. The sector protect and sector unprotect functions must be implemented via programming equipment. See the “Sector Pro-
tection/Unprotection” section.
, H = Logic High = VIH, VID = 12.0 ± 0.5 V , X = Don’t Care, AIN = Addresses In, DIN = Data In, D
IL
XXXV
ID
), A15:A-1 in byte mode (BYTE# = VIL).
IH

Word/Byte Configuration

The BYTE# pin controls whether the device data I/O
pins DQ15–DQ0 operate in the byte or word configura­tion. If the BYTE# pin is set at logic ‘1’, the device is in word configuration, DQ15–D Q0 are active and con­trolled by CE# and OE#.
If the BYTE# pin is set at logic ‘0’, the device is in byte configuration, and only data I/O pins DQ0–DQ7 ar e ac­tive and controlled by CE# and OE#. The data I/O pins DQ8–DQ14 are tri-stated, and the DQ15 pin is used as an input for the LSB (A-1) address function.

Requirements for Reading Array Data

To read array data from the outputs, the system must drive the CE# and OE# pins to V control and selects the device. OE# is the output control and gates array data to the output pins. WE# should re­main at V
. The BYTE# pin determines whether the de-
IH
vice outputs array data in words or bytes. The internal state machine is set for reading array
data upon device power-up , or after a hardware re­set. This ensures that no spurious alteration of the
. CE# is the power
IL
(Note 1)
IN
IN
A
IN
memory content occurs during th e power transition. No command is necessary in this mode to obtain array data. Standard microprocessor read cycles that assert valid addresses on the device address inputs produce valid data on the device data outputs. The device remains enabled for read access until the command register contents are altered.
See “Reading Array Data” for more information. Refer to the AC Read Operations table for timing specifica­tions and to the Read Operations Timings diagram for the timing waveforms. I
table represents the active current specification for reading array data.

Writing Commands/Command Sequences

To write a command or command sequence (which in­cludes programming data to the device and erasing sectors of memory), the system must drive WE# and CE# to V
For program operations, the BYTE# pin determines whether the device accepts prog ram data in bytes or words. Refer to “Word/Byte Configuration” for more information.
DQ0–
DQ7
D
OUT
D
IN
D
IN
, and OE# to VIH.
IL
BYTE#
= V
IH
D
OUT
D
IN
D
IN
in the DC Characteristics
CC1
BYTE#
= V
IL
DQ8–DQ14 = High-Z,
DQ15 = A-1
High-Z
= Data Out
OUT
Am29F100 7
An erase operation can erase one sector, multiple sec­tors, or the entire device. The Sector Address Tables indicate the address space that each sector occupies.
A “sector address” consists of the address bits required to uniquely select a sector. See the “Command Defini­tions” section for details on erasing a sector or the en­tire chip, or suspending/resuming the erase operation.
After the system writes the autoselect command se­quence, the device enters the autoselect mode. The system can then read autoselect codes from the inter­nal register (which is separate from the memory array) on DQ7–DQ0. Standard read cycle timings apply in this mode. Refer to the “Autoselect Mode” and “Autoselect Command Sequence” sections for more information.
in the DC Characteristics table represents the ac-
I
CC2
tive current specification for the write mode. The “AC Characteristics” section contains timing specification tables and timing diagrams for write operations.

Program and Erase Operation Status

During an erase or program operation, t he system may check the status of the operation by reading the status bits on DQ7–DQ0. Standard read cycle timings and I
CC
read specificat ions apply. Refer to “Write Operation Status” for more information, and to each AC Charac­teristics section for timing diagrams.

Standby Mode

When the system is not reading or writing to the device, it can place the device in the standby mo de. In this mode, current consumption is greatly reduced, and the outputs are placed in the high impedance state, inde­pendent of the OE# input.
The device enters the CMOS standby mode when CE# and RESET# pins are both held at V that this is a more restricted voltage rang e than V The device e nters the TTL standby mode when CE# and RESET# pins are both held at V quires standard access time (t
CE
when the device is in either of these standby modes , before it is ready to read data.
The device also enters the standby mode when th e RESET# pin is driven low. Refer to the next section, “RESET#: Hardware Reset Pin”.
± 0.5 V. (Note
CC
IH
. The device re-
IH
) for read access
If the device is deselected during erasure or program­ming, the device draws active current until the operation is completed.
In the DC Charac teristics tables, I
CC3
standby current specification.

RESET#: HARDWARE RESET PIN

The RESET# pin provides a hardware method of reset­ting the device to reading array data. When the system drives the RESET# pin low for at least a period of t the device immediately terminates any oper ation in progress, tristates all data output pins, and ignores all read/write atte mpts for the duration of the RESET# pulse. The device a lso resets the internal sta te ma­chine to reading array data. The operation that was in­terrupted should be reinitiated once the devic e is ready to accept another command sequence, to ensure data integrity.
Current is reduced for the duration of the RESET# pulse. When RESET# is held at V
, the device enters
IL
the TTL standby mode; if RESET# is held at V
0.5 V, the device enters the CMOS standby mode. The RESET# pin may be tied to the system reset cir-
cuitry. A system reset would thus also reset the Flash memory, enabling the system to read the boot-up firm­ware from the Flash memory.
If RESET# is asserted during a program or erase oper­ation, the RY/BY# pin remains a “0” (busy) until the in­ternal reset operation is complete, which re quires a time of t
(during Embedded Algorithms). The
READY
system can thus monitor RY/BY# to determine whether the reset operation is co mplete. If RESET# is asserted when a program or erase operation is not executing (RY/BY# pin is “1”), the reset opera tion is completed within a time of t
.)
rithms). The system can read data t SET# pin returns to V
(not during Embedded Algo-
READY
.
IH
RH
Refer to the AC Characteristics tables for RESET# pa­rameters and timing diagram.

Output Disable Mode

When the OE# input is at VIH, output from the device is disabled. The output pins are placed in the high imped­ance state.
represents the
RP
SS
after the RE -
,
±
8 Am29F100
Table 2. Sector Addresses Tables (Am29F100T)
A15 A14 A13 A12 (x8) Address Range (x16 ) Address Rang e
SA0 0 X X X 00000h-0FF FFh 00000h-07FFFh SA1 1 0 X X 10000h-17FFFh 08000h-0BFFFh SA2 1 1 0 0 18000 h-1 9F FFh 0C000h-0CFFFh SA3 1 1 0 1 1A000h-1BFFFh 0D000h-0DFFFh SA4 1 1 1 X 1C000h-1FFFFh 0E000h-0FFFFh
Table 3. Sector Addresses Tables (Am29F100B)
A15 A14 A13 A12 (x8) Address Range (x16 ) Address Rang e
SA0 0 0 0 X 00000h-03FFFh 00000h-01FFFh SA1 0 0 1 0 04000 h-0 5F FFh 02000h-02F FF h SA2 0 0 1 1 06000 h-0 7F FFh 03000h-03F FF h SA3 0 1 X X 08000h-0FFFFh 04000h-07FFFh SA4 1 X X X 10000h-1FF FFh 08000h-0FFFFh

Autoselect Mode

The autoselect mode provides manu facturer and de­vice identification, and sector protection verification,
through identifier codes output on DQ7–DQ0. This mode is primarily intended for programming equipment to automatically match a device to be programmed with its corresponding progra mming algorithm. However, the autoselect codes can also be accessed in-system through the command register.
When using programming equipment, the autoselect mode requires V
(11.5 V to 12.5 V) on address pin
ID
A9. Address pins A6, A1, and A0 must be as shown in Autoselect Codes (High Voltage Method) table. In ad­dition, when verifying sector protection, the sector ad-
dress must appear on the appropriate highest order address bits. Refer to the corresponding Sector Ad­dress Tables. The Command Definitions table shows the remaining address bits that are don’t c are. When all necessary bits have been set as required, the program­ming equipment may then read the corresponding identifier code on DQ7–DQ0.
To access the autoselect codes in-system, the host system can issue the autoselect command via the command register, as shown in the Command Defini­tions table. This method does not require V “Command Definitions” for details on using the autose­lect mode.
ID
. See
Table 4. Am29F100 Autoselect Codes (High Voltage Method)
A15
A11
to
to
Description Mode CE# OE# WE#
Manufacturer ID: AMD L L H X X V Device ID:
Am29F100 (Top Boot Block)
Device ID: Am29F100 (Bottom Boot Block)
Sector Protection Verification L L H SA X V
L = Logic Low = VIL, H = Logic High = VIH, SA = Sector Address, X = Don’t care.
Word L L H
Byte L L H X D9h
Word L L H
Byte L L H X DFh
A12
A10 A9
XXV
XXV
A8
to
A7 A6
XLXLL X 01h
ID
XLXLH
ID
XLXLH
ID
XLXHL
ID
Am29F100 9
A5
to
A2 A1 A0
DQ8
to
DQ15
22h D9h
22h DFh
X
X
DQ7
DQ0
(protected)
(unprotected)
to
01h
00h

Sector Protection/Unprotection

The hardware sector protection feature disables both program and erase operations in any sector. The hardware sector unprotection feature re-enables both program and erase operations in previously pro­tected sectors.
Sector protection/unprotection must be implemented using programming equipment. The procedure re­quires a high voltage (V control pins. Details on this method are provided in a supplement, publication number 20373. Contact an AMD representative to obtain a copy of the appropriate document.
) on address pin A9 and the
ID
START
RESET# = V
(Note 1)
Perform Erase or
Program Operations
RESET# = V
ID
IH
The device is shipped with all sectors unprotected. AMD offers the option of programming and protecting sectors at its factory prior to shipping the device
through AMD’s ExpressFlash™ Service. Contact a n AMD representative for details.
It is possible to determine whether a sector is protected or unprotected. See “Autoselect Mode” for details.

Temporary Sector Unprotect

This feature allows temporary unprotection of previ­ously protected sectors to change data in-system. The Sector Unprotect mo de is activ ated by setti ng the RESET# pin to V tected sectors can be programmed or erased by se­lecting the sector addresses. Once V from the RESET# pin, all the previously protected sectors are protected again. Figure 1 shows the algo­rithm, and the Temporary Sector Unprotect (Figure
17) diagram shows the t imin g wave fo rms, fo r thi s fea­ture.
. During this mode, formerly pro-
ID
is removed
ID
Temporary Sector
Unprotect
Completed (Note 2)
18926C-6
Notes:
1. All protected sectors unprotected.
2. All previously protected sectors are protected once again.
Figure 1. Temporary Sector Unprotect Operation
10 Am29F100

Hardware Data Protection

The command sequence requirement of unlock cycles for programming or erasing provides data protection against inadvertent writes (refer to t he Comma nd Defi­nitions table). In addition, the following hardware data protection measures prevent accidental era sure or pro­gramming, which might otherwise be caused by spuri­ous system level signals during V
power-up and
CC
power-down transitions, or from system noise.
Low V
When V cept any write cycles. This protects data during V
Write Inhibit
CC
is less than V
CC
, the device does not ac-
LKO
CC
power-up and power-down. The command register and all internal program/erase circuits are disabled, and the device resets. Subsequent writes are ignored until V is greater than V
. The system must provide the
LKO
CC

COMMAND DEFINITIONS

Writing specific address and data command s or se­quences into the command register initiates device op­erations. The Command Defini tions table defines the valid register command sequences. Writing incorrect
address and data values or writing them in the im- proper sequence resets the device to reading array
data. All addresses are latched on the falling edge of WE# or
CE#, whichever happens later. All data is latched on the rising edge of WE# or CE#, whichever happens first. Refer to the appropriate timing diagrams in the
“AC Characteristics” section.

Reading Array Data

The device is a utomatically set to reading array data after device power-up. No commands are required to retrieve data. The device is also ready to read array data after completing an Em bedded Program or Em­bedded Erase algorithm.
After the device accepts an Erase Suspend command, the device enters the Erase Suspend mode. The sys­tem can read array data using the standard read tim­ings, except that if it reads at an address within erase­suspended sectors, the device outputs status data. After completing a programming operation in the Erase Suspend mode, the system may once again read array data with the same exception. See “Erase Suspend/ Erase Resume Commands” for more information on this mode.
must
The system able the device for reading array data if DQ5 goes high, or while in the autoselect mode. See the “Reset Com­mand” section, next.
issue the reset command to re-en-
proper signals to the control pins to prevent uninten­tional writes when V
is greater than V
CC
LKO
.

Write Pulse “Glitch” Protection

Noise pulses of less than 5 ns (typical) on OE#, CE# or WE# do not initiate a write cycle.

Logical Inhibit

Write cycles are inhibited by holding any one of OE#
, CE# = VIH or WE# = VIH. To initia te a write c y-
= V
IL
cle, CE# and WE# must be a logical zero while OE# is a logical one.
Power-Up Write Inhibit
If WE# = CE# = V
and OE# = VIH during power
IL
up, the device does not accept commands on the rising edge of WE#. The internal state machine is automatically reset to reading array data on power-up.
See also “Requirements for Reading Array Data” in the “Device Bus Operations” section for more information. The Read Operations table provides the read parame­ters, and Read Operation Timings diagram shows the timing diagram.

Reset Command

Writing the reset command to the device resets the de­vice to reading array data. Address bits are don’t care for this command.
The reset command may be written between the se­quence cycles in an erase command sequence before erasing begins. This resets the device to reading array data. Once erasure begins, however, the device ig­nores reset commands until the operation is complete.
The reset command may be written between the se­quence cycles in a program command sequence be­fore programming begins. This resets the device to reading array data (also applies to programming in Erase Suspend mode). Once programming begins, however, the device ignores reset commands until the operation is complete.
The reset command may be written between the se­quence cycles in an autoselect command sequence. Once in the autoselect mode, the reset command be written to return to reading array data (also applies to autoselect during Erase Suspend).
If DQ5 goes high during a program or erase operat ion, writing the reset command returns the device to read­ing array data (also applies during Erase Suspend).
must
Am29F100 11
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