AMD Am29DL400B Service Manual

查询Am29DL400BB-70EC供应商
PRELIMINARY
Am29DL400B
4 Megabit (512 K x 8-Bit/256 K x 16-Bit) CMOS 3.0 Volt-only, Simultaneous Operation Flash Memory
DISTINCTIVE CHARACTERISTICS
— Host system can program or erase in one bank,
then immediately and simultaneously read from
the other bank — Zero latency between read and write operations — Read-while-erase — Read-while-program
Single power supply operation
— 2.7 to 3.6 volt read and write operations for
battery-powered applications
Manufactured on 0.35 µm process technology
High performance
— Access times as fast as 70 ns
Low current consumption (typical values
at 5 MHz)
— 7 mA active read current — 21 mA active read-while-program or read-while-
erase current — 17 mA active program-while-erase-suspended
current — 200 nA in standby mode — 200 nA in automatic sleep mode — Standard t
transition from automatic sleep mode to active
mode
Flexible sector architecture
— Two 16 Kword, two 8 Kword, four 4 Kword, and
six 32 Kword sectors in word mode — Two 32 Kb yt e, two 16 Kbyte, four 8 Kbyte, and
six 64 Kbyte sectors in byte mode — Any combination of sectors can be erased — Supports full chip erase
Unlock Bypass Program Command
— Reduces overall progr amming time when
issuing multiple program command sequences
chip enable access time applies to
CE
Sector protection
— Hardware method of locking a sector to prevent
any program or erase operation within that sector
— Sectors can be locked in-system or via
programming equipment
— T emporary Sector Unprotect f eature allows code
changes in previously locked sectors
Top or bottom boot block configurations
available
Embedded Al gorithms
— Embedded Erase algorithm automatically
pre-programs and erases sectors or entire chip
— Embedded Program algorithm automatically
programs and verifies data at specified address
Minimum 1 million program/erase cyc les
guaranteed per sector
Package options
— 44-pin SO — 48-pin TSOP
Compatible with JEDEC standards
— Pinout and software compatible with
single-power-supply flash standard
— Superior inadvertent write protection
Data# Polling and Toggle Bits
— Provides a software method of detecting
program or erase cycle completion
Ready/Busy# output (RY/BY#)
— Hardware method for detecting program or
erase cycle completion
Erase Suspend/Erase Resume
— Suspends or resumes erasing sectors to allow
reading and programming in other sectors
— No need to suspend if sector is in the other bank
Hardware reset pin (RESET#)
— Hardware method of resetting the device to
reading array data
Publication# 21606 Rev: C Amendment/0 Issue Date: April 1998
PRELIMINARY
GENERAL DESCRIPTION
The Am29DL 400B is an 4 Mb it, 3.0 volt-only flas h memory device, organized as 262,144 words or 524,288 bytes. The device is offered in 44-pin SO and 48-pin TSOP packages. The word-wide (x16) data ap-
pears on DQ0–DQ15; the byte-wide (x8) data appears on DQ0–DQ7 . This device requir es only a single 3. 0 volt V operations. A standard EPROM programmer can also be used to program and erase the device.
The standard device offers access times of 70, 80, 90, and 120 ns, allowing high-speed microprocessors to operate without wait states. Standard control pins— chip enable (CE#), write enable (WE#), and out put en­able (OE#)—control read and write operations, and avoid bu s contention issues.
The device requires only a single 3. 0 v o lt po wer sup- ply for both read and write functions. Internally gener­ated and regulated voltages are provided for the program and erase operations.
supply to perform read , program, and erase
CC
Simultaneous Read/Write Operations with Zero Latency
The Simultaneous Read/Write architecture provides si­multaneous operation by dividing the memory space
into two banks. Bank 1 contains boot/parameter sec­tors, and Bank 2 consists of larger, code sectors of uni­form size. The device can improve overall system performance by allowing a host system to program or erase in one bank, then immediately and simultane­ously read from the other bank, with zer o la tenc y. This releases the system from waiting for the completion of program or erase operations.
Am29DL400B Features
The device offers complete compatibility with the
JEDEC single-power-supply Flash command set standard. Commands are written to the command
register using standard micr oprocessor write timings. Register contents serve as input to an internal state machine that controls the erase and programming circuitry. Write cycles also internally latch addresses and data needed for the programming and erase operations. Reading data out of the device is similar to reading from other Flash or EPROM devices.
Device programming occurs by executing the program command sequence. This initiates the Embedded Program algorithm—an internal algorithm that auto­matically times the program pulse widths and verifies proper cell margin. The Unlock Bypass mode facili­tates faster programming times by requir ing only two write cycles to program data instead of four.
Device erasure occurs by executing the erase com­mand sequenc e. This initiates the Embedded Erase algorithm—an in ternal algorithm that auto matically preprograms the arra y (if it is not already progr ammed) before e xecuting the er ase operation. During erase, the device automatically times the erase pulse widths and verifies proper cell margin.
The host system can detect whether a program or erase operation is complete by observing the RY/BY# pin, or by reading the DQ7 (Data# Polling) and DQ6 (toggle) status bits. After a program or erase cycle has been completed, the device automatically returns to reading array data.
The sector erase ar chitecture allo ws memo ry secto rs to be erased and reprogrammed without affecting the data contents of other sectors. The device is fully erased when shipped from the factory.
Hardware data protection measures include a low
detector that automatically in hibits write opera-
V
CC
tions during power transitions. The hardware sector protection feature disables both program and erase
operations in any combination of the sectors of mem­ory. This can be achieved in-system or via program­ming equipment.
The Erase Suspend feature enables the user to put erase on hold for any period of time to read data from, or program data to, any sector within that bank that is not selected for erasure. True background erase can thus be achieved. There is no need to suspend the erase operation if the read data is in the other bank.
The hardware RESET# pin term inates any operation in progress and resets the internal state machine to reading array dat a. The RESET# pin ma y be tied to the system reset circuitry. A system reset would thus also reset the device to reading array data, enab ling the sys­tem microprocessor to read the boot-up firmware from the Flash memory.
The device off ers two power-sa ving f eatures. When ad­dresses have been stable for a specified amount of time, the device enters the automatic sleep m ode. The system can also place the de vice into the standby mode. Power consumption is greatly reduced in both these modes.
AMD’s Flash technology combines years of Flash mem­ory manufacturin g experience to produce th e highest levels of quality, reliability, and cost effectiveness. The device electrically erases all bits within a sector simulta­neously via Fowler-Nordheim tunneling. The bytes are programmed one byte or word at a time using hot elec­tron injection.
2 Am29DL400B
PRELIMINARY
PRODUCT SELECTOR GUIDE
Family Part Number Am29DL400B Speed Options (Full Voltage Range: V
= 2.7 – 3.6 V) -70 -80 -90 -120
CC
Max Access Time (ns) 70 80 90 120 CE# Access (ns) 70 80 90 120 OE# Access (ns) 30 30 35 50
Note: See “AC Characteristics” for full specifications.
BLOCK DIAGRAM
V
CC
V
SS
A0–A17
A0–A17
RESET#
WE#
CE#
BYTE# DQ0–DQ15
A0–A17A0–A17
STATE
CONTROL
& COMMAND REGISTER
Upper Bank Address
Upper Bank
Y-Decoder
RY/BY#
X-Decoder
Status
Control
X-Decoder
OE# BYTE#
Latches and Control Logic
DQ0–DQ15
A0–A17
Lower Bank Address
DQ0–DQ15 DQ0–DQ15
Lower Bank
Y-Decoder
Latches and
Control Logic
OE# BYTE#
21606C-1
Am29DL400B 3
CONNECTION DIAGRAMS
PRELIMINARY
A15 A14 A13 A12 A11 A10
A9
A8 NC NC
WE#
RESET#
NC NC
RY/BY#
NC
A17
A7
A6
A5
A4
A3
A2
A1
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24
Standard TSOP
48 47 46 45 44 43 42 41 40 39 38 37 36 35 34 33 32 31 30 29 28 27 26 25
A16 BYTE# V
SS
DQ15/A-1 DQ7 DQ14 DQ6 DQ13 DQ5 DQ12 DQ4
V
CC
DQ11 DQ3 DQ10 DQ2 DQ9 DQ1 DQ8 DQ0 OE#
V
SS
CE# A0
A16
BYTE#
V
SS
DQ15/A-1
DQ7
DQ14
DQ6
DQ13
DQ5
DQ12
DQ4
V
CC
DQ11
DQ3
DQ10
DQ2 DQ9 DQ1 DQ8 DQ0
OE#
V
SS
CE#
A0
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24
Reverse TSOP
48 47 46 45 44 43 42 41 40 39 38 37 36 35 34 33 32 31 30 29 28 27 26 25
A15 A14
A13 A12 A11 A10 A9 A8 NC NC WE# RESET# NC NC RY/BY# NC A17 A7 A6 A5 A4 A3 A2 A1
21606C-2
4 Am29DL400B
CONNECTION DIAGRAMS
PRELIMINARY
RY/BY#
NC
A17
A7 A6 A5 A4 A3 A2 A1 A0
CE#
V
SS
OE# DQ0 DQ8 DQ1 DQ9 DQ2
DQ10
DQ3
DQ11
10 11 12 13 14 15 16 17 18 19 20 21 22
1 2 3 4 5 6 7 8 9
SO
44
RESET#
43
WE#
42
A8
41
A9
40
A10
39
A11
38
A12
37
A13
36
A14
35
A15
34
A16
33
BYTE#
32
V DQ15/A-1
31
DQ7
30
DQ14
29
DQ6
28
DQ13
27
DQ5
26
DQ12
25
DQ4
24
V
23
SS
CC
21606C-3
Am29DL400B 5
PRELIMINARY
PIN DESCRIPTION
A0-A17 = 18 Addresses DQ0-DQ14= 15 Data Inputs/Outputs DQ15/A-1 = DQ15 (Data Input/Output, word mode),
A-1 (LSB Address Input, byte mode) CE# = Chip Enable OE# = Output En able WE# = Write Enable BYTE# = Selects 8-bit or 16-bit mode RESET# = Hardware Reset Pin, Active Low RY/BY# = Ready/Busy Output
= 3.0 volt-only single power supply
V
CC
V
SS
NC = Pin Not Connected Internally
(see Product Selector Guide for speed options and voltage supply tolerances)
= Device Ground
LOGIC SYMBOL
18
A0–A17
CE# OE#
WE# RESET# BYTE# R Y/BY#
16 or 8
DQ0–DQ15
(A-1)
21606C-4
6 Am29DL400B
PRELIMINARY
ORDERING INFORMATION Standard Pr od ucts
AMD standard products are available in several packages and operating ranges. The order number (Valid Combination) is formed by a combination of the following:
Am29DL400B -70 E C
T
OPTIONAL PROCESSING
Blank = Standa rd Pro ces sin g B = Burn-in (Contact an AMD representative for more information)
TEMPERATURE RANGE
C=Commercial (0°C to +70°C) I = Industrial (–40°C to +85°C) E = Extended (–55°C to +125°C)
PACKAGE TYPE
E = 40-Pin Thin Small Outline Package (TSOP)
Standard Pinout (TS 040)
F = 40-Pin Thin Small Outline Package (TSOP)
Reverse Pinout (TSR040)
S = 44-Pin Small Outline Package (SO 044)
SPEED OPTION
See Product Selector Guide and Valid Combinations
BOOT CODE SECTOR ARCHITECTURE
T = Top Sector B = Bottom Sector
Am29DL400BT-70 Am29DL400BB-70
Am29DL400BT-80 Am29DL400BB-80
Am29DL400BT-90 Am29DL400BB-90
Am29DL400BT-120 Am29DL400BB-120
DEVICE NUMBER/DES CR IPT IO N
Am29DL400B 4 Megabit (512 K x 8-Bit/256 K x 16-Bit) CMOS Flash Memory
3.0 Volt-only Read, Program, and Erase
Valid Combinations
EC, EI, FC, FI,
EC, EI, EE, FC, FI, FE,
SC, SI, SE
SC, SI
Valid Combinations
Valid Combinations list configurations planned to be sup­ported in volume for this device. Consult the local AMD sales office to confir m availability of specifi c valid combinations to check on newly released combinations.
Am29DL400B 7
PRELIMINARY
DEVICE BUS OPERATIONS
This section describes the requirements and use of the device bus operations, which are initiated through the internal c ommand register. The command register it­self does not occupy any addressable memory loca­tion. The register is a latch used to store the commands, along with the address and data informa­tion needed to execute the command. The contents of
Table 1. Am29DL400B Device Bus Operations
Operation CE# OE # WE# R ESET#
Read L L H H A
Write L H L H A Standby Output Disable L H H H X High-Z High-Z High-Z
Reset X X X L X High-Z High-Z High-Z
Sector Protect (Note 2) L H L V
Sector Unprotect (Note 2) L H L V
Temporary Sector Unprotect X X X V
Legend:
L = Logic Low = V
Notes:
1. Addresses are A17:A0 in word mode (BYTE# = V
2. The sector protect and sector unprotect functions may also be implemented via programming equipment. See the “Sector
Protection/Unprotection” section.
, H = Logic High = VIH, VID = 12.0 ± 0.5 V, X = Don’t Care, AIN = Address In, DIN = Data In, D
IL
VCC ±
0.3 V
XX
VCC ±
0.3 V
), A17:A-1 in byte mode (BYTE# = VIL).
IH
the register serve as inputs to the internal state ma­chine. The state machine outputs dictate the function of the device. Table 1 lists the device bus operations, the inputs and control lev els t he y requ ire , and t he resulting output. The following subsections describe each of these operations in further detail.
DQ8–DQ15
Sector Address,
A6 = L, A1 = H,
ID
Sector Address, A6 = H, A1 = H,
ID
ID
Addresses
(Note 1)
IN IN
X High-Z High-Z High-Z
A0 = L
A0 = L
A
IN
DQ0–
DQ7
D
OUT
D
IN
D
IN
D
IN
D
IN
BYTE#
= V
IH
D
DQ8–DQ14 = High-Z,
OUT
D
IN
XX
XX
D
IN
DQ15 = A-1
BYTE#
= V
IL
High-Z
= Data Out
OUT
Word/Byte Configuration
The BYTE# pin controls whether the device data I/O pins operate in the byte or word configuration. If the BYTE# pin is set at logic ‘1’, the device is in word con-
figuration, DQ0-15 are active and controlled by CE# and OE# .
If the BYTE# pin is set at logic ‘0’, the device is in byte configuration, and only data I/O pins DQ0–DQ7 are ac­tive and controlled by CE# and OE#. The data I/O pins DQ8–DQ14 are tri-stated, and the DQ15 pin is used as an input for the LSB (A-1) address function.
Requirements for Reading Array Data
To read array data from the outputs, the system must drive the CE# and OE# pins to V control and selects the device. OE# is the output con­trol and gates arra y data to the output pins . WE# should remain at V
. The BYTE# pin determines whether the
IH
device outputs array data in words or bytes.
. CE# is the power
IL
The internal state machine is set for reading array data upon device po wer-u p , or after a hardw are res et. This ensure s that no sp urious alteration of the mem­ory content occurs dur ing the power transition. No command is nece ssary in this mode to ob tain array data. Standard microprocessor read cycles that as­sert valid addresses on the de vice addr ess inputs pro­duce valid d ata on th e de vice data outputs . Each ban k remains enabled for read access until the command register contents are altered.
See “Reading Array Data” for more information. Refer to the AC Read-Only Operations table for timing spec­ifications and to Figure 13 for the timing diagram. I
in the DC Characteristics table represents the active current specification for reading array data.
Writing Commands/Command Sequences
To write a command or command sequence (which in­cludes programming data to the device and erasing
8 Am29DL400B
CC1
PRELIMINARY
sectors of memory), the system must drive WE# and CE# to V
, and OE# to VIH.
IL
For program operations, the BYT E# pin determin es whether the device accepts program data in bytes or
words. Refer to “Word/Byte Configuration” for more in­formation.
The device features an Unlock Bypass mode to facili- tate faster programming. Once a bank enters the Unlock Bypass mode, only two write cycles are required to pro­gram a word or byte, instead of four. The “Byte/Word Program Command Sequence” section has details on programming data to the device using both standard and Unlock Bypass command sequences.
An erase operation can erase one sect or, multiple sec­tors, or the entire device. Tables 2 and 3 indicate the address space that each sector occupies. The device address space is divided into two banks: Bank 1 con­tains the boot/parameter sectors, and Bank 2 contains the larger, code sectors of uniform size. A “bank ad­dress” is the address bits required to uniquely select a bank. Similarly, a “sector address” is the address bits required to uniquely select a sector.
If the system writes the autoselect co mmand se­quence, the device enters the autoselect mode. The system can then read autoselect codes from the inter­nal register (which is separate from the memory array) on DQ7–DQ0. Standard read cycle timings apply in this mode. Refer to the Autoselect Mode and Autoselect Command Sequence sections for more information.
in the DC Characteristics table represents the ac-
I
CC2
tive current specification for the write mode. The AC Characteristics section contains timing specification ta­bles and timing diagrams for write operations.
Simultaneous Read/Write Operations with Zero Latency
This device is capable of readin g data from one bank of memory while programming or erasing in the other bank of memory. An erase operation may also be sus­pended to read from or pro gram to another location within the same bank (except the sector being erased).
Figure 19 shows how read and write cycles may be in­itiated for simultaneous operation with zero latency. I
CC6
and I
in the DC Characteristics table represent
CC7
the current specificatio ns for read-while-program and read-while-erase, respectively.
Standby Mode
When the system is not reading or writing to the device , it can place the device in the standby mode. In this mode, current consumption is gr eatly reduced, and the outputs are placed in the high impedance state, inde­pendent of the OE# input.
The device enters the CMOS standby mode when the CE# and RESET# pins are both held at V
CC
± 0.3 V.
(Note that this is a more restricted voltage range than
.) If CE# and RESET# ar e held at VIH, but not within
V
IH
± 0.3 V, the device will be in the standby mode , b ut
V
CC
the standby current will be grea ter. The device requires standard access time (t
) for read access when the
CE
device is in either of these standby modes, before it is ready to read data.
The device also enters the standb y mode when the RE­SET# pin is driven low. Refer to the next section, “RE­SET#: Hardware Reset Pin”.
If the device is deselected during erasure or program­ming, the device draws active current until the operation is completed.
in the DC Characteristics table represents the
I
CC3
standby current specification.
Automatic Sleep Mode
The automatic sleep mode minimizes Flash device energy consumption. The de vice automatically enables this mode when addresses remain stable f or t ns. The automatic sleep mode is independent of the CE#, WE#, and OE# control signals. Standard addres s access timings provide new data when addresses are changed. While in sleep mode, output data is latched and always available to the system. I
CC4
Characteristics table represents the automatic sleep mode current specification.
+ 30
ACC
in the DC
Am29DL400B 9
PRELIMINARY
RESET#: Hardware Reset Pin
The RESET# pin provides a har dware method of reset­ting the device to reading array data. When the RE­SET# pin is driven low for at least a period of t device immediately terminates any operation in progress, tristates all output pins, and ignores all read/ write commands for the duration of the RESET# pulse . The device also resets the internal state machine to reading array data. The operation that was interrupted should be reinitiated once the de vi ce is ready to accept another command sequence, to ensure data integrity.
Current is reduced for the duration of the RESET# pulse. When RESET# is held at V
draws CMOS standby current (I
but not within VSS±0.3 V, the standby current will
at V
IL
±0.3 V, the device
SS
). If RESET# is held
CC4
be greater. The RESET# pin may be tied to the system reset cir-
cuitry. A system reset would thus also reset the Flash
RP
, the
memory, enabling the system to read the boot-up firmware from the Flash memory.
If RESET# is asserted during a program or erase oper­ation, the RY/BY# pin remains a “0” (busy) until the in­ternal reset operatio n is complete, which requires a time of t
(during Embedded Algorithms). The
READY
system can thus monitor RY/BY# to determine whether the reset operation is complete. If RESET# is asserted when a program or erase operation is not executing (RY/BY# pin is “1”), the reset operation is completed within a time of t rithms). The system can read data t SET# pin returns to V
(not during Embe dded Algo-
READY
.
IH
RH
after the RE-
Refer to the AC Characteristics tables for RESET# pa­rameters and to Figure 14 for the timing diagram.
Output Disable Mode
When the OE# input is at VIH, output from the device is disabled. The output pins are placed in t he high imped­ance state.
10 Am29DL400B
PRELIMINARY
Bank Sector
SA0 0 0 0 X X X 64/32 00000h–0FFFFh 00000h–07FFFh SA1 0 0 1 X X X 64/32 10000h–1FFFFh 08000h–0FFFFh SA2 0 1 0 X X X 64/32 20000h–2FFFFh 10000h–17FFFh
Bank 2
SA3 0 1 1 X X X 64/32 30000h–3FFFFh 18000h–1FFFFh SA4 1 0 0 X X X 64/32 40000h–4FFFFh 20000h–27FFFh SA5 1 0 1 X X X 64/32 50000h–5FFFFh 28000h–2FFFFh SA6 1 1 0 0 0 X 16/8 60000h–63FFFh 30000h–31FFFh
SA7 1 1 0
SA8 1 1 0 1 1 0 8/4 6C000h–6DFFFh 36000h–36FFFh SA9 1 1 0 1 1 1 8/4 6E000h–6FFFFh 37000h–37FFFh
Bank 1
SA10 1 1 1 0 0 0 8/4 70000h–71FFFh 38000h–38FFFh
Bank
Address
Table 2.
Sector Address
A15 A14 A13 A12A17 A16
Am29DL400BT Top Boot Sector Architecture
01X 10X
Sector Size
(Kbytes/ Kwords)
32/16 64000h–6BFFFh 32000h–35FFFh
(x8)
Address Range
(x16)
Address Range
SA11 1 1 1 0 0 1 8/4 72000h–73FFFh 39000h–39FFFh
SA12 1 1 1
SA13 1 1 1 1 1 X 16/8 7C000h–7FFFFh 3E000h–3FFFFh
01X
32/16 74000h–7BFFFh 3A000h–3DFFFh
10X
Note: The address range is A17:A-1 if in byte mode (BYTE# = VIL). The address range is A17:A0 if in word mode (BYTE# = VIH).
Am29DL400B 11
Bank Sector
SA13 1 1 1 X X X 64/32 70000h–7FFFFh 38000h–3FFFFh SA12 1 1 0 X X X 64/32 60000h–6FFFFh 30000h–37FFFh
Bank
Address
PRELIMINARY
Tab le 3. Am29DL400BB Bottom Boot Sector Architecture
Sector Address
Sector Size
A15 A14 A13 A12A17 A16
(Kbytes/Kwords)
(x8)
Address Range
(x16)
Address Range
Bank 2
Bank 1
Note: The address range is A17:A-1 if in byte mode (BYTE# = VIL). The address range is A17:A0 if in word mode (BYTE# = VIH).
Autoselect Mode
The autoselect mode provides manufacturer and de­vice identification, and sector protection verification,
through identifier codes output on DQ7–DQ0. This mode is primarily intended for progr amming equipment to automatically match a device to be progr ammed with its correspondi ng programming al gorithm. However, the autoselect codes can also be accessed in-system through the command register.
When using programming equipment, the autoselect mode requires V A9. Address pins A6, A1, and A0 must be as shown in
SA11 1 0 1 X X X 64/32 50000h–5FFFFh 28000h–2FFFFh SA10 1 0 0 X X X 64/32 40000h–4FFFFh 20000h–27FFFh
SA9 0 1 1 X X X 64/32 30000h–3FFFFh 18000h–1FFFFh SA8 0 1 0 X X X 64/32 20000h–2FFFFh 10000h–17FFFh SA7 0 0 1 1 1 X 16/8 1C000h–1FFFFh 0E000h–0FFFFh
SA6 0 0 1
SA5 0 0 1 0 0 1 8/4 12000h–13FFFh 09000h–09FFFh SA4 0 0 1 0 0 0 8/4 10000h–11FFFh 08000h–08FFFh SA3 0 0 0 1 1 1 8/4 0E000h–0FFFFh 07000h–07FFFh SA2 0 0 0 1 1 0 8/4 0C000h–0DFFFh 06000h–06FFFh
SA1 0 0 0
SA0 0 0 0 0 0 X 16/8 00000h–03FFFh 00000h–01FFFh
10X
32/16 14000h–1BFFFh 0A000h–0DFFFh
01X
10X
32/16 04000h–0BFFFh 02000h–05FFFh
01X
Table 4. In a ddition, when verifying sector protection, the sector address must appear on the appropriate highest order address bits (see Tables 2 and 3). Table 4 shows the remaining address bits that are don’t care . When all necessary bits have been set as required, the programming equipment may then read the corre­sponding identifier code on DQ7-DQ0.
To access the autoselect codes in-system, the host system can issue the autoselect command via the command register, as shown in Table 5. This method
(11.5 V to 12.5 V) on address pin
ID
does not require V Sequence section for more information.
. Refer to the Autoselect Command
ID
12 Am29DL400B
PRELIMINARY
Table 4. Am29DL400B Autoselect Codes (High V o ltage Method)
Description Mode CE# OE# WE#
A17
to
A12
A11
to
A10 A9
A8
to
A7 A6
A5
to
A2 A1 A0
DQ8
to
DQ15
DQ7
to
DQ0
Manufacturer ID: AMD L L H BA X V Device ID:
Am29DL400B (Top Boot Block)
Device ID: Am29DL400B (Bottom Boot Block)
Sector Protection Verification L L H SA X V
Note: L = Logic Low = VIL, H = Logic High = VIH, BA = Bank Address, SA = Sector Address, X = Don’t care.
Word L L H
BA X V
Byte L L H X 0C
Word L L H
BA X V
Byte L L H X 0F
Sector Protection/Unprotection
The hardware sector protection feature disables both program and erase operations in any sect or. The hard­ware sector unprotection feature re-enables both pro­gram and erase operations in previously protected sectors. Sector protection/unprotecti on can be imple­mented via two methods.
The primary method requires V
on the RESET# pin
ID
XLXLL X 01h
ID
22h 0C
XLXLH
ID
22h 0F
XLXLH
ID
XLXHL
ID
SET# pin to V
(11.5 V – 12.5 V). During this mode,
ID
formerly protected sectors can be programmed or erased by selecting the sector addresses. Once V removed from the RESET# pin, all the previously pro­tected sectors are protected again. Figure 1 shows the algorithm, and Figur e 23 shows the timing diagrams, for this feature.
only, and can be implemented either in-system or via programming equipment. Figure 2 shows the algo­rithms and Figure 24 shows the timing diagram. This
START
method uses standard m icroprocessor bus cycle tim­ing. For sector unprotect, all unprotected sectors must first be protected prior to the first sector unpro tect write cycle.
RESET# = V
(Note 1)
ID
X
X
01h
(protected)
00h
(unprotected)
ID
is
The alternate method intended on ly for programming equipment requires V
on address pin A9 and OE#.
ID
This method is compatible with programmer routines written for earlier 3.0 v olt-only AMD flash de vices. Pub­lication number 22145 contains further details; contact an AMD representative to request a copy.
The device is shipped with all sectors unprotected. AMD offers the option of programming and protecting sectors at its factory prior to shipping the device
through AMD’s ExpressFlash™ Servic e. Contact an AMD representative for details.
It is possible to determine whether a sector is protected or unprotected. See the Autoselect Mode section for details.
Temporary Sector Unprotect
This feature allows temporary unpr otection of previ­ously protected sectors to change data in-system. The Sector Unprotect mode is activated by setting the RE-
Am29DL400B 13
Perform Erase or
Program Operations
RESET# = V
Temporary Sector
Unprotect Completed
(Note 2)
Notes:
1. All protected sectors unprotected.
2. All previously protected sectors are protected once again.
IH
21606C-5
Figure 1. Temporary Sector Unprotect Operation
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