Alpha & Omega Semiconductor AOD4184, AOD4184L Service Manual

AOS Semiconductor
Product Reliability Report

AOD4184/AOD4184L,

rev A

Plastic Encapsulated Device

ALPHA & OMEGA Semiconductor, Inc

495 Mercury Drive
Sunnyvale, CA 94085
U.S.

Tel: [phone] www.aosmd.com

Apr 15, 2008

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This AOS product reliability report summarizes the qualification result for AOD4184. Accelerated
environmental tests are performed on a specific sample size, and then followed by electrical test
at end point. Review of final electrical test result confirms that AOD4184 passes AOS quality and
reliability requirements. The released product will be categorized by the process family and be
monitored on a quarterly basis for continuously improving the product quality.

Table of Contents:

I. Product Description
II. Package and Die information
III. Environmental Stress Test Summary and Result
IV. Reliability Evaluation
V. Quality Assurance Information

I. Product Description:

The AOD4184/L uses advanced trench technology and design to provide excellent R
low gate charge. With the excellent thermal resistance of the DPAK package, this device is well
suited for high current load applications.

-RoHS Compliant

-AOD4184L is Halogen Free

Absolute Maximum Ratings T
Parameter Symbol Maximum Units

Drain-Source Voltage VDS 40 V

Gate-Source Voltage VGS ±20 V

Continuous Drain
Current

TA=25°C 50

=100°C

T

A

Pulsed Drain Current IDM 120

TA=25°C 50

Power Dissipation

T

=100°C

A

TA=25°C 2.3

Power Dissipation

T

=70°C

A

Junction and Storage
Temperature Range T

Thermal Characteristics
Parameter Symbol Typ Max Units

Maximum Junction-to­Ambient
Maximum Junction-to­Ambient

Maximum Junction-to-Lead

=25°C unless otherwise noted

A

I

D

P

D

P

DSM

, T

-55 to 175 °C

J

STG

T ≤ 10s

R

Steady-

θJA

State

Steady-

R

State

θJL

40

25

1.45

18 22 °C/W

44 55 °C/W

2.4 3 °C/W

with

DS(ON)

A

W

W

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