
March 2004
3.3V 128K X 8 CMOS SRAM (Center power and ground)
Features
• Industrial and commercial temperatures
• Organization: 131,072 x 8 bits
• High speed
- 10/12/15/20 ns address access time
- 5, 6, 7, 8 ns output enable access time
• Low power consumption: ACTIVE
- 252 mW / max @ 10 ns
• Low power consumption: STANDBY
- 18 mW / max CMOS
• 6 T 0.18 u CMOS technology
Logic block diagram
V
CC
GND
Input buffer
A0
A1
A2
A3
A4
A5
A6
A7
A8
512 x 256 x 8
Array
(1,048,576)
Row decoder
Column decoder
Sense amp
Control
circuit
WE
OE
CE
I/O7
I/O0
AS7C31025B
®
• Easy memory expansion with
• Center power and ground
• TTL/LVTTL-compatible, three-state I/O
• JEDEC-standard packages
- 32-pin, 300 mil SOJ
- 32-pin, 400 mil SOJ
• ESD protection ≥ 2000 volts
• Latch-up current ≥ 200 mA
Pin arrangement
32-pin SOJ (300 mil)
32-pin SOJ (400 mil)
1
A0
2
A1
3
A2
4
A3
5
CE
WE
6
7
8
CC
9
10
11
12
13
A4
14
A5
15
A6
16
A7
I/O0
I/O1
V
GND
I/O2
I/O3
CE, OE
A16
32
A15
31
A14
30
A13
29
28
OE
I/O7
27
26
I/O6
25
GND
V
24
CC
23
I/O5
AS7C31025B
22
I/O4
21
A12
A11
20
19
A10
A9
18
17
A8
inputs
A9
A1 1
A10
A12
A13
A14
A15
A16
Selection guide
-10 -12 -15 -20 Unit
Maximum address access time 10 12 15 20 ns
Maximum output enable access time 5678ns
Maximum operating current 70 65 60 55 mA
Maximum CMOS standby current 5555mA
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Copyright © Alliance Semiconductor. All rights reserved.

AS7C31025B
®
Functional description
The AS7C31025B is a high-performance CMOS 1,048,576-bit Static Random Access Memory (SRAM) device organized as 131,072 x 8
bits. It is designed for memory applications where fast data access, low power, and simple interfa cing are desired.
Equal address access and cycle times (t
high-performance applications. The chip enable input CE permits easy memory and expansion with multiple-bank memory systems.
When CE is high the device enters standby mode. A write cycle is accomplished by asserting write enable (WE) and chip enable (CE). Data
on the input pins I/O0 through I/O7 is written on the rising edge of WE (write cycle 1) or CE (write cycle 2). To avoid bus contention,
external devices should drive I/O pins only after outputs have been disabled with output enable (
A read cycle is accomplished by asserting output enable (OE) and chip enable (CE), with write enable (WE) high. The chip drives I/O pins
with the data word referenced by the input address. When either chip enable or output enable is inactive or write enable is active, output
drivers stay in high-impedance mode.
All chip inputs and outputs are TTL-compatible, and operation is from a single 3.3 V supply. The AS7C31025B is packaged in common
industry standard packages.
Absolute maximum ratings
Parameter Symbol Min Max Unit
Voltage on V
Voltage on any pin relative to GND V
Power dissipation P
Storage temperature (plastic) T
Ambient temperature with V
DC current into outputs (low) I
NOTE: Stresses greater than those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions outside those indicated in the operational sections of this specification is not implied. Exposure
to absolute maximum rating conditions for extended periods may affect reliability.
relative to GND V
CC
CC
, tRC, tWC) of 10/12/15/20 ns with output enable access times (tOE) of 5, 6, 7, 8 ns are ideal for
AA
OE
applied T
t1
t2
D
stg
bias
OUT
) or write enable (
–0.50 +5.0 V
–0.50 VCC + 0.5 V
–1.0W
–65 +150
–55 +125
–20mA
WE
o
o
).
C
C
Truth table
CE WE OE
H X X High Z Standby (I
L H H High Z Output disable (I
LHL D
LLX D
Key: X = don’t care, L = low, H = high.
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Data Mode
SB
OUT
IN
Read (ICC)
Write (ICC)
, I
SB1
CC
)
)

Recommended operating conditions
Parameter Symbol Min Nominal Max Unit
Supply voltage V
Input voltage
Ambient operating temperature
V
= -1.0V for pulse width less than 5ns
IL
V
+ 1.5V for pulse width less than 5ns
IH = VCC
AS7C31025B
®
CC
V
IH
V
IL
T
A
T
A
3.0 3.3 3.6 V
2.0 – VCC + 0.5 V
–0.5 – 0.8 V
0–70o C
–40 – 85
o
C
DC operating characteristics (over the operating range)
-10 -12 -15 -20
Parameter Sym Test conditions
Input leakage
current
Output leakage
current
Operating power
supply current
Standby power
supply current
Output voltage
Capacitance (f = 1 MHz, T
Input capacitance C
I/O capacitance C
| I
|
VCC = Max, VIN = GND to V
LI
| I
|
LO
VCC = Max, CE = VIH,
V
= GND to V
out
CC
–1–1–1–1µA
CC
–1–1–1–1µA
VCC = Max
I
CC
CE
≤ VIL, f = f
I
OUT
= 0 mA
Max
,
–70–65–60–55
VCC = Max
I
SB
1
I
V
SB1
CE
≥ VIH, f = f
Max
VCC = Max, CE ≥ VCC–0.2 V,
≤ 0.2 V or VIN ≥ VCC –0.2 V,
IN
–30–25–20–20
– 5 – 5 – 5 – 5
f = 0
V
OL
V
OH
IOL = 8 mA, VCC = Min
IOH = –4 mA, VCC = Min
= 25o C, VCC = NOMINAL)
a
–0.4–0.4–0.4–0.4V
2.4–2.4–2.4–2.4– V
2
Parameter Symbol Signals Test conditions Max Unit
IN
I/O
A, CE, WE,
I/O VIN = V
1
OE
VIN = 0 V 5 pF
= 0 V 7 pF
OUT
UnitMin Max Min Max Min Max Min Max
mA
mA
mA
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