The AS7C1024B is a high performance CMOS 1,048,576-bit Static Random Access Memory (SRAM) device organized as 131,072 words x 8
bits. It is designed for memory applications where fast data access, low power, and simple interfacing are desired.
Equal address access and cycle times (tAA, tRC, tWC) of 10/12/15/20 ns with output enable access times (tOE) of 5/6/7/8 ns are ideal for high
performance applications. Active high and low chip enables (CE1
When CE1
static, then full standby power is reached (I
conditions.
A write cycle is accomplished by asserting write enable (WE) and both chip enables (CE1, CE2). Data on the input pins I/O0 through I/O7 is
written on the rising edge of WE (write cycle 1) or the active-to-inactive edge of CE1 or CE2 (write cycle 2). To avoid bus contention, external
devices should drive I/O pins only after outputs have been disabled with output enable (OE) or write enable (WE).
A read cycle is accomplished by asserting output enable (OE) and both chip enables (CE1, CE2), with write enable (WE) high. The chips drive I/
O pins with the data word referenced by the input address. When either chip enable is inactive, output enable is inactive, or write enable is active,
output drivers stay in high-impedance mode.
is high or CE2 is low, the devices enter standby mode. If inputs are still toggling, the device will consume ISB power. If the bus is
). For example, the AS7C1024B is guaranteed not to exceed 55 mW under nominal full standby
SB1
, CE2) permit easy memory expansion with multiple-bank systems.
Absolute maximum ratings
ParameterSymbolMinMaxUnit
Voltage on V
Voltage on any pin relative to GND V
Power dissipationP
Storage temperature (plastic)T
Ambient temperature with V
DC current into outputs (low)I
Note: Stresses greater than those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only and functional
operation of the device at these or any other conditions outside those indicated in the operational sections of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect reliability.
relative to GNDV
CC
appliedT
CC
t1
t2
D
stg
bias
OUT
–0.50+7.0V
–0.50VCC +0.50V
–1.0W
–65+150°C
–55+125°C
–20mA
Truth table
CE1
HXXXHigh ZStandby (I
XLXXHigh ZStandby (I
LHHHHigh ZOutput disable (I
LHHLD
LHLXD
Key: X = don’t care, L = low, H = high
CE2
WEOE
DataMode
SB
SB
OUT
IN
Read (ICC)
Write (
ICC
, I
, I
SB1
SB1
)
CC
)
)
)
3/26/04, v 1.2Alliance Memory IncP. 2 of 9
Page 3
Recommended operating conditions
ParameterSymbolMinNominalMaxUnit
Supply VoltageV
Input Voltage
Ambient operating
temperature
VIL min = -1.0V for pulse width less than 5ns
VIH max = VCC+2.0V for pulse width less than 5ns.
commercialT
industrialT
AS7C1024B
®
CC
V
IH
V
IL
A
A
4.55.05.5V
2.2-VCC + 0.5V
–0.5–0.8V
0–70°C
–40–85°C
DC operating characteristics (over the operating range)
-10-12-15-20
ParameterSymTest conditions
Input leakage
current
Output leakage
current
Operating power
supply current
Standby power
supply current
Output voltage
|I
|VCC = Max, VIN = GND to V
LI
V
= Max, CE1 = VIH or
|
|I
LO
CC
CE2 = V
, V
IL
OUT
VCC = Max, CE1 ≤ VIL,
I
CC
I
SB
CE2 ≥ V
I
OUT
IH
= 0 mA
VCC = Max, CE1 ≥ VIH and/or
CE2 ≤ V
IL
VCC = Max, CE1 ≥ VCC–0.2V
I
V
V
SB1
OL
OH
and/or CE2 ≤ 0.2V
V
≤ 0.2V or
IN
≥ VCC – 0.2V, f = 0
V
IN
IOL = 8 mA, VCC = Min-0.4–0.4–0.4–0.4
IOH = –4 mA, VCC = Min2.4-2.4–2.4–2.4–
= GND to V
, f = f
, f = f
Max
Max
,
MinMaxMinMaxMinMaxMinMax
CC
-1–1–1–1µA
-1–1–1–1µA
CC
-110–100–90–80mA
-50–45–45–40
-10–10–10–10
Capacitance (f = 1 MHz, Ta = 25 °C, VCC = NOMINAL)
1
Unit
mA
V
2
ParameterSymbolSignalsTe st c ond iti onsMaxUnit
Input capacitanceC
I/O capacitanceC
3/26/04, v 1.2Alliance Memory Inc.P. 3 of 9
IN
I/O
A, CE1, CE2, WE, OEVIN = 0V5pF
I/OVIN = V
= 0V7pF
OUT
Page 4
AS7C1024B
®
Read cycle (over the operating range)
ParameterSymbol
Read cycle timet
Address access timet
Chip enable (CE1
) access timet
Chip enable (CE2) access timet
Output enable (OE
) access timet
Output hold from address change t
CE1
Low to output in low Zt
CE2 High to output in low Zt
CE1
Low to output in high Zt
CE2 Low to output in high Zt
OE
Low to output in low Zt
OE
High to output in high Zt
Power up timet
Power down timet
RC
AA
ACE1
ACE2
OE
OH
CLZ1
CLZ2
CHZ1
CHZ2
OLZ
OHZ
PU
PD
Key to switching waveforms
3,9,12
-10-12-15-20
Unit NotesMin Max Min Max Min Max Min Max
10- 12–15–20–ns
-10–12–15–20ns 3
-10–12–15–20ns3, 12
-10–12–15–20ns3, 12
-5–6–7–8ns
3-3–3–3–ns 5
3-3–3–3–ns4, 5, 12
3-3–3–3–ns4, 5, 12
-4–5–6–7ns4, 5, 12
-4–5–6–7ns4, 5, 12
0-0–0–0–ns4, 5
–4–5–6–7ns4, 5
0-0–0–0–ns4, 5, 12
–10–12–15–20ns4, 5, 12
Undefined / don’t careFalling inputRising input
OLZ
t
RC1
3,6,7,9,12
t
RC
Data valid
3,6,8,9,12
Data valid
t
OH
t
OHZ
t
, t
CHZ1
CHZ2
t
PD
Read waveform 1 (address controlled)
Address
D
OUT
t
AA
Read waveform 2 (CE1, CE2, and OE controlled)
CE1
CE2
OE
t
D
OUT
Current
supply
3/26/04, v 1.2Alliance Memory IncP. 4 of 9
ACE1, tACE2
t
, t
CLZ1
t
PU
CLZ2
t
OE
t
50%50%
I
CC
I
SB
Page 5
AS7C1024B
®
Write cycle (over the operating range)
ParameterSymbol
Write cycle timet
Chip enable (CE1
) to write endt
Chip enable (CE2) to write endt
Address setup to write endt
Address setup timet
Write pulse widtht
Write recovery timet
Address hold from end of writet
Data valid to write endt
Data hold timet
Write enable to output in high Zt
Output active from write endt
WC
CW1
CW2
AW
AS
WP
WR
AH
DW
DH
WZ
OW
11, 12
-10-12-15-20
UnitNotesMin Max MinMaxMin Max Min Max
10-12–15–20–ns
8-9–10–12–ns12
8-9–10–12–ns12
8-9–10–12–ns
00–0–0–ns12
78–9–12–ns
0-0 – 0–0– ns
0-0 – 0–0– ns
56–8–10–ns
00–0–0–ns4, 5
-5–6–7–8ns4, 5
1-1–1–2–ns4, 5
Write waveform 1 (WE controlled)
Address
WE
t
AS
D
IN
D
OUT
10,11,12
t
WZ
t
AW
t
WC
t
WP
t
DW
Data valid
t
OW
t
WR
t
t
AH
DH
3/26/04, v 1.2Alliance Memory Inc.P. 5 of 9
Page 6
AS7C1024B
®
Write waveform 2 (CE1 and CE2 controlled)
t
WC
t
AW
Address
t
t
AS
CW1
, t
CW2
CE1
CE2
t
WP
D
WE
D
OUT
t
WZ
IN
AC test conditions
– Output load: see Figure B.
– Input pulse level: GND to 3.5V. See Figure A.
– Input rise and fall times: 2 ns. See Figure A.
– Input and output timing reference levels: 1.5V.
D
+3.5V
GND
90%
10%
2 ns
Figure A: Input pulse
90%
10%
OUT
255
Figure B: 5V Output load
10,11,12
Ω
t
DW
Data valid
+5V
480
Ω
13
C
GND
t
t
WR
AH
t
DH
Thevenin equivalent:
168
Ω
D
OUT
+1.728V
Notes
1During VCC power-up, a pull-up resistor to VCC on CE1 is required to meet I
2This parameter is sampled and not 100% tested.
3For test conditions, see AC Test Conditions, Figures A and B.
and t
4t
CLZ
5This parameter is guaranteed, but not 100% tested.
is high for read cycle.
6WE
7CE1
and OE are low and CE2 is high for read cycle.
8Address valid prior to or coincident with CE1
9All read cycle timings are referenced from the last valid address to the first transitioning address.
10 N/A
11 All write cycle timings are referenced from the last valid address to the first transitioning address.
12 CE1
and CE2 have identical timing.
13 C = 30 pF, except all high Z and low Z parameters where C = 5 pF.
are specified with CL = 5pF, as in Figure C. Transition is measured ±500 mV from steady-state voltage.
CHZ
transition Low.
3/26/04, v 1.2Alliance Memory Inc.P. 6 of 9
specification.
SB
Page 7
Package dimensions
AS7C1024B
®
Pin 1
A2
D
e
32-pin SOJ 300
mil
32-pin SOJ 400
mil
MinMaxMinMax
E2
E1
A0.1280.1450.1320.146
A10.025-0.025-
B
c
E
A1
b
Seating
Plane
A20.0950.1050.1050.115
B0.0260.0320.0260.032
A
b0.0160.0200.0150.020
c0.0070.0100.0070.013
D0.8200.8300.8200.830
E0.2550.2750.3540.378
E10.2950.3050.3950.405
E20.3300.3400.4350.445
e0.050 BSC0.050 BSC
b
e
32-pin TSOP 8×20 mm
MinMax
α
A–1.20
A10.050.15
c
D
L
Hd
A1AA2
A20.951.05
b0.170.27
c0.100.21
D18.3018.50
pin 1pin 32
e0.50 nominal
E7.908.10
Hd19.8020.20
L0.500.70
E
pin 16pin 17
α0°5°
3/26/04, v 1.2Alliance Memory IncP. 7 of 9
Page 8
®
Ordering codes
Package \ Access
time
Plastic SOJ, 300 mil
Plastic SOJ, 400 mil
TSOP1 8×20 mm
sTSOP1
8 x 13.4mm
Note: Add suffix ‘N’ to the above part number for LEAD FREE PARTS (Ex:AS7C1024B-10TCN)
Alliance. All other brand and product names may be the trademarks of their respective companies. Alliance reserves the right to make changes to this
document and its products at any time without notice. Alliance assumes no responsibility for any errors that may appear in this document. The data
contained herein represents Alliance's best data and/or estimates at the time of issuance. Alliance reserves the right to change or correct this data at any
time, without notice. If the product described herein is under development, significant changes to these specifications are possible. The information in
this product data sheet is intended to be general descriptive information for potential customers and users, and is not intended to operate as, or provide,
any guarantee or warrantee to any user or customer. Alliance does not assume any responsibility or liability arising out of the application or use of any
product described herein, and disclaims any express or implied warranties related to the sale and/or use of Alliance products including liability or
warranties related to fitness for a particular purpose, merchantability, or infringement of any intellectual property rights, except as express agreed to in
Alliance's Terms and Conditions of Sale (which are available from Alliance). All sales of Alliance products are made exclusively according to Alliance's
Terms and Conditions of Sale. The purchase of products from Alliance does not convey a license under any patent rights, copyrights; mask works rights,
trademarks, or any other intellectual property rights of Alliance or third parties. Alliance does not authorize its products for use as critical components in
life-supporting systems where a malfunction or failure may reasonably be expected to result in significant injury to the user, and the inclusion of
Alliance products in such life-supporting systems implies that the manufacturer assumes all risk of such use and agrees to indemnify Alliance against all
claims arising from such use.
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