Agilent Technologies
High-Resolution LXI Digitizers
L4532A 2-channel, 20 MSa/s, 16-bit, ± 250 V
L4534A 4-channel, 20 MSa/s, 16-bit, ± 250 V
Key Features
• Up to 20 M samples per second sample rate
• 16 bit ADC resolution
• 2 or 4 simultaneously sampled channels
• ± 250 mV to ±250 V isolated inputs
• AC or DC coupling
• On-board measurements
• Built-in web interface
• 1U, full-rack standalone instrument
• Gigabit LAN and USB 2.0 interfaces
• Standard 32 MSa/ch or extended 128 MSa/ch segmented memory
• LXI Class C compliant
High-Resolution LXI Digitizers
The Agilent Technologies L4532A and
L4534A are high-resolution, standalone LXI digitizers. They offer 2 or 4
channels of simultaneous sampling
at up to 20 MSa/s, with 16 bits of
resolution. Inputs are isolated and
can measure up to ±250 V to handle
your most demanding applications.
Input channels with the ability to
measure waveforms up to 250 V
are ideal for analyzing high-voltage
and transient signals as seen in
automotive and aerospace defense
applications. Most oscilloscopes
and PXI digitizers have a maximum
input range less than 40 Vpk. The
L4532A and L4534A can make
measurements that other products
cannot. For example, since the ±250
V input range is combined with 16-bit
analog-to-digital converters (ADCs),
the isolated front-end and low input
offset allows a small voltage, such as
a 250 mV, and a larger voltage, such
as 250 V, to be measured
at the same time.
The digitizers are LXI Class C
compliant providing the benefits of
an Ethernet connection, standard
software drivers, an enhanced web
interface, and more. Multiple vendors
support the LXI standard making it
easy to integrate the digitizers into
your test system.
Save test time and money with
high-performance analog inputs
The digitizer’s individually isolated
channel inputs have been designed
for high performance with an A/D
converter per channel to ensure the
signals you measure are accurately
digitized without distortion or additional noise. Channel input range
is configurable from ±250 mV up to
±250 V, with a floating voltage up to
±40 V to accommodate differential
waveform acquisition. You can also
choose to enable 2 MHz and 200 KHz
input filters to your digitizer. The high
voltage input, isolated inputs, and
selection of noise filters reduces the
need to add expensive input signal
attenuation and signal conditioning
circuitry, saving test development
time and money.
The 16-bit dynamic range combined
with the ±250 V range is an advantage
for test throughput since there is no
need to make repeated “passes” with
different range settings to capture
both the smaller waveform details
and larger waveform signals.
Minimize post processing
with onboard measurements
The L4532A and L4534A digitizers
include a collection of on-board
“scope-like” measurements such as
Vmin/Vmax, Vp-p, frequency, rise/fall
time, and more that can be applied
to a selected portion or the overall
waveform. There is no need for post
processing data to get the measurement results you need, saving time
and minimizing the need to transfer
and store large amounts of data. The
waveform measurements are made
within a user-selected region of the
digitized waveform and include their
time position. The following measurements are supported by the digitizers:
• V min/V max
• VPP
• V avg/V rms
• V top/V base
• Rise/fall time
• Overshoot/preshoot
• Frequency/period
• Pulse width
• Duty cycle
2
Easy-to-use graphical web
interface
Connect to the digitizers’ graphical
web interface either by direct LAN
or the Internet with your PC’s
Java-enabled web browser (such
as Internet Explorer). Enter the IP
address displayed on the front of the
digitizer into the web browser address
and you will be able to configure,
acquire, and display waveforms and
measurements without programming.
The web interface simultaneously
displays the channel signals and
measurements, and provides an
instrument command log that is very
useful during development or debug.
The digitizer’s web interface is easy
to use, even from remote locations.
The Setup Digitizer window allows
you to select the configuration including sample rate, voltage range, record
size, trigger source, and trigger mode.
The Acquire Data window displays
the waveforms and measurements.
The waveform display has a similar
look and feel to an oscilloscope with
adjustable vertical and horizontal
views. Markers allow you to select
a portion of the waveform to make
measurements on or view the waveform more closely.
The web interface records and
displays the digitizers’ instrument
commands you select in the Setup
window. The list of instrument commands can be copied and pasted
directly into your test program to
expedite your test development.
Deep memory for fl exible data
acquisition
• The L4532A and L4534A digitizers
include a deep memory option (up
to 128 MSa per channel) providing
flexible waveform data acquisition..
The waveform data collected is
determined by the user and digitizer configuration including sample
rate, segmented memory, flexible
trigger system, and data reduction
feature for data transferred from
memory.
• Segmented memory is used for
sampling multiple bursts of readings. Memory can be segmented in
1 to 1024 records. Multiple records
allow multiple bursts of data to be
digitized without the need to re-initialize between bursts. The record
size is configured by selecting the
total number of samples including
pre-trigger samples.
• A flexible trigger system allows
you to capture only the data you
need. Trigger events are used to
initialize the digitization of data for
each record. Configurable Trigger
Delay and Trigger Holdoff allow
you to better define where record
data is collected relative to the
trigger event.
• When retrieving digitized data
users can take advantage of the
built-in data reduction feature. This
allows you to reduce the amount
of unnecessary data through data
decimation on select channels that
were sampled at a faster rate than
necessary.
3
Confi gurable sample rates
Based on a 20 Mhz sample clock,
the L4532A and L4534A allow you
to select the desired sample rate on
each channel. The sample rate is
configurable from 1 KS/s to 20 MSa/s.
External clock (reference clock
10 MHz)
The Clock In/Out allows synchronizing system clocks of multiple instruments. When used with the external
trigger, the synchronized instrument
clocks allow multiple digitizers to
sample in a synchronized lock step.
Flexible triggering
The digitizer’s flexible trigger capability allows you to digitize samples in
close proximity to the data of interest,
reducing the overall data that needs
to be digitized. Each trigger event
causes completion of the current
record’s post trigger samples. The
configurable Trigger Delay feature
allows precise positioning of acquisition relative to the trigger event,
while the Trigger Hold-off feature
allows avoiding false triggers.
The External TTL trigger output
enables L4532A and L4534A digitizers to synchronize to other devices.
Multiple L4532A and L4534A digitizers can be synchronized for higher
channel count. The digitizers provide
an Arm-Trigger model you can use
to pace groups of records (groups of
triggers) by gating them through Arm
events that are different than trigger
events. The Fast Re-arm feature
reduces the dead-time between
records, thus reducing the likelihood
of missing a Trigger event.
Built-in self-test ensures proper
operation
A built-in self-test ensures proper
operation of all major subsystems of
the digitizer and reports any errors. A
high-level self-test automatically runs
at startup, or a more thorough selftest can be initiated on command.
Successful completion indicates the
digitizer is ready to use.
Easy, semi-automatic
calibration
Calibration is easily achieved using
a 6.5 digit DMM to measure the Cal
Src Out on a few defined ranges of
the digitizer. Simply send a command,
using your programming language
of choice or the web interface, that
contains the measured source values
to the digitizer, and the rest of the
calibration is done automatically.
Gigabit ethernet for high-speed
connection
The Gigabit Ethernet interface offers
a high-speed connection that enables
remote access and control of the digitizer. You can set up a private network
to filter out unwanted LAN traffic and
speed up the I/O throughput, or take
advantage of the remote capabilities
and distribute your tests worldwide.
The Ethernet interface along with
the web interface enables you to
configure, monitor, and debug your
application remotely.
The digitizers ship with Agilent
E2094N I/O Libraries Suite making
it easy for you to configure and
integrate Agilent and other vendors’
instruments into your system.
Standard software
environments supported
Full support for standard programming environments ensures compatibility and efficiency. The digitizers
can be automated using SCPI or
standard IVI and LabVIEW software
drivers that provide compatibility
with the most popular development
environments:
• Agilent Microsoft® Visual Studio®
.NET, Agilent VEE Pro, Microsoft
C/C++, Visual Basic
• National Instruments LabVIEW,
LabWindows/CVI, Test Stand
4
Specifi cations
L4532A (2 channel) or L4534A (4 channel) digitizers with ADCs
per channel
Max sample rate 20 MSa/s
Sample resolution 16 Bits
Input confi guration Isolated inputs (each channel
independently isolated)
Isolation voltage
(low to chassis)
Maximum input (Hi to Low) ±250 Vpk
Maximum input range ±256 V
Input impedance 1 MΩ in parallel with 40 pF
Input coupling DC or AC
AC cutoff freq (-3 dB) < 10 Hz
Input ranges: ±256 V, ±128 V, ±64 V, ±32 V,
Over voltage protection Yes
Maximum overvoltage
transient
Analog bandwidth (-3 dB) 20 MHz typical
Noise fi ltering (2-pole Bessel) 200 KHz, 2 MHz typical
Power requirements
Line voltage 100 to 240 VAC (universal)
Line frequency 50 Hz or 60 Hz
Power consumption 45 W (100 VA)
Safety conforms to
IEC/EN 61010-1:2001( EU)
CAN/CSA-C22.2 No. 61010-1-04 (Canada)
UL 61010-1 (2nd Edition) (US)
AS 61010.1:2003 (Australia/New Zealand)
EMC conforms to
IEC 61326-1:2005-12 (EU)
EN 61326-1:2006
ICES-001:2004 (Canada)
AS/NZS CISPR 11:2004
1. CAT I IEC measurement Category I. Inputs may be connected only to
circuits that are isolated from AC mains.
±40 V
1
±16 V, ±8 V, ±4 V, ±2 V, ±1 V,
±500 mV, ±250 mV
±400 Vpk
Arm and trigger
Each Arm event gates one or more trigger events. Each
trigger event causes acquisition of data into a single record
at the confi gured sample rate. The number of data records is
confi gurable from 1 to 1024.
Source ARM Trigger Description
IMMediate ● ● Trigger or ARM at INIT time
EXTernal 1 ● ● BNC TTL input edge
(selectable rising/falling
edge
Software ● ● Instrument commands
Timer ● 0.0 s to 3600.0 s with
50 ns resolution
Channel/Edge ● Selectable level, rising/
falling, hysteresis
Channel/Window ● Selectable high and low
levels, leaving/entering,
hysteresis
2
OR
● Logical OR of channel trigger
source and External
1. EXTernal can be used as an ARM source or a trigger source,
but not both at the same time.
2. OR can only be used if the EXTernal source is being used as
a trigger source.
Sampling
Programmable sample
rates
External event output
Event types: Trigger, end-of-record,
Output signal:
3,4
Impedance: 25 ohm or 50 ohm
Trigger modes
Pre trigger 0 to record length -4
Post trigger Record length-pretrigger
Timestamp triggered event Elapsed time since INIT, or
Timestamp resolution 12.5 ns
Trigger delay 0 – 3600 s with 50 ns resolution
Trigger holdoff 0 – 10 s with 50 ns resolution
Trigger latency
5
Trigger reactive
Ext input trigger latency 40 ns to 51 ns
Ext output trigger latency 4 ns to 21 ns
3. Pulse width 1 µs (200 ns for records taking <2 µs to complete).
4. TTL output pulse can be confi gured for either rising or falling edge.
5. Latency between level/window trigger detection and fi rst (trigger)
sample.
1 KSa/s, 2 KSa/s, 5 KSa/s,
10 KSa/s, 20 KSa/s, 50 KSa/s,
100 KSa/s, 200 KSa/s, 500 KSa/s,
1 MSa/s, 2 MSa/s, 5 MSa/s,
10 MSa/s, 20 MSa/s
end-of-acquisition
TTL (rising edge)
CONTinuous running timestamp
12.5 ns
5
Accuracy
1
DC accuracy
Total specifi cation (% of reading + % of range).
23 °C ± 5 °C T
autozero
±3 °C
Range ±% of
reading
±% of
range
±% of
range
4
Temp coeffi cient
5
outside 18-28 °C
±% of
reading/C
±% of
range/C
250 mV 0.10 0.30 0.11 0.010 0.015
500 mV 0.10 0.20 0.06 0.010 0.010
1 V, 2 V 0.10 0.12 0.04 0.010 0.010
4 V, 64 V 0.10 0.30 0.05 0.010 0.015
8 V, 128 V 0.10 0.20 0.04 0.010 0.010
16 V, 32 V,
0.10 0.12 0.04 0.010 0.010
256 V
1. 100,000 reading average @ 1 MSa/s
For 1 V range and greater, typical offset with constant temperature is
0.01% of range.
Integral nonlinearity ±5 LSB
Differential nonlinearity ±1 LSB typical, no missing
codes
Input bias current < 10 nA typical
Dynamic Characteristics 4 (typical)
Measured using a 65536 point FFT)
(
Input range 980 kHz input (–1 dBFS)
SFDR
- dBc
250 mV 71 79 67 66.7 10.8
500 mV 77 83 70 69.8 11.3
1 V 81 85 73 72.7 11.8
2 V 85 82 75 74.2 12.0
4 V 70 80 64 63.9 10.3
8 V 70 83 65 64.9 10.5
16 V 70 81 65 64.9 10.5
Input range 10 MHz input (-1 dBFS)
250 mV 71 71 66 64.8 10.5
500 mV 71 73 68 66.8 10.8
1 V 69 68 72 66.5 10.8
2 V 63 62 72 61.6 9.9
3. ENOB = (SINAD - 1.76)/6.02
4. External timebase measurements made with 1 Vpp sinewave with
<2 ps RMS jitter.
AC fl atness (DC-4 MHz)
250 mV ±0.28 dB relative to 1 kHz
500 mV, 1 V, 2 V, 4 V, 8 V,
16 V, 32 V
64 V, 128 V, 256 V ±0.40 dB (±0.01 dB/ºC
Crosstalk (Ch to Ch)
R
= 50 Ohm
s
THD
- dBc
SNR
- dB
SINAD
- dB
±0.20 dB relative to 1 kHz
temperature coeffi cient outside
18-28º C) relative to 1 kHz
<–90 dB @ 1 MHz
ENOB
Timing and synchronization
Internal timebase accuracy ±50 ppm
Internal timebase output
(Clock out BNC)
Frequency 10 MHz
Level >1 Vpp
External timebase reference
(Clock in BNC)
Lock range 10 MHz ±5000 pp
(10 MHz ±50 kHz)
Clock lock skew (typical) ±10 ns (typical)
Level 1 Vpp sinewave min
<2 psec rms jitter
Input resistance nominal 100 kΩ nominal
Waveform memory
Data memory
Standard
Extended
Random access to readings
Multiple record mode
5. Nominal values. Specifi c sample max is 33,554,432 and 134,205,440
samples.
5
5
32 MSa/ch
128 MSa/ch
Capture multiple records from
multiple triggers
Waveform measurements
Voltage Peak-to-peak, minimum,
maximum, average, RMS,
2
amplitude, base, top, overshoot,
preshoot, upper, middle, lower
Time Rise, fall, period, frequency,
positive width, negative width,
duty cycle
Utilities
Calibration
Calibration cycle 1 year
Internal calibration source 0 to ±16 V typical
Electronic calibration Requires an external 6.5 digit
DMM and PC
Self-test Power on self-test, Complete
test performed via *TST?
command
Hardware
1U full rack LXI 425.7 mm W x 44.5 H x
367.9 mm D
Weight
L4532A (2-ch) 3.3 kg
L4534A (4-ch) 3.63 kg
Front panel Power switch and display
Back panel (Connectors)
Power input
Input channels BNC
Cal Src Out BNC
10 MHz In BNC
10 MHz Out BNC
Trig In/Out BNC
I/O interface LAN (Gbit), USB 2.0
6
Software
Web interface: Internet Explorer, IE
(version 6 & 7), Mozilla Firefox
and Netscape; requires Javaenabled browser (Java 1.6 or
greater)
Programming language: ASCII commands, IEEE 488.2
compliant
Computer interfaces:
LAN: Standard LAN
10/100/1000BaseTx
USB: Standard USB 2.0 (USBTMC** compliant)
Programming via direct native command set:
VISA IO control (LAN or USB)
LAN sockets control
(LAN only)
Programming via software driver:
IVI-COM, IVI-C Driver for Window 2000/XP/Vista, G driver for
LabVIEW
Compatible with programming tools and environments:
Agilent VEE Pro, Microsoft Visual Studio.NET, C/C++,
Visual Basic 6, National Instruments Test Stand,
Measurement Studio, LabWindows/CVI, LabVIEW
* VXI-11 allows transfer of IEEE 488.1 and IEEE 488.2 messages over a
TCP/IP network. Supported by Agilent IO Library Suite (included).
** USB Test and Measurement Class (TMC) that communicates over
USB, complying with IEEE 488.1 and IEEE 488.2 standards. Supported
by Agilent IO Library Suite (included).
(VXI-11* compliant),
Sockets (service at port 5025),
Telnet (service at port 5024))
Agilent IO Libraries Suite 15.0
or greater recommended
<Sockets programming>
Minimum system requirements (I/O libraries & drivers)
Operating
system
Processor 450 MHz Pentium II or
Available
memory
Available
disk space
Video Super VGA (800 x 600),
Browser Microsoft Internet
Windows XP SP2 (or
later) Windows 2000
Professional
SP4 (or later)
higher required; 800
MHz recommended
128 MB minimum,
(256 MB or greater
recommended)
280 MB minimum, 1 GB recommended for
Microsoft.NET framework 2.0
65 MB for Agilent IO Libraries Suite
256 colors or more
Explorer 5.01 or greater
Windows Vista 32-bit
(Home, Basic, Premium,
Business, Ultimate,
Enterprise)
1 GHz 32-bit (x86)
512 MB minimum
(1 GB recommended)
Support for Direct X 9
graphics with 128 MB
graphics memory recommended (Super VGA
graphics is supported)
Microsoft Internet
Explorer 7 or greater
Environmental
Operational environment Pollution degree 2, indoors
Operating temperature 0 to 55 °C
Storage temperature –40 to+70 °C
Warm-up period <60 min to rated specs
Relative humidity @ 40 °C 20 to 95% non-condensing
Vibration: Agilent’s ETM limits
Data storage/transfer
Pre-trigger data Up to full record length -4 samples
Record length 8 samples to 32 MSa/128 MSa
Post-trigger data 4 samples to 128 MSamples
Maximum number of triggers Number of records (triggers)
confi gurable to 1024 records
Resolution One sampling interval
Timestamp rollover >1.5 years
Maximum data transfer rate
from memory
USB 2.0 8 MB/s
Gbit LAN 15.0 MB/s
Ordering Information
L4532A 2-channel 20 MSa/s digitizer
Opt 001 Standard memory (32 MS/ch)
Opt 002 Extended memory (128 MS/ch)
L4534A 4-channel 20 MSa/s digitizer
Opt 001 Standard memory (32 MS/ch)
Opt 002 Extended memory (128 MS/ch)
Includes product reference CD (products doc and examples),
IO Libraries CD, and power cord.
Accessories
Opt 908 Rack mount kit L4532-67001
Option 0B0 Deletes printed manual set
(Full documentation included on CD ROM)
Option ABA English printed manual set
For additional information please visit:
http://www.agilent.com/find/L4534A
Related Agilent Literature
Agilent VEE Pro, data sheet, literature number 5989-7427EN
Agilent E2094N IO Libraries Suite, data sheet, literature
number 5989-1439EN
7
www.agilent.com
www.agilent.com/find/digitizers
Defi nitions for
Specifi cations
Specifications describe the warranted
performance of calibrated instruments
that have been stored for a minimum
of 2 hours within the operating temperature range of 0 to 55°C, unless
otherwise stated, and after a 60 minute warm-up period. Data represented
in this document arespecifications
unless other wise noted.
Characteristics describe product
performance that is useful in the
application of the product, but that is
not covered by the product warranty.
Characteristics are often referred to
as Typical or Nominal values.
• Typical describes characteristic
performance, which 80% of the
instruments will meet when operated
over a 18 to 28°C temperature range.
Typical performance is not warranted.
• Nominal describes representative
performance that is useful in the
application of the product when operated over a 18 to 28°C temperature
range. Nominal performance is not
warranted.
Note: All graphs contain measure
data from several units at room temperature unless otherwise noted.
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Product specifications and descriptions
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© Agilent Technologies, Inc. 2011
Published in USA, June 9, 2011
5989-9636EN
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