Agilent E5500 Series
Phase Noise Measurement Solutions
Technical Overview and Data Sheet
Model E5505A configurations
Carrier frequency ranges
50 kHz to 6.6 GHz
50 kHz to 18 GHz
50 kHz to 26.5 GHz
• Flexible set of measurements and
configurations, widest offset range,
and best reputation for the R&D
workbench or production floor
• Measurements on one-port VCOs,
DROs, crystal oscillators, and synthesizers and on two-port devices,
including amplifiers and converters,
plus CW, pulsed and spurious
signals
• Absolute and residual phase noise,
AM noise, and low level spurious
signals
• Easy configuration for various
measurement techniques,
including PLL/reference
source, residual and FM
discriminator methods
• Wide offset range capability,
from 0.01 Hz to 100 MHz
• Architecture combines
standard instruments, phase
noise components, and PC
software flexibly, allowing re-use of
assets (proprietary architectures are
less flexible because the reference
sources and analyzers selected can
limit phase noise measurements)
Offset frequency ranges
0.01 Hz to 2 MHz
0.01 Hz to 100 MHz
With over 35 years of low phase noise, RF design,
• E5500 software enables many
standalone instruments to work
together within a system
and measurement experience, Agilent solutions
provide excellent measurement integrity, repeatability, and accuracy.
Agilent E5500 Theory of Operation
The “phase detector with reference source” technique is the most
general-purpose and cost-effective
measurement approach to measure
the single sideband (SSB) phase
noise characteristic of oscillators.
This technique demodulates the noise
sidebands of the device-under-test
(DUT) oscillator to a baseband signal
for a fast, easy measurement using
off-the-shelf baseband analyzers.
With the reference source and the
DUT in steady state quadrature, the
phase detector generates a baseband
signal proportional to the phase difference of the two sources. When the
noise characteristics of the reference
source signal are less than the DUT
signal noise characteristics, the
resulting baseband noise signal is
effectively that of the DUT.
A narrow-band phase-lock-loop forces
the two phase detector input signals
into quadrature and allows the reference source to track DUT frequency
drift for drift rates within the loop
bandwidth. Noise fluctuations within
the loop bandwidth are suppressed
by the operation of the phase-lockloop. This suppression effect can be
independently measured and the noise
data corrected automatically by the
measurement software. Noise fluctuations outside of the phase-lock-loop
bandwidth are unaffected.
When the oscillator-under-test has
a frequency output in the microwave
frequency range, it is difficult to
find suitable, low noise, microwave
frequency sources to use as the
necessary reference signal. In this
case, the solution is to use a lownoise downconverter to translate the
DUT microwave output frequency to
a lower RF/IF frequency, allowing the
use of the same low-noise RF reference sources described previously.
The phase noise of the RF reference
or the microwave downconverter
usually dominates the effective noise
floor of this phase noise measurement. The noise contribution of the
baseband test set is much lower than
either and typically does not factor
into the overall measurement noise
floor.
Simplified phase noise measurement diagram
2
Widest Measurement Coverage
The E5500 has been tailored to meet
the extensive needs of engineers,
providing the most flexible and best
measurements at the lowest possible
cost. The modular instrument architecture takes advantage of standalone
instrumentation for superior frequency
offset range, broadest capability, best
sensitivity, and excellent overall value
for phase noise measurements. The
E5500’s low internal noise floor and
measurement flexibility let you measure a wide variety of devices with
one system.
Ability to test a wide range of devices
The E5500 Series measures the
absolute, single sideband phase noise,
the absolute AM noise, and the low
level spurious signals of a wide range
of one-port production devices with
either CW or pulsed carrier signals:
• VCOs, DROs, and fixed oscillators
Measure AM noise directly
The E5500 Series can automatically
measure the AM noise of RF and
microwave devices. The internal
AM detector and DC blocking filter
provided within Agilent’s N5500A–001
measures AM noise on carriers up
to 26.5 GHz. AM noise of millimeter
frequency devices can be measured
with an external AM detector.
Additive noise measurements to
two–port devices
The E5500 Series also measures the
residual (additive) phase noise, AM
noise, and low level spurious signals
of two-port production devices with
either CW or pulsed carrier signals:
• High power amplifiers
• Frequency dividers
• Frequency multipliers
Measuring noise using the external noise
input port
• Crystal oscillators and clocks
• High frequency synthesizers
• Low noise DC supplies
Residual noise measurement of a two-port device
• Mixers
3
Most Flexible Measurement Solution
Superior frequency offset range
The Agilent E5500 comes standard
with the capability to measure from
0.01 Hz to 2 MHz of offset range
directly, or optionally measure offset
ranges to 100 MHz and beyond. The
wide offset range provides engineers
with more information on the test
device’s performance close-to-carrier
and far-from carrier. The E5500 provides complete 0.01 Hz to 100 MHz
offset range measurement capability without the need for additional
baseband analysis hardware. A PC
digitizer, along with an optional broadband RF signal/spectrum analyzer,
provides not only a complete phase
noise measurement solution, but the
signal/spectrum analyzer can also be
used for many other independent R&D
measurement functions. All of this
for a price you might expect to pay
for other, more limited, measurement
solutions.
Handles carrier frequencies to 26.5 GHz
The E5500 solutions can include a low
noise down-converter optimized for
their respective frequency ranges. For
example, the 18-GHz down-converter
has a minimum input frequency of
1 GHz allowing you to select an RF
reference source with a maximum
output frequency of 1 GHz. This
optimization helps reduce the total
solution costs for phase noise measurements because standalone low
frequency signal sources are lower
cost components. The addition of
low-noise RF reference sources and
microwave down-converters provide
a complete phase noise measurement solution for a wide range of
IF, RF, microwave, and millimeter
frequency oscillators. Some low noise
measurements could be configured
with the N5500A phase noise test
set’s optional 26.5 GHz input. This
requires a low noise microwave
reference source because the E5500
does not downconvert the signal.
Expand carrier frequencies to 110 GHz
For absolute measurement of phase
noise in the millimeter frequency
bands, add the appropriate Agilent
11970 Series millimeter harmonic
mixers to the E5500 solution with the
26.5-GHz microwave down-converter.
The down-converter provides the
high power, direct LO drive necessary
to down-convert millimeter signals.
The 45-dB variable gain IF amplifier
is available to amplify the IF output
of the harmonic mixer. The downconverter can also supply the DC bias
to the harmonic mixer if appropriate.
Wide choice of reference sources
The E5500 offers a wide choice of low
noise reference sources because this
system component is critical to the
overall phase noise measurement performance. One reference source might
be needed to measure the best closeto-carrier phase noise and another
reference could easily be used for
the best far from carrier phase noise
measurements. Unlike proprietary
architectures that limit your choice
to one or two reference sources, the
E5500 offers numerous reference
sources to fit your application. These
standalone instruments will provide
the best value and are easily reused
on your bench or in your ATE systems.
The E5500 phase noise test set and
downconverters have an internal
noise floor well below the noise of
most reference sources and do not
require special phase detectors to
lower the noise floor further. For
situations where standard RF signal
generators may not offer sufficient
measurement sensitivity, the E5500
series can use any voltage tuneable
source as a reference source. For
example, the N5508A is an ultra-lownoise fixed frequency source that has a
tunable option.
Block diagram for coverage up to 110 GHz
Use off-the-shelf RF signal generators or
your own low-noise source as the reference
source
4
Easiest Integration into the Production ATE Environment
The Agilent E5500 Series of phase
noise measurement solutions is tailored to meet the demanding needs of
production ATE. With test times of less
than 3 seconds (1 kHz to 100 kHz) and
less than 30 seconds (10 Hz to 1 MHz)
achievable, the E5500 Series meets
the high throughput and over-all, low
cost-oftest needs for today’s higher
volume devices.
Key features for ATE are:
• Quick and easy integration into
existing ATE systems using
standard instruments and
SCPI programming
• “Just-enough” measurement
performance because of E5500
configuration flexibility
• Lowest overall cost of measurement
by using standalone instruments
likely to be included in your ATE
system
A configuration for ATE consists of a
low noise baseband test set, a PC digitizer for baseband signal measurement,
and measurement software. The baseband test set provides all of the phase
detectors, amplifiers, filters, switches,
and attenuators necessary to measure
phase noise over the IF, RF, and
microwave frequency ranges directly.
The PC digitizer samples the baseband
noise signal and sends the digitized
data to the measurement software
for fast digital signal processing. The
measurement software provides all of
the operator interaction, measurement
coordination, calibration, data signal
processing, and data results. The
remote (SCPI) standard commands
programmable instruments programming interface client provides quick
and easy integration into new and
existing production test environments.
Quick and easy integration into your
ATE system
With a completely defined, industry
standard SCPI programming interface
client, the E5500 Series can be quickly
and easily integrated into your specific
ATE computing environment. If you
choose to configure an E5500 Series
solution to run on a separate computer,
initiate a measurement over LAN or
GPIB using the standard, remote,
phase noise SCPI command language.
Full measurement system control,
including capturing measurement
data, is included. If your production
ATE computing environment runs
under Windows®, a separate computer is not necessary. Simply initiate
a measurement using the multitasking
capability and the remote SCPI interface to communicate with the E5500
series measurement software running
concurrently on your ATE computer.
Data is available in two ASCII formats:
a spread sheet format and an XY
graph format. Other data translators
can be specified and provided.
Software summary
• Modular, object oriented, client/
server architecture
• Windows-compliant graphical user
interface and operating system
• Industry standard SCPI programming language
• Standard ASCII data formats
Integrating an Agilent E5500 solution into a production test environment
5
SENSe:NOISe:MEAStype ABSolute
CARRier:FREQuency:FIXed 10 MHz
REFerence:FREQuency:FIXed 10 MHz
SENSe:DETector:FREQuency 10 MHz
SENSe:DETector LFRequenc
SENSe:RANGe:OFFSet 10 Hz, 10 MHz
SENSe:RANGe:SEGTable:MEASurement:QUALity FAST
DISPlay GRAPh:TRANsform SSBNoise
INITiate:CALibrate
TTOTal?
*WAI
*STB?
CALCulate:VIEW:XYDATA
CALCulate:DATA:HEADer: POINts?
CALCulate:DATA?
A simple SCPI programming example
Powerful Phase Noise Measurement Software
The Windows-compliant graphicaluser interface of the E5500 system
provides instant access to all measurement functions making it easy to
configure a system, define or initiate
measurements, and analyze data.
The main icons are always displayed,
allowing you simple and quick access
to measurement information. The
forms–based graphical interaction
helps you define your measurement
quickly and easily.
Easy set up for measurements
Each form tab is labeled with its content, preventing you from getting lost
in the define and configure process.
To obtain a quick look at the measurement data, select the “fast” quality
level. If more frequency resolution to
separate spurious signals is important,
select the “high resolution” quality
level. And if you need to customize
the offset range beyond the defaults
provided, tailor the measurement
segment tables to meet your needs
and save them as a “custom” selection. You can also place markers on
the data trace. Select the marker
icon and add up to nine data markers
that can be placed and plotted with
the measured data. Other features
include:
• Plotting data without spurs
• Tabular listing of spurs
• Plotting in alternate bandwidths
• Parameter summary
• Plotting several different
measurements on the same
displayed graph
• Color printouts to any supported
color printer
Real-time monitoring of time
and frequency noise data
Real-time monitoring of the noise
signal is fast and easy. Choose the
real-time monitor measurement mode,
define the offset range you wish to
view, and select the appropriate
baseband analyzer role control panel.
These role control panels can also be
used for measurement troubleshooting when measuring complex devices,
direct manual control of reference
sources, test set, or downconverters,
and test development.
Share real-time data and results with
other users
Users operating other computers can
view your measurements directly
through the use of the E5500 Series
software client-server structure. The
software allows multiple GUI client
connections even when those GUI
clients are located on other computers. Being connected remotely allows
users the opportunity to evaluate
measurement results and configurations in real time.
Place markers directly on the measured data
Easy-to-use forms allow fast and easy
measurement configuring
Real-time view of baseband FFT
analysis can show both time domain
and frequency domain data
6
Measurement Expertise and Leadership
The E5500 Series provides the kind of
measurement integrity and leadership
that you have come to expect from
Agilent Technologies. The new software design provides exceptional flexibility, measurement integrity, and low
overall cost-of-measurement. The new
dedicated hardware modules provide
improved measurement range, proven
reliability, and excellent repeatability.
Trained phase noise application engineers will provide on-site training for
up to six users. The training explains
all operating modes of the E5500
Series, when each measurement
technique is appropriate, and how to
analyze the measured data. Additional
application assistance focused on
measuring your specific devices is
also available. Support options include
worldwide service and support, on-
Worldwide application services and
hardware support
Agilent has a complete, worldwide
site training, applications assistance,
access to E5500 system experts, and
remote access to software updates
and application information.
support services structure in place,
providing regional hardware calibration and repair and local application
expertise.
Agilent E5500 Solution Configuration
Agilent’s commitment to worldwide
support can provide high system uptimes
in critical test environments’ measuring
systems
The E5500 solutions can easily
be configured to meet the needs
of bench R&D or production ATE
environments. They include modular
hardware including specific phase
noise instruments, industry-standard
instruments, and Windows PC for
maximum test throughput, current
and future measurement flexibility,
and asset reuse. These solutions can
easily include specific RF reference
sources, additional baseband analysis
hardware, and computers for complete
production phase noise measurement
solutions.
The Agilent E5500 hardware includes
• 0.01 Hz to 2 MHz PC digitizer
• N5500A baseband test set
• Optional low noise downconverter
Operating characteristics
Offset frequency range 0.01 Hz to 2 MHz
System noise response –180 dBc/Hz typically (>10 kHz offsets)
System spurious response < –120 dBc typically
Phase detector input power (<1.6 GHz carrier frequency)
R input = 0 to +23 dBm
L input = +15 to +23 dBm
Downconverter input range 1 GHz to 18 GHz
1.5 GHz to 26.5 GHz
External noise input port 0.01 Hz to 100 MHz
Measurement accuracy ±2 dB (< 1.0 MHz offsets)
±4 dB (< 100 MHz offsets)
Optional capabilities
• Extend offset range to 100 MHz
• Add RF reference source
• Add high power input capability (includes μW phase and AM detectors)
• Extend carrier frequency to 110 GHz
• Add remote SCPI programming client for ATE environments
7
Specifications
Determining overall solution performance
Measurement accuracy
Measurement of all noise and spurious present at the
phase detector inputs and system contribution, provided
the following conditions are met:
Source return loss > 9.5 dB (< 2:1 VSWR)
Source harmonic distortion < –20 dB (or square wave)
Nonharmonic spurious < –26 dBc (except for PM close
to carrier)
Supported measurement configuration (PLL verification)
±2 dB for < 1.0 MHz offsets
±4 dB for < 100 MHz offsets
Overall phase noise measurement system sensitivity is a
combination of noise contributions from the baseband test
set, the RF reference source, and the microwave downconverter used and is normally dominated by either the RF
reference source or the microwave downconverter:
Baseband test set + RF reference + microwave DC
noise floor noise floor noise floor
When the dominant noise contributions (RF reference and
the downconverter) are close to each other, a noise floor
correction factor (dB) is added to the most dominant noise
contributor in order to determine overall system noise
floor:
Magnitude 16 10 6 3 2 1 0
difference (dB)
Noise 0.1 0.4 1.2 1.8 2.1 2.5 3
correction
factor (dB)
Offset Baseband TS RF reference Microwave DC Difference Factor System total
frequency (Hz) (dBc/Hz) (dBc/Hz) (dBc/Hz) (dB) (dB) (dBc/Hz)
1
10
100
1 K
10 K
100 K
1 M
10 M
100 M
Examples: Offset frequency = 1 MHz Offset frequency = 1 MHz
RF reference = –140 dBc/Hz RF reference = –130 dBc/Hz
Downconverter = –140 dBc/Hz Downconverter = –140 dBc/Hz
Mag difference (dB) = 0 Difference (dB) = 10
Noise correction factor = 3 dB Noise factor = 0.4 dB
Dominant + factor = –140 + 3 Dominant + factor = –130 + 0.4
Overall noise floor = –137 dBc/Hz Overall noise floor = –129.6 dBc/Hz
8
Agilent N5500A (Included in all E5500 Systems) Specification Summary
Options 001 and 201 Option 001
Low frequency inputs High frequency inputs AM noise
Carrier frequency range 50 kHz to 1.6 GHz 1.2 GHz to 26.5 GHz 50 kHz to 26.5 GHz
R input power 0 dBm to +23 dBm 0 dBm to +5 dBm N/A
with Option 001 0 dBm to +30 dBm 0 dBm to +30 dBm 0 dBm to 30 dBm
L input power +15 dBm to +23 dBm +7 dBm to +10 dBm
Offset frequency range Noise input port
Offset frequency Detector input frequency Frequency 0.01 Hz to 100 MHz
0.01 Hz to 20 kHz 50 kHz to 500 kHz Amplitude 1 volt peak max
0.01 Hz to 200 kHz 500 kHz to 5 MHz Input impedance 50 Ω (typical),
0.01 Hz to 2 MHz 5 MHz to 25 MHz (DC coupled, RL > 9.5 dB
(typical))
0.01 Hz to 20 MHz 25 MHz to 250 MHz
0.01 Hz to 100 MHz 250 MHz to 26.5 GHz
Tuning voltage output Noise floor degradation
Voltage range ±10 volts, open circuit Degrade system noise floor 1 dB for every dB reduction
Current 20 mA, max in R input levels less than:
Output impedance 50 Ω, typical +15 dBm (low frequency input)
+5 dBm (high frequency input)
Graph of typical test set noise floor from E5500 measurement software
9
Agilent N5500A Specification Summary
Phase detector input ports
Residual phase noise and spurious responses
(does not include phase noise and spurious signals from
a reference source)
Carrier frequency: 50 kHz to 1.6 GHz
RF phase detector
Offset frequency System noise floor
0.01 Hz –70 dBc/Hz
1.0 Hz –130 dBc/Hz
10 kHz –170 dBc/Hz
> 10 kHz –170 dBc/Hz
Offset frequency Spurious response
0.01 Hz –70 dBc
0.1 Hz –100 dBc
> 10 Hz –112 dBc
Carrier frequency: 1.2 GHz to 26.5 GHz
Microwave phase detector Option 001 and 201
Offset frequency System noise floor
0.01 Hz –55 dBc/Hz
1.0 Hz –115 dBc/Hz
32 kHz –160 dBc/Hz
> 32 kHz –160 dBc/Hz
Offset frequency Spurious response
0.01 Hz –50 dBc
0.1 Hz –80 dBc
> 10 kHz –97 dBc
Use the typical phase noise plot to determine
specifications at other offset frequencies.
N5500A–001 AM Performance Summary
AM noise accuracy
For frequencies from 250 MHz to 26.5 GHz when using “internal automatic self-calibration”
+ 3 dB 0.01 Hz to 1 MHz offsets
+ 5 dB 1 to 100 MHz offsets
For frequencies from 50 kHz to 26.5 GHz when using single- or double-sided spur calibration
+ 2 dB 0.01 Hz to 1 MHz offsets
+ 4 dB 1 to 100 MHz offsets
AM detector noise floor
(Tested at 600 MHz, input signal +10 to +20 dBm)
AM noise (dBc/Hz) Spurious (dBc)
Offset from 10 100 1k 10k 50k 100k 1M 10M 100M 10 1k 100M
carrier (Hz)
Typical –112 –122 –132 –147 –156 –157 –157 –157 –157 –72 –92 –92
Specification –105 –115 –125 –140 –149 –150 –150 –150 –150 –65 –85 –85
General specifications
General considerations:
Operating temperature range: +0 °C to +55 °C
Warm–up time: 20 minutes
The N5500A has low susceptibility to RFI and mechanical
vibration. Care must be exercised however in making mea-
surements in high RFI or vibration environments as spurious
signals may be induced in the module.
10
Agilent N5502A (Optional in E5500 Systems) Specification Summary
RF input 1.0 GHz to 18 GHz
(18 GHz to 20 GHz typical over range)
Input power +15 dBm max
5 dBm min up to 12 GHz
10 dBm min 12 to 18 GHz
LO resolution 600 MHz (1.8 GHz to 18 GHz)
IF output 5 MHz to 1.2 GHz
IF output power 0 to +5 dBm
IF gain 0 to 45 dB (5 dB steps)
Mixing spurious (< +15 dBm at mixer)
< 6 GHz –50 dBc (except as noted below)
> 6 GHz –70 dBc
Carrier frequency range (GHz) Typical
where a mixing spur will occur spurious
< 100 MHz from carrier (dBc)
1.566 to 1.634, 1.166 to 1.234 –10
1.060 to 1.200, 1.274 to 1.303 –20
1.325 to 1.375, 1.420 to 1.460
1.775 to 1.825
1.013 to 1.043, 1.250 to 1.043 –30
1.900 to 1.940, 2.225 to 2.275
1.112 to 1.138, 1.483 to 1.517 –40
1.983 to 2.017, 2.380 to 2.420
2.483 to 2.517, 2.975 to 3.025
3.583 to 3.617
2.556 to 2.586, 2.983 to 3.017 –50
3.071 to 3.101, 2.860 to 2.900
4.785 to 4.815, 4.183 to 4.217 –60
3.580 to 3.620, 1.487 to 1.513
4.099 to 4.129, 3.483 to 3.517
2.042 to 2.072, 2.087 to 2.113
Downconverter noise floor
(all oscillators locked)
Input Offset from carrier (Hz) Spurious (dBc)
frequency 1 10 100 1k 10k 100k 1M 10M 100M < 1k > 1k
1.0 to Typical –50 –80 –97 –125 –137 –143 –145 –145 –145 –60 –75
3.0 GHz Specification –45 –75 –92 –120 –132 –138 –140 –140 –140 –50 –65
3.0 to Typical –44 –74 –91 –119 –131 –143 –145 –145 –145 –50 –80
6.0 GHz Specification –39 –69 –86 –114 –126 –138 –140 –140 –140 –44 –70
6.0 to Typical –38 –68 –85 –113 –125 –140 –140 –140 –140 –50 –80
12.0 GHz Specification –33 –63 –80 –108 –120 –135 –135 –135 –135 –40 –70
12.0 to Typical –34 –64 –81 –109 –121 –131 –131 –131 –131 –47 –70
General specifications
Operating temperature range: +0 °C to +55 °C
Warm-up time: 20 minutes
Offset from carrier (Hz)
General considerations:
The N5502A has low susceptibility to RFI and mechanical
vibration. Care must be exercised however in making
measurements in high RFI or vibration environments as
spurious signals may be induced in the module.
11
Spurious (dBc)
Agilent N5507A (Optional in E5500 Systems) Specification Summary
RF input 1.5 GHz to 26.5 GHz
Input power +30 dBm max
–30 dBm min
LO resolution 600 MHz (2.4 GHz to 25.8 GHz)
IF output 5 MHz to 1.2 GHz
IF output power 0 to +5 dBm (> –30 dBm input)
IF gain 0 to 45 dB (5 dB steps)
Mixing spurious (< +15 dBm at mixer)
< 6 GHz –50 dBc (except as noted below)
> 6 GHz –70 dBc
LO output power 0 to +16 dBm (2.4 to 6.6 GHz)
0 to +10 dBm (7.2 to 25.8 GHz)
Carrier frequency range (GHz) Typical
where a mixing spur will occur spurious
< 100 MHz from carrier (dBc)
1.586 to 1.614 –20
1.790 to 1.81, 1.912 to 1.928 –30
2.392 to 2.408, 2.872 to 2.888
2.990 to 3.000
1.708 to 1.720, 1.993 to 2.007 –40
2.240 to 2.260, 2.493 to 2.507
2.737 to 2.749, 3.592 to 3.600
2.051 to 2.063, 2.095 to 2.100 –50
2.565 to 2.578, 2.793 to 2.807
3.000 to 3.007, 3.080 to 3.092
3.493 to 3.507, 4.108 to 4.120
4.193 to 4.200
Downconverter noise floor
(All oscillators locked. For input signals < 0 dBm. Noise at offsets >
1 kHz may increase by 1 dB for every dB of input power reduction.)
Offset from carrier (Hz)
Spurious (dBc)
Input
frequency 1 10 100 1k 10k 100k 1M 10M 100M 10 to 100 >1k
1.5 to Typical –50 –80 –100 –128 –138 –145 –145 –145 –145 –60 –80
3.0 GHz Specification –45 –75 –95 –123 –133 –140 –140 –140 –140 –50 –65
3.0 to Typical –44 –74 –94 –122 –134 –144 –147 –147 –147 –50 –80
6.0 GHz Specification –39 –69 –89 –117 –129 –139 –142 –142 –142 –44 –70
6.0 to Typical –38 –68 –88 –116 –128 –140 –143 –143 –143 –50 –80
12.0 GHz Specification –33 –63 –83 –111 –123 –135 –138 –138 –138 –40 –70
12.0 to Typical –35 –65 –85 –113 –125 –137 –140 –140 –140 –47 –70
18.0 GHz Specification –30 –60 –80 –108 –120 –132 –135 –135 –135 –37 –60
18.0 to Typical –32 –62 –82 –110 –122 –130 –130 –130 –130 –44 –65
26.5 GHz Specification –27 –57 –77 –105 –117 –125 –125 –125 –125 –34 –55
mm bands (when adding the 11970 series harmonic mixers)
26 to 40 GHz Typical –26 –56 –76 –104 –116 –128 –130 –131 –131 –54 –80
33 to 50 GHz Typical –26 –56 –76 –104 –116 –128 –130 –131 –131 –44 –70
40 to 60 GHz Typical –23 –53 –73 –101 –113 –125 –127 –128 –128 –50 –80
50 to 75 GHz Typical –23 –53 –73 –101 –113 –125 –127 –128 –128 –40 –70
75 to 110 GHz Typical –20 –50 –70 –97 –109 –120 –122 –122 –122 –47 –70
General specifications
Operating temperature range: +0 °C to +55 °C
Warm-up time: 20 minutes
General considerations:
The N5507A has low susceptibility to RFI and mechanical
vibration. Care must be exercised however in making
measurements in high RFI or vibration environments as
spurious signals may be induced in the module.
12
Agilent N5501A1 Specification Summary
RF Input 1.0 GHz to 6.6 GHz
Input Power +15 dBm max
5 dBm min
LO resolution 600 MHz (1.8 GHz to 6.0 GHz)
IF output 5 MHz to 1.2 GHz
IF output power 0 to +5 dBm
IF gain 0 to 45 dB (5 dB steps)
Mixing spurious (< +15 dBm at mixer)
< 6 GHz -50 dBc (except as noted below)
> 6 GHz -70 dBc
Carrier frequency range (GHz)
where a mixing spur will occur
< 100 MHz from carrier
1.566 to 1.634, 1.166 – 1.234 -10
1.060 to 1.200, 1.274 to 1.303 -20
1.325 to 1.375, 1.420 to 1.460
1.775 to 1.825
1.013 to 1.043, 1.250 to 1.043 -30
1.900 to 1.940, 2.225 to 2.275
1.112 to 1.138, 1.483 to 1.517 -40
1.983 to 2.017, 2.380 to 2.420
2.483 to 2.517, 2.975 to 3.025
3.583 to 3.617
2.556 to 2.586, 2.983 to 3.017 -50
3.071 to 3.101, 2.860 to 2.900
4.785 to 4.815, 4.183 to 4.217 -60
3.580 to 3.620, 1.487 to 1.513
4.099 to 4.129, 3.483 to 3.517
2.042 to 2.072, 2.087 to 2.113
Typical
spurious
(dBc)
Downconverter noise floor
(all oscillators locked)
Input
frequency 1 10 100 1k 10k 100k 1M 10M 100M < 1k > 1k
1.0 to Typical -50 -80 -97 -125 -137 -143 -145 -145 -145 -60 -75
3.0 GHz Specification -45 -75 -92 -120 -132 -138 -140 -140 -140 -50 -65
3.0 to Typical -44 -74 -91 -119 -131 -143 -145 -145 -145 -50 -80
6.6 GHz Specification -39 -69 -86 -114 -126 -138 -140 -140 -140 -44 -70
General specifications
Operating temperature range: +0 °C to +55 °C
Warm-up time: 20 minutes
Offset from carrier (Hz)
General considerations:
The N5501A has low susceptibility to RFI and mechanical
vibration. Care must be exercised however in making
measurements in high RFI or vibration environments as
spurious signals may be induced in the module.
Spurious (dBc)
1. N5501A has been discontinued and replaced by N5502A. The information on this page is primarily for customers who
previously purchased the N5501A.
13
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(BP-09-27-13)
Product specifications and descriptions in
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© Agilent Technologies, Inc. 2013
Published in USA, November 28, 2013
5989-0851EN
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