The new standard in RF impedance
and material measurements.
Agilent
E4991A RF Impedance/
Material Analyzer
Technical Overview
Windows®-based user interface
• Windows®-based graphical user interface
(GUI) brings an intuitive view of
measurement settings and results.
• 8.4-inch TFT color LCD can display up to 5
traces (3 scalar and 2 complex parameters),
9 markers (1 reference marker and 8 markers),
and 801 sweep points.
High accuracy and adaptability
• Test head with 7 mm connector adapts
easily to various test fixtures.
• RF I-V technique enables highly accurate
measurements up to 3 GHz.
Versatile analysis functions
• Marker analysis and marker limit functions
reduce test time.
• Various test signals such as frequency, DC
bias and AC signal level are available.
• Equivalent circuit analysis function enables
easy modeling of components with 5
different multi-parameter models.
Built-in Visual Basic
®
for Applications (VBA)
programming function
• VBA offers easy
programming for
automation and
further detailed
analysis.
Data storage function
• Internal 31/2 - inch floppy disk drive and
hard disk drive are available.
• Store VBA program, calibration data,
and measurement data.
• CITIFILE format is supported for
automation tool users.
E4991A RF Impedance/
Material Analyzer
2
External VGA output
• Display measurement results on a
larger VGA monitor.
Parallel interface
• Support parallel interface printers.
External keyboard and mouse interface
• VBA programming made easy.
• Users can perform operations with a
mouse for more comfortable operation.
LAN interface
• Control other instruments or simplify
test-data sharing.
• Connect to a PC through remote user
interface software.
GPIB interface
• Controlled by external PC.
(cannot control external
instruments)
USB interface
• Control external instruments using the
82357A USB/GPIB interface.
• Support USB interface printers.
3
Powerful Analysis
Functions to Meet
Your Needs
The Agilent E4991A RF impedance/
material analyzer provides a total
solution for making highly accurate,
repeatable and stable measurements
of surface mount devices (SMD)
and dielectric/magnetic materials.
Recent trends indicate that
wireless communications and
digital equipment operating
frequencies are getting higher,
while component sizes are getting
smaller. Component and equipment
manufacturing engineers need to
evaluate components they will be
using in their products under their
projected operating conditions.
The E4991A can evaluate passive
component's characteristics up to
3 GHz. Additionally, engineers must
measure SMDs as small as
0201(inch)/0603(mm).
Key Specifications
Agilent provides various test
fixtures for SMDs, designed to
help you obtain the impedance
parameters with high repeatability.
The E4991A offers impedance
measurement capabilities for
your needs today and into the
future.
• Accurate and versatile 3 GHz
impedance measurement
solution
• Analyze passive component
behavior
• Wide range of test fixtures
available
• PC connectivity features with
Windows®-based technology
Advanced Solution
for RF Impedance
and Material
Measurement
The E4991A provides a powerful
tool for component manufacturing
R&D engineers and circuit
designers of wireless and digital
equipment who want to evaluate
components from various perspectives. The following are
application examples:
Passive components
• RF impedance measurement
of chip components such as
ceramic capacitors, RF
inductors, ferrite beads, and
resistors
Semiconductors
• Capacitance-Voltage (C-V)
characteristics and
Equivalent Series Resistance
(ESR) measurements of
varactor diodes
Materials
• Permittivity and loss tangent
evaluation of plastics,
ceramics, printed circuit
boards and other dielectric
material
• Permeability and loss
tangent evaluation of ferrite,
amorphous and other
magnetic materials
Table 1. E4991A key specifications
E4991A RF Impedance/Material Analyzer
Operating frequency 1 MHz to 3 GHz (1 mHz resolution)
Impedance parameters |Z|, θZ, |Y|, θY, R, X, G, B, CS, CP, LS, LP, RP, RS, D, Q, |Γ|, θΓ, ΓX, Γ
Y
Material parameters
1
|εr|, εr’, εr", |µr|, µr’, µr", θ, tanδ
Basic impedance accuracy ±0.8%
Test port 7-mm connector
Sweep parameters Frequency, AC signal level, DC bias level
Calibration Open/short/50 Ω/low-loss capacitor
Fixture compensation Open/short, fixture electrical length
Mass storage 3
1
/2 -inch floppy disk drive (MS-DOS®format),
hard disk drive
Other features •Equivalent circuit analysis function
•Built-in VBA for internal programming
•Segment sweep
DC bias (Option E4991A-001)
DC level 0 V ~ ±40 V (1 mV resolution)
100 µA ~ 50 mA, –100 µA ~ –50 mA (10 µA resolution)
1. Option E4991A-002 is required
E4991A Provides
New Insights into RF
Passive Component
Behavior
The Agilent E4991A's enhanced
frequency coverage up to 3 GHz
is compatible with wireless
communication applications such
as W-CDMA, BluetoothTM, and
Wireless LAN. The E4991A’s wide
impedance coverage and versatile
measurement functions allow
analysis of RF chip inductors and
capacitors under actual operating
conditions. A wide range of test
fixturing solutions makes tiny
chip device measurements even
easier.
Quality Factor (Q) and
Equivalent Series Resistance
(ESR) are critical parameters for
the components used in mobile
communication equipment. Q and
ESR measurements require high
accuracy. Prior to the E4991A,
there was not a good solution
available over 2 GHz. The E4991A
offers much improved Q and ESR
accuracy over traditional network
analyzers; due to the enhanced
RF I-V technique that measures
voltage and current at the device
under test (DUT), along with the
innovative low-loss capacitor
calibration.
Table 3 provides a brief summary
of the key differences between
Agilent E4991A and network
analyzers.
Low-loss capacitor
calibration
The low-loss capacitor calibration of the E4991A improves
phase measurement accuracy,
which establishes a reference to
the reactance axis (-90 degrees)
in the impedance plane with its
near-zero resistance. Capacitors
and inductors are measured
close to the reactance axis in
the impedance plane, making
low-loss capacitance calibration
very effective for ESR and Q
measurements. (See Figure 1)
Figure 1. Ls-Q characteristics of a chip inductor
Table 3. Comparison of key characteristics of E4991A and network analyzers
E4991A Network analyzers
Device type 1 port devices such as inductors, 2 port devices such as filters,
capacitors, and others. amplifiers, and others.
Measurement |Z|, |Y|, θ, R, X, G, B, C, L, S-parameters, Γ, θ
parameters R, D, Q, Γ
Sweep • Frequency • Frequency
parameter • Test signal level • Test signal level
setting • DC bias voltage
• DC bias current
Fixturing • Selection from various * Prepare custom test fixture or
Agilent test fixtures use Agilent channel partner
• Built-in fixture compensation solution
function (Accuracy enhancement
at DUT connection)
Impedance • Accurate high Q device • Accurate impedance
measurement measurement due to low loss measurement around 50 Ω
accuracy capacitor calibration
• Accurate measurement over
non-50 Ω impedance
Other Equivalent circuit analysis function
Table 2. Q measurement accuracy (Typical)
4
5
In-depth Device
Characterization
Intuitive graphical user
interface
The 8.4-inch color LCD with
Windows-based GUI brings an
intuitive view of measurement
settings and results. The E4991A
can display up to 3 scalar
and 2 complex parameters
simultaneously.
Figure 2 shows a measurement
result of a chip bead. You can
observe the |Z|, R and X parameters on the display at same time.
You can also assign each measurement trace in a separate window.
Windows-styled GUI brings the
added benefits of mouse operation
to the E4991A. Simply drag the
mouse over the area you are
interested in and you can zoom
in quickly and easily. (See Figure 3)
Figure 2. Flexible measurement trace assignment
Figure 3. Mouse operation example
6
DC bias function–
Option E4991A-001
For components with voltage
and current dependency, such
as RF inductors or ceramic
capacitors, the DC bias function
(Option E4991A-001) supplies
DC voltage (±40 V) and current
bias (±50 mA) across the device.
You can easily observe your
device behavior under various
DC bias conditions without using
an external DC bias source.
External DC bias adapter
If you require even higher DC
current bias, the Agilent 16200B
external DC bias adapter allows
you to apply larger DC bias across
the device of up to ±5 A through
a 7-mm test port by using an
external DC current source.
E4991A operating frequency
is limited to 1 GHz with the
16200B.
Extracting the equivalent
circuit parameters
The equivalent circuit analysis
function offers more detailed
circuit models over the standard
2-parameter model. Five different
multi-parameter models accommodate different types of devices,
such as ceramic capacitors
or crystal resonators. You can
simulate the impedance trace of
your own equivalent parameter
values and then compare it with
actual measurement traces. The
extracted parameters can also
be used with electronic design
automation (EDA) tools to
improve modeling accuracy.
Figure 4 shows the C-V
characteristic measurement
of a varactor diode. Sweeping
DC voltage from 0.5 V to 4.5 V,
you can easily read capacitance
change (11.27 pF) using the
delta marker function. Evaluate
DC bias voltage dependency on
components easily. DC current
bias measurement is also available so that you can evaluate
characteristics of inductors, such
as, saturation or hysteresis.
Figure 4. Varactor diode capacitance vs. DC
voltage characteristics
Figure 5-1. 16200B
Figure 5. 16200B DC bias adapter connected to the E4991A
Figure 6. Equivalent circuit analysis models
7
Increase Productivity
with Segment
Sweep Function
The segment sweep function
enables different measurement
setups in a single sweep by
dividing the sweep range into
segments. Each segment, including
the frequency range, number of
points, averaging factor, DC bias
level (V or I), and test signal level
can be set independently. (See
Figure 7) Segment sweep function
can drastically reduce your test
time when you need specific data
in a wide frequency range. With
segment sweep, you can avoid
repeatedly changing instrument
setups. (See Figure 7-1)
Various Text Fixtures
are Ready to Use
The 16197A and 16196A/B/C/D
are test fixtures that accommodate
passive surface mount devices
(SMD) and have high repeatability
and stable frequency characteristics up to 3 GHz.
The 16197A is a test fixture that
can hold chip devices that have
electrodes at the bottom. Various
sizes and shapes of devices are
supported. The 16197A supports
the following EIA/EIAJ standard
sizes:
• 0201 (inch)/0603 (mm)
1
• 0402 (inch)/1005 (mm)
• 0603 (inch)/1608 (mm)
• 0805 (inch)/2012 (mm)
• 1208 (inch)/3216 (mm)
• 1210 (inch)/3225 (mm)
• Non-standard shape
(requires modification of the
holder part)
The 16196A/B/C/D series are
coaxial-structured high performance test fixtures, which achieve
high repeatability and stability
up to 3 GHz. The 16196x series
simplifies operation significantly
and eliminates operation-related
errors. The 16196x series supports
chip devices as small as 01005
(inch)/0402 (mm) size. Each test
fixture model supports respectively
shaped devices as follows:
Model Device size supported
16196A 0603 (inch)/1608 (mm)
16196B 0402 (inch)/1005 (mm)
16196C 0201 (inch)/0603 (mm)
16196D 01005 (inch)/0402 (mm)
Figure 8. Agilent 16197A bottom electrode SMD
test fixture
Figure 9. Agilent 16196B parallel electrode SMD
test fixture
1 Option E4991A-001 is required.
Figure 7. Segment list table
Figure 7-1. Segment sweep measurement example
8
Connectivity
Advances with PC
and Windows-based
Technology
Visual Basic for
applications (VBA) helps
automate tasks
The built-in VBA is available for
customization and automation of
complex measurement procedures.
You can create macro programs
in the Integrated Development
Environment (IDE) of VBA in a
similar manner to Visual Basic®
operation.
Link to EDA tools
Using electronic design
applications such as Agilent’s
Advanced Design System (ADS),
in conjunction with the E4991A,
can help you optimize and verify
the performance of your device
with simulated circuit modeling.
You can easily store measured
data in CITIFILE format and
import to EDA software tools.
(Agilent’s ADS software may be
purchased separately from the
E4991A.)
LAN interface enables
seamless connectivity
with PC environment
Using the remote user interface
software provided with the
E4991A, you can easily correct
data and troubleshoot over the
LAN interface. The remote user
interface brings the instrument
control panel to the PC display
via LAN. You can gain control
of instruments in physically
separate locations. Easily share
your measurement data with
other applications, such as
spreadsheets, through a file
or via the clipboard.
Figure 10. VBA
Figure 11. ADS figure
Figure 12. Remote user interface
Material Analysis
Made Easy
The dielectric and magnetic
measurement software
(Option E4991A-002) provides
direct readout of material
parameters such as permeability
and permittivity up to 1 GHz. The
dielectric material test fixture,
16453A, and the magnetic material
test fixture, 16454A, eliminate
designing time-consuming custom
test fixtures.
Dielectric material testing
The 16453A employs the parallel
plate method for dielectric
constant and loss tangent
measurements up to 1 GHz. It
is well-suited for measuring a
sheet of solid substrate material,
such as PC board, ceramic or
polymer. Simple measurements
are possible by inserting the
material between the electrodes.
With E4991A Option E4991A-002,
material measurement function,
you can display permittivity
parameters directly on the analyzer’s display.
Magnetic material testing
The 16454A is used for permeability measurements up to 1 GHz
on the E4991A. This single-wound,
coil-structured test fixture
holds toroidal-shaped magnetic
materials such as soft-ferrite
and magnetic cores. It is possible
to accommodate different sizes
of toroidal cores by exchanging
small (smaller than 8 mm
diameter) and large adapters.
To use the 16454A, you need
the material measurement
function (Option E4991A-002).
9
Material size requirements
Diameter ≥ 15 mm
Thickness ≤ 3 mm
Material size requirements
Small size:
Outer diameter ≤ 8 mm
Inner diameter ≥ 3.1 mm
Thickness ≤ 3 mm
Large size:
Outer diameter ≤ 20 mm
Inner diameter ≥ 5 mm
Thickness ≤ 8.5 mm
Figure 13. E4991A with material test fixtures
Figure 14. 16453A Dielectric material fixture
Figure 15. 16454A Magnetic material fixture
10
More ICs or circuit modules are used in electronic circuits to save
spaces, more capacitors or inductors, such as thin dielectric layers
and pattern inductors, tend to be developed on wafer or substrate.
These devices usually have a small capacitance or inductance like
pF, nH. The Agilent E4991A RF impedance/material analyzer,
with Option E4991A-010 probe station connection kit, offers an
accurate on-wafer or micro-component impedance measurement
solution up to 3 GHz.
Easy installation
When connecting the E4991A
to probe stations, the accuracy
degradation, caused by port
extension and improper calibration, always becomes a big issue.
The Option E4991A-010 probe
station connection kit, for
E4991A provides all necessary
parts as one option and solves
this problem. This option
includes a smaller test head,
extension cables, adapters, a
connecting plate and detailed
installation procedures. Probe
stations are provided from
Cascade Microtech, Inc. With
this kit, you can easily establish
a reliable measurement system
in the short time.
Impedance measurement
specification at the
extended test head port
The E4991A’s Option E4991A-010
has a guaranteed impedance
measurement specification at
the end of the extended 7-mm
test head port. This is an important element for accurate measurement, because the port
extension usually de-grades the
measurement accuracy. The situation becomes even worse if the
cable used has an improper
characteristic. Agilent solved
this issue by preparing reliable
extension cables and
making a special test head. This
test head is small enough to be
brought closer to probe stations,
so that the measurement error
caused by this extra length is
also minimized.
Figure 16. Agilent E4991A with probe station
Accurate impedance measurement with probe station
Figure 17. Probe measurement configuration using E4991A Option E4991A-010
Test head*
Extension cable*
E4991A
Mounting plate
3.5-mm to 7-mm
adapter*
*Comes with Agilent E4991A Option E4991A-010
probe station connection kit.
Semi-rigid cable
DUT
Probe head
Stage
11
Wide and repeatable
impedance measurement
Agilent E4991A can cover wider
impedance range than network
analyzers. In general, network
analyzers are good at measuring
impedance near 50 Ω, but
the accuracy gets worse for
impedance away from 50 Ω. The
E4991A is designed to measure
non-50 Ω impedance as well, so
it can give much better accuracy
especially when you measure
small capacitance and inductance
like 1 pF and 1 nH. The E4991A
is repeatable over time and
temperature, too This is another
benefit of dedicated impedance
analyzers.
Figure 18. Agilent E4991A Option E4991A-010 probe station connection kit
What is E4991A
Option E4991A-010
The E4991A Option E4991A-010
includes following items:
• Smaller E4991A test head
• Extension cables
• 7mm - 3.5mm (f) adapter x 1 ea.
• N (m)-SMA(f) adapter x 3 ea.
• Installation manual
Probe
Agilent E4991A RF
impedance/material
analyzer
Probe head
Agilent E4991A
probe station
connection kit
(Option E4991A-010)
What else do you need
for a system?
Besides the E4991A with
Option E4991A-010, a probe
station and probe heads need to
be purchased separately. This
option works with any probe
stations, but we recommend
Cascade Microtech probe stations, because this combination
was carefully checked to work
well. The following are product
examples:
• Summit 9000, 11000, or 12000
series probe station
• ACP-series or HPC-series
probe head
• Impedance Standard
Substrate (ISS)
• Adjustable mounting plate for
the E4991A test head.
• Semi-rigid cable for the probe
head connection
These products are provided by
Cascade Microtech, Inc.
High-temperature cable
Test fixture
station
VBA sample
program
Extension cable
12
The temperature characteristic
test kit, E4991A Option E4991A007, is a new solution of temperature characteristic measurement
for components and materials.
This solution provides highly
accurate temperature characteristic analysis capability within
the wide temperature range from
-55°C to +150°C with a powerful
temperature drift compensation
function.
Figure 19 shows the typical 10%
measurement accuracy range
of the E4991A compared to the
4291B. The 4291B requires both
low and high impedance test
heads for obtaining the wide
impedance measurement range.
On the other hand, the E4991A
covers the wider impedance
measurement range with a
single test head.
The temperature drift compensation function is a new technology
that is adopted in the E4991A.
Unlike the 4291B, open/short
compensation can be performed
at pre-defined temperature points
so that temperature drift errors
can be drastically reduced as
shown in Figure 20.
Easy integration with
the ESPEC
1
temperature
chamber
ESPEC supplies a temperature
chamber, while Agilent provides
all other necessary accessories
and a sample program for creating an automated temperature
characteristic test system. Figure
21 shows the contents of the
E4991A Option E4991A-007.
2
A VBA sample program is
compatible with the ESPEC
bench-top temperature chamber,
SU-261, so that you can easily
integrate an automated temperature characteristic test system
Figure 22. The SU-261 provides
a wide temperature range from
-60° C to +150° C; which covers
the entire temperature range of
Option E4991A-007. Also, this
sample program can be modified
to fit other companies’ temperature chambers. In addition, the
VBA sample program provides
an intuitive GUI interface; which
provides the temperature chamber
control, measurement parameter
setup, and temperature profile
setup with easy operation.
Figure 19. Typical 10% measurement
accuracy comparison chart
Figure 20. Effect of the temperature drift
compensation function
Figure 21. Contents of the E4991A Option E4991A-007
Integrated Temperature Characteristic Testing
A temperature characteristic
test solution is now available
Figure 22. The E4991A Option E4991A-007 with the
ESPEC bench-top temperature chamber (SU-261)
1. ESPEC is an Agilent channel partner.
2. The Agilent 82357A USB/GPIB interface is
required to control the chamber from the
E4991A. The USB/GPIB interface is not
included in the Option E4991A-007.
13
Test Fixture Accessories
16197A bottom electrode SMD test fixture
Designed for bottom electrode SMDs up to 3 GHz.
Adjustable electrodes accommodate a wide array of
sizes. This fixture is designed to evaluate SMDs
between 0.6 mm1and 3.2 mm in length.
Figure 23. 16197A
16196A/B/C/D parallel electrode
SMD test fixture
Designed for side electrode SMDs up to 3 GHz.
Dedicated design for specific shape of the devices
eliminates repeatability errors and significantly
improves usability. 0603 inch/1608 mm (16196A), 0402
inch/1005 mm (16196B), 0201 inch/0603 mm (16196C),
and 01005 inch/0402 mm (16196D) are supported.
Figure 24. 16196A/B/C
16191A bottom electrode SMD
test fixture
Designed for bottom electrode SMDs up to 2 GHz.
Adjustable electrodes accommodate a wide array of
sizes. This fixture is designed to evaluate SMDs
between 2.0 mm and 12.0 mm in length.
Figure 25. 16191A
16192A parallel electrode
SMD test fixture
Holds chip devices with electrodes on both sides up
to 2 GHz. Adjustable electrodes can accommodate a
wide array of sizes. This fixture is adapted to evaluate SMDs between 1.0 mm and 20.0 mm in length.
Figure 26. 16192A
16194A parallel electrode SMD
test fixture
Holds both lead devices and SMDs up to 2 GHz.
It is furnished with two device holders that can
be easily attached to measure either type of DUT.
Figure 27. 16194A
SMD test fixture selection guide
DUT size Side Bottom
electrodes SMD electrode SMD
01005 (inch)/0603 (mm) 16196D –
0201 (inch)/0603 (mm) 16196C 16197A
3
0402 (inch)/1005 (mm) 16196B 16197A
0603 (inch)/1608 (mm) 16196A 16197A
0805 (inch)/2012 (mm) 16192A
2
16197A
1206 (inch)/3216 (mm) 16192A
2
16197A
1210 (inch)/3225 (mm) 16192A
2
16197A
Over 1210 (inch)/3225 (mm) 16192A
2
16191A
2
1. Option E4991A-001 is required.
2. Frequency is limited to 2 GHz.
3. Option 16197A-001.
14
Ordering information
Agilent E4991A RF impedance/
material analyzer includes:
Impedance test head, calibration
kit (50 Ω load, open, short, low
loss capacitor, torque wrench),
power cable, CD-ROM
(firmware/VBA software), and
CD-ROM (manual).
1
Configuration guide
Choose the option from the group
<A> depending on your requirement for frequency reference
function. Then, choose the appropriate options from the option
group <B>, <C>, <D>, and <E>.
❍ Choose ONE and ONLY one
(Options are mutually exclusive)
❑ Choose any combination
<A> For frequency reference function
❍ E4991A-800 standard
frequency reference, no DC
bias
❍ E4991A-1D5 high stability
frequency reference
<B> For test function
❑ E4991A-001 DC bias
❑ E4991A-002 material
measurement firmware
❑ E4991A-007 temperature
characteristic test kit
❑ E4991A-010 probe station
connection kit
<C> For calibration certificate
❑ E4991A-1A7 ISO 17025
compliant calibration
<D> For accessories
❑ E4991A-810 keyboard
❑ E4991A-820 mouse
❑ E4991A-1CM rackmount kit
❑ E4991A-1CN front handle kit
❑ E4991A-1CP handle/rack
mount kit
<E> For manual
2
❑ E4991A-ABA
U.S. - English localization
❑ E4991A-ABJ
Japan - Japanese localization
❑ E4991A-0BW service manual
Accessories
3
16197A4 bottom electrode SMD test
fixture (up to 3 GHz)
Options
16197A-001 add 0201 (inch)/0603
(mm) device guide set
16197A-ABA
U.S. - English localization
16197A-ABJ
Japan - Japanese localization
16196A/B/C/D5parallel electrode
SMD test fixture (up to 3 GHz)
Options
16196A/B/C/D-710 add
magnifying lens and tweezers
16196A/B/C/D-ABJ
Japan - Japanese localization
16196A/B/C/D-ABA
U.S. - English localization
16196U maintenance kits for 16196X
Options
16196U-010 upper electrode set
for 16196A/B/C (5 ea)
16196U-020 upper electrode set
for 16196D (5 ea)
16196U-100 1608 (mm) short
plate set (5 ea)
16196U-110 1608 (mm) lower
electrode set (5 ea)
16196U-200 1005 (mm) short
plate set (5 ea)
16196U-210 1005 (mm) lower
electrode set (5 ea)
16196U-300 0603 (mm) short
plate set (5 ea)
16196U-310 0603 (mm) lower
electrode set (5 ea)
16196U-400 0402 (mm) short
plate set (5 ea)
16196U-410 0402 (mm) lower
electrode set (5 ea)
16191A6bottom electrode SMD test
fixture (DC to 2 GHz)
Options
16191A-701 short bars set
(1 x 1 x 2.4, 1.6 x 2.4 x 2,
3.2 x 2.4 x 2.4, 4.5 x 2.4 x 2.4) mm
16191A-710 add magnifying lens
and tweezers
16191A-010 EIA/EIAJ industry
sized short bar set
16192A6parallel electrode SMD test
fixture (DC to 2 GHz)
Options
16192A-701 short bars set
(1 x 1 x 2.4, 1.6 x 2.4 x 2,
3.2 x 2.4 x 2.4, 4.5 x 2.4 x 2.4) mm
16192A-710 add magnifying lens
and tweezers
16192A-010 EIA/EIAJ industry
sized short bar set
16094A probe test fixture
(up to 125 MHz)
16453A dielectric material test fixture
(up to 1 GHz)
16454A magnetic material test fixture
(up to 1 GHz)
16190B performance kit
16195B 7-mm coaxial calibration kit
16092A SMD test fixture
(up to 500 MHz)
16200B external DC bias adapter
(up to 1 GHz)
82357A USB/GPIB Interface for
Windows
7
1. Test fixtures, a keyboard, a mouse, USB/GPIB Interface, and a printed manual are not furnished as standard.
2. Printed manual is not furnished as standard.
3. Additional accessory details can be found in the Accessories Selection Guide for Impedance Measurements, publication number 5965-4792E.
4. Must specify one of language options (ABA or ABJ) for operation manual for shipment with product.
5. Magnify lens and tweezers are not furnished as standard. Must specify one of language options (ABA or ABJ) for operation manual for
shipment with product.
6. Short bar set, magnify lens, and tweezers are not furnished as standard.
7. The USB/GPIB Interface is required to control external devices.
E4991A Configuration and Accessory Guide
Key Web Resources
Please visit our component
manufacturer industry area at:
www.agilent.com/find/component_test
Please visit our impedance
solutions area at:
www.agilent.com/find/impedance
www.agilent.com/find/emailupdates
Get the latest information on the
products and applications you select.
For Cascade Microtech products,
contact Cascade Microtech, Inc.
Cascade Microtech
2430 NW 206th Avenue
Beaverton, Oregon 97006, U.S.A.
Tel. 503-610-1000
Fax. 506-601-1002
Email sales@cmicro.com
www.cascademicrotech.com
For the ESPEC products, contact
ESPEC Corp.
ESPEC CORP.
3-5-6, Tenjinbashi, Kita-ku, Osaka,
530-8550 Japan
Tel. +81-6-6358-4741
Fax. +81-6-6358-5500
www.espec.co.jp
ESPEC North America, Inc.
425 Gordon Industrial Court, S.W.
Byron Center, MI 49315-8354, U.S.A.
Tel. 616-878-0270
Toll Free 1-800-537-7320
Fax. 616-878-0280
www.espec.com
Windows®is a U.S. registered trademark of
Microsoft Corporation.
Visual Basic®for Applications is a U.S.
registered trademark of Microsoft Corporation.
BluetoothTMis a trademark owned by the
Bluetooth SIG, Inc.
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Our extensive support resources and services can help
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Our Promise means your Agilent test and measurement
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Agilent T&M Software and Connectivity
Agilent’s Test and Measurement software and connectivity
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Product specifications and descriptions in this document
subject to change without notice.
© Agilent Technologies, Inc. 2000, 2003, 2004, 2005
Printed in USA, March 8, 2005
5980-1234E
Phone or Fax
United States:
(tel) 800 829 4444
(fax) 800 829 4433
Canada:
(tel) 877 894 4414
(fax) 800 746 4866
China:
(tel) 800 810 0189
(fax) 800 820 2816
Europe:
(tel) 31 20 547 2111
Japan:
(tel) (81) 426 56 7832
(fax) (81) 426 56 7840
Korea:
(tel) (080) 769 0800
(fax) (080)769 0900
Latin America:
(tel) (305) 269 7500
Taiwan:
(tel) 0800 047 866
(fax) 0800 286 331
Other Asia Pacific
Countries:
(tel) (65) 6375 8100
(fax) (65) 6755 0042
Email: tm_ap@agilent.com
Contacts revised: 1/12/05
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