Agilent E4980A Data Sheet

E4980A Precision LCR Meter
20 Hz to 2 MHz

Data Sheet

Agilent

2

All specifications apply to the conditions of a 0 to 55 °C temperature range, unless
otherwise stated, and 30 minutes after the instrument has been turned on.

Specifications (spec.): Warranted performance. Specifications include guardbands to
account for the expected statistical performance distribution, measurement uncertainties,
and changes in performance due to environmental conditions.

Supplemental information is provided as information that is useful in operating the instru­ment, but is not covered by the product warranty. This information is classified as either
typical or nominal.

Typical (typ.): Expected performance of an average unit without taking guardbands into
account.

Nominal (nom.): A general descriptive term that does not imply a level of performance.

When measurement conditions fall under multiple categories in a table, apply the best value.

For example, basic accuracy Ab is 0.01% under the following conditions;

Measurement time mode SHORT
Test frequency 125 Hz
Test signal voltage 0.3 Vrms

Definitions

How to Use Tables

3

Measurement functions

Measurement parameters

• Cp-D, Cp-Q, Cp-G, Cp-Rp

• Cs-D, Cs-Q, Cs-Rs

• Lp-D, Lp-Q, Lp-G, Lp-Rp, Lp-Rdc

1

• Ls-D, Ls-Q, Ls-Rs, Ls-Rdc

1

•R-X

•Z-θd, Z-θr

•G-B

•Y-θd, Y-θr

• Vdc-Idc

1

Definitions

Cp Capacitance value measured with parallel-equivalent circuit model
Cs Capacitance value measured with series-equivalent circuit model
Lp Inductance value measured with parallel-equivalent circuit model
Ls Inductance value measured with series-equivalent circuit model
D Dissipation factor
Q Quality factor (inverse of D)
G Equivalent parallel conductance measured with parallel-equivalent circuit model
Rp Equivalent parallel resistance measured with parallel-equivalent circuit model
Rs Equivalent series resistance measured with series-equivalent circuit model
Rdc Direct-current resistance
R Resistance
X Reactance
Z Impedance
Y Admittance

θd Phase angle of impedance/admittance (degree)
θr Phase angle of impedance/admittance (radian)

B Susceptance
Vdc Direct-current voltage
Idc Direct-current electricity

Deviation measurement function: Deviation from reference value and percentage of

deviation from reference value can be output as the result.

Equivalent circuits for measurement: Parallel, Series

Impedance range selection: Auto (auto range mode), manual (hold range mode)

Trigger mode: Internal trigger (INT), manual trigger (MAN), external trigger (EXT), GPIB

trigger (BUS)

Basic Specifications

1. Option E4980A-001 is required.

Table 1. Trigger delay time

Range 0 s - 999 s

Resolution 100 µs (0 s - 100 s)

1 ms (100 s - 999 s)

Table 2. Step delay time

Range 0 s - 999 s

Resolution 100 µs (0 s - 100 s)

1 ms (100 s - 999 s)

Measurement terminal: Four-terminal pair

Test cable length: 0 m, 1 m, 2 m, 4 m

Measurement time modes: Short mode, medium mode, long mode.

Table 3. Averaging

Range 1 - 256 measurements

Resolution 1

Test signal

Table 4. Test frequencies

Test frequencies 20 Hz - 2 MHz

Resolution 0.01 Hz (20 Hz - 99.99 Hz)

0.1 Hz (100 Hz - 999.9 Hz)
1 Hz (1 kHz - 9.999 kHz)
10 Hz (10 kHz - 99.99 kHz)
100 Hz (100 kHz - 999.9 kHz)
1 kHz (1 MHz - 2 MHz)

Measurement accuracy ± 0.01%

Table 5. Test signal modes

Normal Program selected voltage or current at the measurement

terminals when they are opened or short-circuited, respectively.

Constant Maintains selected voltage or current at the device under test

(DUT) independently of changes in impedance of DUT.

4

5

Signal level

Table 6. Test signal voltage

Range 0 Vrms - 2.0 Vrms
Resolution 100 µVrms (0 Vrms - 0.2 Vrms)

200 µVrms (0.2 Vrms - 0.5 Vrms)
500 µVrms (0.5 Vrms - 1 Vrms)
1 mVrms (1 Vrms - 2 Vrms)

Accuracy Normal ±(10% + 1 mVrms) Test frequency ≤ 1 MHz: spec.

Constant

1

±(6% + 1 mVrms) Test frequency > 1 MHz: typ.

Table 7. Test signal current

Range 0 Arms - 20 mArms
Resolution 1 µArms (0 Arms - 2 mArms)

2 µArms (2 mArms - 5 mArms)
5 µArms (5 mArms - 10 mArms)
10 µArms (10 mArms - 20 mArms)

Accuracy Normal ±(10% + 10 µArms) Test frequency ≤ 1 MHz: spec.

Constant

1

±(6% + 10 µArms) Test frequency > 1 MHz: typ.

Output impedance: 100 Ω (nominal)

Test signal level monitor function

• Test signal voltage and test signal current can be monitored.

• Level monitor accuracy.

Table 8. Test signal voltage monitor accuracy (Vac)

Test signal voltage

2

Test frequency Specification

5 mVrms - 2 Vrms ≤ 1 MHz ± (3% of reading value + 0.5 mVrms)

> 1 MHz ± (6% of reading value + 1 mVrms)

Table 9. Test signal current monitor accuracy (lac)

Test signal current

2

Test frequency Specification

50 µArms - 20 mArms ≤ 1 MHz ± (3% of reading value + 5 µArms)

> 1 MHz ± (6% of reading value + 10 µArms)

1. When auto level control function is on.

2. Monitored test signal level.

6

Measurement display ranges

Table 10 shows the range of measured value that can be displayed on the screen.

Table 10. Allowable display ranges for measured values

Parameter Measurement display range

Cs, Cp ± 1.000000 aF to 999.9999 EF

Ls, Lp ± 1.000000 aH to 999.9999 EH

D ± 0.000001 to 9.999999

Q ± 0.01 to 99999.99

R, Rs, Rp, ± 1.000000 aΩ to 999.9999 EΩ
X, Z, Rdc

G, B, Y ± 1.000000 aS to 999.9999 ES

Vdc ± 1.000000 aV to 999.9999 EV

Idc ± 1.000000 aA to 999.9999 EA

θr ± 1.000000 arad to 3.141593 rad

θd ± 0.0001 deg to 180.0000 deg

D% ± 0.0001 % to 999.9999 %

a: 1 x 10

-

18

, E: 1 x 10

18

7

Absolute measurement accuracy

The following equations are used to calculate absolute accuracy.

Absolute accuracy Aa of |Z|, |Y|, L, C, R, X, G, B (L, C, X, and B accuracies apply
when Dx ≤ 0.1, R and G accuracies apply when Qx ≤ 0.1 )

Equation 1. Aa = Ae + Acal

Aa Absolute accuracy (% of reading value)
Ae Relative accuracy (% of reading value)
Acal Calibration accuracy (%)

where G accuracy is applied only to G-B measurements.

D accuracy (when Dx ≤ 0.1)

Equation 2. De + θcal

Dx Measured D value
De Relative accuracy of D

θcal Calibration accuracy of θ (radian)

Q accuracy (When Qx × Da < 1)

Equation 3.

±

(Qx

2

×

Da)

(1 Qx × Da)

Qx Measured Q value
Da Absolute accuracy of D

θ accuracy

Equation 4. θe + θcal

θe Relative accuracy of θ (degree)
θcal Calibration accuracy of θ (degree)

±

8

G accuracy (when Dx ≤ 0.1)

Equation 5. Bx + Da (S)

Bx = 2πfCx =

1

2πfLx

Dx Measured D value
Bx Measured B value (S)
Da Absolute accuracy of D
f Test frequency (Hz)
Cx Measured C value (F)
Lx Measured L value (H)

where the accuracy of G is applied to Cp-G measurements.

Absolute accuracy of Rp (when Dx ≤ 0.1)

Equation 6.

±

Rpx × Da

(Ω)

Dx Da

Rpx Measured Rp value (Ω)
Dx Measured D value
Da Absolute accuracy of D

Absolute accuracy of Rs (when Dx ≤ 0.1)

Equation 7. Xx × Da (Ω)

Xx = 1 = 2πfLx

2πfCx

Dx Measured D value
Xx Measured X value (Ω)
Da Absolute accuracy of D
f Test frequency (Hz)
Cx Measured C value (F)
Lx Measured L value (H)

±

9

Relative accuracy

Relative accuracy includes stability, temperature coefficient, linearity, repeatability, and
calibration interpolation error. Relative accuracy is specified when all of the following
conditions are satisfied:

• Warm-up time: 30 minutes

• Test cable length: 0 m, 1 m, 2 m, or 4 m (Agilent 16047A/B/D/E)

• DC bias current level monitor ≤ 100 mA

• The DC bias current does not exceed a set value within each range of the DC
bias current

• A “Signal Source Overload” warning does not appear.
When the test signal current exceeds a value in table 11 below, a “Signal
Source Overload” warning appears.

Table 11.

Test signal voltage Test frequency Condition

1

≤ 2 Vrms – –
> 2 Vrms ≤ 1 MHz the smaller value of either 110 mA or

130 mA - 0.0015 × Vac × (Fm / 1 MHz) × (L_cable + 0.5)

> 1 MHz 70 mA - 0.0015 × Vac × (Fm / 1 MHz) × (L_cable + 0.5)

Vac [V] Test signal voltage
Fm [Hz] Test frequency
L_cable [m] Cable length

• OPEN and SHORT corrections have been performed.

• Bias current isolation: Off

• The optimum impedance range is selected by matching the impedance of DUT to the
effective measuring range.

|Z|, |Y|, L, C, R, X, G, and B accuracy (L, C, X, and B accuracies apply when
Dx ≤ 0.1, R and G accuracies apply Qx ≤ 0.1)

Relative accuracy Ae is given as:
Equation 8. Ae = [Ab + Zs /|Zm| × 100 + Yo × |Zm| × 100 ] × Kt

Zm Impedance of DUT
Ab Basic accuracy
Zs Short offset
Yo Open offset
Kt Temperature coefficient

D accuracy

D accuracy De is given as

• when Dx ≤ 0.1

Equation 9. De = ±Ae/100

Dx Measured D value
Ae Relative accuracies of |Z|, |Y|, L, C, R, X, G, and B

• when Dx > 0.1, multiply De by (1 + Dx)

1. When the calculation result is a negative value,
0 A is applied.

10

Q accuracy (when Q x De < 1)

Q accuracy Qe is given as:

Equation 10. Qe = ±

(Qx

2

× De)

(1 Qx × De)

Qx Measured Q value
De Relative D accuracy

θ accuracy
θ accuracy θe is given as:

Equation 11. θe =

180 × Ae

(deg)

π× 100

Ae Relative accuracies of |Z|, |Y|, L, C, R, X, G, and B

G accuracy (when Dx ≤ 0.1)

G accuracy Ge is given as:

Equation 12. Ge = Bx × De (S)

Bx = 2πfCx =

1

2πfLx

Ge Relative G accuracy
Dx Measured D value
Bx Measured B value
De Relative D accuracy
f Test frequency
Cx Measured C value (F)
Lx Measured L value (H)

Rp accuracy (when Dx ≤ 0.1)

Rp accuracy Rpe is given as:

Equation 13. Rpe = ±

Rpx × De

(Ω)

Dx De

Rpe Relative Rp accuracy
Rpx Measured Rp value (Ω)
Dx Measured D value
De Relative D accuracy

Rs accuracy (when Dx ≤ 0.1)

Rs accuracy Rse is given as:

Equation 14. Rse = Xx × De (Ω)

Xx = 1 = 2πfLx

2πfCx

Rse Relative Rs accuracy
Dx Measured D value
Xx Measured X value (Ω)
De Relative D accuracy
f Test frequency (Hz)
Cx Measured C value (F)
Lx Measured L value (H)

±

±

11

Example of C-D accuracy calculation

Measurement conditions

Test Frequency: 1 kHz
Measured C value: 100 nF
Test signal voltage: 1 Vrms
Measurement time mode: Medium
Measurement temperature: 23 °C

Ab = 0.05%
|Zm| = 1 / (2π×1 × 10

3

× 100 × 10-9) = 1590 Ω
Zs = 0.6 mΩ×(1 + 0.400/1) × (1 + √(1000/1000) = 1.68 mΩ
Yo = 0.5 nS × (1 + 0.100/1) × (1 + √(100/1000) = 0.72 nS
C accuracy: Ae = [0.05 + 1.68 m/1590 × 100 + 0.72 n × 1590 × 100] × 1 = 0.05%
D accuracy: De = 0.05/100 = 0.0005

Basic accuracy

Basic accuracy Ab is given below.

Table 12. Measurement time mode = SHORT

Test signal voltage

Test 5 mVrms - 50 mVrms - 0.3 Vrms - 1 Vrms - 10 Vrms ­frequency [Hz] 50 mVrms 0.3 Vrms 1 Vrms 10 Vrms 20 Vrms

20 - 125 (0.6%) × 0.60% 0.30% 0.30% 0.30%

(50 mVrms/Vs)

125 - 1 M (0.2%) × 0.20% 0.10% 0.15% 0.15%

(50 mVrms/Vs)

1 M - 2 M (0.4%) × 0.40% 0.20% 0.30% 0.30%

(50 mVrms/Vs)

Table 13. Measurement time mode = MED, LONG

Test signal voltage

Test 5 mVrms - 50 mVrms - 0.3 Vrms - 1 Vrms - 10 Vrms ­frequency [Hz] 50 mVrms 0.3 Vrms 1 Vrms 10 Vrms 20 Vrms

20 - 125 (0.25%) × 0.25% 0.10% 0.15% 0.15%

(30 mVrms/Vs)

125 - 1 M (0.1%) × 0.10% 0.05% 0.10% 0.15%

(30 mVrms/Vs)

1 M - 2 M (0.2%) × 0.20% 0.10% 0.20% 0.30%

(30 mVrms/Vs)

Vs [Vrms] Test signal voltage

12

Effect by impedance of DUT

Table 14. For impedance of DUT below 30 Ω, the following value is added.

Test Impedance of DUT
frequency [Hz] 1.08 Ω≤|Zx| < 30 Ω |Zx| < 1.08 Ω

20 - 1 M 0.05% 0.10%
1 M - 2 M 0.10% 0.20%

Table 15. For impedance of DUT over 9.2 k Ω, the following value is added.

Test Impedance of DUT
frequency [Hz] 9.2 kΩ < |Zx| ≤ 92 kΩ 92 kΩ < |Zx|

10 k - 100 k 0% 0.05%
100 k - 1 M 0.05% 0.05%
1 M - 2 M 0.10% 0.10%

Effect from cable extension

When the cable is extended, the following element is added per one meter.

0.015 % × (Fm/1 MHz)

2

× (L_cable)

2

Fm [Hz] Test Frequency
L_cable [m] Cable length

13

Short offset Zs

Table 16. Impedance of DUT > 1.08 Ω

Test Measurement time mode
frequency [Hz] SHORT MED, LONG

20 - 2 M 2.5 mΩ×(1 + 0.400/Vs) × 0.6 mΩ×(1 + 0.400/Vs) ×

(1 + √(1000/Fm)) (1 + √(1000/Fm))

Table 17. Impedance of DUT ≤ 1.08 Ω

Test Measurement time mode
frequency [Hz] SHORT MED, LONG

20 - 2 M 1 mΩ×(1 + 1/Vs) × 0.2 mΩ×(1 + 1/Vs) ×

(1 + √(1000/Fm)) (1 + √(1000/Fm))

Vs [Vrms] Test signal voltage
Fm [Hz] Test frequency

Effect from cable extension (Short offset)

Table 18. When the cable is extended, the following value is added to Zs
(independent of the measurement time mode).

Test Cable length
frequency [Hz] 0 m 1 m 2 m 4 m

20 - 1 M 0 0.25 mΩ 0.5 mΩ 1 mΩ
1 M - 2 M 0 1 mΩ 2 mΩ 4 mΩ

Open offset Yo

Table 19. Test signal voltage ≤ 2.0 Vrms

Test Measurement time mode
frequency [Hz] SHORT MED, LONG

20 - 100 k 2 nS × (1 + 0.100/Vs) × 0.5 nS × (1 + 0.100/Vs) ×

(1 + √(100/Fm)) (1 + √(100/Fm))
100 k - 1 M 20 nS × (1 + 0.100/Vs) 5 nS × (1 + 0.100/Vs)
1 M - 2 M 40 nS × (1 + 0.100/Vs) 10 nS × (1 + 0.100/Vs)

Table 20. Test signal voltage > 2.0 Vrms

Test Measurement time mode
frequency [Hz] SHORT MED, LONG

20 - 100 k 2 nS × (1 + 2/Vs) × 0.5 nS × (1 + 2/Vs) ×

(1 + √(100/Fm)) (1 + √(100/Fm))
100 k - 1 M 20 nS × (1 + 2/Vs) 5 nS × (1 + 2/Vs)
1 M - 2 M 40 nS × (1 + 2/Vs) 10 nS × (1 + 2/Vs)

Vs [Vrms] Test signal voltage
Fm [Hz] Test frequency

14

Effect from cable length

Table 21. When the cable is extended, multiply Yo by the following factor.

Test Cable length
frequency [Hz] 0 m 1 m 2 m 4 m

100 - 100 k 1 1 + 5 × Fm/1 MHz 1 + 10 × Fm/1 MHz 1 + 20 × Fm/1 MHz
100 k - 1 M 1 1 + 0.5 × Fm/1 MHz 1 + 1 × Fm/1 MHz 1 + 2 × Fm/1 MHz
1 M - 2 M 1 1 + 1 × Fm/1 MHz 1 + 2 × Fm/1 MHz 1 + 4 × Fm/1 MHz

Fm [Hz] Test frequency

Temperature factor Kt

Table 22. The temperature factor Kt is given below.

Temperature [°C] Kt

0 - 18 4
18 - 28 1
28 - 55 4

15

Calibration accuracy Acal

Calibration accuracy Acal is given below.
For impedance of DUT on the boundary line, apply the smaller value.

Table 23. Impedance range = 0.1, 1, 10 Ω

Test frequency [Hz]

20 - 1 k 1 k - 10 k 10 k -100 k 100 k - 300 k 300 k - 1 M 1 M - 2 M

|Z| [%] 0.03 0.05 0.05 0.05 + 0.05 + 0.1 +

5 × 10

-5

Fm 5 × 10

-5

Fm 1 × 10

-4

Fm

θ [radian] 1 × 10-42 × 10

-4

3 × 10

-4

3 × 10-4+ 3 × 10-4+6 × 10-4+
2 × 10

-7

Fm 2 × 10

-7

Fm 4 × 10

-7

Fm

Table 24. Impedance range = 100 Ω

Test frequency [Hz]

20 - 1 k 1 k - 10 k 10 k -100 k 100 k - 300 k 300 k - 1 M 1 M - 2 M

|Z| [%] 0.03 0.05 0.05 0.05 + 0.05 + 0.1 +

5 × 10

-5

Fm 5 × 10

-5

Fm 1 × 10

-4

Fm

θ [radian] 1 × 10

-4

2 × 10

-4

3 × 10

-4

3 × 10

-4

3 × 10

-4

6 × 10

-4

Table 25. Impedance range = 300, 1 kΩ

Test frequency [Hz]

20 - 1 k 1 k - 10 k 10 k -100 k 100 k - 300 k 300 k - 1 M 1 M - 2 M

|Z| [%] 0.03 0.03 0.05 0.05 0.05 0.1
θ [radian] 1 × 10-41 × 10

-4

3 × 10

-4

3 × 10

-4

3 × 10

-4

6 × 10

-4

Table 26. Impedance range = 3 k, 10 kΩ

Test frequency [Hz]

20 - 1 k 1 k - 10 k 10 k -100 k 100 k - 300 k 300 k - 1 M 1 M - 2 M

|Z| [%] 0.03 + 0.03 + 0.03 + 0.03 + 0.03 + 0.06 +

1 × 10

-4

Fm 1 × 10

-4

Fm 1 × 10

-4

Fm 1 × 10

-4

Fm 1 × 10

-4

Fm 2 × 10

-4

Fm

θ [radian] (100 + (100 + (100 + (100 + (100 + (200 +

2.5 Fm) × 10-62.5 Fm) × 10-62.5 Fm) × 10-62.5 Fm) × 10-62.5 Fm) × 10-65 Fm) × 10

-6

Table 27. Impedance range = 30 k, 100 kΩ

Test frequency [Hz]

20 - 1 k 1 k - 10 k 10 k -100 k 100 k - 300 k 300 k - 1 M 1 M - 2 M

|Z| [%] 0.03 + 0.03 + 0.03 + 0.03 + 0.03 + 0.06 +

1 × 10

-3

Fm 1 × 10

-3

Fm 1 × 10

-3

Fm 1 × 10

-3

Fm 1 × 10

-4

Fm 2 × 10

-4

Fm

θ [radian] (100 + (100 + (100 + (100 + (100 + (200 +

20 Fm) × 10-620 Fm) × 10-620 Fm) × 10-620 Fm) × 10-62.5 Fm) × 10-65 Fm) × 10

-6

Fm[kHz] Test frequency

16

Measurement accuracy

The impedance measurement calculation example below is the result of absolute
measurement accuracy.

Figure 1. Impedance measurement accuracy (Test signal voltage = 1 Vrms, cable length=0 m,
measurement time mode = MED)

[ S ]

10n

100n

10µ

100µ

1m

10m

1kH

100aF

100H

10H

1H

10pF

1n

1G

100pF

100M

1nF

10M

1pF

100fF

1MH

100kH

10.0%

1.0%

10fF

10kH

1fF

0.3%

10nF

1µ

1M

100nF

100k

1µF

10k

[Ω]

1k

100

10µF

C

100µF

0.1%

0.1%

100mH

10mH

1mH

100µH

10µH

100m

100

1mF

10

10mF

1

1

0.3%

100mF

10

100m

10m

1.0%

1F

10.0%

10

1m

20 100 1k 10k 100k 1M 2M

Frequency [ Hz ]

1µH

100nH

10nH

1nH

100pH

17

Compensation function

Table 28. The E4980A provides three types of compensation functions:
OPEN compensation, SHORT compensation, and LOAD compensation.

Type of compensation Description

OPEN compensation Compensates errors caused by the stray admittance (C, G)

of the test fixture.

SHORT compensation Compensates errors caused by the residual impedance (L, R)

of the test fixture.

LOAD compensation Compensates errors between the actual measured value

and a known standard value under the measurement conditions
desired by the user.

List sweep

Points: There is a maximum of 201 points.

First sweep parameter (primary parameter): Test frequency, test signal voltage, test

signal current, test signal voltage of DC bias signal, test signal current of DC bias
signal, DC source voltage.

Second sweep parameter (secondary parameter): None, impedance range, test
frequency, test signal voltage, test signal current, test signal voltage of DC bias signal,
test signal current of DC bias signal, DC source voltage

Trigger mode

Sequential mode: When the E4980A is triggered once, the device is measured at all

sweep points. /EOM/INDEX is output only once.

Step mode: The sweep point is incremented each time the E4980A is triggered.
/EOM/INDEX is output at each point, but the result of the comparator function of the list
sweep is available only after the last /EOM is output.

Note

A parameter selected for one of the two
parameters cannot be selected for the other
parameter. It is not possible to set up a
combination of test signal voltage and test
signal current or one of test signal voltage of
DC bias signal and test signal current of DC bias.

The secondary parameter can be set only with
SCPI commands.

18

Comparator function of list sweep: The comparator function enables setting one pair of
lower and upper limits for each measurement point.

You can select from: Judge with the first sweep parameter/Judge with the second
parameter/Not used for each pair of limits.

Time stamp function: In the sequential mode, it is possible to record the measurement
starting time at each measurement point by defining the time when FW detects a trigger
as 0 and obtain it later with the SCPI command.

Comparator function

Bin sort: The primary parameter can be sorted into 9 BINs, OUT_OF_BINS, AUX_BIN,

and LOW_C_REJECT. The secondary parameter can be sorted into HIGH, IN, and LOW.
The sequential mode and tolerance mode can be selected as the sorting mode.

Limit setup: Absolute value, deviation value, and % deviation value can be used for setup.

BIN count: Countable from 0 to 999999.

DC bias signal

Table 29. Test signal voltage

Range 0 V to +2 V
Resolution 0 V / 1.5 V / 2 V only
Accuracy 0.1% + 2 mV (23 °C ± 5 °C)

(0.1% + 2 mV) × 4
(0 to 18 °C or 28 to 55 °C)

Output impedance: 100 Ω (nominal)

Measurement assistance functions

Data buffer function: Up to 201 measurement results can be read out in a batch.

Save/Recall function:

• Up to 10 setup conditions can be written to/read from the built-in non-volatile memory.

• Up to 10 setup conditions can be written to/read from the USB memory.

• Auto recall function can be performed when the setting conditions are written to

Register 10 of the USB memory.

Key lock function: The front panel keys can be locked.

GPIB: 24-pin D-Sub (Type D-24), female; complies with IEEE488.1, 2 and SCPI.

USB host port: Universal serial bus jack, type-A (4 contact positions, contact 1 is on

your left), female (for connection to USB memory only).

USB interface port: Universal serial bus jack, type mini-B (4 contact positions); complies
with USBTMC-USB488 and USB 2.0; female; for connection to the external controller.

USBTMC: Abbreviation for USB Test & Measurement Class

LAN: 10/100 BaseT Ethernet, 8 pins (two speed options)

Note

The following USB memory can be used.
Complies with USB 1.1; mass storage class,
FAT16/FAT32 format; maximum
consumption current is below 500 mA.

19

The following options are available for the E4980A LCR Meter.

Option 001 (Power and DC bias enhancement)

Increases test signal voltage and adds the variable DC bias voltage function.

Measurement parameters

The following parameters can be used.

• Lp-Rdc

• Ls-Rdc

• Vdc-Idc

where

Rdc Direct-current resistance (DCR)
Vdc Direct-current voltage
Idc Direct-current electricity

Test signal

Signal level

Table 30. Test signal voltage

Range 0 Vrms to 20 Vrms (test frequency ≤ 1 MHz)

0 Vrms to 15 Vrms (test frequency > 1 MHz)

Resolution 100 µVrms (0 Vrms - 0.2 Vrms)

200 µVrms (0.2 Vrms - 0.5 Vrms)
500 µVrms (0.5 Vrms - 1 Vrms)
1 mVrms (1 Vrms - 2 Vrms)
2 mVrms (2 Vrms - 5 Vrms)
5 mVrms (5 Vrms - 10 Vrms)
10 mVrms (10 Vrms - 20 Vrms)

Setup accuracy normal ±(10% + 1 mVrms) (test signal voltage ≤ 2 Vrms)

(test frequency ≤ 1 MHz : spec., test frequency > 1 MHz : typ.)
±(10% + 10 mVrms) (Test frequency ≤ 300 kHz,
test signal voltage > 2 Vrms) (spec.)
±(15% + 20 mVrms) (test frequency > 300 kHz,
test signal voltage > 2 Vrms) (test frequency ≤ 1 MHz : spec.,
test frequency > 1 MHz : typ.)

Constant1±(6% + 1 mVrms) (test signal voltage ≤ 2 Vrms)

(test frequency ≤ 1 MHz : spec. , test frequency > 1 MHz : typ.)
±(6% + 10 mVrms) (test frequency ≤ 300 kHz,
test signal voltage > 2 Vrms) (spec.)
±(12% + 20 mVrms) (test frequency > 300 kHz,
test signal voltage > 2 Vrms) (test frequency ≤ 1 MHz : spec.,
test frequency > 1 MHz : typ.)

Options

Note

Option xxx is described as E4980A-xxx in the
order information

1. When auto level control function is on.

20

Table 31. Test signal current

Range 0 Arms - 100 mArms
Resolution 1 µArms (0 Arms - 2 mArms)

2 µArms (2 mArms - 5 mArms)
5 µArms (5 mArms - 10 mArms)
10 µArms (10 mArms - 20 mArms)
20 µArms (20 mArms - 50 mArms)
50 µArms (50 mArms - 100 mArms)

Setup accuracy normal ±(10% + 10 µArms) (test signal voltage ≤ 20 mArms)

(test frequency ≤ 1 MHz : spec., test frequency > 1 MHz : typ.)
±(10% + 100 µArms) (test frequency ≤ 300 kHz,
test signal current > 20 mArms) (spec.)
±(15% + 200 µArms) (test frequency > 300 kHz,
test signal voltage > 20 mArms) (test frequency ≤ 1 MHz : spec.,
test frequency > 1 MHz : typ.)

Constant1±(6% + 10 µArms) (test signal voltage ≤ 20 mArms)

(test frequency ≤ 1 MHz : spec. , test frequency > 1 MHz : typ.)
±(6% + 100 µArms) (test frequency ≤ 300 kHz,
test signal voltage > 20 mArms) (spec.)
±(12% + 200 µArms) (test frequency > 300 kHz,
test signal voltage > 20 mArms) (test frequency ≤ 1 MHz : spec.,
test frequency > 1 MHz : typ.)

Test signal level monitor function

• Test signal voltage and test signal current can be monitored.

• Level monitor accuracy:

Table 32. Test signal voltage monitor accuracy (Vac)

Test signal voltage

2

Test frequency Specification

5 mVrms to 2 Vrms ≤ 1 MHz ±(3% of reading value + 0.5 mVrms)

> 1MHz ±(6% of reading value + 1 mVrms)

> 2 Vrms ≤ 300 kHz ±(3% of reading value + 5 mVrms)

> 300 kHz ±(6% of reading value + 10 mVrms)

3

Table 33. Test signal current monitor accuracy (Iac)

Test signal current

2

Test frequency Specification

50 µArms to 20 mArms ≤ 1 MHz ±(3% of reading value + 5 µArms)

> 1MHz ±(6% of reading value + 10 µArms)

> 20 mArms ≤ 300 kHz ±(3% of reading value + 50 µArms)

> 300 kHz ±(6% of reading value + 100 µArms)

1. When auto level control function is on.

2. Monitored signal level.

3. Typ. when test frequency is > 1 MHz with test signal voltage > 10 Vrms.

21

DC bias signal

Table 34. Test signal voltage

Range –40 V to +40 V
Resolution Setup resolution: 100 µV, effective

resolution: 330 µV ±(0 V - 5 V)
1 mV ±(5 V - 10 V)
2 mV ±(10 V - 20 V)
5 mV ±(20 V - 40 V)

Accuracy test signal voltage ≤ 2 Vrms 0.1% + 2 mV (23 °C ± 5 °C)

(0.1% + 2 mV) x 4
(0 to 18 °C or 28 to 55 °C)

test signal voltage > 2 Vrms 0.1 % + 4 mV (23 °C ± 5 °C)

(0.1% + 4 mV) x 4
(0 to 18 °C or 28 to 55 °C)

Table 35. Test signal current

Range –100 mA - 100 mA
Resolution Setup resolution: 1 µA, effective

resolution: 3.3 µA ±(0 A - 50 mA)
10 µA ±(50 mA - 100 mA)

DC bias voltage level monitor Vdc

(0.5% of reading value + 60 mV) × Kt

When using Vdc-Idc measurement: (spec.)

When using level monitor: (typ.)

Kt Temperature coefficient

DC bias current level monitor Idc

(A [%] of the measurement value + B [A]) × Kt

When using Vdc-Idc measurement: (spec.)

When using level monitor: (typ.)

A [%] When the measurement time mode is SHORT: 2%

When the measurement time mode is MED or LONG: 1%

B [A] given below

Kt Temperature coefficient

When the measurement mode is SHORT, double the following value.

22

Table 36. Test signal voltage ≤ 0.2 Vrms (measurement time mode = MED, LONG)

DC bias Impedance range [Ω]
current range < 100 100 300, 1 k 3 k, 10 k 30k, 100 k

20 µA 150 µA 30 µA 3 µA 300 nA 45 nA
200 µA 150 µA 30 µA 3 µA 300 nA 300 nA
2 mA 150 µA 30 µA 3 µA 3 µA 3 µA
20 mA 150 µA 30 µA 30 µA 30 µA 30 µA
100 mA 150 µA 150 µA 150 µA 150 µA 150 µA

Table 37. 0.2 Vrms < test signal voltage ≤ 2 Vrms
(measurement time mode = MED, LONG)

DC bias Impedance range [Ω]
current range < 100 100, 300 1k, 3 k 10k, 30 k 100 k

20 µA 150 µA 30 µA 3 µA 300 nA 45 nA
200 µA 150 µA 30 µA 3 µA 300 nA 300 nA
2 mA 150 µA 30 µA 3 µA 3 µA 3 µA
20 mA 150 µA 30 µA 30 µA 30 µA 30 µA
100 mA 150 µA 150 µA 150 µA 150 µA 150 µA

Table 38. Test signal voltage > 2 Vrms (measurement time mode = MED, LONG)

DC bias Impedance range [Ω]
current range ≤ 300 1 k, 3 k 10k, 30 k 100 k

20 µA 150 µA 30 µA 3 µA 300 nA
200 µA 150 µA 30 µA 3 µA 300 nA
2 mA 150 µA 30 µA 3 µA 3 µA
20 mA 150 µA 30 µA 30 µA 30 µA
100 mA 150 µA 150 µA 150 µA 150 µA

DC source signal

Table 39. Test signal voltage

Range –10 V to 10 V
Resolution 1 mV
Accuracy 0.1% + 3 mV (23 °C ± 5 °C)

(0.1% + 3 mV) x 4
(0 to 18 °C or 28 to 55 °C)

Table 40. Test signal current

Range –45 mA to 45 mA (nominal)

Output impedance

100 Ω (nominal)

23

DC resistance (Rdc) accuracy

Absolute measurement accuracy Aa

Absolute measurement accuracy Aa is given as

Equation 15. Aa = Ae + Acal

Aa Absolute accuracy (% of reading value)
Ae Relative accuracy (% of reading value)
Acal Calibration accuracy

Relative measurement accuracy Ae

Relative measurement accuracy Ae is given as
Equation 16. Ae = [Ab + (Rs /|Rm|+ Go × |Rm|) × 100 ] × Kt

Rm Measurement value
Ab Basic accuracy
Rs Short offset [Ω]
Go Open offset [S]
Kt Temperature coefficient

Calibration accuracy Acal

Calibration accuracy Acal is 0.03%.

Basic accuracy Ab

Table 41. Basic accuracy Ab is given below.

Measurement Test signal voltage
time mode ≤ 2 Vrms > 2 Vrms

SHORT 1.00% 2.00%
MED 0.30% 0.60%

Open offset Go

Table 42. Open offset Go is given below.

Measurement Test signal voltage
time mode ≤ 2 Vrms > 2 Vrms

SHORT 50 nS 500 nS
MED 10 nS 100 nS

Short offset Rs

Table 43. Short offset Rs is given below.

Measurement Test signal voltage
time mode ≤ 2 Vrms > 2 Vrms

SHORT 25 mΩ 250 mΩ
MED 5 mΩ 50 mΩ

24

Effect from cable length (Short offset)

Table 44. The following value is added to Rs when the cable is extended.

Cable length
1 m 2 m 4 m

0.25 mΩ 0.5 mΩ 1 mΩ

Temperature coefficient Kt

Table 45. Temperature coefficient Kt is given below.

Temperature [°C] Kt

0 - 18 4
18 - 28 1
28 - 55 4

Other options

Option 002 (Bias current interface): Adds a digital interface to allow the E4980A LCR

meter to control the Agilent 42841A bias current source.

Option 005 (Entry model): Economy option with less measurement speed.
Same measurement accuracy as the standard model.

Option 007 (Standard model): Upgrade to the standard model.

Option 201 (Handler interface): Adds handler interface.

Option 301 (Scanner interface): Adds scanner interface.

Note

Option 007 can be installed only in the E4980A
with option 005.

25

Table 46. Power source

Voltage 90 VAC - 264 VAC
Frequency 47 Hz - 63 Hz
Power consumption Max. 150 VA

Table 47. Operating environment

Temperature 0 - 55 °C
Humidity 15% - 85% RH

(≤ 40 °C, no condensation)
Altitude 0 m - 2000 m

Table 48. Storage environment

Temperature –20 - 70 °C
Humidity 0% - 90% RH

( ≤ 60 °C, no condensation)
Altitude 0 m - 4572 m

Outer dimensions: 375 (width) x 105 (height) × 390 (depth) mm (nominal)

Figure 2. Dimensions (front view, with handle and bumper, in millimeters, nominal)

Figure 3. Dimensions (front view, without handle and bumper, in millimeters, nominal)

General specifications

367.4

14.4 14.4338.6

41.8

E4980A

20 Hz - 2 MHz

Recall A Recall B

Precision LCR Meter

789

456

123

.

Meas
Setup

DC Source
(Option 001)

0

10VDC Max

Display

Format

Save/
Recall

Return

Local/

System

Lock

DC

Source

Discharge test device before connecting
42V Peak Max Output CAT I

L

CUR

103.8

55.0

Preset

Trigger

DC Bias

DC

Source

319.1

E4980A

20 Hz - 2 MHz

Recall A Recall B

Precision LCR Meter

789

456

123

.

Meas
Setup

DC Source
(Option 001)

0

10VDC Max

Display

Format

Save/
Recall

Return

Local/

System

Lock

DC

Source

Discharge test device before connecting
42V Peak Max Output CAT I

L

CUR

2755.2

88.3

Preset

Trigger

DC Bias

DC

Source

L

L

POT

POT

DC

Bias

UNKNOWN

DC
Bias

UNKNOWN

USB

H

POT

2222222755.2 40.1

USB

H

POT

222222 30.3

28.027.3

H

CUR

32.0

21.8

H

CUR

18.0

26

Figure 4. Dimensions (rear view, with handle and bumper, in millimeters, nominal)

Figure 5. Dimensions (front view, without handle and bumper, in millimeters, nominal)

Option 301: Scanner Interface

Option 201: Handler Interface

Option 002: DC Current Control Interface

rigger

GPIB

LAN

LINE

115V

-230V
50/60Hz
150V

A MAX

Fuse

T3A , 250V

E4980A

Option 710: No Interface

Option 710: No Interface

17.6

rigger

GPIB

LAN

LINE

115V

-230V
50/60Hz
150V

A MAX

Fuse

T3A , 250V

E4980A

Option 710: No Interface

Option 710: No Interface

118.1

367.4

332.2

23.241.6 34.7

17.6

23.9

E4980A

Option 710: No Interface

101.6

115V

-230V
50/60Hz
150V

Fuse

T3A , 250V

Serial Label

LINE

A MAX

Option 710: No Interface

GPIB

55.0 28.0

113.9 72.3 72.3 31.1

17.1

49.3

Option 002: DC Current Control Interface

36.2

72.3

Option 301: Scanner Interface

72.3

0.4

Option 201: Handler Interface

36.2

317.8

110.9

19.6

Serial Label

E4980A

Option 710: No Interface

84.4

36.5 23.7

GPIB

LINE

115V

-230V
50/60Hz
150V

A MAX

Fuse

T3A , 250V

25.7

LAN

36.2

72.3

21.3

Option 710: No Interface

Trigger

23.241.6 27.5

LAN

Trigger

26.63725.5

20.9

22.23712.7

106.7

72.3 72.3 24.0

0.4

Option 301: Scanner Interface Option 201: Handler InterfaceOption 002: DC Current Control Interface

27

Figure 6. Dimensions (side view, with handle and bumper, in millimeters, nominal )

Figure 7. Dimensions (side view, without handle and bumper, in millimeters, nominal)

Weight: 5.3 kg (nominal)
Display: LCD, 320 × 240 (pixels), RGB color

The following items can be displayed:

• measurement value

• measurement conditions

• limit value and judgment result of comparator

• list sweep table

• self-test message

66.6

Note

Effective pixels are more than 99.99%. There
may be 0.01% (approx. 7 pixels) or smaller
missing pixels or constantly lit pixels, but this is
not a malfunction.

388.7

103.8

55.0

1

4

1

.4

15.7

21.921.9

88.3

45.7

19.7

50.9

374.0

101.6

10.5347.9

84.4

28

Description Supplemental Information

EMC

European Council Directive 89/336/EEC, 92/31/EEC, 93/68/EEC
IEC 61326-1:1997 +A1:1998 +A2:2000
EN 61326-1:1997 +A1:1998 +A2:2001
CISPR 11:1997 +A1:1999 +A2:2002
EN 55011:1998 +A1:1999 +A2:2002 Group 1, Class A
IEC 61000-4-2:1995 +A1:1998 +A2:2001
EN 61000-4-2:1995 +A1:1998 +A2:2001 4 kV CD/8 kV AD
IEC 61000-4-3:1995 +A1:1998 +A2:2001
EN 61000-4-3:1996 +A1:1998 +A2:2001 3 V/m, 80-1000 MHz, 80% AM
IEC 61000-4-4:1995 +A1:2001 +A2:2001
EN 61000-4-4:1995 +A1:2001 +A2:2001 1 kV power /0.5 kV Signal
IEC 61000-4-5:1995 +A1:2001
EN 61000-4-5:1995 +A1:2001 0.5 kV Normal/1 kV Common
IEC 61000-4-6:1996 +A1:2001
EN 61000-4-6:1996 +A1:2001 3 V, 0.15-80 MHz, 80% AM
IEC 61000-4-11:1994 +A1:2001
EN 61000-4-11:1994 +A1:2001 100% 1cycle

ICES/NMB-001 This ISM device complies with Canadian ICES-001:1998.

Cet appareil ISM est conforme a la norme NMB-001 du Canada.

AS/NZS 2064.1 Group 1, Class A

Safety

European Council Directive 73/23/EEC, 93/68/EEC
IEC 61010-1:2001/EN 61010-1:2001

Measurement Category I, Pollution Degree 2, Indoor Use

IEC60825-1:1994 Class 1 LED

CAN/CSA C22.2 61010-1-04

Measurement Category I, Pollution Degree 2, Indoor Use

Environment

This product complies with the WEEE Directive (2002/96/EC)
marking requirements. The affixed label indicates that you must
not discard this electrical/electronic product in domestic house
hold waste.
Product Category: With reference to the equipment types in the
WEEE Directive Annex I, this product is classed as a “Monitoring
and Control instrumentation” product.

29

Settling time

Table 49. Test frequency setting time

Test frequency setting time Test frequency (Fm)

5 mS Fm ≥ 1 kHz
12 mS 1 kHz > Fm ≥ 250 Hz
22 mS 250 Hz > Fm ≥ 60 Hz
42 mS 60 Hz > Fm

Table 50. Test signal voltage setting time

Test signal voltage setting time Test frequency (Fm)

11 mS Fm ≥ 1 kHz
18 mS 1 kHz > Fm ≥ 250 Hz
26 mS 250 Hz > Fm ≥ 60 Hz
48 mS 60 Hz > Fm

Switching of the impedance range is as follows:
≤ 5 mS/ range switching

Measurement circuit protection

The maximum discharge withstand voltage, where the internal circuit remains protected
if a charged capacitor is connected to the UNKNOWN terminal, is given below.

Table 51. Maximum discharge withstand voltage

Maximum discharge withstand voltage Range of capacitance value C of DUT

1000 V C < 2 µF

`

2/C V

2 µF ≤ C

Figure 8. Maximum discharge withstand voltage

Supplemental
Information

Note

Discharge capacitors before connecting them
to the UNKNOWN terminal or a test fixture to
avoid damages to the instrument.

0

200

400

600

800

1000

1200

1.E–15 1.E–13 1.E–11 1.E–09 1.E–07 1.E–05 1.E–03

Voltage [V]

Capacitance [F]

30

Measurement time

Definition

This is the time between the trigger and the end of measurement (EOM) output on the
handler interface.

Conditions

Table 51 shows the measurement time when the following conditions are satisfied:

• Normal impedance measurement other than Ls-Rdc, Lp-Rdc, Vdc-Idc

• Impedance range mode: hold range mode

• DC bias voltage level monitor: OFF

• DC bias current level monitor: OFF

• Trigger delay: 0 s

• Step delay: 0 s

• Calibration data: OFF

• Display mode: blank

Table 52. Measurement time [ms](DC bias:OFF)

Measurement
time mode Test frequency

20 Hz 100 Hz 1 kHz 10 kHz 100 kHz 1 MHz 2 MHz

1 LONG 480 300 240 230 220 220 220
2 MED 380 180 110 92 89 88 88
3 SHORT 330 100 20 7.7 5.7 5.6 5.6

Figure 9. Measurement time (DC bias: OFF)

10

1

0.1

Measurement time [sec]

0.01

0.001
20 100 1k 10k 100k 1M 2M

Test frequency [Hz]

1. LONG

2. MED

3. SHORT

31

Measurement time when Option 005 is installed

Table 53. Measurement time when option 005 is installed [mS]
(DC bias: OFF)

Measurement
time mode Test frequency

20 Hz 100 Hz 1 kHz 10 kHz 100 kHz 1 MHz 2 MHz

1 LONG 1190 650 590 580 570 570 570
2 MED 1150 380 200 180 180 180 180
3 SHORT 1040 240 37 25 23 23 23

Figure 10. Measurement time (DC bias: OFF, Option 005)

When DC bias is ON, the following time is added:

Table 54. Additional time when DC bias is ON [ms]

Test frequency
20 Hz 100 Hz 1 kHz 10 kHz 100 kHz 1 MHz 2 MHz

30 30 10 13 2 0.5 0.5

When the number of averaging increases, the measurement time is given as

Equation 17. MeasTime + (Ave – 1) × AveTime

MeasTime Measurement time calculated based on Table 52 and Table 53
Ave Number of averaging
AveTime Refer to Table 55

Table 55. Additional time per averaging [mS]

Measurement
time mode Test frequency

20 Hz 100 Hz 1 kHz 10 kHz 100 kHz 1 MHz 2 MHz

SHORT 51 11 2.4 2.3 2.3 2.2 2.2

MED 110 81 88 87 85 84 84

LONG 210 210 220 220 220 210 210

10

1

0.1

Measurement time [sec]

0.01

0.001
20 100 1k 10k 100k 1M 2M

Test frequency [Hz]

1. LONG

2. MED

3. SHORT

32

Display time

When the display is set to something other than “Display Blank page”, time required to
update the display on each page (display time) is as follows. When a screen is changed,
drawing time and switching time are added. Display updates are done approx. every
100 ms during the measurement.

Table 56. Display time

Item Time

MEAS Display screen drawing time 40 ms

MEAS Display screen (large) drawing time 40 ms

BIN No. Display screen drawing time 40 ms

BIN COUNT screen drawing time 40 ms

Measurement display switching time 35 ms

33

Measurement data transfer time

This table shows the measurement data transfer time under the following conditions.
The measurement data transfer time varies depending on measurement conditions and
computers.

Table 57. Measurement transfer time under the following conditions:

Host computer: DELL OPTIPLEX GX260 Pentium 4 2.6 GHz

Display: ON

Impedance range mode: AUTO (The overload has not been generated.)

OPEN/SHORT/LOAD compensation: OFF

Test signal voltage monitor: OFF

Table 58. Measurement data transfer time [ms]

using :FETC? command using data buffer memory
Data (one point measurement) (list sweep measurement)
transfer Comparator Comparator 10 51 128 201

Interface format ON OFF points points points points

ASCII 2 2 4 13 28 43

GPIB ASCII Long 2 2 5 15 34 53

Binary 2 2 4 10 21 32

ASCII 2 2 3 8 16 23

USB ASCII Long 2 2 4 9 19 28

Binary 2 2 3 5 9 13

ASCII 3 4 5 12 24 36

LAN ASCII Long 3 3 5 13 29 44

Binary 3 3 5 9 18 26

DC bias test signal current (1.5 V/2.0 V): Output current: Max. 20 mA

Option 001 (Power and DC Bias enhance):

DC bias voltage: DC bias voltage applied to DUT is given as:

Equation 18. Vdut = Vb – 100 × Ib

Vdut [V] DC bias voltage
Vb [V] DC bias setting voltage
Ib [A] DC bias current

DC bias current: DC bias current applied to DUT is given as:

Equation 19. Idut = Vb/(100 + Rdc)

Idut [A] DC bias current
Vb [V] DC bias setting current
Rdc [Ω] DUT’s DC resistance

34

Maximum DC bias current

Table 59. Maximum DC bias current when the normal measurement
can be performed.

Bias current isolation

Impedance OFF
range [Ω]

ON

Test signal voltage ≤ 2 Vrms Test signal voltage > 2 Vrms

0.1 20 mA 100 mA

1 20 mA 100 mA

10 20 mA 100 mA

100 20 mA 100 mA

300 2 mA 100 mA

1 k 2 mA 20 mA

3 k 200 µA 20 mA

10 k 200 µA 2 mA

30 k 20 µA 2 mA

100 k 20 µA 200 µA

When DC bias is applied to DUT

When DC bias is applied to the DUT, add the following value to the absolute accuracy Ab.

Table 60. Only when Fm < 10 kHz and |Vdc| > 5 V

SHORT MED, LONG

0.05% × (100 mV/Vs) × (1 + √(100/Fm)) 0.01% × (100 mV/Vs) × (1 + √(100/Fm))

Fm [Hz] Test frequency
Vs [V] Test signal voltage

Relative measurement accuracy with bias current isolation

When DC bias Isolation is set to ON, add the following value to the open offset Yo.

Equation 20. Yo_DCI1 × (1 + 1/(Vs)) × (1 + √(500/Fm)) + Yo_DCI2

Zm [Ω] Impedance of DUT
Fm [Hz] Test frequency
Vs [V] Test signal voltage
Yo_DCI1,2 [S] Calculate this by using Table 61 and 62
Idc [A] DC bias isolation current

Table 61. Yo_DCI1 value

DC bias current range Measurement time mode

SHORT MED, LONG

20 µA 0 S 0 S
200 µA 0.25 nS 0.05 nS
2 mA 2.5 nS 0.5 nS
20 mA 25 nS 5 nS
100 mA 250 nS 50 nS

Table 62. Yo_DCI2 value

DC bias Measurement time mode
current range ≤ 100 Ω 300 Ω, 1 k Ω 3 k Ω, 10 k Ω 30 k Ω, 100 k Ω

20 µA 0 S 0 S 0 S 0 S
200 µA 0 S 0 S 0 S 0 S
2 mA 0 S 0 S 0 S 3 nS
20 mA 0 S 0 S 30 nS 30 nS
100 mA 0 S 300 nS 300 nS 300 nS

Auto range
mode: 100 mA

Hold range mode:
its values for
the range.

35

DC bias settling time

When DC bias is set to ON, add the following value to the settling time:

Table 63. DC bias settling time

Bias Settling time

1 Standard Capacitance of DUT × 100 × loge(2/1.8 m) + 3 m
2 Option 001 Capacitance of DUT × 100 × loge(40/1.8 m) + 3 m

Figure 11. DC bias settling time

100 sec

10 sec

1 sec

100 msec

Settling time

10 msec

1 µF 10 µF 100 µF 1 mF 10 mF 100 mF

2.

1.

DUT capacitance

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