Agilent E4440A Instrument Messages and Functional Tests

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Instrument Messages and

Functional Tests

Agilent Technologies PSA Spectrum Analyzers

This manual provides documentation for the following instrument:

Agilent Technologies PSA Series

E4440A (3 Hz – 26.5 GHz)

Manufacturing Part Number: E4440-90030

Printed in USA

January 2001

The information contained in this document is subject to change without notice.

Agilent T echnologies makes no warranty of any kind with r egard to this material, including but not limited to, the implied warranties of merchantability and fitness for a particular pur pose. Agilent Technologies shall not be liable for errors contained herein or for incidental or consequential damages in connect ion with the furnishing, performance, or use of this material.

Where to Find the Latest Information

Documentation is updated periodically. Fo r the latest information about Agilent PSA spectrum analyzers, including firmware upgrades and application information, see: http://www.agilent.com/find/psa.

Contents

1. Instrument Messages

Error Messages . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2

Error Queues . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2

Error Message Information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3

Error Message Types . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4

0: No Error . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5

−499 to −400: Query Errors . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6

−399 to −300: Device-Specific Errors . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7

−299 to −200: Execution Errors . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8

−199 to −100: Command Errors . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10

102 to 799: Device-Specific Errors . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11

Informational Messages . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16

Status Messages . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17

2. Functional Tests

Getting Started . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20

Performing Functional Tests . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20

Required Test Equipment . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21

Amplitude Accuracy at 50 MHz . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23

Testing Option 1DS (Preamp) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26

Displayed Average Noise Level (DANL) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27

Frequency Readout Accuracy . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30

Frequency Response (Flatness) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 32

Amplitude Linearity . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 36

Second Harmonic Distortion (SHD) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 39

Index

iii

1 Instrument Messages

This chapter describes the following types of messages displayed on the analyzer:

• Error Messages, beginning on page 2, appear at the bottom of the screen in the status line.

These messages normally indicate that a user-error has occurred as a result of either front-panel or remote interface activity.

• Informational Messages, beginning on page 16, appear at the bottom of the screen in the status line

These messages simply provide information; you are not required to do anything.

• Status Messages, beginning on page 17, appear in the upper-right portion of the screen grid

These messages indicate conditions that can cause the display of incorre ct data.

Instrument Messages

Error Messages

Error messages appear at the bottom of the screen in the status line (in yellow on color displays). This section provides information to help you understand and resolve errors:

• An overview of error queues, below.

• An overview of the information provided in an error message, on page 3.

• A description of the types of error messages, on page 4.

• A description of error messages , grouped by type, beginning on page 5.

Error Queues

There are two types of errors in the instrument, and two corresponding error queues:

• Front panel

• Remote interface (SCPI) If an error condition occurs , it may be reported to both error queues. These two queues are viewed and managed separately, as described in the following table.

Characteristic

Capacity (number of errors)

Overflow Handling

Viewing Entries

Clearing the Queue

a.Error history includes the date and time an error last occurred, the error number, the error message, and the

number of times the error occurred.

Circular (rotating). Drops oldest error as new error comes in.

Press:

System, Show Errors, Clear Error Queue

Front-Panel Display

Error Queue

11 30

System, Show Errors

SCPI Remote Interface

Error Queue

Linear, first-in/first-out. Replaces newest error with:

350,Queue overflow

−

Use SCPI query

SYSTem:ERRor?

Power up . Send a *CLS command. Read last item in the queue.

2 Chapter 1

Instrument Messages

Error Messages

Error Message Information

The system-defined error numbers are chosen on an enumerated (“1 of N”) basis. The <error description > portion of the error query response (not the number) appears at the

bottom of the screen in the status line (in yellow on color displays).

NOTE To see an error number, view the error queue as described on page 2. In this chapter, an explanation is included with each error to further clarify its meaning.

The last error described in each class (for example, −400, −300, −200, −100) is a “generic” error. In selecting the proper error number to report, more sp ecific error codes are preferred.

There are also references in this chapter to the IEEE Standard 488.2-1992, IEEE

Standard Codes, Formats, Protocols and Common Commands for Use with ANSI/IEEE Std 488.1-1987. New York, NY, 1992.

Chapter 1 3

Instrument Messages

Error Messages

Error Message Types

Events do not generate more than one type of error. For example , an event that gener ates a query error will not generate a device-specific, execution, or command error.

Query Errors (–499 to –400) indicate that the instrument output queue control has detected a problem with the message exchange protocol described in IEEE 488.2, Ch apter

6. Errors in this class set the query error bit (bit 2) in the event status register (IEEE

488.2, section 11.5.1). These errors correspond to message exchange protocol errors described in IEEE 488.2, 6.5. In this case:

• Either an attempt is being made to read data from the output queue when no output is either present or pending, or

• data in the output queue has been lost.

Device-Specific Errors (–399 to –300 and 102 to 799) indicate that a device operation did not properly complete , possibly due to an abnormal hardware or firmware condition. These codes are also used for self- test response errors. Errors in this class set the device-specific error bit (bit 3) in the event status register (IEEE 488.2, section 11.5.1).

The <error_message> string for a positive error is not defined by SCPI. A positive error indicates that the instrument detected an error within the GPIB system, within the

instrument’s firmware or hardware, during the transfer of block data, or during calibration.

Execution Errors (–299 to –200) indicate that an error has been detected during instrument execution.

Command Errors (–199 to –100) indicate that the instrument parser detected an IEEE

488.2 syntax error. Errors in this class set the command error bit (bit 5) in the event status

• Either an IEEE 488.2 syntax error has been detected by the parser (a control-to-device message was received that is in violation of the IEEE 488.2 standard. Possible violations include a data element which violates device listening formats or whose type is unacceptable to the device.), or

• an unrecognized header was received. These include incorrect device-specific headers and incorrect or unimplemented IEEE 488.2 common commands.

4 Chapter 1

Instrument Messages

Error Messages

0: No Error

NOTE Error numbers are displayed in the error queue, not on the display.

To s ee an error number, view the error queue as described on page 2.

0 No error

The queue is empty. Either every error in the queue has been read, or the queue was cleared by power-on or *CLS.

Chapter 1 5

Instrument Messages

Error Messages

−499 to −400: Query Errors

The instrument output queue control has detected a problem with the message exchange protocol described in IEEE 488.2, Chapter 6. Errors in this class set the query error bit (bit

2) in the event status register (IEEE 488.2, section 11.5.1). These errors correspond to

message exchange protocol errors described in IEEE 488.2, 6.5. In this case, either an attempt is being made to read data from the output queue when no

output is either present or pending , or data in the output queue has been lost.

NOTE Error numbers are displayed in the error queue, not on the display.

To s ee an error number, view the error queue as described on page 2.

−400 Query Error This is a generic query error for devices that cannot detect more specific errors. The code

indicates only that a query error as defined in IEE 488.2, 11.5.1.1.7 and 6.3 has occurred.

6 Chapter 1

Instrument Messages

Error Messages

−399 to −300: Device-Specific Errors

Some device operations did not properly complete, possibly due to an abnormal hardware or firmware condition. These codes are also used fo r self-test re sponse errors . Errors in this class set the device-specific error bit (bit 3) in the event status register (IEEE 488.2, section 11.5.1).

NOTE Error numbers are displayed in the error queue, not on the display.

To s ee an error number, view the error queue as described on page 2.

−330 Self-test failed; EEPROM checksum for <card> The card identification header for a hardware card is incorrect. If the card is not properly

identified, the instrument is likely to be non-functional. Report this error to the nearest Agilent Technologies sales or service office.

−321 Out of memory An internal operation needed more memory than was available. Report this error to the nearest

Agilent Technologies sales or service office.

−310 System error An internal system problem was detected. Report this error to the nearest Agilent Technologies

sales or service office.

−300 Device-specific error This is a generic device-dependent error for devices that cannot detect more specific errors. The

code indicates only that a device-dependent error as defined in IEEE 488.2, 11.5.1.1.6 has occurred. Report this error to the nearest Agilent Technologies sales or service office.

Chapter 1 7

Instrument Messages

Error Messages

−299 to −200: Execution Errors

An error has been detected by the instr ument’ s ex ecution contro l block. Errors in this cl ass set the execution error bit (bit 4) in the event status register (IEEE 488.2, section 11.5.1).

NOTE Error numbers are displayed in the error queue, not on the display.

To s ee an error number, view the error queue as described on page 2.

−253 Corrupt media A removable media was found to be bad or incorrectly formatted. Any existing data on the media

may have been lost.

−250 Mass storage error; EEPROM write timeout on EEPROM Failure to initialize EEPROM. Report this error to the nearest Agilent Technologies sales or

service office.

−241 Hardware missing Missing device hardware. For example, an option is not installed.

Hardware missing; no such SIO address

The expected board is not installed. Report this error to the nearest Agilent Technologies sales or service office.

−230 Data corrupt or stale Possibly invalid data. A new measurement was started but not completed.

Data corrupt or stale; RAM copy of EEPROM

The EEPROM copy of a file is either corrupt or otherwise unusable. The system automatically updates the non-volatile RAM copy of the EEPROM copy using a default initialization. The actual EEPROM file is left as it is. Report this error to the nearest Agilent Technologies sales or service office.

Data corrupt or stale; RAM copy of EEPROM

The non-volatile RAM copy of a file is either corrupt or is out of date with the EEPROM master copy (if one exists). The system automatically re-initializes the file from EEPROM (if appropriate) or from a default algorithm. A potential cause is a failing backup battery.

−224 Illegal parameter value You have sent a parameter for this command that is not allowed. See the Function Reference.

8 Chapter 1

−222 Data out of range A legal program data element was parsed but could not be execute d because the interpreted

value was outside the legal range defined by the device (see IEEE 488.2 11.5.1.1.5).

−221 Settings conflict; Command incompatible with span pair marker Using remote commands, you have tried to adjust the start or stop frequency of a span pair

marker. You can adjust only the center and span.

Settings conflict; Command incompatible with band pair marker

Using remote commands, you have tried to adjust the center frequency or span of a delta pai r marker. You can adjust only the reference ma rker frequency or the delta marker frequency.

−200 Execution Error For devices that cannot detect more specific errors, this code indicates only that an execution

error as defined in IEEE 488.2, 11.5.1.1.5 has occurred.

Instrument Messages

Error Messages

Chapter 1 9

Instrument Messages

Error Messages

−199 to −100: Command Errors

The instrument parser detected an IEEE 488.2 syntax error. Errors in this class set the command error bit (bit 5) in the event status register (IEEE 488.2, section 11.5.1). In this case:

• Either an IEEE 488.2 syntax error has been detected by the parser (a control-to-device message was received that is in violation of the IEEE 488.2 standard. Possible violations include a data element whic h violates device listening formats or whose type is unacceptable to the device.), or

• an unrecognized header was received. These include incorrect device-specific headers and incorrect or unimplemented IEEE 488.2 common commands.

NOTE Error numbers are displayed in the error queue, not on the display.

To s ee an error number, view the error queue as described on page 2.

−120 Numeric data error This error (and errors −121 through −129) is generated when parsing a data element that

appears to be numeric, including non-decimal numeric types. This message is used if the device cannot detect a more specific error.

−100 Command error This is a generic syntax error for devices that cannot detect more specific errors. The code

indicates only that a command error as defined in IEEE 488.2, 11.5.1.1.4 has occurred.

10 Chapter 1

Instrument Messages

Error Messages

102 to 799: Device-Specific Errors

The <error message> string for a positive error is not defined by SCPI. A positive error indicates that the instrument detected an error within the GPIB system, within the instrument firmware or hardware, during the transfer of block data, or during calibration.

NOTE Error numbers are displayed in the error queue, not on the display.

To s ee an error number, view the error queue as described on page 2.

102 High 50MHz Power Level

There is too much 50 MHz energy at the RF port for alignments to run. Reduce input power and run alignments again.

103 Sampling Oscillator Unlock

Report this error to the nearest Agilent Technologies sales or service office.

104 1st LO Unlock

The first LO on has lost phase lock. Report this error to the nearest Agilent Technologies sales or service office.

105 2nd LO Unlock

The second LO has lost phase lock. Report this error to the nearest Agilent Technologies sales or service office.

106 4th LO Unlock

The fourth LO has lost phase lock. Report this error to the nearest Agilent Technologies sales or service office.

107 Sample Clock Unlock

Report this error to the nearest Agilent Technologies sales or service office.

108 Cal Oscillator Unlock

Report this error to the nearest Agilent Technologies sales or service office.

Chapter 1 11

Instrument Messages

Error Messages

202 No peak found

No peak found that meets the criteria under

208 Unable to execute preselector centering, not tuned to YTF band

You tried to center the preselector with the analyzer frequency too low. Preselector centering can be performed only for frequencies above 3.025 GHz.

209 Preselector centering failed, Narrow the span and try again

You tried to center the preselector with the analyzer span too wide. Preselector centering can be performed only for spans below 1.123 GHz.

601 File not found

The analyzer could not find the specified file.

602 Media is protected

A save was attempted to a write-protected device.

604 File name error

Peak Search, Search Param.

An invalid file name was specified. Use filenames with a maximum of 8 characters (letters and digits only), and use a 3-character extension. File names are not case-sensitive. This error also occurs if you try to delete a nonexistent file.

The following messages represent additional conditions that can generate this error:

• File name error; Directory does not have a default file type

• File name error; Directory does not support extenders

• File name error; Empty filename

• File name error; Illegal extender

• File name error; Illegal filename character

• File name error; Only one : is allowed

• File name error; Only one extender character allowed

606 Data questionable; RAM copy of EEPROM

EEPROM error occurred. The EEPROM copy of a file is either corrupt or otherwise unusable. The system automatically updates the non-volatile RAM copy of the EEPROM copy using a default initialization. The actual EEPROM file is left as it is. Report this error to the nearest Agilent Technologies sales or service office.

610 File access is denied

The file is protected and cannot be accessed.

12 Chapter 1

615 File exists

You attempted to save to a file that already exists. Either delete the existing file or select a new name, then try again.

619 Can’t Auto-Couple RBW in Zero Span

You sent a remote command to set the RBW into auto while in zero span.

620 Can’t Auto-Couple Sweep Time in Zero Span

You sent a remote command to set the sweep time to auto while in zero span.

622 External reference missing or out of range

The external frequency reference signal is missing, has too low an amplitude, or does not match the frequency value that you previously entered into instrument memory.

Instrument Messages

Error Messages

623 Printer not responding

Check the printer. It may not be connected properly or turned on.

627 Media not writable

A save was attempted to a device that could not be written to. Try a known-good disk.

751 Instrument state may be corrupt, state has been reset to initial values

While trying to load a trace or state, the state information was found to be in error. This may be because the state had been stored on a later revision of analyzer firmware. A default set of state variables was loaded instead. There is nothing wrong with the analyzer.

752 Unable to load state from file

Attempt to load a state from a file failed.

753 Unable to save state to file

Attempt to save a state to a file failed. See the associated error messages for the cause (press

System, Show Errors).

755 Unable to load state from register

Attempt to load a state from an internal state register failed.

Chapter 1 13

Instrument Messages

Error Messages

756 Unable to save state to register

Attempt to save a state to an internal state register failed. See the associated error messages for the cause (press

757 Unable to load user state, factory preset was done

A user preset failed , so the f actor y pre set valu es wer e used. S av e a valid st ate in to user prese t and try again.

758 Unable to save user state

Attempt to save a user preset state failed. See the associated error messages for the cause (press

System, Show Errors).

763 Bad, missing, or unformatted disk

System, Show Errors).

The floppy disk is not inserted properly, is not formatted, or the directory cannot be read. Insert a known good disk and try again.

764 Unable to save file

Attempt to save a file failed; the file was not saved. See the associated error messages for the cause

System, Show Errors).

(press

765 Unable to load file

Attempt to load a file failed; the file was not loaded.

767 Failed to Initialize ISTATE regions. Fatal LDS error

Attempt to initialize the instrument state has failed. Cycle instrument power. If this fails to correct the problem, contact your nearest Agilent Technologies service center.

768 Unable to load user state, required instrument mode is not installed

Attempt to load a state failed, because the state was saved with a measurement personality that is not currently loaded. Load the appropriate personality and try again.

14 Chapter 1

770 Incorrect filename, allowable extensions are .gif or .wmf

You sent a remote command to save a screen file but did not specify a valid extension.

Incorrect filename, allowable extension is .sta

You sent a remote command to save a state file but did not specify a valid extension.

Incorrect filename, allowable extensions are .trc or .csv

You sent a remote command to save a trace file but did not specify a valid extension.

781 Video Trigger cannot be active with Average Detector

You sent a remote command to do one of the following:

• Turn on video trigger while the Average Detector or a Marker Function is active.

• Turn on the Average Detector or a Marker Function while Video Trigger is active.

Instrument Messages

Error Messages

Chapter 1 15

Instrument Messages

Informational Messages

These messages simply provide information; you are not required to do anything. Information in brackets (such as <directoryname>), is a previously-p rovided input.

Informational messages appear at the bottom of the screen in the status line.

<directoryname> directory deleted

The directory indicated has been successfully deleted.

<directoryname1> directory renamed to <directoryname2>

Directory name1 has been successfully renamed to directory name2.

<filename> file loaded

The filename indicated has been successfully loaded.

<filename> file saved

The filename indicated has been successfully saved.

<filename> file copied

The filename indicated has been successfully copied.

<filename> file deleted

The filename indicated has been successfully deleted.

<filename1> file renamed to <filename2>

Filename1 has been successfully renamed to filename2.

Directory already exists

Each directory and file must have a unique name. The directory name you have entered is currently being used on the selected drive. You may either enter a new name or rename the directory currently existent.

16 Chapter 1

Instrument Messages

Status Messages

These messages indicate conditions that can cause the displ a y of incorr ect d ata. The name of the corresponding status bit appears in parenthesis. Some messages display only the status bit (as noted).

Status messages appear in the upper right portion of the screen grid.

* (Invalid Data)

Data on the screen may not ma tch the sc reen ann otation . F or ex ample , whil e analyzer setting s are chang ing or when any trace is in view mode.

1st IF Overload (IF/ADC Over Range)

The IF section has been overloaded. Measurement results may be invalid.

50 MHz Osc Unlevel (50 MHz Osc Unleveled)

The internal 50 MHz amplitude reference source has become unleveled. This condition must be corrected before a valid alignment ca n be performed.

(ADC Align Failure) status bit only, no message

The alignment routine was unable to align the analog-to-digital converter (ADC).

System, Alignments, Align All Now Needed (Align Needed)

The instrument requires an

Align All Now.

Ext Ref (no corresponding status bit) The frequency reference is being supplied by an external 10MHz source.

Final IF Overload (IF/ADC Overrange)

The final IF section has been overloaded. Measurement results may be invalid.

Align All Now. Restore the alignment by pressing System, Alignments,

First IF Overload (IF/ADC Overrange)

The first IF section has been overloaded. Measurement results may be invalid. Either increase the input attenuation or decrease the input level.

Chapter 1 17

Instrument Messages

Status Messages

Freq Count: Reduce Span/RBW ratio

The span is too wide for the current resolution bandwidth. Either reduce the span or increase the RBW.

Frequency Reference Error (Freq Ref Unlocked)

The frequency reference has been tuned too far off of 10 MHz. This condition may be corrected by cycling power on the analyzer.

(IF Align Failure) status bit only, no message

A failure has occurred during the IF alignment. Measurement results may be invalid.

LO Out Unlevel (LO Out Unleveled)

Indicates the output of the local oscillator (LO) has become unl eveled. This condition must be corrected to make valid measurements.

LO Unlevel (LO Unleveled)

Indicates the internal circuitry of the local oscillator (LO) has become unl eveled. This condition m ust be corrected to make valid measurements.

LO Unlock (Synth Unlocked)

Indicates the phas e loc ked ci rcui try of t he loc al osci llat or (LO) has beco me unloc ke d. This c ondit ion must be corrected to make valid measurements.

Meas Uncal (Oversweep)

The measurement is uncalibrated. Check the sweep time, span and bandwidth settings, or press

Auto Couple.

(RF Align Failure) status bit only, no message

A failure has occurred during the alignment of the RF section. Measurement results may be invalid.

18 Chapter 1

2 Functional Tests

These tests, which check various instrument parameters, offer a high degree of confidence that the instrument is operating correctly. These tests are recommended as a check of instrument operation (incoming inspectio n or after a rep air). These te sts are a lso designed to test an instrument (operating within the temperature range defined by the instrumen t specifications) using a minimum set of test equipment.

NOTE The instrument is checked against limits that are wider than the published

specifications. Measurement uncertainty analysis is not available for functional tests.

This chapter includes the following:

• Getting Started (pre-test conditions and specifications)

• Required Test Equipment (summarized list)

• Functional Tests include the following (beginning on page 23): — Test Limits (pass/fail crit eria)

— Tes t Descriptions — Required Test Equipment (specific to each test) — Graphical Interpretations of Test Setups (figures) — Test Procedures — Tables for Recording Measurement Data

List of Functional Tests

• Amplitude Accuracy at 50 MHz on page 23

• Displayed Average Noise Level on page 27

• Frequency Readout Accuracy on page 30

• Frequency Response (Flatness) on page 32

• Amplitude Linearity on page 36

• Second Harmonic Spurious Response s on page 39

Functional Tests vs. Performance Verification Tests

The functional tests check a much smaller range of parame ters and a limited number of data points for each parameter. They require only limited test equipment.

NOTE If a functional test does not pass, perfo rma nce verification tests must be run

to confirm that a problem exists.

Performance verification tests span a wide range of instrument parameters and provide the highest level of confidence that the instrument conforms to published specifications. These tests are time consuming and require extensive test equipment.

Functional Tests

Getting Started

Performing Functional Tests

1. Ensure that you have the proper test equipment.

2. Switch on the unit under test (UUT) and let it warm up (in accordance with warm-up requirements in the instrument specifications).

3. Allow sufficient warm-up time for the required test equipment (refer to individual instrument documentation for warm-up specifications).

4. Ensure that the frequency reference is set to Internal. To test that the instrument is set up properly, press the underlined. If not, press the

Input/Output key. The Freq Ref softkey should have Int

Freq Ref softkey until Int is underlined.

5. Following instrument warm-up, perform the auto align routine by pressing the

Alignment, and Align All Now keys.

System,

NOTE Functional test accuracy d epends on the precision of the te st equipment used.

Ensure that all of the test equipment is calibrated before running a functional test.

20 Chapter 2

Functional Tests

Required Test Equipment

The table below outlines the required test equipment needed to pe rform the functional tests. Alternate equipment model numbers are given in case the recommended equipment is not available.

If neither the recommended nor the alternative test equipment are available, you may use substitute equipment that meets or exceeds the critical specifications required to perform the functional tests.

Table 2-1 Required Equipment List

Recommended

Item Critical Specifications

Adapters

3.5 mm(f) to 3.5mm(f) (connector saver for 83630B)

3.5 mm(f) to N(f) 1250-1745 BNC(f) to SMA(m) 1250-1200 BNC(m) to SMA(f) 1250-1700 Type N(f) to BNC(m) 1250-1534 Type N(f) to N(f) 1250-1472 1250-0777 Type N(m) to 3.5 mm(f) 1250-1744 Type N(m) to 3.5 mm(m) 1250-1743 Type N(m) to BNC(f) 1250-1476

Attenuators

10 dB Step Attenuator Range: 0 to 60 dB 355D 20 dB Fixed Attenuator Accuracy: < 0.5 dB 8491A 8491B

Agilent

Model Number

5061-5311

Alternate

Agilent

Model Number

Cables

APC 3.5 mm (1 meter) 8120-4921 Cable, BNC (2 required) 120 cm (48 in.) BNC cable 10503A

Signal Source

Synthesized Sweeper Frequency: 10 MHz to 26.5 GHz

Harmonic level:< −40 dBc Amplitude range: 10 to −20 dBm Frequency Accuracy: 0.02%

83630B 83640B,

83650B

Chapter 2 21

Functional Tests

Required Test Equipment

Table 2-1 Required Equipment List (Continued)

Item Critical Specifications

Miscellaneous E quipment

Filter, 50 MHz Low Pass Cutoff Frequency: 50 MHz

Rejection at 65 MHz: > 40 dB Rejection at 75 MHz: > 60 dB

Power Meter Power Reference Accuracy: ±1.2%

Compatible with power sensor

Power Sensor Frequency Range: 50 MHz to 26.5 GHz

Amplitude Range: −25 to 10 dBm

Power Splitter, 3.5 mm Nominal Insertion Loss: 6 dB

Tracking Between Ports: < 0.25 dB

Ter mi nat io n, 50Ω Type N(m) Connector

Frequency: 1 MHz to 4 GHz

Recommended

Agilent

Model Number

0955-0306

E4418B E4419B

8485A E4413A

11667B 11667A

909A Option 012

Alternate

Agilent

Model Number

22 Chapter 2

Functional Tests

Amplitude Accuracy at 50 MHz

Test Limits

Amplitude Accuracy should r emain within ±0.5 dB of the measured source value acro ss the range of source levels and changes in resolution bandwidth. Option 1DS (preamp option) should remain within ±1.2 dB of measured values.

Test Description

A synthesized sweeper is used as the signal source for the test. The source amplitude is varied using the signal source amplitude control. The resolution bandwidth is also varied on the spectrum analyzer. The source amplitude is measured by the power meter and spectrum analyzer at each setting, and the values compared. The difference between each pair of measurements indicates the amplitude accuracy.

Item Critical Specifications

Adapter Type-N(m), to 3.5 mm(m) 1250-1743 Adapter 3.5 mm(f) to 3.5 mm(f) 5061-5311 Attenuator, 20 dB Accuracy: < 0.5 dB 8491A Cable APC 3.5 mm, 1 meter 8120-4921 Power Meter Compatible with power sensor E4418B Power Sensor Amplitude Range: −25 dBm to 10 dBm 8485A Power Splitter 3.5 mm

6 dB loss

Synthesized Sweeper Typical Temperature Stability: 0.01 dBc/°C 83630B

Recommended Agilent

Model Number s

11667B

Chapter 2 23

Functional Tests

Amplitude Accuracy at 50 MHz

Figure 2-1 Amplitude Accuracy Test Setup

Procedure

1. Zero and calibrate the power meter.

2. Configure equipment as shown in Figure 2-1, with the power splitter connected to the spectrum analyzer input.

CAUTION To minimize stress on the test equipment connections, support the power

sensor.

3. If the auto alignment for the analyzer has not been performed within the past 24 hours ,

System, Alignment, Align All Now to perform the auto alignment routine.

press

4. Press

Preset on the analyzer.

5. Set up the spectrum analyzer by pressing:

Frequency, 50 MHz Input/Output Mode Setup, RBW VBW ST Auto Swp Time Sweep Span, 75 MHz

, RF Coupling (DC)

, Accy

, Sweep Type (SWP)

BW/AVG

, 1 MHz

6. Set up the synthesized sweeper by pressing:

CW, 50 MHz Power Level

(On)

24 Chapter 2

, 0 dBm

Functional Tests

Amplitude Accuracy at 50 MHz

7. On the spectrum analyzer, press:

BW/Avg, Average (On) 10, Enter

8. Perform the following steps for each row listed in Table 2-2: a. Set the synthesized sweeper amplitude to the value listed in the Nominal Source

Amplitude column in Table 2-2. b. Set the Res BW and Span as listed in each row of the table. c. Rec ord the source amplitude, as measured by the power meter, in the Power Meter

Amplitude column of Table 2-2. d. On the spectrum analyzer, press

Restart, Peak Search.

e. Wait for the spectrum analyzer to finish averaging. f. Record the signal amplitude, as measured by the analyzer in the Measured

Amplitude column of Table 2-2. g. Calculate the signal amplitude accuracy error using the following equation, and

record the results under the Amplitude Accuracy Error column:

Amplitude Accuracy Error = Meas_amp − Powe r_meter

Table 2-2 Amplitude Accuracy Results

Nominal

Source

Amplitude

(dBm)

−4 Off 1000 75000 0.8

−4 Off 300 31800 0.8

−4 Off 100 10600 0.8

−4 Off 30 3180 0.8

Preamp

(Option 1DS)

Res BW

(kHz)

Span

(kHz)

Measured Amplitude Meas_amp

(dBm)

Power Meter

Amplitude

Power_meter

(dBm)

Amplitude

Accuracy

Error

(dB)

Test Limit

(dB)

−4 Off 10 1060 0.8

−4 Off 1 106 0.8

−13 Off 1 106 0.8

Chapter 2 25

Functional Tests

Amplitude Accuracy at 50 MHz

Testing Option 1DS (Preamp)

Instruments containing Option 1DS must ha ve the preamp function turned on and tested. In order to enable this function, press

Procedure

1. Connect the 20 dB pad between the input of the spectrum analyzer and the power splitter, as shown in Figure 2-1

2. Set the synthesized sweeper amplitude to the value listed in the Nominal Source Amplitude column in Table 2-3.

3. Set the Res BW and Span as listed in Table 2-3.

4. Record the source amplitude, as measured by the power meter, in the Power Meter Amplitude column of Table 2-3.

Amplitude, More 1 of 3, Int Preamp (On).

5. On the spectrum analyzer, press

Restart, Peak Search.

6. W a it for the analyzer to finish averaging.

7. Record the signal amplitude as measured by the analyzer in the measured amplitude column of Table 2-3.

8. Calculate the signal amplitude accuracy using the following equation:

Amplitude Accuracy Error = Meas_amp + 20 dB − Corrected Power Value

9. Recor d th e results under t he A m p l it u de Accuracy Er ro r column of Table 2-3.

Table 2-3 Amplitude Accuracy Results (Option 1DS)

Nominal

Source

Amplitude

(dBm)

−13 On 1 106 1.2

Preamp (Option

1DS)

Res BW

(kHz)

Span

(kHz)

Measured Amplitude Meas_amp

(dBm)

Power Meter

Amplitude

Power_meter

(dBm)

Amplitude

Accuracy

Error

(dB)

Test Limit

(dB)

26 Chapter 2

Displayed Average Noise Level (DANL)

Test Limits (with 0 dB input attenuation)

Frequency R an ge Maximum

1 MHz to 10 MHz –140 dBm 10 MHz to 3.0 GHz –148 dBm

3.0 GHz to 6.6 GHz –147 dBm

6.6 GHz to 13.2 GHz –145 dBm

13.2 GHz to 22.0 GHz –142 dBm

22.0 GHz to 26.5 GHz –139 dBm

Test Description

Functional Tests

Displayed Average Noise Level (DANL)

The Displayed A verage Noise Level (DANL) of the spectrum analyzer is measured a cross a 10 kHz frequency span at several center frequencies. The analyzer input is terminated into a 50Ω load. A test is performed to assure the measurement is not performed in the presence of a residual response. The measurement is then averaged, and the result is normalized to a 1 Hz bandwidth.

Item

Termination 50Ω Type-N(m) 909A Option 012

Critical Specifications

(for this test)

Recommended Agilent Mo del

Figure 2-2 DANL/Noise Figure Test Setup

Chapter 2 27

Functional Tests

Displayed Average Noise Level (DANL)

Procedure

1.Configure the equipment as shown in Figure 2-2.

2.Press

Preset on the analyzer.

3. Set up the spectrum analyzer by pressing:

FREQUENCY, Center Freq, 5 MHz Input/Output Span, 10 kHz AMPLITUDE

Amplitude BW/Avg Video BW, 100 Hz Average

, RF Coupling, DC

, –70 dBm

, Attenuation, 0 dB

, 1 kHz

(On), 20, Enter

4.Press Display, then press the Display Line key.

5.Rotate the RPG knob and set the display line at the average amplitude of the displayed noise floor by visual inspection.

6.Confirm that the measurement will be performed on the spectrum analysis noise floor and not on a residual response within the displayed 10 kHz span.

NOTE Ignore the residual response if one appears when taking the measurement.

7.Enter the value of the display line as the Measured Average Noise Level at 5 MHz column in Table2-4.

8.Normalize the measured value to a 1 Hz BW by adding −30 dB to the measured value.

NOTE The −30 dB value is added because the formula used to calculate the value of

the noise power in a 1 Hz BW when measured with a 1 kHz BW is:

Noise = 10 Log (bw 2/bw 1) where bw 2 is the 1 kHz BW we measure and bw 1 is 1 Hz BW we want to normalize to.

Therefore, 10 Log (1000) = 30 dB, so the noise floor will be 30 dB lower in a 1 Hz BW.

9.Enter the normalized value of the displayed average noise level in Table2-4.

10.The value of the normalized displayed average noise should be less than the specification value.

11.Change the analyzer center frequency to the next value listed in Table2-4.

12.Repeat steps 4 through 10 to fill in the remainder of Table2-4.

28 Chapter 2

Displayed Average Noise Level (DANL)

Table 2-4 Displayed Average Noise Level (DANL) Results

Functional Tests

Measured Average Noise Level

Center Frequency

(dBm)

5 MHz –140 2 GHz –148

6 GHz –147 13 GHz –145 20 GHz –142

26.5 GHz –139

Normalized Average Noise Level

(1 Hz BW)

(dBm)

Test Limits

(dBm)

Chapter 2 29

Functional Tests

Frequency Readout Accuracy

Test Limits

Frequency Readout Accuracy is equivalent to the following equat ion:

(0.25% x span + 5% X RBW + 2 Hz + 0.5 x horizontal resolution)

NOTE See results table for actual values.

Test Description

The frequency readout accuracy is measured in several spans and center frequencies that allow both internal analyzer synthesizer modes and prefilter bandwi dths to be tested. Frequency reference error is eliminated by using the same frequency standard for the analyzer and signal source.

Item

Adapter Type-N(m), to 3.5 mm(f) 1250-1744 Adapter 3.5 mm(f) to 3.5 mm(f) 5061-5311 Cable APC 3.5 mm, 1 meter 8120-4921 Synthesized Sweeper Frequency: Capable of 2 GHz (must have external reference input) 83630B

Critical Specification

(for this test)

Recommended

Agilent Model

Figure 2-3 Frequency Readout Accuracy Test Setup

30 Chapter 2

Functional Tests

Frequency Readout Accuracy

Procedure

1. Configure the equipment as shown in Figure 2-3. Confirm the analyzer’s built-in auto alignment has been performed within the past 24 hours.

2. Perform the following steps to set up the equipment: a. On the synthesized sweeper, press

POWER LEVEL, –10dBm

, 1505 MHz, RF (On)

b. On the spectrum analyzer, press

PRESET, then set the controls as follows:

Preset.

3. Set up the spectrum analyzer by pressing:

System, Reference, 10 MHz, Ext (0n) Frequency, 1505 MHz Det/Demod, Detector, Sample

, 2990 MHz

Span

NOTE Ensure Ref Level is set to 0 dBm. In addition, ensure Resolution BW and

Video BW are both se t to Auto.

4. Press

Peak Search on the analyzer to measure the frequency readout accuracy. If the

instrument is functioning correctly, the marker reading in the acti ve function bloc k will be between the values listed in Table 2-5. Record the marker value in the Marker Frequency Readout column in Table 2-5.

5. On the spectrum analyzer, change the span and center frequency as listed in Table 2-5.

6. Change the synthesized sweeper frequency to match the center frequency of the analyzer.

7. Repeat step 4 until the Marker Frequency Readout column of Table 2-5 is complete.

Table 2-5 Frequency Readout Accuracy Results

Span

(MHz)

2990 1505 1.495 GHz 1.515 GHz

127.2 1505 1.5045 GHz 1.5055 GHz

54.1 1505 1.50480 GHz 1.50520 GHz

7.95 1505 1.504968 GHz 1.505032 GHz

0.106 1505 1.5049996 GHz 1.5050004 GHz

1.98 517.59 517.5829 MHz 517.5971 MHz

1.98 832.50 832.4928 MHz 832.5071 MHz

Chapter 2 31

Center

Frequency

(MHz)

Minimum Marker Frequenc y Readout Maximum

Functional Tests

Frequency Response (Flatness)

Test Limits

Frequency Range

3 Hz to 3 GHz ≤1.5 dB 3 GHz to 6.6 GHz ≤2.5 dB

6.6 GHz to 13.2 Ghz ≤3.0 dB

13.2 GHz to 22 GHz ≤3.5 dB 22 GHz to 26 GHz ≤3.5 dB

Maximum (50Ω Inputs)

Test Description

The frequency response test measures the spectrum analyzer’ s amplitude error as a function of the tuned frequency. Measurements are made ranging from 50 MHz to 26 GHz. The signal source amplitude is measured with a power meter to eliminate error due to source flatness.

Item

Adapter Type N(m) to 3.5 mm(m) 1250-1743 Adapter Type N(m) to 3.5 mm(f) 1250-1744 Adapter 3.5 mm(f) to 3.5 mm(f) 5061-5311

Critical Specifications

(for this test)

Recommended

Agilent Model

Cable APC 3.5 mm, 1 meter 8120-492 1 Cables (2 required) BNC, 120 cm (48 in.) 10503A Power Meter Compatible with power sensor E4418B Power Sensor Frequency Range: 50 MHz to 26.5 GHz 8485A Power Splitter Frequency Range: 50 MHz to 26.5 GHz

Tracking between ports: < 0.25 dB

Synthesized Sweeper Frequency Range: 50 MHz to 26 GHz 83630B

11667B

32 Chapter 2

Figure 2-4 Frequency Response Test Setup

Procedure

Functional Tests

Frequency Response (Flatness)

1. Zero and calibrate the power meter and power sensor as described in the power meter operation manual.

2. Configure the equipment as shown in Figure 2-4.

NOTE Connect the power splitter to the spectrum analyzer input using the

appropriate adapter. Do not use a cable.

3. Assure the spectrum analyzer’s built-in auto alignment has been performed within the

last 24 hours.

4. Preset both the spectrum analyzer and the synthesized sweeper.

5. Set up the synthesized sweeper by pressing:

CW, 50 MHz Power level

, –8 dBm

6. Set up the spectrum analyzer by pressing:

Frequency, 50 MHz

, 20 kHz

Span Amplitude

(ref level), –10 dBm

Attenuation, 10 dB Scale/Div BW/AVG, 10 kHz Video BW, 3 kHz

, 2 dB

7. Adjust the synthesized sweeper output power for a power meter display of –14 dBm

±0.1 dB.

Chapter 2 33

Functional Tests

Frequency Response (Flatness)

NOTE The power level of the synthesized sweeper remains unchanged for the

duration of the test.

8.Press the

Peak Search key on the signal analyzer to position the marker on the peak of

the signal.

9.Refer to Table 2-6, “Frequency Response (Flatness) Results.” Enter the amplitude of the

signal displayed on the spectrum analyzer into the Meas

10.Enter the power meter reading into the Power

Meter

column of Table2-6.

Amp

11.Tune the synthesized sweeper and spectrum analyzer to the next frequency listed in

Table2-6.

12.Enter the Power Sensor calibration factor into the power meter.

13.Repeat steps 8-14 and complete the r emainder of Table2-6.

14.Compute the flatness error (Flat

Error

= Meas

Amp

− Power

). The flatness error

Meter

should be less than the value listed in the Flatness Error Test Limit column.

15.Enter the computed flatness error value into the Flat

column of Table2-6.

Error

34 Chapter 2

Table 2-6 Frequency Response (Flatness) Results

Functional Tests

Frequency Response (Flatness)

Center

Frequency

Analyzer Amplitude

Meas

amp

Power Meter Measurement

Power

meter

Flatness Error

Flat

error

Flatness Error

Test Limits

(dB)

50 MHz ±1.5

1 GHz ±1.5 2 GHz ±1.5 3 GHz ±1.5

3.5 GHz ±2.5 5 GHz ±2.5 6 GHz ±2.5

7 GHz ±3.0 10 GHz ±3.0 13 GHz ±3.0 14 GHz ±3.5 16 GHz ±3.5 22 GHz ±3.5 23 GHz ±3.5 25 GHz ±3.5

26.5 GHz ±3.5

Chapter 2 35

Functional Tests

Amplitude Linearity

Test Limits

The linearity error will be ≤ ±1.0 dB with

10 dBm at the mixer.

≤ −

Test Description

This test checks the amplitude linearity of the instrument by maintaining a constant reference level and measuring signals of different amplitudes over most of the display range. This test sets the input attenuator to 10 dB and the Reference Level to 0 dBm. The external attenuator is set to 0 dB, and the amplitude of the source is adjusted to set the displayed signal at the reference level.

The instrument’s internal marker is used to measure the refere nce amplitude. The Marker Delta function is activated and the RF input is reduced using the external precision step attenuator. Signal input levels from 0 dBm to −50 dBm are measured.

Item

Adapter Type-N(m), to BNC(f) 1250-1476 Adapter 3.5 mm(f) to 3.5mm(f) 5061-5311 Adapter BNC(m) to SMA(f) 1250-1700 APC 3.5 mm (1 meter) APC 3.5 mm, 1 meter 8120-4921

Critical Specifications

(for this test)

Recommended

Agilent Model

Attenuator , 10 dB Step Range: 0-50 dB

Frequency: 50 MHz Accuracy: ±0.25 dB

Cables (2 required) BNC, 120 cm (48 in.) 10503A Synthesized Sweeper Output Level Accuracy: 0 to –15 dBm: ±1.0 dB 83630B

355D

36 Chapter 2

Functional Tests

Amplitude Linearity

Figure 2-5 Amplitude Linearity Setup

NOTE Averaging is used for all measurements to improve repeatability and reduce

measurement uncertainty.

Procedure

1. Configure the equipment as shown in Figure 2-5.

2. Set up the synthesized sweeper by pressing:

Frequency, 50 MHz Amplitude

RF On/Off

, –2 dBm

, On

3. Set up the spectrum analyzer by pressing:

Frequency, 50 MHz

, Zero Span

Span

NOTE On the analyzer, ensure the reference level is 0 dBm and the attenuator is set

to 10 dB.

BW/AVG, 30 kHz Average Marker

, 10, Enter

(to turn on Marker function)

4. Set the external 10 dB attenuator to 0 dB.

5. Adjust the amplitude on the signal source until the marker amplitude on the analyzer reads 0 dBm ±0.2 dB.

6. On the analyzer, press the Single key to trigger a 10 sweep average.

Chapter 2 37

Functional Tests

Amplitude Linearity

7. On the analyzer, activate the Marker Delta function by pressing Marker, Delta.

8. Perform the following steps for eac h attenuator setting listed in the table below: a. Select the next External attenuator setting.

b. Press the

Single key to trigger a 10 sweep average.

c. Enter the delta marker value into Table 2-7. d. Check delta marker reading against the test limits.

Table 2-7 Amplitude Linearity Results

External Attenuator Setting

0 N/A Reference N/A 10 −11.0 −9.0 20 −21.0 −19.0 30 −31.0 −29.0 40 −41.0 −39.0 50 −51.0 −49.0

Minimum

(dB)

Marker Delta Value

(dB)

Maximum

(dB)

38 Chapter 2

Functional Tests

Second Harmonic Distortion (SHD)

Test Limits

Applied Frequency Mixer Level Distortion

40 MHz –20 dBm < –55 dBc

Test Description

This test checks the second harmonic distortion of the spectrum analyzer by tuning to twice the input frequency and examining the level of the distortion product. A low pass filter is inserted between the source and the spectrum analyzer to prevent the second harmonic from artificially raising the second harmonic product displayed on the analyzer.

The power level at the input mixer is 20 dB higher than specified to allow the distortion product to be seen. For example, the instrument specification may state that with a

–40 dBm signal at the input mixer, the distortion product should be suppressed by >–75 dBc.

The equivalent Second Harmonic Intercept (SHI) is 35 dBm (–40 dBm + 75 dBc). This test is performed with –20 dBm at the mixer and verifies the distortion product is suppressed by –55 dBc. This ensures the SHI is also 35 dBm (–20 dBm + 55 dBc).

Item

Adapter Type-N(m) to BNC(f) 1250-1476 Adapter BNC(m) to SMA(f) 1250-1700 Cable APC 3.5 mm, 1 meter 8120-4921 Filter, 50 MHz Low Pass Cutoff Frequency: 50 MHz

Rejection at 65 MHz: > 40 dB Rejection at 75 MHz: > 60 dB

Synthesized Sweeper Frequency: 50 MHz

Spectral Purity: Better than –30 dBc

Critical Specifications

(for this test)

Recommended

Agilent Model

0955-0306

83630B

Chapter 2 39

Functional Tests

Second Harmonic Distortion (SHD)

Figure 2-6 Second Harmonic Distortion Te st Setup

Procedure

1. Configure the equipment as shown in Figure 2-6.

2. Press

Preset on the spectrum analyzer and the synthesized sweeper.

3. Set up the spectrum analyzer by pressing:

Frequency, 40 MHz Amplitude

, –10 dBm Span, 1 MHz Sweep, Sweep Type, SWP (Swept)

4. Set up the synthesized sweeper by pressing:

CW Frequency, 40 MHz

, –10 dBm

Level

(On)

5. On the analyzer, press

Peak Search.

6. Adjust the synthesized sweeper amplitude for a spectrum analyzer display of –10 dBm

±0.1 dBm.

7. On the analyzer, activate the marker delta function by pressing the

Marker and Delta

keys.

8. Set the analyzer Center Frequency to 80 MHz.

9. Press

Enter to begin the twenty sweep averaging routine and read the Marker Delta value.

BW/Avg, Average and enter the number 20 using the numeric keypad. Then, press

Enter the displayed value under the Measured Second Harmonic Distortion (dBc) heading in Table 2-8.

40 Chapter 2

Table 2-8 Second Harmonic Distortion Results

Functional Tests

Second Harmonic Distortion (SHD)

Applied Frequency

(MHz)

40 <−55

Measured Second Harmonic Distortion

(dBc)

Specification

(dBc)

Chapter 2 41

Index

Agilent Technologies URL ii amplitude accuracy test amplitude linearity test

command error messages 10

DANL test 27 device-specific error messages

102 to 799

-399 to -300

displayed average noise level. See DANL

equipment

functional tests warm-up time

error messages

102 to 799 (device-specific)

-199 to -100 (command)

-299 to -200 (execution)

-399 to -300 (device-specific)

-499 to -400 (query) command (-199 to -100) device-specific (102 to 799) device-specific (-399 to -300) display location empty error queue execution (-299 to -200)

format introduction query (-499 to -400)

types viewing messages in queue

error queues

capacity clearing empty message front panel overflow handling SCPI remote interface

types viewing entries

execution errors

11 10 8

functional tests

before you start equipment list introduction vs performance verification tests warm-up time See also individual functional tests

informational messages

descriptions display location

messages

error informational

status

performance verification tests vs functional tests 19

query errors 6

remote interface error queue 2

SCPI interface error queue 2 second harmonic distortion test status messages

descriptions display location

tests. See functional tests

URL (Agilent Technologies) ii

frequency readout accuracy test 30 frequency response (flatness) test front panel

error queue characteristics

Agilent E4440A Instrument Messages and Functional Tests

Specifications and Main Features

Frequently Asked Questions

User Manual

1 Instrument Messages

Error Messages

Error Queues

Error Message Information

Error Message Types

0: No Error

102 to 799: Device-Specific Errors

Informational Messages

Status Messages

2 Functional Tests

Getting Started

Performing Functional Tests

Required Test Equipment

Amplitude Accuracy at 50 MHz

Testing Option 1DS (Preamp)

Displayed Average Noise Level (DANL)

Frequency Readout Accuracy

Frequency Response (Flatness)

Amplitude Linearity

Second Harmonic Distortion (SHD)

Index