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Agilent E1740A
VXI Time Interval Analyzer
Data Sheet
• 2-Slot, C-size, message based
• Continuous measurements — up to 80 MHz sample rate
• High-resolution time measurements
• 50 ps LSB for single-shot time interval measurements
• 512 K measurement memory or real-time histogram
• Built-in statistics and window margin analysis
Agilent E1740A
Description
The Agilent E1740A Time Interval Analyzer is a C-size, 2-slot,
message-based VXI module. It is a high-performance
analyzer capable of resolving single-shot time interval
measurements to 50 ps. Its ability to capture high-resolution
timing measurements continuously at up to an 80 MHz
measurement rate makes it well suited for many applications.
For data rates up to 80 MHz, the time-of-occurrence of every
edge is measured. Higher data rates are measured with a
maximum sample rate of 80 MHz. Measurements can be
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stored sequentially in the 512 K measurement memory or
sorted real-time into a histogram. Further on-card processing
gives faster access to statistics and window margin analysis
results—without the transfer of large amounts of
measurement data.
Timing is measured on a single channel, going from edge to
edge—useful in characterizing voltage-controlled oscillators
(VCOs), phase-locked loops (PLLs), frequency stability, or
clock jitter. Timing relationships between two channels, such
as clock and data, can be fully investigated also. This is
particularly useful in communications and digital design
where synchronization is important.
Refer to the Agilent Technologies Website for instrument
driver availability and downloading instructions, as well as for
recent product updates, if applicable.
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Measurement Setup and Powerful
Arming
Measurement setup is easy with the E1740A. Input parameters
and signal conditioning for the measurement channels are
selectable to accommodate your measurement situation.
Extensive arming capabilities let you specify exactly when
and at what rate measurements are acquired and the number
of times the acquisition process is repeated. Everything from
a single measurement to 10
15
time interval measurements can
be captured to meet your measurement needs.
Further measurement control is available with the Inhibit
input, allowing you to control acquisition with an external
signal. The Inhibit input allows you to effectively “gate out”
unwanted measurements on complex signals.
Product Specifications
Accuracy
±Resolution
±(Time Interval Reference Error)
Reference Error = Timebase Aging X Elapsed Time since Last Calibration.
±(Start Threshold Level Timing Error)
Threshold Level Timing Error = (1⁄2Sensitivity) / Signal Slew Rate at the
Threshold Level
±(Stop Threshold Level Timing Error)
± 1 ns Systematic Error
Systematic Error can be significantly reduced with calibration.
Measurement Memory
(# of measurements)
Fast histogram (singlechannel or dual-channel): 10
Single-channel sequential
(1→1 or 2→2): 512 K
Dual-channel sequential
(1→2): 256 K
Sequential measurement
memory: 512 K
12
, accumulation to 10
15
Measurements
Time interval: 1→1, 1→2, 2→2
Timing Characteristics
Minimum TI (1→2): 0.0 ns
Minimum TI (1→1 or 2→2):
Continuous: >12.5 ns
Noncontinuous: 8 ns (2 adjacent edges followed by a ≥30 ns
Maximum TI
(1→1 or 1→2):
Latency after TI (1→2): 30 ns
Frequency: 150 MHz
Minimum LSB: 50 ps
Measurement resolution: < 100 ps rms
Resolution: [(100 ps rms)
Threshold trigger error: [(600 µV)2+ E
Note: Enis the rms noise of the input signal over a 200 MHz bandwidth.
Peak-to-peak jitter (for 10
measurements): 500 ps typical
10
(every edge on an 80 MHz signal)
delay on a 125 MHz signal)
3.2 µs to 26.2 ms, depending on selected
resolution (LSB)
(every 0.0 ns two-channel
measurement on a 30 MHz signal)
2
+ (Threshold Trigger
1/2
Errors)2]
Threshold Level
1/2
2
]
÷ Input Slew Rate at the
n
Arming
(Acquiring the Right Time Interval Measurements)
(Typical)
Delay after trigger
(holdoff):
Delay resolution: 25 ns or 1 event
Measurement duration: Number of measurements or time (<26 ms)
Re-arm time: <500 ns between acquisitions
Pacing: Events (1<N<2
Inhibit: Yes
Time (100 ns to 26 ms),
events (1 to 1 million), or none
20
), or random
1 and 2 Input Characteristics
(Typical)
Bandwidth: 200 MHz
Impedance: 50 Ω, or 1 MΩ
switchable
Capacitance (1 MΩ): <20 pf
Coupling: AC or DC switchable
Slope: ± (1 only), +, –
Maximum dynamic range: 5 V p-p
Signal operating range:
1 MΩ: 10 V
50 Ω: 5 V
Damage level:
1 MΩ: 40 V rms for <5 kHz, 5 V rms for >5 kHz
50 Ω: 5 V rms
Threshold: TTL, ECL, and 0 V presets; variable from
–10 V to +10 V in 2.5 mV steps
Minimum pulse width: 5 ns at sensitivity level
(500 kΩ in common)
(<30 pf in common)
(100 Hz cutoff in AC)
2
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Trigger Input Characteristics
(Typical)
Impedance: 1 MΩ
Slope: +, –
Threshold levels: ECL, ECL/10, 0 V, TTL, TTL/10
Inhibit Input Characteristics
(Typical)
Impedance: 10 kΩ
Level: ECL, 0 V, TTL
Active: High or low
Frequency Reference
(Typical)
Internal oscillator, phase-lockable to VXI CLK10 or front panel 10 MHz reference input
Frequency:
Aging: <1 ppm/year
10 MHz
Programming
Output data: Frequency, time intervals, time stamps,
Output data format: ASCII, integer, or floating point
histogram, statistics, or window margin
analysis
Instrument Drivers
See the Agilent Technologies Website (http://www.agilent.com/find/
inst_drivers) for driver availability and downloading.
Command module
firmware: n/a
Command module
firmware rev: n/a
I-SCPI Win 3.1: n/a
I-SCPI Series 700: n/a
C-SCPI LynxOS: n/a
C-SCPI Series 700: n/a
Panel Drivers: Yes
plug&play
VXI
Framework: No
plug&play
VXI
Framework: No
plug&play
VXI
Framework: No
Win
Win 95/NT
HP-UX
Module Current
I
PM
+5 V: <50
+12 V: <0.16 0
–12 V: <0.16 0
+24 V: 00
–24 V: 00
–5.2 V: <60
–2 V: <1.6 0
I
DM
Cooling/Slot
Watts/slot: 32.00
∆P mm H
Air Flow liter/s: 2.60
O: 0.00
2
General Specifications
VXI Characteristics
VXI device type: Message based
Size: C
Slots: 2
Connectors: P1/2
Shared memory: Yes
VXI busses: ECL Trigger Bus
C-size compatibility: n/a
Ordering Information
Description Product No.
VXI Time Interval Analyzer E1740A
Refurbished Equipment E1740AR 8ZE
Time Interval Analyzer Software E1741A
Sonet/SDH Tributary Jitter Analyzer E1742A
Clock Jitter Analyzer Software E1743A
Timing Pattern Analysis Software E1747A
Multiple-Channel Network Synchronization SW E1748A
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Related Literature
2000 Test System and VXI Catalog CD-ROM,
Agilent Pub. No. 5980-0308E (detailed specifications for VXI products)
2000 Test System and VXI Catalog,
Agilent Pub. No. 5980-0307E (overview of VXI products )
1998 Test System and VXI Products Data Book,
Agilent Pub. No. 5966-2812E
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Get assistance with all your test and measurement needs at
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or check your local phone book for the Agilent office
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Data Subject to Change
©Agilent Technologies 2000
Printed in the U.S.A. 04/2000
Publication No.: 5965-5549E
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