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Manual Part Number
81980-90A11
Edition
Fourth edition, April 2005
Third edition, January 2005
Second edition, July 2004
First edition, October 2003
Printed in Germany
Subject Matter
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Safety Notices
CAUTION
A CAUTION notice denotes a
hazard. It calls attention to an
operating procedure, practice, or
the like that, if not correctly
performed or adhered to, could
result in damage to the product
or loss of important data. Do not
proceed beyond a CAUTION
notice until the indicated
conditions are fully understood
and met.
WARNING
A WARNING notice denotes a
hazard. It calls attention to an
operating procedure, practice,
or the like that, if not correctly
performed or adhered to, could
result in personal injury or
death. Do not proceed beyond a
WARNING notice until the
indicated conditions are fully
understood and met.
Agilent Technologies Sales and Service Offices
For more information about Agilent Technologies test and measurement
products, applications, services, and for a current sales office listing, viesit
our web site:
http://www.agilent.com/comms/lightwave
You can also contact one of the following centers and ask for a test and
measurement sales representative.
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In This Guide...
Chapter 1, “Getting Started.
This chapter contains an introductory description of the modules and aims
to make the modules familiar to you.
Chapter 2, “Accessories.
This chapter contains details of the various modules and options available.
Chapter 3, “Specifications.
This chapter contains the full performance specifications for the modules.
Chapter 4, “Performance Tests.
This chapter contains full detailed instructions that enable you to run a
performance test on a High Power Optical Attenuator. Also included are
Test Report sheets to record the measurements taken during the
performance test.
Chapter 5, “Cleaning Information.
This appendix contains information as to how best clean your instrument,
along with some general safety instructions that you should follow when
cleaning your instrument.
Table of Contents
Getting Started11
Safety Considerations12
Safety Symbols12
Initial Inspection13
Line Power Requirements13
Operating Environment13
Input/Output Signals14
Storage and Shipment14
Initial Safety Information for Tunable Laser Modules15
Laser Safety Labels16
Introduction17
Typical Use Models20
Optical Output22
Polarization Maintaining Fiber22
Angled and Straight Contact Connectors23
Test Record91
Test Record101
Test Record111
Test Record118
Test Record128
Cleaning Information139
Cleaning Instructions140
Safety Precautions140
Why is it important to clean optical devices ?141
What do I need for proper cleaning?142
Preserving Connectors146
Cleaning Instrument Housings146
Which Cleaning Procedure should I use?147
How to clean connectors148
How to clean connector interfaces150
The following general safety precautions must be observed during all
phases of operation, service, and repair of this instrument. Failure to
comply with these precautions or with specific warnings elsewhere in this
manual violates safety standards of design, manufacture, and intended
use of the instrument. Agilent Technologies Inc. assumes no liability for
the customer’s failure to comply with these requirements.
Before operation, review the instrument and manual, including the red
safety page, for safety markings and instructions. You must follow these to
ensure safe operation and to maintain the instrument in safe condition.
CAUTIONWARNING
The WARNING sign denotes a hazard. It calls attention to a
procedure, practice or the like, which, if not correctly performed
or adhered to, could result in injury or loss of life. Do not proceed
beyond a WARNING sign until the indicated conditions are fully
understood and met.
Safety Symbols
The apparatus will be marked with this symbol when it is necessary for the
user to refer to the instruction manual in order to protect the apparatus
against damage.
Inspect the shipping container for damage. If there is damage to the
container or cushioning, keep them until you have checked the contents of
the shipment for completeness and verified the instrument both
mechanically and electrically.
The Performance Tests give procedures for checking the operation of the
instrument. If the contents are incomplete, mechanical damage or defect
is apparent, or if an instrument does not pass the operator’s checks, notify
the nearest Agilent Technologies Sales/Service Office.
CAUTIONWARNING
CAUTIONWARNING
To avoid hazardous electrical shock, do not perform electrical
tests when there are signs of shipping damage to any portion of
the outer enclosure (covers, panels, etc.).
You MUST return instruments with malfunctioning laser modules
to an Agilent Technologies Sales/Service Center for repair and
calibration.
Line Power Requirements
The Agilent 81980A, 81940A, 81944A, 81989A and 81949A Compact
Tunable Laser Source modules operate when installed in Agilent 8163A/B
Lightwave Multimeters, Agilent 8164A/B Lightwave Measurement
Systems, and Agilent 8166A/B Lightwave Multichannel Systems.
Operating Environment
The safety information in your mainframe’s User’s Guide summarizes the
operating ranges for the Agilent 81980A, 81940A, 81944A, 81989A and
81949A Compact Tunable Laser Source modules. In order for these
modules to meet specifications, the operating environment must be within
the limits specified for your mainframe.
Laser Class according to
IEC 60825-1 (2001)- Intl.
Max. permissible CW
output power**
* Max. CW output power is defined as the highest possible optical power that the laser source can produce at its output
connector.
** Max. permissible CW output power is the highest optical power that is permitted within the appropriate laser class.
A sheet of laser safety labels is included with the laser module as required.
In order to meet the requirements of IEC 60825-1 we recommend that you
stick the laser safety labels, in your language, onto a suitable location on
the outside of the instrument where they are clearly visible to anyone
using the instrument.
CAUTIONWARNING
Please pay attention to the following laser safety warning:
Under no circumstances look into the end of an optical cable
attached to the optical output when the device is operational. The
laser radiation can seriously damage your eyesight.
Do not enable the laser when there is no fiber attached to the
optical output connector.
The laser is enabled by pressing the ’active’ button close to the
optical output connector on the front panel of the module. The
laser is on when the green LED on the front panel of the instrument
is lit.
The use of optical instruments with this product will increase eye
hazard.
The laser module has a built-in safety circuitry which will disable
the optical output in the case of a fault condition
Refer servicing only to qualified and authorized personnel.
A Tunable Laser Source (TLS) is a laser source for which the wavelength
can be varied through a specified range. The Agilent Technologies range of
TLS modules also allow you to set the output power, and to choose
between continuous wave or modulated power.
The Agilent Technologies range of compact TLS modules are flexible
stimulus modules suitable for applications such as the testing of optical
amplifiers, DWDM components, and complete DWDM systems.
Installation
The Agilent 81980A, 81940A, 81944A, 81989A, 81949A Compact TLS
modules are front-loadable modules.
For a description of how to install your module, refer to “How to Fit and
Remove Modules” in the Installation and Maintenance chapter of your
mainframe’s User’s Guide.
Switch the laser source on or off using the switch on its front panel, using
the [State] parameter in the instrument’s Graphical User Interface, or
remotely using GP-IB commands. When the Active LED is lit the source is
emitting radiation. When the Active LED is not lit the source is not emitting
radiation.
High power compact Tunable Laser modules for S-, C- and L-band
The Agilent 81980A, 81940A, 81944A, 81989A, 81949A Compact TLS
modules provide high output power up to +13 dBm.
Each module covers a total wavelength range of 110 nm, either:
•In the S and C-bands
with the high power in C-band (81980A and 81989A), or
•In the C and L-bands
with the high power in the L-band (81940A, 81944A and 81949A).
Their compact single-slot format makes them a flexible and cost-effective
stimulus for single channel and multichannel DWDM applications
Device Characterization at high power levels
The high optical output power of the Agilent 81980A, 81940A, 81944A,
81989A, 81949A Compact TLS module improves the testing of all types of
optical amplifiers and other active components as well as broadband
passive optical components. It helps overcome losses in test setups or in
the device under test itself. Thus, engineers can test optical amplifiers
such as EDFAs, Raman amplifiers, SOAs and EDWAs to their limits. This
tunable laser provides the high power levels required to help speed the
development of innovative devices by enabling the test and measurement
of nonlinear effects.
SBS suppression feature enables high launch power
A new SBS Suppression feature avoids the reflection of light induced by
Stimulated Brillouin Scattering (SBS). It enables the launch of the high
optical output power into long fibers without intensity modulation to avoid
impairment in time-domain measurements.
Coherence Control avoids interference-induced power
fluctuations
A high-frequency modulation function is used to increase the effective
linewidth to avoid power fluctuations due to coherent interference effects
The modulation pattern is optimized for stable power measurements, even
in the presence of reflections.
Built-in wavelength meter for active wavelength control
The 81980A, 81940A and 81944A feature a built-in wavelength meter with
a closed feedback loop for enhanced wavelength accuracy. In continuous
sweep mode, it allows dynamic wavelength logging to make
measurements during the sweep.
Dynamic power control for excellent reproducibility
The integrated dynamic power control loop ensures a high reproducibility
in power level. This allows highly repeatable measurements to reduce
errors when comparing the results of several wavelength sweeps. As
these modules feature mode-hop free tunability over their entire tuning
range with continuous output power, they achieve highly accurate
measurements over wavelength.
Continuous Sweep Mode with wavelength logging
All 819xxA modules can be operated in the stepped mode, usually used
where measurements are done at particular wavelength.
The 81980A, 81940A and 81944A can also be operated in the continuous
sweep mode with dynamic wavelength logging to make measurements
during the wavelength sweep.
Internal Modulation
The internal modulation feature enables an efficient and simple TimeDomain Extinction (TDE) method for Erbium based optical amplifier test
when used together with the external gating feature of Agilent's OSA.
It also supports the transient testing of optical amplifiers by simulating
channel add and drop events.
Specifications:
For further details on specifications, see the “Definition of Terms” in
Angled contact connectors are available as an option for Agilent 81980A,
81940A, 81944A, 81989A, 81949A Compact TLS modules.
Angled contact connectors help you to control return loss, since reflected
light tends to reflect into the cladding, reducing the amount of light that
reflects back to the source.
CAUTION
NOTE
If the contact connector on your instrument is angled, you can only
use cables with angled connectors with the instrument
Angled Contact
Connector Symbol
Figure 7 Angled and Straight Contact Connector Symbols
Figure 7 shows the symbols that tell you whether the contact connector of
your Tunable Laser module is angled or straight. The angled contact
connector symbol is colored green.
You should connect straight contact fiber end connectors with neutral
sleeves to straight contact connectors and connect angled contact fiber
end connectors with green sleeves to angled contact connectors.
Angled non-contact fiber end connectors with orange sleeves cannot be
directly connected to the instrument.
Straight Contact
Connector Symbol
See “Connector Interfaces” on page 28 for further details on connector
interfaces and accessories.
The Agilent 81980A, 81940A, 81944A, 81989A, 81949A Compact TLS
module are available in various configurations for the best possible match
to the most common applications.
This chapter provides information on the available options and
accessories.
The following connector interfaces are available for these Compact TLS
module:
Option 071:
Straight Contact Connectors
If you want to use straight connectors (such as FC/PC/SPC, E-2000,
SC/PC/SPC, DIN 47256 or ST) to connect to the instrument, you must do
the following:
1 Attach your connector interface to the interface adapter.
2 See Ta b l e 2 for a list of the available connector interfaces.
Table2 Straight Contact Connector Interfaces
DescriptionModel number
FC/PC/SPCAgilent 81000 FI
Table 3 Angled Contact Connector Interfaces
E-2000Agilent 81000 HI
SC/PC/SPCAgilent 81000 KI
DIN 47256 / 4108.6Agilent 81000 SI
STAgilent 81000 VI
3 Connect your cable.
Option 072:
Angled Contact Connectors
If you want to use angled connectors (such as E-2000 APC, SC/APC,
FC/APC or DIN 4108.6/4108.6) to connect to the instrument, you must do
the following:
1 Attach your connector interface to the interface adapter.
2 See Ta b l e 3 for a list of the available connector interfaces.
DescriptionModel number
E-2000 APCAgilent 81000 HI
SC/APCAgilent 81000 KI
FC/APCAgilent 81000 NI
DIN 47256 / 4108.6Agilent 81000 SI
Agilent 81980A, 81940A, 81944A, 81989A, 81949A Compact TLS module
are produced to the ISO 9001 international quality system standard as part
of Agilent’s commitment to continually increasing customer satisfaction
through improved quality control.
Specifications apply, unless otherwise noted, for the stated environmental
conditions, after warm-up, in CW mode (unmodulated output, coherence
control off, SBS suppression off) and at uninterrupted line voltage.
“Constant temperature” is a stable operating temperature within ±1 K.
The maximum difference between the displayed wavelength and the
actual wavelength of the tunable laser source. Wavelength is defined as
wavelength in vacuum.
Effective linewidth
The time-averaged 3 dB width of the optical spectrum with coherence
control on, expressed in Hertz.
Conditions:
As specified.
Measurement:
Using a heterodyning technique: The output of the laser under test is
mixed with another laser of the same type on a wide bandwidth
photodetector. The electrical noise spectrum of the photodetector current
is measured with an Agilent Lightwave signal analyzer, and the linewidth
calculated from the heterodyne spectrum (Lightwave signal analyzer
settings: resolution bandwidth 1 MHz, video bandwidth 10 kHz, sweep
time 20 ms, single scan).
External digital modulation - delay time
Specifies the time between the falling edge of the external trigger (when
reaching logical zero) and the falling edge of the optical pulse (at 10% of its
original value).
Conditions:
Modulation input signal and duty cycle as specified, modulation frequency
as specified.
Measurement:
Using a photoreceiver (of sufficient bandwidth) and an oscilloscope.
Specifies half the peak-to-peak optical power change divided by the
average optical power for a sinusoidal input voltage at the analog
modulation input. The average power is defined as half the sum of
maximum and minimum power.
Conditions:
Modulation input signal as specified, modulation frequency as specified.
NOTE
Modulation depthis a is a value between 0 and 100%
Measurement:
Using a photoreceiver (of sufficient bandwidth) and an oscilloscope.
Internal digital modulation - duty cycle
When the laser is internally (digitally) modulated at a frequency f, the duty
cycle is specified as
modulation cycle (expressed in percent).
Conditions:
Modulation frequency as specified.
Measurement:
Using a photoreceiver (of sufficient bandwidth) and an oscilloscope.
τ
x f, where τon is the time the laser is on during one
on
Internal digital modulation - rise and fall time
Fall time specifies the time for the optical pulse to fall from 90% to 10% of
its original power value.
Rise time specifies the time for the optical pulse to rise from 10% to 90% of
its final power value.
Using a photoreceiver (of sufficient bandwidth) and an oscilloscope.
Linewidth
The 3 dB width of the optical spectrum, expressed in Hertz.
Conditions:
Coherence control off.
Measurement:
Using a self-heterodyning technique: The output of the laser under test is
sent through a Mach-Zehnder interferometer in which the length
difference of the two arms is longer than the coherence length of the laser.
The electrical noise spectrum of the photodetector current is measured
with Agilent lightwave signal analyzer, and the linewidth is calculated from
the heterodyne spectrum.
Alternatively, Using a heterodyning technique: The output of the laser
under test is mixed with another laser of the same type on a wide
bandwidth photodetector. The electrical noise spectrum of the
photodetector current is measured with Agilent Lightwave signal analyzer,
and the linewidth is calculated from the heterodyne spectrum. (Lightwave
signal analyzer settings: resolution bandwidth 1 MHz, video bandwidth 10
kHz, sweep time 20 ms, single scan).
The 81944A compact tunable laser source has a built-in polarization
controller which alters the polarization of the output.
The information here about the polarization extinction ratio does not apply
to the 81944A.
Specifies the ratio of the optical power in the slow axis of a connected
polarization-maintaining fiber to optical power in the fast axis, expressed
in dB
Conditions:
Applicable to tunable laser sources utilizing polarization maintaining fiber
that has its TE mode in the slow axis and aligned with the connector key.
Measurement:
Using a polarization analyzer at the end of a polarization-maintaining
patchcord, by sweeping the wavelength to create circular traces on the
Poincaré sphere. Calculate the polarization extinction ratio from the
diameters of these circles.
Figure10 Circular traces on the Poincaré sphere used to calculate polarization extinction
When measuring ratios (in dB) between the displayed power level and the
actual power level for different output power levels of the tunable laser
source, the power linearity is ± half the difference between the maximum
and the minimum value of all ratios.
The uncertainty in reproducing the power level after changing and resetting the power level. The power repeatability is ± half the span between
the highest and lowest actual power (in dBm).
The long-term power repeatabilitycan be obtained by taking the
power repeatability and power stability into account.
Specifies the change of the power level of the tunable laser source over
time, expressed as ± half the span (in dB) between the highest and lowest
actual power.
Figure 13 Power stability.
Conditions:
Time span as specified. Uninterrupted tunable laser source output power,
constant wavelength and power level settings, constant temperature.
Specifies the ratio between the mean-square of the optical power
fluctuation amplitude
bandwidth B, and the square of the average optical power P
RIN, if expressed as “dB/Hz”, is calculated by:
Conditions:
As specified.
∆P
within a specified frequency range f and for
f,B
avg
.
Measurement:
Using an Agilent Lightwave signal analyzer and bandwidth set to 3 MHz.
Relative wavelength accuracy
When randomly changing the wavelength of the tunable laser source and
measuring the differences between the displayed and the actual
wavelength, the relative wavelength accuracy is
± half the span between the maximum and the minimum value of all
differences.
Figure 14 Relative wav e le ngt h acc uracy.
Conditions:Uninterrupted tunable laser source output power, constant power setting,
Specifies the ratio of the optical power incident to the tunable laser source
output port at the wavelength set on the tunable laser source, to the power
reflected from the tunable laser source output port.
Conditions:
Tunable laser source output off.
SBS suppression - effective linewidth
Specifies the peak-to-peak change of the periodically modulated
wavelength resulting from the SBS suppression feature, expressed in
Hertz.
SBS suppression - residual amplitude modulation (depth)
Specifies the peak-to-peak difference of the periodically modulated optical
power resulting from the SBS suppression feature, divided by the sum of
NOTE
minimum power P
Modulation depthis a value between 0 and 100%
and maximum power P
min
max
.
Side-mode suppression ratio
The ratio of optical power in the main mode to the optical power of the
highest sidemode, expressed in dB:
Using the Agilent Lightwave signal analyzer, by analyzing the heterodyning
between the main signal and the highest sidemode.
Signal to source spontaneous emission ratio
Specifies the ratio between signal power and maximum spontaneous
emission (SSE) power. The SSE power is determined in a specified
bandwidth within a ±3 nm window around the signal wavelength, where
±1 nm around the signal wavelength are excluded, expressed in dB per
nm.
Figure 15 Signal to source spontaneous emission ratio.
Conditions:
As specified.
Measurement:
Using an optical spectrum analyzer at 0.5 nm resolution bandwidth (to
address the possibility of higher SSE within a narrower bandwidth), then
extrapolated to 1 nm bandwidth.
The random uncertainty in reproducing a wavelength of the tunable laser
source after changing and re-setting the wavelength. The wavelength
repeatability is ± half the span between the maximum and the minimum of
all actual values of this wavelength.
The long-term wavelength repeatabilitycan be obtained by taking
the wavelength repeatability and wavelength stability into account.
Wavelength resolution
The smallest selectable wavelength increment or decrement.
Wavelength stability
Specifies the change of the actual wavelength of the tunable laser source
over time, expressed as ± half the span between the maximum and
minimum of all wavelengths.
Conditions:
Time span as specified, uninterrupted tunable laser source output power,
constant wavelength and power level settings, constant temperature.
The dynamic specifications describe the behavior of the instrument in
“Continuous sweep mode” .
Static conditions
The static specifications describe the behavior of the instrument in
“Stepped mode” .
Logged wavelength
This is the wavelength measured and recorded by the internal wavelength
meter during a sweep at the corresponding trigger signal. This recorded
wavelength can be read with the logging function.
NOTE
Measurement principles are indicated. Altern ative m easurement principles of equal value are also acceptable.
The logged wavelength posi tions during a sweepdepend on
environmental conditions and may slightly differ between repeated
sweeps.
Steppe d mode
In stepped mode the tunable laser source is operated statically, so that a
user's measurement is made at a fixed wavelength of the tunable laser
source. When tuning to a new wavelength the static specifications are
valid after completion of the tuning operation.
Continuous sweep mode
In continuous sweep mode the tunable laser source is operated
dynamically, so that a user's measurement is made while the wavelength
of the tunable laser source changes in a defined way (given by start
wavelength, end wavelength and sweep speed). During a continuous
sweep the dynamic specifications and the “Logged wavelength” applies.
50% duty cycle
200 Hz to 1 MHz (extinction > 30 dB)
rise and fall time < 100 ns.
Modulation output (mainframe):
TTL reference signal
External digital modulation
> 45% duty cycle, fall time
<300 ns, 200 Hz to 1 MHz
Modulation input (mainframe):
TTL signal
[1]
[1]
External analog modulation
≥ 15% modulation depth,
5kHz to 1MHz
Modulation input (mainframe):
5 Vp-p
Coherence Control:
For measurements on components with 2 m long patchcords and
connectors with 14 dB return loss, the effective linewidth results in a
typical power stability of < ±0.025 dB over 1 minute by drastically reducing
interference effects in the test setup.
The procedures in this chapter test the optical performance of Agilent
81980A, 81940A, 81944A, 81989A, 81949A Compact TLS module. The
complete specifications to which each module is tested are given in
“Specifications” on page 31.
All tests can be performed without access to the interior of the module.
The performance tests refer specifically to tests using the listed test
equipment and to the associated figures and descriptions of the test
setups.
The equipment required for the performance test is listed in Ta b l e 5 . Any
equipment that satisfies the critical specifications of the equipment given
in Ta b l e 5 may be substituted for the recommended models.
Results of the performance test may be tabulated on the Test Record
provided at the end of the test procedures. It is recommended that you fill
out the Test Record and refer to it while executing the test. Since the test
limits and setup information are printed on the Test Record for easy
reference, the record can also be used as an abbreviated test procedure (if
you are already familiar with the test procedure). The Test Record can also
be used as a permanent record and may be reproduced without written
permission from Agilent Technologies.
Test Failure
Always ensure that you use the correct cables and adapters, and that all
connectors are undamaged and extremely clean.
If an Agilent 81980A, 81940A, 81944A, 81989A, 81949A Compact TLS
module fails any performance test, return it to the nearest Agilent
Technologies Sales/Service Office for repair.
Instrument Specification
Specifications are the performance characteristics of the instrument that
are certified. These specifications, listed in “Compact Tunable Laser
Module Specifications” on page 47 are the performance standards or
limits against which an Agilent 81980A, 81940A, 81944A, 81989A, 81949A
Compact TLS module can be tested.
The specifications also list some “Supplementary Performance
Characteristics” of the Agilent 81980A, 81940A, 81944A, 81989A, 81949A
Compact TLS module on page 54. Supplementary Performance
Characteristics should be regarded as additional information.
Any changes to the specification due to manufacturing changes, design, or
traceability to the National Institute of Standards and Technology (NIST),
will be covered in a manual change supplement, or revised manual. Such
specifications supersede any that were previously published.
•Turn the instruments on, enable the laser and allow the instruments to
warm up.
•Ensure that the Device Under Test (DUT) and all the test equipment is
held within the environmental specifications given in “Compact
Tunable Laser Module Specifications” on page 47.
General test Setup
Insert your Compact Tunable Laser Source from the front of Slot 1 of the
Agilent 8164A/B Lightwave Measurement System.
The procedures in this section show how to calculate the Relative
Wavelength Accuracy, Absolute Wavelength Accuracy, Mode-hop Free
Tuning, and Wavelength Repeatability results.
Absolute and Relative Wavelength
Accuracy
For definitions, see “Absolute wavelength accuracy” on page 33 and
“Relative wavelength accuracy” on page 41.
Measurement Principle
The TLS is set to certain wavelengths and the actual wavelength is
measured using a well-calibrated wavelength meter. Ideally, the displayed
and measured wavelengths should coincide. The difference between the
displayed and measured (actual) wavelength is the Absolute Wavelength
Accuracy.
Relative Wavelength Accuracy describes the instrument's ability to
generate precise wavelength steps. For example, if the wavelength setting
is changed by 1 nm, the actual wavelength should change by 1 nm. To test
for deviations from this ideal, the tunable laser source is set to various
wavelengths, and the actual wavelength is measured using a wavelength
meter.
The measurement of the relative wavelength accuracy includes the
measurement of absolute wavelength accuracy. The absolute wavelength
accuracy measurement program generates all the results needed for the
calculation of the relative wavelength accuracy.
For definition, see “Mode-hop free tunability” on page 37.
This test does
NOT apply to the 81944A.
Measurement Principle
Figure 19 Mode-hop free Tuning Range.
A mode - hop is an abrupt change of the laser wavelength occurring while
tuning, when the laser changes to another longitudinal mode.
The mode-hop free tuning range is defined for the stepped mode. It is
automatically ensured by the wavelength regulation performed by the
built-in wavelegth meter, because the relative wavelength accuracy is
better than a mode-hop. Consequently, the mode-hop free tuning range
can not be tested manually in a way of measuring wavelength accuracy.
The wavelength is always forced to the value referenced to and controlled
by the built-in wavelength meter. As a result, a mode-hop is generally not
possible. The previous tests of absolute and relative wavelength accuracy
have proved the functionality and performance of the built-in wavelength
meter.
For definition, see “Wavelength repeatability” on page 45.
Measurement Principle
The TLS is set to any wavelength (an initial reference wavelength) within
the specified wavelength range and the actual wavelength measured.
Then the TLS is set to another wavelength (generally chosen at random),
re-set to the initial wavelength and the actual wavelength measured again.
This sequence is repeated several times. The maximum deviation of the
measured wavelength after being reset to the reference is calculated and
compared to the test limits.
Then the TLS is set to a second (initial reference) wavelength, and the
sequence repeated.
Figure 20 Wavelengt h Re peatability.
At the start of the test, the TLS is set:
•To its lowest specified wavelength,
•To the highest power the TLS can deliver over the full wavelength
The procedures in this section show how to measure the Maximum Output
Power, Power Linearity, Power Flatness versus Wavelength, and Power
Stability.
Maximum Output Power
For definition, see “Maximum output power” on page 36.
Make sure the instruments have warmed up before starting the
measurement.
Measurement Principle
NOTE
The TLS' output power is set to excessive power (indicated on the display
by “ExP”) to get the highest achievable power. For each wavelength within
the specified wavelength range, the actual output power is measured and
compared against (wavelength-dependent) test limits.
Figure21 Maximum Output Power.
•Absolute power accuracy is not specified.
•The result of the measurement is greatly influenced by the quality and
matching of the interconnections used.
At the start of the test, the TLS is set:
•To its lowest specified wavelength,
•To an output power larger than the specified output power,
•Such that any modulation is off.
At the end of the test, the TLS is set to its maximum specified wavelength.
The laser output is limited to its maximum possible value at this
wavelength.
The display will probably show ExP (Excessive Power).
6 Switch on the TLS output.
7 Set the wavelength of the 81626B to the same as the compact TLS
module, as given in step 5.
8 Measure the output power using the 81626B and note the result for
this wavelength in the Test Record.
9 Increase λ, the output wavelength, of the compact TLS module to the
next value given in the Test Record.
10 Increase the wavelength of the 81626B to the same value.
11 Note the measured power for the wavelength in the Test Record.
12 Repeat step 9 to step 11 for the full wavelength range.
Test Procedure for 81944A
The 81944A has an integrated building block which modulates the output
power versus wavelength and temperature. Even very small changes
would vary the output power randomly. This function is required for use in
the 3909A PDM system. The following test covers both the maximum
(mean) output power, as well as the amount of the output power
modulation.
1 Set up the equipment as shown in Figure 23:
Figure 23 Test Setup for Maximum Output Power Tests
Power linearity describes the TLS' ability to generate precise power steps.
For example, if the power setting is changed by
3 dB, the actual power should change by 3 dB. The deviations from this
ideal are tested by setting defined power steps and measuring them using
the power meter.
Figure24 Power Linearity
At the start of the test, the TLS is set:
•To any fixed wavelength, preferably to a wavelength where the highest
specified output power can be achieved,
•To the maximum output power specified for this wavelength,
•Such that any modulation is off.
The output power is measured and compared to the displayed power
value. For simplicity, the start value is defined to a reference, and all
sequencing differences between the measured and displayed power
values are compared to this reference.
Output power is decremented in 1 dB steps.
At the end of the test, the compact TLS is set to its minimum output power.
•Set λ, the wavelength, to the same as the compact TLS module, as
given in step 3.
7 Switch on the TLS output.
8 Note the power value displayed by the 81626B in the Test Record.
9 At the 81626B, select <Menu> then <Disp → Ref>
10 Change the power setting of the compact TLS module to the next value
given in the Test Record.
11 Note the (relative) power displayed by the 81626B as the “Measured
Relative Power from start”.
12 Calculate the “Power Linearity at current setting” as the sum of
“Measured Relative Power from start” and “Power Reduction from
start”.
13 Repeat step 10 to step 12 for all power levels listed in the Test record.
14 Determine the maximum value and the minimum value of the
calculated Power Linearity at the various settings and record them in
the test record them as “Maximum Power Linearity at current setting”,
and “Minimum Power Linearity at current setting”, respectively.
15 Subtract the minimum power linearity value from the maximum power
linearity value and record the result as the Total Power Linearity.
Table6 Example: Agilent 81980A Power Linearity.
Power Setting
from start
Start = REF+ 13.0 dBm0.00 dBm+ 0.00 dBm=0.00 dBm
+12.0dBm-1.02dBm+ 1.00dBm= -0.02dBm
+11.0dBm-1.98dBm+ 2.00dBm= +0.02dBm
+10.0dBm-2.97dBm+ 3.00dBm= +0.03dBm
+ 9.0 dBm- 4.03 dBm+ 4.00 dBm= -0.03dBm
+ 8.0 dBm- 4.96 dBm+ 5.00 dBm= +0.04dBm
+ 7.0 dBm- 5.97 dBm+ 6.00 dBm= + 0.03 dBm
+ 6.0 dBm- 6.98 dBm+ 7.00 dBm= + 0.02 dBm
Measured Relative
Power from start
Maximum Power Linearity at current setting:+ 0.04 dBm
Minimum Power Linearity at current setting:- 0.03 dBm
To t al L in e a ri t y
= Max. Power Linearity - Min. Power Linearity0.07 dBpp
For definition, see “Power flatness versus wavelength” on page 39.
This test does
NOT apply to the 81944A.
Measurement Principle
At a fixed power level, the wavelength is tuned over a given wavelength
span. At each wavelength, the power is measured. Ideally, all power levels
would be identical. Any deviation is expressed as power flatness
Figure 26 Power Flatn ess
At the start of the test, the TLS is set:
•To its lowest specified wavelength,
•To the highest power the TLS can deliver over the full wavelength
range,
•Such that any modulation is off.
The wavelength is increased in 5 nm increments and the difference
between the measured and the displayed power is recorded.
At the end of the test, the TLS is set to its maximum specified wavelength.
2 Connect the fiber to the optical output.
3 Move to the compact TLS channel. Set the [Menu] parameters to:
Tunable Laser Channel [Menu] ParametersValues
<Wavelength Mode><λ>
<Source State><Off>
<Power Unit><dBm>
<Power Mode><Automatic>
Modulation: <mod src><Off>
4 Set the initial wavelength and power of the compact TLS to:
Compact TLS moduleWavelength [λ]Power [P]
Agilent 81980A1540.000 nm+ 6.000 dBm
Agilent 81989A1540.000 nm+ 6.000 dBm
Agilent 81940A1580.000 nm+ 6.000 dBm
Agilent 81949A1580.000 nm+ 6.000 dBm
5 Make sure the optical output is switched off.
6 Zero the power meter. Press [Menu] then select <Zero>.
7 Switch on the TLS output, then wait for 1 minute.
8 Select the logging application. Press [Appl] then select <Logging>.
For definition, see “Signal to source spontaneous emission ratio” on
page 43.
Measurement Principle
The compact TLS is set to a number of wavelengths. For each wavelength,
the Signal-to-Source Spontaneous Emission Ratio (SSE) spectrum is
measured for a ±3 nm window around the set wavelength using an Optical
Spectrum Analyzer (OSA). The SSE spectrum within ±1 nm of the set
wavelength is excluded because of the limited dynamic range of the OSA.
The OSA bandwidth resolution is set to 0.5 nm to catch the peaks of the
SSE ripple caused by the chip modes of the laser chip. An extrapolation to
1 nm is done by adding 3 dB to the SSE measurement result.
Figure 30 Signal-to-source spontaneous emission ratio
At the start of the test the compact TLS is set:
•To its lowest specified wavelength,
•To the output power specified for the compact TLS at this wavelength,
•Such that any modulation is off.
With a bandwidth resolution of 0.5 nm, SSE is measured directly using the
OSA, then the measurement result is extrapolated for a bandwidth
resolution of 1 nm (a factor of 2 relates to 3 dB). This value is recorded as
the test result.
The wavelength is increased, preferably in 10 nm increments. For each
wavelength, the associated SSE value is measured, extrapolated to 1 nm
bandwidth resolution and recorded.
At the end of the test, the compact TLS is set to its maximum specified
wavelength.
Test Procedure
1 Set up the equipment as shown in Figure 31:
Figure 31 Test Setup for Source Spontaneous Emission Test.
2 Connect the fiber to the optical output of the compact TLS and to the
optical input of the OSA.
3 Move to the compact TLS channel of the 8164A/B mainframe. Set the
[Menu] parameters to:
Tunable Laser Channel [Menu] ParametersValues
<Wavelength Mode><λ>
<Source State><Off>
<Power Unit><dBm>
<Power Mode><Automatic>
Modulation: <mod src><Off>
4 Make sure the optical output is switched off.
5 Set the wavelength of the compact TLS to:
These tests refer to some typical characteristics of the compact TLS that
are not guaranteed, and which are not part of the standard re-calibration.
However, the tests can be performed in qualified Agilent Service Centers
on special request.
Signal-to-Total-Source Spontaneous
Emission Ratio
For definition, see “Signal to total source spontaneous emission ratio” on
page 44.
NOTE
Qualified Agilent Service Center recommended:Although the
following description should allow users to verify their products'
performance, due to the high complexity of this test Agilent recommends
that it be performed in a qualified Agilent Service Center.
Measurement Principle
The compact TLS is set to a number of wavelengths. For each wavelength,
the Signal-to-Source Spontaneous Emission Ratio (SSE) spectrum is
measured in the specified wavelength range using an OSA resolution
bandwidth of 1 nm. One sample per nm is taken and summed to the total
SSE. The SSE spectrum near the signal (within a ±3 nm window) is
substituted by the average SSE based on the last sample on the left, at -3
nm, and the first sample on the right, at +3 nm.
8 Determine total noise power by adding up all 24 partial noise power
levels:
OSA_noise = Sum of all partial noise power levels
OSA_noise = _________ pW
9 Note the OSA_noise value in the Test Record.
10 Determine the SSE of the compact TLS output signal by using the
maximum value at its border:
a Note the power measured at OSA_λ_center - 3 nm,
b Note the power measured at OSA_λ_center + 3 nm,
c Determine the larger of these two power values and record it as
SSE_power_
Record all the power values in pW, where 1 pW = 10
d SSE_power_λTLS_max = ________ 10
11 Determine the Total SSE power, power_total_SSE,
Add the values of OSA_noise and SSE_power_
λTLS_max,
-12
W.
-12
W = _______ pW.
λTLS_max:
NOTE
power_total_SSE = OSA_noise + SSE_power_lTLS_max
-12
= ___________ 10
12 Calculate the Total SSE (in dB) using:
W = ___________ pW.
Use consistent power units!:Record all power values using the same
units, such as Watts W, or picoWatts pW.
This ensures that the equation in step 12 delivers the Total SSE in decibels
dB.
This section contains Test Records for Agilent 81980A, 81940A, 81944A,
81989A, 81949A Compact TLS module.
Results of the performance test may be tabulated on the Test Records. It is
recommended that you fill out the Test Record and refer to it while
executing the test. Since the test limits and setup information are printed
on the Test Record for easy reference, the record can also be used as an
abbreviated test procedure (if you are already familiar with the test
procedure). The Test Record can also be used as a permanent record and
may be reproduced without written permission from Agilent Technologies.
Agilent Compact Tunable Laser Source module Pe rformance TestPage 5 of 10
Model: Agilent 81980AReport No. ________Date:________
Wavelength Repeatability
Repeatability of 1465.000nm
(=REF)
Initial SettingREF= ________ nmInitial SettingREF= ________ nm
from 1490.000nm to REF________nmfrom 1465.000nm to REF________nm
from 1520.000nm to REF________nmfrom 1490.000nm to REF________nm
from 1550.000nm to REF________nmfrom 1550.000nm to REF________nm
from 1575.000nm to REF________nmfrom 1575.000nm to REF________nm
largest measured wavelength________nmlargest measured wavelength________nm
smallest measured wavelength________nmsmallest measured wavelength________ nm
Wavelength Repeatability________ nmWavelength Repeatability________ nm
(= largest measured wavelength - smallest measured wavelength)(= largest measured wavelength - smallest measured wavelength)
Upper Test Limit0.005nmUpper Test Limit0.005nm
Performance Characteristic0.002nm typicalPerformance Characteristic0.002nm typical
Repeatability of 1575.000nm
(=REF)
Initial SettingREF= ________ nm
from 1465.000nm to REF________nm
from 1490.000nm to REF________nm
from 1520.000nm to REF________nm
from 1550.000nm to REF________nm
largest measured wavelength________nm
smallest measured wavelength________ nm
Wavelength Repeatability________ nm
(= largest measured wavelength - smallest measured wavelength)
Upper Test Limit0.005nm
Performance Characteristic0.002nm typical