
Multiband Passive
Intermodulation Testing
Keysight Technologies and
Power Technology Solutions
Accurate and rapid PIM characterization of
communications components
Passive intermodulation (PIM) is a critical issue that can limit the quality of service
and capacity of current and next generation mobile communication systems such as
cellular, PCS/DCS, UMTS and 4G/LTE. Passive intermodulation arises at high power
levels due to the signal degradation ef fects of passive elements such as antennas,
cables and lters within the transmission system. PIM cannot be removed by ltering
alone. The reduction and containment of passive intermodulation requires good design and manufacturing techniques and the ability to achieve accurate and repeatable
measurement of PIM ef fects.
A new PIM test solution from Power Technology Systems (PTS) and Keysight addresses the need of component suppliers, integrators and service providers to measure
passive intermodulation effects. The solution uses the Keysight E5072A ENA series
network analyzer and the N5171B EXG signal generator to provide multiband PIM
testing capabilities. The system integrates intermodulation distortion measurements
with S-parameter characterization to fully qualify mobile communications components and sub-systems.
Passive intermodulation testing uses two independent high power (20 W typical)
signals in the cellular transmit band of interest. These create intermodulation distortion products in the receive band,
which can be measured to characterize the amount of PIM present.
The signals to be measured are
small and require a noise oor in
the test instrument of 10 dB better
than the device-under-test. This
will typically require sensitivity
of better than -173 dBc, which is
achieved by using the advanced
measurement capabilities of the
Keysight ENA.
– Multiband passive intermodulation
testing
– Test antennas, cables, connectors,
lters, and other components
– Uses Keysight ENA network analyzer
and EXG signal generator
– Accuracy better than -173 dBc
– Rapid measurements using built-in
frequency offset functions
– Flexible conguration for design,
production, QA
– Achieve accurate and rapid PIM
characterization

Multiband Passive Intermodulation Testing
PIM testing guidelines are dened in the
IEC-62037 standard on RF connector and
cables intermodulation level measurements.
This includes guidelines for both xed and
swept frequency measurements. The new
system is compatible with these guidelines
and provides both high measurement accuracy and rapid test speed.
Higher test speeds are achieved through
the built-in frequency offset functions in the
Keysight network analyzer and signal generator. The frequency offset functions are
set by internal rmware eliminating the need for additional ex ternal instruments. This
reduces signicantly the time required to recongure the test system for dif ferent
frequency bands and allows easy conguration of the system to implement the IEC62037 tests. The system can be congured for use in design, production or quality
assurance.
With the new multiband PIM testing
system from PTS
and Keysight you can
achieve accurate and
fast PIM characterization of your passive
components and
sub-systems.
System Components
To learn how this solution
can address your specific needs
please contact
Keysight’s solutions partner,
Power Technology Solutions
www.keysight.com/find/pts
Keysight & Solutions Partners
Extending our solutions to meet your needs
Keysight and its Solutions Partners work
together to help customers meet their
unique challenges, in design, manufacturing, installation or support. To learn more
about the program, our partners and
solutions go to
www.keysight.com/nd/solutionspartner
Power Technology Solutions is a leading provider of high power solutions for
telecommunications and satellite systems
with experienced personnel and many
decades of proven capability.
www.pwrts.com
Keysight Technologies
N5171B EXG signal generator
E5072A ENA series network analyzer
U2001B USB power sensor
PTS
P7022 Dual channel PIM test set (AMPS/PCS)
P8689 Single channel PIM test set (AMPS)
For information on Keysight Technologies’ products, applications and
services, go to
www.keysight.com
© Keysight Technologies, 2013-2014
Published in USA, August 3, 2014
5991-2194EN